CA2067048A1 - Field effect transistor - Google Patents

Field effect transistor

Info

Publication number
CA2067048A1
CA2067048A1 CA002067048A CA2067048A CA2067048A1 CA 2067048 A1 CA2067048 A1 CA 2067048A1 CA 002067048 A CA002067048 A CA 002067048A CA 2067048 A CA2067048 A CA 2067048A CA 2067048 A1 CA2067048 A1 CA 2067048A1
Authority
CA
Canada
Prior art keywords
layer
layers
composition ratio
transistor according
channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002067048A
Other languages
English (en)
French (fr)
Inventor
Nobuhiro Kuwata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3096857A external-priority patent/JPH04326734A/ja
Priority claimed from JP3096858A external-priority patent/JPH04326735A/ja
Application filed by Individual filed Critical Individual
Publication of CA2067048A1 publication Critical patent/CA2067048A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/80Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/802Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with heterojunction gate, e.g. transistors with semiconductor layer acting as gate insulating layer, MIS-like transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1025Channel region of field-effect devices
    • H01L29/1029Channel region of field-effect devices of field-effect transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Junction Field-Effect Transistors (AREA)
CA002067048A 1991-04-26 1992-04-24 Field effect transistor Abandoned CA2067048A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP96858/1991 1991-04-26
JP96857/1991 1991-04-26
JP3096857A JPH04326734A (ja) 1991-04-26 1991-04-26 電界効果トランジスタ
JP3096858A JPH04326735A (ja) 1991-04-26 1991-04-26 電界効果トランジスタ

Publications (1)

Publication Number Publication Date
CA2067048A1 true CA2067048A1 (en) 1992-10-27

Family

ID=26438021

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002067048A Abandoned CA2067048A1 (en) 1991-04-26 1992-04-24 Field effect transistor

Country Status (4)

Country Link
US (1) US5331410A (ko)
EP (1) EP0510705A2 (ko)
KR (1) KR950003946B1 (ko)
CA (1) CA2067048A1 (ko)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3226069B2 (ja) * 1993-10-04 2001-11-05 キヤノン株式会社 半導体積層構造および半導体光素子
JP2674539B2 (ja) * 1994-12-21 1997-11-12 日本電気株式会社 電界効果トランジスタ
US5856684A (en) * 1996-09-12 1999-01-05 Motorola, Inc. High power HFET with improved channel interfaces
JP3601649B2 (ja) * 1996-12-25 2004-12-15 株式会社村田製作所 電界効果トランジスタ
US5701020A (en) * 1997-01-31 1997-12-23 National Science Council Pseudomorphic step-doped-channel field-effect transistor
JP3751398B2 (ja) * 1997-03-13 2006-03-01 富士通株式会社 化合物半導体装置
TW319913B (en) * 1997-05-06 1997-11-11 Nat Science Council InGaP/GaAs modulation compositioned channel Exhibit high current
JP3159198B2 (ja) * 1999-02-19 2001-04-23 住友電気工業株式会社 電界効果トランジスタ
JP3421306B2 (ja) * 2000-07-19 2003-06-30 富士通カンタムデバイス株式会社 化合物半導体装置
JP4586547B2 (ja) * 2005-01-24 2010-11-24 住友電気工業株式会社 接合型電界効果トランジスタ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4163237A (en) * 1978-04-24 1979-07-31 Bell Telephone Laboratories, Incorporated High mobility multilayered heterojunction devices employing modulated doping
US4691215A (en) * 1985-01-09 1987-09-01 American Telephone And Telegraph Company Hot electron unipolar transistor with two-dimensional degenerate electron gas base with continuously graded composition compound emitter
JP2645993B2 (ja) * 1986-06-12 1997-08-25 富士通株式会社 電界効果型半導体装置及びその製造方法
US4994866A (en) * 1988-01-07 1991-02-19 Fujitsu Limited Complementary semiconductor device
US5091759A (en) * 1989-10-30 1992-02-25 Texas Instruments Incorporated Heterostructure field effect transistor
JP2501627B2 (ja) * 1988-09-27 1996-05-29 沖電気工業株式会社 化合物半導体の構造体及びその形成方法
JPH02192739A (ja) * 1989-01-20 1990-07-30 Sanyo Electric Co Ltd ヘテロ接合電界効果トランジスタ
US5060030A (en) * 1990-07-18 1991-10-22 Raytheon Company Pseudomorphic HEMT having strained compensation layer
US5206527A (en) * 1990-11-09 1993-04-27 Sumitomo Electric Industries, Ltd. Field effect transistor

Also Published As

Publication number Publication date
EP0510705A3 (ko) 1995-05-24
EP0510705A2 (en) 1992-10-28
KR950003946B1 (ko) 1995-04-21
US5331410A (en) 1994-07-19

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Legal Events

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