WO2011021825A3 - Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사장치 및 검사방법 - Google Patents

Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사장치 및 검사방법 Download PDF

Info

Publication number
WO2011021825A3
WO2011021825A3 PCT/KR2010/005409 KR2010005409W WO2011021825A3 WO 2011021825 A3 WO2011021825 A3 WO 2011021825A3 KR 2010005409 W KR2010005409 W KR 2010005409W WO 2011021825 A3 WO2011021825 A3 WO 2011021825A3
Authority
WO
WIPO (PCT)
Prior art keywords
unit
ctsp
resonant
touch screen
capacitive touch
Prior art date
Application number
PCT/KR2010/005409
Other languages
English (en)
French (fr)
Other versions
WO2011021825A2 (ko
Inventor
고재준
김영권
Original Assignee
주식회사 에프티랩
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 에프티랩 filed Critical 주식회사 에프티랩
Priority to CN201080001521.9A priority Critical patent/CN102187319B/zh
Priority to JP2011527759A priority patent/JP5403640B2/ja
Publication of WO2011021825A2 publication Critical patent/WO2011021825A2/ko
Publication of WO2011021825A3 publication Critical patent/WO2011021825A3/ko

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
    • G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
    • G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Position Input By Displaying (AREA)

Abstract

본 발명은 정전용량방식 터치스크린패널(capacitive touch screen panel : CTSP)의 불량여부 검사에 있어서 ITO 패턴의 형태에 무관하게 그리고 CTSP 전용 컨트롤러 칩 없이도 CTSP의 불량을 판별하는 검사장치 및 검사방법에 관한 것이다. 본 발명에 따른 검사장치는 CTSP의 ITO 센서 전극 간의 정전용량과 결합하여 전기적 공진을 일으키는 LC공진회로를 포함한 LC 공진부, 상기 LC 공진부와 연속되어 상기 LC 공진부의 LC 공진회로를 발진하며, 공진주파수의 파형을 구형파로 변환하는 OP 앰프 구동부, 상기 LC 공진부와 연속되어 상기 LC 공진회로와 상기 CTSP의 ITO 센서 전극을 대칭되게 병렬 연결하는 릴레이부, 상기 OP 앰프 구동부와 연속되어 상기 릴레이부를 구동하고, 상기 OP 앰프 구동부로부터 출력되는 상기 구형파를 카운팅하여 주파수를 측정하고 CTSP의 불량여부를 판단하는 마이컴부를 포함하는 것을 특징으로 한다.
PCT/KR2010/005409 2009-08-17 2010-08-17 Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사장치 및 검사방법 WO2011021825A2 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201080001521.9A CN102187319B (zh) 2009-08-17 2010-08-17 利用lc共振频率变化检测电容式触摸屏面板的装置及方法
JP2011527759A JP5403640B2 (ja) 2009-08-17 2010-08-17 Ｌｃ共振周波数シフトを用いた静電容量方式タッチスクリーンパネルの検査装置および検査方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2009-0075525 2009-08-17
KR1020090075525A KR100971220B1 (ko) 2009-08-17 2009-08-17 Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사방법

Publications (2)

Publication Number Publication Date
WO2011021825A2 WO2011021825A2 (ko) 2011-02-24
WO2011021825A3 true WO2011021825A3 (ko) 2011-05-26

Family

ID=42645805

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/005409 WO2011021825A2 (ko) 2009-08-17 2010-08-17 Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사장치 및 검사방법

Country Status (5)

Country Link
JP (1) JP5403640B2 (ko)
KR (1) KR100971220B1 (ko)
CN (1) CN102187319B (ko)
TW (1) TWI431293B (ko)
WO (1) WO2011021825A2 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2606938C2 (ru) * 2012-05-30 2017-01-10 3М Инновейтив Пропертиз Компани Устройство для тестирования электродов

