GB2335280B - Ic testing method and ic testing device using the same - Google Patents

Ic testing method and ic testing device using the same

Info

Publication number
GB2335280B
GB2335280B GB9912919A GB9912919A GB2335280B GB 2335280 B GB2335280 B GB 2335280B GB 9912919 A GB9912919 A GB 9912919A GB 9912919 A GB9912919 A GB 9912919A GB 2335280 B GB2335280 B GB 2335280B
Authority
GB
United Kingdom
Prior art keywords
testing
same
testing device
testing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9912919A
Other languages
English (en)
Other versions
GB2335280A (en
GB9912919D0 (en
Inventor
Yoshihiro Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB9912919D0 publication Critical patent/GB9912919D0/en
Publication of GB2335280A publication Critical patent/GB2335280A/en
Application granted granted Critical
Publication of GB2335280B publication Critical patent/GB2335280B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB9912919A 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same Expired - Fee Related GB2335280B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP1997/004228 WO1999027376A1 (fr) 1997-11-20 1997-11-20 Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede
CNB971814333A CN1141593C (zh) 1997-11-20 1997-11-20 集成电路测试方法和采用该测试方法的集成电路测试装置

Publications (3)

Publication Number Publication Date
GB9912919D0 GB9912919D0 (en) 1999-08-04
GB2335280A GB2335280A (en) 1999-09-15
GB2335280B true GB2335280B (en) 2002-01-16

Family

ID=25744427

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9912919A Expired - Fee Related GB2335280B (en) 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same

Country Status (4)

Country Link
CN (1) CN1141593C (zh)
DE (1) DE19782244T1 (zh)
GB (1) GB2335280B (zh)
WO (1) WO1999027376A1 (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102609A (ja) * 1999-09-28 2001-04-13 Kanegafuchi Chem Ind Co Ltd 光電変換装置の特性測定装置
AT412242B (de) 2000-03-02 2004-11-25 Siemens Ag Oesterreich Verfahren und anordnung zum testen eines prüflings
JP4729212B2 (ja) * 2001-09-27 2011-07-20 株式会社アドバンテスト 半導体試験装置
KR100989588B1 (ko) 2005-07-07 2010-10-25 가부시키가이샤 어드밴티스트 시험 장치
WO2007069646A1 (ja) * 2005-12-15 2007-06-21 Advantest Corporation 試験装置、及びピンエレクトロニクスカード
JP4726679B2 (ja) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 半導体試験方法および半導体装置
WO2008139606A1 (ja) 2007-05-14 2008-11-20 Advantest Corporation 試験装置
CN101995534B (zh) * 2009-08-10 2013-08-28 宏正自动科技股份有限公司 漏电检测装置及方法
CN102918407B (zh) * 2010-04-22 2015-05-13 株式会社爱德万测试 Pin卡及使用pin卡的试验装置
CN102540055B (zh) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 一种检测逻辑电平极限值的方法及装置
US9448274B2 (en) * 2014-04-16 2016-09-20 Teradyne, Inc. Circuitry to protect a test instrument
CN105044536B (zh) * 2015-03-20 2018-11-13 深圳康姆科技有限公司 一种新型的封装缺陷检测方法和***

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6329277A (ja) * 1986-07-23 1988-02-06 Nec Corp 論理集積回路の試験装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923676U (ja) * 1982-08-04 1984-02-14 株式会社アドバンテスト 自己診断機能を持つｉｃ試験装置
JPS63190975U (zh) * 1987-05-29 1988-12-08

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6329277A (ja) * 1986-07-23 1988-02-06 Nec Corp 論理集積回路の試験装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP 190975/1988 Y (Advantest) 1.12.1988 *
JP 23676/1984 Y (Takeda) 14.2.1984 *

Also Published As

Publication number Publication date
CN1244925A (zh) 2000-02-16
WO1999027376A1 (fr) 1999-06-03
GB2335280A (en) 1999-09-15
GB9912919D0 (en) 1999-08-04
DE19782244T1 (de) 2000-01-05
CN1141593C (zh) 2004-03-10

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Legal Events

Date Code Title Description
789A Request for publication of translation (sect. 89(a)/1977)
789A Request for publication of translation (sect. 89(a)/1977)
PCNP Patent ceased through non-payment of renewal fee