CN115343347A - Programmable automatic test device and method for glucometer - Google Patents

Programmable automatic test device and method for glucometer Download PDF

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Publication number
CN115343347A
CN115343347A CN202210772380.5A CN202210772380A CN115343347A CN 115343347 A CN115343347 A CN 115343347A CN 202210772380 A CN202210772380 A CN 202210772380A CN 115343347 A CN115343347 A CN 115343347A
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blood glucose
effect transistor
test
blood
field effect
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薛建章
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Beijing Sinomedisite Bio Tech Co Ltd
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Beijing Sinomedisite Bio Tech Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416Systems
    • G01N27/4163Systems checking the operation of, or calibrating, the measuring apparatus

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Abstract

The invention discloses a programmable automatic testing device of a glucometer, which comprises a singlechip and a testing circuit, wherein the testing circuit is respectively connected with the singlechip and the glucometer through an IO interface, the control pin of the singlechip comprises a power-on interruption control pin, a full blood threshold detection control pin and a blood sugar measurement control pin, the testing circuit comprises a power-on simulation unit, a blood sampling simulation unit and a blood sugar measurement simulation unit, the power-on simulation unit, the blood sampling simulation unit and the blood sugar measurement simulation unit are respectively connected with the control pins corresponding to the singlechip and are used for controlling a field effect tube to be conducted according to a control signal output by the singlechip so as to conduct a trigger pin in the glucometer and a ground wire pin, and the test of the glucometer is completed. According to the scheme, the field effect tube in the test circuit is controlled to be selectively conducted through the singlechip programming, the power consumption of the device is low, integration is facilitated, and the efficiency of automatic test of a large batch of glucometers can be improved.

Description

Programmable automatic test device and method for glucometer
Technical Field
The invention relates to the technical field of medical instruments, in particular to a programmable automatic test device and method of a blood glucose meter.
Background
The glucometer needs to be tested for accuracy and fatigue before leaving the factory. Because the blood glucose meter generally expresses the concentration information of blood glucose through the current in the electrochemical reaction process, in order to improve the accuracy of current measurement, an operational amplifier circuit and software in the blood glucose meter are tested through a resistor, and the accuracy of the blood glucose meter can be fully expressed. Meanwhile, since the glucometers are produced in batches when leaving factories, the glucometers need to be copied for a long time and tested for multiple times of accuracy after production, so that the reliability and the accuracy of the glucometers can be verified. At present, most of glucometers need manual large-batch and long-time manual test and calibration before leaving factories, and the mode is high in cost, time-consuming and labor-consuming; and in addition, some test tools for blood glucose meters have complex test circuit structures and inflexible control modes.
Therefore, a programmable automatic testing device for automatically performing large-batch and long-time copying testing on a blood glucose meter is needed to solve the problems of long time consumption, low efficiency, insufficient control and the like when the blood glucose meter is shipped and tested and is accurately tested.
Disclosure of Invention
In view of the above, the present invention has been developed to provide a programmable automatic test device and method for a blood glucose meter that overcomes, or at least partially solves, the above-mentioned problems.
According to one aspect of the invention, the programmable automatic test device of the blood glucose meter comprises a single chip microcomputer and a test circuit, wherein the test circuit is respectively connected with the single chip microcomputer and the blood glucose meter through an IO interface, the test circuit comprises a starting simulation unit, a full blood collection simulation unit and a blood glucose value measurement simulation unit, and the test circuit is respectively connected with a starting interruption pin, a full blood threshold pin and a blood glucose value measurement pin of the single chip microcomputer. The test circuit is used for controlling the conduction of the field effect transistor according to a high-level control signal output by the IO interface of the singlechip, so that the internal circuit of the blood glucose meter is connected through the field effect transistor and/or a preset resistor, and the start-up of the blood glucose meter, the judgment of a full blood threshold value and the measurement of a blood glucose value are completed in a simulated mode.
The device controls the conduction of the field effect tube in each unit of the test circuit through the singlechip programming, so that the internal circuit of the glucometer is conducted through the field effect tube, and the internal circuit of the glucometer simulates and finishes the start of a cutting, blood dripping, threshold detection and blood sugar value detection of the glucometer by detecting the resistance value of a preset resistor. And the field effect transistor is used as a switching device, so that the integration of the device is facilitated, and the power consumption of the testing device can be reduced, so that the requirement of long-time testing is met.
Optionally, in the above apparatus, the start-up simulation unit includes a first field-effect transistor, a drain of the first field-effect transistor is connected to a start-up interruption trigger pin of the blood glucose meter, a source of the first field-effect transistor is grounded, a gate of the first field-effect transistor is connected to the start-up interruption pin of the single-chip microcomputer through a first resistor, the single-chip microcomputer sends a high level to the gate of the first field-effect transistor through the start-up interruption pin to control the first field-effect transistor to be turned on, so that an internal circuit of the blood glucose meter monitors the low level, and the start-up of the blood glucose meter is completed
Optionally, the full blood collection simulation unit includes a second field effect transistor, a drain of the second field effect transistor is connected to a full blood threshold triggering pin of the blood glucose meter through a second resistor, a source of the second field effect transistor is grounded, a gate of the second field effect transistor is connected to a full blood threshold pin of the single chip microcomputer through a third resistor, the single chip microcomputer can send a high level to the gate of the second field effect transistor through the full blood threshold triggering pin, and control the second field effect transistor to be turned on, so that an internal circuit of the blood glucose meter detects a first predetermined resistance threshold, and the blood glucose meter detects that blood volume collection is qualified.
Optionally, the blood glucose measurement simulation unit includes a third field effect transistor, a drain of the third field effect transistor is connected to a blood glucose measurement trigger pin of the blood glucose meter through a fourth resistor, a source of the third field effect transistor is grounded, a gate of the third field effect transistor is connected to a blood glucose measurement pin of the single chip microcomputer through a fifth resistor, the blood glucose measurement pin of the single chip microcomputer sends a high level to the gate of the third field effect transistor to control the third field effect transistor to be turned on, so that the internal circuit of the blood glucose meter detects a second predetermined resistance threshold value to complete blood glucose measurement.
Optionally, a sixth resistor is connected in series between the gate and the source of the first field effect transistor, a seventh resistor is connected in series between the gate and the source of the second field effect transistor, and an eighth resistor is connected in series between the gate and the source of the third field effect transistor.
Optionally, the device may further include a display, a key, and a speaker. The display can show the blood glucose meter according to the counter value of singlechip triggers or test the number of times, and the button can select the test mode of blood glucose meter, and the speaker can send out the sound suggestion according to the control signal of singlechip.
Optionally, the device further comprises a power module and a voltage stabilizing module, wherein the power module can supply power for the single chip microcomputer, the display, the keys and the loudspeaker, and the voltage stabilizing module is a low dropout linear regulator and is suitable for stabilizing the power voltage within a set value range.
Above-mentioned device can realize blood glucose meter automatic cycle switching on and shutting down, three-pin blood glucose meter measurement or copy machine (do not contain full blood threshold value and detect), four-pin blood glucose meter measurement or copy machine (contain full blood threshold value and detect), can select the default resistance value in the test circuit through programming to the singlechip, can test different blood sugar values in a flexible way, has improved the automation of device test.
According to another aspect of the invention, a programmable automatic test method of a blood glucose meter is provided, in the method, firstly, the waiting time and the required resistance value required in the test process of the blood glucose meter can be determined according to the model and the test mode of the blood glucose meter, so that a single chip microcomputer generates a corresponding control signal. Then, the control signal is output to a corresponding trigger pin of the test circuit through an IO interface of the single chip microcomputer, and the internal circuit of the blood glucose meter is conducted through a field effect tube and/or a preset resistor by controlling the conduction of the field effect tube in any one of the starting simulation unit, the full blood collection simulation unit and the blood glucose value measurement simulation unit, so that the starting of the blood glucose meter, the judgment of a full blood threshold value and the measurement of the blood glucose value are completed in a simulated mode.
Optionally, in the above method, the blood glucose test value may be compared with a preset value to obtain a blood glucose meter accuracy test result.
Optionally, the number of glucose meter tests is accumulated and displayed on a display; and judging whether the current test frequency reaches the preset test frequency or not, and controlling the loudspeaker to send a sound prompt for completing the test when the preset test frequency is reached.
According to the scheme of the invention, the conduction of the field effect tube in the test circuit is controlled by the singlechip programming, so that the internal circuit of the glucometer is conducted through the field effect tube, and the internal circuit of the glucometer simulates and finishes the startup of a cutting, blood dripping, threshold detection and blood sugar value detection of the glucometer by detecting the resistance value of a preset resistor in the test circuit. And the field effect transistor is used as a switching device, so that the integration of the device is facilitated, and the power consumption of the testing device can be reduced, so that the requirement of long-time testing is met. The device can realize that blood glucose meter automatic cycle switching on and shutting down, three-pin blood glucose meter measure or copy machine (do not contain full blood threshold value and detect), four-pin blood glucose meter measure or copy machine (contain full blood threshold value and detect), can select the predetermined resistance value in the test circuit through programming to the singlechip, can test different blood glucose value in a flexible way, has improved the automation of device test, has improved the efficiency of big blood glucose meter test in batches.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 shows a schematic diagram of a programmable automatic measurement device 100 of a blood glucose meter, according to one embodiment of the present invention;
FIG. 2 shows a schematic diagram of a programmable automatic measurement device 100 of a blood glucose meter, according to an embodiment of the present invention;
FIG. 3 shows a schematic diagram of a test circuit configuration according to an embodiment of the invention;
FIG. 4 is a schematic diagram showing the structure of a blood glucose level measuring unit according to an embodiment of the present invention;
FIG. 5 illustrates a flow diagram of a method 500 for programmable automatic testing of a blood glucose meter, according to one embodiment of the present invention;
FIG. 6 shows a flow diagram for testing a blood glucose meter based on a programmable automatic test device, according to one embodiment of the invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The glucometer generally adopts an electrochemical method, glucose in blood reacts with a chemical substrate on a test strip to generate current, and then the detected current intensity is converted into the content of the blood glucose. Before the glucometer leaves a factory, the glucometer needs to be tested for accuracy and repeatability, so that the function and performance of the glucometer can meet the requirements. The accuracy of the blood glucose meter can be better represented by verifying through the resistance simulation test strip. Therefore, different resistance values need to be measured through the analog switch and the blood glucose test to complete the test calibration of the blood glucose meter. According to the scheme, the field effect tube is controlled to be conducted through the single chip microcomputer, so that the internal test circuit of the blood glucose meter detects startup interruption and different resistance values, and automatic test of the blood glucose meter is completed.
FIG. 1 shows a schematic diagram of a programmable automatic test device 100 of a blood glucose meter, according to an embodiment of the present invention. As shown in fig. 1, the device may include a single chip microcomputer (programmable control unit), a plurality of test circuits 1-n connected with the single chip microcomputer through a bus, each test circuit may be packaged in a modular manner, each test circuit is provided with a socket, and the bus of the blood glucose meter may be connected to the test circuit through the socket. The flat cable connected with the single chip microcomputer and the test circuit comprises 4 control lines which are a GND ground wire, a power-on interruption control line, a full blood threshold control line and a blood sugar value measurement control line. The single chip microcomputer sends high-level signals to different control lines to control the switch device in the test circuit to be switched on, so that the internal test circuit of the glucometer forms a path with different resistance values through the switch device, and the whole test process is completed by detecting the corresponding resistance values. As shown in fig. 1, the apparatus 100 further includes a power module, a voltage regulator module, a key, a segment code display module, and a speaker. The power module is a rechargeable battery and can provide stable voltage for the whole device. The voltage stabilizing module can be an LDO (low dropout regulator), and in a system taking a battery as a power supply, the LDO with the lowest voltage difference as possible is selected, so that the battery can supply power for the system for a longer time. The keys can select a test mode of the blood glucose meter, such as a starting trigger mode, a three-needle blood glucose meter test or copy mode, a four-needle blood glucose meter test or copy mode and the like. The segment code display module can display the test times of the blood glucose meter in real time, and the loudspeaker can send out sound prompt information according to the control signal of the single chip microcomputer after the blood glucose meter completes a preset test program.
It should be noted that the preset resistance values in the test circuits shown in fig. 1 may be set to different sizes, so that in an automatic test process, test circuits with different resistance values may be selected through programming of a single chip microcomputer, so as to satisfy batch testing of blood glucose meters.
The device accessible singlechip is to the blood glucose meter of different models, the automatic test of a plurality of blood glucose meters of different test modes realization through programming, can modularize test circuit simultaneously, and the test circuit trouble appears in the test procedure can directly carry out the modularization replacement to test circuit, does not influence whole test procedure.
FIG. 2 shows a schematic diagram of a programmable automatic test device 100 of a blood glucose meter, according to an embodiment of the present invention. As shown in fig. 2, the apparatus includes a single chip microcomputer 110 and a test circuit 120. The test circuit 120 is connected to the single chip microcomputer 110 and the blood glucose meter through IO interfaces respectively. The IO interface comprises a power-on interrupt control pin, a full blood threshold control pin, a blood sugar measurement control pin and a grounding pin. The test circuit comprises a startup analog unit 121, a full blood collection analog unit 122 and a blood sugar value measurement analog unit 123 which are respectively connected with a startup interruption control pin, a full blood threshold control pin and a blood sugar value measurement control pin of the single chip microcomputer, and the test circuit 120 can control the conduction of field effect tubes in the analog units according to control signals output by the single chip microcomputer 110, so that the internal circuit of the blood glucose meter is conducted through the field effect tubes and/or preset resistors to simulate the completion of startup of the blood glucose meter, the judgment of the full blood threshold and the measurement of the blood sugar value.
