CN110320463B - Device and method for realizing intelligent aging control of equipment to be tested - Google Patents
Device and method for realizing intelligent aging control of equipment to be tested Download PDFInfo
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- CN110320463B CN110320463B CN201910600103.4A CN201910600103A CN110320463B CN 110320463 B CN110320463 B CN 110320463B CN 201910600103 A CN201910600103 A CN 201910600103A CN 110320463 B CN110320463 B CN 110320463B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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Abstract
The application provides a device and a method for realizing intelligent aging control of equipment to be tested, which are applied to the technical field of electronics and used for solving the problem that the equipment to be tested such as a television or a mainboard aging experiment is difficult to independently perform aging control on the equipment to be tested. The device includes: including micro control processor, memory cell, power, input unit, its characterized in that still includes switch selection unit and switch unit, the memory cell the power input unit reaches switch selection unit's one end all with micro control processor connects, switch selection unit's the other end is connected switch unit's one end, switch unit's the other end is connected the equipment that awaits measuring. According to the method and the device, the power-on and power-off of each piece of to-be-tested equipment which is connected are controlled through the control switch selection unit, and the aging of a single piece of or multiple pieces of to-be-tested equipment is independently controlled.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a device and a method for realizing intelligent aging control of equipment to be tested.
Background
With the continuous development of science and technology, the types of smart televisions are more and more, and the functions are more and more complex. In order to ensure that the produced smart television or mainboard is safer and more reliable, each manufacturer usually places the smart television or mainboard which is just produced in a specific environment for an aging test, the aging test of different devices to be tested is controlled by the traditional aging test by manpower, so that the efficiency is low, human errors are easy to occur, and the switch in the current market is difficult to control the aging test of the devices to be tested simultaneously and independently.
Therefore, the problem that the equipment to be tested such as a television or a mainboard aging experiment is difficult to independently perform aging control on the equipment to be tested exists at present.
Disclosure of Invention
Therefore, the invention provides a device and a method for realizing intelligent aging control of equipment to be tested, so as to solve the technical problem that the equipment to be tested is difficult to be independently aged and controlled in the prior art.
A device for realizing intelligent aging control of equipment to be tested comprises a micro control processor, a storage unit, a power supply, an input unit, a switch selection unit and a switch unit, wherein one end of the storage unit, one end of the power supply, one end of the input unit and one end of the switch selection unit are all connected with the micro control processor, the other end of the switch selection unit is connected with one end of the switch unit, and the other end of the switch unit is connected with the equipment to be tested;
the power supply is used for supplying power to the micro control processor, the storage unit, the input unit and the switch selection unit;
the storage unit is used for storing the address of the switch unit;
the input unit is used for receiving a test instruction and the test time of the equipment to be tested and inputting the test instruction and the test time to the micro control processor;
the micro-control processor is used for generating a level control signal corresponding to the switch unit according to the test instruction, the address of the switch unit and the test time, and sending the level control signal to the switch selection unit;
the switch selection unit is used for generating different high and low levels according to the level control signal and controlling the on/off of the corresponding switch in the switch unit through the high and low levels;
and the switch unit is used for controlling the power-on or power-off of each circuit in the corresponding equipment to be tested according to the level signal of the switch selection unit.
A method for realizing intelligent aging control of equipment to be tested comprises the following steps:
receiving input equipment to be tested, a test instruction of the equipment to be tested and test time;
determining the address of a switch unit according to the test position of the equipment to be tested and the test object in the test instruction;
selecting a corresponding switch unit according to a mapping relation between the address of the switch unit and the switch unit which is configured in advance;
determining the closing time of the corresponding switch unit in the address according to the test time;
and controlling the selected open/close state and close time of the middle switch unit through a level control signal to finish the aging test of the equipment to be tested.
In the embodiment of the invention, the received test instruction and the test time of the equipment to be tested are converted into the level control signal of the corresponding switch unit through the micro-control processor, and the switch selection unit controls the on or off of the corresponding switch unit according to the level control signal, so that the switch unit can be always on or off at a certain moment according to the level control signal.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.
