WO2021017044A1 - Élément de batterie iv et équipement de test double face el - Google Patents

Élément de batterie iv et équipement de test double face el Download PDF

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Publication number
WO2021017044A1
WO2021017044A1 PCT/CN2019/101305 CN2019101305W WO2021017044A1 WO 2021017044 A1 WO2021017044 A1 WO 2021017044A1 CN 2019101305 W CN2019101305 W CN 2019101305W WO 2021017044 A1 WO2021017044 A1 WO 2021017044A1
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WO
WIPO (PCT)
Prior art keywords
carrier
cell
double
tester
test equipment
Prior art date
Application number
PCT/CN2019/101305
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English (en)
Chinese (zh)
Inventor
张学强
戴军
张建伟
罗银兵
祝志强
龚艳刚
Original Assignee
罗博特科智能科技股份有限公司
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Publication date
Application filed by 罗博特科智能科技股份有限公司 filed Critical 罗博特科智能科技股份有限公司
Publication of WO2021017044A1 publication Critical patent/WO2021017044A1/fr

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Definitions

  • the invention relates to the technical field of solar cell detection equipment, in particular to a double-sided test equipment for cell IV and EL.
  • the cells In order to ensure the working efficiency of solar panels, the cells need to be tested during the processing process to ensure that they have good electrical performance parameters.
  • Solar cell testing and sorting is an important part of the quality control of the finished solar module production process.
  • the current test equipment mainly supports single-cell cell testing, that is, only one side of the cell can be tested, and it is impossible to test both sides of the cell at the same time. Therefore, in the specific implementation process, it is necessary to complete the cell After one side of the test is manually performed on the other side of the battery, the test process is tedious and complicated, the test equipment occupies a huge area and the cost is high.
  • the technical problem to be solved by the present invention is to provide a battery slice IV and EL double-sided test equipment, which can simultaneously test the front and back sides of the battery slice, has a compact structure, improves space utilization efficiency and saves costs.
  • the present invention provides a battery cell IV, EL double-sided test equipment, including a machine platform, a feeding mechanism, a rotating transmission mechanism, a testing mechanism, and a discharging mechanism.
  • the rotary transmission mechanism is fixed on the machine platform.
  • the rotary transmission mechanism includes a four-station index plate and a carrier, and the loading mechanism, the testing mechanism and the unloading mechanism are respectively arranged on the machine table along the rotation direction of the four-station index plate Or on the side of the machine table, the carrier is connected with four evenly spaced outwards along the four-station indexing plate.
  • the carrier is driven by the four-station indexing plate and is respectively connected with the feeding mechanism and the testing mechanism.
  • the carrier is a hollow frame structure, and the test mechanism clamps in the direction of the carrier from the upper and lower sides.
  • the side of the carrier is connected with a number of suction cups extending inward
  • the four-station indexing plate includes a DD motor and a turntable
  • the carrier is connected around the turntable
  • a vacuum pipe passes through the DD motor and the machine to communicate with the suction cup and the pneumatic slip ring.
  • the carrier includes an outer frame and a bottom plate, an air flow path exists between the outer frame and the bottom plate, and an air suction port of the air flow path is located at one end of the carrier and the turntable, and the vacuum The pipe communicates with the suction cup through the air flow channel.
  • the center of the DD motor is also provided with a driving rod, one end of the driving rod is connected to the rotor of the DD motor through a limit disk, the other end of the driving rod is connected to the pneumatic slip ring, and the limit A limit slot for the vacuum pipeline to pass through is arranged around the disc.
  • the feeding mechanism includes a first linear module set on the machine table, a feeding suction cup connected to the first linear module, and a support assembly located below the feeding suction cup.
  • the module is a three-axis linear module, the feeding suction cup and the three-axis linear module are connected by a rotating motor, and a positioning camera is also arranged above the support assembly.
  • the support assembly is a conveyor belt assembly, and an end of the conveyor belt assembly away from the four-station index plate is inclined downwardly with a receiving box.
  • the test mechanism includes a front tester, a back tester, an upper probe row, a lower probe row, and a probe movement mechanism.
  • the front tester and the back tester include a test part and an illuminating part.
  • the tester and the upper probe row are located above the carrier, the back tester and the lower probe row are located below the carrier, and the upper probe row and the lower probe row are both connected to the front tester and
  • the test part of the back tester is electrically connected, and the upper probe row and the lower probe row are driven by the probe movement mechanism to move up and down relative to each other.
  • the illuminating part of the front tester points to the carrier
  • the back tester is arranged horizontally
  • a reflector is arranged between the illuminating part of the back tester and the carrier.
  • the probe movement mechanism includes a drive motor and a screw rod, the upper probe row and the lower probe row are respectively connected to the nut pairs of the screw rod, and the upper probe row and the lower probe row respectively include A mounting frame and several rows of probe groups are provided with mounting grooves on both sides of the mounting frame, and both ends of the probe group are connected with the mounting grooves through sliding blocks.
  • the blanking mechanism includes a second linear module and a blanking suction cup connected to the second linear module, the second linear module is a linear slide, and the slide seat of the linear slide is connected to the The same direction linear modules of the feeding mechanism are connected, and the feeding suction cup is fixedly connected to the sliding seat.
