WO2018142788A1 - リフトピン、該リフトピンを用いたエピタキシャル成長装置およびシリコンエピタキシャルウェーハの製造方法 - Google Patents
リフトピン、該リフトピンを用いたエピタキシャル成長装置およびシリコンエピタキシャルウェーハの製造方法 Download PDFInfo
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- WO2018142788A1 WO2018142788A1 PCT/JP2017/045443 JP2017045443W WO2018142788A1 WO 2018142788 A1 WO2018142788 A1 WO 2018142788A1 JP 2017045443 W JP2017045443 W JP 2017045443W WO 2018142788 A1 WO2018142788 A1 WO 2018142788A1
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- lift pin
- carbon
- susceptor
- silicon wafer
- head
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/06—Epitaxial-layer growth by reactive sputtering
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/12—Substrate holders or susceptors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02293—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process formation of epitaxial layers by a deposition process
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
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- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Definitions
- the present invention relates to a lift pin, an epitaxial growth apparatus using the lift pin, and a method for manufacturing a silicon epitaxial wafer.
- single crystal silicon is grown by the Czochralski method (CZ method), etc., the silicon single crystal is cut into blocks, and then sliced thinly, and then surface grinding (lapping), etching, and mirror polishing. (Polishing) It is obtained by final cleaning after the process. After that, various quality inspections are performed and if no abnormality is confirmed, the product is shipped as a product.
- CZ method Czochralski method
- a single crystal silicon thin film is vapor-phase grown (epitaxially grown) on a silicon wafer. Manufacturing.
- the epitaxial growth apparatus 1 For manufacturing a silicon epitaxial wafer, for example, a single wafer epitaxial growth apparatus is used.
- a general single wafer epitaxial growth apparatus will be described with reference to FIG.
- the epitaxial growth apparatus 1 has an epitaxial film forming chamber 2 surrounded by an upper dome 11, a lower dome 12, and a dome mounting body 13.
- the epitaxial film forming chamber 2 is provided with a gas supply port 31 and a gas discharge port 32 for supplying and discharging a reactive gas at positions opposite to the side surfaces thereof.
- a susceptor 4 on which the silicon wafer W is placed is disposed in the epitaxial film forming chamber 2.
- the susceptor 4 is supported by a susceptor support shaft 41 connected to the susceptor rotating portion 40 at the outer periphery of the lower surface thereof, and rotates together with the susceptor support shaft 41. Further, the susceptor 4 is formed with a through hole 42 through which lift pins 5 for moving the silicon wafer W up and down are passed. The lift pin 5 is lifted and lowered with its base end supported by the lift shaft 6.
- the lift pin 5 has a head portion 52 that contacts the silicon wafer W and a straight body portion 51 that is inserted into the through hole 42 of the susceptor 4.
- the silicon wafer W introduced into the epitaxial film forming chamber 2 moves the lift pins 5 inserted through the through holes 42 of the susceptor 4 toward the upper side of the susceptor 4, and the head 50 of the lift pins 5 is moved as shown in FIG.
- the silicon wafer W is brought into contact with the back surface of the silicon wafer W and is temporarily supported by the lift pins 5.
- the upward movement of the lift pin 5 is performed through the upward movement of the elevating shaft 6 that supports the base end of the lift pin 5.
- the susceptor support shaft 41 that supports the susceptor 4 is raised to move the susceptor 4 to the position of the silicon wafer W, and the silicon wafer W is placed on the susceptor 4.
- the head 52 of the lift pin 5 is accommodated in the through hole 42 of the susceptor 4.
- the silicon wafer W is placed on the susceptor 4.
- the silicon wafer W is heated to a temperature of 1000 ° C. or higher by a plurality of heating lamps 14 disposed above and below the susceptor 4, while a reactive gas is supplied into the epitaxial film forming chamber 2 to obtain a predetermined thickness.
- the epitaxial film is grown to produce a silicon epitaxial wafer.
- the susceptor 4 is lowered by the lowering of the support shaft 41. This lowering is performed until the lift pins 5 are supported by the lift shaft 6 and protrude from the susceptor 4, and the silicon wafer W is supported by the lift pins 5. Then, a transfer blade (not shown) is introduced into the epitaxial film forming chamber 2, the lift pin 5 is lowered and the silicon wafer W is placed on the transfer blade, whereby the silicon wafer W is transferred from the lift pin 5 to the transfer blade. Thereafter, the silicon wafer W is withdrawn from the growth apparatus 1 together with the transfer blade.
- the silicon wafer W is abutted and supported by the lift pins 5.
- Patent Document 1 proposes a lift pin having a sheath (sheath) portion formed of SiC and a glassy carbon head fitted in the sheath portion.
- the surface of the lift pin that contacts the silicon wafer is made of a material having a hardness lower than that of the silicon wafer. Therefore, with this lift pin, it is considered that wrinkles can be prevented from occurring at a position where the head and the silicon wafer are in contact with each other. Further, in this lift pin, since the sheath portion and at least the surface of the susceptor 4 are formed of SiC, which is the same material, the straight body portion of the lift pin and the wall surface around the through hole 42 when the lift pin is moved up and down It is thought that dust generation due to sliding can be prevented.
- Patent Document 1 in order to fit the head portion into the sheath portion, the inset portion is cracked due to a difference in thermal expansion due to different materials of the head portion and the sheath portion due to high heat treatment during the epitaxial growth process. There is a concern that it cannot be used.
- this inventor replaces the fitting of the head which consists of glassy carbon to a hollow sheath part as described in patent document 1, and consists of glassy carbon on the top part of the lift pin which consists of a SiC base material.
- the carbon-based coating material was peeled off.
- an object of the present invention is to provide a lift pin for an epitaxial growth apparatus that can prevent the carbon-based coating material from peeling off.
- the present inventor diligently studied a way to solve the above-mentioned problems, and assumed that the cause of peeling with the prototype lift pin is that the adhesion between the carbon-based coating material and the SiC base material is insufficient. . Since the SiC base material has a dense SiC structure, the carbon-based coating material coated on the SiC base material has a simple laminated structure, and it is considered that separation occurs during epitaxial growth due to a difference in thermal expansion. Accordingly, the idea of using a porous body instead of the SiC base material as the base material of the lift pin was conceived, and such a lift pin was found to be effective for any of the above-mentioned problems and to complete the present invention. Arrived.
- the gist configuration of the present invention is as follows. (1) A lift pin that is inserted in a through hole of a susceptor installed in the epitaxial growth apparatus so as to be movable in the penetration direction, and moves the silicon wafer forward and backward with respect to the susceptor while supporting the silicon wafer placed on the susceptor. There, A straight body inserted into the through hole; A head abutting against the silicon wafer; A covering portion that covers at least the top of the head, The straight body part and the head part are made of a porous body, The covering portion is made of a carbon-based covering material, The lift pin, wherein the covering portion fills at least a part of the void of the porous body in the head.
- the term “contact” as used in the present specification means that when epitaxial growth is performed, the head of the lift pin passes through a covering portion having a surface layer thickness of 1 ⁇ m to 100 ⁇ m that is sufficiently smaller than the thickness of the head. It means that it is “connected with touching” or “attached” to the back of the screen.
- the surface layer thickness is the thickness from the outermost surface on the head side of the lift pin (exposed surface of the covering portion) to the surface on the contact side of the head in the central axis of the lift pin.
- An epitaxial growth apparatus comprising the lift pin according to any one of (1) to (5).
- a method for producing a silicon epitaxial wafer comprising growing an epitaxial film on a silicon wafer using the epitaxial growth apparatus according to (6).
- FIG. 4 is a cross-sectional view showing a lift pin 500 according to the present embodiment.
- the lift pin 500 is inserted in the through hole 42 of the susceptor 4 installed in the above-described epitaxial growth apparatus 1 with reference to FIG. 1 so as to be movable in the penetration direction, and supports the silicon wafer W placed on the susceptor 4.
