WO2007135857A1 - 形状測定装置用プローブ及び形状測定装置 - Google Patents
形状測定装置用プローブ及び形状測定装置 Download PDFInfo
- Publication number
- WO2007135857A1 WO2007135857A1 PCT/JP2007/059510 JP2007059510W WO2007135857A1 WO 2007135857 A1 WO2007135857 A1 WO 2007135857A1 JP 2007059510 W JP2007059510 W JP 2007059510W WO 2007135857 A1 WO2007135857 A1 WO 2007135857A1
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- WIPO (PCT)
- Prior art keywords
- measurement
- probe
- shape measuring
- measuring apparatus
- surface contact
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G01B5/012—Contact-making feeler heads therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
- G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
- G01B7/012—Contact-making feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
Definitions
- the present invention relates to a probe for a shape measuring apparatus that performs scanning measurement with high accuracy and low measuring force for measuring an inner surface and a hole diameter of a three-dimensional arbitrary shape hole, and measuring a shape of an outer surface of an arbitrary shape,
- the present invention relates to a shape measuring apparatus.
- Patent Document 1 discloses a conventional probe capable of measuring an outer surface, an inner surface, a hole diameter, and the like of a measurement object.
- 18A and 18B are diagrams showing the configuration of a conventional probe 310 for a three-dimensional shape measuring apparatus described in Patent Document 1.
- FIG. The probe 310 is a probe for measuring a side surface extending in the vertical direction or the substantially vertical direction of the measurement object, and cannot measure a surface extending in the horizontal direction or the substantially horizontal direction.
- the probe 310 performs a measurement operation as follows.
- the arm 303 having the stylus 301 tilts substantially along the X direction according to the displacement in the X direction on the measurement surface S.
- the laser light is irradiated from the semiconductor laser projector 306 to the mirror 302 on the upper surface of the arm 303, and the tilt of the arm 303 is detected by the light position detecting means 307 based on the reflected light from the mirror 302.
- the entire probe 310 is moved in the X direction so that the detected inclination becomes constant, the X coordinate measurement value of the entire probe 310 is obtained from the amount of movement, and the X coordinate measurement value is detected by the optical position detection means 307.
- the X coordinate indicating the displacement amount of the surface S to be measured in the X direction is measured with high accuracy.
- the probe 310 cannot measure the position of the measurement object in the Y direction due to its structure.
- FIG. 19 is a diagram showing the structure of the shape measuring probe described in the above application.
- a shape measuring device probe 351 is provided in the shape measuring device 371.
- the measurement surface contact member 360 having the stylus 361 is connected to the mounting member 362 so as to be swingable in an arbitrary horizontal direction around the fulcrum portion 363.
- the connecting member 364 is formed of a coil panel, and holds the central axis of the measurement surface contact member 360 in the vertical direction when not measuring, and generates a force that presses the stylus 361 against the measurement object when measuring.
- the tilt angle detector 366 detects the tilt around the X and Y axes of the mirror 365 fixed to the upper part of the measurement surface contact member 360.
- the shape measuring device 371 operates the entire probe 351 with respect to the measurement surface so that the amount of stylus push is constant, detects the XYZ position of the probe 351, and calculates the value from the tilt of the mirror 365. By adding the horizontal displacement of the converted stylus, the position of the stylus is detected with high accuracy. With this configuration, it is possible to measure the side surface of the measurement object in any direction without rotating the measurement object.
- the stylus 301 can swing only in one horizontal direction, and is used to measure the entire circumferential shape of the cylindrical surface with the vertical axis as the central axis. Had to rotate the cylindrical surface. For this reason, a mechanism for rotating the object to be measured is required, and the center axis of the rotation mechanism has a problem that a measurement error occurs. In addition, there is a problem that the surface to be measured having a complicated cross section cannot be measured by the method of rotating the measurement object.
- the stylus 361 can be tilted in any horizontal direction, but the coil panel force that is the connecting member 364 needs to be weakened.
- the fulcrum for the 360 mounting member 362 moves in the horizontal direction, which may cause a movement error.
- a sensor in the horizontal movement direction can be provided to correct the movement error, but the configuration becomes complicated.
- a coil panel is used, it is necessary to generate a force that is slightly larger than the force that lifts the weight of the measurement surface contact member, that is, a force that presses against the workpiece, for example, a force that is larger by 30 mgf. .
- an object of the present invention is to solve the above-described problem, in which the stylus is positioned horizontally.
- the stylus is held in a neutral position during non-measurement, and it is possible to generate a minute measurement pressure on the measured object during measurement, and the stylus swing fulcrum is displaced.
- An object of the present invention is to provide a probe for a shape measuring apparatus and a shape measuring apparatus that can be easily adjusted with a simple configuration.
- the present invention is configured as follows.
- a measurement surface contact portion having an arm and a stylus disposed at the tip of the arm and in contact with the measurement surface of the measurement object
- a mounting member for attaching the measurement surface contact portion to the shape measuring device
- a fulcrum member provided on the measurement surface contact portion and a mounting base fixed to the mounting member and on which the fulcrum member is placed, and attached to the measurement surface contact portion so as to be swingable with the fulcrum member as a fulcrum.
- the movable side member and the fixed side member have a movable side member provided on the measurement surface contact portion and a fixed side member provided on the mounting member, which are arranged so as to face each other in the vertical direction.
- An apparatus probe is provided.
- one of the movable side member and the fixed side member may be a permanent magnet and the other may be a magnetic material.
- the movable side member and the fixed side member are both composed of permanent magnets, and are arranged so that different polarities face each other.
- the fulcrum member is constituted by a needle-like protrusion
- the mounting table has a conical groove into which the tip end of the fulcrum member can be fitted, and the deepest part of the conical groove and the pointed end of the fulcrum member
- the measurement surface contact portion and the mounting member may be connected so as to be swingable with the contact portion as a swing center.
