CN101047110A - 基板处理装置以及基板处理方法 - Google Patents
基板处理装置以及基板处理方法 Download PDFInfo
- Publication number
- CN101047110A CN101047110A CNA2007100878482A CN200710087848A CN101047110A CN 101047110 A CN101047110 A CN 101047110A CN A2007100878482 A CNA2007100878482 A CN A2007100878482A CN 200710087848 A CN200710087848 A CN 200710087848A CN 101047110 A CN101047110 A CN 101047110A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- substrate surface
- liquid
- fluid
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 364
- 238000012545 processing Methods 0.000 title claims description 41
- 238000003672 processing method Methods 0.000 title claims description 7
- 239000007788 liquid Substances 0.000 claims abstract description 204
- 239000002904 solvent Substances 0.000 claims abstract description 128
- 238000011144 upstream manufacturing Methods 0.000 claims abstract description 122
- 239000012530 fluid Substances 0.000 claims description 99
- 238000011010 flushing procedure Methods 0.000 claims description 70
- 238000001035 drying Methods 0.000 claims description 68
- 239000000203 mixture Substances 0.000 claims description 26
- 239000007921 spray Substances 0.000 claims description 4
- 238000002955 isolation Methods 0.000 claims 4
- 230000007613 environmental effect Effects 0.000 claims 1
- 239000010453 quartz Substances 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 5
- 230000008569 process Effects 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 98
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 72
- 230000009471 action Effects 0.000 description 33
- 241001252483 Kalimeris Species 0.000 description 28
- 230000000694 effects Effects 0.000 description 28
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 27
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 20
- 230000007246 mechanism Effects 0.000 description 16
- 229910052757 nitrogen Inorganic materials 0.000 description 10
- 239000007787 solid Substances 0.000 description 10
- 235000014347 soups Nutrition 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 239000011521 glass Substances 0.000 description 7
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 239000012633 leachable Substances 0.000 description 5
- 230000009467 reduction Effects 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- 230000033228 biological regulation Effects 0.000 description 4
- 229910021641 deionized water Inorganic materials 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 230000006378 damage Effects 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 206010016825 Flushing Diseases 0.000 description 2
- 230000001154 acute effect Effects 0.000 description 2
- 210000000988 bone and bone Anatomy 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005587 bubbling Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 239000012046 mixed solvent Substances 0.000 description 1
- -1 more particularly Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims (15)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006095041 | 2006-03-30 | ||
JP2006095041A JP4641964B2 (ja) | 2006-03-30 | 2006-03-30 | 基板処理装置および基板処理方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101047110A true CN101047110A (zh) | 2007-10-03 |
CN100505156C CN100505156C (zh) | 2009-06-24 |
Family
ID=38557067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2007100878482A Expired - Fee Related CN100505156C (zh) | 2006-03-30 | 2007-03-21 | 基板处理装置以及基板处理方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8857449B2 (zh) |
JP (1) | JP4641964B2 (zh) |
KR (1) | KR100858578B1 (zh) |
CN (1) | CN100505156C (zh) |
TW (1) | TW200737321A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102062524A (zh) * | 2010-11-22 | 2011-05-18 | 烟台睿创微纳技术有限公司 | 一种用于mems器件圆片的自动干燥设备 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101316769B1 (ko) | 2005-04-01 | 2013-10-15 | 티이엘 에프에스아이, 인코포레이티드 | 하나 이상의 처리 유체를 이용하여 마이크로일렉트로닉 워크피이스를 처리하는데 이용되는 장치용 배리어 구조 및 노즐 장치 |
JP4889331B2 (ja) * | 2006-03-22 | 2012-03-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
KR101191337B1 (ko) | 2006-07-07 | 2012-10-16 | 에프에스아이 인터내쇼날 인크. | 하나 이상의 처리 유체로 마이크로일렉트로닉 워크피스를 처리하는데 사용되는 장치용 배리어 구조물 및 노즐장치 |
KR100829376B1 (ko) * | 2006-12-20 | 2008-05-13 | 동부일렉트로닉스 주식회사 | 반도체 소자의 세정방법 |