- the silicon wafer W is moved forward and backward with respect to the susceptor 4. That is, the lift pin 500 according to the present embodiment can be used in place of the lift pin 5 inserted through the through hole 42 of the susceptor 4 of the epitaxial growth apparatus 1 according to the prior art shown in FIG.
- the lift pin 500 has a straight body portion 510 inserted into the through hole 42, a head portion 520 that contacts the silicon wafer W, and a covering portion 550 that covers at least the top portion of the head portion 520. Accordingly, the interface between the lift pin 500 and the silicon wafer W is the exposed surface 550A of the covering portion 550 (the outermost surface of the lift pin 500).
- the straight body portion 510 can have a rod shape, and the head portion 520 can have a larger diameter than the straight body portion 510 and the through hole 40.
- the lift pin 500 according to the present embodiment need not be limited in shape as long as it has a head that supports the silicon wafer at the tip of the rod-like straight body, and is therefore limited to the shape shown in the drawing. is not.
- the lift pin 500 may have an appropriate shape.
- the straight body portion 510 and the head portion 520 are made of a porous body, and the covering portion 550 is made of a carbon-based covering material.
- the covering portion 550 fills at least a part of the void of the porous body in the head portion 520.
- the thickness D of the covering portion 550 is defined by the total thickness (D1 + D2) of the surface layer thickness D1 and the deep portion thickness D2. .
- the surface layer thickness D1 is from the exposed surface 550A of the covering portion 550 in the central axis of the lift pin 500 (which is the outermost surface of the lift pin 500 and is a portion that directly contacts the back surface of the silicon wafer during epitaxial growth). It is the thickness up to the surface 520A on the contact side of the head 520. Further, the deep portion thickness D2 is a thickness of a portion filling the surface layer portion of the covering portion 550 from the surface 520A on the contact side of the head portion 520 in the central axis of the lift pin 500.
- the lift pin 500 according to the present embodiment has the above-described filling structure, it is possible to ensure adhesion between the covering portion 550 made of a carbon-based covering material and the head portion 520 made of a porous body. Therefore, even when the lift pins 500 are used in the epitaxial growth apparatus 1, the carbon-based coating material can be prevented from being peeled off.
- the surface layer thickness D1 of the covering portion 550 is normally 1 ⁇ m to 100 ⁇ m, which is sufficiently smaller than the thickness of the head portion 520 of the lift pin 500.
- the depth D2 of the covering portion 550 made of the carbon-based covering material filling the voids of the porous body is preferably 50 ⁇ m or more, and more preferably 100 ⁇ m or more. This is because the cover portion 550 has a structure that does not easily peel off due to the anchor effect. Further, all of the voids of the porous body of the head 520 may be filled with the covering portion 550.
- the total thickness D of the covering portion 550 is preferably 100 ⁇ m or more, and is preferably 300 ⁇ m or less in consideration of the manufacturing efficiency of the lift pins 500.
- the interface between the lift pin 500 and the silicon wafer W is the exposed surface 550A of the covering portion 550, and the carbon-based coating material comes into contact with the silicon wafer W.
- the carbon-based coating material is preferably a material having a hardness lower than that of the silicon wafer W. By doing so, it is possible to more reliably avoid wrinkling of the back surface of the silicon wafer by the lift pins 500.
- a carbon-based coating material glassy carbon or pyrolytic carbon is preferably used. These carbon-based coating materials have heat resistance to withstand use in an epitaxial growth apparatus (maximum temperature of about 1200 ° C.), and also have resistance to HCl used as an etching gas.
- these carbon-based coating materials are also advantageous in that they do not contain elements that form active levels in the silicon epitaxial wafer. Furthermore, the use of these carbon-based coating materials is advantageous in that it is easy to obtain thermal uniformity within the silicon wafer surface during the formation of the epitaxial film.
- the porous body constituting the straight body portion 510 and the head portion 520 is preferably made of porous SiC or a porous carbon material. If porous SiC is used, the portion where the lift pin 500 is in contact with the wall surface around the through hole 42 of the susceptor 4 is made of SiC of the same material, which is preferable in terms of more reliably suppressing dust generation due to the sliding of both.
- the porous carbon material is preferable in that the covering portion 550 is easily filled with at least a part of the voids of the porous body and is less likely to be peeled off.
- the structure including the straight body portion 510 and the head portion 520 can be obtained by a general method.
- the porous SiC constitutes a structure made up of the straight body portion 510 and the head portion 520
- the structure can be produced by dispersing pores in a SiC sintered body sintered at normal pressure.
- a covering portion 550 made of a carbon-based covering material is formed on the top portion of the head portion 520.
- a thermosetting resin such as phenol resin and COPNA resin
- a covering portion 550 made of glassy carbon can be formed by heat treatment at 700 to 2600 ° C. in an inert gas atmosphere such as argon.
- the covering portion 550 thus formed fills the voids of the porous body in the head portion 520 because the glassy carbon infiltrates the inside of the head portion 520.
- the depth D2 of the covering portion 550 is derived from infiltration.
- the coating portion 550 made of glassy carbon can be formed as follows. That is, a thermosetting resin such as a phenol resin that is a raw material for glassy carbon is subjected to impregnation treatment or coating treatment, or both impregnation treatment and coating treatment, partially or entirely on the head 520, and carbon Also, the covering portion 550 made of glassy carbon can be formed.
- a thermosetting resin such as a phenol resin that is a raw material for glassy carbon is subjected to impregnation treatment or coating treatment, or both impregnation treatment and coating treatment, partially or entirely on the head 520, and carbon
- the covering portion 550 made of glassy carbon can be formed.
- a furan resin, a polycarbodiimide resin, a furfural-phenol copolymer, a divinylbenzene resin, a COPNA resin, or the like can be used as the thermosetting resin.
- the depth D2 of the covering portion 550 is derived from impregnation.
- pyrolytic carbon when used as the carbon-based coating material, a hydrocarbon material is sprayed or applied to the top of the head 520 or partially over the head, and is formed by a thermal CVD method or the like at 800 ° C. or higher. A film may be used.
- the covering portion 550 thus formed fills the voids of the porous body in the head portion 520 because pyrolytic carbon also enters the inside of the head portion 520. In this case, the depth D2 of the covering portion 550 is derived from infiltration.
- Pyrolytic carbon is high purity and high crystallinity carbon obtained by pyrolyzing hydrocarbon compounds having about 1 to 8 carbon atoms. Pyrocurve (manufactured by Ibiden Co., Ltd.) is used as pyrolytic carbon. And pyrographs (Toyo Tanso Co., Ltd.) are known.
- the method of manufacturing the covering portion 550 of the lift pin 500 according to the present embodiment is not limited to the specific example described above.
- the straight body 510 is covered with the SiC coating material 530.
- the SiC coating material 530 can be formed by a chemical vapor deposition method (CVD method).
- CVD method chemical vapor deposition method
- the coating thickness by the SiC coating material 530 to the straight body part 510 shall be 40 micrometers or more, and it is more preferable to set it as 60 micrometers or more.
- the porosity of the porous body used in the present embodiment is preferably 15% or more and 85% or less, and more preferably 35% or more and 85% or less. In order to obtain the above-described effect more reliably, it is particularly preferable to set the ratio to 15% or more and 60% or less.
- the “porosity” in the present specification is the volume of the voids in the porous body in the total volume of the porous body, assuming that the voids in the porous body are not filled with the carbon-based coating material. A percentage.
- coated part 550 has coat
- the carbon-based coating material of the covering portion 550 may fill all the voids inside the head portion 520.
- the SiC coating material 530 covers the straight body portion 510, but the side coating surface and the lower surface of the head portion 520, that is, the surfaces other than those covered with the coating portion 550 May be provided.
- the epitaxial growth apparatus includes the lift pin 500 described above.
- the structure of the epitaxial growth apparatus other than the lift pins 500 the same structure as the general epitaxial growth apparatus 1 described above with reference to FIG. 1 can be used.
- an epitaxial film is grown on the silicon wafer using the epitaxial growth apparatus having the lift pins 500. By this manufacturing method, peeling of the carbon-based coating material can be prevented.
- a lift pin 500 shown in FIG. 4 was produced.
- the porosity of porous SiC was set to 40%.
- a head portion 520 of the lift pin 500 was impregnated with a phenol resin and carbonized to form a covering portion made of glassy carbon.
- the thickness from the outermost surface of the lift pin 500 (exposed surface 550A of the covering portion 550) to the surface 520A of the head portion 520, ie, the surface layer thickness D1 was about 40 ⁇ m.
- coated part 550 from the surface 520A of the contact side of the head 520 was 100 micrometers.
- each thickness is a measured value of each average thickness after carrying out the epitaxial growth process of 50 sheets, having measured the lift pin cross-sectionally after this test and using a microscope and SEM.
- Invention Example 2 Invention Example 1, a coating portion made of glassy carbon was formed. Instead, pyrolytic carbon was used as a carbon-based coating material. Other conditions were the same as in Invention Example 2, and a lift pin according to Invention Example 2 was produced.
- Comparative Example 1 A lift pin 5 shown in FIG. 3 was prepared.
- the straight body portion 51 and the head portion 52 of the lift pin 5 are made of dense (not porous) SiC.
- the surface of the head 52 was coated with glassy carbon to produce a lift pin according to Comparative Example 1.
- the lift pins according to Invention Examples 1 and 2 and Comparative Examples 1 to 3 were applied to the epitaxial growth apparatus 1 shown in FIG. 1, and a silicon epitaxial wafer was manufactured according to the following procedure.
- the susceptor 4 used was a carbon substrate whose surface was SiC coated.
- As a substrate for the silicon epitaxial wafer a boron-doped silicon wafer W having a diameter of 300 mm was used.
- trichlorosilane gas as a source gas was supplied at a temperature of 1150 ° C., and the surface of the susceptor 4 was coated with silicon.
- the silicon wafer W was introduced into the epitaxial film forming chamber 2 and placed on the susceptor 4 using lift pins.
- hydrogen gas was supplied at 1150 ° C. to perform hydrogen baking, and then an epitaxial silicon film was grown at 1150 ° C. by 4 ⁇ m to obtain an epitaxial silicon wafer.
- trichlorosilane gas was used as the source gas
