WO2021017044A1 - 一种电池片iv、el双面测试设备 - Google Patents

一种电池片iv、el双面测试设备 Download PDF

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Publication number
WO2021017044A1
WO2021017044A1 PCT/CN2019/101305 CN2019101305W WO2021017044A1 WO 2021017044 A1 WO2021017044 A1 WO 2021017044A1 CN 2019101305 W CN2019101305 W CN 2019101305W WO 2021017044 A1 WO2021017044 A1 WO 2021017044A1
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WIPO (PCT)
Prior art keywords
carrier
cell
double
tester
test equipment
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PCT/CN2019/101305
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English (en)
French (fr)
Inventor
张学强
戴军
张建伟
罗银兵
祝志强
龚艳刚
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罗博特科智能科技股份有限公司
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Publication of WO2021017044A1 publication Critical patent/WO2021017044A1/zh

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Definitions

  • the invention relates to the technical field of solar cell detection equipment, in particular to a double-sided test equipment for cell IV and EL.
  • the cells In order to ensure the working efficiency of solar panels, the cells need to be tested during the processing process to ensure that they have good electrical performance parameters.
  • Solar cell testing and sorting is an important part of the quality control of the finished solar module production process.
  • the current test equipment mainly supports single-cell cell testing, that is, only one side of the cell can be tested, and it is impossible to test both sides of the cell at the same time. Therefore, in the specific implementation process, it is necessary to complete the cell After one side of the test is manually performed on the other side of the battery, the test process is tedious and complicated, the test equipment occupies a huge area and the cost is high.
  • the technical problem to be solved by the present invention is to provide a battery slice IV and EL double-sided test equipment, which can simultaneously test the front and back sides of the battery slice, has a compact structure, improves space utilization efficiency and saves costs.
  • the present invention provides a battery cell IV, EL double-sided test equipment, including a machine platform, a feeding mechanism, a rotating transmission mechanism, a testing mechanism, and a discharging mechanism.
  • the rotary transmission mechanism is fixed on the machine platform.
  • the rotary transmission mechanism includes a four-station index plate and a carrier, and the loading mechanism, the testing mechanism and the unloading mechanism are respectively arranged on the machine table along the rotation direction of the four-station index plate Or on the side of the machine table, the carrier is connected with four evenly spaced outwards along the four-station indexing plate.
  • the carrier is driven by the four-station indexing plate and is respectively connected with the feeding mechanism and the testing mechanism.
  • the carrier is a hollow frame structure, and the test mechanism clamps in the direction of the carrier from the upper and lower sides.
  • the side of the carrier is connected with a number of suction cups extending inward
  • the four-station indexing plate includes a DD motor and a turntable
  • the carrier is connected around the turntable
  • a vacuum pipe passes through the DD motor and the machine to communicate with the suction cup and the pneumatic slip ring.
  • the carrier includes an outer frame and a bottom plate, an air flow path exists between the outer frame and the bottom plate, and an air suction port of the air flow path is located at one end of the carrier and the turntable, and the vacuum The pipe communicates with the suction cup through the air flow channel.
  • the center of the DD motor is also provided with a driving rod, one end of the driving rod is connected to the rotor of the DD motor through a limit disk, the other end of the driving rod is connected to the pneumatic slip ring, and the limit A limit slot for the vacuum pipeline to pass through is arranged around the disc.
  • the feeding mechanism includes a first linear module set on the machine table, a feeding suction cup connected to the first linear module, and a support assembly located below the feeding suction cup.
  • the module is a three-axis linear module, the feeding suction cup and the three-axis linear module are connected by a rotating motor, and a positioning camera is also arranged above the support assembly.
  • the support assembly is a conveyor belt assembly, and an end of the conveyor belt assembly away from the four-station index plate is inclined downwardly with a receiving box.
  • the test mechanism includes a front tester, a back tester, an upper probe row, a lower probe row, and a probe movement mechanism.
  • the front tester and the back tester include a test part and an illuminating part.
  • the tester and the upper probe row are located above the carrier, the back tester and the lower probe row are located below the carrier, and the upper probe row and the lower probe row are both connected to the front tester and
  • the test part of the back tester is electrically connected, and the upper probe row and the lower probe row are driven by the probe movement mechanism to move up and down relative to each other.
