WO2008078529A1 - 試験装置および試験方法 - Google Patents
試験装置および試験方法 Download PDFInfo
- Publication number
- WO2008078529A1 WO2008078529A1 PCT/JP2007/073601 JP2007073601W WO2008078529A1 WO 2008078529 A1 WO2008078529 A1 WO 2008078529A1 JP 2007073601 W JP2007073601 W JP 2007073601W WO 2008078529 A1 WO2008078529 A1 WO 2008078529A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- failure
- test
- sequence
- test equipment
- block
- Prior art date
Links
- 238000010998 test method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/16—Protection against loss of memory contents
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5606—Error catch memory
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008551019A JP5100663B2 (ja) | 2006-12-26 | 2007-12-06 | 試験装置および試験方法 |
KR1020097015591A KR101095639B1 (ko) | 2006-12-26 | 2007-12-06 | 시험 장치 및 시험 방법 |
US12/487,615 US7945826B2 (en) | 2006-12-26 | 2009-06-18 | Test apparatus and test method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-350625 | 2006-12-26 | ||
JP2006350625 | 2006-12-26 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/487,615 Continuation US7945826B2 (en) | 2006-12-26 | 2009-06-18 | Test apparatus and test method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008078529A1 true WO2008078529A1 (ja) | 2008-07-03 |
Family
ID=39562323
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/073601 WO2008078529A1 (ja) | 2006-12-26 | 2007-12-06 | 試験装置および試験方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7945826B2 (ja) |
JP (1) | JP5100663B2 (ja) |
KR (1) | KR101095639B1 (ja) |
TW (1) | TWI353607B (ja) |
WO (1) | WO2008078529A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010033626A (ja) * | 2008-07-25 | 2010-02-12 | Renesas Technology Corp | 半導体装置 |
KR20150057155A (ko) * | 2013-11-18 | 2015-05-28 | 삼성전자주식회사 | 메모리 시스템 및 그에 따른 반도체 메모리의 결함 메모리 셀 관리방법 |
CN111798915A (zh) * | 2019-04-02 | 2020-10-20 | 爱思开海力士有限公司 | 存储器***及其操作方法 |
CN116340191A (zh) * | 2023-05-31 | 2023-06-27 | 合肥康芯威存储技术有限公司 | 一种存储器固件的测试方法、装置、设备及介质 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009272028A (ja) * | 2008-04-07 | 2009-11-19 | Renesas Technology Corp | 半導体集積回路およびその動作方法 |
TW200947450A (en) * | 2008-05-09 | 2009-11-16 | A Data Technology Co Ltd | Storage system capable of data recovery and method thereof |
TWI395226B (zh) * | 2008-11-07 | 2013-05-01 | Silicon Motion Inc | 測試儲存裝置的方法及其系統 |
KR20100115970A (ko) * | 2009-04-21 | 2010-10-29 | 삼성전자주식회사 | 배드 셀 관리 방법과 그 장치 |
US8683456B2 (en) * | 2009-07-13 | 2014-03-25 | Apple Inc. | Test partitioning for a non-volatile memory |
US8650446B2 (en) * | 2010-03-24 | 2014-02-11 | Apple Inc. | Management of a non-volatile memory based on test quality |
US8645776B2 (en) * | 2010-03-24 | 2014-02-04 | Apple Inc. | Run-time testing of memory locations in a non-volatile memory |
US8411519B2 (en) * | 2010-06-04 | 2013-04-02 | Apple Inc. | Selective retirement of blocks |
US8751903B2 (en) | 2010-07-26 | 2014-06-10 | Apple Inc. | Methods and systems for monitoring write operations of non-volatile memory |
TWI459393B (zh) * | 2011-01-19 | 2014-11-01 | Phison Electronics Corp | 用於非揮發性記憶體的資料寫入方法、控制器與儲存裝置 |
KR20150029402A (ko) | 2013-09-10 | 2015-03-18 | 에스케이하이닉스 주식회사 | 데이터 저장 시스템 및 그것의 동작 방법 |
KR102070729B1 (ko) | 2013-11-12 | 2020-03-02 | 삼성전자주식회사 | 반도체 메모리 장치 및 그것을 포함하는 메모리 시스템 |
CN106909318B (zh) * | 2013-12-23 | 2020-05-08 | 华为技术有限公司 | 固态硬盘使用方法及装置 |
US10593421B2 (en) * | 2015-12-01 | 2020-03-17 | Cnex Labs, Inc. | Method and apparatus for logically removing defective pages in non-volatile memory storage device |
TWI601148B (zh) * | 2016-05-05 | 2017-10-01 | 慧榮科技股份有限公司 | 損壞資料行的篩選方法與具有損壞資料行總表的資料儲存裝置 |
CN112309481B (zh) * | 2019-08-02 | 2024-07-16 | 神讯电脑(昆山)有限公司 | Eeprom读写检测***及其方法 |
US11397635B2 (en) * | 2019-12-09 | 2022-07-26 | Sandisk Technologies Llc | Block quality classification at testing for non-volatile memory, and multiple bad block flags for product diversity |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08315597A (ja) * | 1995-05-17 | 1996-11-29 | Hitachi Electron Eng Co Ltd | Ic試験装置 |