- diborane gas was used as the dopant gas
- hydrogen gas was used as the carrier gas.
- the evaluation criteria were as follows. ⁇ : 0.2 pieces / wafer or less ⁇ : 0.2 pieces / wafer or less to 0.5 pieces / wafer or less ⁇ : 0.5 pieces / wafer or less
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Abstract
Description
(1)エピタキシャル成長装置内に設置するサセプタの貫通孔内を該貫通方向に移動可能に挿通され、前記サセプタに載置するシリコンウェーハを支持しながら該シリコンウェーハを前記サセプタに対して進退させるリフトピンであって、
前記貫通孔内に挿通される直胴部と、
前記シリコンウェーハに当接する頭部と、
前記頭部の頂部を少なくとも被覆する被覆部と、を有し、
前記直胴部および前記頭部は、多孔質体からなり、
前記被覆部は炭素系被覆材からなり、
前記被覆部が、前記頭部における前記多孔質体の空隙の少なくとも一部を充填していることを特徴とするリフトピン。
図4に示すリフトピン500を作製した。リフトピン500の作製にあたり、多孔質SiCの気孔率を40%とした。リフトピン500の頭部520をフェノール樹脂で含浸し、炭素化して、ガラス状カーボンからなる被覆部を形成した。リフトピン500の最表面(被覆部550の露出面550A)から頭部520の表面520Aまでの厚み、すなわち表層厚みD1は約40μmであった。また、頭部520の当接側の表面520Aから、被覆部550の表層部を充填する部分の厚み(すなわち、深部厚みD2)は、100μmであった。さらに、直胴部510の周面を、CVD法を用いて1250℃にてSiCコート材で被覆した。なお、各厚みは本試験後にリフトピンを断面破断して顕微鏡、SEMを用いて測定したものであり、50枚エピタキシャル成長処理した後の、各平均厚みの測定値である。
発明例1ではガラス状カーボンからなる被覆部を形成していたところ、これに替えて熱分解炭素を炭素系被覆材とした。その他の条件は発明例2と同様にして発明例2に係るリフトピンを作製した。
図3に示す、リフトピン5を用意した。リフトピン5の直胴部51および頭部52は、緻密な(多孔質でない)SiCからなる。この頭部52の表面に、ガラス状カーボンをコーティングし、比較例1に係るリフトピンを作製した。
図3に示す、SiCのみからなるリフトピン5を用意し、比較例2に係るリフトピンとした。
図3に示す、ガラス状カーボンのみからなるリフトピン5を用意し、比較例3に係るリフトピンとした。
得られたエピタキシャルウェーハについて、0.25μmLPD発生密度を測定した。すなわち、作製したエピタキシャルウェーハについて、ウェーハ表面検査装置(ケーエルエーテンコール社製、SP-2)を用いて、エピタキシャル膜表面で観察されるサイズ0.25μm以上の表面欠陥(LPD:Light Point Defect)の個数を評価した。この測定結果によって、発塵によるパーティクルの発生状況を評価することができる。
評価基準は下記のとおりとした。
○:0.2個/wafer以下
△:0.2個/wafer超~0.5個/wafer以下
×:0.5個/wafer超
得られたエピタキシャルウェーハについて、リフトピン当接部のピンマーク強度として、ウェーハ表面検査装置(ケーエルエーテンコール社製、SP-2)を用いて、リフトピン接触領域における、レーザー反射の設定値以上の散乱強度を有する領域の面積を測定し、ウェーハ裏面のリフトピン起因の疵付きを評価した。
評価基準は下記のとおりとした。
◎:0.5mm2以下
○:0.5mm2超~1mm2以下
△:1mm2超~2mm2以下
×:2mm2超
2 エピタキシャル膜形成室
4 サセプタ
5 リフトピン
6 昇降シャフト
W シリコンウェーハ
11 上部ドーム
12 下部ドーム
13 ドーム取付体
40 サセプタ回転部
41 サセプタサポートシャフト
42 貫通孔
500 リフトピン
510 直胴部
520 頭部
530 SiCコート材
550 被覆部
Claims (7)
- エピタキシャル成長装置内に設置するサセプタの貫通孔内を該貫通方向に移動可能に挿通され、前記サセプタに載置するシリコンウェーハを支持しながら該シリコンウェーハを前記サセプタに対して進退させるリフトピンであって、
前記貫通孔内に挿通される直胴部と、
前記シリコンウェーハに当接する頭部と、
前記頭部の頂部を少なくとも被覆する被覆部と、を有し、
前記直胴部および前記頭部は、多孔質体からなり、
前記被覆部は炭素系被覆材からなり、
前記被覆部が、前記頭部における前記多孔質体の空隙の少なくとも一部を充填していることを特徴とするリフトピン。 - 前記多孔質体は多孔質SiCまたは多孔質炭素材からなる、請求項1に記載のリフトピン。
- 前記直胴部がSiCコート材により被覆される、請求項1または2に記載のリフトピン。
- 前記多孔質体の気孔率が、15%以上85%以下である、請求項1~3のいずれか1項に記載のリフトピン。
- 前記被覆部の前記炭素系被覆材がガラス状カーボンまたは熱分解炭素からなる、請求項1~4のいずれか1項に記載のリフトピン。
- 請求項1~5のいずれか1項に記載のリフトピンを有することを特徴とする、エピタキシャル成長装置。
- 請求項6に記載のエピタキシャル成長装置を用いて、シリコンウェーハ上にエピタキシャル膜を成長させることを特徴とする、シリコンエピタキシャルウェーハの製造方法。
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US16/476,151 US11264265B2 (en) | 2017-02-02 | 2017-12-19 | Lift pin, and epitaxial growth apparatus and method of producing silicon epitaxial wafer using the lift pin |
