DE60221625D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number
DE60221625D1
DE60221625D1 DE60221625T DE60221625T DE60221625D1 DE 60221625 D1 DE60221625 D1 DE 60221625D1 DE 60221625 T DE60221625 T DE 60221625T DE 60221625 T DE60221625 T DE 60221625T DE 60221625 D1 DE60221625 D1 DE 60221625D1
Authority
DE
Germany
Prior art keywords
semiconductor circuit
integrated semiconductor
integrated
circuit
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60221625T
Other languages
English (en)
Other versions
DE60221625T2 (de
Inventor
Toru Koga
Shinya Fujioka
Katsuhiro Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Semiconductor Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE60221625D1 publication Critical patent/DE60221625D1/de
Application granted granted Critical
Publication of DE60221625T2 publication Critical patent/DE60221625T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2227—Standby or low power modes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Stand-By Power Supply Arrangements (AREA)
DE60221625T 2001-11-28 2002-03-28 Integrierte Halbleiterschaltung Expired - Lifetime DE60221625T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001362489 2001-11-28
JP2001362489A JP4132795B2 (ja) 2001-11-28 2001-11-28 半導体集積回路

Publications (2)

Publication Number Publication Date
DE60221625D1 true DE60221625D1 (de) 2007-09-20
DE60221625T2 DE60221625T2 (de) 2007-11-22

Family

ID=19172979

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60221625T Expired - Lifetime DE60221625T2 (de) 2001-11-28 2002-03-28 Integrierte Halbleiterschaltung

Country Status (7)

Country Link
US (1) US6683491B2 (de)
EP (1) EP1317044B1 (de)
JP (1) JP4132795B2 (de)
KR (1) KR100799948B1 (de)
CN (1) CN1173402C (de)
DE (1) DE60221625T2 (de)
TW (1) TW550584B (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100426443B1 (ko) * 2002-06-29 2004-04-13 주식회사 하이닉스반도체 딥 파워다운 제어 회로
KR100452327B1 (ko) * 2002-07-08 2004-10-12 삼성전자주식회사 반도체 메모리 장치의 내부 전원 전압 발생회로
JP2004178782A (ja) * 2002-10-04 2004-06-24 Sharp Corp 半導体記憶装置およびその制御方法および携帯電子機器
JP4386706B2 (ja) 2003-11-06 2009-12-16 富士通マイクロエレクトロニクス株式会社 半導体記憶装置
KR100562646B1 (ko) * 2004-12-22 2006-03-20 주식회사 하이닉스반도체 저전압용 반도체 메모리 장치
KR100715147B1 (ko) * 2005-10-06 2007-05-10 삼성전자주식회사 전류소모를 감소시키는 내부전원전압 발생회로를 가지는멀티칩 반도체 메모리 장치
KR20100035428A (ko) * 2008-09-26 2010-04-05 삼성전자주식회사 디스플레이 장치 및 방법
JP5742508B2 (ja) * 2011-06-27 2015-07-01 富士通セミコンダクター株式会社 半導体メモリ、システムおよび半導体メモリの動作方法
US9417675B2 (en) * 2014-05-29 2016-08-16 Silicon Storage Technology, Inc. Power sequencing for embedded flash memory devices
US9997230B1 (en) * 2017-06-20 2018-06-12 Elite Semiconductor Memory Technology Inc. Reference voltage pre-processing circuit and reference voltage pre-processing method for a reference voltage buffer
GB201718054D0 (en) * 2017-11-01 2017-12-13 Smith & Nephew Sterilization of integrated negative pressure wound treatment apparatuses and sterilization methods
US11257549B2 (en) 2020-05-08 2022-02-22 Micron Technology, Inc. Sequential voltage control for a memory device

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07220472A (ja) * 1994-01-31 1995-08-18 Mitsubishi Electric Corp 内部電源回路
FR2724025B1 (fr) * 1994-08-31 1997-01-03 Sgs Thomson Microelectronics Circuit integre avec fonction de demarrage rapide de sources de tension ou courant de reference
JP3645593B2 (ja) * 1994-09-09 2005-05-11 株式会社ルネサステクノロジ 半導体集積回路装置
JP3641511B2 (ja) * 1995-06-16 2005-04-20 株式会社ルネサステクノロジ 半導体装置
TW324101B (en) * 1995-12-21 1998-01-01 Hitachi Ltd Semiconductor integrated circuit and its working method
JP3319960B2 (ja) * 1996-10-17 2002-09-03 富士通株式会社 半導体装置
JP4094104B2 (ja) * 1997-02-27 2008-06-04 株式会社東芝 半導体集積回路装置および記憶装置
TW404063B (en) * 1997-02-27 2000-09-01 Toshiba Corp Semiconductor integrated circuit apparatus and semiconductor memory apparatus
JPH10283776A (ja) * 1997-04-04 1998-10-23 Mitsubishi Electric Corp 半導体記憶装置
JP3235516B2 (ja) * 1997-06-12 2001-12-04 日本電気株式会社 半導体集積回路
JPH11186527A (ja) * 1997-12-24 1999-07-09 Hitachi Ltd ラッチ制御回路、半導体記憶装置、及びデータ処理装置
JP3480309B2 (ja) * 1998-05-21 2003-12-15 松下電器産業株式会社 半導体記憶装置
JP4390304B2 (ja) * 1998-05-26 2009-12-24 株式会社ルネサステクノロジ 半導体集積回路装置
JP2000075944A (ja) * 1998-08-31 2000-03-14 Hitachi Ltd 半導体装置
JP2000113693A (ja) * 1998-10-08 2000-04-21 Hitachi Ltd 不揮発性メモリおよび半導体集積回路
JP3233911B2 (ja) * 1999-03-17 2001-12-04 株式会社 沖マイクロデザイン 半導体集積回路装置
JP4043142B2 (ja) * 1999-05-18 2008-02-06 富士通株式会社 メモリデバイス
US6563746B2 (en) 1999-11-09 2003-05-13 Fujitsu Limited Circuit for entering/exiting semiconductor memory device into/from low power consumption mode and method of controlling internal circuit at low power consumption mode

Also Published As

Publication number Publication date
EP1317044B1 (de) 2007-08-08
JP2003162895A (ja) 2003-06-06
CN1421929A (zh) 2003-06-04
EP1317044A3 (de) 2005-08-17
KR20030043575A (ko) 2003-06-02
CN1173402C (zh) 2004-10-27
JP4132795B2 (ja) 2008-08-13
EP1317044A2 (de) 2003-06-04
US6683491B2 (en) 2004-01-27
KR100799948B1 (ko) 2008-02-01
DE60221625T2 (de) 2007-11-22
TW550584B (en) 2003-09-01
US20030098741A1 (en) 2003-05-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU MICROELECTRONICS LTD., TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU SEMICONDUCTOR LTD., YOKOHAMA, KANAGAWA, JP

8328 Change in the person/name/address of the agent

Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE