CN1175271C - 液晶显示屏的检验装置和检验方法及其制造方法 - Google Patents

液晶显示屏的检验装置和检验方法及其制造方法 Download PDF

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Publication number
CN1175271C
CN1175271C CNB971911258A CN97191125A CN1175271C CN 1175271 C CN1175271 C CN 1175271C CN B971911258 A CNB971911258 A CN B971911258A CN 97191125 A CN97191125 A CN 97191125A CN 1175271 C CN1175271 C CN 1175271C
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CN
China
Prior art keywords
lcds
integrated circuit
check
terminal
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CNB971911258A
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English (en)
Chinese (zh)
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CN1199466A (zh
Inventor
行田幸三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
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Seiko Epson Corp
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Publication date
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Publication of CN1199466A publication Critical patent/CN1199466A/zh
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Publication of CN1175271C publication Critical patent/CN1175271C/zh
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Measuring Leads Or Probes (AREA)
CNB971911258A 1996-09-02 1997-09-02 液晶显示屏的检验装置和检验方法及其制造方法 Expired - Fee Related CN1175271C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP232335/1996 1996-09-02
JP23233596A JP3624570B2 (ja) 1996-09-02 1996-09-02 液晶表示パネルの検査装置、液晶表示パネルの検査方法及び集積回路の実装方法
JP232335/96 1996-09-02

Publications (2)

Publication Number Publication Date
CN1199466A CN1199466A (zh) 1998-11-18
CN1175271C true CN1175271C (zh) 2004-11-10

Family

ID=16937594

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB971911258A Expired - Fee Related CN1175271C (zh) 1996-09-02 1997-09-02 液晶显示屏的检验装置和检验方法及其制造方法

Country Status (5)

Country Link
JP (1) JP3624570B2 (fr)
KR (1) KR100518161B1 (fr)
CN (1) CN1175271C (fr)
TW (1) TW359748B (fr)
WO (1) WO1998010298A1 (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100911467B1 (ko) * 2002-12-31 2009-08-11 삼성전자주식회사 액정표시장치의 검사 장치
JP4219729B2 (ja) * 2003-04-25 2009-02-04 日本発條株式会社 液晶パネル用検査装置
JP4579074B2 (ja) * 2005-07-15 2010-11-10 三菱電機株式会社 フレキシブル回路基板及びこれを用いた表示装置
JP2008032958A (ja) * 2006-07-28 2008-02-14 Optrex Corp 表示パネルの点灯検査装置および点灯検査方法
KR100843126B1 (ko) * 2006-08-29 2008-07-02 주식회사 에스에프에이 평판 표시장치의 패널 검사장치 및 그 방법, 그리고 평판표시장치의 회로기판 본딩 시스템 및 그 방법
KR20060122804A (ko) * 2006-11-11 2006-11-30 윤재완 디스플레이 패널 검사용 프로브 블록
JP5347258B2 (ja) * 2007-09-28 2013-11-20 カシオ計算機株式会社 電子デバイス用機能検査装置
KR101219285B1 (ko) * 2011-01-06 2013-01-11 (주)에이앤아이 기판 검사방법 및 장치
KR101290669B1 (ko) * 2013-02-04 2013-07-29 (주)메리테크 패널 테스트용 프로브 블록
CN105867003A (zh) * 2016-06-15 2016-08-17 苏州众显电子科技有限公司 一种新型stn液晶显示屏
CN106205030B (zh) * 2016-07-25 2019-01-29 京东方科技集团股份有限公司 一种警报电路、集成电路板及警报***

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2559242B2 (ja) * 1987-12-25 1996-12-04 東京エレクトロン株式会社 プローブカード
JPH02253168A (ja) * 1989-03-28 1990-10-11 Seiko Epson Corp 液晶表示パネルの点燈検査用プローブ
JP2524308Y2 (ja) * 1989-12-27 1997-01-29 日本電子材料 株式会社 プローブカード
JPH0489579A (ja) * 1990-07-31 1992-03-23 Morimichi Fujiyoshi プリント基板等の検査装置
JPH0495929A (ja) * 1990-08-08 1992-03-27 Fujitsu Ltd アクティブプローブを用いた試験装置と試験方法
JP2966671B2 (ja) * 1991-11-18 1999-10-25 東京エレクトロン株式会社 プローブカード
JPH06120647A (ja) * 1992-10-06 1994-04-28 Fujitsu Ltd 半導体素子の実装方法と実装装置

Also Published As

Publication number Publication date
TW359748B (en) 1999-06-01
JPH1078456A (ja) 1998-03-24
WO1998010298A1 (fr) 1998-03-12
KR100518161B1 (ko) 2005-12-01
CN1199466A (zh) 1998-11-18
KR20000064315A (ko) 2000-11-06
JP3624570B2 (ja) 2005-03-02

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