FIG. 3 shows a schematic diagram of a test circuit according to an embodiment of the invention. As shown in fig. 3, a GND of the testing apparatus is connected to a blood glucose meter GND, a power-on interruption trigger pin of the blood glucose meter is connected to a power-on interruption trigger pin of the testing circuit through an IO interface, a power-on simulation unit 121 in the testing circuit 120 includes a first field-effect transistor Q1, a drain of the first field-effect transistor Q1 is connected to the power-on interruption trigger pin of the blood glucose meter, a source of the first field-effect transistor Q1 is Grounded (GND), a gate of the first field-effect transistor Q1 is connected to a power-on interruption control pin of the single chip microcomputer through a first resistor R1, and the power-on interruption control pin of the single chip microcomputer controls conduction between the drain and the source of the first field-effect transistor Q1 by sending a high level to the gate of the first field-effect transistor Q1. At the moment, the start-up interruption triggering pin of the blood glucose meter monitors the low level, and the start-up interruption is triggered by the blood glucose meter to complete the start-up of the blood glucose meter.
As shown in fig. 3, the full blood threshold triggering pin of the blood glucose meter is connected to the full blood threshold triggering pin of the test circuit through an interface, the full blood collection simulation unit 122 includes a second field effect transistor Q2, a drain of the second field effect transistor Q2 is connected to the full blood threshold detection triggering pin of the blood glucose meter through a second resistor R5, a source of the second field effect transistor Q2 is grounded, a gate of the second field effect transistor Q2 is connected to a full blood threshold control pin of the single chip microcomputer through a third resistor R3, and the full blood threshold control pin of the single chip microcomputer controls conduction between the drain and the source of the second field effect transistor Q2 by sending a high level to the gate of the second field effect transistor Q2. The full blood threshold triggering pin of the blood glucose meter is connected with the ground wire through the second resistor R5, and the internal circuit of the blood glucose meter detects that the second resistor R5 meets the first preset resistor threshold, so that the blood glucose meter is qualified in collecting the simulated full blood. The resistance of the second resistor R5 may be adjusted according to different signals of the blood glucose meter.
As shown in fig. 3, the blood glucose measurement trigger pin of the blood glucose meter is connected to the blood glucose measurement trigger pin of the test circuit through an interface, the blood glucose measurement simulation unit 123 includes a third field effect transistor Q3, the drain of the third field effect transistor Q3 is connected to the blood glucose measurement trigger pin of the blood glucose meter through a fourth resistor R8, the source of the third field effect transistor Q3 is grounded, the gate of the third field effect transistor Q3 is connected to the blood glucose measurement control pin of the single chip microcomputer through a fifth resistor R6, the blood glucose measurement control pin of the single chip microcomputer controls conduction between the drain and the source of the third field effect transistor Q3 by sending a high level to the gate of the third field effect transistor Q3, the blood glucose measurement trigger pin of the blood glucose meter is conducted to the ground through the fourth resistor R8, and the blood glucose meter internal circuit detects that the resistance value of the fourth resistor R8 meets a second predetermined resistance threshold value, thereby completing the simulated blood glucose measurement of the blood glucose meter. The resistance value of the fourth resistor R8 can be adjusted according to different signals of the blood glucose meter, and the fourth resistor R8 can be decomposed into a plurality of resistors with different resistance values according to test requirements, so that the test circuit can be selected conveniently.
Fig. 4 is a schematic diagram showing the structure of a blood glucose level measuring unit according to an embodiment of the present invention. As shown in fig. 4, the drain of the third fet Q3 is connected in series with a plurality of resistors R8, R9, R10, R11, and R12, the number of the resistors connected in series in the figure is merely exemplary, and the blood glucose measurement trigger pin may be connected to a plurality of different types of blood glucose meters to detect different series resistance values correspondingly, thereby realizing simultaneous testing of different types of blood glucose meters.
It should be noted that the field effect transistor (MOSFET) used in the present solution may be a field effect transistor or a PMOS, and may be adjusted according to actual needs, and when the field effect transistor is selected, the drain-source turn-on resistance value should not be greater than 50 milliohms; the grid source electrode starting voltage is smaller than the single chip microcomputer level voltage; the withstand voltage value of the drain-source voltage is larger than the level voltage of the single chip microcomputer, and the like, so that the effectiveness and the sensitivity of the control of the single chip microcomputer are improved.
As shown in fig. 3, a sixth resistor R2 is further connected in series between the gate and the source of the first fet Q1, a seventh resistor R4 is connected in series between the gate and the source of the second fet Q2, and an eighth resistor R6 is connected in series between the gate and the source of the third fet Q3. Because the grid of the field effect transistor has high input impedance, static electricity or interference can cause the misconduction risk of the field effect transistor, and therefore, a resistor can be connected in parallel between the grid and the source of the field effect transistor to reduce the input impedance and enhance the stability of circuit design. In addition, the second resistor R5 and the fourth resistor R8 may be high-precision resistors, that is, resistors with small resistance tolerance and stable resistance, so as to improve the accuracy and stability of detection.
The device can realize the operation of circular startup and copy through the programming of the single chip microcomputer. For example, when a copying test is required to be performed on the blood glucose meter, the single chip microcomputer can firstly simulate the start of a cutting strip of a blood glucose meter test strip, and perform high-level triggering on a field effect transistor connected with a start interruption control pin, so that the field effect transistor is in an open state, and an interruption trigger pin of the blood glucose meter is conducted through a drain and a source of the field effect transistor, so that the start interruption pin of the blood glucose meter performs low-level triggering, and the blood glucose meter is started. After the start-up interruption of the blood glucose meter is triggered, the blood glucose meter can be subjected to delay waiting (waiting for the completion of the start-up of the blood glucose meter). The full blood threshold value trigger pin is used for detecting whether the blood glucose test strip sucks full blood during blood sampling. The single chip microcomputer can simulate the full blood resistance value of the test strip after artificial blood dripping of the test strip, the field effect tube connected with the full blood threshold control pin is subjected to high level triggering, the field effect tube is in an open state, and the full blood threshold triggering pin of the blood glucose meter is conducted through the high-precision resistor R5, the drain stage of the field effect tube and the source electrode, so that the testing device simulates a resistance signal of the test strip after full blood, and the blood glucose meter detects a signal that the full blood threshold is qualified. After the full blood threshold signal of the blood glucose meter is qualified, the blood glucose meter can be subjected to certain delay waiting. Then, the single chip microcomputer can simulate the resistance value of the test strip after artificial blood dripping, the field effect transistor of the blood glucose measuring control pin is triggered at a high level, the field effect transistor is in an open state, the blood glucose measuring trigger pin of the blood glucose meter is conducted through the high-precision resistor R8, the drain stage of the field effect transistor and the source electrode, and therefore the testing device simulates the resistance signal of the blood glucose after blood sampling of the test strip. At the moment, the device keeps a waiting state, the glucometer detects the resistance value of the testing pin until the time of delaying the detection of the glucometer is over, the glucometer detects the resistance value of the conduction resistor R8 of the testing device, a blood sugar result is obtained through calculation, and the device simulates a test strip testing process to complete. And finally, the power-on interrupt control pin, the full blood threshold control pin and the blood sugar value measurement control pin are restored to the low level state.
When the blood glucose meter needs to be copied and circularly started, the single chip microcomputer can simulate the insertion starting of a blood glucose meter test strip, the field effect transistor of the starting interruption control pin is subjected to high-level triggering, the field effect transistor is in an open state, the blood glucose meter starting interruption triggering pin is conducted between the drain and the source, the blood glucose meter starting interruption triggering pin is subjected to low-level triggering, and therefore the blood glucose meter is started. The test device waits for the completion of the start-up of the blood glucose meter and the completion of the automatic shutdown of the blood glucose meter through time delay. After the start-up time and the automatic shutdown time of the blood glucose meter are finished, the start-up interruption trigger control pin is restored to the low level state.
FIG. 5 shows a flow diagram of a method 500 for programmable automatic testing of a blood glucose meter, according to one embodiment of the present invention. As shown in fig. 5, the method 500 begins with step S510, and determines the waiting time and the required resistance value required in the testing process of the blood glucose meter according to the model and the testing mode of the blood glucose meter, so that the single chip microcomputer generates a corresponding control signal. The single chip microcomputer can be used for programming different types of glucometers, different test modes and different test requirements, simulating manual operation sequences of pins of different glucometers, and generating corresponding time sequence signals and control signals so as to complete the test of the circulating startup and the measurement accuracy of the glucometers.
And step S520 is executed, the control signal is output to a corresponding trigger pin of the test circuit through an IO interface of the single chip, and the internal circuit of the blood glucose meter is conducted through a field effect tube and/or a preset resistor by controlling the conduction of the field effect tubes in the starting simulation unit, the full blood collection simulation unit and the blood glucose value measurement simulation unit, so that the starting of the blood glucose meter, the judgment of a full blood threshold value and the measurement of the blood glucose value are completed in a simulated mode.
Specifically, the single chip microcomputer can send out a high level through the startup interrupt pin to control the conduction of the field effect transistor in the startup analog unit, so that the internal circuit of the blood glucose meter is conducted between the startup interrupt trigger pin and the ground wire pin of the blood glucose meter to detect the low level trigger interrupt, and the startup of the blood glucose meter is completed. The singlechip can send out high level through the full blood threshold value pin, control the field effect transistor in the full blood collection simulation unit to switch on, make full blood threshold value trigger pin of blood glucose meter switch on through preset resistance and ground wire to make blood glucose meter internal circuit detect corresponding resistance value, it is qualified to detect the full blood threshold value. The singlechip can send out high level through blood sugar value measurement pin, and the field effect transistor in the control blood sugar value measurement analog unit switches on, makes the blood sugar value measurement of blood glucose meter trigger pin switch on through default resistance and ground wire to make blood glucose meter internal circuit detect corresponding resistance value, accomplish blood sugar value and measure.
In one embodiment of the present invention, the blood glucose test value may be compared with a predetermined value in the method 500 to obtain a blood glucose meter accuracy test result. In order to perform a fatigue test on the glucose meter, the number of cycle tests may be set and accumulated and displayed on the segment code display. And judging whether the current test times reach the preset test times or not, and controlling the loudspeaker to send a sound prompt for completing the test when the preset test times are reached.
FIG. 6 shows a flow diagram for testing a blood glucose meter based on a programmable automatic test device, according to one embodiment of the invention. As shown in fig. 6, different test modes may be selected by pressing a button, for example, a power-on trigger mode, a three-pin glucose meter test mode (not including full blood threshold test), and a four-pin glucose meter test mode (including full blood threshold test) may be selected by pressing a button.
In the startup triggering mode, the control flow of the single chip microcomputer is as follows:
1. the power-on interrupt PIN PIN is set high through the singlechip, the field effect tube connected with the power-on interrupt wire is conducted, and the power-on interrupt PIN of the blood glucose meter is triggered, so that the blood glucose meter is controlled to be powered on.
2. Waiting for the start of the blood glucose meter in a delayed manner until the blood glucose meter is started (waiting time can be set according to test requirements, starting is kept when the waiting time is less than a preset threshold value, and the blood glucose meter is shut down when the waiting time exceeds the preset threshold value)
3. And controlling the power-on interruption PIN PIN to be set low through the MCU, so that the device is restored to the initial state, one trigger operation is completed, and the power-on trigger frequency of the MCU is +1.
4. And controlling the display to display the startup triggering times +1 through the MCU.
5. Judging the preset triggering times, and judging whether the preset triggering times are reached: if the preset triggering times are not reached, jumping to the first step to execute; and if the preset triggering times are reached, carrying out the next operation.
6. And (5) using the MCU to control the loudspeaker to prompt, and prompting that the test is finished.
In the test/copy mode of the three-wire blood glucose meter, the test device firstly controls the three-wire threshold detection pin of the blood glucose meter to be in a forbidden state through the MCU, so that the blood glucose meter is in the three-wire measurement value test/copy mode. The test flow is as follows:
1. the MCU is used for enabling the PIN PIN for controlling the startup interrupt to be set high, and the field effect tube connected with the startup interrupt line is conducted, so that the startup interrupt PIN of the blood glucose meter is triggered, and the blood glucose meter is controlled to be started.
2. Carry out delay waiting on the glucometer, wait for the glucometer to finish the startup (can realize the self-defined adjustment of the waiting time according to the reaction time and the waiting time of different glucometers)
3. Different resistance values needing to be connected are selected through the MCU, so that the corresponding PIN of the blood glucose measuring value is set high, the field effect transistor of the blood glucose measuring value is conducted (the field effect transistor is connected with the corresponding resistor in series), the resistance value of the measuring value simulates a test strip during testing is matched with an internal detection circuit of the glucometer, and the standard value of the glucometer is tested.
4. Waiting for the glucometer in a delayed manner, waiting for the glucometer to finish the test waiting time and the calculation process (the waiting time can be adjusted by self-definition according to the response time and the waiting time of different glucometers)
5. After the blood glucose meter is tested, the power-on interrupt trigger PIN is set to be low, so that the power-on interrupt trigger field effect transistor is closed. The blood sugar value measurement value PIN is set low, and the blood sugar value measurement field effect tube is closed. Thereby restoring the test control line of the test device circuit to the initial state. MCU completes the test number of times +1
6. And controlling the display to display the triggering times +1 through the MCU.
7. Judging the preset triggering times, and judging whether the preset triggering times are reached: if the preset triggering times are not reached, jumping to the first step to execute; and if the preset triggering times are reached, carrying out the next operation.
8. And controlling the loudspeaker to emit prompt sound through the MCU to prompt the completion of the test.
In the blood glucose meter measuring value detection/copying mode, firstly, the four-needle blood glucose meter threshold value detection pin is controlled to be in an enabled state through the MCU, so that the blood glucose meter is in the four-needle measuring value detection/copying mode. The test flow is as follows:
1. the MCU is used for enabling the PIN PIN for controlling the startup interrupt to be set high, and the field effect tube connected with the startup interrupt line is conducted, so that the startup interrupt PIN of the blood glucose meter is triggered, and the blood glucose meter is controlled to be started.
2. Carry out delay waiting on the glucometer, wait for the glucometer to finish the startup (can realize the self-defined adjustment of the waiting time according to the reaction time and the waiting time of different glucometers)
3. The PIN of the full blood threshold detection PIN is set high through the MCU, the field effect tube connected with the PIN of the full blood threshold is conducted (the field effect tube is connected with the fixed resistor in series), the full blood state of the device after the blood dropping of the test strip is simulated, and the device is matched with an internal detection circuit of a glucometer, so that the value of the threshold detected by the glucometer is qualified, and the next operation is allowed.
4. Different resistance values needing to be connected are selected through the MCU, so that the corresponding PIN of the blood glucose measuring value is set high, the field effect transistor of the blood glucose measuring value is conducted (the field effect transistor is connected with the corresponding resistor in series), the resistance value of the measuring value simulates a test strip during testing is matched with an internal detection circuit of the glucometer, and the standard value of the glucometer is tested.
5. The glucometer waits for a delay time, waits for the glucometer to finish the test waiting time and the calculation process (the self-defined adjustment of the waiting time can be realized according to the reaction time and the waiting time of different glucometers)
6. After the blood glucose meter is tested, the power-on interrupt trigger PIN is set to be low, so that the power-on interrupt trigger field effect transistor is closed. The blood sugar value measurement value PIN is set low, and the blood sugar value measurement field effect tube is closed. Thereby restoring the test control line of the test device circuit to the initial state. The MCU completes the trigger times +1.
7. And controlling the display to display the triggering times +1 through the MCU.
8. Judging the preset triggering times, and judging whether the preset triggering times are reached: if the preset triggering times are not reached, jumping to the first step for execution; and if the preset triggering times are reached, carrying out the next operation.
9. And the MCU controls the loudspeaker to emit prompt sound to prompt the completion of the test.
By the scheme, the conduction of the field effect tube in the test circuit is controlled by the singlechip programming, so that the internal circuit of the glucometer is conducted through the field effect tube, and the internal circuit of the glucometer simulates and finishes the start of a cutting, blood dripping, threshold detection and blood sugar value detection of the glucometer by detecting the resistance value of the preset resistor in the test circuit. And the field effect transistor is used as a switching device, so that the integration of the device is facilitated, and the power consumption of the testing device can be reduced, so that the requirement of long-time testing is met. The device can realize blood glucose meter automatic cycle switching on and shutting down, three-pin blood glucose meter measurement or copy machine (do not contain full blood threshold value and detect), four-pin blood glucose meter measurement or copy machine (contain full blood threshold value and detect), can select the predetermined resistance value in the test circuit through programming the singlechip, can test different blood sugar values in a flexible way, has improved the automation of device test, has improved the efficiency of big blood glucose meter test in batches.
In the description provided herein, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be construed to reflect the intent: that the invention as claimed requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
Those skilled in the art will appreciate that the modules or units or components of the devices in the examples disclosed herein may be arranged in a device as described in this embodiment or alternatively may be located in one or more devices different from the devices in this example. The modules in the foregoing examples may be combined into one module or may be further divided into multiple sub-modules.
Those skilled in the art will appreciate that the modules in the device in an embodiment may be adaptively changed and disposed in one or more devices different from the embodiment. The modules or units or components in the embodiments may be combined into one module or unit or component, and furthermore, may be divided into a plurality of sub-modules or sub-units or sub-components. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where at least some of such features and/or processes or elements are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Moreover, those of skill in the art will appreciate that while some embodiments herein include some features included in other embodiments, not others, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the following claims, any of the claimed embodiments may be used in any combination.
Furthermore, some of the described embodiments are described herein as a method or combination of method elements that can be performed by a processor of a computer system or by other means of performing the described functions. A processor having the necessary instructions for carrying out the method or method elements thus forms a means for carrying out the method or method elements. Further, the elements of the apparatus embodiments described herein are examples of the following apparatus: the apparatus is used to implement the functions performed by the elements for the purpose of carrying out the invention.
As used herein, unless otherwise specified the use of the ordinal adjectives "first", "second", "third", etc., to describe a common object, merely indicate that different instances of like objects are being referred to, and are not intended to imply that the objects so described must be in a given sequence, either temporally, spatially, in ranking, or in any other manner.
While the invention has been described with respect to a limited number of embodiments, those skilled in the art, having benefit of this description, will appreciate that other embodiments can be devised which do not depart from the scope of the invention as described herein. Furthermore, it should be noted that the language used in the specification has been principally selected for readability and instructional purposes, and may not have been selected to delineate or circumscribe the inventive subject matter. Accordingly, many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the appended claims. The present invention has been disclosed in an illustrative rather than a restrictive sense with respect to the scope of the invention, as defined in the appended claims.

