JP4571525B2 - 基板処理装置及び基板処理方法 - Google Patents

基板処理装置及び基板処理方法 Download PDF

Info

Publication number
JP4571525B2
JP4571525B2 JP2005067082A JP2005067082A JP4571525B2 JP 4571525 B2 JP4571525 B2 JP 4571525B2 JP 2005067082 A JP2005067082 A JP 2005067082A JP 2005067082 A JP2005067082 A JP 2005067082A JP 4571525 B2 JP4571525 B2 JP 4571525B2
Authority
JP
Japan
Prior art keywords
substrate
stage
unit
nozzle
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2005067082A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006253373A (ja
Inventor
義治 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP2005067082A priority Critical patent/JP4571525B2/ja
Priority to KR1020060022159A priority patent/KR101154756B1/ko
Priority to TW095108195A priority patent/TWI305659B/zh
Publication of JP2006253373A publication Critical patent/JP2006253373A/ja
Application granted granted Critical
Publication of JP4571525B2 publication Critical patent/JP4571525B2/ja
Priority to KR1020110108796A priority patent/KR101188077B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274Photolithographic processes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05BSPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B1/00Nozzles, spray heads or other outlets, with or without auxiliary devices such as valves, heating means
    • B05B1/005Nozzles or other outlets specially adapted for discharging one or more gases
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/60Substrates
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2041Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Materials For Photolithography (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
JP2005067082A 2005-03-10 2005-03-10 基板処理装置及び基板処理方法 Active JP4571525B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005067082A JP4571525B2 (ja) 2005-03-10 2005-03-10 基板処理装置及び基板処理方法
KR1020060022159A KR101154756B1 (ko) 2005-03-10 2006-03-09 기판 처리 장치 및 기판 처리 방법
TW095108195A TWI305659B (en) 2005-03-10 2006-03-10 Substrate processing apparatus and substrate processing method
KR1020110108796A KR101188077B1 (ko) 2005-03-10 2011-10-24 기판 처리 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005067082A JP4571525B2 (ja) 2005-03-10 2005-03-10 基板処理装置及び基板処理方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009294325A Division JP5221508B2 (ja) 2009-12-25 2009-12-25 基板処理装置

Publications (2)

Publication Number Publication Date
JP2006253373A JP2006253373A (ja) 2006-09-21
JP4571525B2 true JP4571525B2 (ja) 2010-10-27

Family

ID=37093541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005067082A Active JP4571525B2 (ja) 2005-03-10 2005-03-10 基板処理装置及び基板処理方法

Country Status (3)

Country Link
JP (1) JP4571525B2 (ko)
KR (2) KR101154756B1 (ko)
TW (1) TWI305659B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008029938A (ja) * 2006-07-27 2008-02-14 Tokyo Electron Ltd 塗布方法及び塗布装置