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101192956B1 (ko) 2010-11-05 2012-10-19 (주)디지엔티 정전식 터치스크린 패널 성능 테스트 시스템 및 방법, 정전식 터치스크린 패널 성능 테스트 장치, 정전식 터치스크린 패널 제조방법 및 기록매체
KR101150624B1 (ko) * 2010-12-06 2012-05-30 주식회사 에프티랩 공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 전기적 특성 검사장치
KR101267259B1 (ko) 2011-11-08 2013-05-24 (주)펨트론 Ｐｌｌ을 이용한 정전식 터치스크린 패널 검사 장치 및 방법
KR101279737B1 (ko) * 2012-03-29 2013-06-27 주식회사 에프티랩 스위칭부재를 이용한 정전용량방식 터치스크린패널 검사장치 및 검사방법
KR101386118B1 (ko) * 2012-04-09 2014-04-22 (주) 루켄테크놀러지스 터치 스크린 패널의 검사방법 및 검사장치
CN102636718B (zh) * 2012-05-10 2014-08-20 意力(广州)电子科技有限公司 互电容触摸屏检测方法
US9410907B2 (en) 2013-12-19 2016-08-09 Clarus Vision, Inc. Methods and apparatuses for testing capacitive touch screen films
KR20160025440A (ko) * 2014-08-27 2016-03-08 삼성전자주식회사 터치 패널 및 이를 구비한 좌표 측정 시스템
EP2998834B1 (en) 2014-08-27 2020-01-22 Samsung Electronics Co., Ltd. Touch panel
CN105467259B (zh) * 2015-11-16 2018-06-29 上海天马微电子有限公司 检测电容感测线路的检测电路、电容式触摸屏和检测方法
CN106155447A (zh) * 2016-07-14 2016-11-23 深圳市唯酷光电有限公司 电容屏及液晶手写装置
JP6992045B2 (ja) * 2016-07-22 2022-01-13 ハーマン インターナショナル インダストリーズ インコーポレイテッド 触覚誘導システム
CN107037352B (zh) * 2017-04-06 2020-01-17 芯海科技（深圳）股份有限公司 一种电容式触控按键芯片检测标定***及方法
CN107462273B (zh) * 2017-07-17 2020-05-12 江苏邦融微电子有限公司 一种电容式传感器模组的量产测试装置及其方法
US11474135B2 (en) * 2019-04-03 2022-10-18 Cirrus Logic, Inc. Auto-centering of sensor frequency of a resonant sensor

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH077038B2 (ja) * 1986-05-19 1995-01-30 株式会社リードエレクトロニクス プリント基板検査装置
KR20040029194A (ko) * 2002-09-25 2004-04-06 마이크로 인스펙션 주식회사 Ｐｄｐ 패널의 유전체 검사장치
US20070062739A1 (en) * 2005-09-20 2007-03-22 Harald Philipp Touch Sensitive Screen
KR20070056676A (ko) * 2005-11-30 2007-06-04 삼성전자주식회사 표시 장치 및 그 검사 방법
KR20070104420A (ko) * 2005-01-19 2007-10-25 오에이치티 가부시끼가이샤 검사 장치 및 검사 방법 및 검사 장치용 센서

