DE60336560D1 - Schutzverfahren für ein halbleiterbauelement und dieses verwendendes schutzgerät für ein halbleiterbauelement - Google Patents
Schutzverfahren für ein halbleiterbauelement und dieses verwendendes schutzgerät für ein halbleiterbauelementInfo
- Publication number
- DE60336560D1 DE60336560D1 DE60336560T DE60336560T DE60336560D1 DE 60336560 D1 DE60336560 D1 DE 60336560D1 DE 60336560 T DE60336560 T DE 60336560T DE 60336560 T DE60336560 T DE 60336560T DE 60336560 D1 DE60336560 D1 DE 60336560D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor component
- protection device
- protection
- protection method
- use protection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
- H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
- H02H5/044—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using a semiconductor device to sense the temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Electronic Switches (AREA)
- Protection Of Static Devices (AREA)
- Emergency Protection Circuit Devices (AREA)
- Control Of Voltage And Current In General (AREA)
- Power Conversion In General (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002204729A JP3990218B2 (ja) | 2002-07-12 | 2002-07-12 | 半導体素子の保護装置 |
PCT/JP2003/008786 WO2004008500A2 (en) | 2002-07-12 | 2003-07-10 | Method of protecting semiconductor device and protection apparatus for semiconductor device using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60336560D1 true DE60336560D1 (de) | 2011-05-12 |
Family
ID=30112732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60336560T Expired - Lifetime DE60336560D1 (de) | 2002-07-12 | 2003-07-10 | Schutzverfahren für ein halbleiterbauelement und dieses verwendendes schutzgerät für ein halbleiterbauelement |
Country Status (8)
Country | Link |
---|---|
US (1) | US7248452B2 (de) |
EP (1) | EP1522089B1 (de) |
JP (2) | JP3990218B2 (de) |
KR (1) | KR100749181B1 (de) |
CN (1) | CN1669118B (de) |
AU (1) | AU2003250532A1 (de) |
DE (1) | DE60336560D1 (de) |
WO (1) | WO2004008500A2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4278572B2 (ja) | 2004-06-16 | 2009-06-17 | 矢崎総業株式会社 | 半導体スイッチの制御装置 |
JP4398312B2 (ja) | 2004-07-06 | 2010-01-13 | 矢崎総業株式会社 | 半導体スイッチの制御装置 |
JP4701052B2 (ja) | 2005-09-21 | 2011-06-15 | 矢崎総業株式会社 | 過電流検出装置 |
JP4773822B2 (ja) * | 2005-12-26 | 2011-09-14 | 株式会社オートネットワーク技術研究所 | 電力供給制御装置 |
JP4800772B2 (ja) * | 2006-01-04 | 2011-10-26 | ルネサスエレクトロニクス株式会社 | 過電流検出回路 |
JP4929020B2 (ja) | 2007-04-10 | 2012-05-09 | 矢崎総業株式会社 | 負荷回路の過電流保護装置 |
JP5030717B2 (ja) * | 2007-09-10 | 2012-09-19 | 矢崎総業株式会社 | 過電流保護装置 |
US7843248B1 (en) * | 2007-11-01 | 2010-11-30 | Intersil Americas Inc. | Analog switch with overcurrent detection |
JP5087441B2 (ja) * | 2008-03-19 | 2012-12-05 | 矢崎総業株式会社 | 電力供給装置 |
JP5351694B2 (ja) * | 2009-10-02 | 2013-11-27 | 矢崎総業株式会社 | 半導体スイッチの保護装置 |
JP2011130564A (ja) * | 2009-12-17 | 2011-06-30 | Hitachi Ltd | パワー半導体スイッチ素子の保護装置および保護方法 |
JP5480653B2 (ja) * | 2010-02-05 | 2014-04-23 | 矢崎総業株式会社 | 負荷回路の過電流保護装置 |
JP5351793B2 (ja) * | 2010-02-05 | 2013-11-27 | 矢崎総業株式会社 | 過電流保護装置及び過電流保護システム |
JP5952060B2 (ja) * | 2012-04-05 | 2016-07-13 | 矢崎総業株式会社 | 発熱保護回路及び発熱保護方法 |
US9705394B2 (en) | 2012-05-01 | 2017-07-11 | Shunzou Ohshima | Overcurrent protection power supply apparatus |
JP6597213B2 (ja) * | 2015-11-12 | 2019-10-30 | 株式会社デンソー | 過電流検出装置 |
WO2017134824A1 (ja) | 2016-02-05 | 2017-08-10 | 俊蔵 大島 | 電源装置 |
JP7347316B2 (ja) * | 2020-04-20 | 2023-09-20 | 株式会社オートネットワーク技術研究所 | 給電制御装置 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH056053Y2 (de) | 1987-07-22 | 1993-02-17 | ||
JP2797336B2 (ja) | 1988-09-26 | 1998-09-17 | 日本電気株式会社 | 半導体集積回路 |
JPH06180332A (ja) | 1992-12-14 | 1994-06-28 | Nec Kansai Ltd | 電流検出回路 |
