JP2008146432A - マークの検出方法 - Google Patents

マークの検出方法 Download PDF

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Publication number
JP2008146432A
JP2008146432A JP2006334105A JP2006334105A JP2008146432A JP 2008146432 A JP2008146432 A JP 2008146432A JP 2006334105 A JP2006334105 A JP 2006334105A JP 2006334105 A JP2006334105 A JP 2006334105A JP 2008146432 A JP2008146432 A JP 2008146432A
Authority
JP
Japan
Prior art keywords
mark
range
color
resin film
hue
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006334105A
Other languages
English (en)
Japanese (ja)
Inventor
Sang Il Nam
相逸 南
Atsuhiko Shinozuka
淳彦 篠塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP2006334105A priority Critical patent/JP2008146432A/ja
Priority to PCT/JP2007/073982 priority patent/WO2008072679A1/ja
Priority to TW96147044A priority patent/TW200839222A/zh
Publication of JP2008146432A publication Critical patent/JP2008146432A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30204—Marker

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2006334105A 2006-12-12 2006-12-12 マークの検出方法 Pending JP2008146432A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006334105A JP2008146432A (ja) 2006-12-12 2006-12-12 マークの検出方法
PCT/JP2007/073982 WO2008072679A1 (ja) 2006-12-12 2007-12-06 マークの検出方法
TW96147044A TW200839222A (en) 2006-12-12 2007-12-10 Mark detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006334105A JP2008146432A (ja) 2006-12-12 2006-12-12 マークの検出方法

Publications (1)

Publication Number Publication Date
JP2008146432A true JP2008146432A (ja) 2008-06-26

Family

ID=39511694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006334105A Pending JP2008146432A (ja) 2006-12-12 2006-12-12 マークの検出方法

Country Status (3)

Country Link
JP (1) JP2008146432A (zh)
TW (1) TW200839222A (zh)
WO (1) WO2008072679A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105704464A (zh) * 2016-01-18 2016-06-22 安徽工程大学 一种基于fpga的色域空间转换方法
CN106353335A (zh) * 2016-08-11 2017-01-25 苏州柯创电子材料有限公司 一种用于包装膜的表面缺陷检测装置
CN109709048A (zh) * 2019-02-22 2019-05-03 哈尔滨工程大学 一种谷物检测装置
CN111413284B (zh) * 2020-05-18 2022-03-22 攀钢集团攀枝花钢铁研究院有限公司 钒钛烧结矿中主要物相的定量检测方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11281325A (ja) * 1998-03-27 1999-10-15 Toshiba Corp 画像認識システムおよびこれを用いた画像認識方法
JP4332122B2 (ja) * 2005-01-17 2009-09-16 シーケーディ株式会社 外観検査装置及びｐｔｐ包装機
JP2006266847A (ja) * 2005-03-23 2006-10-05 Sumitomo Bakelite Co Ltd プラスチックシート、プラスチックシートの製造方法、そのプラスチックシート用いた回路基板および表示用デバイス

Also Published As

Publication number Publication date
TW200839222A (en) 2008-10-01
WO2008072679A1 (ja) 2008-06-19

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