  • the illuminating part of the front tester points to the carrier
  • the back tester is arranged horizontally
  • a reflector is arranged between the illuminating part of the back tester and the carrier.
  • the probe movement mechanism includes a drive motor and a screw rod, the upper probe row and the lower probe row are respectively connected to the nut pairs of the screw rod, and the upper probe row and the lower probe row respectively include A mounting frame and several rows of probe groups are provided with mounting grooves on both sides of the mounting frame, and both ends of the probe group are connected with the mounting grooves through sliding blocks.
  • the blanking mechanism includes a second linear module and a blanking suction cup connected to the second linear module, the second linear module is a linear slide, and the slide seat of the linear slide is connected to the The same direction linear modules of the feeding mechanism are connected, and the feeding suction cup is fixedly connected to the sliding seat.
  • the double-sided test equipment for cell IV and EL of the present invention has the beneficial effect that it can simultaneously test the front and back sides of the cell, has a compact structure, improves space utilization efficiency, and saves costs. .
  • Figure 1 is a schematic diagram of the overall structure of the present invention.
  • FIG. 2 is a schematic diagram of the structure of the rotating transmission mechanism of the present invention.
  • Figure 3 is an exploded view of the vehicle of the present invention.
  • FIG. 4 is a schematic diagram of the loading and unloading mechanism of the present invention.
  • Figure 5 is a schematic diagram of the first embodiment of the testing mechanism of the present invention.
  • Figure 6 is a schematic diagram of a first embodiment of the probe mechanism of the present invention.
  • Fig. 7 is a schematic diagram of the second embodiment of the testing mechanism of the present invention.
  • FIG. 1 shows an embodiment of a double-sided test equipment for cell IV and EL according to the present invention, which includes a machine table 100, a feeding mechanism 200, a rotating transmission mechanism 300, a testing mechanism 400, and a discharging mechanism 500.
  • the rotary transmission mechanism 300 is fixed on the machine table 100, the rotary transmission mechanism 300 includes a four-station index plate 310 and a carrier 320, the loading machine mechanism 200, the testing mechanism 400 and the unloading mechanism 500 They are respectively arranged on the machine table 100 or on the side of the machine table 100 along the rotation direction of the four-station indexing plate 310.
  • the testing mechanism 400 in this embodiment needs to test the products on the carrier 320 from both up and down directions at the same time.
  • the distance between the machine 100 and the carrier 320 is over
  • the test mechanism 400 is small and cannot be set up. Therefore, the test mechanism 400 is arranged on the side of the machine 100.
  • Each mechanism is arranged around the four-station index plate 310, which improves the utilization rate of space and reduces the equipment footprint.
  • 320 is connected to four outwards at even intervals along the four-station index plate 310.
  • the testing mechanism 400 is close to the carrier 320 from the upper and lower directions, and the carrier 320 extends outward, which can prevent the part under the test mechanism 400 from interfering with the driving part of the index plate.
  • the carrier 320 is driven by the four-station index plate 310
  • the lower part corresponds to the feeder mechanism 200, the test mechanism 400 and the unloading mechanism 500 respectively, so that every time the four-station indexing plate 310 rotates one angle, the carrier 320 on it can be transferred from the previous station to the lower station.
  • One station greatly improves the efficiency of the carrier 320 switching back and forth between different stations.
  • the carrier 320 is a hollow frame structure. When the cell 600 is placed on the carrier 320, the upper and lower surfaces of the cell 600 All are exposed, and the testing mechanism 400 is clamped toward the carrier 320 from the upper and lower sides.
  • the carrier 320 is connected to a plurality of suction cups 321 extending inward from the side.
  • the structure of the suction cup 321 is adopted. Since the carrier 320 rotates 360° with the four-station indexing plate 310, in order to prevent the vacuum suction tube connecting the suction cup 321 with the machine 100 Interference occurs.
  • the four-station indexing plate 310 is configured to include a DD motor 311 and a turntable 312. The carrier 320 is connected around the turntable 312.
  • the DD motor 311 has a large output torque to ensure The turntable 312 and the carrier 320 are driven to rotate.
  • the DD motor 311 has a tubular structure.
  • the vacuum pipe can pass through the center of the DD motor 311, so that when the carrier 320 rotates, the vacuum pipe connecting the suction cup 321 will not be connected to the machine table. 100 and other institutions interfere.
  • a pneumatic slip ring 330 is provided under the machine table 100.
  • the vacuum pipe passes through the DD motor 311 and the machine table 100 to connect the suction cup 321 and the pneumatic The slip ring 330 realizes the normal operation of the suction cup 321.
  • a drive rod 313 is further provided in the center of the DD motor 311.
  • One end of the drive rod 313 is connected to the rotor of the DD motor 311 through a limit disk 314.
  • the other end is connected with the pneumatic slip ring 330, the driving rod 313 is driven by the DD motor 311, and the driving rod 313 drives the pneumatic slip ring 330 to rotate synchronously.
  • the limit disk 314 is provided with a passage for the vacuum pipe to pass through.
  • the limiting slot 315 corresponds to the direction of the carrier 320, and the vacuum pipe can only pass through the limiting slot 315 to ensure the order of the vacuum pipe.
  • the carrier 320 includes an outer frame 322 and a bottom plate 323, and there is air flow between the outer frame 322 and the bottom plate 323
  • the suction port 324 of the air flow path is located at the end where the carrier 320 is connected to the turntable 312, the vacuum pipe is connected to the suction cup 321 through the air flow path, and a plurality of suction cups 321 pass through one suction port 324 performs air extraction, on the one hand, reducing the setting of the vacuum pipe, on the other hand, it will not interfere with the approach of the test component to the carrier 320.
  • the loader mechanism 200 includes a first linear module 210 arranged on the machine 100, and a first linear module 210 connected to the first linear module 210.
  • the loading suction cup 220 and the supporting assembly 230 located under the loading suction cup 220, the loading suction cup 220 sucks the cell 600 on the supporting assembly 230, and then places the cell 600 on the corresponding carrier through the transmission of the first linear module 210
  • the first linear module 210 is a three-axis linear module.
  • the loading suction cup 220 and the three-axis linear module are connected by a rotating motor 240, and a positioning camera 250 is also arranged above the supporting assembly 230.
  • the positioning camera 250 is used to pair the cell 600 placed on the supporting assembly 230. Perform positioning to determine whether it is in the correct position in X, Y, and ⁇ , so that when the cell 600 is moved to the carrier 320 when the cell 600 is sucked up, the cell 600 is oriented in the X, Y, Z directions and the angle ⁇
  • the adjustment, transfer and adjustment can be carried out at the same time, saving work beats.
  • the support assembly 230 is a conveyor belt assembly 231, and an end of the conveyor belt assembly 231 away from the four-station index plate 310 is provided with a receiving box 260 inclined downwards.
  • the feeding suction cup 220 does not move to suck the cell 600
  • the conveyor belt assembly 231 rotates away from the four-station index plate 310, and the cell 600 moves from the conveyor belt assembly
  • the end of 231 drops and is collected by the receiving box 260 to complete the preliminary screening.
  • the test mechanism 400 includes a front tester 410, a back tester 420, an upper probe row 430, a lower probe row 440, and probe movement.
  • the component 450, the front tester 410 and the back tester 420 include a test part 411 and an illuminating part 412, the front tester 410 and the upper probe row 430 are located above the carrier 320, and are illuminated by the front tester 410
  • the part 412 provides simulated sunlight to the front of the cell 600, and at the same time, the upper probe row 430 is used to test the upper surface of the cell 600.
  • the back tester 420 and the lower probe row 440 are located under the carrier 320 and pass through the back
  • the lighting part 412 of the tester 420 provides simulated sunlight on the back of the cell 600, and at the same time, the lower probe row 440 is used to test the lower surface of the cell 600.
  • the upper probe row 430 and the lower probe row 440 are both compatible with
  • the front tester 410 and the test part 411 of the back tester 420 are electrically connected.
  • the front tester 410 and the back tester 420 are both IV and EL test integrated machines, so both sides of the cell 600 can be tested simultaneously. Carry out IV and EL tests.
  • IV and EL tests can be carried out separately in two stations, and the two are arranged on the adjacent two sides of the four-station index plate 310, because the cell 600 is always located On the same carrier 320, even if they are tested separately, there is no need to carry the cell 600 multiple times, so as to ensure the quality of the cell 600.
  • the probe movement assembly 450 includes a drive motor 451 and a screw rod.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to the nut pair of the screw rod.
  • the screw rod in this embodiment is a unidirectional screw rod. 452.
  • Each screw rod is driven by a driving motor 451.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to a unidirectional screw rod 452.
  • the two probe rows move in opposite directions.
  • the upper probe row 430 and the lower probe row 440 respectively include a mounting frame 431 and a plurality of rows of probe groups 432. Two sides of the mounting frame 431 are provided with mounting grooves 433, and both ends of the probe group 432 pass through sliders. 434 is connected to the mounting slot 433, and the sliding block 434 can adjust the position in the mounting slot 433 to change the distance between the probe sets 432, so that the probe sets 432 can adapt to the battery slices 600 of different sizes.
  • FIG. 7 it is a schematic structural diagram of the second embodiment of the test mechanism 400 of the present invention. Since the space above the carrier 320 is not limited, the front tester 410 can be installed vertically, and the illuminating part of the front tester 410 faces from below. The cell 600 is illuminated, and the space under the carrier 320 is small, which cannot satisfy the vertical arrangement of the back tester 420. Therefore, the back tester 420 is arranged horizontally in this embodiment, and the illumination of the back tester 420 A reflector 421 is arranged between the part 412 and the carrier 320, and the light generated by the illumination part 412 of the back tester 420 is reflected to the back of the cell 600 through the reflector 421 to illuminate the back of the cell 600.
  • the screw rod is a bidirectional screw rod 453, and one drive motor 451 is provided.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to the nut pairs at both ends of the bidirectional screw rod 453, so that the two probe rows can be Driven by the bidirectional screw rod 453, they move toward or relative to each other.
  • the blanking mechanism 500 includes a second linear module 510 and a blanking sucker 520 connected to the second linear module 510.