- the measurement surface contact portion has a main body portion provided with a through hole extending in the lateral direction in the center, the arm is fixed to an outer lower wall of the main body portion, and The fulcrum member is configured to hang down from the inner upper wall in the through hole,
- the mounting table may be configured to extend through the through hole.
- the measurement surface contact portion includes an extending portion that extends to the opposite side of the stylus with respect to the fulcrum member, and a movable side holding portion that is provided at a distal end of the extending portion and holds the movable side member.
- the mounting member is provided on the inner side surface of the cylindrical main body portion on the same side as the fulcrum member with respect to the movable side holding portion, and includes a fixed side holding portion that holds the fixed side member. May be.
- the movable side holding portion is configured in a ring shape, and holds a plurality of movable side members at intervals on the lower surface side thereof.
- the fixed-side holding portion may be configured to hold a plurality of fixed-side members corresponding to each movable-side member at a position facing each movable-side member in the vertical direction.
- the mounting member is configured to have a regulating member that regulates a swinging width of the measurement surface contact portion by contacting the measurement surface contact portion on an inner surface of a cylindrical main body portion. You may do it.
- the shape measuring apparatus probe having a mirror that reflects the measurement laser beam at the measurement surface contact portion of the shape measuring apparatus probe;
- a laser beam generator for generating a measurement laser beam for obtaining position information of a measurement point on the surface to be measured of the object to be measured, which is irradiated to the device probe;
- a measurement point information determination unit for detecting the inclination angle of the measurement surface contact portion of the shape measurement device probe based on the reflected light reflected by the mirror provided in the shape measurement device probe and obtaining the position information of the measurement point;
- a shape measuring apparatus is provided.
- the measurement point information determination unit includes an inclination angle detection unit that detects the inclination angle, and an angle signal obtained from the inclination angle detection unit in the probe for the shape measurement device.
- a stylus position calculator that converts the amount of stylus displacement relative to the mounting member; a position coordinate measuring unit that obtains a relative position coordinate value of the measurement point relative to the mounting member using the measurement laser beam; and the relative position And an addition unit for adding the displacement amount of the stylus to the coordinate value to obtain the position information of the measurement point. I'll do it with you.
- a stage that moves the relative position between the mounting member and the measurement object in a two-dimensional or three-dimensional manner along the surface to be measured
- the tilt angle detection unit includes a photodetector that receives the reflected light, and the photodetector is provided in a plurality of light receiving regions that perform photoelectric conversion independently. It can also be configured to have one light receiving surface partitioned.
- the measurement laser light is an oscillation frequency stabilized laser light
- the reflected light is separated into two, and the separated light is irradiated to the photodetector, and the other light is irradiated.
- the apparatus further includes a light separation unit that measures the position of the stylus in the Z direction along the optical axis of the measurement laser beam irradiated on the mirror and irradiates the tilt angle detection unit provided in the position coordinate measurement unit. You may comprise as follows.
- the probe for the shape measuring apparatus according to the first aspect
- a plurality of position detection sensors provided on the inner surface of the cylindrical main body portion of the mounting member for detecting a distance from the measurement surface contact portion;
- a measurement point information determination unit for detecting the inclination angle of the measurement surface contact portion of the probe for shape measuring device based on the outputs from the plurality of position detection sensors to obtain the position information of the measurement point;
- a shape measuring apparatus is provided.
- the position detection sensor may be provided at two positions so as to be at an angle of 90 ° with respect to a center position of the main body portion of the mounting member.
- the measuring surface contact portion and the mounting member are swingably connected by the connecting mechanism, and
- the measurement surface contact portion that can be tilted in any horizontal direction can be held in a posture by urging the arm so as to be in a vertical direction without using a magnetic force by a magnet.
- the axis of the stylus is not limited to the vertical direction, and can be used in an inclined state.
- the surface diameter measurement of the inner surface of an arbitrary hole, the shape measurement of the outer surface, etc. can be performed with high accuracy and low measurement. Scan measurement with force is possible.
- the fixed side member and the movable side member is made of a permanent magnet, an attractive force can be exerted, and no current flows like an electromagnet. Is not affected by electric heat.
- a fulcrum composed of a conical groove and a tip as the coupling mechanism, it is possible to prevent the fulcrum from being displaced. Furthermore, if the movable side member is held at the distal end of the extending portion and the fixed side member is held on the fulcrum side with respect to the movable side holding portion, the conical groove and the tip of the coupling mechanism are caused by the attractive force of the magnet. The configured fulcrum is pressed down. Therefore, the fulcrum is less likely to be displaced.
- the measurement surface contact portion and the mounting member are reliably prevented from falling off. can do.
- FIG. 1 is a perspective view of a probe for a shape measuring apparatus used in a shape measuring apparatus according to a first embodiment of the present invention
- FIG. 2 is a perspective view of the profile measuring device probe of FIG. 1 cut along a plane of symmetry.
- Fig. 3 is a cross-sectional view of the oscillating member of the probe for shape measuring apparatus of Fig. 1 taken along the YZ plane.
- FIG. 4 is a cross-sectional view of the shape measuring device probe mounting member of FIG. 1 taken along the YZ plane.
- FIG. 5 is a diagram showing the configuration of the fixed holding member
- FIG. 6 is an exploded perspective view of the probe for the shape measuring apparatus in FIG. 1.
- FIG. 7 is a view showing an example of the shape measuring apparatus having the probe shown in FIG. 8]
- FIG. 8 is a diagram showing another example of the shape measuring apparatus including the probe shown in FIG. 1.
- FIG. 9 shows the configuration of the measurement point information determining unit provided in the shape measuring apparatus shown in FIG. Is a diagram showing
- FIG. 10 is a plan view of an inclination angle detection unit provided in the measurement point information determination unit shown in FIG.
