GB2335280B - Ic testing method and ic testing device using the same - Google Patents
Ic testing method and ic testing device using the sameInfo
- Publication number
- GB2335280B GB2335280B GB9912919A GB9912919A GB2335280B GB 2335280 B GB2335280 B GB 2335280B GB 9912919 A GB9912919 A GB 9912919A GB 9912919 A GB9912919 A GB 9912919A GB 2335280 B GB2335280 B GB 2335280B
- Authority
- GB
- United Kingdom
- Prior art keywords
- testing
- same
- testing device
- testing method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1997/004228 WO1999027376A1 (fr) | 1997-11-20 | 1997-11-20 | Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede |
CNB971814333A CN1141593C (zh) | 1997-11-20 | 1997-11-20 | 集成电路测试方法和采用该测试方法的集成电路测试装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9912919D0 GB9912919D0 (en) | 1999-08-04 |
GB2335280A GB2335280A (en) | 1999-09-15 |
GB2335280B true GB2335280B (en) | 2002-01-16 |
Family
ID=25744427
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9912919A Expired - Fee Related GB2335280B (en) | 1997-11-20 | 1997-11-20 | Ic testing method and ic testing device using the same |
Country Status (4)
Country | Link |
---|---|
CN (1) | CN1141593C (zh) |
DE (1) | DE19782244T1 (zh) |
GB (1) | GB2335280B (zh) |
WO (1) | WO1999027376A1 (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001102609A (ja) * | 1999-09-28 | 2001-04-13 | Kanegafuchi Chem Ind Co Ltd | 光電変換装置の特性測定装置 |
AT412242B (de) | 2000-03-02 | 2004-11-25 | Siemens Ag Oesterreich | Verfahren und anordnung zum testen eines prüflings |
JP4729212B2 (ja) * | 2001-09-27 | 2011-07-20 | 株式会社アドバンテスト | 半導体試験装置 |
KR100989588B1 (ko) | 2005-07-07 | 2010-10-25 | 가부시키가이샤 어드밴티스트 | 시험 장치 |
WO2007069646A1 (ja) * | 2005-12-15 | 2007-06-21 | Advantest Corporation | 試験装置、及びピンエレクトロニクスカード |
JP4726679B2 (ja) * | 2006-03-31 | 2011-07-20 | ルネサスエレクトロニクス株式会社 | 半導体試験方法および半導体装置 |
WO2008139606A1 (ja) | 2007-05-14 | 2008-11-20 | Advantest Corporation | 試験装置 |
CN101995534B (zh) * | 2009-08-10 | 2013-08-28 | 宏正自动科技股份有限公司 | 漏电检测装置及方法 |
CN102918407B (zh) * | 2010-04-22 | 2015-05-13 | 株式会社爱德万测试 | Pin卡及使用pin卡的试验装置 |
CN102540055B (zh) * | 2011-12-22 | 2015-07-29 | 深圳创维数字技术有限公司 | 一种检测逻辑电平极限值的方法及装置 |
US9448274B2 (en) * | 2014-04-16 | 2016-09-20 | Teradyne, Inc. | Circuitry to protect a test instrument |
CN105044536B (zh) * | 2015-03-20 | 2018-11-13 | 深圳康姆科技有限公司 | 一种新型的封装缺陷检测方法和*** |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6329277A (ja) * | 1986-07-23 | 1988-02-06 | Nec Corp | 論理集積回路の試験装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5923676U (ja) * | 1982-08-04 | 1984-02-14 | 株式会社アドバンテスト | 自己診断機能を持つic試験装置 |
JPS63190975U (zh) * | 1987-05-29 | 1988-12-08 |
-
1997
- 1997-11-20 WO PCT/JP1997/004228 patent/WO1999027376A1/ja active IP Right Grant
- 1997-11-20 DE DE19782244T patent/DE19782244T1/de not_active Withdrawn
- 1997-11-20 CN CNB971814333A patent/CN1141593C/zh not_active Expired - Fee Related
- 1997-11-20 GB GB9912919A patent/GB2335280B/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6329277A (ja) * | 1986-07-23 | 1988-02-06 | Nec Corp | 論理集積回路の試験装置 |
Non-Patent Citations (2)
Title |
---|
JP 190975/1988 Y (Advantest) 1.12.1988 * |
JP 23676/1984 Y (Takeda) 14.2.1984 * |
Also Published As
Publication number | Publication date |
---|---|
CN1244925A (zh) | 2000-02-16 |
WO1999027376A1 (fr) | 1999-06-03 |
GB2335280A (en) | 1999-09-15 |
GB9912919D0 (en) | 1999-08-04 |
DE19782244T1 (de) | 2000-01-05 |
CN1141593C (zh) | 2004-03-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
789A | Request for publication of translation (sect. 89(a)/1977) | ||
789A | Request for publication of translation (sect. 89(a)/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |