DE10297044B8 - Testsockel - Google Patents

Testsockel Download PDF

Info

Publication number
DE10297044B8
DE10297044B8 DE10297044T DE10297044T DE10297044B8 DE 10297044 B8 DE10297044 B8 DE 10297044B8 DE 10297044 T DE10297044 T DE 10297044T DE 10297044 T DE10297044 T DE 10297044T DE 10297044 B8 DE10297044 B8 DE 10297044B8
Authority
DE
Germany
Prior art keywords
test sockets
sockets
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE10297044T
Other languages
English (en)
Other versions
DE10297044B4 (de
DE10297044T5 (de
Inventor
Gerd Frankowsky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Polaris Innovations Ltd
Original Assignee
Qimonda AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qimonda AG filed Critical Qimonda AG
Publication of DE10297044T5 publication Critical patent/DE10297044T5/de
Application granted granted Critical
Publication of DE10297044B4 publication Critical patent/DE10297044B4/de
Publication of DE10297044B8 publication Critical patent/DE10297044B8/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
DE10297044T 2001-07-17 2002-07-09 Testsockel Expired - Fee Related DE10297044B8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/906,886 US6677770B2 (en) 2001-07-17 2001-07-17 Programmable test socket
US09/906,886 2001-07-17
PCT/EP2002/007583 WO2003010547A2 (en) 2001-07-17 2002-07-09 Programmable test socket

Publications (3)

Publication Number Publication Date
DE10297044T5 DE10297044T5 (de) 2004-08-12
DE10297044B4 DE10297044B4 (de) 2011-06-01
DE10297044B8 true DE10297044B8 (de) 2013-01-03

Family

ID=25423149

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10297044T Expired - Fee Related DE10297044B8 (de) 2001-07-17 2002-07-09 Testsockel

Country Status (7)

Country Link
US (1) US6677770B2 (de)
JP (1) JP2004536324A (de)
KR (1) KR20040020953A (de)
CN (1) CN100350253C (de)
DE (1) DE10297044B8 (de)
TW (1) TW583402B (de)
WO (1) WO2003010547A2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050049578A1 (en) * 2000-04-14 2005-03-03 Hosheng Tu Implantable ocular pump to reduce intraocular pressure
US6927588B1 (en) * 2002-04-03 2005-08-09 Jeffrey David Snelgrove Ball alignment plate testing apparatus and method for testing semiconductor chips
US6998862B2 (en) * 2003-04-28 2006-02-14 Micron Technology, Inc. Test socket for semiconductor components having serviceable nest
US7256595B2 (en) * 2004-03-22 2007-08-14 Micron Technology, Inc. Test sockets, test systems, and methods for testing microfeature devices
KR100563603B1 (ko) * 2004-06-04 2006-03-23 주식회사 대성엔지니어링 인서트 장치
US7118385B1 (en) 2005-09-22 2006-10-10 International Business Machines Corporation Apparatus for implementing a self-centering land grid array socket
KR100822281B1 (ko) * 2006-11-29 2008-04-16 미래산업 주식회사 반도체 소자 테스트 핸들러용 캐리어모듈
US7955892B2 (en) * 2007-11-25 2011-06-07 Globalfoundries Inc. Multiple size package socket
KR101437092B1 (ko) * 2013-09-30 2014-09-03 주식회사 엔티에스 반도체 칩 검사장치
TWI680019B (zh) * 2016-05-11 2019-12-21 萬潤科技股份有限公司 晶圓殘膠清潔方法及裝置
US20180172760A1 (en) * 2016-12-20 2018-06-21 Multitest Elektronische Systeme Gmbh Contact device and a method of testing a singulated electronic component using a contact device
US10789550B2 (en) * 2017-04-13 2020-09-29 Battelle Memorial Institute System and method for generating test vectors
CN109683593B (zh) * 2018-12-29 2021-09-21 上海辛格林纳新时达电机有限公司 一种脉冲型伺服驱动器基本功能测试方法及设备

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4243056A1 (de) * 1992-07-06 1994-01-13 Wells Electronics Fassung für integrierte Schaltungsträger
US5290192A (en) * 1992-09-28 1994-03-01 Wells Electronics, Inc. Chip carrier socket

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5557212A (en) * 1994-11-18 1996-09-17 Isaac; George L. Semiconductor test socket and contacts
US5926027A (en) * 1995-09-28 1999-07-20 Bumb, Jr.; Frank E. Apparatus and method for testing a device
US5791914A (en) * 1995-11-21 1998-08-11 Loranger International Corporation Electrical socket with floating guide plate
KR0175268B1 (ko) * 1996-05-10 1999-04-01 김광호 수평 하향식 접속 방식의 베어 칩 테스트 장치
US6181149B1 (en) 1996-09-26 2001-01-30 Delaware Capital Formation, Inc. Grid array package test contactor
JPH11329648A (ja) 1998-05-19 1999-11-30 Molex Inc Ｉｃデバイスソケット
JP2001249163A (ja) * 2000-03-06 2001-09-14 Takai Kogyo Kk Ｉｃデバイスの試験用ソケット

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4243056A1 (de) * 1992-07-06 1994-01-13 Wells Electronics Fassung für integrierte Schaltungsträger
US5290192A (en) * 1992-09-28 1994-03-01 Wells Electronics, Inc. Chip carrier socket

Also Published As

Publication number Publication date
CN1537232A (zh) 2004-10-13
US20030016038A1 (en) 2003-01-23
TW583402B (en) 2004-04-11
WO2003010547A2 (en) 2003-02-06
KR20040020953A (ko) 2004-03-09
WO2003010547A3 (en) 2003-09-25
CN100350253C (zh) 2007-11-21
US6677770B2 (en) 2004-01-13
DE10297044B4 (de) 2011-06-01
JP2004536324A (ja) 2004-12-02
DE10297044T5 (de) 2004-08-12

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R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee