CN1584774A - 半导体集成电路 - Google Patents
半导体集成电路 Download PDFInfo
- Publication number
- CN1584774A CN1584774A CNA2004100697411A CN200410069741A CN1584774A CN 1584774 A CN1584774 A CN 1584774A CN A2004100697411 A CNA2004100697411 A CN A2004100697411A CN 200410069741 A CN200410069741 A CN 200410069741A CN 1584774 A CN1584774 A CN 1584774A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 50
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- 238000006243 chemical reaction Methods 0.000 claims description 18
- 230000003534 oscillatory effect Effects 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 15
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 13
- 230000003278 mimic effect Effects 0.000 claims description 9
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- 101000766035 Homo sapiens tRNA (guanine(37)-N1)-methyltransferase Proteins 0.000 description 1
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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Images
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
- G06F1/08—Clock generators with changeable or programmable clock frequency
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
- H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2254—Calibration
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
- H03K2005/00019—Variable delay
- H03K2005/00026—Variable delay controlled by an analog electrical signal, e.g. obtained after conversion by a D/A converter
- H03K2005/00032—Dc control of switching transistors
- H03K2005/00039—Dc control of switching transistors having four transistors serially
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K2005/00013—Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
- H03K2005/00078—Fixed delay
- H03K2005/00143—Avoiding variations of delay due to temperature
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Nonlinear Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (29)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003203574A JP2005049970A (ja) | 2003-07-30 | 2003-07-30 | 半導体集積回路 |
JP203574/2003 | 2003-07-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1584774A true CN1584774A (zh) | 2005-02-23 |
CN1584774B CN1584774B (zh) | 2011-06-08 |
Family
ID=34208943
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004100697411A Expired - Fee Related CN1584774B (zh) | 2003-07-30 | 2004-07-14 | 半导体集成电路 |
Country Status (4)
Country | Link |
---|---|
US (5) | US7061825B2 (zh) |
JP (1) | JP2005049970A (zh) |
KR (1) | KR20050014666A (zh) |
CN (1) | CN1584774B (zh) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1949703B (zh) * | 2005-10-14 | 2010-08-04 | 株式会社瑞萨科技 | 收发装置和使用了该收发装置的通信*** |
CN102306034A (zh) * | 2011-08-23 | 2012-01-04 | 北京亚科鸿禹电子有限公司 | 一种fpga 原型验证时钟装置 |
CN103427799A (zh) * | 2012-05-16 | 2013-12-04 | 瑞萨电子株式会社 | 半导体集成电路及其操作方法 |
CN107305405A (zh) * | 2016-04-19 | 2017-10-31 | 罗姆股份有限公司 | 时钟发生装置、电子电路、集成电路、及电气设备 |
CN108334158A (zh) * | 2017-01-20 | 2018-07-27 | 精工爱普生株式会社 | 电路装置、实时时钟装置、电子设备、移动体和验证方法 |
CN110657458A (zh) * | 2018-06-28 | 2020-01-07 | 三美电机株式会社 | 电子控制装置、电子控制用半导体集成电路装置及燃气灶 |
CN110780702A (zh) * | 2018-07-30 | 2020-02-11 | 瑞昱半导体股份有限公司 | 具有分时及分频启动机制的时钟产生***及方法 |
CN111048026A (zh) * | 2018-10-11 | 2020-04-21 | 美格纳半导体有限公司 | 显示驱动器集成电路和调整工作频率的方法 |
CN113507277A (zh) * | 2021-06-02 | 2021-10-15 | 西安电子科技大学 | 一种射频能量采集前端的协同匹配与自调谐*** |
CN114401543A (zh) * | 2022-01-14 | 2022-04-26 | 四川恒湾科技有限公司 | 一种降低基站射频单元功耗的方法及*** |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090319802A1 (en) * | 2002-12-02 | 2009-12-24 | Silverbrook Research Pty Ltd | Key Genaration In An Integrated Circuit |
US7707621B2 (en) * | 2002-12-02 | 2010-04-27 | Silverbrook Research Pty Ltd | Creation and usage of mutually exclusive messages |
JP2005049970A (ja) * | 2003-07-30 | 2005-02-24 | Renesas Technology Corp | 半導体集積回路 |
JP2006039830A (ja) * | 2004-07-26 | 2006-02-09 | Renesas Technology Corp | 半導体集積回路 |
FR2875329A1 (fr) * | 2004-09-15 | 2006-03-17 | St Microelectronics Sa | Lecture de l'etat d'un element de memorisation non volatile |
JP4434906B2 (ja) * | 2004-10-01 | 2010-03-17 | 三洋電機株式会社 | 発振周波数制御回路 |
JP4208864B2 (ja) * | 2005-06-30 | 2009-01-14 | 日本テキサス・インスツルメンツ株式会社 | チューナー用半導体装置及びダイバーシティ受信機 |
JP2007079904A (ja) * | 2005-09-14 | 2007-03-29 | Seiko Epson Corp | 半導体集積回路 |
DE102006004851B4 (de) * | 2006-02-02 | 2012-06-06 | Qimonda Ag | Integrierter Halbleiterspeicher mit Erzeugung von Spannungen |
JP5282994B2 (ja) * | 2007-08-27 | 2013-09-04 | Ntn株式会社 | オートテンショナ |
US7768868B2 (en) * | 2007-06-15 | 2010-08-03 | Micron Technology, Inc. | Digital filters for semiconductor devices |
JP5350049B2 (ja) * | 2009-04-03 | 2013-11-27 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | インターフェース回路 |
JP2011055477A (ja) | 2009-08-07 | 2011-03-17 | Rohm Co Ltd | スイープ機能付きオシレータ回路およびそれを用いたモータ駆動装置 |
TWI400884B (zh) * | 2010-05-28 | 2013-07-01 | Macronix Int Co Ltd | 時鐘積體電路 |
CN102315836B (zh) * | 2010-07-05 | 2014-04-16 | 旺宏电子股份有限公司 | 时钟集成电路 |
TWI444823B (zh) * | 2011-03-31 | 2014-07-11 | Phison Electronics Corp | 參考頻率設定方法、記憶體控制器及快閃記憶體儲存裝置 |
CN102736666B (zh) * | 2011-04-12 | 2016-03-30 | 群联电子股份有限公司 | 参考频率设定方法、存储器控制器及闪存储存装置 |
KR20130016810A (ko) | 2011-08-09 | 2013-02-19 | 에스케이하이닉스 주식회사 | 내부제어신호 조절회로 |
TW201435372A (zh) * | 2012-12-17 | 2014-09-16 | Ps4 Luxco Sarl | 半導體裝置 |
US8922254B2 (en) | 2013-01-29 | 2014-12-30 | Macronix International Co., Ltd. | Drive circuitry compensated for manufacturing and environmental variation |
TWI525415B (zh) * | 2013-02-25 | 2016-03-11 | 群聯電子股份有限公司 | 參考頻率設定方法、記憶體控制器及記憶體儲存裝置 |
US9000490B2 (en) * | 2013-04-19 | 2015-04-07 | Xilinx, Inc. | Semiconductor package having IC dice and voltage tuners |
JP2015036965A (ja) * | 2013-08-16 | 2015-02-23 | 富士通株式会社 | メモリ制御装置、メモリ制御装置の制御方法及び情報処理装置 |
KR101501530B1 (ko) * | 2013-10-10 | 2015-03-11 | 재단법인대구경북과학기술원 | 송수신 동기화 모듈의 오류 검출 시스템 및 그 방법 |
JP6107612B2 (ja) * | 2013-11-14 | 2017-04-05 | 富士通株式会社 | 半導体集積回路、及び、半導体集積回路の試験方法 |
TWI530799B (zh) * | 2013-11-28 | 2016-04-21 | 慧榮科技股份有限公司 | 應用於通用串列匯流排裝置的頻率校正方法及其相關的通用串列匯流排裝置 |
US9444462B2 (en) | 2014-08-13 | 2016-09-13 | Macronix International Co., Ltd. | Stabilization of output timing delay |
US9419596B2 (en) | 2014-09-05 | 2016-08-16 | Macronix International Co., Ltd. | Sense amplifier with improved margin |
US10177747B2 (en) * | 2015-11-20 | 2019-01-08 | Texas Instruments Incorporated | High resolution capture |
CN106230385B (zh) * | 2016-08-31 | 2023-03-28 | 安徽赛腾微电子有限公司 | 振荡频率可调整的时钟产生电路 |
JP7326709B2 (ja) * | 2018-07-20 | 2023-08-16 | セイコーエプソン株式会社 | 回路装置、発振器、電子機器及び移動体 |
US10659012B1 (en) * | 2018-11-08 | 2020-05-19 | Nxp B.V. | Oscillator and method for operating an oscillator |
US11442494B2 (en) * | 2020-06-08 | 2022-09-13 | Analog Devices, Inc. | Apparatus and methods for controlling a clock signal |
Family Cites Families (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5034181B1 (zh) * | 1969-12-13 | 1975-11-06 | ||
JPS5451344A (en) * | 1977-09-29 | 1979-04-23 | Sharp Corp | Automatic frequency adjustment system of lsi system |
JPS5538583A (en) * | 1978-09-13 | 1980-03-18 | Sankyo Seiki Mfg Co Ltd | Exposure control mechanism in cine camera |
FR2649505B1 (fr) | 1989-07-07 | 1991-10-25 | Sgs Thomson Microelectronics | Circuit integre avec oscillateur reglable a frequence independante de la tension d'alimentation |
FR2649504B1 (fr) * | 1989-07-07 | 1991-09-27 | Sgs Thomson Microelectronics | Circuit integre a microprocesseur et horloge interne programmable |
US5440749A (en) | 1989-08-03 | 1995-08-08 | Nanotronics Corporation | High performance, low cost microprocessor architecture |
JPH0483413A (ja) * | 1990-07-26 | 1992-03-17 | Seiko Epson Corp | 発振回路及び集積回路 |
JP2776098B2 (ja) * | 1991-11-27 | 1998-07-16 | 松下電器産業株式会社 | クロック再生回路および時間軸誤差補正装置 |
SE501190C2 (sv) * | 1993-04-28 | 1994-12-05 | Ellemtel Utvecklings Ab | Digitalt styrd kristalloscillator |
JPH086664A (ja) * | 1994-06-15 | 1996-01-12 | Nec Corp | コンピュータおよびそのクロック切り替え方法 |
JP3310482B2 (ja) * | 1994-11-30 | 2002-08-05 | シャープ株式会社 | マイクロコンピュータ |
US5778237A (en) * | 1995-01-10 | 1998-07-07 | Hitachi, Ltd. | Data processor and single-chip microcomputer with changing clock frequency and operating voltage |
KR100470575B1 (ko) * | 1995-01-31 | 2005-06-27 | 가부시끼가이샤 히다치 세이사꾸쇼 | 불휘발성메모리 |
US5805923A (en) * | 1995-05-26 | 1998-09-08 | Sony Corporation | Configurable power management system having a clock stabilization filter that can be enabled or bypassed depending upon whether a crystal or can oscillator is used |
JP3824689B2 (ja) * | 1995-09-05 | 2006-09-20 | 株式会社ルネサステクノロジ | 同期型半導体記憶装置 |
JP3410922B2 (ja) * | 1996-04-23 | 2003-05-26 | 株式会社東芝 | クロック制御回路 |
US5796312A (en) | 1996-05-24 | 1998-08-18 | Microchip Technology Incorporated | Microcontroller with firmware selectable oscillator trimming |
US5694067A (en) | 1996-05-24 | 1997-12-02 | Microchip Technology Incorporated | Microcontroller having a minimal number of external components |
KR100224718B1 (ko) * | 1996-10-30 | 1999-10-15 | 윤종용 | 동기식 메모리장치의 내부 클락 발생기 |
JP3857762B2 (ja) * | 1997-02-17 | 2006-12-13 | 三洋電機株式会社 | 発振回路の周波数調整装置 |
JPH11203864A (ja) * | 1998-01-14 | 1999-07-30 | Mitsubishi Electric Corp | 同期型半導体記憶装置 |
US6275444B1 (en) * | 1998-02-24 | 2001-08-14 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit |
JPH11317080A (ja) * | 1998-03-04 | 1999-11-16 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JPH11312026A (ja) * | 1998-04-28 | 1999-11-09 | Nec Corp | クロック信号切替方法およびクロック信号切替システム |
JP4034886B2 (ja) * | 1998-10-13 | 2008-01-16 | 富士通株式会社 | 半導体装置 |
KR100381966B1 (ko) * | 1998-12-28 | 2004-03-22 | 주식회사 하이닉스반도체 | 반도체메모리장치및그구동방법 |
JP2000268019A (ja) | 1999-03-16 | 2000-09-29 | Hitachi Ltd | 不揮発性メモリ回路を内蔵した半導体集積回路 |
JP4365984B2 (ja) * | 1999-05-14 | 2009-11-18 | キヤノン株式会社 | 再生プラスチック材料の製造方法 |
JP2001044825A (ja) * | 1999-07-28 | 2001-02-16 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP2001068976A (ja) * | 1999-08-30 | 2001-03-16 | Nec Kansai Ltd | 発振器 |
US6271733B1 (en) * | 1999-12-13 | 2001-08-07 | Agere Systems Guardian Corp. | Integrated oscillator circuit with a memory based frequency control circuit and associated methods |
JP2001202154A (ja) | 2000-01-24 | 2001-07-27 | Matsushita Electric Ind Co Ltd | Pll内蔵ワンチップマイクロコンピュータ |
JP2002009614A (ja) | 2000-06-19 | 2002-01-11 | Sony Corp | クロック供給回路 |
US6686803B1 (en) * | 2000-07-10 | 2004-02-03 | Silicon Laboratories, Inc. | Integrated circuit incorporating circuitry for determining which of at least two possible frequencies is present on an externally provided reference signal and method therefor |
JP2002111450A (ja) * | 2000-09-29 | 2002-04-12 | Seiko Epson Corp | 電圧制御型発振回路 |
JP2002215258A (ja) * | 2001-01-23 | 2002-07-31 | Mitsubishi Electric Corp | 半導体集積回路装置 |
US6678205B2 (en) * | 2001-12-26 | 2004-01-13 | Micron Technology, Inc. | Multi-mode synchronous memory device and method of operating and testing same |
JP2004247026A (ja) * | 2003-01-24 | 2004-09-02 | Renesas Technology Corp | 半導体集積回路及びicカード |
KR100528472B1 (ko) * | 2003-03-13 | 2005-11-15 | 삼성전자주식회사 | 동작 모드에 따라 가변 가능한 내부 클록 신호를 생성하는반도체 메모리 장치 |
CN2664290Y (zh) * | 2003-06-24 | 2004-12-15 | 深圳市东方汉华软件技术有限公司 | 一种对振荡频率源进行温度补偿和频率校正的电路结构 |
JP2005049970A (ja) * | 2003-07-30 | 2005-02-24 | Renesas Technology Corp | 半導体集積回路 |
JP2006039830A (ja) * | 2004-07-26 | 2006-02-09 | Renesas Technology Corp | 半導体集積回路 |
-
2003
- 2003-07-30 JP JP2003203574A patent/JP2005049970A/ja active Pending
-
2004
- 2004-06-15 US US10/867,013 patent/US7061825B2/en active Active
- 2004-07-14 CN CN2004100697411A patent/CN1584774B/zh not_active Expired - Fee Related
- 2004-07-14 KR KR1020040054610A patent/KR20050014666A/ko not_active Application Discontinuation
-
2006
- 2006-06-05 US US11/446,219 patent/US7193929B2/en not_active Expired - Lifetime
- 2006-06-05 US US11/446,217 patent/US7196967B2/en not_active Expired - Lifetime
-
2007
- 2007-02-21 US US11/708,346 patent/US7382681B2/en not_active Expired - Lifetime
-
2008
- 2008-04-21 US US12/107,069 patent/US20080309383A1/en not_active Abandoned
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CN103427799A (zh) * | 2012-05-16 | 2013-12-04 | 瑞萨电子株式会社 | 半导体集成电路及其操作方法 |
CN103427799B (zh) * | 2012-05-16 | 2017-05-03 | 瑞萨电子株式会社 | 半导体集成电路及其操作方法 |
CN107305405A (zh) * | 2016-04-19 | 2017-10-31 | 罗姆股份有限公司 | 时钟发生装置、电子电路、集成电路、及电气设备 |
US10491225B2 (en) | 2016-04-19 | 2019-11-26 | Rohm Co., Ltd. | Clock generating device, electronic circuit, integrated circuit and electrical machinery |
CN108334158B (zh) * | 2017-01-20 | 2024-01-30 | 精工爱普生株式会社 | 电路装置、实时时钟装置、电子设备、移动体和验证方法 |
CN108334158A (zh) * | 2017-01-20 | 2018-07-27 | 精工爱普生株式会社 | 电路装置、实时时钟装置、电子设备、移动体和验证方法 |
CN110657458A (zh) * | 2018-06-28 | 2020-01-07 | 三美电机株式会社 | 电子控制装置、电子控制用半导体集成电路装置及燃气灶 |
CN110657458B (zh) * | 2018-06-28 | 2023-07-25 | 三美电机株式会社 | 电子控制装置、电子控制用半导体集成电路装置及燃气灶 |
CN110780702A (zh) * | 2018-07-30 | 2020-02-11 | 瑞昱半导体股份有限公司 | 具有分时及分频启动机制的时钟产生***及方法 |
CN111048026A (zh) * | 2018-10-11 | 2020-04-21 | 美格纳半导体有限公司 | 显示驱动器集成电路和调整工作频率的方法 |
CN111048026B (zh) * | 2018-10-11 | 2023-09-05 | 美格纳半导体有限公司 | 显示驱动器集成电路和调整工作频率的方法 |
CN113507277A (zh) * | 2021-06-02 | 2021-10-15 | 西安电子科技大学 | 一种射频能量采集前端的协同匹配与自调谐*** |
CN114401543A (zh) * | 2022-01-14 | 2022-04-26 | 四川恒湾科技有限公司 | 一种降低基站射频单元功耗的方法及*** |
CN114401543B (zh) * | 2022-01-14 | 2023-04-07 | 四川恒湾科技有限公司 | 一种降低基站射频单元功耗的方法及*** |
Also Published As
Publication number | Publication date |
---|---|
US7382681B2 (en) | 2008-06-03 |
US20070159914A1 (en) | 2007-07-12 |
US20050047265A1 (en) | 2005-03-03 |
CN1584774B (zh) | 2011-06-08 |
US20080309383A1 (en) | 2008-12-18 |
US20060227650A1 (en) | 2006-10-12 |
KR20050014666A (ko) | 2005-02-07 |
US7196967B2 (en) | 2007-03-27 |
JP2005049970A (ja) | 2005-02-24 |
US7061825B2 (en) | 2006-06-13 |
US20060238216A1 (en) | 2006-10-26 |
US7193929B2 (en) | 2007-03-20 |
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