JP5084656B2 (ja) * | 2008-07-29 | 2012-11-28 | 東京エレクトロン株式会社 | 現像処理方法及び現像処理装置 |
JP5270263B2 (ja) * | 2008-08-29 | 2013-08-21 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
CN101526760B (zh) * | 2009-04-10 | 2011-09-07 | 友达光电股份有限公司 | 基板处理***及显影方法 |
US20110130009A1 (en) * | 2009-11-30 | 2011-06-02 | Lam Research Ag | Method and apparatus for surface treatment using a mixture of acid and oxidizing gas |
JP5584653B2 (ja) * | 2010-11-25 | 2014-09-03 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
CN102028357B (zh) * | 2010-11-30 | 2012-08-15 | 沈阳芯源微电子设备有限公司 | 毛刷清洗装置及其使用方法 |
RU2585322C2 (ru) * | 2011-03-18 | 2016-05-27 | Басф Се | Способ получения интегральных схем, оптических устройств, микромашин и механических высокоточных устройств, имеющих слои структурированного материала со строчным интервалом 50 нм и менее |
JP6916003B2 (ja) * | 2017-02-24 | 2021-08-11 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
US11728185B2 (en) | 2021-01-05 | 2023-08-15 | Applied Materials, Inc. | Steam-assisted single substrate cleaning process and apparatus |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3928125A (en) * | 1972-12-18 | 1975-12-23 | Feldmuehle Anlagen Prod | Water extraction apparatus for papermaking machine |
JP2983495B2 (ja) * | 1997-05-20 | 1999-11-29 | 株式会社カイジョー | 基板の乾燥方法 |
JP3653198B2 (ja) | 1999-07-16 | 2005-05-25 | アルプス電気株式会社 | 乾燥用ノズルおよびこれを用いた乾燥装置ならびに洗浄装置 |
JP4064729B2 (ja) * | 2001-06-08 | 2008-03-19 | 住友精密工業株式会社 | 基板処理装置 |
JP3955197B2 (ja) * | 2001-09-28 | 2007-08-08 | アルプス電気株式会社 | ウエット処理用ノズルおよびウエット処理装置 |
JP2003151947A (ja) * | 2001-11-08 | 2003-05-23 | Seiko Epson Corp | 表面処理装置および表面処理方法 |
AT411335B (de) * | 2002-03-06 | 2003-12-29 | Sez Ag | Verfahren zum nassbehandeln von scheibenförmigen gegenständen |
WO2003105201A1 (ja) | 2002-06-07 | 2003-12-18 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び現像装置 |
JP4194302B2 (ja) * | 2002-06-07 | 2008-12-10 | 東京エレクトロン株式会社 | 現像装置及び現像処理方法 |
TWI230396B (en) * | 2002-09-30 | 2005-04-01 | Lam Res Corp | System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold |
US7383843B2 (en) * | 2002-09-30 | 2008-06-10 | Lam Research Corporation | Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer |
JP2004335840A (ja) | 2003-05-09 | 2004-11-25 | Personal Creation Ltd | 基板からの水分除去装置及び水分除去方法 |
JP4036815B2 (ja) * | 2003-10-31 | 2008-01-23 | シャープ株式会社 | 洗浄装置 |
JP4455228B2 (ja) * | 2004-08-26 | 2010-04-21 | 大日本スクリーン製造株式会社 | 基板処理方法および基板処理装置 |
-
2006
- 2006-03-30 JP JP2006095041A patent/JP4641964B2/ja not_active Expired - Fee Related
-
2007
- 2007-02-13 TW TW096105187A patent/TW200737321A/zh not_active IP Right Cessation
- 2007-03-06 KR KR1020070022071A patent/KR100858578B1/ko active IP Right Grant
- 2007-03-21 CN CNB2007100878482A patent/CN100505156C/zh not_active Expired - Fee Related
- 2007-03-21 US US11/689,073 patent/US8857449B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102062524A (zh) * | 2010-11-22 | 2011-05-18 | 烟台睿创微纳技术有限公司 | 一种用于mems器件圆片的自动干燥设备 |
CN102062524B (zh) * | 2010-11-22 | 2012-11-21 | 烟台睿创微纳技术有限公司 | 一种用于mems器件圆片的自动干燥设备 |
Also Published As
Publication number | Publication date |
---|---|
KR20070098509A (ko) | 2007-10-05 |
TWI346976B (zh) | 2011-08-11 |
US20070227566A1 (en) | 2007-10-04 |
CN100505156C (zh) | 2009-06-24 |
JP2007273575A (ja) | 2007-10-18 |
JP4641964B2 (ja) | 2011-03-02 |
KR100858578B1 (ko) | 2008-09-17 |
US8857449B2 (en) | 2014-10-14 |
TW200737321A (en) | 2007-10-01 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: SCREEN GROUP CO., LTD. Free format text: FORMER NAME: DAINIPPON SCREEN MFG. CO., LTD. Owner name: DAINIPPON SCREEN MFG. CO., LTD. Free format text: FORMER NAME: DAINIPPON MESH PLATE MFR. CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Kyoto City, Kyoto, Japan Patentee after: Skilling Group Address before: Kyoto City, Kyoto, Japan Patentee before: DAINIPPON SCREEN MFG Co.,Ltd. Address after: Kyoto City, Kyoto, Japan Patentee after: DAINIPPON SCREEN MFG Co.,Ltd. Address before: Kyoto City, Kyoto, Japan Patentee before: Dainippon Screen Mfg. Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090624 Termination date: 20200321 |
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CF01 | Termination of patent right due to non-payment of annual fee |