GB2335280B - Ic testing method and ic testing device using the same - Google Patents

Ic testing method and ic testing device using the same

Info

Publication number
GB2335280B
GB2335280B GB9912919A GB9912919A GB2335280B GB 2335280 B GB2335280 B GB 2335280B GB 9912919 A GB9912919 A GB 9912919A GB 9912919 A GB9912919 A GB 9912919A GB 2335280 B GB2335280 B GB 2335280B
Authority
GB
United Kingdom
Prior art keywords
testing
same
testing device
testing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9912919A
Other versions
GB9912919D0 (en
GB2335280A (en
Inventor
Yoshihiro Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB9912919D0 publication Critical patent/GB9912919D0/en
Publication of GB2335280A publication Critical patent/GB2335280A/en
Application granted granted Critical
Publication of GB2335280B publication Critical patent/GB2335280B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
GB9912919A 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same Expired - Fee Related GB2335280B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP1997/004228 WO1999027376A1 (en) 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same
CNB971814333A CN1141593C (en) 1997-11-20 1997-11-20 IC testing method and IC testing device using the same

Publications (3)

Publication Number Publication Date
GB9912919D0 GB9912919D0 (en) 1999-08-04
GB2335280A GB2335280A (en) 1999-09-15
GB2335280B true GB2335280B (en) 2002-01-16

Family

ID=25744427

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9912919A Expired - Fee Related GB2335280B (en) 1997-11-20 1997-11-20 Ic testing method and ic testing device using the same

Country Status (4)

Country Link
CN (1) CN1141593C (en)
DE (1) DE19782244T1 (en)
GB (1) GB2335280B (en)
WO (1) WO1999027376A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102609A (en) * 1999-09-28 2001-04-13 Kanegafuchi Chem Ind Co Ltd Device for measuring characteristic of photoelectric conversion device
AT412242B (en) * 2000-03-02 2004-11-25 Siemens Ag Oesterreich METHOD AND ARRANGEMENT FOR TESTING A TEST
JP4729212B2 (en) * 2001-09-27 2011-07-20 株式会社アドバンテスト Semiconductor test equipment
KR100989588B1 (en) 2005-07-07 2010-10-25 가부시키가이샤 어드밴티스트 Testing apparatus
KR100995813B1 (en) * 2005-12-15 2010-11-23 가부시키가이샤 어드밴티스트 Testing apparatus and pin electronics card
JP4726679B2 (en) * 2006-03-31 2011-07-20 ルネサスエレクトロニクス株式会社 Semiconductor test method and semiconductor device
JP4874391B2 (en) 2007-05-14 2012-02-15 株式会社アドバンテスト Test equipment
CN101995534B (en) * 2009-08-10 2013-08-28 宏正自动科技股份有限公司 Electric leakage detecting device and method
KR101407821B1 (en) 2010-04-22 2014-06-18 가부시키가이샤 어드밴티스트 Pin card and test device using same
CN102540055B (en) * 2011-12-22 2015-07-29 深圳创维数字技术有限公司 A kind of method and device detecting logic level limit value
US9448274B2 (en) * 2014-04-16 2016-09-20 Teradyne, Inc. Circuitry to protect a test instrument
CN105044536B (en) * 2015-03-20 2018-11-13 深圳康姆科技有限公司 A kind of novel encapsulation defect inspection method and system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6329277A (en) * 1986-07-23 1988-02-06 Nec Corp Testing device for logic integrated circuit

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5923676U (en) * 1982-08-04 1984-02-14 株式会社アドバンテスト IC test equipment with self-diagnosis function
JPS63190975U (en) * 1987-05-29 1988-12-08

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6329277A (en) * 1986-07-23 1988-02-06 Nec Corp Testing device for logic integrated circuit

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP 190975/1988 Y (Advantest) 1.12.1988 *
JP 23676/1984 Y (Takeda) 14.2.1984 *

Also Published As

Publication number Publication date
WO1999027376A1 (en) 1999-06-03
CN1141593C (en) 2004-03-10
GB9912919D0 (en) 1999-08-04
DE19782244T1 (en) 2000-01-05
CN1244925A (en) 2000-02-16
GB2335280A (en) 1999-09-15

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Legal Events

Date Code Title Description
789A Request for publication of translation (sect. 89(a)/1977)
789A Request for publication of translation (sect. 89(a)/1977)
PCNP Patent ceased through non-payment of renewal fee