JP4345743B2 - 電気光学装置 - Google Patents
電気光学装置 Download PDFInfo
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- JP4345743B2 JP4345743B2 JP2005377150A JP2005377150A JP4345743B2 JP 4345743 B2 JP4345743 B2 JP 4345743B2 JP 2005377150 A JP2005377150 A JP 2005377150A JP 2005377150 A JP2005377150 A JP 2005377150A JP 4345743 B2 JP4345743 B2 JP 4345743B2
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- 238000007689 inspection Methods 0.000 claims description 297
- 239000000758 substrate Substances 0.000 claims description 123
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- 239000002346 layers by function Substances 0.000 claims description 7
- 238000012360 testing method Methods 0.000 description 17
- 239000000523 sample Substances 0.000 description 13
- 238000005401 electroluminescence Methods 0.000 description 12
- 239000010408 film Substances 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
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- 239000000853 adhesive Substances 0.000 description 5
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- 239000003086 colorant Substances 0.000 description 4
- 230000002950 deficient Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 235000019557 luminance Nutrition 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
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- 239000004020 conductor Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal (AREA)
- Liquid Crystal Display Device Control (AREA)
- Control Of El Displays (AREA)
Description
Claims (6)
- 複数の画素回路が形成された基板と、前記複数の画素回路を封止する封止部材と、が接着されており、前記複数の画素回路の夫々がデータ線、及び走査線に接続されてなる電気光学装置において、
前記基板は、前記画素回路を駆動するトランジスタと、前記走査線及び前記データ線のうちの少なくとも一方に接続されトランジスタを含む検査回路と、が形成された回路形成層を備え、
前記複数の画素回路の夫々は、前記画素回路を駆動する前記トランジスタに接続され陽極となる画素電極と、発光層を含む機能層と、前記複数の画素回路に渡って設けられ陰極となる共通電極と、を前記回路形成層上に有し、
前記検査回路の前記トランジスタは、前記共通電極が形成された領域と、前記基板と前記封止部材とが接着される接着領域と、の間に配置されてなることを特徴とする電気光学装置。 - 請求項1に記載の電気光学装置において、
前記検査回路の前記トランジスタは、検査モード信号を供給する検査モード信号供給線、及び検査データ信号を供給する検査データ信号供給線、に接続されてなることを特徴とする電気光学装置。 - 請求項2に記載の電気光学装置において、
前記検査モード信号供給線に接続される検査用外部端子、及び前記検査データ信号供給
線に接続される検査用外部端子、を含んでなることを特徴とする電気光学装置。 - 請求項1に記載の電気光学装置において、
前記検査回路の前記トランジスタは、
検査用の選択信号を供給する選択信号供給線、及び検査モード信号を供給する検査モード信号供給線に接続されてなることを特徴とする電気光学装置。 - 請求項4に記載の電気光学装置において、
前記選択信号供給線に接続されたシフトレジスタ、及び前記前記シフトレジスタに接続されており、検査用のクロック信号を供給するクロック信号供給線、を有することを特徴とする電気光学装置。 - 請求項5に記載の電気光学装置において、
前記選択信号供給線に接続された検査用外部端子、前記クロック信号供給線に接続された検査用外部端子、及び前記検査モード信号供給線に接続された検査用外部端子、を含んでなることを特徴とする電気光学装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005377150A JP4345743B2 (ja) | 2005-02-14 | 2005-12-28 | 電気光学装置 |
TW095103935A TWI327446B (en) | 2005-02-14 | 2006-02-06 | Electro-optical device |
KR1020060012156A KR100751848B1 (ko) | 2005-02-14 | 2006-02-08 | 전기 광학 장치 |