  • the second linear module 510 only needs to pick up the cell 600 that has been tested on the carrier 320 and send it out to the four-station indexing plate 310. Since the testing mechanism 400 in this embodiment only occupies one station, the unloading mechanism 500 and the upper The feeder mechanism 200 is on the same straight line, and the unloading suction cup 520 moves the cell 600 out of the carrier 320 and the loading suction cup 220 sends the cell 600 onto the carrier 320 at the same tempo.
  • the second linear module 510 is set as a linear slide 511, the slide 512 of the linear slide 511 is connected to the same direction linear module of the feeder mechanism 200 by a connecting rod 513, and the unloading suction cup 520 is connected to
  • the sliding seat 512 is fixedly connected, and the blanking suction cup 520 does not need to move in the up and down direction, because when the suction cup 321 on the carrier 320 sucks the cell 600, the cell 600 is close to the surface of the carrier 320, and the surface of the cell 600 and There is a certain distance between the blanking suction cups 520, which does not affect the carrier 320 to send the battery slice 600 under the blanking suction cup 520.
  • the blanking sucker 321 releases the battery slice 600, the battery slice 600 bounces up a certain distance Therefore, the unloading sucker 520 can easily suck the cell 600.

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  • Condensed Matter Physics & Semiconductors (AREA)
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Abstract

本发明公开了一种电池片IV、EL双面测试设备，包括机台、上料机构、旋转传送机构、测试机构和下料机构，旋转传送机构固定于机台上，旋转传送机构包括四工位分度盘和载具，上料机构、测试机构和下料机构分别沿四工位分度盘的旋转方向设置于机台上或机台侧边，载具沿四工位分度盘四周均匀间隔地向外连接有四个，载具在四工位分度盘的驱动下分别与上料机构、测试机构和下料机构对应，载具为中间镂空的框架结构，测试机构从上下两侧向载具方向夹持。本发明能够实现同时对电池片正反两面的测试，且结构紧凑，提高了空间的利用效率，节约成本。

Description

一种电池片IV、EL双面测试设备 技术领域
本发明涉及太阳能电池检测设备技术领域，具体涉及一种电池片IV、EL双面测试设备。
背景技术
为了保证太阳能电池板的工作效率，在加工工序中需要对电池片进行测试，以保障其具备良好的电性能参数。太阳能电池片测试分选是太阳能组件成品生产过程质量控制的重要环节。但是，目前的测试设备主要支持单片的电池片进行测试，即只能对电池片的一面进行测试，无法对电池片的两面同时进行测试，因此，在具体实施过程中，要在完成电池片一面的测试后再手动进行电池片另一面的测试，测试过程繁琐复杂，测试设备占地庞大，成本高。
综上，目前关于双面电池片在测试过程中无法同时进行测试的问题，尚无有效的解决办法。
发明内容
本发明要解决的技术问题是提供一种电池片IV、EL双面测试设备，能够实现同时对电池片正反两面的测试，且结构紧凑，提高了空间的利用效率，节约成本。
为了解决上述技术问题，本发明提供了一种电池片IV、EL双面测试设备，包括机台、上料机构、旋转传送机构、测试机构和下料机构，所述旋转传送机构固定于机台上，所述旋转传送机构包括四工位分度盘和载具，所述上料机构、测试机构和下料机构分别沿所述四工位分度盘的旋转方向设置于所述机台上或 机台侧边，所述载具沿四工位分度盘四周均匀间隔地向外连接有四个，所述载具在四工位分度盘的驱动下分别与上料机构、测试机构和下料机构对应，所述载具为中间镂空的框架结构，所述测试机构从上下两侧向所述载具方向夹持。
进一步的，所述载具侧边向内延伸连接有若干吸盘，所述四工位分度盘包括DD电机和转盘，所述载具连接于所述转盘四周，所述机台下方设置有气动滑环，真空管道穿过所述DD电机和机台连通所述吸盘和气动滑环。
进一步的，所述载具包括外框和底板，所述外框和底板之间存在空气流道，所述空气流道的抽气口位于所述载具与所述转盘连接的一端，所述真空管道通过所述空气流道连通所述吸盘。
进一步的，所述DD电机中心还设置有驱动杆，所述驱动杆的一端通过限位盘连接所述DD电机的转子，所述驱动杆的另一端连接所述气动滑环，所述限位盘四周设置有供所述真空管道穿过的限位槽。
进一步的，所述上料机构包括设置在机台上的第一直线模组、与第一直线模组相连的上料吸盘以及位于上料吸盘下方的支撑组件，所述第一直线模组为三轴直线模组，所述上料吸盘与所述三轴直线模组之间通过旋转电机相连，所述支撑组件上方还设置有定位相机。
进一步的，所述支撑组件为传送带组件，所述传送带组件远离所述四工位分度盘的一端向下倾斜设置有接料盒。
进一步的，所述测试机构包括正面测试仪、背面测试仪、上探针排、下探针排和探针运动机构，所述正面测试仪和背面测试仪包括测试部和照明部，所述正面测试仪和上探针排位于所述载具上方，所述背面测试仪和下探针排位于所述载具下方，所述上探针排和下探针排均与所述正面测试仪和背面测试仪的测试部电连接，所述上探针排和下探针排均由所述探针运动机构驱动上下相对移动。
进一步的，所述正面测试仪的照明部指向所述载具，所述背面测试仪水平 设置，所述背面测试仪的照明部与所述载具之间设置有反射镜。
进一步的，所述探针运动机构包括驱动电机和丝杆，所述上探针排和下探针排分别连接所述丝杆的螺母副，所述上探针排和下探针排分别包括安装框和若干排探针组，所述安装框两侧设置有安装槽，所述探针组两端通过滑块与所述安装槽相连。
进一步的，所述下料机构包括第二直线模组以及与所述第二直线模组相连的下料吸盘，所述第二直线模组为直线滑轨，所述直线滑轨的滑座与所述上料机构的同向直线模组相连，所述下料吸盘与所述滑座固定连接。
本发明的一种电池片IV、EL双面测试设备与现有技术相比的有益效果是，能够实现同时对电池片正反两面的测试，且结构紧凑，提高了空间的利用效率，节约成本。
附图说明
图1是本发明的整体结构示意图；
图2是本发明的旋转传送机构的结构示意图；
图3是本发明的载具的***图；
图4是本发明的上下料机构示意图；
图5是本发明的测试机构实施例一示意图；
图6是本发明的探针机构实施例一示意图；
图7是本发明的测试机构实施例二示意图。
具体实施方式
下面结合附图和具体实施例对本发明作进一步说明，以使本领域的技术人员可以更好地理解本发明并能予以实施，但所举实施例不作为对本发明的限定。
参照图1所示，为本发明的一种电池片IV、EL双面测试设备的实施例，包括机台100、上料机机构200、旋转传送机构300、测试机构400和下料机构500，所述旋转传送机构300固定于所述机台100上，所述旋转传送机构300包括四工位分度盘310和载具320，所述上料机机构200、测试机构400和下料机构500分别沿所述四工位分度盘310的旋转方向设置于所述机台100上或机台100侧边，对于上料机机构200和下料机构500，为保证与载具320的配合节约安装型材，两者设置于机台100上，而本实施例中的测试机构400需要从上下两个方向同时对载具320上的产品进行测试，机台100与载具320之间的距离过小，无法设置测试机构400，因此测试机构400设置于机台100侧边，各机构均围绕四工位分度盘310设置，提高了空间的利用率，降低设备占地面积，所述载具320沿四工位分度盘310四周均匀间隔地向外连接有四个，一方面无需使用大尺寸分度盘，节约成本，减轻分度盘的重量，方便驱动，另一方面，由于测试机构400从上下两个方向贴近载具320，载具320向外延伸，能够防止测试机构400下方的部分与分度盘的驱动部分干涉，所述载具320在四工位分度盘310的驱动下分别与上料机机构200、测试机构400和下料机构500对应，从而使得四工位分度盘310每转动一个角度时，其上的载具320都能从上一个工位转移到下一个工位，大大提高了载具320在不同工位间来回转换的效率，所述载具320为中间镂空的框架结构，当电池片600放置在载具320上时，电池片600的上下表面均暴露在外，所述测试机构400从上下两侧向所述载具320方向夹持。
参照图2所示，为本发明的旋转传送机构的结构示意图，所述载具320侧边向内延伸连接有若干吸盘321，当电池片600放置在载具320上后，由于电池片600比较脆弱，机械固定结构容易损坏电池片600，因此本实施例中采用吸盘321固定的结构，由于载具320随四工位分度盘310360°旋转，为防止连接吸盘321的真空吸管与机台100发生干涉，本实施例中，所述四工位分度盘310设置为包括DD电机311和转盘312，所述载具320连接于所述转盘312四 周，一方面DD电机311输出力矩大，保证驱动转盘312和载具320转动，另一方面DD电机311为管状结构，真空管道能够从DD电机311的中心穿过，从而在载具320转动时，连接吸盘321的真空管道不会与机台100及其他机构干涉。为进一步保证真空管道随转盘312一同转动的同时还能够传输气体，所述机台100下方设置有气动滑环330，真空管道穿过所述DD电机311和机台100连通所述吸盘321和气动滑环330，实现吸盘321的正常工作。为进一步方便驱动气动滑环330转动，所述DD电机311中心还设置有驱动杆313，所述驱动杆313的一端通过限位盘314连接所述DD电机311的转子，所述驱动杆313的另一端连接所述气动滑环330，驱动杆313由DD电机311驱动，驱动杆313带动气动滑环330同步转动，进一步的，所述限位盘314四周设置有供所述真空管道穿过的限位槽315，限位槽315与载具320的方向对应，真空管道仅能从限位槽315中穿过，保证真空管道的整齐。
参照图3所示，为本发明的载具320结构***图，为减少真空管道的设置，所述载具320包括外框322和底板323，所述外框322和底板323之间存在空气流道，所述空气流道的抽气口324位于所述载具320与所述转盘312连接的一端，所述真空管道通过所述空气流道连通所述吸盘321，多个吸盘321通过一个抽气口324进行抽气，一方面减少真空管道的设置，另一方面不会干扰测试组件向载具320的靠近。
参照图4所示，为本发明的上料机机构200示意图，所述上料机机构200包括设置在机台100上的第一直线模组210、与第一直线模组210相连的上料吸盘220以及位于上料吸盘220下方的支撑组件230，上料吸盘220吸取支撑组件230上的电池片600，而后通过第一直线模组210的传送将电池片600放置于对应的载具320上，但当电池片600放置在支撑组件230上时，电池片600的位置和角度可能与载具320并不对应，因此所述第一直线模组210为三轴直线模组，所述上料吸盘220与所述三轴直线模组之间通过旋转电机240相连，所述支撑组件230上方还设置有定位相机250，通过定位相机250对放置在支 撑组件230上的电池片600进行定位，判断其在X、Y和θ上是否正位，从而在吸起电池片600时将其移动至载具320上时，对电池片600进行X、Y、Z方向上和θ角度上的调整，移送和调整能够同时进行，节省工作节拍。进一步的，本实施例中，所述支撑组件230为传送带组件231，所述传送带组件231远离所述四工位分度盘310的一端向下倾斜设置有接料盒260，在定位相机250对电池片600进行检测时，当发现电池片600表面存在缺陷，则上料吸盘220不移动吸取电池片600，传送带组件231向远离四工位分度盘310的方向转动，电池片600从传送带组件231端部掉落，被接料盒260收集，完成初步筛选。
参照图5所示，为本发明的测试机构400实施例一结构示意图，所述测试机构400包括正面测试仪410、背面测试仪420、上探针排430、下探针排440和探针运动组件450，所述正面测试仪410和背面测试仪420包括测试部411和照明部412，所述正面测试仪410和上探针排430位于所述载具320上方，通过正面测试仪410的照明部412对电池片600正面提供模拟太阳光，同时利用上探针排430对电池片600上表面进行测试，所述背面测试仪420和下探针排440位于所述载具320下方，通过背面测试仪420的照明部412对电池片600背面提供模拟太阳光，同时利用下探针排440对电池片600下表面进行测试，所述上探针排430和下探针排440均与所述正面测试仪410和背面测试仪420的测试部411电连接，本实施例中，正面测试仪410和背面测试仪420的均为IV、EL测试一体机，因此能够同时对电池片600的双面进行IV和EL的测试，在另外的实施例中，IV测试和EL测试可以在两个工位分开进行，两者设置在四工位分度盘310相邻两侧，由于电池片600始终位于同一个载具320上，即使分别测试也不需要对电池片600的多次搬运，保证电池片600的质量。
参照图6所述，为本发明探针机构实施例一结构示意图，本实施例中的所述上探针排430和下探针排440均由所述探针运动组件450驱动上下相对移动，所述探针运动组件450包括驱动电机451和丝杆，所述上探针排430和下探针排440分别连接所述丝杆的螺母副，本实施例中的丝杆为单向丝杆452，每根 丝杆均由一个驱动电机451驱动，上探针排430和下探针排440分别连接一根单向丝杆452，两探针排反向运动，当载具320带动电池片600移动至两探针排之间时，两探针排从上下两侧向载具320的方向移动，测试完成后，两探针排均朝向远离载具320的方向移动，载具320旋转90°到达下一工位，同时另一电池片600到达两探针排之间。所述上探针排430和下探针排440分别包括安装框431和若干排探针组432，所述安装框431两侧设置有安装槽433，所述探针组432两端通过滑块434与所述安装槽433相连，滑块434能够在安装槽433内调整位置，改变各探针组432之间的距离，能够使探针组432适应不同尺寸的电池片600。
参照图7所示，为本发明测试机构400实施例二结构示意图，由于载具320上方的空间无限制，因此所述正面测试仪410能够竖直设置，正面测试仪410的光照部从下方对电池片600进行照亮，而载具320下方的空间较小，无法满足背面测试仪420的竖直设置，因此本实施例中所述背面测试仪420水平设置，所述背面测试仪420的照明部412与所述载具320之间设置有反射镜421，通过反射镜421将背面测试仪420照明部412产生的光亮反射至电池片600背面，照亮电池片600的背面。本实施例中，丝杆为双向丝杆453，驱动电机451设置有一个，上探针排430与下探针排440分别连接双向丝杆453两端的螺母副，从而两个探针排能够在双向丝杆453的驱动下相向或相对移动。
参照图4所示，为本发明下料机构500的结构示意图，所述下料机构500包括第二直线模组510以及与第二直线模组510相连的下料吸盘520，第二直线模组510仅需要拾取载具320上检测完成的电池片600，并将其送出四工位分度盘310即可，由于本实施例中测试机构400仅占用一个工位，因此下料机构500与上料机机构200处于同一直线上，且下料吸盘520将电池片600移出载具320与上料吸盘220将电池片600送上载具320处于同一节拍，因此本实施例中为节约成本，所述第二直线模组510设为直线滑轨511，所述直线滑轨511的滑座512与所述上料机机构200的同向直线模组通过连杆513相连，所 述下料吸盘520与所述滑座512固定连接，下料吸盘520无需在上下方向上移动，因为载具320上的吸盘321在吸取电池片600时，电池片600靠近载具320表面，此时电池片600表面与下料吸盘520之间存在一定的距离，不影响载具320将电池片600送至下料吸盘520下方，同时在下料时，吸盘321放开电池片600，电池片600向上弹起一定的距离，因此下料吸盘520能够很容易的吸取电池片600。
以上所述实施例仅是为充分说明本发明而所举的较佳的实施例，本发明的保护范围不限于此。本技术领域的技术人员在本发明基础上所作的等同替代或变换，均在本发明的保护范围之内。本发明的保护范围以权利要求书为准。

Claims (10)

  1. 一种电池片IV、EL双面测试设备，其特征在于，包括机台、上料机构、旋转传送机构、测试机构和下料机构，所述旋转传送机构固定于机台上，所述旋转传送机构包括四工位分度盘和载具，所述上料机构、测试机构和下料机构分别沿所述四工位分度盘的旋转方向设置于所述机台上或机台侧边，所述载具沿四工位分度盘四周均匀间隔地向外连接有四个，所述载具在四工位分度盘的驱动下分别与上料机构、测试机构和下料机构对应，所述载具为中间镂空的框架结构，所述测试机构从上下两侧向所述载具方向夹持。
  2. 如权利要求1所述的一种电池片IV、EL双面测试设备，其特征在于，所述载具侧边向内延伸连接有若干吸盘，所述四工位分度盘包括DD电机和转盘，所述载具连接于所述转盘四周，所述机台下方设置有气动滑环，真空管道穿过所述DD电机和机台连通所述吸盘和气动滑环。
  3. 如权利要求2所述的一种电池片IV、EL双面测试设备，其特征在于，所述载具包括外框和底板，所述外框和底板之间存在空气流道，所述空气流道的抽气口位于所述载具与所述转盘连接的一端，所述真空管道通过所述空气流道连通所述吸盘。
  4. 如权利要求2所述的一种电池片IV、EL双面测试设备，其特征在于，所述DD电机中心还设置有驱动杆，所述驱动杆的一端通过限位盘连接所述DD电机的转子，所述驱动杆的另一端连接所述气动滑环，所述限位盘四周设置有供所述真空管道穿过的限位槽。
  5. 如权利要求1所述的一种电池片IV、EL双面测试设备，其特征在于，所述上料机构包括设置在机台上的第一直线模组、与第一直线模组相连的上料吸盘以及位于上料吸盘下方的支撑组件，所述第一直线模组为三轴直线模组，所述上料吸盘与所述三轴直线模组之间通过旋转电机相连，所述支撑组件上方 还设置有定位相机。
  6. 如权利要求5所述的一种电池片IV、EL双面测试设备，其特征在于，所述支撑组件为传送带组件，所述传送带组件远离所述四工位分度盘的一端向下倾斜设置有接料盒。
  7. 如权利要求1所述的一种电池片IV、EL双面测试设备，其特征在于，所述测试机构包括正面测试仪、背面测试仪、上探针排、下探针排和探针运动机构，所述正面测试仪和背面测试仪包括测试部和照明部，所述正面测试仪和上探针排位于所述载具上方，所述背面测试仪和下探针排位于所述载具下方，所述上探针排和下探针排均与所述正面测试仪和背面测试仪的测试部电连接，所述上探针排和下探针排均由所述探针运动机构驱动上下相对移动。
  8. 如权利要求7所述的一种电池片IV、EL双面测试设备，其特征在于，所述正面测试仪的照明部指向所述载具，所述背面测试仪水平设置，所述背面测试仪的照明部与所述载具之间设置有反射镜。
  9. 如权利要求7所述的一种电池片IV、EL双面测试设备，其特征在于，所述探针运动机构包括驱动电机和丝杆，所述上探针排和下探针排分别连接所述丝杆的螺母副，所述上探针排和下探针排分别包括安装框和若干排探针组，所述安装框两侧设置有安装槽，所述探针组两端通过滑块与所述安装槽相连。
  10. 如权利要求1所述的一种电池片IV、EL双面测试设备，其特征在于，所述下料机构包括第二直线模组以及与所述第二直线模组相连的下料吸盘，所述第二直线模组为直线滑轨，所述直线滑轨的滑座与所述上料机构的同向直线模组相连，所述下料吸盘与所述滑座固定连接。
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CN210120118U (zh) * 2019-07-26 2020-02-28 罗博特科智能科技股份有限公司 一种电池片iv、el双面测试设备

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