TWI691899B - 用於參數調適之設備、系統及方法 - Google Patents
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Abstract
一種設備可包括經組態以使用一組通道參數處理一輸入信號的一電路。該電路可使用一第一調適演算法產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數。該電路可進一步基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該電路使用為該組通道參數之該第二調適演算法的一第二組通道參數。另外,該電路可將該第二組通道參數使用為該組通道參數而執行該輸入信號的處理。
Description
本發明係關於近似參數調適,且更特定言之係關於用於近似參數調適的設備系統及方法。
本發明係關於近似參數調適。
在某些實施例中,一種設備可包括一電路,該電路經組態以使用一組通道參數處理一輸入信號。該電路可使用一第一調適演算法產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數。該電路可進一步基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該電路使用為該組通道參數之該第二調適演算法的一第二組通道參數。另外,該電路可將該第二組通道參數使用為該組通道參數而執行該輸入信號的處理。
在某些實施例中,一種系統可包括一通道電路及一調適電路,該通道電路經組態以使用一組參數處理一輸入信號,該調適電路經組態以使用一第一調適演算法產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數。該調適電路可進一步經組態以基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道
參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該通道電路使用為該組通道參數之該第二調適演算法的一第二組通道參數。另外,該調適電路可經組態以將該第二組通道參數輸出至該通道電路以在處理該輸入信號時使用為該組通道參數。
在某些實施例中,一種方法可包括藉由經組態以使用一組通道參數處理一輸入信號及使用一第一調適演算法的一電路產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數。該方法可進一步包括基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該電路使用為該組通道參數之該第二調適演算法的一第二組通道參數。另外,該方法可包括將該第二組通道參數使用為該組通道參數而執行該輸入信號之處理。
100:系統/通訊通道
102:類比數位轉換器/ADC/等化器
104:等化器
106:偵測器
108:調適組件/偵測器
110:解碼器
112:製造資料
114:連續時間信號/信號
116:樣本
118:經等化樣本序列
120:資料序列/決策
122:已解碼資料
124:參數/係數/值
200:流程圖/方法
202,204,206,208,210,212,214,216,218:步驟
300:流程圖/方法
302,304,306,308,310,312,314,316,318,320:步驟
400:系統
402:系統處理器
404:記憶體
406:緩衝器
408:資料儲存媒體
410:讀取/寫入(R/W)通道
412:主機介面電路
414:主機裝置/主機
416:資料儲存裝置/DSD
418:方塊
b:已解碼資料
p:參數
x:樣本
x(t):連續時間信號
y:經等化樣本序列
圖1係根據本揭露的某些實施例之包括近似參數調適的通訊通道之方塊圖;圖2係根據本揭露的某些實施例之近似參數調適的方法之流程圖;圖3係根據本揭露的某些實施例之近似參數調適的方法之流程圖;圖4係根據本揭露的某些實施例之包括近似參數調適的系統之方塊圖。
在下文之實施例的實施方式中,請參考形成實施方式的一部分並藉由繪示顯示的隨附圖式。應當理解,可組合各種所述實施例之特徵,可利用其他實施例,且在不脫離本揭露之範圍的情况下可進行結構變化。亦應當理解,在不脫離本揭露之範圍的情况下,可組合、交換、或移除本文之各種實施例及實例之特徵。
根據各種實施例,本文所述之方法及功能可經實施為在一電腦處理器或控制器上運行之一或多個軟體程式。根據另一個實施例,本文所述之方法及功能可經實施為在一計算裝置(諸如使用磁碟驅動器之個人電腦)上運行之一或多個軟體程式。專用硬體實施方案,包括但不限於特定應用積體電路、可程式化邏輯陣列、及可同樣經建構以實施本文所述之方法及功能之其他硬體裝置。此外,本文所述之方法可經實施為一電腦可讀的儲存媒體或裝置,其包括在經執行時使一處理器執行該等方法之指令。
本揭露大致係關於參數調適,且在一些實施例中,本揭露可關於基於由第二調適演算法產生之參數的變化而近似第一調適演算法的參數調適。
一些系統(諸如,電氣、電子、馬達驅動、處理、或其他系統)可接收關注信號並基於參數處理該信號。例如,通訊系統或磁性記錄儲存系統的讀取通道可利用調適性參數處理輸入信號。在一些系統中,偵測器可基於等化樣本序列及調適性參數生成資料序列。調適組件可包括用於調適偵測器之參數的各種調適性函數或演算法。例如,調適性參數可係軟輸出維特比(Viterbi)演算法(soft-output Viterbi
algorithm,SOVA)偵測器之濾波器電路(例如,SOVA偵測器之有限脈衝響應濾波器(finite impulse response filter,FIR)或資料相依FIR(DDFIR))的係數或分接係數(tap),或參數(諸如,SOVA偵測器的分支差異或分支偏差)。
調適演算法之類型的實例可包括最小位元錯誤率(Minimum Bit-Error Rate,MBER)調適、最小均方差(minimum mean squared error,MMSE)調適、最小均方調適、遞迴最小平方(recursive least squares,RLS)調適、及類似的調適演算法。
在一些實施例中,一第一調適演算法可用於在至少一組情況下(例如,在正常操作下)調適一組調適性參數。在至少一些其他情況中,一第二調適演算法可用於基於由該第一調適演算法產生的該組調適性參數與由該第二調適演算法產生的該組調適性參數之間的一預定關係來近似該第一調適演算法的該組調適性參數。例如,此種近似可在該第一調適演算法可能不適合處理或該第一調適演算法可能提供錯誤更新的情況下執行。
相關於圖1於下文討論此種系統的實例。
參考圖1,展示包括近似參數調適且整體地指定為100之通訊通道的方塊圖。系統100能包括可耦接至等化器104的類比數位轉換器(ADC)102。等化器104可耦接至偵測器106及調適組件108。偵測器106可耦接至解碼器110及調適組件108。調適組件108可連接至偵測器106。另外,解碼器110可包括來自通訊通道100的輸出並連
接到調適組件108。調適組件108可包括用於儲存製造資料112的記憶體,或可存取儲存在單獨記憶體(未圖示)中的製造資料112。
ADC 102、等化器104、偵測器106、調適組件108、及解碼器110之各者可係單獨電路、系統單晶片(system on chip,SOC)、韌體、(一或多個)處理器、或未列出的其他系統、或其之任何組合。
如下文所詳細討論的,在繪示於圖1的實施例中,經調適的參數係偵測器106的參數。雖然本文之討論利用讀取通道之偵測器的參數作為實例,但所揭示之技術及系統可適用於其他電路或參數。鑒於本揭露,許多變型對於所屬技術領域中具有通常知識者而言將係顯而易見的。
在操作中,ADC 102可以規律間隔取樣連續時間信號x(t)114,並可將該信號量化以產生樣本x 116的數位化序列。
等化器104可接收樣本x 116的數位化序列並生成經等化樣本序列y 118。在一些實例中,等化器可操作以縮短通道的符際干擾(intersymbol interference,ISI)長度或記憶體。另外,等化器102可作用以吸收輸入信號或雜訊統計中可隨時間推移而發生之變化。一般而言,等化器104可將一致、已知的輸入信號產生給偵測器106,使得偵測器106可基於由調適組件108提供的係數或參數p 124來估計對應於信號x(t)114的資料序列。
偵測器106可操作以基於等化樣本序列y 118及由調適組件108提供的參數或係數p 124來判定(或估計)對應於信號x(t)114之位元值的資料序列 120。具體地說,可將參數p 124提供給偵測器
以用於資料序列 120的估計。資料序列 120可代表各位元係零或一的概率。可將值124表示為此等概率之比率的對數,並可稱為對數概似比或LLR(log likelihood ratio)。偵測器106可起作用以基於一通道響應(例如各可能寫入/傳輸資料型樣之預期通道輸出)之知識而產生LLR值。在一些實例中,偵測器108可採用軟輸出維特比演算法(SOVA)。
可將生成的資料序列 120傳遞至解碼器110,若資料序列 120被成功地解碼或係可代表各位元係零或一之概率的外在資訊或EXT(未圖示),該解碼器可生成已解碼資料b 122。解碼器110可生成已解碼資料b 122或基於所用碼之結構的EXT。
雖然為便於繪示而未顯示,在一些實施方案中,可將EXT傳回至偵測器(例如,為了使用為由偵測器106及解碼器110執行之迭代解碼處理的一部分)。
更明確地說,偵測器106可係SOVA偵測器。在一些實施例中,SOVA偵測器的參數124可在正常操作中使用最小位元錯誤率(MBER)調適而調適。更明確地說,SOVA偵測器參數的MBER調適在解碼器110能正確解碼寫入資料(例如,從而再產生寫入資料並將b 122提供至調適組件)的正常操作中可在扇區上運行。已解碼資料b 122可與已儲存的經等化樣本序列y 118(或它們的子集)一起反饋給MBER調適。
在MBER調適可能不適合或MBER調適可能提供錯誤更新的情形中,近似更新的MBER參數可基於由LMS調適演算法產生的該組調適性參數及由MBER產生的該組調適性參數與由LMS產生的該組調適性參數之間的預定關係來判定,並儲存為製造資料112。例如,當解碼器無法解碼寫入資料(b 122)、且調適係使用可包括位元誤差的偵測器決策資料( 120)執行(例如,決策導向調適)時,MBER調適可能不合適或偵測器參數的MBER調適可能提供錯誤更新。當執行決策導向調適時,MBER成本函數可能導致調適性係數以此種方式移動而增強決策錯誤,其可能進一步劣化偵測器效能。其他因素或條件也可用於觸發近似MBER參數生成。例如,當關注扇區已無法在臨限數目個迭代解碼迭代後進行解碼並具有與相鄰扇區充分不同之雜訊統計而顯示相鄰扇區上的調適可能無用時,可觸發近似MBER參數生成。
製造資料112可在製造期間或在現場的訓練過程期間生成。在硬碟驅動器或其參數橫跨媒體變化之其他裝置的情形中,製造資料112可針對各儲存單元(例如,扇區、頁等)或針對可對應於磁軌群組的較大區域或區(其係下文討論之實例中的情况)生成。在製造資料的生成期間,可使用已知寫入資料生成MBER及LMS參數組二者。可儲存已生成的參數組、關於參數組之間的關係(例如,差異)的資訊、或二者。
在操作中,當解碼器110無法解碼儲存在扇區中的資料時,可使用偵測器決策120生成目前LMS參數組。然後,在一些實施
例中,可將在訓練時生成並儲存為製造資料112之MBER與LMS參數組間的差加至目前LMS參數以生成近似MBER參數。
下文提供此處理對實例類型之SOVA偵測器參數的應用,具體地說,針對分支偏差的應用。
對數域維特比或SOVA中的分支度量可採用以下形式:
其中σ2可係分支差異、z可係此分支的DDFIR輸出(或若無資料相依濾波,則FIR)、且zt可係分支偏差。使用LMS調適中的MMSE成本函數,zt=zavg=E[z](例如,分支平均的條件可係此係正確分支)。然而,使用MBER成本函數的調適可遠離zavg調適zt,以在複雜雜訊統計存在的情形下將BER最小化。
在製造期間,可對各區判定MBER參數組zt及已測量MMSE參數組zavg二者。可將製造參數組標記為zt (m)及zavg (m)。
當解碼器110無法在場操作中解碼特定扇區時,更新的MBER參數可允許扇區被解碼。例如,在由於磁軌擠壓而無法解碼的情形中,若對此扇區使用更新的MBER參數,可能會解碼該扇區。然而,因為調適將基於可包括錯誤的偵測器決策,因此可能不使用MBER調適。替代地,調適組件108可使用偵測器決策生成或調適目前MMSE參數zavg (f)。然後調適組件可使用目前MMSE參數zavg (f)以使用下式近似已更新的MBER參數:
此可係有效的,因為MBER偏差與MMSE偏差之間的差對製造參數組可與其對現場錯誤恢復參數組相同。當將zt (m)及zavg (m)儲存在來自製造程序的製造資料112中時,調適組件能在從偵測器決策及LMS演算法計算出zavg (f)之後執行近似。在一些實施例中,LMS調適可利用來自解碼器之可源自偵測器決策及外在資訊的總資訊(例如,LDPC切片總資訊)。
雖然上述實例回應於解碼失敗而計算近似參數,實施例並未受如此限制。例如,近似參數可在即時(on-the-fly)及連續的基礎上藉由調適組件108生成,並基於偵測器106或調適組件108中的模式選擇使用,該模式選擇可允許回應於觸發條件(例如,解碼器110解碼扇區失敗三十(30)次)而使用近似值參數。
參考圖2,顯示一種近似參數調適之方法且整體地指定為200的流程圖。更具體地說,流程圖200可係製造或訓練操作,以針對一目前區生成關於圖1於上文詳述的製造資料112。
在202,系統可接收一目前區之一連續時間輸入信號的複數個樣本以及對應的已知資料。在204,然後該系統可基於該連續時間輸入信號生成數位化樣本的一序列。在206,該系統可基於該等數位化樣本生成一等化樣本序列。
接著,在208,該系統可基於該等化樣本序列及可更新的MBER偵測器參數產生該輸入信號的一資料序列之基於MBER的估
計。在210,該系統可基於該等化樣本序列及可更新的MMSE偵測器參數產生該輸入信號的一資料序列之基於MMSE的估計。在一些實施例中,解碼器可對該等基於MBER的估計及該等基於MMSE的估計的一或多者執行解碼操作。
在212,該系統可基於該等已知值及MBER估計而對該等MBER偵測器參數執行一基於MBER的調適處理。然後,在214,該系統可基於該等已知值及MMSE估計而對該等MMSE偵測器參數執行一基於MMSE的調適處理。
在216,然後該系統可判定該等MBER偵測器參數及該等MMSE偵測器參數是否已穩定。若該等參數已穩定,在218,該系統可儲存該目前區之基於MBER的偵測器參數及基於MMSE的偵測器參數(例如,作為製造資料112)。在一些實施例中,該系統也可判定及儲存該等MBER偵測器參數與該等MMSE偵測器參數之間的關係資料(例如,差)。另外地或替代地,當利用該等區參數時,可生成一些或所有關係資料。若該等參數尚未穩定,該系統可返回至208以進行額外的調適操作。雖然未圖示,但在一些實施例中,當參數尚未穩定或可係可對新樣本執行穩定性判定時,亦可重複額外操作(諸如,操作202至206之一或多者),直到參數對於該區之整體資料樣本已穩定。
參考圖3,顯示一種近似參數調適之方法且整體地指定為300的流程圖。更具體地說,流程圖300可係在讀取或接收操作期間的偵測、解碼、及近似參數調適,且可如上文關於圖1所詳述地執行。
在操作中,在302,該系統可接收,例如,一目前資料扇區之一連續時間輸入信號的複數個樣本。在304,該系統可基於該連續時間輸入信號,例如,使用ADC生成數位化樣本的一序列。接著,在306,該系統可基於該等數位化樣本生成一等化樣本序列。
在308,該系統可基於該等化樣本序列及可更新的MBER偵測器參數,例如,使用一SOVA偵測器產生該輸入信號之一資料序列的估計。在310,然後可對該等偵測器估計,例如,使用一LDPC解碼器執行解碼操作。
在312,該系統可判定該解碼器是否成功。若是如此,在314,該系統可停止對該目前扇區的操作、輸出該已解碼資料序列、並基於該已成功解碼的資料序列使用MBER調適來更新該等基於MBER的偵測器參數。若該解碼器未成功,在316,該系統可判定對於該目前扇區是否已失敗達一臨限數目個解碼嘗試。若為否,該系統可返回至308以進行額外偵測及解碼嘗試。若對於該目前扇區已發生一臨限數目個解碼失敗,在318,該系統可開始近似參數調適。更具體地說,在318,該系統可藉由使用基於MMSE的偵測器參數執行偵測操作、對該等基於MMSE的偵測器估計執行解碼、及使用MMSE調適來更新該等基於MMSE的偵測器參數,而調適該目前扇區之該等基於MMSE的偵測器參數。
接著,在320,該系統可基於基於MMSE的偵測器參數以及一目前區之該等MBER偵測器參數及該等基於MMSE的偵測器參數之先前值的一關係資料而近似更新的MBER偵測器參數。例如,可
藉由將先前生成及儲存的MBER偵測器參數與基於MMSE的偵測器參數之間的差加至如參考圖1於上文所述之目前扇區的目前生成之基於MMSE的偵測器參數而生成近似更新的MBER偵測器參數。
然後,在322,該系統可執行偵測器操作以基於該等化樣本序列和該等近似更新的MBER偵測器參數產生該輸入信號之一資料序列的估計,並基於使用該等近似更新的MBER偵測器參數生成的估計執行解碼操作(例如,一或多個迭代偵測和解碼操作可使用該等近似更新的MBER偵測器參數來執行)。雖然未顯示,若在322的解碼操作成功,可輸出該目前扇區的解碼結果,且MBER調適可基於該等近似更新的MBER偵測器參數及該等MBER偵測器參數之一或兩者使用該成功解碼的結果來執行。若在322的解碼操作不成功,可觸發其他恢復操作,或處理300可在錯誤狀態下終止。
方法200及300中所列的所有步驟可應用至具有調適性參數的系統。如上所述,其他調適演算法能取代MBER及MMSE,且此等處理可用於其他電路(諸如,解碼器、等化器、及ADC等)的參數。鑒於本揭露,許多其他變體將係顯而易見的。用以執行該方法中之操作的組件及電路可係離散的、整合進系統單晶片(SOC)中、或其他電路中。
此外,該等步驟可在處理器(例如,數位信號處理器)中實行、以軟體實施、經由韌體實施、或藉由其他手段實施。
參考圖4,顯示包括近似參數調適且整體地指定為400之系統的方塊圖。系統400可係資料儲存裝置(data storage device,DSD)
之實例,且可係系統100之實例實施方案。DSD 416能可選地連接至主機裝置414且可自該主機裝置移除,該主機裝置能係具有儲存資料的裝置或系統,諸如,桌上型電腦、膝上型電腦、伺服器、數位視訊記錄器、影印機、電話機、音樂播放器、未列出之其他電子裝置或系統、或其任何組合。資料儲存裝置416能經由基於硬體/韌體的主機介面電路412與主機裝置414通訊,該主機介面電路可包括允許DSD 416與主機414物理連接及斷開的連接器(未圖示)。
DSD 416能包括系統處理器402(其可係可程式化控制器),及關聯記憶體404。系統處理器402可係系統單晶片(SOC)之一部分。緩衝器406可在讀取及寫入操作期間臨時儲存資料,並能包括命令佇列。讀取/寫入(R/W)通道410可在寫入操作期間編碼至資料儲存媒體408的資料,並在讀取操作期間重建來自該資料儲存媒體的資料。將資料儲存媒體408顯示及描述為硬碟驅動器,但亦可係其他類型之磁性媒體,諸如,快閃媒體、光學媒體、或其他媒體、或其任何組合。
R/W通道410可同時自多於一個的資料儲存媒體接收資料,且在一些實施例中,也能並行地接收多個資料信號,諸如,來自讀取頭之多於一個的輸出。例如,具有二維磁性記錄(TDMR)系統之儲存系統可具有多個讀取或記錄元件,且可同時或幾乎同時自兩個磁軌讀取。多維記錄(MDR)系統可接收來自多個源(例如,記錄頭、快閃記憶體、光學記憶體等)之兩個或更多個輸入。如本文之實例中所述,R/W通道410可組合多個輸入且提供單個輸出。
方塊418可實施全部或部分的系統及系統與方法100、200、及300的功能。在一些實施例中,方塊418可係單獨電路、整合進R/W通道410、包括在系統單晶片中、韌體、軟體、或其任何組合。
本文描述的繪示、實例、及實施例旨在提供各種實施例之結構的一般理解。該等圖解不意欲作為對利用本文所述之結構或方法之設備及系統的所有元件及特徵的完整描述。在查看本揭露後,許多其他實施例對於所屬技術領域中具有通常知識者而言可係顯而易見的。其他實施例可加以利用且衍生自本揭露,使得在不脫離本揭露之範圍的情况下可進行結構及邏輯取代及變化。例如,圖式及以上說明提供了可經改變(諸如,為了系統之設計要求)之架構及電壓之實例。此外,雖然本文繪示且描述了具體實施例,但應當理解,為達成相同或相似目的而設計的任何後續配置可取代所展示之具體實施例。
本揭露意欲涵蓋各種實施例之任何且全部後續調適或變型。在檢視本說明之後,以上實例之組合及本文未具體描述之其他實施例對於所屬技術領域中具有通常知識者而言將係顯而易見的。另外,該等圖解僅僅係代表性的,且可不按比例繪製。圖解中之某些比例可經放大,而其他比例可經縮小。因此,本揭露及圖式應被視係例示性的、而非限制性的。
100:系統/通訊通道
102:類比數位轉換器/ADC/等化器
104:等化器
106:偵測器
108:調適組件/偵測器
110:解碼器
112:製造資料
114:連續時間信號/信號
116:樣本
118:經等化樣本序列
120:資料序列/決策
122:已解碼資料
124:參數/係數/值
b:已解碼資料
p:參數
x:樣本
x(t):連續時間信號
y:經等化樣本序列
Claims (20)
- 一種用於參數調適之設備,其包含:一電路,其經組態以使用一組通道參數(channel parameters)處理一輸入信號,該電路進一步經組態以:使用一第一調適演算法(adaptation algorithm)來產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數;基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似(approximate)在處理該輸入信號時由該電路使用為該組通道參數之該第二調適演算法的一第二組通道參數;及將該第二組通道參數使用為該組通道參數而執行該輸入信號的該處理。
- 如請求項1之設備,其進一步包含該電路進一步包括一偵測器,該偵測器使用該組通道參數執行該輸入信號的該處理。
- 如請求項2之設備,其進一步包含該偵測器係一軟輸出維特比演算法(Soft-Output Viterbi Algorithm,SOVA)偵測器,且該組通道參數係該SOVA偵測器的分支偏差。
- 如請求項2之設備,其進一步包含該第一調適演算法係一MMSE調適演算法,且該第二調適演算法係一MBER調適演算法。
- 如請求項1之設備,其進一步包含一記憶體,該記憶體儲存使用該第一調適演算法生成的該第三組通道參數及使用該第二調適演算法生成之該第四組通道參數。
- 如請求項1之設備,其進一步包含該電路進一步包括一偵測器,該偵測器使用該組通道參數執行該輸入信號之該處理,該電路進一步經組態以:將使用由該第二調適演算法生成的一第五組通道參數使用為處理該輸入信號時的該組通道參數而執行該輸入信號的處理以產生一偵測結果;判定藉由該偵測器使用該第五組通道參數所產生之一或多個偵測結果的一解碼已失敗達一臨限次數;及至少部分回應於該判定該解碼已失敗達該臨限次數,將該第二組通道參數使用為該組通道參數而執行該輸入信號的該處理。
- 如請求項6之設備,其進一步包含該電路經組態以:判定藉由該偵測器使用該第二組通道參數所產生之一或多個偵測結果的一解碼已成功;及至少部分回應於該判定該解碼已成功,使用該第二調適演算法而使用該成功解碼的結果來調適該第二組通道參數。
- 如請求項1之設備,其進一步包含該電路進一步包括一偵測器,該偵測器使用該組通道參數執行該輸入信號之該處理,該電路進一步經組態以: 將使用該第二調適演算法生成的一第五組通道參數使用為處理該輸入信號時的該組通道參數而執行該輸入信號的處理以產生一偵測結果;判定藉由該偵測器使用該第五組通道參數所產生之一或多個偵測結果的一解碼在小於一臨限數目個失敗後已成功;及至少部分回應於該判定該解碼已成功,使用該第二調適演算法而使用該成功解碼的結果來調適該第五組通道參數。
- 如請求項1之設備,其進一步包含:一記憶體,其儲存使用該第一調適演算法生成的該第三組通道參數及使用該第二調適演算法生成之該第四組通道參數;該輸入信號係讀自一磁性儲存媒體之一扇區的一讀回信號;及該第三組通道參數及該第四組通道參數對應於包括該扇區之該磁性儲存媒體的一區域,且係在包括讀回寫入至包括該扇區之該磁性儲存媒體的該區域之已知資料的一製造程序期間所生成。
- 一種用於參數調適之系統,其包含:一通道電路,其經組態以使用一組參數來處理一輸入信號;一調適電路,其經組態以:使用一第一調適演算法來產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數;基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該通道電 路使用為該組通道參數之該第二調適演算法的一第二組通道參數;及將該第二組通道參數輸出至該通道電路以在處理該輸入信號時使用為該組通道參數。
- 如請求項10之系統,其進一步包含該通道電路係一軟輸出維特比演算法(SOVA)偵測器,且該組通道參數係該SOVA偵測器的分支偏差。
- 如請求項11之系統,其進一步包含該第一調適演算法係一MMSE調適演算法,且該第二調適演算法係一MBER調適演算法。
- 如請求項11之系統,其進一步包含:一記憶體,其儲存使用該第一調適演算法生成的該第三組通道參數及使用該第二調適演算法生成之該第四組通道參數;該輸入信號係對應於一磁性儲存媒體之一扇區的一數位化樣本序列;及該第三組通道參數及該第四組通道參數對應於包括該扇區之該磁性儲存媒體的一區域,且係在包括讀回寫入至包括該扇區之該磁性儲存媒體的該區域之已知資料的一製造程序期間所生成。
- 如請求項11之系統,其進一步包含:一ADC電路,其經組態以基於對應於該扇區的一讀回信號生成一或多個ADC樣本;一等化器電路,其經組態以接收一ADC樣本並等化該等ADC樣本以生成該數位化樣本序列;及 一解碼器,其經組態以接收使用該組參數處理該輸入信號之該SOVA偵測器的一輸出,及對該SOVA偵測器的該輸出執行解碼。
- 如請求項10之系統,其進一步包含該通道電路係一偵測器,且該調適電路進一步經組態以:將一第五組通道參數輸出至該通道電路以在處理該輸入信號時使用為該組通道參數而產生一或多個偵測結果,該第五組通道參數使用該第二調適演算法生成;判定藉由該偵測器使用該第五組通道參數所產生之該一或多個偵測結果的一解碼已失敗達一臨限次數;及至少部分回應於該判定該解碼已失敗達該臨限次數,將該第二組通道參數使用為該組通道參數而執行該輸入信號的該處理。
- 如請求項10之系統,其進一步包含該通道電路係一偵測器,且該調適電路進一步經組態以:將一第五組通道參數輸出至該通道電路以在處理該輸入信號時使用為該組通道參數而產生一或多個偵測結果,該第五組通道參數使用該第二調適演算法生成;判定藉由該偵測器使用該第五組通道參數所產生之該一或多個偵測結果的一解碼在小於一臨限數目個失敗後已成功;及至少部分回應於該判定該解碼已成功,使用該第二調適演算法而使用該成功解碼的結果來調適該第五組通道參數。
- 一種用於參數調適之方法,其包含: 藉由經組態以使用一組通道參數處理一輸入信號及使用一第一調適演算法的一電路,產生在處理該輸入信號時由該電路使用為該組通道參數的一第一組通道參數;基於該第一組通道參數及使用該第一調適演算法生成的一第三組通道參數與使用一第二調適演算法生成的一第四組通道參數之間的一關係來近似在處理該輸入信號時由該電路使用為該組通道參數之該第二調適演算法的一第二組通道參數;及將該第二組通道參數使用為該組通道參數而執行該輸入信號的該處理。
- 如請求項17之方法,其進一步包含電路包括將該組通道參數使用為該SOVA偵測器的分支偏差以執行該輸入信號之該處理的一軟輸出維特比演算法(SOVA)偵測器。
- 如請求項18之方法,其進一步包含該第一調適演算法係一MMSE調適演算法,且該第二調適演算法係一MBER調適演算法。
- 如請求項17之方法,其進一步包含:該輸入信號係對應於一磁性儲存媒體之一扇區的一數位化樣本序列;該第三組通道參數及該第四組通道參數對應於包括該扇區之該磁性儲存媒體的一區域,且係在包括讀回寫入至包括該扇區之該磁性儲存媒體的該區域之已知資料的一製造程序期間所生成;及該第三組通道參數與該第四組通道參數之間的該關係係一差。
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