US11/352,361 US7994810B2 (en) | 2005-02-14 | 2006-02-13 | Electro-optical device |
CNB2006100042512A CN100433360C (zh) | 2005-02-14 | 2006-02-13 | 电光装置 |
US13/172,351 US8324916B2 (en) | 2005-02-14 | 2011-06-29 | Electro-optical device |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005035643 | 2005-02-14 | ||
JP2005035644 | 2005-02-14 | ||
JP2005035645 | 2005-02-14 | ||
JP2005377150A JP4345743B2 (ja) | 2005-02-14 | 2005-12-28 | 電気光学装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009032309A Division JP4715933B2 (ja) | 2005-02-14 | 2009-02-16 | 電気光学装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006251774A JP2006251774A (ja) | 2006-09-21 |
JP4345743B2 true JP4345743B2 (ja) | 2009-10-14 |
Family
ID=36933171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005377150A Active JP4345743B2 (ja) | 2005-02-14 | 2005-12-28 | 電気光学装置 |
Country Status (5)
Country | Link |
---|---|
US (2) | US7994810B2 (ja) |
JP (1) | JP4345743B2 (ja) |
KR (1) | KR100751848B1 (ja) |
CN (1) | CN100433360C (ja) |
TW (1) | TWI327446B (ja) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4345743B2 (ja) * | 2005-02-14 | 2009-10-14 | セイコーエプソン株式会社 | 電気光学装置 |
JP2009123618A (ja) * | 2007-11-16 | 2009-06-04 | Toppan Printing Co Ltd | 有機el表示装置及びその製造方法 |
JP5428299B2 (ja) * | 2008-03-18 | 2014-02-26 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
KR100924142B1 (ko) * | 2008-04-01 | 2009-10-28 | 삼성모바일디스플레이주식회사 | 평판표시장치, 이의 에이징 방법 및 점등 테스트 방법 |
JP2009288276A (ja) * | 2008-05-27 | 2009-12-10 | Seiko Epson Corp | 実装構造体、電気光学装置および電子機器 |
US8358256B2 (en) * | 2008-11-17 | 2013-01-22 | Global Oled Technology Llc | Compensated drive signal for electroluminescent display |
US8436635B2 (en) * | 2009-09-01 | 2013-05-07 | Texas Instruments Incorporated | Semiconductor wafer having test modules including pin matrix selectable test devices |
JP5700626B2 (ja) * | 2009-09-04 | 2015-04-15 | 株式会社半導体エネルギー研究所 | El表示装置 |
JP5687117B2 (ja) * | 2011-04-12 | 2015-03-18 | パナソニック株式会社 | アクティブマトリクス基板、アクティブマトリクス基板の検査方法、表示パネル、および表示パネルの製造方法 |
KR102059943B1 (ko) * | 2013-10-16 | 2019-12-30 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치 |
JP6302683B2 (ja) * | 2014-01-29 | 2018-03-28 | パイオニア株式会社 | 発光装置 |
CN109166504B (zh) * | 2018-10-17 | 2021-10-01 | 惠科股份有限公司 | 测试电路及显示装置 |
KR20210014263A (ko) * | 2019-07-29 | 2021-02-09 | 삼성디스플레이 주식회사 | 표시 장치 |
KR20210083804A (ko) * | 2019-12-27 | 2021-07-07 | 엘지디스플레이 주식회사 | 투명 표시 장치 |
KR20210085135A (ko) * | 2019-12-30 | 2021-07-08 | 엘지디스플레이 주식회사 | 투명 표시 장치 |
CN112310317B (zh) * | 2020-10-30 | 2024-03-15 | 京东方科技集团股份有限公司 | 一种显示面板测试用组件及其制备方法 |
CN117612465B (zh) * | 2024-01-22 | 2024-05-21 | 南京国兆光电科技有限公司 | 一种显示亮点缺陷的修复电路 |
