CN114325547B - Detection device and method for ATE (automatic test equipment) test channel - Google Patents
Detection device and method for ATE (automatic test equipment) test channel Download PDFInfo
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- CN114325547B CN114325547B CN202111609496.9A CN202111609496A CN114325547B CN 114325547 B CN114325547 B CN 114325547B CN 202111609496 A CN202111609496 A CN 202111609496A CN 114325547 B CN114325547 B CN 114325547B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses a detection method of an ATE test channel, which is used for judging whether the calibration of the sending direction of the test channel is effective or not; the method comprises the following steps: s01: connecting at least two test channels to an oscilloscope through wires with equal length; s02: editing the same test program in the ATE platform for each test channel, wherein the test program controls the test channel to send at least one waveform; s03: running a test program, and displaying waveforms of all the test channels in an oscilloscope; s04: and judging whether the transmitting direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel. In the process of judging whether the transmitting direction calibration of the test channel is effective or not, the dependence on proprietary equipment is reduced, and the detection cost is reduced.
Description
Technical Field
The invention belongs to the field of ATE (automatic test equipment) testing, and particularly relates to a device and a method for detecting an ATE test channel.
Background
In recent years, the localization process of chips and related matched equipment is accelerated due to the forbidden operation of the chips and the related equipment, the integrated circuit industry in China is developed in a blowout way, more and more multi-chip enterprises are also in progress, the requirement on integrated circuit testing equipment is also increased in a blowout way, the detection and maintenance of the integrated circuit testing equipment are also more and more important, and a plurality of detection methods are also in research and groment.
In general, before the equipment is formally tested, an integrated circuit testing company needs to calibrate the AC (ALTERNATING CURRENT; alternating current) of the service board card; when a problem is encountered in use of the test channel after calibration, it is necessary to confirm whether the calibration effect meets the requirement. At this point assistance needs to be requested from the vendor, and the calibration validity is checked using a dedicated test board and internal commands. These commands tend not to be open to the outside, and the dedicated test boards are relatively costly, and require factory technicians to perform field debugging validation, requiring significant time and cost. Thus, there may be several problems in detecting the validity of an AC calibration:
1. if the vendor engineer is asked to perform the on-site test, the cost is high, which increases the cost of the ATE test.
2. In the case where the vendor and the supplier are in different cities, the detection period may be lengthened.
3. Third party equipment used in the integrated circuit industry is often expensive, tens of thousands or even hundreds of thousands of RMB, and has high cost and increased calibration cost
It can be seen that when confirming whether the calibration effect satisfies the requirement, the dependence on the specific equipment is large and the cost is high. It is therefore desirable to devise a device and method for confirming the calibration effect that is cost effective and simple and convenient.
Disclosure of Invention
In order to solve the technical problems, the invention provides a detection device and a detection method for an ATE test channel, which can reduce the dependence on special equipment and reduce the detection cost in the process of judging whether the calibration of the transmitting direction of the test channel is effective.
In order to achieve the above object, the present invention provides the following technical solutions: a detection method of ATE test channel, is used for judging whether the sending direction calibration of the test channel is effective; the method comprises the following steps:
S01: connecting at least two test channels to an oscilloscope through wires with equal length;
S02: editing the same test program in the ATE platform for each test channel, wherein the test program controls the test channel to send at least one waveform;
S03: running a test program, and displaying waveforms of all the test channels in an oscilloscope;
S04: and judging whether the transmitting direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
Further, in the step S04, when the waveforms of the test channels are completely aligned, it is determined that the calibration of the transmission direction of the test channel is effective.
Further, the test program controls the waveform format, the sending time and the high-low level of the waveform sent by each test channel to be the same.
Further, the test channel has the function of setting 0\1 a logic threshold voltage and outputting a logic 0\1 waveform.
Further, the test program controls the waveforms sent by the test channels to be square waves.
The detection device of the ATE test channels comprises an ATE platform, equal-length wires and an oscilloscope, wherein each test channel in the ATE platform is connected with the oscilloscope through the equal-length wires; the ATE platform comprises a test program which is the same for each test channel, and the test program controls the test channels to send at least one waveform; when the test program is operated, the waveform of each test channel is displayed in the oscilloscope; and judging whether the transmitting direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
Further, when the waveforms of all the test channels in the oscilloscope are completely aligned during running the test program, the calibration effect of the transmitting direction of the test channels is judged.
Further, the test program controls the waveform format, the sending time and the high-low level of the waveform sent by each test channel to be the same.
Further, the test program controls the waveforms sent by the test channels to be square waves.
The application has the following beneficial effects: compared with the prior art that a special test board and an internal command are required to be used for checking the calibration effectiveness, the application can check the calibration effectiveness only by using the equal-length wires and the oscilloscopes, and if the waveforms in the oscilloscopes are in the alignment state after the equal-length wires pass through, the transmission direction calibration of the test channels is effective, and the corresponding test channels can be adopted for the next test; if the waveforms in the oscilloscopes are not aligned after the equal-length wires pass through, the test channels are invalid in calibration in the sending direction, and the test of the corresponding test channels cannot be directly performed, so that the test channels need to be calibrated. The device for judging the calibration effectiveness is simple and convenient to operate, greatly improves the judgment efficiency of the calibration effectiveness, and promotes the progress of the integrated circuit testing field.
Drawings
FIG. 1 is a schematic diagram of a test apparatus for ATE test channels according to the present invention;
FIG. 2 is a flow chart of a method of detecting ATE test channels according to the present invention.
Detailed Description
For a clearer understanding of technical features, objects and effects of the present invention, a detailed description of embodiments of the present invention will be made with reference to the accompanying drawings. In the following description, it should be understood that the directions or positional relationships indicated by "front", "rear", "upper", "lower", "left", "right", "longitudinal", "transverse", "vertical", "horizontal", "top", "bottom", "inner", "outer", "head", "tail", etc. are configured and operated in specific directions based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention, and do not indicate that the apparatus or element to be referred to must have specific directions, and thus should not be construed as limiting the present invention.
It should also be noted that unless explicitly stated or limited otherwise, terms such as "mounted," "connected," "secured," "disposed," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. When an element is referred to as being "on" or "under" another element, it can be "directly" or "indirectly" on the other element or one or more intervening elements may also be present. The terms "first," "second," "third," and the like are used merely for convenience in describing the present invention and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated, whereby features defining "first," "second," "third," etc. may explicitly or implicitly include one or more such features. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
A detection device and method for ATE test channels are used for judging whether the calibration of the transmitting direction of the test channels is effective or not. The ATE platform needs to calibrate the test channel before testing, but the calibration process can not reach the expected effect, so that the calibration effect needs to be further judged after calibration, and whether the calibration effect reaches the expected value is judged. If the calibration result is not judged, the test of the test channel is directly started, and when the test result is abnormal, whether the test object has a problem or the test channel has a problem cannot be judged.
The device and the method are used for judging the effectiveness of the calibration of the AC transmission direction of the test channel, wherein the calibration of the AC transmission direction refers to the calibration of the signal output direction of the test channel; in an ATE test platform, test data acquired by a test channel needs to be transmitted to a next object, and AC transmission direction calibration refers to calibration for a test channel transmission process, so that the data can be ensured to be transmitted accurately.
As shown in fig. 2, the method for detecting an ATE test channel provided by the present application specifically includes the following steps:
S01: at least two test channels needing to be subjected to calibration effectiveness judgment are connected to the oscilloscope through equal-length wires. Each board card in the ATE platform is provided with a plurality of test channels, and the test channels have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms and also have the function of setting waveform generation time; while also having logical operations that are completed within certain time constraints.
This step occurs after the AC transmit direction calibration of the test channel, and further determinations are made regarding the results of the calibration to confirm whether the calibration process is effective.
S02: the same test program is compiled in the ATE for each test channel, the test program controlling the test channel to transmit at least one waveform. The ATE platform has an editable function, test programs of all the test channels can be obtained through programming on the ATE platform, the test programs of all the test channels are identical, the test programs are used for controlling the corresponding test channels to send waveform signals outwards, and in view of the fact that the test programs of all the test channels are identical, namely, the test programs in the step control the waveform formats, the sending time and the average of the high-low levels in waveforms sent by all the test channels.
S03: and running a test program, and displaying waveforms of all the test channels in the oscilloscope.
In view of the fact that the test channels in the application all have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms, the test program can control the waveforms sent by the test channels to be square waves.
S04: and whether the transmitting direction calibration of the broken test channel is effective or not is judged according to the waveform alignment condition of each test channel. When the waveforms of the test channels are completely aligned, judging that the calibration of the transmitting direction of the test channels is effective; when the waveforms of one or more test channels cannot be aligned with the waveforms of other test channels, it is indicated that the AC transmission direction calibration of the test channels corresponding to the misaligned waveforms does not reach the expected effect, and the AC transmission direction calibration needs to be performed again on all the test channels, and then the above steps are repeated to determine the calibration result.
The application adopts the equal-length wires to connect the test channel and the oscilloscope, the influence of the equal-length wires and the oscilloscope on the test channel is the same, and the test program is the same; if the AC transmit direction calibration is valid, the waveforms of the test channels arriving at the oscilloscope should be perfectly aligned, and if not, it is indicated that the AC transmit direction calibration does not achieve the desired effect.
As shown in figure 1, the application provides a detection device for an ATE test channel, which comprises an ATE platform, equal-length wires and oscilloscopes, wherein each test channel in the ATE platform is connected with the oscilloscopes through the equal-length wires. Each board card in the ATE platform is provided with a plurality of test channels, and the test channels have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms and also have the function of setting waveform generation time; while also having logical operations that are completed within certain time constraints.
The ATE platform comprises a test program which is the same for each test channel, and the test program controls the test channels to send at least one waveform; the test program is used for controlling the corresponding test channels to send waveform signals outwards, and in view of the fact that the test programs of all the test channels are the same, that is, in the step, the test program controls the waveform format, the sending time and the high-low level of the waveforms sent by all the test channels to be the same.
The medium length wires of the application can be wires with any structure, but the wires connected with different test channels are required to be ensured to be equal in length, equal in section and identical in wire type.
When the test program is operated, the waveform of each test channel is displayed in the oscilloscope; and judging whether the transmitting direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel. When the waveforms of the test channels are completely aligned, judging that the calibration of the transmitting direction of the test channels is effective; when the waveforms of one or more of the test channels are not aligned with the waveforms of the other test channels, it is indicated that the AC transmit direction calibration of these test channels does not achieve the desired effect, and it is necessary to re-perform the AC transmit direction calibration for all the test channels.
As the external circuit only needs the equal-length connecting wire and the oscilloscope, the oscilloscope manufacturer is generally equipped with the oscilloscope without additional purchase, and the cost of the equal-length connecting wire can be basically controlled within 1000 RMB. Because the test procedures of the invention are all completed under the operating content of the integrated circuit test company, the dependence on the personnel of the integrated circuit test equipment provider is reduced. The integrated circuit tester can detect the problem by himself once it is found, the period is very short, and the overall cost reduction is very considerable.
It is to be understood that the above examples only represent preferred embodiments of the present invention, which are described in more detail and are not to be construed as limiting the scope of the invention; it should be noted that, for a person skilled in the art, the above technical features can be freely combined, and several variations and modifications can be made without departing from the scope of the invention; therefore, all changes and modifications that come within the meaning and range of equivalency of the claims are to be embraced within their scope.
Claims (5)
1. The detection method of the ATE test channel is used for judging whether the calibration of the sending direction of the test channel is effective or not before the ATE platform performs the test; the method is characterized by comprising the following steps of:
S01: connecting at least two test channels to an oscilloscope through wires with equal length;
S02: editing the same test program in the ATE platform for each test channel, wherein the test program controls the test channel to send at least one waveform; the test program controls the waveform format, the transmission time and the average of the high and low levels in the waveform transmitted by each test channel to be the same;
S03: running a test program, and displaying waveforms of all the test channels in an oscilloscope;
s04: judging whether the calibration of the transmitting direction of the test channel is effective or not according to the waveform alignment condition of each test channel; and when the waveforms of the test channels are completely aligned, judging that the calibration of the transmitting direction of the test channels is effective.
2. The method of claim 1, wherein the test channel has a function of setting 0\1 logic threshold voltages and outputting logic 0\1 waveforms.
3. The method of claim 2, wherein the test program controls each test channel to send a square waveform.
4. The detection device for the ATE test channels is characterized by comprising an ATE platform, equal-length wires and an oscilloscope, wherein each test channel in the ATE platform is connected with the oscilloscope through the equal-length wires; the ATE platform comprises a test program which is the same for each test channel, the test program controls the test channels to send at least one waveform, and the test program controls the waveform format, the sending time and the high-low level of the waveform sent by each test channel to be the same; when the test program is operated, the waveform of each test channel is displayed in the oscilloscope; judging whether the calibration of the transmitting direction of the test channel is effective or not according to the waveform alignment condition of each test channel; and when the waveforms of all the test channels in the oscilloscope are completely aligned, judging that the calibration of the transmitting directions of the test channels is effective.
5. The apparatus of claim 4, wherein the test program controls each test channel to transmit a square waveform.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111609496.9A CN114325547B (en) | 2021-12-24 | 2021-12-24 | Detection device and method for ATE (automatic test equipment) test channel |
| PCT/CN2021/142902 WO2023115627A1 (en) | 2021-12-24 | 2021-12-30 | Detection apparatus and method for ate test channel |
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| CN202111609496.9A CN114325547B (en) | 2021-12-24 | 2021-12-24 | Detection device and method for ATE (automatic test equipment) test channel |
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|---|---|
| WO2023115627A1 (en) | 2023-06-29 |
| CN114325547A (en) | 2022-04-12 |
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