  • the double-sided test equipment for cell IV and EL of the present invention has the beneficial effect that it can simultaneously test the front and back sides of the cell, has a compact structure, improves space utilization efficiency, and saves costs. .
  • Figure 1 is a schematic diagram of the overall structure of the present invention.
  • FIG. 2 is a schematic diagram of the structure of the rotating transmission mechanism of the present invention.
  • Figure 3 is an exploded view of the vehicle of the present invention.
  • FIG. 4 is a schematic diagram of the loading and unloading mechanism of the present invention.
  • Figure 5 is a schematic diagram of the first embodiment of the testing mechanism of the present invention.
  • Figure 6 is a schematic diagram of a first embodiment of the probe mechanism of the present invention.
  • Fig. 7 is a schematic diagram of the second embodiment of the testing mechanism of the present invention.
  • FIG. 1 shows an embodiment of a double-sided test equipment for cell IV and EL according to the present invention, which includes a machine table 100, a feeding mechanism 200, a rotating transmission mechanism 300, a testing mechanism 400, and a discharging mechanism 500.
  • the rotary transmission mechanism 300 is fixed on the machine table 100, the rotary transmission mechanism 300 includes a four-station index plate 310 and a carrier 320, the loading machine mechanism 200, the testing mechanism 400 and the unloading mechanism 500 They are respectively arranged on the machine table 100 or on the side of the machine table 100 along the rotation direction of the four-station indexing plate 310.
  • the testing mechanism 400 in this embodiment needs to test the products on the carrier 320 from both up and down directions at the same time.
  • the distance between the machine 100 and the carrier 320 is over
  • the test mechanism 400 is small and cannot be set up. Therefore, the test mechanism 400 is arranged on the side of the machine 100.
  • Each mechanism is arranged around the four-station index plate 310, which improves the utilization rate of space and reduces the equipment footprint.
  • 320 is connected to four outwards at even intervals along the four-station index plate 310.
  • the testing mechanism 400 is close to the carrier 320 from the upper and lower directions, and the carrier 320 extends outward, which can prevent the part under the test mechanism 400 from interfering with the driving part of the index plate.
  • the carrier 320 is driven by the four-station index plate 310
  • the lower part corresponds to the feeder mechanism 200, the test mechanism 400 and the unloading mechanism 500 respectively, so that every time the four-station indexing plate 310 rotates one angle, the carrier 320 on it can be transferred from the previous station to the lower station.
  • One station greatly improves the efficiency of the carrier 320 switching back and forth between different stations.
  • the carrier 320 is a hollow frame structure. When the cell 600 is placed on the carrier 320, the upper and lower surfaces of the cell 600 All are exposed, and the testing mechanism 400 is clamped toward the carrier 320 from the upper and lower sides.
  • the carrier 320 is connected to a plurality of suction cups 321 extending inward from the side.
  • the structure of the suction cup 321 is adopted. Since the carrier 320 rotates 360° with the four-station indexing plate 310, in order to prevent the vacuum suction tube connecting the suction cup 321 with the machine 100 Interference occurs.
  • the four-station indexing plate 310 is configured to include a DD motor 311 and a turntable 312. The carrier 320 is connected around the turntable 312.
  • the DD motor 311 has a large output torque to ensure The turntable 312 and the carrier 320 are driven to rotate.
  • the DD motor 311 has a tubular structure.
  • the vacuum pipe can pass through the center of the DD motor 311, so that when the carrier 320 rotates, the vacuum pipe connecting the suction cup 321 will not be connected to the machine table. 100 and other institutions interfere.
  • a pneumatic slip ring 330 is provided under the machine table 100.
  • the vacuum pipe passes through the DD motor 311 and the machine table 100 to connect the suction cup 321 and the pneumatic The slip ring 330 realizes the normal operation of the suction cup 321.
  • a drive rod 313 is further provided in the center of the DD motor 311.
  • One end of the drive rod 313 is connected to the rotor of the DD motor 311 through a limit disk 314.
  • the other end is connected with the pneumatic slip ring 330, the driving rod 313 is driven by the DD motor 311, and the driving rod 313 drives the pneumatic slip ring 330 to rotate synchronously.
  • the limit disk 314 is provided with a passage for the vacuum pipe to pass through.
  • the limiting slot 315 corresponds to the direction of the carrier 320, and the vacuum pipe can only pass through the limiting slot 315 to ensure the order of the vacuum pipe.
  • the carrier 320 includes an outer frame 322 and a bottom plate 323, and there is air flow between the outer frame 322 and the bottom plate 323
  • the suction port 324 of the air flow path is located at the end where the carrier 320 is connected to the turntable 312, the vacuum pipe is connected to the suction cup 321 through the air flow path, and a plurality of suction cups 321 pass through one suction port 324 performs air extraction, on the one hand, reducing the setting of the vacuum pipe, on the other hand, it will not interfere with the approach of the test component to the carrier 320.
  • the loader mechanism 200 includes a first linear module 210 arranged on the machine 100, and a first linear module 210 connected to the first linear module 210.
  • the loading suction cup 220 and the supporting assembly 230 located under the loading suction cup 220, the loading suction cup 220 sucks the cell 600 on the supporting assembly 230, and then places the cell 600 on the corresponding carrier through the transmission of the first linear module 210
  • the first linear module 210 is a three-axis linear module.
  • the loading suction cup 220 and the three-axis linear module are connected by a rotating motor 240, and a positioning camera 250 is also arranged above the supporting assembly 230.
  • the positioning camera 250 is used to pair the cell 600 placed on the supporting assembly 230. Perform positioning to determine whether it is in the correct position in X, Y, and ⁇ , so that when the cell 600 is moved to the carrier 320 when the cell 600 is sucked up, the cell 600 is oriented in the X, Y, Z directions and the angle ⁇
  • the adjustment, transfer and adjustment can be carried out at the same time, saving work beats.
  • the support assembly 230 is a conveyor belt assembly 231, and an end of the conveyor belt assembly 231 away from the four-station index plate 310 is provided with a receiving box 260 inclined downwards.
  • the feeding suction cup 220 does not move to suck the cell 600
  • the conveyor belt assembly 231 rotates away from the four-station index plate 310, and the cell 600 moves from the conveyor belt assembly
  • the end of 231 drops and is collected by the receiving box 260 to complete the preliminary screening.
  • the test mechanism 400 includes a front tester 410, a back tester 420, an upper probe row 430, a lower probe row 440, and probe movement.
  • the component 450, the front tester 410 and the back tester 420 include a test part 411 and an illuminating part 412, the front tester 410 and the upper probe row 430 are located above the carrier 320, and are illuminated by the front tester 410
  • the part 412 provides simulated sunlight to the front of the cell 600, and at the same time, the upper probe row 430 is used to test the upper surface of the cell 600.
  • the back tester 420 and the lower probe row 440 are located under the carrier 320 and pass through the back
  • the lighting part 412 of the tester 420 provides simulated sunlight on the back of the cell 600, and at the same time, the lower probe row 440 is used to test the lower surface of the cell 600.
  • the upper probe row 430 and the lower probe row 440 are both compatible with
  • the front tester 410 and the test part 411 of the back tester 420 are electrically connected.
  • the front tester 410 and the back tester 420 are both IV and EL test integrated machines, so both sides of the cell 600 can be tested simultaneously. Carry out IV and EL tests.
  • IV and EL tests can be carried out separately in two stations, and the two are arranged on the adjacent two sides of the four-station index plate 310, because the cell 600 is always located On the same carrier 320, even if they are tested separately, there is no need to carry the cell 600 multiple times, so as to ensure the quality of the cell 600.
  • the probe movement assembly 450 includes a drive motor 451 and a screw rod.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to the nut pair of the screw rod.
  • the screw rod in this embodiment is a unidirectional screw rod. 452.
  • Each screw rod is driven by a driving motor 451.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to a unidirectional screw rod 452.
  • the two probe rows move in opposite directions.
  • the upper probe row 430 and the lower probe row 440 respectively include a mounting frame 431 and a plurality of rows of probe groups 432. Two sides of the mounting frame 431 are provided with mounting grooves 433, and both ends of the probe group 432 pass through sliders. 434 is connected to the mounting slot 433, and the sliding block 434 can adjust the position in the mounting slot 433 to change the distance between the probe sets 432, so that the probe sets 432 can adapt to the battery slices 600 of different sizes.
  • FIG. 7 it is a schematic structural diagram of the second embodiment of the test mechanism 400 of the present invention. Since the space above the carrier 320 is not limited, the front tester 410 can be installed vertically, and the illuminating part of the front tester 410 faces from below. The cell 600 is illuminated, and the space under the carrier 320 is small, which cannot satisfy the vertical arrangement of the back tester 420. Therefore, the back tester 420 is arranged horizontally in this embodiment, and the illumination of the back tester 420 A reflector 421 is arranged between the part 412 and the carrier 320, and the light generated by the illumination part 412 of the back tester 420 is reflected to the back of the cell 600 through the reflector 421 to illuminate the back of the cell 600.
  • the screw rod is a bidirectional screw rod 453, and one drive motor 451 is provided.
  • the upper probe row 430 and the lower probe row 440 are respectively connected to the nut pairs at both ends of the bidirectional screw rod 453, so that the two probe rows can be Driven by the bidirectional screw rod 453, they move toward or relative to each other.
  • the blanking mechanism 500 includes a second linear module 510 and a blanking sucker 520 connected to the second linear module 510.
  • the second linear module 510 only needs to pick up the cell 600 that has been tested on the carrier 320 and send it out to the four-station indexing plate 310. Since the testing mechanism 400 in this embodiment only occupies one station, the unloading mechanism 500 and the upper The feeder mechanism 200 is on the same straight line, and the unloading suction cup 520 moves the cell 600 out of the carrier 320 and the loading suction cup 220 sends the cell 600 onto the carrier 320 at the same tempo.
  • the second linear module 510 is set as a linear slide 511, the slide 512 of the linear slide 511 is connected to the same direction linear module of the feeder mechanism 200 by a connecting rod 513, and the unloading suction cup 520 is connected to
  • the sliding seat 512 is fixedly connected, and the blanking suction cup 520 does not need to move in the up and down direction, because when the suction cup 321 on the carrier 320 sucks the cell 600, the cell 600 is close to the surface of the carrier 320, and the surface of the cell 600 and There is a certain distance between the blanking suction cups 520, which does not affect the carrier 320 to send the battery slice 600 under the blanking suction cup 520.
  • the blanking sucker 321 releases the battery slice 600, the battery slice 600 bounces up a certain distance Therefore, the unloading sucker 520 can easily suck the cell 600.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

L'invention concerne un élément de batterie IV et un équipement de test double face EL, comprenant une table de machine, un mécanisme de chargement de matériau, un mécanisme de transmission rotatif, un mécanisme de test et un mécanisme de déchargement de matériau ; le mécanisme de transmission rotatif est fixé sur la table de machine ; le mécanisme de transmission rotatif comprend une plaque d'indexage à quatre stations, et un outil de transport ; le mécanisme de chargement de matériau, le mécanisme de test et le mécanisme de déchargement de matériau sont agencés sur la table de machine ou sur le côté de la table de machine le long de la direction de rotation de la plaque d'indexage à quatre stations, respectivement ; il y a quatre outils de transport reliés vers l'extérieur à des intervalles uniformes le long de la plaque d'indexage à quatre stations ; l'outil de transport est entraîné par la plaque d'indexage à quatre stations pour correspondre au mécanisme de chargement de matériau, au mécanisme de test et au mécanisme de déchargement de matériau, respectivement ; l'outil de transport est une structure de cadre qui est creuse au milieu ; le mécanisme de test est serré dans la direction de l'outil de transport à partir des côtés supérieur et inférieur. La présente invention réalise un test sur les côtés avant et arrière d'un élément de batterie en même temps, et a une structure compacte, améliore l'efficacité d'utilisation de l'espace, et est rentable.
PCT/CN2019/101305 2019-07-26 2019-08-19 Élément de batterie iv et équipement de test double face el WO2021017044A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201910681960.1A CN110444491A (zh) 2019-07-26 2019-07-26 一种电池片iv、el双面测试设备
CN201910681960.1 2019-07-26

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WO2021017044A1 true WO2021017044A1 (fr) 2021-02-04

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204407295U (zh) * 2015-02-17 2015-06-17 秦皇岛博硕光电设备股份有限公司 Iv和el测试一体机
WO2018148927A1 (fr) * 2017-02-17 2018-08-23 Medtrum Technologies Inc. Pâte à papier destinée à des batteries souples et son procédé de préparation
CN208189564U (zh) * 2018-04-28 2018-12-04 罗博特科智能科技股份有限公司 一种电池片快速吸盘装置
CN109283417A (zh) * 2018-11-26 2019-01-29 深圳市诺峰光电设备有限公司 一种三工位dito全自动测试机及其测试工艺
CN109507606A (zh) * 2018-12-20 2019-03-22 苏州迈为科技股份有限公司 一种电池片电池效率检测设备
CN209071287U (zh) * 2018-09-27 2019-07-05 苏州迈为科技股份有限公司 一种多工位电池片效率检测装置
CN210120118U (zh) * 2019-07-26 2020-02-28 罗博特科智能科技股份有限公司 一种电池片iv、el双面测试设备

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JP4349488B2 (ja) * 2004-06-25 2009-10-21 三井金属鉱業株式会社 電子部品実装用フィルムキャリアテープの搬送装置
US9797944B2 (en) * 2014-11-10 2017-10-24 Boe Technology Group Co., Ltd. Test fixture and test method using the same
CN109119354B (zh) * 2015-10-30 2021-03-26 苏州迈为科技股份有限公司 一种太阳能电池片电池效率测试方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204407295U (zh) * 2015-02-17 2015-06-17 秦皇岛博硕光电设备股份有限公司 Iv和el测试一体机
WO2018148927A1 (fr) * 2017-02-17 2018-08-23 Medtrum Technologies Inc. Pâte à papier destinée à des batteries souples et son procédé de préparation
CN208189564U (zh) * 2018-04-28 2018-12-04 罗博特科智能科技股份有限公司 一种电池片快速吸盘装置
CN209071287U (zh) * 2018-09-27 2019-07-05 苏州迈为科技股份有限公司 一种多工位电池片效率检测装置
CN109283417A (zh) * 2018-11-26 2019-01-29 深圳市诺峰光电设备有限公司 一种三工位dito全自动测试机及其测试工艺
CN109507606A (zh) * 2018-12-20 2019-03-22 苏州迈为科技股份有限公司 一种电池片电池效率检测设备
CN210120118U (zh) * 2019-07-26 2020-02-28 罗博特科智能科技股份有限公司 一种电池片iv、el双面测试设备

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