CN109104204B - 用于混合定时恢复的装置、***和方法 - Google Patents
用于混合定时恢复的装置、***和方法 Download PDFInfo
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Abstract
本发明题为“用于混合定时恢复的装置、***和方法”。本主题申请涉及用于混合定时恢复的装置、***和方法。本发明提供了一种装置,所述装置可包括电路,所述电路被配置为接收相位控制值信号的第一相位控制值,生成相位内插器控制信号的第一相位内插器控制信号值,并且生成数字内插器控制信号的第一数字内插器控制信号值。所述装置能够进一步被配置为基于所述第一相位内插器控制信号值对时钟信号进行相位内插以产生相移时钟信号,并且基于所述第一数字内插器信号值对数字样本进行数字内插,以基于所述第一相位控制值产生具有有效相位的相移数字样本,所述数字样本使用所述相移时钟信号作为采样时钟生成。
Description
技术领域
本发明涉及混合定时恢复,并且具体地涉及用于混合定时恢复的装置、***和方法。
背景技术
本发明涉及混合定时恢复。
发明内容
在某些实施方案中,一种装置可包括电路,所述电路被配置为接收相位控制值信号的第一相位控制值,生成相位内插器控制信号的第一相位内插器控制信号值,并且生成数字内插器控制信号的第一数字内插器控制信号值。该装置可以进一步被配置为基于第一相位内插器控制信号值对时钟信号进行相位内插以产生相移时钟信号,并且基于第一数字内插器信号值对数字样本进行数字内插,以基于第一相位控制值产生具有有效相位的相移数字样本,所述数字样本使用相移时钟信号作为采样时钟来生成。
在某些实施方案中,***可包括定时控制电路,该定时控制电路被配置为接收相位控制信号的第一相位控制值,基于相位控制信号生成相位内插器控制信号,并且基于相位控制信号生成数字内插器控制信号的第一数字内插器控制信号值。该***还可包括相位内插器,该相位内插器基于相位内插器控制信号来对时钟信号进行相位内插以产生相移时钟信号,以及数字内插器,该数字内插器基于数字内插器信号对数字样本进行数字内插以产生相移数字样本;基于数字内插器控制信号的第一数字内插器控制值对数字样本的第一数字样本进行内插,以基于第一相位控制值产生具有有效相位的第一相移数字样本,所述数字样本使用相移时钟信号作为采样时钟来生成。
在某些实施方案中,方法可包括由定时控制电路接收相位控制值信号的第一相位控制值,由定时控制电路生成相位内插器控制信号的第一相位内插器控制信号值,以及由定时控制电路生成数字内插器控制信号的第一数字内插器控制信号值。该方法还可包括基于第一相位内插器控制信号值对时钟信号进行相位内插以产生相移时钟信号,并且基于第一数字内插器信号对数字样本进行数字内插,以基于第一相位控制值产生具有有效相位的相移数字样本,所述数字样本使用相移时钟信号作为采样时钟来生成。
附图说明
图1是根据本公开的某些实施方案的可以包括混合定时恢复功能的通信信道的框图;
图2是根据本公开的某些实施方案的用于包括混合定时恢复功能的通信信道的采样电路的框图;
图3示出了根据本公开的某些实施方案的定时恢复过程中的定时控制电路的示例性操作;
图4是根据本公开的某些实施方案的混合定时恢复功能的方法的流程图;
图5是根据本公开的某些实施方案的混合定时恢复功能的方法的流程图;
图6是根据本公开的某些实施方案的包括混合定时恢复功能的***的框图。
具体实施方式
在下面对实施方案的详细描述中,参考了形成其一部分的附图,并且其中通过例示示出。应当理解,所述的各种实施方案的特征可以组合,可使用其他实施方案,并且可在不脱离本公开的范围的情况下进行结构变化。还应当理解,在不脱离本公开的范围的情况下,本文的各种实施方案和示例的特征可以组合、交换或移除。
根据各种实施方案,本文所述的方法和功能可被实现为在计算机处理器或控制器上运行的一个或多个软件程序。根据另一个实施方案,本文所述的方法和功能可被实现为在计算设备(例如,使用磁盘驱动器的个人计算机)上运行的一个或多个软件程序。包括但不限于专用集成电路、可编程逻辑阵列和其他硬件设备的专用硬件具体实施同样可被构造为实现本文所述的方法和功能。此外,本文所述的方法可被实现为包括指令的计算机可读存储介质或设备,所述指令在被执行时使得处理器执行所述方法。
本公开整体涉及同步数字***,并且在一些实施方案中,本公开可涉及结合时钟控制定时恢复和内插定时恢复两者的混合定时恢复方法。
一些***诸如电***、电子***、马达驱动***、处理***或其他***可接收所关注的信号并处理该信号。例如,通信***或磁性记录存储***的读取信道可接收模拟输入信号并对输入信号进行采样以生成数字化样本。在一些***中,数字化信号的采样可在施加到数字接收机之前与输入信号的相位同步。例如,数字接收机可以是检测器、解码器、滤波器或其他数字***。
如上所述,一些实施方案可包括混合定时恢复部件,其可结合时钟控制定时恢复功能和内插定时恢复功能。
在一些示例中,时钟控制的定时恢复功能可改变时钟信号的相位,以基于相位控制值来生成相移时钟信号。然后,相移时钟信号可用于对数字接收机的逻辑(例如,通过模数转换器(ADC))进行采样和计时。相位控制值可以是来自目标相的时钟信号相位偏差的估计。当相位控制值大于相位步长时,时钟信号的相移可操作以将时钟信号的相位移动相位步长(例如,在每个样本基础上或在每多个样本基础上)。在一些实施方案中,相位步长或步长可为该采样时钟相位的瞬时变化的量值受限的最大值。可选择相位步长,以便在数字逻辑上闭合定时时固定到最小长度时钟周期。如果时钟相位的期望变化超过此值,则可通过调节多个周期的相位来实现,其中时钟相位中的每个变化(或步骤)不超过指定的最大值。
此外,内插定时恢复功能可对使用相移时钟信号生成的样本(例如,使用内插滤波器)进行相位调节。例如,当相位控制值大于相位步长时,内插定时恢复功能可以以相位控制值超过相位步长的量执行样本的相位调节。
这种***的一个示例将在下文参照图1进行论述。
参考图1,示出了可包括混合定时恢复功能的通信信道的框图,并且其通常被指定为100。***100可包括可以耦接至采样电路104的模拟前端(AFE)102。采样电路104可耦接至数字接收机106,该数字接收机可又耦接至采样电路104。另外,***100可以包括可耦接至采样电路104的锁相环(PLL)108。
AFE 102、采样电路104、数字接收机106和PLL 108中的每一者可以是单独的电路、片上***(SOC)、固件、处理器或未列出的其他***,或其任何组合。
在操作中,AFE 102可以接收连续时间信号(z(t))110并且执行处理诸如模拟滤波和施加增益以产生连续时间信号x(t)112。此外,PLL 108可操作以产生时钟信号(c)116。
采样电路104可以接收连续时间信号x(t)112、PLL时钟信号(c)116和相位控制值120。采样电路还可以使用混合定时恢复方法来生成相移样本序列xk 114和相移时钟信号118。下文相对于图2提供采样电路104的示例性实施方案的操作的附加细节。
数字接收机106可以接收相移样本序列xk 114和相移时钟信号118。数字接收机106然后可以使用相移时钟信号118来处理相移样本序列xk 114。此外,数字接收机106可确定或估计时钟信号的相位与目标相位的偏差,并且可使用该偏差来调节所需的相位,并将所需的相位返回到采样电路104作为相位控制值120。在一些实施方案中,数字接收机106可不限于采样电路104的混合定时恢复方法,并且对于允许的相位控制值120的变化可能没有限制。
参见图2,示出了可包括混合定时恢复功能的通信信道***100的采样电路104的框图,并且其通常被指定为200。图2的采样电路104可包括模数转换器(ADC)202,该模数转换器可耦接至数字内插器204。采样电路104还可包括可耦接至ADC 202的相位内插器206。此外,采样电路104可包括定时控制电路208,该定时控制电路可耦接至数字内插器204和相位内插器206。
ADC 202、数字内插器204、相位内插器206和时序控制电路208中的每一者可以是单独的电路、片上***(SOC)、固件、处理器或未列出的其他***,或其任何组合。
一般来讲,采样电路104的部件可如下操作。
定时控制电路208可以基于相位控制120产生控制信号p0,k 210和p1,k 212,并且将控制信号p0,k 210和p1,k 212输出至数字内插器204和相位内插器206。
数字内插器204可以接收数字化的样本序列xADC 214和数字内插器控制信号p1,k212。数字内插器204可以基于数字内插器控制信号p1,k 212来执行数字化的样本序列xADC214的数字内插以生成相移样本序列xk 114。在一些示例中,数字内插器206可以是可以对样本进行数字相移的电路。
如上所述,定时控制电路208可以控制相位内插器206以将ADC的采样时钟(例如,相移时钟信号118)的步长改变为相位控制值120(例如,在多个样本上),同时控制数字内插器204对由ADC输出的样本xADC214的数字化序列进行数字内插,以恢复相位步长和相位控制值120之间的其余相位差。如上所述,相位移位时钟信号118可按相位步长的増量改变,因为可能存在可施加于相位内插器206的最大相位变化,而不会导致数字接收机106的逻辑中的定时问题。在一些此类示例中,相位步长可以是大于零(0),并且小于或等于可通过相位内插器206施加的最大相变的任何值,而不会导致数字接收机逻辑中的定时问题。
此外,在一些示例中,定时控制电路208可补偿在相位内插器控制信号p0,k被改变时以及当该改变被反映在数字化的样本序列xADC 214中时的延迟(D)。具体地讲,数字内插器控制信号p1,k 212的产生可以补偿延迟(D)。具体地讲,因为数字内插器控制信号p1,k可以没有延迟地改变相移样本序列xk 114的相位,定时控制电路208可以生成数字内插器控制信号p1,k,以消除相位内插器控制信号p0,k的影响中的延迟的影响。图3中示出了这种实施方案中的定时控制模块的操作的示例。
图3示出了根据本公开的某些实施方案的定时恢复过程中的定时控制电路208的示例性操作。具体地讲,图3示出了定时控制电路208的输入值,具体地讲是相位控制值120和定时控制电路208的输出(即控制信号p0,k 210和p1,k 212)的时序图。在根据图3的一些示例中,相位控制可以被假定为指定期望的采样相位,其可以以采样率来最大化信号折叠。提供最大信号折叠的相位可为采样的最佳相位。换句话讲,当p0,k 210等于相位控制值120时,可提供最佳样本。然而,由于ADC的延迟以及相位内插器控制信号p0,k 210的最大变化的限制,但在数字逻辑中未引起误差的情况下,***可能无法立即将p0,k 210改变为相位控制值。在此类情况下,根据图3的一些示例可在多个周期内将相位内插器控制信号p0,k 210移步到相位控制值120,并且可利用数字内插器对相位控制值120的相位进行数字内插而没有延迟。
如图所示,相位控制值120可在时间t1处从值x变化为值y。在例示的示例中,相位控制值120可由y-x改变,其中(y-x)大于相位内插器控制信号p0,k 210的相位步长DMAX 302。此外,在例示的示例中,在时间t1之前,p0,k=x且p1,k=0,因此,连续输入信号可在相位x处采样。在时间t1处,由数字接收机生成的相位控制值120从x变为y。作为响应,定时控制电路208可立即改变数字内插器控制信号p1,k 212为(y-x),并且可以以每采样周期(T)306为DMAX302的速率(例如,相位步长)开始摆动或步移相位内插器控制信号p0,k 210。在一些示例中,每个样本周期可对应于相移时钟信号118的时钟周期。在其他示例中,相位可以按照可以包括每周期多个样本的每个周期步移(例如,以每周期四个样本)。在图3中,在p0,k时序图中示出了两条线。具体地讲,p0,k时序图中的实线可以示出相位内插器控制信号p0,k 210的值,并且虚线可以示出相位内插器控制信号p0,k 210对ADC输出(例如,在样本xADC 214上)的影响。还如图所示,相位内插器控制信号p0,k 210对样本xADC 214的影响从相位内插器控制信号p0,k 210改变的时间延迟了延迟(D)304。这样,在时间或采样周期(t1+D),相位内插器控制信号p0,k 210的变化可以开始对样本xADC 214起作用。
另外,随着相位内插器控制信号p0,k 210的变化开始对样本xADC 214起作用,并且假设相位控制值120不改变,定时控制电路208可以开始对数字内插器控制信号p1,k 212向下步移,以确保相移采样序列xk 114中的总有效相移等于相位控制值120。到时间t2时,相位内插器控制信号p0,k 210的值可以等于相位控制值120,具体为y,并且p1,k 212可以等于零。
如图3的示例所示,定时控制电路208可以在相位步长的限制内以及在应用p0,k210及其对ADC输出(例如,xADC 214)的影响之间的任何延迟(D)内,尽可能快地驱动相位内插器控制信号p0,k 210以及通过扩展驱动ADC的采样相位至结构性折叠的点。在一些情况下,由于p0,k 210的变化与其对ADC输出(例如,xADC 214)的影响之间的延迟(D),即使当相位控制值120的变化小于DMAX时,p1,k 212的值也可以是非零的。这可确保相位控制值120的值的变化可即时反映在生成用于向数字接收机106施加的相移样本序列xk的值中。
如图3中的示例所示,定时控制电路208可操作以将在下面的时间k处由Pk表示的相位控制值120分配到两个相位控制信号p0,k和p1,k之间。在一些实施方案中,因为时钟边缘可以及时前进,因此Pk可以具有相位集合{0,1,…,N-1}中的值并且可以包入值中。例如,当Pk=N-1和Pk+1=0时,时钟边缘可通过(1+1/N)T)分开。
如上所述,时序控制电路208可以操作,使得在每个时间或采样周期k,用于生成采样(xk)的有效相位等于相位控制值(Pk)和采样时钟的相位,如由相位内插器控制信号p0,k210给相位内插器所指定的,可以在相位步长DMAX 302内尽可能快地步移到当前相位控制值(Pk)的值。
由于p0,k 210被指定时和其可能在ADC输出xADC 214中被反映时之间的延迟(D)304,并且因为可以使用p1,k 212在数字内插器上施加立即相移,周期或时间k的有效相位(Pk,eff)可以通过下式确定:
Pk,eff=(p0,k-D+p1,k)。 (1)
其中p0,k-D为来自K之前的D个采样周期的相位内插器控制信号210的值。在一些示例中,如果在采样周期或时钟周期中测量D,则定时控制电路208可包括存储相位内插器控制信号210的前D值的缓冲器(诸如延迟线)。在其他示例中,相位内插器控制信号210的前D值可被存储在定时控制模块208外部的存储器中,并且由该定时控制模块访问。如上所述,定时控制模块208可以确定相位内插器控制信号p0,k 210和数字内插器控制信号p1,k 212,使得有效相位Pk,eff可以等于相位控制值(Pk)。此关系可表示为:
Pk,eff=Pk=(p0,k-D+p1,k), (2)
为了实现这种关系,定时控制模块208可以将数字内插器控制信号p1,k确定为:
p1,k=(Pk-p0,k-D)。 (3)
在一些实施方案中,当调节相位内插器控制信号p0,k 210的值时,定时控制电路208可首先生成如下误差:
ek=(Pk-p0,k)。 (4)
接下来,定时控制电路208可以确定对于相位内插器控制信号p0,k 210的调节应当施加哪个方向以在最短时间段内达到Pk。例如,如果相位数为64(例如N=64),则相位控制值120为55(例如,Pk=55),并且相位内插器控制信号为6(例如,p0,k=6),(4)中的误差可以被计算为(55-6)=49。虽然相位内插器控制信号p0,k可以被调节49来达到相位控制值,但将相位内插器控制信号p0,k移动(49-64)=-15更快。因此,定时控制电路208可解包误差。例如,如果相位控制值Pk=10并且相位内插器控制信号p0,k=63,则误差ek可以被确定为(10-63)=-53,其可以进而被解包为(64-53)=11。如果解包误差大于相位步长,那么得到的解包误差将饱和到相位步长。然后可以使用饱和解包误差来调节相位内插器控制信号p0,k210。定时控制模块208然后可以计算由(3)给出的p1,k的下一个值。
图4和图5例示了用于采样电路104和定时控制电路208的操作的示例性过程。
参考图4,示出了混合定时恢复的方法的流程图,并且通常将其指定为400。更具体地讲,流程图400可以是以上相对于图1至图3详述的采样电路104的操作的一般流程。
在操作中,***可在402处接收相位控制值。例如,该***可以从数字接收机接收相位控制值,该数字接收机可以表示由数字接收机最近处理的样本中的定时误差。在404处,定时控制电路可基于相位控制值和延迟D的相位内插器控制信号来确定数字内插控制信号(例如,定时控制模块可以输出相位内插器控制信号的时间与相位内插器控制信号的输出可能影响ADC输出的样本的时间之间的延迟)。在406处,***可基于相位内插器控制信号(由于相位内插器和ADC块的固有延迟,可相对于其当前指定值延迟D)而产生相移时钟信号,并且基于相移时钟信号生成ADC样本。数字内插器然后可以在408处基于数字内插控制信号在ADC样本上执行数字内插。接下来,定时控制电路可以在410处基于相位步长,当前相位内插器控制信号和相位控制值来更新当前时间的相位内插器控制信号。定时控制电路的逻辑的更详细的示例性实施方案由图5提供。
参考图5,示出了混合定时恢复的方法的流程图,并且通常将其指定为500。更具体地讲,流程图500可以是如上面相对于图1至图4所详细描述的定时控制电路的操作流程。
在502处,定时控制电路可确定相位内插器控制信号p0,k是否等于相位控制值Pk。如果是,则该过程可继续至504。否则,该过程可继续至506。在504处,定时控制电路可设定p1,k+1至(Pk-p0,k-D)的值。该过程随后可返回到502以用于下一个Pk。在506处,定时控制电路可确定误差值ek为(Pk-p0,k)并且继续至508。
然后,定时控制电路可执行误差解包。具体地讲,在508处,定时控制电路可确定误差e k是否大于相位总数的一半(例如,ek>N/2?)。如果是,则该过程可继续至510。否则,该过程可继续至512。在510处,定时控制电路可以将误差ek设定为(ek-N)。该过程随后可继续至516。在512处,时序控制电路可以确定误差ek是否小于总相位数的负数的一半(例如,ek<-N/2?)。如果是,则该过程可继续至514。否则,该过程可继续至516。在514处,定时控制电路可以将误差ek设定为(N+ek)。该过程随后可继续至516。
然后,定时控制电路可执行误差饱和。具体地讲,在516处,定时控制电路可以确定误差ek是否大于相位步长DMax(例如,ek>DMax?)。如果是,则该过程可继续至518。否则,该过程可继续至520。在518处,定时控制电路可将误差ek设定为相位步长DMax。该过程然后可继续至524。在520处,定时控制电路可确定误差ek是否小于相位步长DMax的负值(例如,ek<-DMax?)。如果是,则该过程可继续至522。否则,该过程可继续至524。在522处,定时控制电路可以将误差ek设定为相位步长-DMax的负值。该过程然后可继续至524。
在524处,定时控制电路可使用解包和饱和的误差来将p0,k+1确定为p0,k+ek。然后如上文所述,该方法可返回至506。
针对方法400和方法500列出的所有步骤可以应用于同步定时***。根据本公开,许多变型形式将是显而易见的。用于执行该方法中的操作的组件和电路可以是分立的,或者集成到片上***(SOC)或其他电路中。此外,这些步骤可以在处理器(例如,数字信号处理器)中执行、在软件中实现、经由固件实现或通过其他手段来执行。
参考图6,示出了包括混合定时恢复的***的框图,并且其通常被指定为600。***600可以是数据存储设备(DSD)的示例,并且可以是***100的示例性具体实施。DSD 616可以任选地连接至主机设备614并且可从该主机设备移除,该主机设备可以是具有存储数据的设备或***,诸如台式计算机、膝上型计算机、服务器、数字视频录像机、影印机、电话、音乐播放器、未列出的其他电子设备或***,或者它们的任何组合。数据存储设备616可经由基于硬件/固件的主机接口电路612与主机设备614进行通信,该主机接口电路可包括允许DSD 616与主机614物理连接和断开连接的连接器(未示出)。
DSD 616可包括可以是可编程控制器的***处理器602以及相关联的存储器604。***处理器602可以是片上***(SOC)的一部分。缓冲器606可以在读取和写入操作期间临时存储数据,并且可包括命令队列。读取/写入(R/W)信道610可以在对数据存储介质608进行写入操作期间对数据进行编码,并且在从数据存储介质进行读取操作期间对数据进行重构。数据存储介质608被示出和描述为硬盘驱动器,但也可以是其他类型的磁介质,诸如闪存介质、光学介质或其他介质,或者它们的任何组合。
R/W信道610可以一次接收来自多于一个数据存储介质的数据,并且在一些实施方案中,还可以同时接收诸如来自读取头的多于一个输出的多个数据信号。例如,具有二维磁记录(TDMR)***的存储***可具有多个读取或记录元件,并且可以同时或几乎同时从两个轨道进行读取。多维录音(MDR)***可以接收来自多个源的两个或更多个输入(例如,记录头、闪存、光学存储器等)。R/W信道610可组合多个输入并提供单个输出,如本文的示例所述。
框618可以实现***和方法100至500的全部或部分***和功能。在一些实施方案中,框618可以是集成到R/W信道610中的独立电路,被包括在片上***、固件、软件或它们的任何组合中。
本文所述的例示、示例和实施方案旨在提供各种实施方案的结构的一般理解。这些说明并非旨在用作采用本文所述结构或方法的装置和***的所有元件和特征的完整描述。在查看本公开后,许多其他实施方案对于本领域技术人员而言可以是显而易见的。可通过本公开利用并得到其他实施方案,使得可在不脱离本公开的范围的情况下进行结构和逻辑替换和变化。例如,附图和以上描述提供了可改变的架构的示例,诸如***的设计要求。此外,虽然在本文中已说明和描述了具体实施方案,但应当理解,被设计为实现相同或相似目的的任何后续布置可以替代所示的具体实施方案。
本公开旨在覆盖各种实施方案的任何和全部后续改型或变型。在查看说明书后,上述示例的组合以及本文中未具体描述的其他实施方案对于本领域技术人员而言将是显而易见的。此外,图示仅仅是代表性的,可能未按比例绘制。图示中的某些比例可能被放大,而其他比例可能被缩小。因此,本公开和附图被认为是例示性的,而非限制性的。
Claims (20)
1.一种用于混合定时恢复的装置,包括:
电路,所述电路被配置为:
接收相位控制值信号的第一相位控制值;
生成相位内插器控制信号的第一相位内插器控制信号值;
生成数字内插器控制信号的第一数字内插器控制信号值;
基于所述第一相位内插器控制信号值对时钟信号进行相位内插以产生相移时钟信号;并且
基于所述第一数字内插器信号值对数字样本进行数字内插,以基于所述第一相位控制值产生具有有效相位的相移数字样本,所述数字样本是使用所述相移时钟信号作为采样时钟生成的。
2.根据权利要求1所述的装置,还包括所述电路,所述电路还包括模数转换器(ADC),并且所述ADC被配置为基于所述相移时钟信号对输入信号进行采样以产生包括所述数字样本的数字样本。
3.根据权利要求2所述的装置,还包括所述电路,所述电路进一步被配置为通过逐个周期地将所述相位内插器控制信号朝向当前采样周期的所述相位控制值信号的当前值步移来执行所述相位内插器控制信号的生成。
4.根据权利要求3所述的装置,还包括所述电路,所述电路进一步被配置为通过以下操作来执行所述相位内插器控制信号朝向所述当前相位控制值的所述步移:
确定所述相位内插器控制信号的当前值与所述当前相位控制值之间的差;
对所述差执行误差解包,以产生解包的差;以及
基于相位步长来对所述解包的差执行误差饱和,以产生解包的饱和差;以及
基于所述解包的饱和差和所述相位内插器控制信号的所述当前值来更新所述相位内插器控制信号的当前值。
5.根据权利要求3所述的装置,还包括:
相位内插器,所述相位内插器基于所述相位内插器控制信号来执行所述时钟信号的相位内插以产生所述相移时钟信号;
所述第一相位内插器控制值是基于第二相位控制值生成的,所述第二相位控制值在比其中接收到所述第一相位控制值的第二采样周期早延迟周期的第一采样周期中被接收。
6.根据权利要求3所述的装置,还包括:
缓冲器,所述缓冲器缓冲相位内插器控制信号值达至少一个延迟周期;
数字内插器,所述数字内插器基于所述数字内插器信号来执行由所述ADC生成的数字样本的所述数字内插以产生相移数字样本,所述数字内插器信号是基于当前相位控制值与在比第一当前采样周期早延迟周期的采样周期中生成的相位内插器控制信号值的差生成的。
7.根据权利要求6所述的装置,还包括处理所述相移数字样本的数字接收机,所述数字接收机的逻辑基于所述相移时钟信号计时。
8.根据权利要求1所述的装置,还包括所述数字接收机,所述数字接收机为解码器、滤波器或检测器中的一者。
9.根据权利要求1所述的装置,还包括所述数字接收机,所述数字接收机进一步被配置为生成所述相位控制信号。
10.一种用于混合定时恢复的***,包括:
定时控制电路,所述定时控制电路被配置为:
接收相位控制信号的第一相位控制值;
基于所述相位控制信号生成相位内插器控制信号;
基于所述相位控制信号生成数字内插器控制信号的第一数字内插器控制信号值;相位内插器,所述相位内插器基于所述相位内插器控制信号对时钟信号进行相位内插以产生相移时钟信号;以及
数字内插器,所述数字内插器基于所述数字内插器信号对数字样本进行数字内插,以产生相移数字样本;基于所述数字内插器控制信号的第一数字内插器控制值对所述数字样本的第一数字样本进行内插,以基于所述第一相位控制值产生具有有效相位的第一相移数字样本,所述数字样本使用所述相移时钟信号作为采样时钟来生成。
11.根据权利要求10所述的***,还包括:
模数转换器(ADC),所述模数转换器被配置为基于所述相移时钟信号对输入信号进行采样以产生所述数字样本。
12.根据权利要求11所述的***,还包括所述定时控制电路,所述定时控制电路被进一步配置为:
通过逐个周期地将所述相位内插器控制信号朝向当前采样周期的所述相位控制值信号的所述当前值步移来执行所述相位内插器控制信号的生成。
13.根据权利要求12所述的***,还包括所述定时控制电路,所述定时控制电路进一步被配置为通过以下操作来执行所述相位内插器控制信号的朝向所述当前相位控制值的所述步移:
确定所述相位内插器控制信号的当前值与所述当前相位控制值之间的差;
对所述差执行误差解包,以产生解包的差;
基于相位步长来对所述解包的差执行误差饱和,以产生解包的饱和差;以及
基于所述解包的饱和差和所述相位内插器控制信号的所述当前值来更新所述相位内插器控制信号的所述当前值。
14.根据权利要求12所述的***,还包括:
第一相位内插器控制值,所述第一相位内插器控制值是基于第二相位控制值生成的,所述第二相位控制值在比其中接收到所述第一相位控制值的第二采样周期早延迟周期的第一采样周期中被接收;以及
第一数字样本,所述第一数字样本是使用所述相移时钟信号作为使用所述第一相位内插器控制值作为采样时钟内插的相位生成的。
15.根据权利要求12所述的***,还包括:
缓冲器,所述缓冲器缓冲所述相位内插器控制信号的值达至少一个延迟周期;以及
所述数字内插器信号,所述数字内插器信号是基于当前相位控制值与比当前采样周期早延迟周期生成的相位内插器控制信号值的差生成的。
16.根据权利要求10所述的***,还包括数字接收机,所述数字接收机处理所述相移数字采样,所述数字接收机的逻辑基于所述相移时钟信号计时,并且所述数字接收机被配置为生成所述相位控制信号。
17.一种用于混合定时恢复的方法,包括:
由定时控制电路接收相位控制值信号的第一相位控制值;
由所述定时控制电路生成相位内插器控制信号的第一相位内插器控制信号值;
由所述定时控制电路生成数字内插器控制信号的第一数字内插器控制信号值;
基于所述第一相位内插器控制信号值对时钟信号进行相位内插以产生相移时钟信号;以及
基于所述第一数字内插器信号对数字样本进行数字内插,以基于所述第一相位控制值产生具有有效相位的相移数字样本,所述数字样本使用所述相移时钟信号作为采样时钟生成。
18.根据权利要求17所述的方法,还包括:
通过以下操作通过逐个周期地将所述相位内插器控制信号朝向当前采样周期的所述相位控制值信号的所述当前值步移来执行所述相位内插器控制信号的生成:
确定所述相位内插器控制信号的当前值与所述当前相位控制值之间的差;
对所述差执行误差解包,以产生解包的差;
对所述解包的差执行误差饱和,以产生解包的饱和差;以及
基于所述解包的饱和差和所述相位内插器控制信号的所述当前值来更新所述相位内插器控制信号的所述当前值。
19.根据权利要求18所述的方法,还包括基于在比所述第一相位控制值早延迟周期的采样周期中接收的第二相位控制值来生成所述第一相位内插器控制值。
20.根据权利要求19所述的方法,还包括基于所述第一相位控制值和所述第一相位内插器控制信号值的差来生成所述数字内插器信号。
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