JP2018565980A JP6766893B2 (ja) | 2017-02-02 | 2017-12-19 | リフトピン、該リフトピンを用いたエピタキシャル成長装置およびシリコンエピタキシャルウェーハの製造方法 |
DE112017006987.4T DE112017006987B4 (de) | 2017-02-02 | 2017-12-19 | Hebestift, Epitaxiewachstumsvorrichtung und Verfahren zur Herstellung von Siliziumepitaxiewafern unter Verwendung des Hebestiftes |
CN201780085199.4A CN110506321B (zh) | 2017-02-02 | 2017-12-19 | 顶升销、使用该顶升销的外延生长装置以及硅外延晶片的制造方法 |
KR1020197019694A KR102262311B1 (ko) | 2017-02-02 | 2017-12-19 | 리프트 핀, 당해 리프트 핀을 이용한 에피택셜 성장 장치 및 실리콘 에피택셜 웨이퍼의 제조 방법 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2022162928A1 (ja) * | 2021-02-01 | 2022-08-04 | ||
WO2024158639A1 (en) * | 2023-01-26 | 2024-08-02 | Applied Materials, Inc. | Cell architectural structures for enhanced thermal management in epitaxial growth processing chamber |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11961756B2 (en) | 2019-01-17 | 2024-04-16 | Asm Ip Holding B.V. | Vented susceptor |
USD920936S1 (en) | 2019-01-17 | 2021-06-01 | Asm Ip Holding B.V. | Higher temperature vented susceptor |
US11404302B2 (en) | 2019-05-22 | 2022-08-02 | Asm Ip Holding B.V. | Substrate susceptor using edge purging |
US11764101B2 (en) | 2019-10-24 | 2023-09-19 | ASM IP Holding, B.V. | Susceptor for semiconductor substrate processing |
USD1031676S1 (en) | 2020-12-04 | 2024-06-18 | Asm Ip Holding B.V. | Combined susceptor, support, and lift system |
US20240038575A1 (en) * | 2022-07-27 | 2024-02-01 | Applied Materials, Inc. | Thickness uniformity improvement kit for thermally sensitive epitaxial processing |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11329977A (ja) * | 1998-05-18 | 1999-11-30 | Matsushita Electric Ind Co Ltd | 真空処理装置 |
JP2000026192A (ja) * | 1998-04-28 | 2000-01-25 | Shin Etsu Handotai Co Ltd | 薄膜成長装置 |
JP2004356124A (ja) * | 2003-05-27 | 2004-12-16 | Sumitomo Electric Ind Ltd | 多孔質セラミックスを用いた半導体製造装置用部品及び半導体製造装置 |
JP2016092130A (ja) * | 2014-10-31 | 2016-05-23 | 株式会社Sumco | リフトピン、該リフトピンを用いたエピタキシャル成長装置およびエピタキシャルウェーハの製造方法 |
JP2016092129A (ja) * | 2014-10-31 | 2016-05-23 | 株式会社Sumco | リフトピン、該リフトピンを用いたエピタキシャル成長装置およびエピタキシャルウェーハの製造方法 |
JP2016225445A (ja) * | 2015-05-29 | 2016-12-28 | 株式会社Sumco | エピタキシャル成長装置、エピタキシャルウェーハの製造方法およびエピタキシャル成長装置用リフトピン |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6596086B1 (en) | 1998-04-28 | 2003-07-22 | Shin-Etsu Handotai Co., Ltd. | Apparatus for thin film growth |
JP4402763B2 (ja) * | 1999-05-13 | 2010-01-20 | Sumco Techxiv株式会社 | エピタキシャルウェーハ製造装置 |
JP3931578B2 (ja) * | 2001-03-30 | 2007-06-20 | 信越半導体株式会社 | 気相成長装置 |
