CN1823532B - 具有电荷装仓的图像传感器 - Google Patents
具有电荷装仓的图像传感器 Download PDFInfo
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- CN1823532B CN1823532B CN2004800201503A CN200480020150A CN1823532B CN 1823532 B CN1823532 B CN 1823532B CN 2004800201503 A CN2004800201503 A CN 2004800201503A CN 200480020150 A CN200480020150 A CN 200480020150A CN 1823532 B CN1823532 B CN 1823532B
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- 238000009792 diffusion process Methods 0.000 claims abstract description 14
- 230000004075 alteration Effects 0.000 claims description 6
- 239000003086 colorant Substances 0.000 claims 2
- 238000005070 sampling Methods 0.000 description 26
- 238000010586 diagram Methods 0.000 description 21
- 230000009977 dual effect Effects 0.000 description 13
- 238000003860 storage Methods 0.000 description 11
- 230000035945 sensitivity Effects 0.000 description 10
- 230000008901 benefit Effects 0.000 description 8
- 230000010354 integration Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 238000012545 processing Methods 0.000 description 6
- 238000012423 maintenance Methods 0.000 description 5
- 238000004088 simulation Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 3
- 230000010349 pulsation Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 206010070834 Sensitisation Diseases 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000019771 cognition Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- AAOVKJBEBIDNHE-UHFFFAOYSA-N diazepam Chemical compound N=1CC(=O)N(C)C2=CC=C(Cl)C=C2C=1C1=CC=CC=C1 AAOVKJBEBIDNHE-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000008313 sensitization Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 239000010981 turquoise Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
- H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
- H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
- H04N25/134—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/767—Horizontal readout lines, multiplexers or registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
- H04N3/1562—Control of the image-sensor operation, e.g. image processing within the image-sensor for selective scanning, e.g. windowing, zooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/80—Camera processing pipelines; Components thereof
- H04N23/84—Camera processing pipelines; Components thereof for processing colour signals
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Color Television Image Signal Generators (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
Claims (2)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/620,060 | 2003-07-15 | ||
US10/620,060 US7859581B2 (en) | 2003-07-15 | 2003-07-15 | Image sensor with charge binning and dual channel readout |
PCT/US2004/021235 WO2005011264A2 (en) | 2003-07-15 | 2004-07-01 | Image sensor with charge binning |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010101363288A Division CN101778193B (zh) | 2003-07-15 | 2004-07-01 | 具有电荷装仓的图像传感器 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1823532A CN1823532A (zh) | 2006-08-23 |
CN1823532B true CN1823532B (zh) | 2010-09-08 |
Family
ID=34062702
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800201503A Expired - Lifetime CN1823532B (zh) | 2003-07-15 | 2004-07-01 | 具有电荷装仓的图像传感器 |
CN2010101363288A Expired - Lifetime CN101778193B (zh) | 2003-07-15 | 2004-07-01 | 具有电荷装仓的图像传感器 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010101363288A Expired - Lifetime CN101778193B (zh) | 2003-07-15 | 2004-07-01 | 具有电荷装仓的图像传感器 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7859581B2 (zh) |
EP (2) | EP1656799A2 (zh) |
JP (1) | JP4611296B2 (zh) |
KR (2) | KR20060122806A (zh) |
CN (2) | CN1823532B (zh) |
TW (1) | TWI358942B (zh) |
WO (1) | WO2005011264A2 (zh) |
Families Citing this family (73)
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DE19947536A1 (de) * | 1999-10-02 | 2001-04-05 | Philips Corp Intellectual Pty | Verfahren zum Auslesen der Sensorelemente eines Sensors sowie Sensor |
US7492391B1 (en) * | 2003-07-14 | 2009-02-17 | Arecont Vision, Llc. | Wide dynamic range network camera |
US20050062866A1 (en) * | 2003-09-23 | 2005-03-24 | Ang Lin Ping | Multiplexed pixel column architecture for imagers |
US11282891B2 (en) | 2003-11-26 | 2022-03-22 | Samsung Electronics Co., Ltd. | Image sensor with a gated storage node linked to transfer gate |
US7443437B2 (en) * | 2003-11-26 | 2008-10-28 | Micron Technology, Inc. | Image sensor with a gated storage node linked to transfer gate |
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KR100871687B1 (ko) * | 2004-02-11 | 2008-12-05 | 삼성전자주식회사 | 서브 샘플링 모드에서 디스플레이 품질을 개선한 고체촬상 소자 및 그 구동 방법 |
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- 2004-07-01 CN CN2004800201503A patent/CN1823532B/zh not_active Expired - Lifetime
- 2004-07-01 JP JP2006520205A patent/JP4611296B2/ja not_active Expired - Lifetime
- 2004-07-01 KR KR1020067000844A patent/KR20060122806A/ko not_active Application Discontinuation
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Also Published As
Publication number | Publication date |
---|---|
KR101159014B1 (ko) | 2012-06-21 |
WO2005011264A3 (en) | 2005-06-02 |
EP2323409B1 (en) | 2017-08-23 |
EP1656799A2 (en) | 2006-05-17 |
JP4611296B2 (ja) | 2011-01-12 |
JP2007531351A (ja) | 2007-11-01 |
CN1823532A (zh) | 2006-08-23 |
CN101778193A (zh) | 2010-07-14 |
EP2323409A3 (en) | 2013-08-28 |
TWI358942B (en) | 2012-02-21 |
US20050012836A1 (en) | 2005-01-20 |
WO2005011264A2 (en) | 2005-02-03 |
TW200509689A (en) | 2005-03-01 |
US7859581B2 (en) | 2010-12-28 |
CN101778193B (zh) | 2012-01-04 |
KR20110003600A (ko) | 2011-01-12 |
KR20060122806A (ko) | 2006-11-30 |
EP2323409A2 (en) | 2011-05-18 |
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