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JPH01130132A (ja) | 1987-11-16 | 1989-05-23 | Seiko Epson Corp | アクティブマトリクス基板 |
JPH07248479A (ja) | 1994-03-08 | 1995-09-26 | Casio Comput Co Ltd | 液晶表示装置検査方法およびその装置 |
JP3783693B2 (ja) * | 1995-02-01 | 2006-06-07 | セイコーエプソン株式会社 | 液晶表示装置及び液晶表示装置の検査方法 |
JP4147594B2 (ja) | 1997-01-29 | 2008-09-10 | セイコーエプソン株式会社 | アクティブマトリクス基板、液晶表示装置および電子機器 |
JPH10260391A (ja) * | 1997-03-19 | 1998-09-29 | Fujitsu Ltd | 検査回路を有する液晶表示装置 |
EP0950917B1 (en) * | 1997-10-31 | 2003-12-03 | Seiko Epson Corporation | Electro-optical device and electronic apparatus |
JP2001265248A (ja) | 2000-03-14 | 2001-09-28 | Internatl Business Mach Corp <Ibm> | アクティブ・マトリックス表示装置、及び、その検査方法 |
JP3797174B2 (ja) * | 2000-09-29 | 2006-07-12 | セイコーエプソン株式会社 | 電気光学装置及びその駆動方法、並びに電子機器 |
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JP3901127B2 (ja) * | 2002-06-07 | 2007-04-04 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
JP2004192925A (ja) | 2002-12-10 | 2004-07-08 | Toshiba Matsushita Display Technology Co Ltd | 有機el表示パネル及びその検査方法 |
JP2004200034A (ja) * | 2002-12-19 | 2004-07-15 | Seiko Epson Corp | 電気光学装置及びその製造方法並びに電子機器 |
JP3783707B2 (ja) * | 2003-03-19 | 2006-06-07 | セイコーエプソン株式会社 | 検査素子付基板並びに電気光学装置用基板及び電気光学装置及び電子機器 |
JP2003307739A (ja) | 2003-03-24 | 2003-10-31 | Seiko Epson Corp | 液晶装置 |
JP4138672B2 (ja) | 2003-03-27 | 2008-08-27 | セイコーエプソン株式会社 | 電気光学装置の製造方法 |
JP3603902B2 (ja) | 2003-09-16 | 2004-12-22 | セイコーエプソン株式会社 | 液晶装置 |
JP3994994B2 (ja) * | 2003-10-23 | 2007-10-24 | セイコーエプソン株式会社 | 有機el装置の製造方法、有機el装置、電子機器 |
KR100828294B1 (ko) * | 2004-04-29 | 2008-05-07 | 엘지디스플레이 주식회사 | 액정표시장치용 기판 및 이를 이용한 액정표시장치 제조방법 |
JP4345743B2 (ja) * | 2005-02-14 | 2009-10-14 | セイコーエプソン株式会社 | 電気光学装置 |
JP4876415B2 (ja) * | 2005-03-29 | 2012-02-15 | セイコーエプソン株式会社 | 有機el装置の製造方法、デバイスの製造方法 |
JP5024110B2 (ja) * | 2008-02-22 | 2012-09-12 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
-
2005
- 2005-12-28 JP JP2005377150A patent/JP4345743B2/ja active Active
-
2006
- 2006-02-06 TW TW095103935A patent/TWI327446B/zh active
- 2006-02-08 KR KR1020060012156A patent/KR100751848B1/ko active IP Right Grant
- 2006-02-13 CN CNB2006100042512A patent/CN100433360C/zh active Active
- 2006-02-13 US US11/352,361 patent/US7994810B2/en active Active
-
2011
- 2011-06-29 US US13/172,351 patent/US8324916B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20110254555A1 (en) | 2011-10-20 |
TWI327446B (en) | 2010-07-11 |
KR100751848B1 (ko) | 2007-08-23 |
US20060195736A1 (en) | 2006-08-31 |
JP2006251774A (ja) | 2006-09-21 |
US7994810B2 (en) | 2011-08-09 |
CN1825619A (zh) | 2006-08-30 |
KR20060091236A (ko) | 2006-08-18 |
US8324916B2 (en) | 2012-12-04 |
CN100433360C (zh) | 2008-11-12 |
TW200633573A (en) | 2006-09-16 |
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