JP3672300B2 (ja) | 2001-10-30 | 2005-07-20 | アプライド マテリアルズ インコーポレイテッド | 薄膜成長装置用のリフトピン、その形成方法およびリフトピン頭部 |
US20030178145A1 (en) * | 2002-03-25 | 2003-09-25 | Applied Materials, Inc. | Closed hole edge lift pin and susceptor for wafer process chambers |
US7754609B1 (en) * | 2003-10-28 | 2010-07-13 | Applied Materials, Inc. | Cleaning processes for silicon carbide materials |
JP2005311108A (ja) * | 2004-04-22 | 2005-11-04 | Shin Etsu Handotai Co Ltd | 気相成長装置 |
NL1034780C2 (nl) | 2007-11-30 | 2009-06-03 | Xycarb Ceramics B V | Inrichting voor het laagsgewijs laten neerslaan van verschillende materialen op een halfgeleider-substraat alsmede een hefpin voor toepassing in een dergelijke inrichting. |
JP5412759B2 (ja) * | 2008-07-31 | 2014-02-12 | 株式会社Sumco | エピタキシャルウェーハの保持具及びそのウェーハの製造方法 |
JP6424726B2 (ja) | 2015-04-27 | 2018-11-21 | 株式会社Sumco | サセプタ及びエピタキシャル成長装置 |
TWI615917B (zh) | 2015-04-27 | 2018-02-21 | Sumco股份有限公司 | 承托器及磊晶生長裝置 |
JP6435992B2 (ja) | 2015-05-29 | 2018-12-12 | 株式会社Sumco | エピタキシャル成長装置、エピタキシャルウェーハの製造方法およびエピタキシャル成長装置用リフトピン |
-
2017
- 2017-12-19 CN CN201780085199.4A patent/CN110506321B/zh active Active
- 2017-12-19 KR KR1020197019694A patent/KR102262311B1/ko active IP Right Grant
- 2017-12-19 WO PCT/JP2017/045443 patent/WO2018142788A1/ja active Application Filing
- 2017-12-19 JP JP2018565980A patent/JP6766893B2/ja active Active
- 2017-12-19 US US16/476,151 patent/US11264265B2/en active Active
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-
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- 2018-01-16 TW TW107101537A patent/TWI669408B/zh active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000026192A (ja) * | 1998-04-28 | 2000-01-25 | Shin Etsu Handotai Co Ltd | 薄膜成長装置 |
JPH11329977A (ja) * | 1998-05-18 | 1999-11-30 | Matsushita Electric Ind Co Ltd | 真空処理装置 |
JP2004356124A (ja) * | 2003-05-27 | 2004-12-16 | Sumitomo Electric Ind Ltd | 多孔質セラミックスを用いた半導体製造装置用部品及び半導体製造装置 |
JP2016092130A (ja) * | 2014-10-31 | 2016-05-23 | 株式会社Sumco | リフトピン、該リフトピンを用いたエピタキシャル成長装置およびエピタキシャルウェーハの製造方法 |
JP2016092129A (ja) * | 2014-10-31 | 2016-05-23 | 株式会社Sumco | リフトピン、該リフトピンを用いたエピタキシャル成長装置およびエピタキシャルウェーハの製造方法 |
JP2016225445A (ja) * | 2015-05-29 | 2016-12-28 | 株式会社Sumco | エピタキシャル成長装置、エピタキシャルウェーハの製造方法およびエピタキシャル成長装置用リフトピン |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2022162928A1 (ja) * | 2021-02-01 | 2022-08-04 | ||
JP7333675B2 (ja) | 2021-02-01 | 2023-08-25 | 株式会社 天谷製作所 | リフトピン、半導体製造装置およびリフトピン製造方法 |
WO2024158639A1 (en) * | 2023-01-26 | 2024-08-02 | Applied Materials, Inc. | Cell architectural structures for enhanced thermal management in epitaxial growth processing chamber |
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