JPH10312340A (ja) * | 1997-05-12 | 1998-11-24 | Kofu Nippon Denki Kk | 半導体記憶装置におけるエラー検出,訂正方式 |
JP2002140899A (ja) * | 2000-11-01 | 2002-05-17 | Toshiba Corp | 半導体記憶装置 |
JP2003178600A (ja) * | 2001-12-11 | 2003-06-27 | Toshiba Corp | 半導体集積回路 |
JP3490403B2 (ja) * | 2000-03-14 | 2004-01-26 | インターナショナル・ビジネス・マシーンズ・コーポレーション | クロック周波数を設定する方法 |
JP2004220068A (ja) * | 2003-01-09 | 2004-08-05 | Matsushita Electric Ind Co Ltd | メモリカード及びメモリへのデータ書き込み方法 |
JP2006139892A (ja) * | 2004-11-15 | 2006-06-01 | Advantest Corp | 試験装置及び試験方法 |
JP3842238B2 (ja) * | 2002-04-30 | 2006-11-08 | インターナショナル・ビジネス・マシーンズ・コーポレーション | メモリ・システム及びこれのテスト方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5623620A (en) | 1993-06-30 | 1997-04-22 | Intel Corporation | Special test modes for a page buffer shared resource in a memory device |
US5353256A (en) | 1993-06-30 | 1994-10-04 | Intel Corporation | Block specific status information in a memory device |
US5956473A (en) | 1996-11-25 | 1999-09-21 | Macronix International Co., Ltd. | Method and system for managing a flash memory mass storage system |
US6085334A (en) * | 1998-04-17 | 2000-07-04 | Motorola, Inc. | Method and apparatus for testing an integrated memory device |
JP4601119B2 (ja) | 2000-05-02 | 2010-12-22 | 株式会社アドバンテスト | メモリ試験方法・メモリ試験装置 |
JP2003194891A (ja) * | 2001-12-28 | 2003-07-09 | Ando Electric Co Ltd | 半導体集積回路試験装置及び方法 |
JP4260434B2 (ja) * | 2002-07-16 | 2009-04-30 | 富士通マイクロエレクトロニクス株式会社 | 不揮発性半導体メモリ及びその動作方法 |
JP2005267761A (ja) * | 2004-03-19 | 2005-09-29 | Meidensha Corp | フラッシュメモリの劣化監視方法 |
TW200622275A (en) | 2004-09-06 | 2006-07-01 | Mentor Graphics Corp | Integrated circuit yield and quality analysis methods and systems |
DE112005002581T5 (de) * | 2004-10-14 | 2007-08-30 | Advantest Corp. | Testvorrichtung und Testverfahren |
-
2007
- 2007-12-06 WO PCT/JP2007/073601 patent/WO2008078529A1/ja active Application Filing
- 2007-12-06 JP JP2008551019A patent/JP5100663B2/ja not_active Expired - Fee Related
- 2007-12-06 KR KR1020097015591A patent/KR101095639B1/ko active IP Right Grant
- 2007-12-19 TW TW096148670A patent/TWI353607B/zh active
-
2009
- 2009-06-18 US US12/487,615 patent/US7945826B2/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08315597A (ja) * | 1995-05-17 | 1996-11-29 | Hitachi Electron Eng Co Ltd | Ic試験装置 |
JPH10312340A (ja) * | 1997-05-12 | 1998-11-24 | Kofu Nippon Denki Kk | 半導体記憶装置におけるエラー検出,訂正方式 |
JP3490403B2 (ja) * | 2000-03-14 | 2004-01-26 | インターナショナル・ビジネス・マシーンズ・コーポレーション | クロック周波数を設定する方法 |
JP2002140899A (ja) * | 2000-11-01 | 2002-05-17 | Toshiba Corp | 半導体記憶装置 |
JP2003178600A (ja) * | 2001-12-11 | 2003-06-27 | Toshiba Corp | 半導体集積回路 |
JP3842238B2 (ja) * | 2002-04-30 | 2006-11-08 | インターナショナル・ビジネス・マシーンズ・コーポレーション | メモリ・システム及びこれのテスト方法 |
JP2004220068A (ja) * | 2003-01-09 | 2004-08-05 | Matsushita Electric Ind Co Ltd | メモリカード及びメモリへのデータ書き込み方法 |
JP2006139892A (ja) * | 2004-11-15 | 2006-06-01 | Advantest Corp | 試験装置及び試験方法 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010033626A (ja) * | 2008-07-25 | 2010-02-12 | Renesas Technology Corp | 半導体装置 |
KR20150057155A (ko) * | 2013-11-18 | 2015-05-28 | 삼성전자주식회사 | 메모리 시스템 및 그에 따른 반도체 메모리의 결함 메모리 셀 관리방법 |
KR102116364B1 (ko) * | 2013-11-18 | 2020-05-28 | 삼성전자주식회사 | 메모리 시스템 및 그에 따른 반도체 메모리의 결함 메모리 셀 관리방법 |
CN111798915A (zh) * | 2019-04-02 | 2020-10-20 | 爱思开海力士有限公司 | 存储器***及其操作方法 |
CN111798915B (zh) * | 2019-04-02 | 2023-09-15 | 爱思开海力士有限公司 | 存储器***及其操作方法 |
CN116340191A (zh) * | 2023-05-31 | 2023-06-27 | 合肥康芯威存储技术有限公司 | 一种存储器固件的测试方法、装置、设备及介质 |
CN116340191B (zh) * | 2023-05-31 | 2023-08-08 | 合肥康芯威存储技术有限公司 | 一种存储器固件的测试方法、装置、设备及介质 |
Also Published As
Publication number | Publication date |
---|---|
US7945826B2 (en) | 2011-05-17 |
TW200839777A (en) | 2008-10-01 |
US20090327822A1 (en) | 2009-12-31 |
TWI353607B (en) | 2011-12-01 |
KR101095639B1 (ko) | 2011-12-19 |
JP5100663B2 (ja) | 2012-12-19 |
JPWO2008078529A1 (ja) | 2010-04-22 |
KR20090103923A (ko) | 2009-10-01 |
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