- FIG. 11 is a diagram for explaining a state in which reflected light from the probe is irradiated to the tilt angle detection unit
- FIG. 12 is a diagram for explaining the tilt angle of the probe when measuring the surface to be measured with the probe shown in FIG. 1, and is a diagram showing the measurement object in a plan view. ,
- FIG. 13 is a diagram for explaining the tilt angle of the probe when the surface to be measured is measured with the probe shown in FIG. 1, and is a diagram showing the measurement object in a side view. ,
- FIG. 14 is a perspective view of an example of a measurement object that can be measured with the probe shown in FIG.
- FIG. 15 is a cross-sectional view of the measurement object shown in FIG.
- FIG. 16 is a perspective view of the shape measuring device probe used in the shape measuring device according to the second embodiment of the present invention cut along a plane of symmetry;
- FIG. 17 is a diagram showing the configuration of the measurement point information determining unit provided in the shape measuring apparatus having the probe shown in FIG.
- FIG. 18A is a side view of the probe provided in the conventional shape measuring device disclosed in Patent Document 1
- FIG. 18B is a front view of the probe provided in the conventional shape measuring apparatus disclosed in Patent Document 1
- FIG. 19 is a diagram showing a configuration of another conventional shape measuring apparatus.
- FIG. 20 is a diagram showing an inclined state of the swing member of the shape measuring apparatus of FIG. BEST MODE FOR CARRYING OUT THE INVENTION
- the shape measuring device described above can measure holes, outer shapes, and arbitrary side surface shapes that could not be measured with high accuracy in a short time with a high measurement accuracy of nanometer order and a low measurement force.
- Measurement targets include, for example, hole shapes in motor bearings that require extremely high accuracy, nozzles in inkjet printers, fuel injection nozzles in automobile engines, etc., and are formed in fluid bearings and contain lubricant.
- the trench portion in the semiconductor circuit pattern can be included in the measurement target.
- the surface to be measured that can be measured by the shape measuring device including the probe for the shape measuring device is from 0 degree to the maximum at the intersection angle ⁇ between the tangential direction and the vertical direction on the surface to be measured.
- FIG. 1 is a perspective view of a probe for a shape measuring apparatus used in the shape measuring apparatus according to the first embodiment of the present invention.
- a probe 101 for a shape measuring device shown in FIG. 1 is provided in the shape measuring device 201 and has a portion that contacts a surface to be measured 61 of a measurement object 60 to be measured.
- the arm 303 can be tilted only in one direction along the X direction, whereas in the probe 101, it can be applied in any direction regardless of the X or Y direction.
- the arm 122 can be tilted.
- Such a probe 101 includes a mounting member 2, an oscillating member 3 corresponding to an example serving as a measurement surface contact portion, and a coupling mechanism 4. Prepare.
- the mounting member 2 is a block member fixed to the shape measuring apparatus 201 or detachably mounted.
- the mounting member 2 is a fixed member, while the swinging member 3 swings, and the mounting member 2 can pass the measurement laser light 211 emitted from the shape measuring device 201.
- a laser beam opening 111 penetrating 2 is provided at the center.
- FIG. 2 is a perspective view of the shape measuring apparatus probe in FIG. 1 cut along a plane of symmetry.
- the mounting member 2 has a cylindrical shape and has a positional relationship such that the swinging member 3 is accommodated therein.
- the swing member 3 and the mounting member 2 are connected by the connecting mechanism 4 as described above.
- the coupling mechanism 4 tilts the swinging member 3 in any direction intersecting the optical axis 21 la of the measurement laser beam 21 1 irradiated on the mirror 123 so that the swinging member 3 can swing.
- This is a mechanism for supporting 3 on the mounting member 2.
- the optical axis 21 la coincides with the Z-axis direction that is the vertical direction.
- the coupling mechanism 4 includes a prismatic mounting base 41 fixed to the mounting member 2 and a fulcrum member 42 attached to the swinging member 3.
- the mounting table 41 has a conical groove 41a formed on the upper surface thereof, and the tip of the fulcrum member 42 is fitted into the groove 41a. When both are inserted, the tip position of the fulcrum member 42 is configured to contact the lowest point of the conical groove of the mounting table 41. With such a configuration, the swing member 3 and the mounting member 2 are swingably connected with the contact portion between the fulcrum member 42 and the conical groove 41a as the swing center.
- the swing member 3 is positioned so that the center of gravity is located below the tip of the fulcrum member 42 in the vertical direction so that the arm 122 faces in the vertical direction when the fulcrum member 42 is fitted and connected to the groove 41a of the mounting table 41. It is preferable that it is comprised.
- FIG. 3 is a cross-sectional view of the oscillating member of the shape measuring apparatus probe of FIG. 1 cut along the YZ plane.
- the oscillating member 3 has a stylus 121 that contacts the surface to be measured 61 of the object to be measured 60 and a mirror 123 that reflects the measurement laser beam 211 that has passed through the mounting member 2, and has the shape of the surface to be measured 61.
- the member swings with respect to the mounting member 2 in response to the displacement of the stylus 121 corresponding thereto.
- the mirror 123 is fixed to the central portion of the oscillating portion 3 and receives the measuring laser beam 211 emitted from the shape measuring apparatus 101.
- the swing member 3 is a through-hole provided in the center in the illustrated X-axis direction.
- a main body 125 including a hole 124 is provided, and an arm 122 provided with a stylus 121 at the tip is suspended from an outer lower wall of the main body 125, that is, a lower surface 125a of the main body 125.
- the mirror 123 is attached to the upper surface of the main body.
- a needle-like fulcrum member 42 is provided on the inner upper wall of the main body 125, that is, on the upper surface 124 a of the through hole 124.
- the mounting table 41 of the coupling mechanism 4 is disposed through the through hole 124 of the main body 125. Therefore, the swinging member 3 and the mounting member 2 are reliably prevented from falling off.
- the stylus 121 is a spherical body having a diameter of about 0.3 mm to about 2 mm, for example, and the arm 122 has a thickness of about 0.7 mm as an example, and the arm is fixed.
- This is a rod-like member having a length L of about 10 mm from the lower surface 125 of the main body to the center of the stylus 121.
- extending portions 127 extending in the Z-axis direction are provided at the peripheral portion of the upper surface 125b of the main body 125 at four locations. Adjacent extending portions 127 are arranged such that a gap 127a is provided therebetween, and a protruding portion 1332 of the fixed side member 52 described later is arranged in the gap 127a (see FIG. 5).
- a movable side holding portion 128 is provided at the tip of the extending portion 127.
- the movable side holding portion 128 is a ring-shaped member, and projects from the extending portion 127 in the XY axis direction.
- movable side magnets 51 which are examples of movable side members, are provided at four locations on the same radius at equal intervals.
- the movable side magnet 51 is provided at a position corresponding to the gap 127 a between the adjacent extending portions 127.
- FIG. 4 is a cross-sectional view of the shape measuring device probe mounting member of FIG. 1 taken along the YZ plane.
- the attachment member 2 includes a fixed-side holding member 133 for attaching a cylindrical main body 131 and a fixed-side magnet 52 which is an example of a fixed-side member.
- the main body 131 has a laser beam opening 111 at the center as described above.
- the lower end portion of the main body portion is a mounting table attaching portion 132.
- the mounting table mounting portion 132 is for fixing the mounting table 41 to the mounting member, and a specific configuration will be described later.
- the stationary holding member 133 includes a ring portion 1331 configured in a ring shape and projecting portions 1332 provided at four locations.
- the protrusions 1332 hold the fixed magnet 52 and are provided at equal intervals and concentrically.
- the fixed-side holding member 133 is fixed to the main body 131 with a fixing screw 134.
- the fixed-side holding member 133 is fixed so that the extending portion 127 of the swing member 3 is positioned between the adjacent protrusions 1332.
- the positional relationship between the movable side magnet 51 and the fixed side magnet 52 held by the movable side holding portion 128 of the swing member 3 is arranged side by side in the Z-axis direction, which is the vertical direction. .
- the movable side magnet 51 and the fixed side magnet 52 are fixed in a direction in which an attractive force acts on each pair.
- all the magnets 51 and 52 are fixed so that the top is the north pole and the bottom is the south pole.
- FIG. 6 is an exploded perspective view of the probe for the shape measuring apparatus shown in FIG. In FIG. 6, in order to understand the assembly structure, a part of the description such as a plurality of members may be omitted.
- the swing member 3 and the mounting member 2 are connected by the mounting table 41 of the connection mechanism 4 passing through the through hole 124 of the main body 125 of the swing member.
- the mounting table 41 is attached to the mounting table mounting portion 132 of the mounting member 2.
- the mounting table mounting portion 132 includes a notch 137 for inserting the mounting table 41, and the mounting table 41 connected to the swing member 3 is mounted in the notch 137.
- the mounting table 41 is fixed by a first fixing member 139 in order to prevent displacement in the X-axis direction.
- the first fixing member 139 is a plate-like member and is fixed by a mounting screw 140 that is screwed into a fixing hole 138 provided in the mounting table mounting portion 132.
- the mounting table is fixed to the second fixing member 142 in order to prevent displacement in the Y-axis direction.
- the second fixing member 142 is a plate panel-like member, and is fixed by a mounting screw 143 that is screwed into a fixing hole 141 provided in the mounting table mounting portion 132.
- the probe 101 in the present embodiment configured as described above operates as follows. To do. According to the above configuration, the oscillating portion 3 receives a downward force due to the attractive force of the movable side magnet 51 and the fixed side magnet 52, and the tip of the fulcrum member 42 is in contact with the center of the conical groove 41a of the mounting table 41. Misalignment is prevented. In addition, the swinging member 3 that is swingably connected to the mounting member 2 is attached so that the arm is in a neutral position extending in the vertical direction by the attractive force of the movable side magnet 51 and the fixed side magnet 52. It is energized.
- the oscillating part 3 can oscillate, but when the central axis of the oscillating part 3 is inclined, the distance between the movable side magnet 51 and the fixed side magnet 52 is increased. Restoring force works in the direction to bring magnets closer to each other. Therefore, the restoring force acts in the direction in which the entire swinging portion 3 returns to the tilt. Similarly, when the oscillating part rotates around the fulcrum, the restoring force works in the direction to return the rotation. As a result, the oscillating portion 3 is biased and held so that the extending direction of the arm coincides with the vertical direction during non-measurement.
- the shape measurement of the measurement target surface 61 of the measurement object 60 is performed by pressing the stylus 121 attached to the swing member 3 against the measurement target surface 61 with a predetermined pressing force. Done.
- the pressing member moves the mounting member 2 slightly toward the measuring object 60 in a state where the stylus 121 is in contact with the surface 61 to be measured, whereby the swinging member 3 is inclined. Due to the inclination, the attraction force of the magnet acts on the swing member 3. That is, the attractive force that presses the stylus 121 against the surface to be measured 61 is generated by the attractive force of the movable side magnet 51 and the fixed side magnet 52, and the swing member 3 is not tilted.
- a restoring force is generated to restore the rocking member 3 to the neutral position in the initial state where the arm extends in the vertical direction.
- the stylus 121 is pressed against the measured surface 61 with a predetermined pressing force, that is, a measuring force.
- a predetermined pressing force that is, a measuring force.
- the tip of the stylus 121 comes into contact with the measurement object with a minute measurement force.
- the measuring force can be 0.3 mN.
- the measuring force can be adjusted by the magnetic force of the movable magnet 51 and the fixed magnet 52 and the distance between them.
- the strength of the magnet, the distance between the magnets, etc. are selected so that the displacement of the tip becomes 10 xm when the tip of the stylus 121 is pushed at 0.3 mN. .
- the method for applying a constant measuring force to the tip is described below.
- the shape measuring apparatus brings the probe into contact with the object to be measured while controlling the movement of the probe so that the contact force becomes almost constant. Move along measurement surface 61, and measure and calculate the surface shape of measured surface 61 based on the positional relationship between the probe and reference surface using a laser measuring instrument and reference plane mirror It is.
- Such a shape measuring apparatus is mainly used for measuring a comparatively large measuring object having a size of about 400 mm square, for example.
- the measuring object 60 is fixed on a surface plate.
- This is mainly used for measuring medium-sized and small-sized objects having a size of about 200 mm square or less, such as a type in which the probe is moved in all directions of the X-axis, Y-axis, and Z-axis.
- the stage on which the measurement object 60 is placed is moved in the X-axis and Y-axis directions while only the probe is moved in the Z-axis direction.
- the above-described shape measuring apparatus probe 101 can be applied to any type of measuring apparatus.
- the shape measuring apparatus 290 shown in Fig. 8 corresponds to the measuring apparatus for a small-sized measuring object in the above.
- reference numeral 291 denotes a stage
- the stage 291 is set on a stone surface plate 292 and is movable in the X-axis and Y-axis directions orthogonal to each other on a plane X—stages 2911 and Y—
- a stage 2912 is provided, and an object 60 to be measured is placed thereon.
- Reference numeral 293 denotes a Z-table that makes the probe 101 movable in the Z-axis direction, and is attached to a column 2921 erected on the stone surface plate 292 so as to be movable in the Z-direction.
- Reference numeral 210 denotes a laser beam generator that generates an oscillation frequency stabilized He—Ne laser beam as the measurement laser beam 211 for obtaining the position information of the measurement point 61a of the surface 61 to be measured.
- 220 denotes an optical system for obtaining position information of the measurement point 61a on the measurement surface 61 using the laser beam 211 generated by the laser beam generation unit 210, and each of the X-axis, Y-axis, and Z-axis directions.
- This is a measurement point information determination unit having a known laser length measurement unit that performs length measurement based on the interference between the laser light from the reference surface and the laser light from the measurement point 61a.
- the measurement point information determination unit 220 will be described in detail later.
- Reference numeral 294 denotes a driving unit for driving the stage 291 and 280 denotes a control device.
- the control device 280 controls the drive unit 294 so that the rocking member 3 of the probe 101 is swung in any direction, not tilted only in a specific direction, when moving on the surface 61 to be measured.
- the moving direction and moving amount of the stage 291 are controlled.
- the shape measuring apparatus 201 shown in FIG. 7 has a configuration corresponding to the measuring apparatus for the large-sized measurement object described above. Note that components having the same or similar functions as those of the shape measuring apparatus 290 described above are denoted by the same reference numerals and description thereof is omitted here.
- the stage 295 is a stage having an X-stage 2951 and a Y-stage 2952 which are installed on a stone surface plate 292 and movable in the X-axis and Y-axis directions.
- Z_table 293, laser beam generator 210, and measurement point information A decision unit 220 is placed. Therefore, the stage 295 can move the Z-tape nozzle 293, the laser beam generation unit 210, and the measurement point information determination unit 220 in the X-axis and Y-axis directions.
- Reference numeral 229 denotes a reference mirror having a reference surface in the Z-axis direction.
- the shape measuring device probe 101 is attached to the shape measuring device 201, the shape measuring device 201 is taken as an example in the following description. However, in the shape measuring apparatus 290, the measurement operation of the surface to be measured 61 using the probe 101 is not different from the case of the shape measuring apparatus 201.
- the measurement point information determination unit 220 will be described in detail with reference to Figs.
- the measurement point information determination unit 220 includes an optical system 221 for obtaining position information of the measurement point 61a, an inclination angle detection unit 222, a stylus position calculation unit 223, a position coordinate measurement unit 224, and an addition unit 225. And have. These tilt angle detection unit 222, stylus position calculation unit 223, position coordinate measurement unit 224, and addition unit 225 are parts corresponding to the laser length measurement unit, and are actually connected to the optical system 221 and actually receive the position information. It is a component for obtaining.
- the measurement laser light 21 1 generated by the laser light generation unit 210 is split into four in the optical system 221 in order to obtain the three-dimensional coordinate position of the measurement point 6 la on the measurement target surface 61.
- the optical system 221 has a total of four optical systems: a first optical system 221a for X, Y, and ⁇ coordinates and a second optical system 221b for the tilt angle of the swing member.
- the first optical system 221a is not shown in order to detect the amount of movement of the stage 295 in the X-axis direction and the Y-axis direction, that is, the amount of movement of the measured surface 61 in the X-axis direction and the Y-axis direction.
- each reference plate has an X-axis reference plate having a reference surface perpendicular to the X-axis direction and having a mirror surface, and a Y-axis reference plate having a reference surface orthogonal to the Y-axis direction and made of a mirror surface. Furthermore, a Z reference plate for detecting a so-called swell component of the stage 295 in the Z-axis direction generated in the stage 295 when the stage 295 is moved is also provided.
- the reference surface of each reference plate has a flatness of 0.01 micron order. ing.
- a method for measuring the shape of the surface 61 to be measured is used to apply a change in the phase of the reflected laser light reflected on each reference surface to each reference surface.
- a known laser length measurement method is used in which detection is performed by counting interference signals between the laser beam to be emitted and the reflected laser beam.
- the laser length measurement method for example, as disclosed in Japanese Patent Laid-Open No. 4-1503, the laser light irradiated onto the reference surface is divided into reference light and measurement light by a branching member such as a prism, and Shift the phase of the reference beam and measurement beam by 90 degrees.