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4318714B2 (ja) * 2006-11-28 2009-08-26 東京エレクトロン株式会社 塗布装置
JP2009018917A (ja) * 2007-07-12 2009-01-29 Tokyo Ohka Kogyo Co Ltd 塗布装置、基板の受け渡し方法及び塗布方法
KR100874611B1 (ko) 2007-08-13 2008-12-17 주식회사 케이씨텍 다층 코팅 방법
KR100891723B1 (ko) * 2007-09-19 2009-04-03 주식회사 엠엠티 비접촉식 패널 세정장치
JP4495752B2 (ja) 2007-11-06 2010-07-07 東京エレクトロン株式会社 基板処理装置及び塗布装置
JP2010034309A (ja) * 2008-07-29 2010-02-12 Dainippon Screen Mfg Co Ltd 塗布装置および基板処理システム
KR101341013B1 (ko) * 2008-09-04 2013-12-13 엘지디스플레이 주식회사 세정 장치
JP4787872B2 (ja) * 2008-10-16 2011-10-05 東京エレクトロン株式会社 基板搬送処理装置
KR101071583B1 (ko) 2009-08-21 2011-10-10 주식회사 케이씨텍 부상식 기판 코터 장치
KR101051767B1 (ko) * 2009-09-01 2011-07-25 주식회사 케이씨텍 부상식 기판 코터 장치
CN107017191B (zh) * 2010-02-17 2020-08-14 株式会社尼康 搬送装置、曝光装置、以及元件制造方法
JP5010019B2 (ja) * 2010-09-09 2012-08-29 東京エレクトロン株式会社 ステージ
JP5663297B2 (ja) * 2010-12-27 2015-02-04 東京応化工業株式会社 塗布装置
TWI685911B (zh) * 2011-05-13 2020-02-21 日商尼康股份有限公司 物體更換系統、物體更換方法、及曝光裝置
KR102096956B1 (ko) * 2011-12-22 2020-04-06 세메스 주식회사 기판 처리 장치 및 방법
KR102190687B1 (ko) * 2014-12-08 2020-12-15 엘지디스플레이 주식회사 슬릿코터 시스템
JP2018043200A (ja) * 2016-09-15 2018-03-22 株式会社Screenホールディングス 塗布装置および塗布方法
JP6905830B2 (ja) * 2017-01-11 2021-07-21 株式会社Screenホールディングス 基板処理装置および基板処理方法
JP6860357B2 (ja) * 2017-01-20 2021-04-14 株式会社Screenホールディングス 塗布装置および塗布方法
JP6860356B2 (ja) * 2017-01-20 2021-04-14 株式会社Screenホールディングス 塗布装置および塗布方法
CN112566730A (zh) * 2018-08-22 2021-03-26 东京毅力科创株式会社 绘制装置和绘制方法
KR102262080B1 (ko) * 2019-08-22 2021-06-07 세메스 주식회사 기판 처리 장치
JP7520665B2 (ja) * 2020-09-25 2024-07-23 株式会社Screenホールディングス 基板処理方法
WO2022209197A1 (ja) * 2021-03-31 2022-10-06 東京エレクトロン株式会社 塗布処理装置、塗布処理方法および塗布処理プログラム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0455347A (ja) * 1990-06-20 1992-02-24 Konica Corp 油性樹脂溶液の塗布方法及び装置
JP2002346463A (ja) * 2001-05-24 2002-12-03 Toppan Printing Co Ltd 単板塗布装置
JP2003290697A (ja) * 2002-04-02 2003-10-14 Toppan Printing Co Ltd 単板連続塗布装置
WO2003086917A1 (fr) * 2002-04-18 2003-10-23 Olympus Corporation Dispositif de transport de substrat

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004273714A (ja) 2003-03-07 2004-09-30 Tokyo Electron Ltd 基板処理装置及び基板処理方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0455347A (ja) * 1990-06-20 1992-02-24 Konica Corp 油性樹脂溶液の塗布方法及び装置
JP2002346463A (ja) * 2001-05-24 2002-12-03 Toppan Printing Co Ltd 単板塗布装置
JP2003290697A (ja) * 2002-04-02 2003-10-14 Toppan Printing Co Ltd 単板連続塗布装置
WO2003086917A1 (fr) * 2002-04-18 2003-10-23 Olympus Corporation Dispositif de transport de substrat

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008029938A (ja) * 2006-07-27 2008-02-14 Tokyo Electron Ltd 塗布方法及び塗布装置

Also Published As

Publication number Publication date
KR20060097659A (ko) 2006-09-14
TW200727338A (en) 2007-07-16
KR20110131149A (ko) 2011-12-06
TWI305659B (en) 2009-01-21
JP2006253373A (ja) 2006-09-21
KR101154756B1 (ko) 2012-06-08
KR101188077B1 (ko) 2012-10-08

Similar Documents

Publication Publication Date Title
JP4571525B2 (ja) 基板処理装置及び基板処理方法
JP4378301B2 (ja) 基板処理装置及び基板処理方法及び基板処理プログラム
JP4634265B2 (ja) 塗布方法及び塗布装置
JP4429943B2 (ja) 基板処理装置及び基板処理方法
JP4564454B2 (ja) 塗布方法及び塗布装置及び塗布処理プログラム
JP4884871B2 (ja) 塗布方法及び塗布装置
JP4570545B2 (ja) 基板処理装置及び基板処理方法
KR101079441B1 (ko) 스테이지 장치 및 도포 처리 장치
JP4272230B2 (ja) 減圧乾燥装置
JP4673180B2 (ja) 塗布装置及び塗布方法
JP4429825B2 (ja) 基板処理装置
JP4995488B2 (ja) 塗布方法及び塗布装置
JP4676359B2 (ja) プライミング処理方法及びプライミング処理装置
WO2006090619A1 (ja) ステージ装置および塗布処理装置
JP2009302122A (ja) 塗布装置及び塗布方法
JP5221508B2 (ja) 基板処理装置
JP4516034B2 (ja) 塗布方法及び塗布装置及び塗布処理プログラム
JP2009018917A (ja) 塗布装置、基板の受け渡し方法及び塗布方法
JP4804567B2 (ja) 基板浮上装置
JP2009040533A (ja) 塗布装置及び塗布方法

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061214

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20091027

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091225

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100330

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100519

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100810

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100812

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130820

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4571525

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250