TW200732677A - Sensor board, and inspection method and apparatus using the same - Google Patents

Sensor board, and inspection method and apparatus using the same

Info

Publication number
TW200732677A
TW200732677A TW095138363A TW95138363A TW200732677A TW 200732677 A TW200732677 A TW 200732677A TW 095138363 A TW095138363 A TW 095138363A TW 95138363 A TW95138363 A TW 95138363A TW 200732677 A TW200732677 A TW 200732677A
Authority
TW
Taiwan
Prior art keywords
board
sensor board
spaced apart
sensor
inspection
Prior art date
Application number
TW095138363A
Other languages
Chinese (zh)
Other versions
TWI306157B (en
Inventor
Masato Ikeda
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200732677A publication Critical patent/TW200732677A/en
Application granted granted Critical
Publication of TWI306157B publication Critical patent/TWI306157B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The invention is to specify the presence of disconnection and a disconnected part by relatively moving a sensor board and a board to be inspected once. The sensor board is used for the inspection of the board to be inspected, such as a glass board of a display panel, comprising a plurality of circuits extending in a second direction spaced apart in a first direction. The sensor board includes at least one power supplying electrode for supplying the circuit with an AC inspection signal in a noncontact manner, a plurality of power receiving electrodes which are spaced apart at least in the first direction and are spaced apart in the second direction so that each of which receives the inspection signal supplied to the circuit in a noncontact manner, and a plurality of sensor circuits which output an electric signal indicating the presence of a reception signal by the power receiving electrode.
TW095138363A 2005-11-29 2006-10-18 Sensor board, and inspection method and apparatus using the same TW200732677A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005343170A JP5276774B2 (en) 2005-11-29 2005-11-29 Inspection method and apparatus

Publications (2)

Publication Number Publication Date
TW200732677A true TW200732677A (en) 2007-09-01
TWI306157B TWI306157B (en) 2009-02-11

Family

ID=38125657

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095138363A TW200732677A (en) 2005-11-29 2006-10-18 Sensor board, and inspection method and apparatus using the same

Country Status (4)

Country Link
JP (1) JP5276774B2 (en)
KR (1) KR100863986B1 (en)
CN (1) CN100538379C (en)
TW (1) TW200732677A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI500006B (en) * 2008-10-10 2015-09-11 尼康股份有限公司 A flexible substrate, a manufacturing method of a display element, and a manufacturing apparatus for a display device
TWI550373B (en) * 2011-11-14 2016-09-21 鴻海精密工業股份有限公司 System and method for automatically replacing measuring probes

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009080042A (en) * 2007-09-26 2009-04-16 Oht Inc Circuit pattern inspection device
JP5269482B2 (en) * 2008-05-28 2013-08-21 株式会社日本マイクロニクス Sensor substrate and inspection device
JP5433876B1 (en) * 2013-03-26 2014-03-05 オー・エイチ・ティー株式会社 Circuit pattern inspection device
KR102387464B1 (en) * 2017-10-12 2022-04-15 삼성전자주식회사 Apparatus and method for testing interconnect circuit, and method for manufacturing semiconductor device comprising the method
CN108039405B (en) * 2018-01-11 2023-10-20 中国工程物理研究院总体工程研究所 Piezoelectric element, piezoelectric sensor, speed and displacement detection device
CN112485724A (en) * 2019-08-21 2021-03-12 泰科电子(上海)有限公司 Flexible flat cable test system

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JPS58103671A (en) * 1981-12-15 1983-06-20 Fujitsu Ltd Controlling method of pattern checker
JPS6444866A (en) * 1987-08-13 1989-02-17 Mitsui Mining & Smelting Co Method and apparatus for inspecting continuity of precise circuit pattern
JPH01119093A (en) * 1987-10-31 1989-05-11 Toshiba Corp Device for inspecting wiring pattern
JPH05196679A (en) * 1992-01-22 1993-08-06 Fujitsu Ltd Inspection method and inspection device for liquid crystal display board
JPH0763809A (en) * 1993-08-27 1995-03-10 Ntn Corp Short circuit defect inspection corrector
US5517110A (en) * 1995-04-06 1996-05-14 Yentec Inc. Contactless test method and system for testing printed circuit boards
JP2001084905A (en) * 1999-09-14 2001-03-30 Dainippon Printing Co Ltd Inspection device for electrode and method therefor
JP2001194405A (en) * 2000-01-07 2001-07-19 Oht Kk Probe for inspecting substrate and inspection/method for substrate
JP2002156417A (en) * 2000-11-17 2002-05-31 Oht Inc Apparatus and method for inspecting circuit board
JP4450143B2 (en) * 2001-05-24 2010-04-14 オー・エイチ・ティー株式会社 Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium
JP2002365325A (en) * 2001-06-11 2002-12-18 Oht Inc Circuit pattern inspection device, circuit pattern inspection method and storage medium
EP1450130A1 (en) * 2001-12-27 2004-08-25 Matsushita Electric Industrial Co., Ltd. Direction sensor and its production method
WO2004051290A1 (en) * 2002-11-30 2004-06-17 Oht Inc. Circuit pattern inspection device and circuit pattern inspection method
KR100528696B1 (en) * 2003-05-06 2005-11-16 엘지.필립스 엘시디 주식회사 Method and Apparatus for Testing Flat Panel Display
JP4562358B2 (en) * 2003-07-04 2010-10-13 株式会社ユニオンアロー・テクノロジー Conductive pattern inspection device
KR100743384B1 (en) * 2003-07-18 2007-07-30 아이치 세이코우 가부시키가이샤 Three-dimensional magnetic bearing sensor and magneto-impedance sensor element

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI500006B (en) * 2008-10-10 2015-09-11 尼康股份有限公司 A flexible substrate, a manufacturing method of a display element, and a manufacturing apparatus for a display device
US9178155B2 (en) 2008-10-10 2015-11-03 Nikon Corporation Flexible substrate, manufacturing method of display element, and manufacturing apparatus of display element
TWI550373B (en) * 2011-11-14 2016-09-21 鴻海精密工業股份有限公司 System and method for automatically replacing measuring probes

Also Published As

Publication number Publication date
KR20070056950A (en) 2007-06-04
JP2007147474A (en) 2007-06-14
CN1975447A (en) 2007-06-06
TWI306157B (en) 2009-02-11
KR100863986B1 (en) 2008-10-16
JP5276774B2 (en) 2013-08-28
CN100538379C (en) 2009-09-09

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees