CN1434441A - 光信息记录介质及其制造方法 - Google Patents

光信息记录介质及其制造方法 Download PDF

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Publication number
CN1434441A
CN1434441A CN03101912A CN03101912A CN1434441A CN 1434441 A CN1434441 A CN 1434441A CN 03101912 A CN03101912 A CN 03101912A CN 03101912 A CN03101912 A CN 03101912A CN 1434441 A CN1434441 A CN 1434441A
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China
Prior art keywords
recording medium
optical information
information recording
mould release
layer
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CN03101912A
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CN1331136C (zh
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角田毅
石田寿男
小泽贵子
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Fujifilm Corp
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Fujifilm Corp
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Priority claimed from JP2002014035A external-priority patent/JP2003217177A/ja
Priority claimed from JP2002063561A external-priority patent/JP2003263796A/ja
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Publication of CN1434441A publication Critical patent/CN1434441A/zh
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Publication of CN1331136C publication Critical patent/CN1331136C/zh
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    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
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    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
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    • G11B7/2542Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of organic resins
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    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
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    • G11B7/257Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers
    • G11B7/2578Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of layers having properties involved in recording or reproduction, e.g. optical interference layers or sensitising layers or dielectric layers, which are protecting the recording layers consisting essentially of inorganic materials
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    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
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    • G11B7/258Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of reflective layers
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract

一种光信息记录介质,在基板上,自基板一侧依次有记录层、中间层、粘合剂层、以及覆盖薄膜,可通过激光的照射进行信息的记录与再生,在所述粘合剂层中,含有其玻璃化转变温度Tg在0℃以下的聚合物。本发明还涉及一种光信息记录介质的制造方法,在基板上设置记录层一侧的表面上,贴附由设置粘接层的覆盖薄膜所构成的覆盖层,且该粘接层与所述表面相接触,所述覆盖层是经过依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而成的层压体形成工艺、和将该层压体卷成辊状的工艺而制作的,且所述第1脱模薄膜的与所述粘接层的表面相接合的面的中心面平均粗糙度为50nm以下,另一面的中心面平均粗糙度为100nm以下,厚度为20μm以上。

Description

光信息记录介质及其制造方法
技术领域
本发明涉及一种光信息记录介质,特别是关于由热模式(heat mode)的追加型光信息记录介质。本发明还涉及能够使用特定波长激光进行记录及再生的追加型光信息记录介质的制造方法以及由该方法制造的光信息记录介质。
背景技术
历来,由激光进行限于一次性信息记录的信息记录介质(光盘)为众所周知。具有可以使用市场上销售的CD唱机进行再生的特点,而且,最近,随着个人电脑的普及,其需求量在不断增大。这种光盘也被称为追加型CD(所谓CD-R),其代表性的结构为,在透明的圆盘状基板上,依次层压由有机色素构成的记录层、由金等金属构成的反射层、以及树脂制的保护层(覆盖层)。这样,向该CD-R的信息记录,是通过对CD-R照射近红外区域的激光(通常是波长在780nm附近的激光)而进行的,记录层的被照射部分由于吸收了照射的光而产生局部的温升,由物理变化或化学变化(例如凹陷(pit)的生成)而引起该部分光学性能的变化,从而记录信息。另一方面,读取信息(再生)时,也是通过用与记录用激光相同波长的激光照射CD-R来进行,通过检出记录层中光学特性发生了变化的部位(记录部分)与未发生变化的部位(未记录部分)反射率的差异而进行的。
近年来,作为记录密度比CD-R更高的光信息记录介质,追加型数码·通用·光盘(所谓DVD-R)也正逐步走向实现化。该DVD-R,在形成有用于导引照射激光且宽度在CD-R一半以下(0.74~0.8μm)的窄导向沟槽(预槽)的透明圆盘状基板上,以记录层在内侧的方式贴附通常是以由有机色素构成的记录层、反射层、以及保护层的顺序依次层压成的2张光盘,或者是以记录层在内侧的方式贴附该光盘和与该盘具有相同形状的圆盘状保护基板而成。这样,向该DVD-R的信息的记录与再生,是通过可见激光(通常指波长在630nm~680nm范围的激光)的照射而进行,能够获得比CD-R密度更高的记录。
最近,互连网等网络、高显示电视等在迅速普及。另外,HDTV(高清晰度电视,High Definition Television)的放映也在最近开始。在这种形势下,非常需要能够对图像信息进行低价、简单的记录,且容量大的记录介质。在现状,DVD-R作为大容量的记录介质发挥了十分重要的作用,但另一方面,对大容量化、高密度化的要求还会提高,所以有必要开发与这些要求相对应的记录介质。为此,进行了对能够以比DVD-R更短波长的光进行高密度记录,且具有更大容量的记录介质的开发。特别是,由于大容量信息的长期保存或备份(back up)用等使用频率的增高,对限于一次性信息记录的追加型光信息记录介质的开发的要求就更为强烈。
例如,特平开4-74690号公报、特平开7-304256号公报、特开平7-304257号公报、特开平8-127174号公报、同11-53758号公报、同11-334204号公报、同11-334205号公报、同11-334206号公报、同11-334207号公报、特开2000-43423号公报、同2000-108513号公报、同2000-113504号公报、同2000-149320号公报、同2000-158818号公报、以及同2000-228028号公报中,都公开了在具有含有机色素的记录层的光信息记录介质中,通过由记录层一侧向反射层一侧照射波长在530nm以下的激光,来进行信息记录及再生的记录再生方法。在这些方法中,对设置有含卟啉化合物、偶氮类色素、金属偶氮类色素、奎酞酮类色素、三次甲基菁色素、双氰乙烯基苯基骨骼色素、香豆素化合物、酞菁化合物等的记录层的光盘,用蓝色(波长430nm,488nm)或蓝绿色(波长515nm)的激光照射,来进行信息的记录与再生。
另一方面,作为DVD也有相变型的光盘。这是一种采用GeSbTe等合金层作为记录层,用激光对记录层进行瞬间加热,发生由晶体状态向非晶状态的相变,利用相变引起的反射率的变化而进行记录与再生的方式。最近,发表了使用这种相变型DVD,用蓝紫色激光进行记录与再生DVR***(“ISOM2000”p210~211)。由该***对高密度化课题取得了一定的成果。
这种使用蓝紫色激光为光源的光信息记录介质中,形成在基板上的记录层被厚度为0.1~0.3mm的薄型覆盖层所覆盖。在使用该光信息记录介质的***中,使用对拾波高开口率(NA,数字光圈,Numerical Aperture)的物镜对激光光束进行对焦的同时,从光盘的薄型覆盖层一侧照射激光而进行记录,此时可以实现单面记录量为22.5G字节的大容量。
在这种光信息记录介质中,覆盖层的形成,通常是使用UV固化性粘合剂将覆盖薄膜贴在记录层上而进行的。当记录层为有机色素时,为了防止液体UV固化性粘合剂对有机色素的溶解,在记录层与覆盖层之间设置一定厚度以上的中间层。但是,中间层过厚时,会使激光的透过率减少,从而引起光信息记录介质的反射率下降的问题。
通常,光信息记录介质的高密度化,可以由记录及再生用激光的短波化、物镜的高NA化,以减小电子束光点来实现。最近,从波长为680nm、650nm以及635nm的红色半导体激光,到能够更超高密度记录的波长为400nm~500nm的蓝紫色半导体激光(以下称蓝紫色激光)的开发在迅速地进行,与此相对应的光信息记录介质的开发也在进行。特别是,自蓝紫色激光发售以来,对利用该蓝紫色激光与高NA拾波的光记录***的开发进行了探讨,且具有相变记录层的可重写型光信息记录介质及光记录***,已作为DVR***(“ISOM2000”210~211页)予以发表。由此对可重写型光信息记录介质中的高密度化问题,取得了一定的成果。
在利用所述蓝紫色激光与高NA拾波的光记录***中所使用的光信息记录介质,在对记录层照射蓝紫色激光时,为了使高NA的物镜聚焦,希望薄化激光入射的覆盖层。在这里,作为覆盖层,例如可以使用薄膜,并用接合剂或粘接剂粘接在记录层上。覆盖层的厚度,包括由接合剂固化而成的粘接层在内,通常为约100μm,并由所照射激光的波长和NA进行最佳化。
而且,在特开2000-67468号公报中,记载了如下的覆盖薄膜的形成方法。连续形成透明薄膜和粘接薄片的层压体被夹持在脱模薄膜两侧而成的薄膜层压体,其后加工成圆盘形状作为圆盘状薄膜层压体,进而一边将接触于粘接薄片一侧的脱模薄膜剥离,一边对准位置贴附在形成有记录面的光盘基板的表面上。
根据所采用的方法,在连续形成薄膜层压体之后,将该薄膜层压体卷成辊状,则脱模薄膜的表面形状就会转录到粘接薄片的粘接面上,在脱模薄膜的表面粗糙度较大的情况下,粘接面的表面粗糙度也变大,设置有使用该粘接薄片的覆盖层的光信息记录介质,就会发生表面印疵、厚度的不均匀、或混入气泡,其结果是不能得到充分的记录特性与耐久性。
发明内容
本发明是鉴于上述问题,为达到以下目的提出的。即,本发明的目的在于提供一种具有高反射率、高载波·噪声比(C/N)和稳定的记录再生特性的光信息记录介质。
本发明的另一目的在于,提供一种在采用具有卷成辊状工艺的覆盖层制作方法的光信息记录介质的制造方法中,具有优异的记录特性及耐久性的光信息记录介质的制造方法及用该方法制造的光信息记录介质。本发明的目的还在于,提供具有优异生产性的光信息记录介质的制造方法以及用该方法所制造的光信息记录介质。
为了解决上述问题,本发明之一的光信息记录介质在基板上自基板一侧依次设有记录层、中间层、粘合剂层、以及覆盖薄膜,通过激光的照射能够进行信息的记录再生,其特征是在所述粘合剂层中,含有玻璃化转变温度Tg在0℃以下的聚合物。
本发明之一的光信息记录介质,理想的是还包括以下的特征。
(1)所述中间层的厚度为1~20nm。
(2)所述记录层含有有机色素,该有机色素为酞菁类色素、苯并三
   唑类色素、或氨基丁二烯类色素。
另外,本发明人发现在将被脱模薄膜所夹持的覆盖层卷成辊状的工艺中,通过抑制该脱模薄膜表面形状向粘接层的转录,可以提高粘接层的密合性,从而可解决上述历来的技术问题,并由此完成了本发明之二。
也就是说,本发明之二的光信息记录介质的制造方法,是在基板上设置记录层一侧的表面上,贴合由设置有粘接层的覆盖薄膜所构成的覆盖层,且使该粘接层与所述表面相接触,其特征在于:
所述覆盖层是由:依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而成的层压体形成工艺、和将该层压体卷成辊状的工艺制作的,
且所述第1脱模薄膜中,与所述粘接层的表面相接合的面的中心面平均粗糙度(SRa)为50nm以下,另一个面的中心面平均粗糙度(SRa)为100nm以下,厚度在20μm以上。
还有,本发明之二的光信息记录介质的制造方法,在将所述层压体卷成辊状的工艺之后,最好依次进行以下工艺:
保持到所述粘接层的交联反应实质性地结束的工艺、将所述层压体冲裁为圆盘状的工艺、将圆盘状的所述层压体在大致垂直或大致水平的状态下层压保持的工艺、以及剥离所述第1及第2脱模薄膜的工艺。
另外,本发明之三的光信息记录介质的特征在于是根据所述光信息记录介质的制造方法所制作的。
附图说明
图1是用于说明层压体结构的截面示意图。
图2是在覆盖薄膜的表面连续设置粘接层的方法的一例示方案中所使用的粘接层设置装置的截面示意图。图中,
1、4、5——辊
2——涂布机构;
3——干燥机构
10——覆盖薄膜
20——粘接层
30——第1脱模薄膜
40——第2脱模薄膜
A——与粘接层相接的第1脱模薄膜面
B——第1脱模薄膜面A的另一侧面
C——与覆盖薄膜相接的第2脱模薄膜面
D——第2脱模薄膜面C的另一侧面
f1——脱模薄膜
f2——覆盖薄膜
f3——设置有圆盘状粘接层的覆盖薄膜
具体实施方式
在本发明之一光信息记录介质的基板上根据需要自基板一侧依次设有光反射层、记录层、中间层、粘合剂层、以及覆盖薄膜。以下,在对各层说明的同时,对该光信息记录介质加以详细说明。还有,后述的“覆盖层”是由所述粘合剂层与所述覆盖薄膜所构成的层。
《光信息记录介质》
<基板>
作为基板,可以在以往的作为光信息记录介质使用的各类材料中进行任意地选择。
具体的例子可以举出,玻璃;聚碳酸酯、聚甲基丙烯酸甲酯等丙烯酸树脂;聚氯乙烯、氯乙烯共聚物等氯乙烯系树脂;环氧树脂;非晶形聚烯烃;聚酯;铝等金属等,还可以根据需要多种并用。
在上述材料中,从耐湿性、尺寸稳定性、以及价格低等观点看,优选非晶形聚烯烃或聚碳酸酯,其中特别优选聚碳酸酯。还有,基板的厚度以1.1±0.3mm为宜。
在基板上形成有导引用的导向槽或表示地址信号等信息的凹凸部(预槽)。为了达到更高的记录密度,优选形成有磁迹间距(track pitch)窄于CD-R或DVD-R的预槽的基板。预槽的磁迹间距在200~400nm的范围内为宜,更优选在250~350nm的范围内。另外,预槽的深度(槽深)在20~150nm的范围内为宜,更优选在30~100nm的范围内。
还有,在设有后述的光反射层的一侧基板表面上,最好形成底涂层,其目的是为了改善平面性,提高接合力。
作为该底涂层的材料,例如可以是聚甲基丙烯酸甲酯、丙烯酸·甲基丙烯酸共聚物、苯乙烯·马来酸酐共聚物、聚乙烯醇、N-羟甲基丙烯酰胺、苯乙烯·乙烯甲苯共聚物、氯磺化聚乙烯、硝基纤维素、聚氯乙烯、氯化聚烯烃、聚酯、聚酰亚胺、醋酸乙烯酯、氯乙烯共聚物、乙烯·醋酸乙烯酯共聚物、聚乙烯、聚丙烯、聚碳酸酯等高分子物质;硅烷偶合剂等表面改性剂。
底涂层可以是在将上述材料溶解或分散在适当的溶剂中调制成涂布液之后,采用旋转涂布、浸渍涂布、挤压涂布等方法在基板表面进行涂布而得到。底涂层的厚度一般在0.005~20μm的范围,优选在0.01~10μm的范围。
<光反射层>
光反射层中使用对激光的反射率高的光反射性物质。该反射率在70%以上为宜。
作为反射率高的光反射性物质,可以举出的例子有:Mg、Se、Y、Ti、Zr、Hf、V、Nb、Ta、Cr、Mo、W、Mn、Re、Fe、Co、Ni、Ru、Rh、Pd、Ir、Pt、Cu、Ag、Au、Zn、Cd、Al、Ga、In、Si、Ge、Te、Pb、Po、Sn、Bi等金属及半金属或不锈钢。这些光反射性物质,可以单独使用,也可以进行两种以上的组合,或者是使用合金。其中优选使用的是Cr、Ni、Pt、Cu、Ag、Au、Al、及不锈钢。特别优选的是Au、Ag、Al、或它们的合金,最优选的是Au、Ag、或它们的合金。
光反射层,可以采用蒸镀、溅射或离子电镀法将所述光反射性物质形成在基板上。光反射层的厚度一般在10~300nm的范围,优选在50~200nm的范围。
还有,当通过记录层可得到充分的反射率的情况下,该光反射层并不是必不可少的,此时记录层可以起到反射层的作用。
<记录层>
记录层形成在所述反射层上,例如,通过镜头开口率为0.7以上的物镜照射波长为380~500nm的激光,就可以对信息进行记录。
另外,记录层最好含有有机色素,作为该有机色素,可以是菁类色素、羰基合成醇(oxonol)类色素、金属配位化合物类色素、偶氮类色素、酞菁类色素、苯并***类色素、氨基丁二烯类色素等。其中,优选的是,酞菁类色素、苯并***类色素和氨基丁二烯类色素。
还有,也可以使用在特开平4-74690号公报、特开平8-127174号公报、同11-53758号公报、同11-334204号公报、同11-334205号公报、同11-334206号公报、同11-334207号公报、特开2000-43423号公报、同2000-108513号公报、以及同2000-158818号公报上所公开的有机色素。
记录层是将色素等记录物质与粘合剂等一同溶解于适当的溶剂而制成涂布液之后,接着将该涂布液涂在基板表面上形成的基板或光反射层上形成涂膜,最后经干燥而形成。涂布液中记录物质的浓度,一般在0.01~15质量%的范围,优选在0.1~10质量%的范围,更优选在0.5~5质量%的范围,最优选在0.5~3质量%的范围。
作为涂布液的溶剂,可以列举出:醋酸丁酯、乳酸乙酯、乙酸溶纤剂等酯;丁酮、环己酮、甲基异丁基酮等酮;二氯甲烷、1,2-二氯乙烷、氯仿等氯代烃;二甲基甲酰胺等酰胺;甲基环己烷等烃;四氢呋喃、***、二氧杂环己烷等醚;乙醇、正丙醇、异丙醇、正丁醇二丙酮醇等醇;2,2,3,3-四氟丙醇等氟系溶剂;乙二醇单甲醚、乙二醇单***、丙二醇单甲醚等二元醇醚类等。
考虑到所使用的记录物质的溶解性,上述溶剂可以单独或者是两种以上组合使用。进而还可以根据使用的目的在涂布液中添加抗氧化剂、UV吸收剂、增塑剂、润滑剂等各种添加剂。
在使用粘合剂的情况下,该粘合剂的例子可以举出:明胶、纤维素衍生物、葡聚糖、松香、橡胶等天然有机高分子物质;聚乙烯、聚丙烯、聚苯乙烯、聚异丁烯等烃类树脂;聚氯乙烯、聚偏氯乙烯、聚氯乙烯·聚醋酸乙烯酯共聚物等乙烯系树脂;聚丙烯酸甲酯、聚甲基丙烯酸甲酯等丙烯酸树脂;聚乙烯醇、氯化聚乙烯、环氧树脂、丁醛树脂、橡胶衍生物、苯酚·甲醛树脂等热固性树脂的初期缩合物等合成有机高分子。当作为记录层材料并用粘合剂时,粘合剂的用量一般在记录物质的0.01~50倍(质量比)的范围内,优选在0.1~5倍(质量比)的范围内。由此制备的涂布液中记录物质的浓度,一般在0.01~10质量%的范围,优选在0.1~5质量%的范围内。
作为涂布方法,可以列举出喷雾法、旋转涂布法、浸渍法、辊涂法、刮刀涂布法、刮刀辊法、网版印刷法等。记录层可以是单层,也可以是叠层。另外,记录层的厚度一般为20~500nm的范围,优选为30~300nm的范围,更优选为50~100nm的范围。
此外,作为涂布温度,在23~50℃就不会有特殊的问题,优选在24~40℃,更优选在25~37℃的范围。
在记录层中,为了提高其耐光性,可以含有各种防止退色剂。
作为防止退色剂一般是使用单态氧猝熄物(quencher)。单态氧猝熄物,可以使用已知的专利说明书等发行物中所登载的物质。
作为其具体的例子可以举出:特开昭58-175693号公报、同59-81194号公报、同60-18387号公报、同60-19586号公报、同60-19587号公报、同60-35054号公报、同60-36190号公报、同60-36191号公报、同60-44554号公报、同60-44555号公报、同60-44389号公报、同60-44390号公报、同60-54892号公报、同60-47069号公报、同63-209995号公报、特开平4-25492号公报、特公平1-38680号公报、以及同6-26028号公报等各公报,德国专利350399号说明书,以及日本化学会志1992年10月号第1141页所记载的物质等。
所述单态氧猝熄物等防止褪色剂的使用量,通常是在相对于色素量的0.1~50质量%的范围,优选在0.5~45质量%的范围,更优选在3~40质量%的范围,特别优选在5~25质量%的范围。
另外,作为记录层,除了含有色素等有机化合物的记录层之外,还可以是利用相变进行记录的相变记录层,利用光磁性进行记录的光磁记录层等。还有,在相变记录层中,作为记录物质可以使用Sb、Te、Tg、In等的硫化物等金属化合物。
<覆盖层>
覆盖层是为了防止水分向光信息记录介质内的入侵,用于保护记录层的表面而形成的层。在本发明之一中,覆盖层是由含有玻璃化转变温度Tg在0℃以下的聚合物的粘合剂层与覆盖薄膜所构成。
在本发明之一的光信息记录介质中,由为了记录而进行的激光照射,使记录层的有机色素发生分解,使折射率发生变化,形成凹陷。此时,由于发热,通过后述的中间层使粘合剂层发生变形之后,由形状的变化而引起折射率的变化,调制度变大,从而得到优异的记录特性。
另外,本发明之一的光信息记录介质,与使用液体UV固化性粘合剂粘接覆盖薄膜时相比,能够大幅度地抑制有机色素的溶解析出,可使后述的中间层变薄,从而提高反射率。
作为形成覆盖薄膜的材质,只要是透明的材质,并没有特别的限制,但作为材质米说,优选聚碳酸酯、三乙酸纤维素、丙烯酸系聚合物等。而且,优选是在23℃,50%RH下吸湿率为5%以下的材质。进而,覆盖薄膜的表面粗糙度最好在5nm以下,双折射率为10nm以下。
还有,所谓“透明”是指对于进行记录再生的激光而言,透明到透过该光(透过率:80%以上)的程度。
覆盖薄膜的厚度,优选在0.01~0.2mm的范围,更优选在0.03~0.1mm的范围,进而更优选在0.05~0.095mm的范围。
作为所述的玻璃化转变温度Tg在0℃以下的聚合物,可以举出的例子有:丙烯酸系聚合物、甲基丙烯酸酯系聚合物、橡胶系聚合物、硅系聚合物、氨基甲酸酯系聚合物等。其中,从透明性、耐久性的观点看,优选丙烯酸系聚合物、甲基丙烯酸酯系聚合物。
另外,作为所述聚合物,优选玻璃化转变温度Tg在-20℃以下的聚合物,更优选玻璃化转变温度Tg在-30℃以下的聚合物。
在粘合剂层中所述聚合物的含有量,优选为干燥后粘合剂层全质量的50~99质量%,更优选为80~99质量%。
作为丙烯酸系聚合物、甲基丙烯酸酯系聚合物,可以使用以2-乙基己基丙烯酸酯、正丁基丙烯酸酯等为主要成分,再将用于提高其凝聚力的丙烯酸短链烷基酯或甲基丙烯酸酯例如丙烯酸甲酯、丙烯酸乙酯、甲基丙烯酸甲酯,以及与交联剂成为交联点的丙烯酸、甲基丙烯酸、丙烯酰胺衍生物、马来酸、羟基乙基丙烯酸酯、丙烯酸缩水甘油酯等共聚而成的聚合物。可以通过改变主成分、短链成分和赋予交联点成分的比例、种类,来改变玻璃化转变温度Tg以及交联密度。
而且,作为丙烯酸系聚合物的溶剂,可以根据所使用的聚合物而适当地选择。例如,可以列举出醋酸乙酯、醋酸丁酯、甲苯、丁酮、环己烷等。
所述粘合剂层中最好还含有异氰酸酯系交联剂。作为该异氰酸酯系交联剂,作为聚异氰酸酯有甲苯撑二异氰酸酯、4,4′-二苯基甲烷二异氰酸酯、六甲撑二异氰酸酯、苯二甲基二异氰酸酯、1,5-二异氰酸萘酯、邻甲苯胺二异氰酸酯、异佛乐酮二异氰酸酯、三苯基甲烷三异氰酸酯等异氰酸酯类,或者是这些异氰酸酯与多元醇的反应产物,而且,还可以使用由异氰酸酯类缩合而成的聚异氰酸酯。这些异氰酸酯类在市场上销售的商品名有:日本聚氨酯公司制造的collo nate L、collo nate HL、collonate2030、collo nate2031、millio nate MR、millio nate MTL,武田药品公司制造的Take nate D-102、Take nate D-110N、Take nate D-200、Take nateD-202,住友Bayer公司制造的desmodule L、desmodule IL、desmodule N、desmodule HL等。
作为由所述粘合剂层与覆盖薄膜形成覆盖层的方法,可以是在覆盖薄膜上涂布粘合剂,待溶剂干燥后,通过该粘合剂将覆盖薄膜置于中间层上,用滚筒施加压力,使覆盖薄膜贴附的方法。
还有,由粘合剂层与覆盖薄膜形成覆盖层的情况下,为了保持弹力,该粘合剂层的厚度优选在1~200μm范围,更优选在5~100μm范围,特别优选在10~50μm范围。
为了控制粘度,粘合剂的涂布温度优选在23~50℃的范围,更优选在24~40℃的范围,进而更优选能够在25~37℃的范围。涂布后,优选在50~300℃的范围进行干燥,更优选在80~200℃的范围,进而更优选在100~150℃的范围进行干燥。另外,在记录层上贴敷覆盖薄膜时的温度,优选在0~100℃的范围,更优选在15~50℃的范围。
而且,根据所使用的粘合剂,也可以在具有脱模性的脱模薄膜上涂布粘合剂,待溶剂干燥后,贴附覆盖薄膜,再将脱模薄膜剥离,从而在覆盖薄膜上设置粘合剂之后,通过贴附在中间层上而形成覆盖层。尤其是在粘合剂中含有的溶剂可溶解覆盖薄膜的情况下,优选采用这种方法。
当使用在脱模薄膜上设置有粘合剂层的薄片时,作为基材而使用的薄膜只要不溶解于粘合剂中所含的溶剂,并没有特别的限制,例如可以使用聚对苯二酸乙二醇酯、聚丙烯、聚乙烯、氯乙烯等塑料薄膜,牛皮纸、高质量纸、clecoat纸(クレコ—ト纸)、口本纸等纸张,人造丝、聚酯等非编织布,由聚酯、尼龙、丙烯等合成纤维所编织的布,铝、铜、不锈钢等的金属箔。从能够在薄膜上连续、均匀地涂布薄的脱模剂层的角度考虑,优选使用塑料薄膜。
另外,作为所用的脱模剂,可以从聚硅氧烷脱模剂或长链烷基类脱模剂等以往常用的各种脱模剂中进行适当的选择而使用。
<中间层>
中间层形成在所述记录层与所述覆盖层之间,起到防止记录层的有机色素向覆盖层一侧溶解的作用。在本发明之一中,如上所述中间层能够形成得较薄,具体说来,其厚度可为1~50nm,优选为1~30nm。
对于构成中间层的材料,只要是能够透过激光的材料,并没有特别的限制,但是优选介电体材料。具体说,可以列举出ZnS、TiO2、SiO2、ZnS-SiO2、GeO2、Si3N4、Ge3N4、MgF2等无机氧化物、氮化物、硫化物等,优选是ZnS-SiO2或SiO2
《使用本发明之一的光信息记录介质的信息的记录与再生方法》
下面,说明向本发明之一的光信息记录介质记录信息的方法及将所记录的信息再生的方法。
向光信息记录介质进行记录信息,例如,可以按以下的方法进行。
首先,使光信息记录介质以一定的线速度(CD格式化的情况下为1.2~1.4米/秒)或一定的角速度旋转,同时从覆盖层一侧照射记录用激光。由于该激光的照射,记录层吸收该光后,局部发生温度的上升,发生物理或化学变化(例如凹陷的生成),改变其光学特性,由此进行信息的记录。
作为具有380~500nm振荡波长的激光光源,可以列举出具有390~415nm范围振荡波长的蓝紫色半导体激光、中心振荡波长为515nm的蓝绿色半导体激光、中心振荡波长为850nm的红外半导体激光与光导波路型的波长变换元件(SHG)所构成的,中心振荡波长为425nm的蓝紫色SHG激光等。为了提高记录密度,特别优选使用能够得到更短波长激光的蓝紫色半导体激光或SHG激光。而且,为了提高记录密度,在拾波中所使用的物镜的透镜开口率必须在0.7以上,优选在0.85以上。
另一方面,所记录的信息的再生,是以与上相同的线速度旋转光信息记录介质的同时,从覆盖层一侧照射激光,并检测其反射光而进行的。
[实施例]
以下以具体的实施例对本发明进行详细的说明。但是,本发明并不限于这些实施例。
(实施例1)
在具有厚度为1.1mm、直径为120mm的螺旋状槽的注射成型聚碳酸酯树脂(帝人公司制造的聚碳酸酯树脂,商品名为panlitAD5503)基板中具有凹槽的一面上,溅射银而形成厚度为100nm的光反射层,之后,混合酞菁系色素A(欧腊索尔(orasol)蓝GN,ciba speciality chemical公司制造)与2,2,3,3-四氟丙醇,使用超声波振动机用2小时使之溶解,得到色素涂布液。
用旋转涂层法,一边把转速从300rpm变化到4000rpm,一边在23℃、50%RH(相对湿度)的条件下涂布该色素涂布液,形成记录层。接着,在23℃、50%RH的条件下保存1~4小时之后,在记录层上用溅射法形成5nm厚的ZnS·SiO2中间层。其后,将预先在粘合剂A(丙烯酸系粘合剂,Tg为-30℃)中混入异氰酸酯系交联剂(collo nate L:大日本油墨化学工业株式会社)(粘合剂∶交联剂=100∶0.5)的混合液涂布在聚碳酸酯薄板(覆盖薄膜)上达20μm的厚度,并将其贴附到中间层上,以形成覆盖层。由以上的工艺得到实施例1的光信息记录介质。
(实施例2)
将实施例1中的色素A替换为色素B(酞菁系色素、FOM0561,和光纯药公司制造,最大吸收波长为340nm,680nm),其余全部与实施例1中相同,制作了实施例2的光信息记录介质。
(实施例3)
将实施例1中的色素A替换为由下述结构式表示的色素C(苯并***系色素),其余全部与实施例1中相同,制作了实施例3的光信息记录介质。[化1]
(实施例4)
将实施例1中的色素A替换为由下述结构式表示的色素D(氨基丁二烯系色素),其余全部与实施例1中相同,制作了实施例4的光信息记录介质。
[化2]
(实施例5)
将实施例1中的粘合剂A替换为粘合剂B(丙烯酸系粘合剂,Tg为-5℃),其余全部与实施例1中相同,制作了实施例5的光信息记录介质。
(实施例6)
将实施例-1中的粘合剂A替换为粘合剂C(丙烯酸系粘合剂,Tg为-45℃),其余全部与实施例1中相同,制作了实施例6的光信息记录介质。
(实施例7)
将实施例1中的中间层的厚度改变为20nm,其余全部与实施例1中相同,制作了实施例7的光信息记录介质。
(实施例8)
将实施例1中的中间层的厚度改变为30nm,其余全部与实施例1中相同,制作了实施例8的光信息记录介质。
(实施例9)
将实施例1中的中间层的厚度改变为50nm,其余全部与实施例1中相同,制作了实施例9的光信息记录介质。
(比较例1)
将实施例1中的粘合剂A替换为粘合剂D(丙烯酸系粘合剂,Tg为5℃),其余全部与实施例1中相同,制作了比较例1的光信息记录介质。
(比较例2)
将实施例1中的粘合剂A替换为粘合剂E(丙烯酸系粘合剂,Tg为45℃),其余全部与实施例1中相同,制作了比较例2的光信息记录介质。
(比较例3)
将实施例1中的覆盖层的形成按以下方式进行之外,其余全部与实施例1中相同,制作了比较例3的光信息记录介质。
~~覆盖层的形成~~
在中间层上用旋转涂布法在100~300rpm的条件下涂布UV固化性粘合剂(大日本油墨化学工业公司制造,SD-347,固化后Tg为30℃),再重叠厚度为0.07mm的聚碳酸酯树脂(帝人公司制造,pure ace),之后,在300~4000rpm内转速变化进行旋转,使粘合剂全面扩展开呈30μm的厚度,再用UV照射灯照射紫外线,使粘合剂固化,形成覆盖层。
(比较例4)
将比较例3中的中间层的厚度改变为20nm,其余全部与比较例3中相同,制作了比较例4的光信息记录介质。
(比较例5)
将比较例3中的中间层的厚度改变为50nm,其余全部与比较例3中相同,制作了比较例5的光信息记录介质。
~~光信息记录介质的评价~~
(记录再生试验)
对由实施例1~9以及比较例1~5所得到的光信息记录介质,使用输出波长405nm的激光、装载有N/A为0.85的拾波器的记录再生评价机(DDU-1000,脉冲技术(pulse technique)公司制造),记录与再生了时钟频率为66MHz,线速度为5.6m/s的单一频率的信号(2T=0.13μm),用光谱分析仪(spectre analyzer)测定了C/N。结果如表1所示。
表1
有机色素     粘合剂      Tg(℃) 中间层厚度(nm)    C/N(dB)
实施例1 色素A 粘合剂A     -30     5     56
实施例2 色素B 粘合剂A     -30     5     55
实施例3 色素C 粘合剂A     -30     5     54
实施例4 色素D 粘合剂A     -30     5     52
实施例5 色素A 粘合剂B     -5     5     52
实施例6 色素A 粘合剂B     -45     5     55
实施例7 色素A 粘合剂A     -30     20     51
实施例8 色素A 粘合剂A     -30     30     47
实施例9 色素A 粘合剂A     -30     50     45
比较例1 色素A 粘合剂D     5     5     39
比较例2 色素A 粘合剂E     45     5     25
比较例3 色素A UV固化粘合剂     30     5     25
比较例4 色素A UV固化粘合剂     30     20     30
比较例5 色素A UV固化粘合剂     30     50     39
由图1可知,使用含有玻璃化转变温度Tg在0℃以下聚合物的粘合剂的实施例1~9中,C/N都在40DbB以上,显示了良好的记录特性。
另一方面,使用含有玻璃化转变温度Tg在0℃以上聚合物的粘合剂的比较例1、2,以及使用UV固化性粘合剂的比较例3~5中,C/N都在40bB以下,不能得到满意的记录特性。
以下对本发明之二的光信息记录介质的制造方法加以详细说明。
首先,对本发明之二的光信息记录介质的制造方法中较有特点的覆盖层的制作方法加以说明。
在本发明之二中,覆盖层至少是经过:(a)依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而形成层压体的工艺、和(b)将该层压体卷成辊状的工艺而制作的。
以下对每个工艺进行说明。
[(a)依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而形成层压体的工艺]
由该工艺所形成的层压体100的结构,如图1所示,设置有粘接层20的覆盖薄膜10的两面被夹持在第1脱模薄膜30与第2脱模薄膜40之间。这里,图1是用于说明层压体结构的截面示意图。
在(a)工艺中,所使用的第1脱模薄膜30贴附在粘接层的表面(粘接面)上,要求与所述粘接层的表面相接合的面A的中心面平均粗糙度(SRa)为50nm以下,另一面B的中心面平均粗糙度为100nm以下,厚度为20μm以上。
更优选的是,面A的中心面平均粗糙度为40nm以下,面B的中心面平均粗糙度为80nm以下,厚度为25μm以上,特别优选面A的中心面平均粗糙度为30nm以下,面B的中心面平均粗糙度为60nm以下,厚度为30μm以上。
这里,所谓中心面平均粗糙度,是指在粗糙度曲面的中心面上设置X、Y轴,与中心面垂直的轴定为Z轴,将粗糙度曲面作为f(x、y),基准面的大小为Lx、Ly而算出的值。
这样,通过将第1脱模薄膜30的面A的表面粗糙度规定在上述范围内,就能够防止第1脱模薄膜30的面A的表面粗糙度直接转录到粘接层上。而且,通过将第1脱模薄膜30的面B的表面粗糙度以及厚度规定在上述范围内,就能够减小第1脱模薄膜30的面B的表面粗糙度以及第2脱模薄膜40的表面粗糙度对粘接层的表面粗糙度的间接影响。所以,本发明的光信息记录介质,能够防止由于粘接层的表面粗糙度而引起的表面印疵(blur)、厚度的不均匀等,而且由于密合性良好,所以能够得到充分的记录特性与耐久性。
与此相对应,在(a)工艺中,所使用的第2脱模薄膜40,是通过图中未示的薄接合层或粘接层贴附在覆盖薄膜的表面上。为了防止照射光的散射,通常要求覆盖层中所使用的覆盖薄膜10的表面具有平滑性,但是其表面的平滑性高时,在卷成辊状的情况下,很可能会成为卷乱、裂缝、或者冲切时操作不良的原因。因此,通过将面D的表面粗糙度大的第2脱模薄膜40贴附到覆盖薄膜10的表面,以赋予其容易卷曲的操作特性。
 另外,为了提高与覆盖薄膜10的密合性,第2脱模薄膜40的面C优选为平滑。
具体说,第2脱模薄膜40中与覆盖薄膜相接的面C的中心面平均粗糙度(SRa)在50nm以下为宜,另一面D的中心面平均粗糙度在200nm以上为宜。另外,厚度优选为10~100μm。
作为这种第1脱模薄膜30与第2脱模薄膜40,可以使用聚乙烯薄膜、聚丙烯薄膜、聚对苯二酸乙二醇酯薄膜、氯乙烯薄膜、偏氯乙烯薄膜等。对于这些薄膜,为了达到上述所希望的表面粗糙度,可以使用以往公知的方法,具体说,可以根据成膜条件(适合拉伸度、速度)、薄膜中含有的填充料的量、大小、以及形状,而进行适当的调整。
对于在覆盖薄膜10的表面设置粘接层20的方法,虽然没有特别的限制,但由于在后述的(b)中有将层压体100卷曲成辊状的工艺,所以希望覆盖薄膜10具有能够卷曲成辊状的连续的长度,而在该覆盖薄膜的表面,最好能够连续地设置粘接层。
具体说,大体分为以下2种方法:在覆盖薄膜10的表面,贴附预先形成的粘接层20的方法(以下称为适宜、间接法)、在覆盖薄膜10的表面直接涂布粘接剂,并通过干燥而形成粘接层20的方法(以下称为适宜、直接法)。另外,也可以使用市售的预先设置有粘接层20的粘接薄膜。
在间接法的情况下,例如,经过如图2所示的粘接层设置装置,可以将粘接层连续地贴附于覆盖薄膜的表面。这里,图2是在覆盖薄膜的表面连续设置粘接层方法的一例示方案中所使用的粘接层设置装置的截面示意图。还有,这种粘接层设置装置也可以在其装置内进行后述的(b)将层压体100卷成辊状的工艺。
如图2所示,粘接层设置装置具有:由脱模薄膜f1卷成的辊1、涂布机构2、干燥机构3、由覆盖薄膜f2(覆盖薄膜10)卷成的辊4、以及将设置有粘接层的脱模薄膜f1与覆盖薄膜f2一同卷曲的辊5。
作为粘接层设置装置的动作,首先,由将脱模薄膜f1卷曲而成的辊1沿箭头方向送出脱模薄膜f1。当由图中未示的控制部确认送出的脱模薄膜f1的前端输送到了所定区域(涂布区域)时,使用设置在该区域的涂布部2,开始在脱模薄膜f1的表面涂布预先调制好的粘接剂涂布液(涂布工艺)。由所实施的涂布工艺,得到形成了粘接剂涂布层的脱模薄膜f1。而且,直至辊1送出所卷的脱模薄膜f1末端为止,继续粘接剂的涂布工艺。
图中未示的控制部,确认形成有粘接剂涂布层的脱模薄膜f1输送到了干燥区域时,由设置在该干燥区域的干燥机构3对粘接剂涂布层进行干燥(干燥工艺)。这样,由该工艺将粘接剂涂布层中的溶剂挥发,就得到设置有粘接层的脱模薄膜f1。其后,再一次输送具有粘接层的脱模薄膜f1,在贴附区域a中贴附于从辊4送出的覆盖薄膜f2,并使覆盖薄膜f2的表面与接合层相接(贴附工艺)。之后,在辊5上,一同卷取设置有粘接层的脱模薄膜f1与覆盖薄膜f2(卷取工艺)。在粘接层设置装置中,这些一连串的工艺,从一个辊状的脱模薄膜f1从辊1的送出,到卷取于辊5为止一直连续地进行。
在粘接层设置装置中,作为涂布机构2,可以采用以往所公知的涂布机构。具体地可以列举出喷射法、辊涂法、刮刀涂层法、刮刀辊法、网版印刷法等。
还有,作为干燥机构3,可以采用加热干燥、吹风干燥等以往所公知的干燥机构。
在所述间接法的粘接层设置装置中所使用的脱模薄膜f1,可以使用与所述第1脱模薄膜30具有同样表面物性和厚度的膜,直接用作第1脱模薄膜30,也可以在卷取到辊5之前,将脱模薄膜f1剥离,再重新贴附第1脱模薄膜30。
另外,在所述间接法的粘接层设置装置中所使用的覆盖薄膜f2的不设置粘接层的面上,可以预先设置第2脱模薄膜40,也可以在卷取到辊5之前,贴附第2脱模薄膜40。
进而,作为辊状的覆盖薄膜f2,例如可以使用在φ75mm的轴上卷绕宽130mm,长200m的薄膜的辊状物。
这里,在所述间接法的粘接层设置装置中,在连续进行(a)工艺与后述的(b)工艺时,脱模薄膜f1最好采用可直接用作第1脱模薄膜30的薄膜,而在覆盖薄膜f2的未设置粘接层的面上,最好预先设置第2脱模薄膜40。
在直接法的情况下,送出辊状的覆盖薄膜,并自该覆盖薄膜的前端到末端连续涂布粘接剂涂布液而形成粘接剂涂布层后,依次干燥粘接剂涂布层,在覆盖薄膜单侧表面的全区域形成粘接层。
其后,在粘接层的表面(粘接面)上贴附第1脱模薄膜30,而在覆盖薄膜的表面上贴附第2脱模薄膜40,形成层压体100。
而且,即使是在直接法的涂布及干燥工艺中,也可以使用与上述粘接层设置装置中所使用的涂布机构及干燥机构相同的方法。
作为在该(a)工艺中所使用的覆盖薄膜10(覆盖薄膜f2),只要是透明材质的薄膜,并没有特别的限制,优选使用聚碳酸酯、聚甲基丙烯酸甲酯等丙烯酸树脂;聚氯乙烯、偏氯乙烯共聚物等氯化乙烯系树脂;环氧树脂;非晶形聚烯烃树脂;聚酯;三乙酸纤维素等,其中更优选聚碳酸酯或三乙酸纤维素。
这里所谓“透明”,是指相对用于记录或再生的光,其透过率在80%以上。
另外,在不影响本发明效果的范围内,在覆盖薄膜10中还可以含有各种添加剂。例如,可以含有为去除波长为400nm以下的光而添加的UV吸收剂或/和为了去除波长为500nm以上的光而添加的色素等。
关于覆盖薄膜10的表面物性,其表面粗糙度的二维粗糙度参数及三维粗糙度参数都在5nm以下。而且,从记录或再生所使用的光的集光度的观点看,覆盖薄膜10的双折射最好在10nm以下。
覆盖薄膜10的厚度,优选在0.03~0.15mm的范围内,更优选在0.05~0.12mm的范围内。在这样的范围内,可使得覆盖薄膜10的贴附工艺及处置都变得容易。而且,还能够抑制彗形像差(coma)。
关于构成该(a)工艺中所形成的粘接层的粘接剂,可以使用丙烯酸系、橡胶系、硅系的粘接剂,但从透明性、耐久性的观点看,优选丙烯酸系的粘接剂。作为这种丙烯酸系的粘接剂,可以采用以2-乙基己基丙烯酸酯、正丁基丙烯酸酯等为主要成分,共聚用于提高其凝聚力的丙烯酸短链烷基酯或甲基丙烯酸酯,例如丙烯酸甲酯、丙烯酸乙酯、甲基丙烯酸甲酯,以及成为与交联剂的交联点的丙烯酸、甲基丙烯酸、丙烯酰胺衍生物、马来酸、羟基乙基丙烯酸酯、丙烯酸缩水甘油基酯等而成的共聚物。可以通过适当调节主成分、短链成分、和赋予交联点的成分的混合比例、种类,而改变玻璃转移温度T。以及交联密度。
为了提高其粘接性与耐久性,在所述粘接剂中最好混入交联剂。作为这种交联剂,可列举异氰酸酯系交联剂、环氧树脂系交联剂、三聚氰胺树脂系交联剂、脲素树脂系交联剂、螯合系交联剂等,其中优选异氰酸酯系交联剂。作为所述异氰酸酯系交联剂,可以是甲苯撑二异氰酸酯、4-4′-二苯基甲烷二异氰酸酯、六甲撑二异氰酸酯、苯二甲基二异氰酸酯、1,5-二异氰酸萘酯、邻甲苯胺异氰酸酯、异佛乐酮二异氰酸酯、三苯基甲烷三异氰酸酯等异氰酸酯类,或者是这些异氰酸酯与多元醇的反应产物,而且,还可以使用由异氰酸酯类缩合而成的聚异氰酸酯。这些异氰酸酯类在市场上销售的商品名有:日本聚氨酯公司制造的collo nate L、collonate HL、collo nate2030、collo nate2031、millio nate MR、millio nate HTL,武田药品公司制造的Take nate D-102、Take nate D-110N、Take nate D-200、Take nate D-202,住友Bayer公司制造的desmodule L、desmodule IL、desmodule N、desmodule HL等。
[(b)将该层压体卷成辊状的工艺]
在本工艺中,将在上述(a)工艺中经过直接法形成的层压体100、或由市售的第1脱模薄膜30与第2脱模薄膜40进行贴附而形成的层压体100卷成辊状,因此层压体100与同样量的板状层压体相比,具有容易输送,即输送性优异的优点。
而且,由所述粘接层设置装置,连续进行(a)工艺与(b)工艺后,所形成的层压体100容易从装置取出,也就容易向后述的其它工艺移动。
[用于制作覆盖层的其它工艺]
(一直保持到粘接层的交联反应实质性地结束)
该工艺是为了优化粘接层的粘接性,以及与记录层或中间层的密合性,提高作为光信息记录介质的耐久性而进行的工艺。
在该工艺中,将通过所述(b)工艺卷曲成辊状的层压体100,一直保持到粘接层的交联反应实质性地结束。这里,“一直保持到粘接层的交联反应实质性地结束”是指“直至由红外分光吸收光谱测定粘接层时所使用的交联剂中与交联相关的官能团波峰实质性地消失为止”,可以根据粘接层的厚度、构成粘接层的粘接剂、交接剂的种类、保持空间的气氛(温度及湿度)等,进行适当的调节。
例如,对以丙烯酸系粘接剂作为粘接剂、以异氰酸酯系交联剂作为交联剂构成的粘接层(X),在温度为23℃、湿度为50%Rh的气氛下,定时持续测定所述粘接层的红外分光吸收光谱,测定保持前(涂布之后立刻)所观察到的异氰酸酯在2275~2250cm-1附近出现的吸收峰实质性地消失为需的时间,求出与“直到粘接层(X)的交联反应实质性结束”所对应的时间。
由此求出的与“直到粘接层的交联反应实质性结束所对应的时间”,具体地讲,在通常的室温环境(温度21~30℃,湿度30~80%Rh)下,为72小时。因此,在所述的环境下,设置有粘接层的覆盖薄膜,需要保持72小时以上。
(将层压体冲裁为圆盘状的工艺)
在该工艺中,将层压体100冲裁成所规定的大小,即与后述基板同样大小的圆盘状。
更详细地讲,将层压体100送出,在临时呈平板状的状态下,例如使用切剪冲床(cut punch),连续地冲裁成与基板同样的大小。
其后,将冲裁部位以外的层压体100再一次卷成辊状,这样,由冲裁而产生的剩余部分,就很容易回收。
(将圆盘状的层压体大致垂直或大致水平层压保持的工艺)
该工艺是为了矫正层压体100上所生成的卷缩、卷曲毛病、各向异性等变形而进行的。作为层压保持圆盘状的层压体100的方法,例如可以将圆盘状的层压体100保持在大致呈垂直的层压状态,并在同一垂直方向上对层压体100施加载荷而矫正变形。也可以将圆盘状的层压体100保持在大致呈水平的层压状态,利用自重或在重力方向上施加载荷而矫正变形。
通过在这种状态下保持一定的时间,例如1小时,就能够矫正层压体100上所生成的卷缩、卷曲毛病、各向异性等变形。所需要的保持时间,可以根据覆盖薄膜的厚度、粘接层的厚度、构成粘接层的粘合剂、交联剂、以及其它添加剂的种类、所保持空间的气氛(温度及湿度)等,进行适当的调节。
这样,根据本发明,由于覆盖层的表面粗糙度小,所以具有厚度不均匀、混入气泡等少的优异效果。而且,由于覆盖层的制作工艺全部是连续进行,并且如上所述,输送性好,垃圾的回收容易,所以还具有生产性优越的效果。进而,经过上述各种工艺制作的覆盖层,除了所述效果,还对记录层或中间层的贴附面显示出高的密合性,同时,由于矫正了卷缩、卷曲毛病、各向异性等变形,所以能够减少面或厚度不均匀的情况发生。
剥离第1脱模薄膜,在基板上设置记录层的表面上,贴附所述覆盖层,并使粘接层与该表面相接,之后将第2脱模薄膜剥离,由此制造光信息记录介质,这样制造的光信息记录介质,具有优异的记录特性与耐久性。
这里,在本发明之二的光信息记录介质的制造方法中,除了所述覆盖层的制造工艺之外,还有后述的在基板上形成所述光反射层的光反射层形成工艺、在该光反射层上形成所述记录层的记录层形成工艺等的各种已知的工艺。
<光反射层形成工艺>
光反射层形成工艺,是在形成有后述的基板预槽的面上形成由光反射性物质构成的光反射层的工艺。
作为所述基板,可以在以往的作为光信息记录介质的基板材料所使用的各种材料中任意地选择使用。
具体可以列举出,玻璃;聚碳酸酯、聚甲基丙烯酸甲酯等丙烯酸树脂;聚氯乙烯、氯乙烯共聚物等氯乙烯系树脂;环氧树脂;非晶形聚烯烃;聚酯;铝等金属等,还可以根据需要多种并用。
在上述材料中,从耐湿性、尺寸稳定性、以及价格低等观点看,优选非晶形聚烯烃或聚碳酸酯,其中特别优选聚碳酸酯。还有,基板的厚度以1.1±0.3mm为宜。
在基板上形成有导引用的导向槽或表示地址信号等信息的凹凸部(预槽)。为了达到更高的记录密度,优选形成有磁迹间距(track pitch)窄于CD-R或DVD-R的预槽的基板。例如当用作DVR-blue等介质时,预槽的磁迹间距在200~400nm的范围内为宜,更优选在250~350nm的范围内。另外,预槽的深度(槽深)在20~150nm的范围内为宜,更优选在50~100nm的范围内。
还有,在设有后述的光反射层的一侧基板表面上,最好形成底涂层,以改善平面性,提高接合力。
作为该底涂层的材料,例如可以是聚甲基丙烯酸甲酯、丙烯酸·甲基丙烯酸共聚物、苯乙烯·马来酸酐共聚物、聚乙烯醇、N-羟甲基丙烯酰胺、苯乙烯·乙烯甲苯共聚物、氯磺化聚乙烯、硝基纤维素、聚氯乙烯、氯化聚烯烃、聚酯、聚酰亚胺、醋酸乙烯酯、氯乙烯共聚物、乙烯·醋酸乙烯酯共聚物、聚乙烯、聚丙烯、聚碳酸酯等高分子物质;硅烷偶合剂等表面改性剂。
底涂层可以是在将上述材料溶解或分散在适当的溶剂中调制成涂布液之后,采用旋转涂布、浸渍涂布、挤压涂布等方法在基板表面进行涂布而得到。底涂层的厚度一般在0.005~20μm的范围,优选在0.01~10μm的范围。
光反射层,可以采用蒸镀、溅射或离子电镀法将所述对激光的反射率高的光反射性物质形成在基板上。光反射层的厚度一般在10~300nm的范围,优选在50~200nm的范围。
还有反射率,优选在70%以上。
作为反射率高的光反射性物质,可以举出的例子有:Mg、Se、Y、Ti、Zr、Hf、V、Nb、Ta、Cr、Mo、W、Mn、Re、Fe、Co、Ni、Ru、Rh、Pd、Ir、Pt、Cu、Ag、Au、Zn、Cd、Al、Ga、In、Si、Ge、Te、Pb、Po、Sn、Bi等金属及半金属或不锈钢。这些光反射性物质,可以单独使用,也可以进行两种以上的组合,或者是使用合金。其中优选使用的是Cr、Ni、Pt、Cu、Ag、Au、Al、及不锈钢。特别优选的是Au、Ag、Al、或它们的合金,最优选的是Au、Ag、或它们的合金。
<记录层形成工艺>
记录层形成工艺,是在所述光反射层上形成记录层的工艺。该记录层最好可由波长在600nm以下的激光对信息进行记录,且含有作为记录物质的色素。作为该记录层中所含有的色素,可以列举出菁系色素、羰基合成醇(oxonol)类色素、金属配位化合物类色素、偶氮类色素、酞菁类色素等。
还有,也可以使用在特开平4-74690号公报、特开平8-127174号公报、同11-53758号公报、同11-334204号公报、同11-334205号公报、同11-334206号公报、同11-334207号公报、特开2000-43423号公报、同2000-108513号公报、以及同2000-158818号公报上所公开的有机色素。
记录层是将色素等记录物质与粘合剂等一同溶解于适当的溶剂而制成涂布液之后,接着将该涂布液涂在基板表面上形成的光反射层上形成涂膜,最后经干燥而形成。涂布液中记录物质的浓度,一般在0.01~15质量%的范围,优选在0.1~10质量%的范围,更优选在0.5~5质量%的范围,最优选在0.5~3质量%的范围。
作为涂布液的溶剂,可以列举出:醋酸丁酯、乳酸乙酯、乙酸溶纤剂等酯;丁酮、环己酮、甲基异丁基酮等酮;二氯甲烷、1,2-二氯乙烷、氯仿等氯代烃;二甲基甲酰胺等酰胺;甲基环己烷等烃;四氢呋喃、***、二氧杂环己烷等醚;乙醇、正丙醇、异丙醇、正丁醇二丙酮醇等醇;2,2,3,3-四氟丙醇等氟系溶剂;乙二醇单甲醚、乙二醇单***、丙二醇单甲醚等二元醇醚类等。
考虑到所使用的记录物质的溶解性,上述溶剂可以单独或者是两种以上组合使用。进而还可以根据使用的目的在涂布液中添加抗氧化剂、UV吸收剂、增塑剂、润滑剂等各种添加剂。
在使用粘合剂的情况下,该粘合剂的例子可以举出:明胶、纤维素衍生物、葡聚糖、松香、橡胶等天然有机高分子物质;聚乙烯、聚丙烯、聚苯乙烯、聚异丁烯等烃类树脂;聚氯乙烯、聚偏氯乙烯、聚氯乙烯·聚醋酸乙烯酯共聚物等乙烯系树脂;聚丙烯酸甲酯、聚甲基丙烯酸甲酯等丙烯酸树脂;聚乙烯醇、氯化聚乙烯、环氧树脂、丁醛树脂、橡胶衍生物、苯酚·甲醛树脂等热固性树脂的初期缩合物等合成有机高分子。当作为记录层材料并用粘合剂时,粘合剂的用量一般在记录物质的0.01~50倍(质量比)的范围内,优选在0.1~5倍(质量比)的范围内。由此制备的涂布液中记录物质的浓度,一般在0.01~10质量%的范围,优选在0.1~5质量%的范围内。
作为涂布方法,可以列举出喷雾法、旋转涂布法、浸渍法、辊涂法、刮刀涂布法、刮刀辊法、网版印刷法等。记录层可以是单层,也可以是叠层。另外,记录层的厚度一般为20~500nm的范围,优选为30~300nm的范围,更优选为50~100nm的范围。此外,涂布温度,在23~50℃范围内为宜,优选在24~40℃,更优选在25~37℃的范围。
在记录层中,为了提高其耐光性,可以含有各种防止退色剂。
作为防止退色剂一般是使用单态氧猝熄物(quencher)。单态氧猝熄物,可以使用已知的专利说明书等发行物中所登载的物质。
作为其具体的例子可以举出:特开昭58-175693号公报、同59-81194号公报、同60-18387号公报、同60-19586号公报、同60-19587号公报、同60-35054号公报、同60-36190号公报、同60-36191号公报、同60-44554号公报、同60-44555号公报、同60-44389号公报、同60-44390号公报、同60-54892号公报、同60-47069号公报、同63-209995号公报、特开平4-25492号公报、特公平1-38680号公报、以及同6-26028号公报等各公报,德国专利350399号说明书,以及日本化学会志1992年10月号第1141页所记载的物质等。
所述单态氧猝熄物等防止褪色剂的使用量,通常是在相对于色素量的0.1~50质量%的范围,优选在0.5~45质量%的范围,更优选在3~40质量%的范围,特别优选在5~25质量%的范围。
<中间层的形成工艺>
在本发明之二的光信息记录介质的制造方法中,还可以在所述记录层上形成中间层。中间层是为了提高记录层的保存性,加强记录层与覆盖层的密合性而设置的。对于构成中间层的材料,只要是能够透过用于记录和再生的激光的材料,并没有特别的限制,但是一般优选介电体材料。具体说,优选由Zn、Si、Ti、Te、Sn、Mo、Ge等的氮化物、氧化物、碳化物、硫化物等所构成的材料,更优选ZnS、MoO2、GeO2、TeO、SiO2、TiO2、ZnO、ZnS-SiO2、SnO2等,特别优选ZnS-SiO2或SnO2等。而且,该中间层可以由蒸镀、溅射等真空成膜的方法所形成。
以上,将经过光反射层形成工艺、记录层形成工艺、根据需要的中间层形成工艺而形成的圆盘层压体,与由所述覆盖层的制作工艺所得到的覆盖层贴附到一起而得到光信息记录介质。
以上,在本发明中,对设有作为记录物质含色素等有机化合物的记录层的光信息记录介质的制造方法进行了说明,但作为记录层,还可以是利用相变进行记录的相变记录层,由光磁性进行记录的光磁记录层等。例如,在相变记录层的情况下,介电体层是由ZnS-SiO2等所构成,并设置介电体层来取代光透过层。而且,相变记录层中作为记录物质,可以使用Sb、Te、Ag、In等的硫化物(カルコグナイド)等的金属化合物。
<光信息记录介质的制作>
在具有螺旋状凹槽(深度100nm、宽度120nm、磁迹间距320nm),且厚度为1.1mm、直径为120mm的注射成形聚碳酸酯树脂(帝人公司制聚碳酸酯,商品名panlitAD5503)的基板的有凹槽的一面上,溅射银而形成厚度为100nm的光反射膜(光反射层形成工艺)。
其后,将20g欧腊索尔(orasol)蓝GN(酞菁类色素,ciba specialitychemical公司制造)添加到2,2,3,3-四氟乙丙醇1升中,并进行超声波处理2小时使之溶解,调制成记录层形成用的涂布液。由旋转涂层法,一边将转速从300rpm变化到4000rpm,一边在23℃、50%RH的条件下,在光反射层上涂布所调制的涂布液。之后,在23℃、50%RH的条件下保存1~4小时,形成膜厚为100nm的记录层(记录层形成工艺)。然后,在记录层上溅射厚度为5nm的ZnS-SiO2,形成中间层。
<覆盖层的制作>
[粘接剂涂布液的调制]
将丙烯酸系共聚物(溶剂:醋酸乙酯/甲苯=1/1)与异氰酸酯系交联剂(溶剂:醋酸乙酯/甲苯=1/1)以100∶1的质量比混合,调制粘接剂涂布液A。
[第1脱模薄膜的表面粗糙度与厚度]
采用以下方法对本实施例中所使用的第1脱模薄膜的中心面平均粗糙度(SRa)进行了测定。
装置:WYKO公司制,HD-2000型
物镜:×15,中间镜:×0.5
测定范围:242μm×184μm
在进行了数据偏差校正与圆筒校正之后,测定了中心面平均粗糙度(SRa)。测定结果如表2所示。表2中还同时给出了第1脱模薄膜的厚度。
[(a)依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而形成层压体的工艺、及(b)将该层压体卷成辊状的工艺]
首先,利用图2所示的粘接层设置装置,在覆盖薄膜的表面设置粘接层。
具体说是,将卷在辊1上的第1脱模薄膜(聚乙烯制脱模薄膜)沿箭头方向送出,利用所设的涂布部2,在第1脱模薄膜的表面涂布粘接剂涂布液A(涂布工艺)。其后,由设置在干燥区域的干燥机构3,在100℃的条件下对形成有粘接剂涂布层的第1脱模薄膜进行干燥(干燥工艺),得到设置有厚度为20μm的粘接层的第1脱模薄膜。之后,再输送设置有粘接层的第1脱模薄膜,在贴附区域a,与从辊4送出的覆盖薄膜(聚碳酸酯薄膜,帝人pure ace,厚度80μm,单面上贴附有第2脱模薄膜,第2脱模薄膜的面D的表面粗糙度为250nm)贴附一起,且使覆盖薄膜的聚碳酸酯面与粘接层相接(贴附工艺)。这样,就得到由第1脱模薄膜、粘接层、覆盖薄膜、第2脱模薄膜依次层压的层压体。最后,将层压体卷取到辊5上。
[保持到粘接层的交联反应实质性结束的工艺]
将卷取的层压体在23℃、50%Rh的条件下,保持72小时。所谓“72小时”,是指在所述气氛下,定时测定本实施例中粘接层的红外分光吸收光谱时,异氰酸酯在2275~2250cm-1附近出现的吸收峰实质性地消失为止所需的时间,对应于本实施例中“直到粘接层(X)的交联反应实质性结束”的时间。
其后,将层压体冲裁成与所述基板相同的形状(圆盘状)。
接着,对圆盘状的层压体,首先,将第1脱模薄膜剥离,再由辊的压延贴附所述中间层和粘接层。进而,将第2脱模薄膜剥离,得到实施例10中的光信息记录介质。
<评价>
(1)C/N(载波对噪声比)
使用装载有405nm激光、NA:0.85的拾波器的记录再生评价机(DDU-1000,脉冲技术(pulse technique)公司制造),在时钟频率为66MHz,线速度为5.6m/s的条件下,用单一频率的信号记录与再生所制的光信息记录介质,并用光谱分析仪测定了C/N。结果如表2所示。
(2)覆盖层厚度不均匀的评价
对于制作的光信息记录介质,使用Keyens制的激光变位器(LT8020),由光信息记录介质圆周方向的8个点(45°间隔)、半径方向上8点(5mm间隔),共计64点,测定作为两点间薄层距离而可测定的覆盖层的厚度。由其(最大值-最小值/平均值)求出厚度的不均匀。评定的标准是,2%以内为○(实用上没有问题),大于2%时为×(难以实用)。结果如表2所示。
(3)气泡混入的评价
对于制作的光信息记录介质,使用焦阑显微镜(兴和公司制),自覆盖层一侧,在4.8mm×6.4mm的测定范围内,以约40倍的放大倍数观察了10个视野,观察了气泡的混入比例。评定的标准为,取平均值,无气泡的为○、气泡在1~5个的为△、6个以上的为×。结果如表2所示。
[实施例11~14]
除了在实施例10的覆盖层的制作工艺中,将第1脱模薄膜分别代替为具有表2所示的表面粗糙度与厚度的薄膜之外,其余全部与实施例10相同,制作了实施例11~14的光信息记录介质。
对于制作的光信息记录介质,进行了与实施例10相同的评价。结果如表2所示。
[比较例6~9]
除了在实施例10的覆盖层的制作工艺中,将第1脱模薄膜分别代替为具有表2所示的表面粗糙度与厚度的薄膜之外,其余全部与实施例10相同,制作了比较例6~9的光信息记录介质。
对于制作的光信息记录介质,进行了与实施例10相同的评价。结果如表2所示。
 表2
  第1脱模薄膜的种类   面A的SRa(nm)    面B的SRa(nm)   厚度(μm)    C/N(dB)   厚度不均匀(%) 气泡
实施例10     ①     30     50     25     55     0.8   ○
实施例11     ②     50     50     25     52     1.2   ○
实施例12     ③     30     100     25     52     1.3   ○
实施例13     ④     30     100     20     51     1.5   ○
实施例14     ⑤     50     100     25     50     1.7   △
比较例6     ⑥     80     50     25     40     3.6   ×
比较例7     ⑦     30     130     25     44     3.1   ×
比较例8     ⑧     80     130     25     38     3.6   ×
比较例9     ⑨     30     50     15     42     2.6   ×
由表2可知,采用本发明之二的制造方法所制作的实施例10~14中的光信息记录介质,其记录特性的C/N好、厚度不均匀小、气泡的混入也少。特别是实施例10的光信息记录介质,由于所使用的第1脱模薄膜的面A及面B的表面粗糙度(SRa)都较小,所以其厚度的不均匀也非常小。与此相比,实施例14中由于所使用的第1脱模薄膜的面A及面B的表面粗糙度(SRa)都比较大,所以虽然实用上不存在问题,但与其它实施例的光信息记录介质相比,厚度的不均匀较大,气泡的混入也较多。
另一方面,比较例6~9中的光信息记录介质,与实施例10~14相比,记录特性的C/N低、厚度不均匀大、气泡的混入也较多。特别是比较例9中的光信息记录介质,即使是所使用的第1脱模薄膜的面A及面B的表面粗糙度(SRa)都很小,但在其厚度很小的情况下,经过将层压体卷成辊状的工艺,第2脱模薄膜的表面形状就会转录到粘接层,无论是哪一种评价指标,都未得到理想的结果。
根据本发明,可以提供反射率高、载波·噪声比(C/N)大,具有稳定的记录再生特性的光信息记录介质。
根据本发明,在采用了包括卷成辊状工艺的覆盖层制作方法的光信息记录介质制造方法中,可以提供具有优异的记录特性的光信息记录介质的制造方法,以及由该制造方法制造的光信息记录介质。另外,还可以提供具有优异生产性的光信息记录介质的制造方法,以及由该制造方法所制造的光信息记录介质。

Claims (3)

1.一种光信息记录介质,是在基板上自基板一侧依次有记录层、中间层、粘合剂层、以及覆盖薄膜且可通过激光照射完成信息的记录再生,其特征在于:在所述粘合剂层中,含有玻璃化转变温度Tg在0℃以下的聚合物。
2.一种光信息记录介质的制造方法,在基板上设置记录层一侧的表面上,贴附由设置有粘接层的覆盖薄膜所构成的覆盖层,且该粘接层与所述表面相接触,其特征在于:所述覆盖层是经过依次层压第1脱模薄膜、粘接层、覆盖薄膜、以及第2脱模薄膜而成的层压体形成工艺、和将该层压体卷成辊状的工艺而制作的,且所述第1脱模薄膜的与所述粘接层的表面相接合的面的中心面平均粗糙度在50nm以下,另一个面的中心面平均粗糙度在100nm以下,厚度在20μm以上。
3.一种光信息记录介质,其特征在于:是由权利要求2中所述的光信息记录介质的制造方法而制造的。
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Granted publication date: 20070808

Termination date: 20130123

CF01 Termination of patent right due to non-payment of annual fee