GB805926A - Improvements relating to the measurement of magnetic fields - Google Patents

Improvements relating to the measurement of magnetic fields

Info

Publication number
GB805926A
GB805926A GB37449/55A GB3744955A GB805926A GB 805926 A GB805926 A GB 805926A GB 37449/55 A GB37449/55 A GB 37449/55A GB 3744955 A GB3744955 A GB 3744955A GB 805926 A GB805926 A GB 805926A
Authority
GB
United Kingdom
Prior art keywords
collector
current
field
emitter
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB37449/55A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Francaise Thomson Houston SA
Original Assignee
Compagnie Francaise Thomson Houston SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Francaise Thomson Houston SA filed Critical Compagnie Francaise Thomson Houston SA
Publication of GB805926A publication Critical patent/GB805926A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07Hall effect devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

805,926. Electric tests. COMPAGNIE FRANCAISE THOMSON-HOUSTON. Dec. 30, 1955 [Jan. 7, 1955], No. 37449/55. Class 37. The strength of a magnetic field is measured by means of a transistor which is positioned in the field so that current carriers injected by the emitter are deflected away from the collector. The reduction in collector current is then an indication of field strength. In the particular example described, the transistor is of N-type germanium the emitter and collector either forming point contacts or being connected to p-n junctions formed by local contamination. The collector current may be observed on a milliammeter or compared by means of a galvanometer with a voltage tapped across a potentiometer. In the absence of a magnetic field the galvanometer current is regulated to zero by means of the potentiometer. When the field is applied the meter deflects and may be calibrated in terms of field strength. The D.C. supply to either the emitter or collector may be replaced by an A.C. one. An arrangement is described with reference to Fig. 3, wherein the collector is in two parts 41, 4<SP>11</SP>, and the magnetic field is arranged to vary the current distribution between them.
GB37449/55A 1955-01-07 1955-12-30 Improvements relating to the measurement of magnetic fields Expired GB805926A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR805926X 1955-01-07

Publications (1)

Publication Number Publication Date
GB805926A true GB805926A (en) 1958-12-17

Family

ID=9251588

Family Applications (1)

Application Number Title Priority Date Filing Date
GB37449/55A Expired GB805926A (en) 1955-01-07 1955-12-30 Improvements relating to the measurement of magnetic fields

Country Status (1)

Country Link
GB (1) GB805926A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1117778B (en) * 1958-07-29 1961-11-23 Jun Ichi Nishizawa Dr Ing Semiconductor arrangement with a current-dependent inductance
DE1206080B (en) * 1964-08-20 1965-12-02 Telefunken Patent High sensitivity transistor magnetic field probe
US3525932A (en) * 1968-01-25 1970-08-25 Honeywell Inc Magnetometer utilizing a grooved reverse biased junction diode
US5134371A (en) * 1989-01-18 1992-07-28 Nippondenso Co., Ltd. Magnetic detection device using an oscillator whose detection element is a magnetoresitance effective element
US5568071A (en) * 1990-01-25 1996-10-22 Nippon Soken Inc. Pulse phase difference encoding circuit
US5686835A (en) * 1989-01-18 1997-11-11 Nippondenso Co., Ltd Physical quantity detection device for converting a physical quantity into a corresponding time interval

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1117778B (en) * 1958-07-29 1961-11-23 Jun Ichi Nishizawa Dr Ing Semiconductor arrangement with a current-dependent inductance
DE1206080B (en) * 1964-08-20 1965-12-02 Telefunken Patent High sensitivity transistor magnetic field probe
US3525932A (en) * 1968-01-25 1970-08-25 Honeywell Inc Magnetometer utilizing a grooved reverse biased junction diode
US5134371A (en) * 1989-01-18 1992-07-28 Nippondenso Co., Ltd. Magnetic detection device using an oscillator whose detection element is a magnetoresitance effective element
US5359287A (en) * 1989-01-18 1994-10-25 Nippondenso Co., Ltd. Magnetic detecting circuit having magnetoresistance effective elements oriented in at least two different directions
US5686835A (en) * 1989-01-18 1997-11-11 Nippondenso Co., Ltd Physical quantity detection device for converting a physical quantity into a corresponding time interval
US5568071A (en) * 1990-01-25 1996-10-22 Nippon Soken Inc. Pulse phase difference encoding circuit

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