DE69836407D1 - Anordnung zur Überprüfung der Signalspannungspegelgenauigkeit in einer digitalen Testeinrichtung - Google Patents

Anordnung zur Überprüfung der Signalspannungspegelgenauigkeit in einer digitalen Testeinrichtung

Info

Publication number
DE69836407D1
DE69836407D1 DE69836407T DE69836407T DE69836407D1 DE 69836407 D1 DE69836407 D1 DE 69836407D1 DE 69836407 T DE69836407 T DE 69836407T DE 69836407 T DE69836407 T DE 69836407T DE 69836407 D1 DE69836407 D1 DE 69836407D1
Authority
DE
Germany
Prior art keywords
driver
testing
receiver
voltage level
pmu
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69836407T
Other languages
English (en)
Other versions
DE69836407T2 (de
Inventor
Heather L Stickler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Avago Technologies International Sales Pte Ltd
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE69836407D1 publication Critical patent/DE69836407D1/de
Application granted granted Critical
Publication of DE69836407T2 publication Critical patent/DE69836407T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69836407T 1997-11-26 1998-09-14 Anordnung zur Überprüfung der Signalspannungspegelgenauigkeit in einer digitalen Testeinrichtung Expired - Fee Related DE69836407T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/979,511 US6025708A (en) 1997-11-26 1997-11-26 System for verifying signal voltage level accuracy on a digital testing device
US979511 1997-11-26

Publications (2)

Publication Number Publication Date
DE69836407D1 true DE69836407D1 (de) 2006-12-28
DE69836407T2 DE69836407T2 (de) 2007-07-05

Family

ID=25526931

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69836407T Expired - Fee Related DE69836407T2 (de) 1997-11-26 1998-09-14 Anordnung zur Überprüfung der Signalspannungspegelgenauigkeit in einer digitalen Testeinrichtung

Country Status (4)

Country Link
US (1) US6025708A (de)
EP (1) EP0919822B1 (de)
JP (1) JPH11274261A (de)
DE (1) DE69836407T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6192496B1 (en) * 1997-11-26 2001-02-20 Agilent Technologies, Inc. System for verifying signal timing accuracy on a digital testing device
WO2001093117A2 (en) * 2000-06-01 2001-12-06 Siemens Dematic Electronics Assembly Systems, Inc. Electronics assembly systems customer benefit modeling tools and methods
US8015333B1 (en) * 2001-06-04 2011-09-06 Digi International Inc. Method and apparatus for the detection of the end of a daisy chain
US6820226B2 (en) * 2002-01-07 2004-11-16 International Business Machines Corporation Method, apparatus and computer program product for contention testing
US6804620B1 (en) * 2003-03-21 2004-10-12 Advantest Corporation Calibration method for system performance validation of automatic test equipment
US7106081B2 (en) * 2004-07-08 2006-09-12 Verigy Ipco Parallel calibration system for a test device
US7552370B2 (en) * 2006-03-31 2009-06-23 Robert Pochowski Application specific distributed test engine architecture system and method
WO2008152695A1 (ja) * 2007-06-12 2008-12-18 Fujitsu Limited 電子装置、電子装置の試験方法
US7683607B2 (en) * 2007-09-25 2010-03-23 Himax Display, Inc. Connection testing apparatus and method and chip using the same
US7802160B2 (en) * 2007-12-06 2010-09-21 Advantest Corporation Test apparatus and calibration method
CN101968527B (zh) * 2009-07-27 2013-06-19 智邦科技股份有限公司 ***级封装的装置批次测试方法及其装置批次测试***
DE102011084143A1 (de) * 2011-10-07 2013-04-11 Rohde & Schwarz Gmbh & Co. Kg Messsoftware unterstütztes Messsystem und Messverfahren
CN102692597B (zh) * 2012-06-15 2015-10-28 株洲南车时代电气股份有限公司 一种感应洁具pcb板通用自动测试***及其方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3541440A (en) * 1967-08-22 1970-11-17 Rca Corp Use in an automatic testing system of a simulator of an article being tested for testing the testing system
US4806852A (en) * 1984-09-07 1989-02-21 Megatest Corporation Automatic test system with enhanced performance of timing generators
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5262716A (en) * 1992-04-21 1993-11-16 Hewlett-Packard Company Tester calibration procedure which includes fixturing
US5256964A (en) * 1992-07-31 1993-10-26 International Business Machines Corporation Tester calibration verification device
JPH06148279A (ja) * 1992-10-30 1994-05-27 Yokogawa Hewlett Packard Ltd 電子デバイス試験・測定装置、およびそのタイミングならびに電圧レベル校正方法
US5504432A (en) * 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment
US5390194A (en) * 1993-11-17 1995-02-14 Grumman Aerospace Corporation ATG test station
US5633596A (en) * 1994-01-11 1997-05-27 Key Solutions Ltd. Fixtureless automatic test equipment and a method for registration for use therewith
US5485096A (en) * 1994-04-05 1996-01-16 Aksu; Allen Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards
US5471145A (en) * 1994-04-07 1995-11-28 Texas Instruments Incorporated Calibrating transition dependent timing errors in automatic test equipment using a precise pulse width generator
US5539305A (en) * 1994-10-03 1996-07-23 Botka; Julius K. Calibration board for an electronic circuit tester
US5590136A (en) * 1995-01-25 1996-12-31 Hewlett-Packard Co Method for creating an in-circuit test for an electronic device

Also Published As

Publication number Publication date
EP0919822B1 (de) 2006-11-15
EP0919822A2 (de) 1999-06-02
JPH11274261A (ja) 1999-10-08
US6025708A (en) 2000-02-15
EP0919822A3 (de) 2003-11-12
DE69836407T2 (de) 2007-07-05

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE., SG

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee