DE69411890D1 - Konfigurierbare integrierte Schaltung mit komplementären nichtflüchtigen Speicherzellen - Google Patents
Konfigurierbare integrierte Schaltung mit komplementären nichtflüchtigen SpeicherzellenInfo
- Publication number
- DE69411890D1 DE69411890D1 DE69411890T DE69411890T DE69411890D1 DE 69411890 D1 DE69411890 D1 DE 69411890D1 DE 69411890 T DE69411890 T DE 69411890T DE 69411890 T DE69411890 T DE 69411890T DE 69411890 D1 DE69411890 D1 DE 69411890D1
- Authority
- DE
- Germany
- Prior art keywords
- integrated circuit
- volatile memory
- memory cells
- complementary non
- configurable integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/026—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in sense amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0441—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Logic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/014,311 US5497475A (en) | 1993-02-05 | 1993-02-05 | Configurable integrated circuit having true and shadow EPROM registers |
PCT/US1994/001294 WO1994018676A2 (en) | 1993-02-05 | 1994-02-04 | Circuit configuration register having true and shadow eprom registers |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69411890D1 true DE69411890D1 (de) | 1998-08-27 |
Family
ID=21764715
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69411890T Expired - Lifetime DE69411890D1 (de) | 1993-02-05 | 1994-02-04 | Konfigurierbare integrierte Schaltung mit komplementären nichtflüchtigen Speicherzellen |
Country Status (6)
Country | Link |
---|---|
US (1) | US5497475A (de) |
EP (1) | EP0682803B1 (de) |
JP (1) | JPH08506683A (de) |
KR (1) | KR960700512A (de) |
DE (1) | DE69411890D1 (de) |
WO (1) | WO1994018676A2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6330186B2 (en) * | 1996-02-19 | 2001-12-11 | Citizen Watch Co, Ltd. | Non-volatile semiconductor memory device having electrically programable memory matrix array |
US5764079A (en) | 1996-03-11 | 1998-06-09 | Altera Corporation | Sample and load scheme for observability of internal nodes in a PLD |
DE60043651D1 (de) * | 1999-02-01 | 2010-02-25 | Renesas Tech Corp | Integrierte halbleiterschaltung und nichtflüchtiges speicherelement |
US6453431B1 (en) | 1999-07-01 | 2002-09-17 | International Business Machines Corporation | System technique for detecting soft errors in statically coupled CMOS logic |
FR2838233A1 (fr) * | 2002-04-04 | 2003-10-10 | St Microelectronics Sa | Procede de programmation de cellules memoire par claquage d'elements antifusible |
US7112993B2 (en) * | 2004-12-23 | 2006-09-26 | Actel Corporation | Non-volatile memory configuration scheme for volatile-memory-based programmable circuits in an FPGA |
US8811109B2 (en) | 2012-02-27 | 2014-08-19 | Qualcomm Incorporated | Memory pre-decoder circuits employing pulse latch(es) for reducing memory access times, and related systems and methods |
CN109828794B (zh) * | 2017-11-23 | 2021-09-17 | 建兴储存科技(广州)有限公司 | 固态储存装置及其相关程序的载入方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4519090A (en) * | 1982-07-27 | 1985-05-21 | General Electric Company | Testable time delay |
JPH0752217B2 (ja) * | 1986-12-20 | 1995-06-05 | 富士通株式会社 | 半導体装置 |
KR930000963B1 (ko) * | 1988-03-09 | 1993-02-11 | 가부시기가이샤 도오시바 | 불휘발성 메모리 회로장치 |
FR2629248B1 (fr) * | 1988-03-25 | 1992-04-24 | Sgs Thomson Microelectronics | Procede de test de memoire a programmation unique et memoire correspondante |
US4852060A (en) * | 1988-03-31 | 1989-07-25 | International Business Machines Corporation | Soft error resistant data storage cells |
JP2537264B2 (ja) * | 1988-04-13 | 1996-09-25 | 株式会社東芝 | 半導体記憶装置 |
US5111423A (en) * | 1988-07-21 | 1992-05-05 | Altera Corporation | Programmable interface for computer system peripheral circuit card |
US4930098A (en) * | 1988-12-30 | 1990-05-29 | Intel Corporation | Shift register programming for a programmable logic device |
US5198997A (en) * | 1989-08-11 | 1993-03-30 | Sony Corporation | Ultraviolet erasable nonvolatile memory with current mirror circuit type sense amplifier |
JPH0793026B2 (ja) * | 1989-09-20 | 1995-10-09 | 富士通株式会社 | デコーダ回路 |
JPH0810728B2 (ja) * | 1990-02-01 | 1996-01-31 | 株式会社東芝 | 半導体記憶装置 |
US5181205A (en) * | 1990-04-10 | 1993-01-19 | National Semiconductor Corporation | Short circuit detector circuit for memory arrays |
US5274778A (en) * | 1990-06-01 | 1993-12-28 | National Semiconductor Corporation | EPROM register providing a full time static output signal |
JPH04119597A (ja) * | 1990-09-07 | 1992-04-21 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置のセンスアンプ |
US5187392A (en) * | 1991-07-31 | 1993-02-16 | Intel Corporation | Programmable logic device with limited signal swing |
-
1993
- 1993-02-05 US US08/014,311 patent/US5497475A/en not_active Expired - Fee Related
-
1994
- 1994-02-04 KR KR1019950702985A patent/KR960700512A/ko not_active Application Discontinuation
- 1994-02-04 DE DE69411890T patent/DE69411890D1/de not_active Expired - Lifetime
- 1994-02-04 WO PCT/US1994/001294 patent/WO1994018676A2/en active IP Right Grant
- 1994-02-04 JP JP6518250A patent/JPH08506683A/ja active Pending
- 1994-02-04 EP EP94907974A patent/EP0682803B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR960700512A (ko) | 1996-01-20 |
US5497475A (en) | 1996-03-05 |
WO1994018676A3 (en) | 1994-10-13 |
WO1994018676A2 (en) | 1994-08-18 |
EP0682803A1 (de) | 1995-11-22 |
EP0682803B1 (de) | 1998-07-22 |
JPH08506683A (ja) | 1996-07-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |