CN114325547A - Detection device and method for ATE test channel - Google Patents
Detection device and method for ATE test channel Download PDFInfo
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- CN114325547A CN114325547A CN202111609496.9A CN202111609496A CN114325547A CN 114325547 A CN114325547 A CN 114325547A CN 202111609496 A CN202111609496 A CN 202111609496A CN 114325547 A CN114325547 A CN 114325547A
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- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses a detection method of an ATE test channel, which is used for judging whether the sending direction calibration of the test channel is effective or not; the method comprises the following steps: s01: connecting at least two test channels to an oscilloscope through equal-length leads; s02: editing the same test program for each test channel in an ATE platform, wherein the test program controls the test channels to send at least one waveform; s03: running a test program, and displaying the waveform of each test channel in an oscilloscope; s04: and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel. In the process of judging whether the sending direction calibration of the test channel is effective or not, the dependence on the special equipment is reduced, and the detection cost is reduced.
Description
Technical Field
The invention belongs to the field of ATE (automatic test equipment) testing, and particularly belongs to a device and a method for detecting an ATE testing channel.
Background
In recent years, due to the forbidden operation of chips and related equipment, the localization process of chips and related corollary equipment is accelerated, the integrated circuit industry in China is developed in a blowout mode, more and more multi-chip enterprises appear, the requirement on integrated circuit testing equipment is increased in a blowout mode, the detection and maintenance of the integrated circuit testing equipment become more and more important, and a plurality of detection methods are researched and groped.
Generally, before a device is formally tested, an integrated circuit testing company needs to calibrate an Alternating Current (AC) of a service board card; when the test channel after calibration encounters a problem in use, it is necessary to confirm whether the calibration effect meets the requirements. At this point, the supplier needs to request assistance to check the validity of the calibration using a dedicated test board and internal commands. These commands are often not open to the outside, and the dedicated test board is relatively costly, and requires field debugging and validation by a manufacturer technician, which takes much time and cost. Therefore, there may be several problems in detecting the effectiveness of AC calibration as follows:
1. if the supplier engineer is requested to perform the field test, the cost is high, and the cost of the ATE test is increased.
2. In the case where the manufacturer and the supplier are in different cities, the detection period may be lengthened.
3. Third party equipment used in the integrated circuit industry is often expensive, often tens of thousands or even hundreds of thousands of RMB, has high cost, and increases calibration cost
It can be seen that, when determining whether the calibration effect meets the requirements, the dependence on special equipment is large, and the cost is high. It is therefore desirable to design a device and method for verifying the calibration effect that is cost effective, simple and convenient.
Disclosure of Invention
In order to solve the technical problem, the invention provides a detection device and a detection method for an ATE test channel, which reduce the dependency on proprietary equipment and reduce the detection cost in the process of judging whether the sending direction calibration of the test channel is effective.
In order to achieve the purpose, the invention provides the following technical scheme: a detection method of ATE test channel is used for judging whether the sending direction calibration of the test channel is effective or not; the method comprises the following steps:
s01: connecting at least two test channels to an oscilloscope through equal-length leads;
s02: editing the same test program for each test channel in an ATE platform, wherein the test program controls the test channels to send at least one waveform;
s03: running a test program, and displaying the waveform of each test channel in an oscilloscope;
s04: and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
Further, in step S04, when the waveforms of the test channels are completely aligned, it is determined that the transmission direction calibration of the test channels is valid.
Further, the test program controls the waveform format, the transmission time and the high-low power average of the waveform transmitted by each test channel to be the same.
Furthermore, the test channel has the functions of setting 0\1 logic threshold voltage and outputting logic 0\1 waveform.
Further, the test program controls the waveform sent by each test channel to be a square wave.
The detection device for the ATE test channels comprises an ATE platform, isometric leads and an oscilloscope, wherein each test channel in the ATE platform is connected with the oscilloscope through the isometric leads; the ATE platform comprises a test program which is the same for each test channel, and the test program controls the test channels to send at least one waveform; when a test program is operated, displaying the waveform of each test channel in an oscilloscope; and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
Further, when a test program is operated and the waveforms of all the test channels in the oscilloscope are completely aligned, the sending direction calibration of the test channels is judged to be effective.
Further, the test program controls the waveform format, the transmission time and the high-low power average of the waveform transmitted by each test channel to be the same.
Further, the test program controls the waveform sent by each test channel to be a square wave.
The invention has the following beneficial effects: compared with the process of checking the calibration effectiveness by using a special test board and an internal command in the prior art, the calibration effectiveness can be checked only by using equal-length wires and an oscilloscope, if the waveforms of the equal-length wires are all in an aligned state, the sending direction calibration of the test channels is effective, and the corresponding test channels can be used for the next test; if the waveforms are not aligned after passing through the equal-length wires, it is indicated that the calibration of the test channel in the sending direction is invalid, the test of the corresponding test channel cannot be directly performed, and the test channel needs to be calibrated. The device for judging the calibration effectiveness is simple and convenient to operate, greatly improves the judgment efficiency of the calibration effectiveness, and promotes the progress of the integrated circuit test field.
Drawings
FIG. 1 is a schematic diagram of an ATE test channel detection apparatus of the present invention;
FIG. 2 is a flow chart of the method for testing ATE test channels according to the present invention.
Detailed Description
For a more clear understanding of the technical features, objects and effects of the present invention, embodiments of the present invention will now be described in detail with reference to the accompanying drawings. In the following description, it is to be understood that the orientations and positional relationships indicated by "front", "rear", "upper", "lower", "left", "right", "longitudinal", "lateral", "vertical", "horizontal", "top", "bottom", "inner", "outer", "leading", "trailing", and the like are configured and operated in specific orientations based on the orientations and positional relationships shown in the drawings, and are only for convenience of describing the present invention, and do not indicate that the device or element referred to must have a specific orientation, and thus, are not to be construed as limiting the present invention.
It is also noted that, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," "disposed," and the like are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. When an element is referred to as being "on" or "under" another element, it can be "directly" or "indirectly" on the other element or intervening elements may also be present. The terms "first", "second", "third", etc. are only for convenience in describing the present technical solution, and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated, whereby the features defined as "first", "second", "third", etc. may explicitly or implicitly include one or more of such features. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
A detection device and a method for an ATE test channel are used for judging whether the sending direction calibration of the test channel is effective or not. The ATE platform needs to calibrate the test channel before performing the test, and the calibration process may not achieve the expected effect, so that the calibration effect needs to be further determined after the calibration, and whether the calibration effect achieves the expected effect is determined. If the calibration result is not judged, the test of the test channel is directly started, and when the test result is abnormal, whether the test object has a problem or the test channel has a problem cannot be judged.
The device and the method aim at the effectiveness judgment of the calibration of the AC sending direction of the test channel, wherein the calibration of the AC sending direction refers to the calibration of the signal output direction of the test channel; in an ATE test platform, test data acquired by a test channel needs to be transmitted to a next object, and AC sending direction calibration refers to calibration aiming at the sending process of the test channel, so that the data can be accurately sent out.
As shown in fig. 2, the method for detecting an ATE test channel provided in the present application specifically includes the following steps:
s01: and connecting at least two test channels needing calibration effectiveness judgment to an oscilloscope through equal-length leads. Each board card in the ATE platform is provided with a plurality of test channels, and the test channels have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms and also have the function of setting the waveform occurrence time; and also has logic operations that are completed within certain time constraints.
This step occurs after the AC transmission direction of the test channel is calibrated, and further determination is made with respect to the result of the calibration to confirm whether the calibration process is in effect.
S02: the same test program is compiled in the ATE for each test channel, which controls the test channel to send at least one waveform. The ATE platform has an editable function, and the test programs of the test channels can be obtained by programming on the ATE platform, and the test programs of each test channel are the same, and the test programs are used for controlling the corresponding test channels to send the waveform signals to the outside.
S03: and running a test program, and displaying the waveform of each test channel in an oscilloscope.
In view of the fact that the test channels in the application have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms, the test program can control the waveforms sent by the test channels to be square waves.
S04: and judging whether the sending direction calibration of the test channel is effective or not according to the waveform alignment condition of each test channel. When the waveforms of the test channels are completely aligned, judging that the sending direction calibration of the test channels is effective; when the waveforms of one or more of the test channels cannot be aligned with the waveforms of the other test channels, it is indicated that the AC transmission direction calibration of the test channels corresponding to these misaligned waveforms does not achieve the expected effect, and the AC transmission direction calibration needs to be performed again on all the test channels, and the above steps are repeated to determine the calibration result.
In the application, the equal-length conducting wires are adopted to connect the test channel and the oscilloscope, the equal-length conducting wires and the oscilloscope have the same influence on the test channel, and simultaneously, the test procedures are also the same; if the AC sending direction calibration is effective, the waveforms of the test channels reaching the oscilloscope should be completely aligned, and if the waveforms of the test channels cannot be completely aligned, the AC sending direction calibration does not achieve the expected effect.
As shown in fig. 1, the device for detecting ATE test channels provided by the present application includes an ATE platform, equal-length wires, and an oscilloscope, where each test channel in the ATE platform is connected to the oscilloscope through the equal-length wires. Each board card in the ATE platform is provided with a plurality of test channels, and the test channels have the functions of setting logic 0\1 logic threshold voltage and outputting logic 0\1 waveforms and also have the function of setting the waveform occurrence time; and also has logic operations that are completed within certain time constraints.
The ATE platform comprises a test program which is the same for each test channel, and the test program controls the test channels to send at least one waveform; the test program is used for controlling the corresponding test channel to send the waveform signal to the outside, and in view of that the test programs of the respective test channels are all the same, that is to say, the test program in this step controls the waveform format, the sending time and the high-low power average of the waveform sent by the respective test channels to be the same.
The equal-length wires in the application can adopt wires with any structures, but the wires connected with different test channels are ensured to be equal in length, equal in cross section and equal in wire type.
When a test program is operated, displaying the waveform of each test channel in an oscilloscope; and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel. When the waveforms of the test channels are completely aligned, judging that the sending direction calibration of the test channels is effective; when the waveforms of one or more of the test channels cannot be aligned with the waveforms of the other test channels, it is indicated that the AC transmission direction calibration of these test channels does not achieve the expected effect, and the AC transmission direction calibration needs to be performed again for all the test channels.
As the external circuit only needs equal-length connecting wires and the oscilloscope, the oscilloscope manufacturers generally do not need to purchase the external circuit, and the cost of the equal-length connecting wires can be basically controlled within 1000 RMB. Because the test procedure of the invention is completed under the operation content of the integrated circuit test company, the dependence on the personnel of the integrated circuit test equipment suppliers is reduced. Once the integrated circuit tester finds a problem, the integrated circuit tester can detect the problem by itself, the period is very short, and the overall reduced cost is very considerable.
It is to be understood that the foregoing examples, while indicating the preferred embodiments of the invention, are given by way of illustration and description, and are not to be construed as limiting the scope of the invention; it should be noted that, for those skilled in the art, the above technical features can be freely combined, and several changes and modifications can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention; therefore, all equivalent changes and modifications made within the scope of the claims of the present invention should be covered by the claims of the present invention.
Claims (9)
1. A detection method of ATE test channel is used for judging whether the sending direction calibration of the test channel is effective or not; the method is characterized by comprising the following steps:
s01: connecting at least two test channels to an oscilloscope through equal-length leads;
s02: editing the same test program for each test channel in an ATE platform, wherein the test program controls the test channels to send at least one waveform;
s03: running a test program, and displaying the waveform of each test channel in an oscilloscope;
s04: and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
2. The method as claimed in claim 1, wherein in step S04, when the waveforms of the test channels are completely aligned, the calibration of the sending direction of the test channel is determined to be valid.
3. The method as claimed in claim 1, wherein the test program controls the waveform format, transmission time and high-low power average in the waveform transmitted by each test channel to be the same.
4. The method as claimed in claim 3, wherein the test channel has functions of setting 0\1 logic threshold voltage and outputting logic 0\1 waveform.
5. The method as claimed in claim 4, wherein the test program controls the waveform sent by each test channel to be a square wave.
6. The detection device for the ATE test channels is characterized by comprising an ATE platform, isometric leads and an oscilloscope, wherein each test channel in the ATE platform is connected with the oscilloscope through the isometric leads; the ATE platform comprises a test program which is the same for each test channel, and the test program controls the test channels to send at least one waveform; when a test program is operated, displaying the waveform of each test channel in an oscilloscope; and judging whether the sending direction calibration of the test channels is effective or not according to the waveform alignment condition of each test channel.
7. The apparatus according to claim 6, wherein when the test program is run, it is determined that the calibration of the transmission direction of the test channels is valid when the waveforms of the test channels in the oscilloscope are completely aligned.
8. The apparatus as claimed in claim 6, wherein the test program controls the waveform format, transmission time and high-low voltage average of the waveform transmitted by each test channel to be the same.
9. The apparatus as claimed in claim 6, wherein the test program controls the waveform sent by each test channel to be a square wave.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111609496.9A CN114325547B (en) | 2021-12-24 | 2021-12-24 | Detection device and method for ATE (automatic test equipment) test channel |
| PCT/CN2021/142902 WO2023115627A1 (en) | 2021-12-24 | 2021-12-30 | Detection apparatus and method for ate test channel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111609496.9A CN114325547B (en) | 2021-12-24 | 2021-12-24 | Detection device and method for ATE (automatic test equipment) test channel |
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| CN114325547A true CN114325547A (en) | 2022-04-12 |
| CN114325547B CN114325547B (en) | 2024-05-03 |
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|---|---|
| WO2023115627A1 (en) | 2023-06-29 |
| CN114325547B (en) | 2024-05-03 |
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