Claims (10)

1. A programmable automatic testing device of a glucometer comprises a singlechip and a testing circuit, wherein the testing circuit is respectively connected with the singlechip and the glucometer through an IO interface,
the test circuit comprises a startup simulation unit, a full blood collection simulation unit and a blood sugar value measurement simulation unit which are respectively connected with a startup interruption pin, a full blood threshold value pin and a blood sugar value measurement pin of the single chip microcomputer, and is used for controlling the conduction of the field effect transistor according to a high-level control signal output by an IO interface of the single chip microcomputer so that an internal circuit of the blood glucose meter is conducted through the field effect transistor and/or a preset resistor to simulate the completion of startup of the blood glucose meter, judgment of the full blood threshold value and blood sugar value measurement.
2. The device of claim 1, wherein the start-up simulation unit comprises a first field-effect transistor, a drain of the first field-effect transistor is connected with a start-up interruption trigger pin of the blood glucose meter, a source of the first field-effect transistor is grounded, a gate of the first field-effect transistor is connected with the start-up interruption pin of the single chip microcomputer through a first resistor, and the single chip microcomputer is adapted to send a high level to the gate of the first field-effect transistor through the start-up interruption pin, control the first field-effect transistor to be turned on, and enable an internal circuit of the blood glucose meter to monitor the low level so as to complete start-up of the blood glucose meter.
3. The device of claim 2, wherein the full blood collection simulation unit comprises a second field effect transistor, a drain of the second field effect transistor is connected with a full blood threshold triggering pin of the blood glucose meter through a second resistor, a source of the second field effect transistor is grounded, a gate of the second field effect transistor is connected with a full blood threshold pin of the single chip microcomputer through a third resistor, and the single chip microcomputer is suitable for sending a high level to the gate of the second field effect transistor through the full blood threshold pin and controlling the second field effect transistor to be conducted so that an internal circuit of the blood glucose meter detects a first preset resistor threshold and the blood glucose meter detects a qualified blood volume collection.
4. The device of claim 3, wherein the blood glucose measurement simulation unit comprises a third field effect transistor, a drain of the third field effect transistor is connected to a blood glucose measurement trigger pin of the blood glucose meter through a fourth resistor and a fifth resistor, a source of the third field effect transistor is grounded, a gate of the third field effect transistor is connected to a blood glucose measurement pin of the single chip microcomputer through a sixth resistor, and the blood glucose measurement pin of the single chip microcomputer controls the third field effect transistor to be turned on by sending a high level to the gate of the third field effect transistor, so that the internal circuit of the blood glucose meter detects a second predetermined resistance threshold value to complete blood glucose measurement.
5. The apparatus of claim 4, wherein a seventh resistor is connected in series between the gate and the source of the first FET, an eighth resistor is connected in series between the gate and the source of the second FET, and a ninth resistor is connected in series between the gate and the source of the third FET.
6. The device of claim 1, wherein the device comprises a display, a button and a speaker, the display is used for displaying the triggering or testing times of the glucometer according to the counter value of the single chip microcomputer, the button is suitable for selecting the testing mode, and the speaker is suitable for emitting a sound prompt according to the control signal of the single chip microcomputer.
7. The device of claim 6, further comprising a power module and a voltage regulation module, wherein the power module is adapted to supply power to the single chip, the display, the button and the speaker, and the voltage regulation module is a low dropout regulator for stabilizing the power voltage within a set value range.
8. A programmable automatic test method for a blood glucose meter, the method comprising:
determining the waiting time and the required resistance value required in the test process of the glucometer according to the model and the test mode of the glucometer, and enabling the singlechip to generate a corresponding control signal;
and outputting the control signal to a corresponding pin of the test circuit through an IO interface of the singlechip, and controlling the conduction of a field effect tube in the test circuit to enable an internal circuit of the glucometer to be conducted through the field effect tube and/or a preset resistor, thereby simulating and completing the startup of the glucometer, the judgment of a full blood threshold value and the measurement of a blood sugar value.
9. The method of claim 8, further comprising:
and comparing the blood sugar test value with a preset value to obtain a blood sugar meter accuracy test result.
10. The method of claim 8, wherein the method comprises:
accumulating the test times of the glucometer and displaying the test times on a display;
and judging whether the current test frequency reaches the preset test frequency or not, and controlling the loudspeaker to send a sound prompt for completing the test when the preset test frequency is reached.
CN202210772380.5A 2022-07-02 2022-07-02 Programmable automatic test device and method for glucometer Pending CN115343347A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117031180A (en) * 2023-10-08 2023-11-10 北京华益精点生物技术有限公司 Blood glucose meter detection method and system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117031180A (en) * 2023-10-08 2023-11-10 北京华益精点生物技术有限公司 Blood glucose meter detection method and system
CN117031180B (en) * 2023-10-08 2023-12-05 北京华益精点生物技术有限公司 Blood glucose meter detection method and system

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