- the measurement light is irradiated and reflected on the reference plane, and the interference light due to the phase shift in the reflected light and the reference light returned is electrically detected, and the obtained interference fringe signal is used.
- the distance between the reference point and the reference plane is measured based on the Lissajous figure to be created.
- the position coordinate measurement unit 224 is a part that executes such a length measurement method, and measures the X coordinate value, the Y coordinate value, and the Z coordinate value at the measurement point 61a on the measurement target surface 61. It has detection parts 224a-224c.
- the X coordinate value and the Y coordinate value at the measurement point 61a described above are used.
- the Z coordinate value can be translated into the relative position coordinate value of the measurement point 61a with respect to the mounting member 2 in the probe 101 attached to the Z-table 293.
- the detection unit 224c is a part that measures the Z coordinate value of the stylus 121 of the probe 101 for shape measuring apparatus, and therefore corresponds to an example that functions as a stylus position measuring device. Based on the detection results from these detection units 224a to 224c and the detection result obtained from the inclination angle of the rocking member 3 described below, the shape of the measured surface 61 changes to the position coordinate measurement unit 224 and the addition unit 225. Is calculated.
- the second optical system 221b is configured to detect the reflected light from the mirror 123 attached to the swing member 3 of the shape measuring apparatus probe 101 out of the measurement laser light 211, and the inclination angle detection unit 222.
- the tilt angle detector 222 and the stylus position calculator 223 will be described.
- the measurement laser beam 211 is applied to the center point 123a of the mirror 123 attached to the swing member 3 provided in the probe 101 for the shape measuring device attached to the lower end of the Z_table 293. A part is irradiated through the focus lens. Irradiated The light 211 is reflected by the mirror 123, and the reflected light 211 b is applied to the tilt angle detection unit 222 by a mirror 221 la provided in the light separation unit 2211.
- the inclination angle detection unit 222 is configured by a photodetector having a light receiving surface 2221 that receives the reflected light 211b and converts it into an electrical signal.
- the light receiving surface 2221 is divided into a plurality of light receiving regions that perform photoelectric conversion independently.
- the light receiving surface 2221 is divided into four light receiving regions 222a to 222d in a lattice shape, that is, in a cross shape. Note that the number and shape of the light receiving regions can be appropriately set based on the relationship with the measurement accuracy and the like, which is not limited to the illustrated form.
- the arm 122 of the probe 101 When the measurement surface 61 is not measured, the arm 122 of the probe 101 is arranged along the vertical direction. Therefore, at the time of non-measurement, the reflected light 21 lb travels in parallel to the optical axis 21 la of the measurement laser light 211 irradiated to the mirror 1 23 along the vertical direction, and is reflected by the mirror 221 la to detect the tilt angle. Irradiated to the center of the light receiving surface 2221 of the portion 222. In this case, the irradiation area of the reflected light 21 lb on the light receiving surface 2221 is indicated by a dotted line in FIG.
- the measurement of the surface 61 to be measured is performed by pressing the stylus 121 against the surface 61 to be measured with a substantially constant measurement force.
- the swing member 3 of the probe 101 is inclined with respect to the mounting member 2. Therefore, the reflected light 21 lb crosses the optical axis 21 la and proceeds to the mirror 221 la, and is irradiated onto the reference irradiation region 2223 that is off the center at the light receiving surface 2221 of the tilt angle detection unit 22 2.
- the swing member 3 can swing in any direction without being limited to a specific direction with the tip of the fulcrum member 42 as a fulcrum. Therefore, if there is no fine unevenness on the surface to be measured 61, for example, in the order of nanometers, the reference irradiation region 2223 is centered on the center point 2221a of the light receiving surface 2221 as shown in FIG. It is located along the circumference 2224 of a circle with a certain radius.
- the tilt angle detection unit 222 generates an electrical signal in response to the irradiation of 21 lb of reflected light on the light receiving surface 2221.
- the light receiving surface 2221 is divided into two light receiving regions 222a to 222d and is Therefore, the inclination angle of the swing member 3 can be detected from the irradiation location of the reflected light 211b. That is, the light receiving area 222a is “A”, the light receiving area 222b is “B”, the light receiving area 222c is “C”, and the light receiving area.
- the inclination angle of the rocking member 3 in the X-axis direction is obtained by performing (A + B) one (C + D) for the electrical signals obtained from the light receiving areas 222a to 222d.
- the inclination angle in the Y-axis direction can be obtained by performing (A + D)-(B + C).
- the inclination angle detector 222 performs (A + B) ⁇ (C + D) and (A + D) ⁇ (B + C) on the electric signals obtained from the light receiving regions 222a to 222d. These are sent as angle signals to the stylus position calculator 223.
- the stylus position calculation unit 223 converts the angle signal into a displacement amount of the stylus 121 provided in the probe 101.
- the measurement surface 61 deviated from the circumference 2224 corresponding to the fine unevenness.
- the position is illuminated with 21 lb of reflected light.
- the tilt angle detection unit 222 sends an angle signal and the stylus position calculation unit 223 outputs the stylus 121 by irradiating the displacement irradiation region 2225 with the reflected light 21 lb.
- the amount of displacement corresponding to the fine irregularities in is obtained. Therefore, by obtaining the difference between the reference displacement amount of the stylus 121 corresponding to the reference irradiation region 2223 and the uneven displacement amount corresponding to the displacement irradiation region 2225, the size of the fine unevenness can be obtained. .
- the reference displacement amount is constant or slightly constant. Needs to be almost constant. That is, the force by which the oscillating member 3 oscillates in any direction causes the irradiation region of the reflected light 21 lb on the light receiving surface 2221 to move along the circumference 2224, for example, at the time of measurement. In such a situation, the reflected light 211b is basically always applied to the reference irradiation region 2223, that is, the tilt angle of the swing member 3 is constant or almost constant regardless of which direction the swing member 3 swings.
