CN102479120A - Startup/shutdown test system and startup/shutdown test method - Google Patents

Startup/shutdown test system and startup/shutdown test method Download PDF

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Publication number
CN102479120A
CN102479120A CN2010105532162A CN201010553216A CN102479120A CN 102479120 A CN102479120 A CN 102479120A CN 2010105532162 A CN2010105532162 A CN 2010105532162A CN 201010553216 A CN201010553216 A CN 201010553216A CN 102479120 A CN102479120 A CN 102479120A
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China
Prior art keywords
time
supply unit
measured
testing
load
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Pending
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CN2010105532162A
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Chinese (zh)
Inventor
李伟铭
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Priority to CN2010105532162A priority Critical patent/CN102479120A/en
Publication of CN102479120A publication Critical patent/CN102479120A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a startup/shutdown test system and a startup/shutdown test method. The method comprises the following steps of: presetting a range for a startup time and a shutdown time and a test number of times, and initializing tested number of times; randomly selecting a number from the range for the startup time and the shutdown time respectively as a startup time and a shutdown time, and controlling to add one to the tested number of times; controlling a power supply device to be tested to start up, and sustaining for the selected startup time; controlling a voltage measurement device to measure a working voltage value of the power supply device to be tested in real time in the sustaining startup time, and reading the measured working voltage value; and when the power supply device to be tested is in startup for the selected startup time and the read working voltage value is not zero, controlling the power supply device to be tested to shut down, and sustaining for the selected shutdown time. With the adoption of the startup/shutdown test system and the startup/shutdown test method, the startup/shutdown test can be carried out more automatically and efficiently.

Description

On-off testing system and method
Technical field
The present invention relates to a kind of on-off testing system and method.
Background technology
Switching on and shutting down (ON-OFF) test is an important test of check Devices to test performance situation; Mainly all be that the tester carries out manual test at present; Cause to know the failure of when can starting shooting or shut down easily like this, also can't use avometer to measure voltage at any time and judge whether to start shooting successfully.In addition, generally speaking, the SPEC of Devices to test (Standard Performance Evaluation Corporation; System Performance Evaluation Corporation) all requires ON-OFF 1,000 times, 10,000 times; Cause test to be wasted time and energy, and since human factor, easy error.Simultaneously owing to use fixing start and unused time that Devices to test is carried out the switching on and shutting down test, can't be accurately comprehensively the understanding Devices to test when start shooting or shut down failure.
Summary of the invention
In view of above content, be necessary to provide a kind of method for testing open/close machine, through the test mode of robotization, and select start and unused time that supply unit to be measured is tested at random, accurately comprehensively carry out the switching on and shutting down test.
In addition, also be necessary to provide a kind of on-off testing system,, and select start and unused time that supply unit to be measured is tested at random, accurately comprehensively carry out the switching on and shutting down test through the test mode of robotization.
A kind of method for testing open/close machine; Be applied in the computing machine; Described computing machine is connected with DC electronic load, power supply device and voltage measuring equipment respectively through general purpose interface bus GPIB, and described DC electronic load, power supply device and voltage measuring equipment all are connected with supply unit to be measured.This method comprises: step is set: be preset as load that supply unit to be measured provides and the scope of voltage, testing time, start and unused time and initialization testing time be zero; Controlled step: in start and the scope of unused time, select a numeral at random, and control that testing time adds one as start and unused time; Start step:, control described supply unit start to be measured, and continue the selected on time according to load and the voltage and the selected on time of said setting; Read step: control voltage measuring equipment measures the operational voltage value of said supply unit to be measured in real time in the lasting on time, and reads the operational voltage value that measures; Shutdown procedures: when supply unit to be measured start has continued the selected on time, and the operational voltage value that is read is controlled described supply unit shutdown to be measured, and is continued the selected unused time when non-vanishing.
A kind of on-off testing system; Run in the computing machine; Described computing machine is connected with DC electronic load, power supply device and voltage measuring equipment respectively through general purpose interface bus GPIB, and described DC electronic load, power supply device and voltage measuring equipment all are connected with supply unit to be measured.This system comprises: module is set, is used to be preset as load and the voltage that supply unit to be measured provides, and preset testing time, the scope of start and unused time, and initialization testing time be zero; Control module is used for selecting a numeral as start and unused time at random in start and the scope of unused time, and controls that testing time adds one; Described control module also is used for load and voltage and selected on time according to said setting, controls described supply unit start to be measured, and continues the selected on time; Described control module also is used in the operational voltage value that continues the said supply unit to be measured of on time inner control voltage measuring equipment real-time measurement, and reads the operational voltage value that measures; Described control module also is used for having continued the selected on time when supply unit to be measured start, and the operational voltage value that is read is controlled described supply unit shutdown to be measured, and continued the selected unused time when non-vanishing.
Compared to prior art, on-off testing system of the present invention and method through the test mode of robotization, and select start and unused time that supply unit to be measured is tested at random, accurately comprehensively carry out the switching on and shutting down test, have improved testing efficiency.In addition, when the start performance of test supply unit to be measured, if boot failure, then automatically powered-down feeding mechanism and DC electronic load finishes testing process, can accurately understand the failure of starting shooting or shut down when like this.
Description of drawings
Fig. 1 is the configuration diagram of on-off testing system preferred embodiment of the present invention.
Fig. 2 is the functional block diagram of on-off testing system preferred embodiment of the present invention.
Fig. 3 is the process flow diagram of method for testing open/close machine preferred embodiment of the present invention.
The main element symbol description
Computing machine 1
Test macro 10
Display unit 20
GPIB 2
The DC electronic load 3
Power supply device 4
The voltage measuring equipment 5
Supply unit to be measured 6
Module is set 100
Control module 102
Display module 104
Judge module 106
Logging modle 108
Embodiment
As shown in Figure 1, be the configuration diagram of on-off testing system preferred embodiment of the present invention.Described automated computer on-off operation test macro 10 (hereinafter to be referred as " test macro 10 ") runs in the computing machine 1.Described computing machine 1 also comprises display unit 20.Described display unit 20 is used to show the visualized data of computing machine 1 output, for example test data etc.This computing machine 1 is through three GPIB (General Purpose Interface Bus; General purpose interface bus) 2 are connected with a DC electronic load 3, a power supply device 4 and a voltage measuring equipment 5 respectively, realize the control to said DC electronic load 3, power supply device 4 and voltage measuring equipment 5.Described DC electronic load 3, power supply device 4 and voltage measuring equipment 5 all are connected with supply unit 6 to be measured.Described DC electronic load 3 is used to supply unit 6 to be measured required load is provided, and described power supply device 4 is used for to supply unit 6 to be measured voltage being provided.Described voltage measuring equipment 5 is used to measure the operational voltage value of supply unit 6 to be measured.When supply unit 6 to be measured is worked (start), just have operational voltage value (the expression operational voltage value is non-vanishing).When supply unit 6 to be measured was not worked (shutdown), its operational voltage value was zero.
As shown in Figure 2, be the functional block diagram of test macro 10 among Fig. 1.This test macro 10 comprises module 100, control module 102, display module 104 and judge module 106 is set.The alleged module of the present invention is to accomplish the computer program code segments of a specific function, be more suitable in describing the implementation of software in computing machine than program, therefore below the present invention to all describing in the software description with module.
The described module 100 that is provided with is used to be preset as load that supply unit 6 to be measured provides and voltage, testing time, and the scope of preset start and unused time.Said preset load, voltage and testing time is that the SPEC (Standard Performance Evaluation Corporation, System Performance Evaluation Corporation) according to supply unit 6 to be measured is provided with.Described testing time can be arranged to 1000 times, 10000 times.The scope of described start and unused time comprises a maximal value (maximum) and a minimum value (minimum).For example, it is 10 seconds that maximal value can be set, and minimum value is 5 seconds.
Described be provided with module 100 also be used for initialization testing time be zero.
Described control module 102 is used for selecting a numeral as start and unused time at random in start and the scope of unused time, and controls that testing time adds one.What should explain is through start and unused time are set at random, can more comprehensively test the power source performance of supply unit 6 to be measured.
Described display module 104 is used for controlling after testing time has added one in control module 102; On display unit 20, show above-mentioned testing time and 102 selected start and unused time of control module this time, testing time that the user can be through this demonstration and start and unused time are understood test case.What should explain is that described display module 104 can also show set load, voltage and start and the test parameters such as scope of unused time on display unit 20, supply the user to check.
Described control module 102 also was used for according to the load of said setting and voltage and selected on time, controlled described supply unit to be measured 6 starts, and continued the selected on time.Described control module 102 provides the load of setting through the load 3 of GPIB2 control DC electronic for supply unit 6 to be measured, and control power supply device 4 provides set voltage for supply unit 6 to be measured, and the lasting selected on time.
Described control module 102 also is used to control voltage measuring equipment 5 and measures the operational voltage value of said supply unit 6 to be measured, and in lasting selected on time and unused time, reads the operational voltage value that measures in real time.
Described judge module 106 is used to judge whether the said operational voltage value that reads is zero.
Described control module 102 also is used for having continued the selected on time when supply unit to be measured 6 starts, and the operational voltage value that is read is controlled described supply unit to be measured 6 shutdown, and continued the selected unused time when non-vanishing.Described control module 102 is zero through the load that GPIB2 control DC electronic load 3 provides for supply unit 6 to be measured; The voltage that control power supply device 4 provides for supply unit 6 to be measured is zero; Thereby close DC electronic load 3 and power supply device 4; And continue the selected unused time, so that supply unit to be measured 6 shutdown and lasting selected unused time.
When supply unit 6 to be measured continued start, if the WV that is read is zero, described control module 102 was closed described DC electronic load 3 and power supply device 4, end switch machine testing process.
Described logging modle 108 is used for when supply unit 6 to be measured continues start; If the WV that is read is zero; And when control module 102 controls supply unit 6 to be measured is started shooting; If the operational voltage value that is read is non-vanishing, writing down this test result is test crash, and is presented on the display unit 20.
Described logging modle 108 also is used for when supply unit to be measured 6 shutdown and has continued the selected unused time, and the operational voltage value that is read is when being zero, and logging modle 108 these test results of record are for to test successfully, and is presented on the display unit 20.
It is when testing successfully, to judge whether testing time reaches set testing time that described judge module 106 also is used for when logging modle 108 writes down these test results.If do not reach set testing time, then continue test next time; If reach set testing time, then switching on and shutting down EOT.
As shown in Figure 3, be the process flow diagram of method for testing open/close machine preferred embodiment of the present invention.Step S10, described be provided with module 100 be preset as load that supply unit 6 to be measured provides and the scope of voltage, testing time, start and unused time and initialization testing time be zero.
Step S11; Described control module 102 selects a numeral as start and unused time in the scope of start and unused time at random; And control that testing time adds one, and described display module 104 shows above-mentioned testing time and 102 selected start and unused time of control module this time on display unit 20.
Step S12, according to load and the voltage and the selected on time of said setting, described supply unit 6 starts to be measured of described control module 102 controls, and continue the selected on time.Described control module 102 provides the load of setting through the load 3 of GPIB2 control DC electronic for supply unit 6 to be measured, and control power supply device 4 provides set voltage for supply unit 6 to be measured, and the lasting selected on time.
Step S13, the operational voltage value of described control module 102 said supply unit 6 to be measured of control voltage measuring equipment 5 measurements in real time in this on time that continues, and read the operational voltage value that measures.
Step S14, described judge module 106 judge that whether the said operational voltage value that reads is zero, when the operational voltage value that is read is zero, gets into step S15; When the WV that is read is non-vanishing, get into step S17.
Step S15, described control module 102 is closed described DC electronic load 3 and power supply device 4, and gets into step S16.
Step S16, described logging modle 108 these test results of record are test crash, and are shown on the display unit 20 end switch machine testing process.
Step S17; After supply unit 6 starts to be measured have continued the selected on time; Described supply unit 6 shutdown to be measured of described control module 102 controls; And continue the selected unused time, and the operational voltage value that in this unused time that continues, reads the supply unit to be measured 6 that 5 of voltage measuring equipments measure in real time.Described control module 102 is zero through the load that GPIB2 control DC electronic load 3 provides for supply unit 6 to be measured, and the voltage that control power supply device 4 provides for supply unit 6 to be measured is zero, and continues the selected unused time.
Step S18, described judge module 106 judge whether the operational voltage value that is read is zero.When the operational voltage value that is read is zero, get into step S19; When the operational voltage value that is read is non-vanishing, return step S16.
Step S19, when supply unit to be measured 6 shutdown have continued the selected unused time, and the operational voltage value that is read is when being zero, described logging modle 108 these test results of record are for to test successfully.
Step S20, judge module 106 judge whether testing time reaches set testing time.If do not reach set testing time, then return step S11 and continue test next time; If reach set testing time, then switching on and shutting down EOT.
What should explain at last is; Above embodiment is only unrestricted in order to technical scheme of the present invention to be described; Although the present invention is specified with reference to preferred embodiment; Those of ordinary skill in the art should be appreciated that and can make amendment or be equal to replacement technical scheme of the present invention, and do not break away from the spirit and the scope of technical scheme of the present invention.

Claims (10)

1. method for testing open/close machine; Be applied in the computing machine; Described computing machine is connected with DC electronic load, power supply device and voltage measuring equipment respectively through general purpose interface bus GPIB; Described DC electronic load, power supply device and voltage measuring equipment all are connected with supply unit to be measured, it is characterized in that, this method comprises:
Step is set: be preset as load that supply unit to be measured provides and the scope of voltage, testing time, start and unused time and initialization testing time be zero;
Controlled step: in start and the scope of unused time, select a numeral at random, and control that testing time adds one as start and unused time;
Start step:, control described supply unit start to be measured, and continue the selected on time according to load and the voltage and the selected on time of said setting;
Read step: control voltage measuring equipment measures the operational voltage value of said supply unit to be measured in real time in the lasting on time, and reads the operational voltage value that measures;
Shutdown procedures: when supply unit to be measured start has continued the selected on time, and the operational voltage value that is read is controlled described supply unit shutdown to be measured, and is continued the selected unused time when non-vanishing.
2. method for testing open/close machine as claimed in claim 1 is characterized in that, this method also comprises:
Step display: on the display unit of computing machine, show above-mentioned testing time and this selected start and unused time.
3. method for testing open/close machine as claimed in claim 1; It is characterized in that; Described start step is to be the load that supply unit to be measured provides setting through the load of GPIB control DC electronic; The control power supply device is that supply unit to be measured provides set voltage, and continues that the selected on time realizes;
And described shutdown procedures is to be that the load that supply unit to be measured provides is zero through the load of GPIB control DC electronic; The control power supply device is that the voltage that supply unit to be measured provides is zero; Thereby close DC electronic load and power supply device, and continue that the selected unused time realizes.
4. method for testing open/close machine as claimed in claim 3 is characterized in that, this method also comprises step:
Continue when the WV that is read is zero, to close described DC electronic load and power supply device in the process of start at supply unit to be measured, and to write down this test result be test crash process ends;
And in the process that supply unit to be measured continues to shut down, when the operational voltage value that is read was non-vanishing, writing down this test result was test crash, process ends.
5. method for testing open/close machine as claimed in claim 1 is characterized in that, this method also comprises:
When supply unit to be measured shutdown has continued the selected unused time, and the operational voltage value that is read writes down this test result for to test successfully, and judges whether testing time reaches set testing time when being zero; And
If testing time has reached set testing time, then flow process finishes; Or
If testing time has not reached set testing time, then return controlled step, continue test next time.
6. on-off testing system; Run in the computing machine; Described computing machine is connected with DC electronic load, power supply device and voltage measuring equipment respectively through general purpose interface bus GPIB; Described DC electronic load, power supply device and voltage measuring equipment all are connected with supply unit to be measured, it is characterized in that, this system comprises:
Module is set, is used to be preset as load and the voltage that supply unit to be measured provides, and preset testing time, the scope of start and unused time, and initialization testing time be zero;
Control module is used for selecting a numeral as start and unused time at random in start and the scope of unused time, and controls that testing time adds one;
Described control module also is used for load and voltage and selected on time according to said setting, controls described supply unit start to be measured, and continues the selected on time;
Described control module also is used in the operational voltage value that continues the said supply unit to be measured of on time inner control voltage measuring equipment real-time measurement, and reads the operational voltage value that measures;
Described control module also is used for having continued the selected on time when supply unit to be measured start, and the operational voltage value that is read is controlled described supply unit shutdown to be measured, and continued the selected unused time when non-vanishing.
7. on-off testing system as claimed in claim 6 is characterized in that this system also comprises
Display module is used on the display unit of computing machine, showing above-mentioned testing time and this selected start and unused time.
8. on-off testing system as claimed in claim 6; It is characterized in that; Described control module is to be the load that supply unit to be measured provides setting through the load of GPIB control DC electronic; The control power supply device is that supply unit to be measured provides set voltage, and continues the selected on time, controls supply unit start to be measured and continues the selected on time;
And be that the load that supply unit to be measured provides is zero through the load of GPIB control DC electronic; The control power supply device is that the voltage that supply unit to be measured provides is zero; Thereby close DC electronic load and power supply device; And continue the selected unused time, control supply unit shutdown to be measured and continue the selected unused time.
9. on-off testing system as claimed in claim 8; It is characterized in that described control module also is used for continuing at supply unit to be measured the process of start, when the WV that is read is zero; Close described DC electronic load and power supply device, end switch machine testing process.
10. on-off testing system as claimed in claim 6; It is characterized in that this system also comprises logging modle, be used for continuing the process of start at supply unit to be measured; When the WV that is read is zero; Or in the process that supply unit to be measured continues to shut down, when the WV that is read was non-vanishing, writing down this test result was test crash; And continued the selected unused time when supply unit to be measured shutdown, and the operational voltage value that in this lasting unused time, is read writes down this result for to test successfully when being zero;
Judge module, being used for when writing down this test result is when testing successfully, to judge whether testing time reaches set testing time; If do not reach set testing time; Then continue test next time, if reach set testing time, then switching on and shutting down EOT.
CN2010105532162A 2010-11-22 2010-11-22 Startup/shutdown test system and startup/shutdown test method Pending CN102479120A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102854423A (en) * 2012-09-14 2013-01-02 上海斐讯数据通信技术有限公司 Method for testing starting reliability of equipment
CN106569925A (en) * 2016-11-15 2017-04-19 惠州大亚湾华北工控实业有限公司 On/off stability test module and on/off stability test method
CN107632219A (en) * 2017-10-11 2018-01-26 四川九州电子科技股份有限公司 A kind of automatic switching test system and its method of testing
CN115174430A (en) * 2022-06-30 2022-10-11 中车青岛四方车辆研究所有限公司 Method and device for testing starting time of rail transit vehicle-mounted equipment
CN115729754A (en) * 2021-09-01 2023-03-03 龙芯中科(成都)技术有限公司 Equipment testing method and device, electronic equipment and storage medium

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1512344A (en) * 2002-12-30 2004-07-14 神达电脑股份有限公司 Test method for open and close of computer
CN101436154A (en) * 2007-11-14 2009-05-20 鸿富锦精密工业(深圳)有限公司 Startup and closedown test system and method of computer mainboard
CN101526585A (en) * 2008-03-07 2009-09-09 佛山市顺德区顺达电脑厂有限公司 Automatic switching test system and method
US20110169521A1 (en) * 2010-01-13 2011-07-14 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. Testing system for power supply unit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1512344A (en) * 2002-12-30 2004-07-14 神达电脑股份有限公司 Test method for open and close of computer
CN101436154A (en) * 2007-11-14 2009-05-20 鸿富锦精密工业(深圳)有限公司 Startup and closedown test system and method of computer mainboard
CN101526585A (en) * 2008-03-07 2009-09-09 佛山市顺德区顺达电脑厂有限公司 Automatic switching test system and method
US20110169521A1 (en) * 2010-01-13 2011-07-14 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. Testing system for power supply unit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102854423A (en) * 2012-09-14 2013-01-02 上海斐讯数据通信技术有限公司 Method for testing starting reliability of equipment
CN106569925A (en) * 2016-11-15 2017-04-19 惠州大亚湾华北工控实业有限公司 On/off stability test module and on/off stability test method
CN107632219A (en) * 2017-10-11 2018-01-26 四川九州电子科技股份有限公司 A kind of automatic switching test system and its method of testing
CN115729754A (en) * 2021-09-01 2023-03-03 龙芯中科(成都)技术有限公司 Equipment testing method and device, electronic equipment and storage medium
CN115174430A (en) * 2022-06-30 2022-10-11 中车青岛四方车辆研究所有限公司 Method and device for testing starting time of rail transit vehicle-mounted equipment
CN115174430B (en) * 2022-06-30 2024-01-26 中车青岛四方车辆研究所有限公司 Method and device for testing starting time of track traffic vehicle-mounted equipment

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Application publication date: 20120530