Fig. 1 is a schematic block diagram of a circuit according to an embodiment of the present invention;
FIG. 2 is a block diagram of a circuit according to another embodiment of the present invention;
FIG. 3 is a block diagram of a circuit according to another embodiment of the present invention;
FIG. 4 is a block diagram of a circuit according to another embodiment of the present invention;
fig. 5 is a schematic circuit diagram of a switch selection unit according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a switch matrix relationship provided in an embodiment of the present invention;
fig. 7 is a schematic circuit diagram of a switch unit according to an embodiment of the present invention;
fig. 8 is a schematic diagram of a circuit structure of a switch unit according to another embodiment of the present invention;
fig. 9 is a flowchart of a method for implementing intelligent aging control of a device under test according to an embodiment of the present invention;
FIG. 10 is a schematic flow chart illustrating step 20 in FIG. 1 according to an embodiment of the present invention;
FIG. 11 is a flowchart illustrating step 30 of FIG. 1;
fig. 12 is a flowchart of a method for implementing intelligent aging control of a device under test according to another embodiment of the present invention;
FIG. 13 is a flowchart illustrating a step 60 in FIG. 12 according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The following detailed description of implementations of the invention refers to the accompanying drawings in which:
fig. 1 illustrates an apparatus for implementing intelligent aging control of a device under test according to an embodiment of the present invention, for convenience of description. Only the parts relevant to the present embodiment are shown, detailed as follows:
as shown in fig. 1, the apparatus for implementing intelligent aging control of a device under test provided by the present invention includes: the microcontroller 101, the storage unit 102, the power supply 103, the input unit 104, the switch selection unit 105 and the switch unit 106.
One end of the storage unit 102, one end of the power supply 103, one end of the input unit 104, and one end of the switch selection unit 105 are all connected to the micro control processor 101, the other end of the switch selection unit 105 is connected to one end of the switch unit 106, and the other end of the switch unit 106 is connected to the device under test 107.
Specifically, the power supply 103 is configured to supply power to the micro control processor 101, the storage unit 102, the input unit 104, and the switch selection unit 105; the storage unit 102 is configured to store an address of the switch unit 106; the input unit 104 is configured to receive a test instruction and test time of the device under test 107, and input the test instruction and the test time to the micro control processor 101; the micro control processor 101 is configured to generate a level control signal corresponding to the switch unit 106 according to the test instruction, the address of the switch unit 106, and the test time, and send the level control signal to the switch selection unit 105; the switch selection unit 105 is configured to generate different high and low levels according to the level control signal, and control the corresponding switch in the switch unit 106 to be turned on or turned off through the high and low levels; the switch unit 106 is configured to control power on or power off of each circuit in the corresponding device under test 107 according to the level signal of the switch selection unit 105.
Further, the switch selection unit 105 includes a station switch pin and a state switch pin, the switch unit includes a station switch unit and a state switch unit, and the switch selection unit is connected to the station switch unit through the station switch pin and is connected to the state switch unit through the state switch pin.
Specifically, the station switch pin is used for controlling the station switch unit to be turned on or off according to the high and low levels of the station switch pin, and controlling the test enable of the device to be tested at the station corresponding to the station switch unit. The state switch pin is used for controlling the on/off of the state switch unit according to the high/low level of the state switch pin and controlling the on/off time of a circuit corresponding to the state switch unit in the equipment to be tested; the station switch unit is used for controlling the test enabling of the station corresponding to the station switch unit; and the state switch unit is used for controlling the closing time of a circuit corresponding to the state switch unit in the equipment to be tested and controlling the aging test duration of different circuits in the equipment to be tested.
In another embodiment of the present invention, the apparatus further comprises: and a voltage conversion unit 108, one end of which is connected to the power supply 103, and the other end of the voltage conversion unit 108 is connected to the second switch unit 106 b.
Further, the voltage conversion unit 108 is configured to convert the voltage output by the power supply into a working voltage of the device under test when the voltage of the power supply 103 is different from the working voltage of the device under test 107.
In one embodiment, when the operating voltage of the device under test is lower than the output voltage of the power supply, the second switch unit 106b connected to the corresponding device under test is an MOS transistor switch.
Specifically, the first switch unit 106a includes a first station switch unit and a first state switch unit, where the first station switch unit is used to determine the first device to be tested, and the first state switch unit is used to control the burn-in test time of different circuits in the first device to be tested.
Specifically, the second switch unit 106b includes a second station switch unit and a second state switch unit, where the second station switch unit is used to determine the second device under test, and the second state switch unit is used to control the aging test time of different circuits in the second device under test.
In an embodiment of the present invention, the device under test includes a television and a motherboard, and when the device under test is a low-voltage device under test such as a motherboard, the 220V ac power provided by the power supply is converted into a 12V/24V low-voltage dc power by the voltage conversion unit to provide power for motherboard aging, and meanwhile, the corresponding second switch unit is a low-voltage MOS transistor circuit, and the second switch unit circuit is as shown in fig. 8.
It should be noted that, in fig. 2, the first switch unit 106a and the second switch unit 106b are both switch units, when the device to be tested is a television, the first switch unit 106a is the switch shown in fig. 7, and when the device to be tested is a low-voltage device such as a motherboard, the second switch unit 106b is the low-voltage MOS transistor switch shown in fig. 8.
In one embodiment, the apparatus further comprises a timing unit 109, which is connected to the micro control processor 101.
Specifically, the micro control processor 101 is further configured to convert the test time into a test time duration corresponding to the switch unit 106, and send the test time duration to the timing unit 109; when receiving a signal of timing end fed back by the timing unit 109, a low-level control signal corresponding to the switch unit 106 is generated and sent to the switch selection unit 105.
Further, the timing unit is configured to start timing when the micro control processor controls a circuit in the device to be tested to be powered on; and when the power-on time of the equipment to be tested reaches the test duration, sending a timing ending signal to the micro control processor.
Further, when the device to be tested, such as a television or a motherboard, is subjected to an aging test, the device to be tested further includes a monitoring input unit 110, one end of the monitoring input unit 110 is connected to the micro control processor 101, and the other end of the monitoring input unit 110 is connected to the device to be tested 107.
Specifically, the monitoring input unit 110 is configured to detect the device under test 107 and the working states of the circuits in the device under test, and send the working states to the micro control processor 101. Further, the monitoring input unit 110 is specifically configured to determine that the device under test 107 is working normally when the test signal sent to the device under test matches the return signal fed back by the device under test according to the test signal, and otherwise, determine that the device under test 107 is working abnormally.
Further, when the device to be tested, such as a television or a motherboard, is subjected to an aging test, the device also includes a display unit 111, and the display unit 111 is connected to the micro control processor 101.
Specifically, the display unit 111 is configured to display a result of the burn-in test on the device under test 107.
In a specific embodiment of the present invention, the monitoring input unit is used to monitor the operating status of the device under test, and the common monitoring circuit may be composed of a camera, an infrared diode with light sensing capability, or other interface circuits capable of directly communicating with the device under test.
Taking the system for controlling the aging time of the television and monitoring the working state of equipment waiting for the television as an example through a switch matrix, the equipment to be tested is connected to a testing station, meanwhile, a testing position is stored in a system storage unit, the system starts to carry out aging testing on the equipment to be tested through the control switch matrix after the aging time is manually input and set, meanwhile, the working state of the equipment to be tested is monitored in real time through a monitoring input unit circuit, a monitoring circuit is composed of a camera, an infrared induction head or a serial port, and when the aging time of the system is up, if the equipment to be tested is not abnormal, the testing is passed. Otherwise, the system can display the state of the abnormal test station and remind a laboratory worker of processing in time, and whether to continue the aging test can be freely determined after the processing is finished.
The embodiment of the invention also provides a method for realizing the intelligent aging control of the equipment to be tested, which can be applied to the device for realizing the intelligent aging control of the equipment to be tested in the embodiment and is used for the aging test of the equipment to be tested.
As shown in fig. 9, an embodiment of the present invention provides a method for implementing intelligent aging control of a device under test, including the following steps:
step 10: and receiving input equipment to be tested, and a test instruction and test time of the equipment to be tested.
In one embodiment, the device under test includes, but is not limited to, a television, a motherboard, and other electronic devices requiring aging test, such as a refrigerator and a washing machine. The test instruction includes the selection of the device to be tested and the test time of each circuit in the device to be tested, for example, the test time of the first circuit in the television is 1H, the test time of the second circuit is 2H, the test time of the third circuit is 3H, and the like.
Step 20: and determining the address of a switch unit according to the test position of the device to be tested and the test object in the test instruction.
Each test station has a corresponding address, the address of the station switch unit can be determined according to the access position of the equipment to be tested, and the address of the state switch unit can be determined according to the access position of a circuit to be tested in the equipment to be tested.
Step 30: and selecting the corresponding switch unit according to the mapping relation between the address of the switch unit and the switch unit which is configured in advance.
The station addresses of the test stations and the station switch units have one-to-one mapping relation, and the station switch units corresponding to the station addresses of the equipment to be tested can be determined according to the station addresses of the equipment to be tested.
Step 40: and determining the closing time of the corresponding switch unit in the address according to the test time.
And controlling the closing time of the corresponding switch unit within a certain time according to the received test time of each circuit of the equipment to be tested, and when the aging test duration of the equipment to be tested reaches the test time, switching off the switch.
Step 50: and controlling the selected open/close state and close time of the middle switch unit through a level control signal to finish the aging test of the equipment to be tested.
As shown in fig. 5, the switch of the device to be tested accessing the station is controlled by the corresponding pin, and when the level control signal output by the switch selection unit is 1, the corresponding switch unit is controlled to be closed, and at this time, the device to be tested is powered on, and the test on the device to be tested is completed.
In an embodiment of the present invention, the system controls the aging time of the television and monitors the television waiting test device through a switch matrix, such as the switch matrix shown in fig. 6, wherein a high-low level signal controlled by a station switch address and a state switch address of each path of switch units in the switch matrix is used for controlling the on-off of the switch of the corresponding switch unit within a specific test time.
The aging test time of the device to be tested corresponding to the corresponding switch unit or a certain circuit module in the device to be tested can be controlled by controlling the closing time of each switch unit.
In a specific embodiment of the present invention, the device to be tested includes a television, a motherboard, and the like, and after the device to be tested accesses the test station, the test instruction and the test time of the device to be tested are obtained. As shown in fig. 5, when the device under test is a television, if the television is controlled to be connected to the test stations '1', '2', '3' for aging time, the television is controlled to be connected to the test stations '1', '2' and '3' for aging time, respectively, to be 1H, 2H and 3H. Assuming that the television access position switches are controlled by Y1, Y2 and Y3, the addresses of the corresponding switch units in the storage unit are inquired to be 001, 010 and 011, and the outputs corresponding to Y1, Y2 and Y3 are set to be high through the selection switch unit, then the control pins corresponding to the switch units in fig. 7 are pulled high, the switch is turned on, that is, the television starts to be electrified and aged. Meanwhile, the input unit receives the set aging time of 1H, 2H and 3H, when the aging time reaches 1H, the output of the switch selection unit with the address of 001 of the system control switch unit is 0, the corresponding switch unit is switched off at the moment, the television is powered off, and the television finishes the 1H aging test. When the aging time reaches 2H and 3H, the system control address is 010 and 011, and the switch is switched off, namely the television finishes 2H and 3H aging tests.
It should be noted that, when the television is subjected to the burn-in test, the first switching unit is as shown in fig. 7. And the output of the switch selection unit is connected to an EN control pin corresponding to the first switch unit. When the level control signal output by the switch selection unit is 1, namely the control pin of the first switch unit is pulled high, the switch is closed, the V1 and the V2 are switched on, the television is powered on, and when the level control signal output by the switch selection unit is 0, namely the control pin of the first switch unit is low, the switch is switched off, the V1 and the V2 are not switched on, and the television is powered off.
In another embodiment of the present invention, when performing an aging test on the motherboard, the second switch unit is as shown in fig. 8, where G is a gate (gate), S is a source (source), D is a drain (drain), the switch selection unit outputs a signal connected to an EN control pin corresponding to the second switch unit, and a high-low level is added to a G terminal to control the on/off of the MOS transistor, when a level control signal output by the switch selection unit is 1, that is, the control pin of the second switch unit is pulled high, the switch is closed, V1 and V2 are turned on, the motherboard is powered on, and when a level control signal output by the switch selection unit is 0, that is, the control pin of the second switch unit is low, the switch is turned off, and V1 and V2 are not turned on, the motherboard is powered off.
For step 20, as shown in fig. 10, it can be implemented by steps 21 to 22, including:
step 21: determining a station address of the test station according to the position of the test station where the equipment to be tested is located;
step 22: and determining the state address of the test state according to the access position of each circuit in the equipment to be tested.
In step 21, the position of each test station has a test station address corresponding thereto, the station address of the test station is determined according to the position of the test station, and the address of the state switch unit can be determined according to the access position of the circuit to be tested in the device to be tested.
And step 22, determining a state address of the test state of the device to be tested according to the position of the test station, and controlling the corresponding state switch unit to be switched on or switched off according to the state address.
For step 30, as shown in fig. 11, the method may be implemented by steps 31 to 32, including:
step 31: selecting a corresponding station switch unit according to a mapping relation between the pre-configured station address and the station switch unit;
step 32: and selecting the corresponding state switch unit according to the mapping relation between the pre-configured state address and the state switch unit.
In step 31, each test station address has a one-to-one mapping relationship with the station switch unit, and the corresponding station switch unit is determined according to the test station address corresponding to the position of the test station.
In step 32, each test station address has a one-to-one mapping relationship with a state switch unit, the state switch unit of the test state of the device to be tested is determined according to the position of the test station, and the closing time of the circuit corresponding to the state switch unit in the device to be tested and the aging test time of different circuits in the device to be tested are determined.
In an alternative implementation, the method further comprises:
and when the power supply voltage is different from the working voltage of the equipment to be tested, converting the voltage output by the power supply into the working voltage of the equipment to be tested. When the device to be tested is assumed to be a low-voltage device such as a motherboard, the 220V alternating current provided by the power supply is converted into 12V/24V direct current through the overvoltage conversion unit 108, so as to provide power for the aging of the motherboard.
Specifically, when the working voltage of the device to be tested is lower than the output voltage of the power supply, the switch unit connected with the corresponding device to be tested is set as an MOS transistor switch.
It should be noted that the switch unit connected to the corresponding device under test is an MOS transistor switch, and a specific circuit of the MOS transistor switch is shown in fig. 8.
The method for controlling the intelligent aging of the equipment to be tested provided by the embodiment of the invention further comprises the following steps:
step 60: detecting the equipment to be detected and the working state of each circuit in the equipment to be detected;
step 70: and displaying the working state of the equipment to be tested and the working state of each circuit in the equipment to be tested.
And step 60, detecting the equipment to be tested in the aging test, and when the abnormality occurs, determining the corresponding power-on switch position of the television by the system through the address of the switch unit in the storage unit so as to determine the fault television test station.
For step 70, if the working state of the device to be tested during the aging test is normal, the testing time is displayed in the display unit, and if the working state of the device to be tested during the aging test is abnormal, the position of the test abnormality is displayed in the display unit, and meanwhile, the system gives an alarm and the alarm is sent out through the display unit, so that the tester can analyze and process the device in time.
As for step 60, as shown in fig. 13, it can be realized by steps 61 to 63, including:
step 61: sending a test signal to the equipment to be tested;
step 62: receiving a return signal fed back by the equipment to be tested according to the test signal;
and step 63: and when the test signal is consistent with the return signal, judging that the equipment to be tested works normally, otherwise, judging that the equipment to be tested works abnormally.
In step 61 and step 62, when the device to be tested with the address of 001 corresponding to the switch unit in the access switch selection unit starts to age, the switch unit is inquired about the address in the storage unit and then synchronously controls the monitoring input unit to switch on the serial port circuit with the address of 001 corresponding to the serial port circuit, and meanwhile, the command is sent to the device to be tested continuously through the serial port at regular time, and the back signal of the device to be tested according to the test signal is received.
For step 63, comparing the test signal with the return signal, and when the transmitted test signal and the return signal are consistent, determining that the device to be tested is working normally; otherwise, confirming that the equipment to be tested is abnormal in work.
Further, the test signal and the return signal are matched, for example:
(1) the sent test signal is A, and the returned signal returned according to the test signal A is also A, so that the equipment to be tested can be determined to work normally;
(2) when the return signal returned according to the test signal A is B, if the return signal B accords with a preset rule, the equipment to be tested can be determined to work normally.
In one embodiment, the feedback signal B meets a predetermined rule, such as the feedback signal B contains a predetermined keyword, and the feedback signal B contains a value within a predetermined range.
The device to be tested adopts a UART serial port detection mode, and the working state of the device to be tested during the aging test can be flexibly set through the communication between a serial port and the device to be tested, such as standing, channel switching, channel, volume increasing and decreasing and the like. In addition, each path of serial port switch address of the monitoring input unit is the same as the address of the switch unit for controlling the power-on and power-off of the equipment to be tested, namely, the switch address for controlling the power-on of the equipment to be tested and the address of the system control serial port switch are the same address in the storage unit, when the equipment to be tested is subjected to aging test, simultaneously, because the equipment to be tested is difficult to independently control aging time in the prior art, when a fault occurs in the aging process, manual on-duty inspection is needed and automatic detection and alarm cannot be carried out, the working state of the equipment to be tested can be monitored in real time through the monitoring input unit, abnormal information can be timely fed back when the equipment is abnormally aged, so that testers can timely analyze and process the equipment, and the aging test efficiency is greatly improved.
In the embodiment of the invention, the received test instruction and the test time of the equipment to be tested are converted into the level control signal of the corresponding switch unit through the micro-control processor, and the switch selection unit controls the on or off of the corresponding switch unit according to the level control signal, so that the switch unit can be always on or off at a certain moment according to the level control signal.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (13)
1. A device for realizing intelligent aging control of equipment to be tested comprises a micro control processor, a storage unit, a power supply, an input unit, a switch selection unit and a switch unit, wherein one end of the storage unit, one end of the power supply, one end of the input unit and one end of the switch selection unit are all connected with the micro control processor, the other end of the switch selection unit is connected with one end of the switch unit, and the other end of the switch unit is connected with the equipment to be tested;
the power supply is used for supplying power to the micro control processor, the storage unit, the input unit and the switch selection unit;
the storage unit is used for storing the address of the switch unit;
the input unit is used for receiving a test instruction and the test time of the equipment to be tested and inputting the test instruction and the test time to the micro control processor;
the micro-control processor is used for generating a level control signal corresponding to the switch unit according to the test instruction, the address of the switch unit and the test time, and sending the level control signal to the switch selection unit;
the switch selection unit is used for generating different high and low levels according to the level control signal and controlling the corresponding switch in the switch unit to be switched on or switched off through the high and low levels;
the switch unit is used for controlling the power-on or power-off of each circuit in the corresponding equipment to be tested according to the level signal of the switch selection unit;
the switch selection unit comprises a station switch pin and a state switch pin, the switch unit comprises a station switch unit and a state switch unit, and the switch selection unit is connected with the station switch unit through the station switch pin and is connected with the state switch unit through the state switch pin;
the station switch pin is used for controlling the station switch unit to be switched on or switched off according to the high and low levels of the station switch pin and controlling the test enable of the equipment to be tested of the station corresponding to the station switch unit;
the state switch pin is used for controlling the on/off of the state switch unit according to the high/low level of the state switch pin and controlling the on/off time of a circuit corresponding to the state switch unit in the equipment to be tested;
the station switch unit is used for controlling the test enabling of the station corresponding to the station switch unit;
the state switch unit is used for controlling the closing time of a circuit corresponding to the state switch unit in the equipment to be tested and controlling the aging test duration of different circuits in the equipment to be tested,
the station switch unit and the state switch unit are in one-to-one correspondence mapping relation.
2. The apparatus according to claim 1, further comprising:
one end of the voltage conversion unit is connected with a power supply, and the other end of the voltage conversion unit is connected with the switch unit;
and the voltage conversion unit is used for converting the voltage output by the power supply into the working voltage of the equipment to be tested when the power supply voltage is different from the working voltage of the equipment to be tested.
3. The apparatus according to claim 2, wherein when the operating voltage of the device under test is lower than the output voltage of the power supply, the switch unit connected to the corresponding device under test is a MOS transistor switch.