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3170519D1 (en) * 1980-12-31 1985-06-20 Ibm Method of trimming thin metal resistors
US5057969A (en) * 1990-09-07 1991-10-15 International Business Machines Corporation Thin film electronic device
KR19990025832A (ko) * 1997-09-18 1999-04-06 윤종용 특정 주파수대의 잡음 측정을 위한 공진회로를 갖는 검사용기판
JP3846028B2 (ja) * 1998-05-13 2006-11-15 セイコーエプソン株式会社 半導体素子検査装置、及び半導体素子検査方法、並びに液晶パネルの製造方法
JP3632832B2 (ja) * 2000-04-27 2005-03-23 シャープ株式会社 シート抵抗測定方法
JP2002164398A (ja) * 2000-11-27 2002-06-07 Tokyo Instruments Inc 容量センサー及び容量測定方法
JP4045424B2 (ja) * 2002-08-02 2008-02-13 トヨタ自動車株式会社 レーザ溶接品質検査方法及び装置
JP2005274225A (ja) * 2004-03-23 2005-10-06 Kawaguchiko Seimitsu Co Ltd タッチパネル検査装置
JP5045023B2 (ja) * 2006-08-09 2012-10-10 パナソニック株式会社 入力装置
JP2009101699A (ja) * 2009-01-09 2009-05-14 Seiko Epson Corp 液滴吐出装置およびインクジェットプリンタ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH077038B2 (ja) * 1986-05-19 1995-01-30 株式会社リードエレクトロニクス プリント基板検査装置
KR20040029194A (ko) * 2002-09-25 2004-04-06 마이크로 인스펙션 주식회사 Ｐｄｐ 패널의 유전체 검사장치
KR20070104420A (ko) * 2005-01-19 2007-10-25 오에이치티 가부시끼가이샤 검사 장치 및 검사 방법 및 검사 장치용 센서
US20070062739A1 (en) * 2005-09-20 2007-03-22 Harald Philipp Touch Sensitive Screen
KR20070056676A (ko) * 2005-11-30 2007-06-04 삼성전자주식회사 표시 장치 및 그 검사 방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2606938C2 (ru) * 2012-05-30 2017-01-10 3М Инновейтив Пропертиз Компани Устройство для тестирования электродов

Also Published As

Publication number Publication date
TW201128205A (en) 2011-08-16
WO2011021825A2 (ko) 2011-02-24
KR100971220B1 (ko) 2010-07-20
JP5403640B2 (ja) 2014-01-29
CN102187319A (zh) 2011-09-14
JP2011527440A (ja) 2011-10-27
TWI431293B (zh) 2014-03-21
CN102187319B (zh) 2014-03-12

Similar Documents

Publication Publication Date Title
WO2011021825A3 (ko) Lc공진주파수 변이를 이용한 정전용량방식 터치스크린패널의 검사장치 및 검사방법
EP2687960A3 (en) Touch screen panel and driving method thereof
CN101539541B (zh) 基于导向波的厚梁结构损伤检测方法
EP2275795A3 (en) Methods and apparatus for vibration testing using multiple sine sweep excitation
WO2009089339A3 (en) Automated phase separation and fuel quality sensor
JP5224547B2 (ja) 構造物の損傷の診断方法および装置
RU2011107306A (ru) Емкостная сенсорная панель и дисплейное устройство с функцией обнаружения касания
JP2010535544A5 (ko)
TW201404044A (zh) 雜訊頻率偵測方法以及觸控裝置
EP2750001A3 (en) Touch panel and touch detecting method therefor
JP5863992B2 (ja) タッチスクリーンパネルの容量測定装置
CA2872474A1 (en) Modular system and methodology for testing and measurement
KR101214955B1 (ko) 회로기판의 검사장치
CN102981686A (zh) 一种电容触摸屏装置缺陷检测的方法
TW200732677A (en) Sensor board, and inspection method and apparatus using the same
JP5163857B2 (ja) コンクリート構造物品質検査方法及びコンクリート構造物品質検査装置
WO2011043569A3 (ko) 반전 구동 ｌｃｄ 디스플레이 장치에 구비된 터치스크린 제어장치 및 제어방법
WO2009048077A1 (ja) 容量変化検出回路、タッチパネル及び判定方法
WO2014091697A1 (ja) 固有振動測定装置
RU2011119621A (ru) Устройство детектирования объектов для механического транспортного средства
KR20130029874A (ko) 탄성파를 이용한 유리판의 크랙탐지장치 및 이를 이용한 크랙탐지방법
CN202422089U (zh) 一种电容屏传感器检测装置
CN102981059A (zh) 一种电容触摸屏装置缺陷检测方法
CN203101005U (zh) 弹力测试设备
KR102201466B1 (ko) 펜 신호 검출 수단을 포함하는 터치 패널

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201080001521.9

Country of ref document: CN

WWE Wipo information: entry into national phase

Ref document number: 2011527759

Country of ref document: JP

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10810133

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 10810133

Country of ref document: EP

Kind code of ref document: A2