- the control unit 280 controls the drive unit 294 of the stage 295, and as shown in FIGS. 12 and 13, the stylus 121 has the swinging member 3 with respect to the direction 121b perpendicular to the running direction 121a. It is necessary to correct the running direction 121a by controlling the moving amount and moving direction of the stage 295 so that the inclination 13 becomes constant.
- the stylus position calculation unit 223 performs the above measurement of the measurement point 61a of the surface 61 to be measured.
- the position coordinate measuring unit 224 obtains the X coordinate value, the Y coordinate value, and the Z coordinate value at the measurement point 61a as described above. Therefore, the adding unit 225 obtains the X coordinate value, the Y coordinate value, and the Z coordinate value at the measurement point 61a obtained by the position coordinate measurement unit 224, and the fine unevenness of the measurement point 61a obtained by the stylus position calculation unit 223.
- the measurement X coordinate value, measurement Y coordinate value, and measurement Z coordinate value at the measurement point 61a that takes into account the fine unevenness amount are obtained.
- the X coordinate value, the Y coordinate value, and the Z coordinate value at the measurement point 61a obtained by the position coordinate measurement unit 224 are set to XI, Yl, Z1, and the measurement point 6 la obtained by the stylus position calculation unit 223 is
- the X coordinate value of the fine irregularities is (A + B)-(C + D)
- the Y coordinate value is (A + D)-(B + C)
- the above measurement obtained by the adder 225 X coordinate value, measurement Y coordinate value, and measurement Z coordinate value are Xl + E ⁇ (A + B) _ (C + D) ⁇ , Yl + F ⁇ (A + D)-(B + C) ⁇ , Zl.
- E and F are correction coefficients.
- the measurement X coordinate value, the measurement Y coordinate value, and the measurement Z coordinate value are the center coordinates of the stylus 121. Therefore, the true coordinate value of the measurement point 61a is a value shifted by the radius value of the stylus 121 in the direction perpendicular to the scanning direction of the probe 101.
- the shape measuring apparatus 201 configured as described above, that is, the shape measuring method for the surface to be measured 61 of the measurement object 60 will be described below.
- the measured surface 61 that can be measured by the shape measuring apparatus 201 to which the probe 101 is attached has a tangential direction perpendicular to the measured surface 61a.
- the crossing angle ⁇ is the surface to be measured at an angle between 0 degrees and a maximum of about 30 degrees.
- the shape measuring method is executed by operation control of the control device 280.
- the stylus 121 is brought into contact with the surface 61 to be measured, and, for example, about 0.3 mN.
- the light receiving surface 2221 of the tilt angle detection unit 222 is irradiated with 21 lb of reflected light on the reference irradiation region 2223, and as described above, via the stylus position calculation unit 223 and the position coordinate measurement unit 224, By the adder 225, the measurement surface 61 at the measurement point 61a
- the reference X coordinate value, Y coordinate value, and Z coordinate value are obtained.
- the controller 280 controls the drive unit 294 of the stage 295 to control the amount and direction of movement of the stage 295 in the X-axis direction and the Y-axis direction.
- the measuring force can be kept at 30 mgf by adjusting the angle so that the displacement of the tip of the stylus 121 keeps 10 ⁇ m.
- the surface to be measured 61 is measured so that the swinging member 3 performs a so-called swinging motion or miso-scrubbing motion on the entire circumference of the surface to be measured 61.
- the reflected light 21 lb makes a round along each of the light receiving regions 222a to 222d on the light receiving surface 2221 of the tilt angle detector 222, for example, along the circumference 2224.
- the irradiation region of the reflected light 21 lb is moved from the reference irradiation region 2223 to the displacement irradiation region 2225 corresponding to the unevenness of the surface 61 to be measured.
- the concavo-convex portion at the measurement point 61a of the surface 61 to be measured is included by the addition unit 225 via the stylus position calculation unit 223 and the position coordinate measurement unit 224.
- the measurement X coordinate value, measurement Y coordinate value, and measurement Z coordinate value are obtained.
- the oscillating portion 3 that can be tilted in any horizontal direction is held in a neutral position in a non-contact manner using a magnetic force of a magnet.
- the force that the stylus 121 presses against the measurement object 60 that is, the measurement force
- the measurement force is generated minutely, so there is little error in the minute force due to the contact force like the coil panel, and it is difficult to break due to accidental impact.
- the fulcrum member 42 composed of the conical groove 41a and the tip of the coupling mechanism 4 by the attractive force of the movable side magnet 9 and the fixed side magnet 11, there is little displacement of the fulcrum.
- the probe 101 is not limited to the vertical direction of the axis of the stylus 121, and can be used in an inclined state.
- the configuration is simple and there is no influence from electric heat.
- the attractive force by the movable side magnet 9 and the fixed side magnet 11 is used.
- the same effect can be obtained by using a magnetic body in which either the fixed side or the movable side is not a magnet. It is done.
- the swing member 3 having the stylus 121 in the probe 101 can perform a so-called swing motion or miso soup motion. Therefore, for example, when measuring the inner peripheral surface of the measuring object 60, the inner peripheral surface is measured by moving the probe 101 in the X-axis direction and the Y-axis direction without rotating the measuring object 60. Can do. Therefore, shape measurement can be performed regardless of the inclination direction of the side surface of the measurement object 60 without adopting a complicated configuration in the measurement apparatus. Further, since there is no need to rotate the measuring object 60, there is no problem that the center axis of the measuring object 60 is displaced, and the measurement error on the surface to be measured can be reduced.
- the outer diameter or the hole diameter of the lens can be measured, and the shape of the groove 55 formed in the measurement object 60 such as the fluid bearing shown in FIGS. 14 and 15 and containing the lubricant is measured. It is also possible. Therefore, the shape measuring apparatus 201 can contribute widely to the development of the industrial industry for precision and miniaturization.