4. The apparatus according to claim 2, further comprising a timing unit, wherein the timing unit is connected to the micro control processor;
the micro-control processor is also used for converting the test time into the test time length of the corresponding switch unit and sending the test time length to the timing unit; when a timing end signal fed back by a timing unit is received, generating a low-level control signal corresponding to a switch unit, and sending the low-level control signal to the switch selection unit;
the timing unit is used for starting timing when the micro control processor controls the circuit in the equipment to be tested to be powered on; and when the power-on time of the equipment to be tested reaches the test duration, sending a signal for ending timing to the micro control processor.
5. The device for realizing intelligent aging control of the device under test according to any one of claims 1 to 4, further comprising a monitoring input unit, wherein one end of the monitoring input unit is connected with the micro control processor, and the other end of the monitoring input unit is connected with the device under test;
the monitoring input unit is used for detecting the equipment to be tested and the working state of each circuit in the equipment to be tested and sending the working state to the micro control processor.
6. The apparatus according to claim 5, wherein the monitor input unit is specifically configured to determine that the device under test is working normally when the test signal sent to the device under test matches a return signal fed back by the device under test according to the test signal, and otherwise determine that the device under test is working abnormally.
7. The device for realizing intelligent aging control of the equipment to be tested according to any one of claims 1 to 4, characterized by further comprising a display unit, wherein the display unit is connected with the micro control processor;
the display unit is used for displaying the result of the aging test of the equipment to be tested.
8. The method for realizing the intelligent aging control of the device under test is applied to the device for realizing the intelligent aging control of the device under test of any one of claims 1 to 7, and comprises the following steps:
receiving input equipment to be tested, and a test instruction and test time of the equipment to be tested;
determining the address of a switch unit according to the test position of the equipment to be tested and the test object in the test instruction;
selecting a corresponding switch unit according to a mapping relation between the address of the switch unit and the switch unit which is configured in advance;
determining the closing time of the corresponding switch unit in the address according to the test time;
and controlling the selected open/close state and close time of the switch unit through the level control signal to finish the aging test of the equipment to be tested.
9. The method of claim 8, wherein the step of determining the address of the switch unit according to the test location of the device under test and the test object in the test instruction comprises:
determining a station address of the test station according to the position of the test station where the equipment to be tested is located;
determining a state address of a test state according to the access position of each circuit in the equipment to be tested;
the step of selecting the corresponding switch unit according to the mapping relationship between the address of the switch unit configured in advance and the switch unit comprises the following steps:
selecting a corresponding station switch unit according to a mapping relation between the pre-configured station address and the station switch unit;
and selecting the corresponding state switch unit according to the mapping relation between the pre-configured state address and the state switch unit.
10. The method of claim 9, wherein the method further comprises:
and when the power supply voltage is different from the working voltage of the equipment to be tested, converting the voltage output by the power supply into the working voltage of the equipment to be tested.
11. The method of claim 9, wherein the method further comprises:
and when the working voltage of the equipment to be tested is lower than the output voltage of the power supply, setting the switch unit connected with the corresponding equipment to be tested as an MOS tube switch.
12. The method of claim 8, wherein the method further comprises:
detecting the equipment to be detected and the working state of each circuit in the equipment to be detected;
and displaying the working state of the equipment to be tested and the working state of each circuit in the equipment to be tested.
13. The method according to claim 12, wherein the detecting the operating states of the device under test and the circuits in the device under test comprises:
sending a test signal to the equipment to be tested;
receiving a return signal fed back by the equipment to be tested according to the test signal;
and when the test signal is consistent with the return signal, judging that the equipment to be tested works normally, otherwise, judging that the equipment to be tested works abnormally.
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| CN113075487A (en) * | 2021-03-31 | 2021-07-06 | 读书郎教育科技有限公司 | Method for controlling aging test duration in factory |
| CN113219314A (en) * | 2021-04-23 | 2021-08-06 | 深圳市时代速信科技有限公司 | Semiconductor batch test system |
| CN114325345B (en) * | 2022-01-04 | 2023-12-15 | 上海季丰电子股份有限公司 | Burn-in machine and interface board for burn-in machine |
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