JP2779373B2 (ja) | 1993-03-29 | 1998-07-23 | セイコープレシジョン株式会社 | El素子 |
JP3080823B2 (ja) | 1993-10-15 | 2000-08-28 | モトローラ株式会社 | 半導体集積回路装置 |
EP0691731A1 (de) * | 1994-06-10 | 1996-01-10 | Omron Corporation | Regelungsschaltung für Gleichstrommotor |
JPH0870244A (ja) | 1994-08-30 | 1996-03-12 | Hitachi Ltd | 駆動回路 |
US5563759A (en) | 1995-04-11 | 1996-10-08 | International Rectifier Corporation | Protected three-pin mosgated power switch with separate input reset signal level |
EP0746101B1 (de) | 1995-05-31 | 2001-08-08 | STMicroelectronics S.r.l. | Schaltung zum Erkennen von und Schutz vor Kurzschlüssen für digitale Ausgänge |
JPH09145749A (ja) | 1995-11-29 | 1997-06-06 | Toyota Motor Corp | 電流検出回路 |
JP2940542B2 (ja) * | 1997-05-07 | 1999-08-25 | セイコーエプソン株式会社 | インクジェット式プリントヘッドの駆動波形生成装置及び駆動波形生成方法 |
JPH10335998A (ja) | 1997-06-05 | 1998-12-18 | Denso Corp | 電流検出回路 |
DE19729904A1 (de) | 1997-07-12 | 1999-02-11 | Kammerer Gmbh M | Schaltungsanordnung zur Überwachung von durch eine Last fließenden Strömen |
JP3706515B2 (ja) * | 1998-12-28 | 2005-10-12 | 矢崎総業株式会社 | 電源供給制御装置および電源供給制御方法 |
JP2000235424A (ja) | 1999-02-12 | 2000-08-29 | Yazaki Corp | カレントミラー回路、電流センサ及びこれを具備したスイッチング回路並びにスイッチングデバイス |
JP2000299922A (ja) | 1999-02-12 | 2000-10-24 | Yazaki Corp | 電源供給制御装置および電源供給制御方法 |
JP3509605B2 (ja) | 1999-02-12 | 2004-03-22 | 日信工業株式会社 | 電気機器駆動回路における電界効果トランジスタの過熱診断装置 |
JP2000308340A (ja) * | 1999-02-19 | 2000-11-02 | Yazaki Corp | ヒューズレスdc/dcコンバータ |
JP2000350440A (ja) | 1999-06-01 | 2000-12-15 | Murata Mfg Co Ltd | 降圧型スイッチング電源回路 |
KR100360325B1 (ko) * | 1999-06-18 | 2002-11-09 | 마쯔시다덴기산교 가부시키가이샤 | 출력제어장치 |
US6166530A (en) * | 2000-02-11 | 2000-12-26 | Advanced Analogic Technologies, Inc. | Current-Limited switch with fast transient response |
JP2002017036A (ja) | 2000-06-29 | 2002-01-18 | Nissan Motor Co Ltd | 過電流検知回路 |
US6377032B1 (en) * | 2000-07-20 | 2002-04-23 | Semtech Corporation | Method and apparatus for virtual current sensing in DC-DC switched mode power supplies |
JP3741949B2 (ja) * | 2000-07-24 | 2006-02-01 | 矢崎総業株式会社 | 半導体スイッチング装置 |
JP3914004B2 (ja) * | 2001-05-25 | 2007-05-16 | 矢崎総業株式会社 | 半導体素子の過電流検出・保護装置 |
US6552889B1 (en) * | 2001-07-17 | 2003-04-22 | Vishay Siliconix | Current limiting technique for hybrid power MOSFET circuits |
US6624994B1 (en) * | 2001-11-09 | 2003-09-23 | National Semiconductor Corporation | Apparatus and method for over-current protection of an analog switch |
-
2002
- 2002-07-12 JP JP2002204729A patent/JP3990218B2/ja not_active Expired - Fee Related
-
2003
- 2003-07-10 EP EP03764163A patent/EP1522089B1/de not_active Expired - Fee Related
- 2003-07-10 US US10/519,745 patent/US7248452B2/en not_active Expired - Fee Related
- 2003-07-10 AU AU2003250532A patent/AU2003250532A1/en not_active Abandoned
- 2003-07-10 WO PCT/JP2003/008786 patent/WO2004008500A2/en active Application Filing
- 2003-07-10 KR KR1020047021572A patent/KR100749181B1/ko not_active IP Right Cessation
- 2003-07-10 DE DE60336560T patent/DE60336560D1/de not_active Expired - Lifetime
- 2003-07-10 CN CN038164655A patent/CN1669118B/zh not_active Expired - Fee Related
-
2007
- 2007-01-22 JP JP2007011932A patent/JP2007159159A/ja not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2004048498A (ja) | 2004-02-12 |
KR20050016677A (ko) | 2005-02-21 |
WO2004008500A2 (en) | 2004-01-22 |
JP2007159159A (ja) | 2007-06-21 |
EP1522089A2 (de) | 2005-04-13 |
CN1669118A (zh) | 2005-09-14 |
EP1522089B1 (de) | 2011-03-30 |
WO2004008500A3 (en) | 2004-05-21 |
US7248452B2 (en) | 2007-07-24 |
US20050275990A1 (en) | 2005-12-15 |
CN1669118B (zh) | 2010-10-06 |
JP3990218B2 (ja) | 2007-10-10 |
KR100749181B1 (ko) | 2007-08-13 |
AU2003250532A1 (en) | 2004-02-02 |
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