- the measured object 60 is fixed on the stone surface plate 292, and the probe 101 is moved in the X, Z, and Z-axis directions, but conversely, the probe 101 is fixed and measured.
- Object 60 may be moved. In short, the measurement object 60 and the probe 101 may be relatively moved.
- the shape measuring device probe 10 la according to the present embodiment has the same configuration as the shape measuring device probe 101 according to the first embodiment, and therefore the difference in configuration will be mainly described. .
- FIG. 16 is a perspective view when the probe for shape measuring apparatus according to the second embodiment of the present invention is cut along a plane of symmetry.
- non-contact displacement sensors 151 and 152 are provided for detecting the inclination of the swing member 3.
- a capacitance type can be considered.
- the non-contact displacement sensors 151 and 152 are provided in the main body 131 of the mounting member 2 and measure the distance from the movable side holding portion 128 of the swing member 3.
- the movable side holding portion 128 is located far from the fulcrum member, and the non-contact displacement center is larger than the displacement amount with respect to the inclination of the swing member 3.
- the distances between the sensors 151 and 152 and the movable side holding portion 128 can be measured with high accuracy.
- the non-contact displacement sensors 151 and 152 are provided so as to form an angle of 90 ° with respect to the center of the swinging member 3 with each other.
- the inclination in the X direction and the Y direction can be detected.
- the tilt amount of the swing member 3 is such that the side surface of the movable side holding portion 128 is in a non-contact displacement sensor 151.
- the non-contact displacement sensors 151 and 152 also function as a restricting member that restricts the swinging width of the swinging member 3.
- FIG. 17 is a diagram showing a configuration of a measurement point information determination unit provided in the shape measuring apparatus including the probe shown in FIG.
- the shape measurement apparatus according to the present embodiment has the same configuration as that of the measurement point information determination unit shown in FIG. 9, but differs in the configuration of the tilt angle detection unit.
- the tilt angle detection unit in the present embodiment includes non-contact displacement sensors 151 and 152 as the configuration of the probe for the shape measuring apparatus, and the sensors 151 and 152 are used to non-optically move the swing member 3. Detect tilt. That is, the non-contact displacement sensors 151 and 152 function as the tilt angle detection unit 222 in FIG. That is, unlike the tilt angle detection unit in the first embodiment, the tilt angle of the swing member 3 is not optically measured, and therefore the mirror 221 la for guiding the reflected light becomes unnecessary.
- the shape measuring apparatus optically detects the inclination angle of the oscillating member 3 in addition to the effects of the shape measuring apparatus according to the first embodiment. Therefore, the configuration of the optical system can be further simplified.
- the present invention is not limited to the above-described embodiment, and can be implemented in various other modes.
- the fulcrum member is a member provided in a protruding shape, and the tip of the protrusion is configured to be recessed into a conical groove.
- the conical groove provided in the swing member may be used as the fulcrum member.
- the present invention relates to a shape measuring apparatus that scans and measures the inner surface and hole diameter of a hole having an arbitrary shape and the shape measurement of an outer surface of an arbitrary shape with high accuracy and low measuring force, and the shape measuring apparatus.
- a shape measuring apparatus that scans and measures the inner surface and hole diameter of a hole having an arbitrary shape and the shape measurement of an outer surface of an arbitrary shape with high accuracy and low measuring force.
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Abstract
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Priority Applications (5)
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KR1020077025056A KR100928609B1 (ko) | 2006-05-18 | 2007-05-08 | 형상측정 장치용 프로브 및 형상측정 장치 |
EP07742945A EP1906135B1 (en) | 2006-05-18 | 2007-05-08 | Probe for shape measuring apparatus, and shape measuring apparatus |
JP2007540002A JP4427580B2 (ja) | 2006-05-18 | 2007-05-08 | 形状測定装置用プローブ及び形状測定装置 |
CN2007800004439A CN101322005B (zh) | 2006-05-18 | 2007-05-08 | 形状测定装置用探头及形状测定装置 |
US11/919,557 US7797851B2 (en) | 2006-05-18 | 2007-05-08 | Shape measurement device probe and shape measurement device |
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JP2006-138886 | 2006-05-18 | ||
JP2006138886 | 2006-05-18 |
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US (1) | US7797851B2 (ja) |
EP (1) | EP1906135B1 (ja) |
JP (1) | JP4427580B2 (ja) |
KR (1) | KR100928609B1 (ja) |
CN (1) | CN101322005B (ja) |
WO (1) | WO2007135857A1 (ja) |
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JP2008304413A (ja) * | 2007-06-11 | 2008-12-18 | Panasonic Corp | 形状測定方法 |
JP2009293927A (ja) * | 2008-06-02 | 2009-12-17 | Panasonic Corp | 形状測定装置用プローブ及び形状測定装置 |
EP2228620A1 (en) | 2009-03-12 | 2010-09-15 | Panasonic Corporation | Shape measurement device probe and shape measurement device |
JP2010210567A (ja) * | 2009-03-12 | 2010-09-24 | Panasonic Corp | 形状測定装置用プローブ及び形状測定装置 |
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Also Published As
Publication number | Publication date |
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KR20080014964A (ko) | 2008-02-15 |
JP4427580B2 (ja) | 2010-03-10 |
US7797851B2 (en) | 2010-09-21 |
JPWO2007135857A1 (ja) | 2009-10-01 |
EP1906135A1 (en) | 2008-04-02 |
KR100928609B1 (ko) | 2009-11-26 |
US20100011601A1 (en) | 2010-01-21 |
EP1906135A4 (en) | 2010-06-09 |
EP1906135B1 (en) | 2012-12-05 |
CN101322005B (zh) | 2010-12-01 |
CN101322005A (zh) | 2008-12-10 |
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