DE60219990D1 - Speichertest-Schaltung - Google Patents
Speichertest-SchaltungInfo
- Publication number
- DE60219990D1 DE60219990D1 DE60219990T DE60219990T DE60219990D1 DE 60219990 D1 DE60219990 D1 DE 60219990D1 DE 60219990 T DE60219990 T DE 60219990T DE 60219990 T DE60219990 T DE 60219990T DE 60219990 D1 DE60219990 D1 DE 60219990D1
- Authority
- DE
- Germany
- Prior art keywords
- test circuit
- memory test
- memory
- circuit
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/842,433 US6574764B2 (en) | 2001-04-25 | 2001-04-25 | Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery |
US842433 | 2004-05-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60219990D1 true DE60219990D1 (de) | 2007-06-21 |
DE60219990T2 DE60219990T2 (de) | 2008-01-17 |
Family
ID=25287279
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60219990T Expired - Fee Related DE60219990T2 (de) | 2001-04-25 | 2002-03-22 | Speichertest-Schaltung |
Country Status (6)
Country | Link |
---|---|
US (1) | US6574764B2 (de) |
EP (2) | EP1701359A1 (de) |
JP (1) | JP4194799B2 (de) |
KR (1) | KR100920277B1 (de) |
DE (1) | DE60219990T2 (de) |
TW (1) | TW583680B (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6763490B1 (en) * | 2000-09-25 | 2004-07-13 | Agilent Technologies, Inc. | Method and apparatus for coordinating program execution in a site controller with pattern execution in a tester |
US20030088810A1 (en) * | 2001-11-02 | 2003-05-08 | Sun Microsystems, Inc. | Methods and apparatus for determining software component sizes associated with errors |
US7117410B2 (en) * | 2002-12-20 | 2006-10-03 | Teradyne, Inc. | Distributed failure analysis memory for automatic test equipment |
WO2004079428A1 (ja) * | 2003-03-03 | 2004-09-16 | Nikon Corporation | 顕微鏡デジタル画像取得システム |
US7039545B2 (en) * | 2004-04-19 | 2006-05-02 | Agilent Technologies, Inc. | Apparatus, system and/or method for converting a serial test to a parallel test |
US20050285612A1 (en) * | 2004-06-23 | 2005-12-29 | From Thirty Incorporated | Apparatus for measuring DC parameters in a wafer burn-in system |
JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
US7528622B2 (en) * | 2005-07-06 | 2009-05-05 | Optimal Test Ltd. | Methods for slow test time detection of an integrated circuit during parallel testing |
DE102005048872A1 (de) * | 2005-10-12 | 2007-04-26 | Mühlbauer Ag | Testkopfeinrichtung |
US7536662B2 (en) * | 2006-06-27 | 2009-05-19 | Atrenta, Inc. | Method for recognizing and verifying FIFO structures in integrated circuit designs |
US8099583B2 (en) * | 2006-08-23 | 2012-01-17 | Axis Semiconductor, Inc. | Method of and apparatus and architecture for real time signal processing by switch-controlled programmable processor configuring and flexible pipeline and parallel processing |
US20090112548A1 (en) * | 2007-10-30 | 2009-04-30 | Conner George W | A method for testing in a reconfigurable tester |
US20090113245A1 (en) * | 2007-10-30 | 2009-04-30 | Teradyne, Inc. | Protocol aware digital channel apparatus |
US7792656B2 (en) * | 2007-12-19 | 2010-09-07 | Advantest Corporation | Test apparatus |
US8078833B2 (en) * | 2008-05-29 | 2011-12-13 | Axis Semiconductor, Inc. | Microprocessor with highly configurable pipeline and executional unit internal hierarchal structures, optimizable for different types of computational functions |
US8181003B2 (en) * | 2008-05-29 | 2012-05-15 | Axis Semiconductor, Inc. | Instruction set design, control and communication in programmable microprocessor cores and the like |
US8458536B2 (en) * | 2008-07-17 | 2013-06-04 | Marvell World Trade Ltd. | Data recovery in solid state memory devices |
US8527677B1 (en) | 2010-06-25 | 2013-09-03 | Altera Corporation | Serial communications links with bonded first-in-first-out buffer circuitry |
CN103163448B (zh) * | 2011-12-16 | 2016-01-27 | 中国科学院微电子研究所 | 对现场可编程门阵列中查找表延迟故障进行检测的方法 |
US10268572B2 (en) * | 2017-08-03 | 2019-04-23 | Fujitsu Limited | Interactive software program repair |
US10565036B1 (en) | 2019-02-14 | 2020-02-18 | Axis Semiconductor, Inc. | Method of synchronizing host and coprocessor operations via FIFO communication |
CN116705137B (zh) * | 2023-05-08 | 2024-04-02 | 深圳市晶存科技有限公司 | 固态硬盘的测试模式切换方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5062109A (en) * | 1988-09-02 | 1991-10-29 | Advantest Corporation | Memory tester |
US5067129A (en) * | 1989-08-16 | 1991-11-19 | International Business Machines Corp. | Service processor tester |
JP3700797B2 (ja) * | 1996-08-09 | 2005-09-28 | 株式会社アドバンテスト | メモリ試験装置 |
US5930735A (en) * | 1997-04-30 | 1999-07-27 | Credence Systems Corporation | Integrated circuit tester including at least one quasi-autonomous test instrument |
US6067648A (en) * | 1998-03-02 | 2000-05-23 | Tanisys Technology, Inc. | Programmable pulse generator |
EP0992907B1 (de) * | 1998-10-06 | 2005-09-28 | Texas Instruments Inc. | Verwaltung eines FIFO zur Abalufverfolgung |
US6233678B1 (en) * | 1998-11-05 | 2001-05-15 | Hewlett-Packard Company | Method and apparatus for profiling of non-instrumented programs and dynamic processing of profile data |
KR100308621B1 (ko) * | 1998-11-19 | 2001-12-17 | 윤종용 | 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템 |
US6320812B1 (en) * | 2000-09-20 | 2001-11-20 | Agilent Technologies, Inc. | Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed |
-
2001
- 2001-04-25 US US09/842,433 patent/US6574764B2/en not_active Expired - Lifetime
-
2002
- 2002-01-24 TW TW091101157A patent/TW583680B/zh not_active IP Right Cessation
- 2002-03-22 DE DE60219990T patent/DE60219990T2/de not_active Expired - Fee Related
- 2002-03-22 EP EP06010471A patent/EP1701359A1/de not_active Withdrawn
- 2002-03-22 EP EP02252099A patent/EP1253600B1/de not_active Expired - Fee Related
- 2002-04-24 KR KR1020020022396A patent/KR100920277B1/ko active IP Right Grant
- 2002-04-24 JP JP2002121654A patent/JP4194799B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1701359A1 (de) | 2006-09-13 |
US20020162046A1 (en) | 2002-10-31 |
TW583680B (en) | 2004-04-11 |
EP1253600B1 (de) | 2007-05-09 |
DE60219990T2 (de) | 2008-01-17 |
KR100920277B1 (ko) | 2009-10-08 |
JP4194799B2 (ja) | 2008-12-10 |
EP1253600A3 (de) | 2004-04-21 |
JP2003007089A (ja) | 2003-01-10 |
US6574764B2 (en) | 2003-06-03 |
KR20020082791A (ko) | 2002-10-31 |
EP1253600A2 (de) | 2002-10-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |