WO2006025199A1 - 誘電泳動力を用いた自己回復性限流ヒューズ - Google Patents
誘電泳動力を用いた自己回復性限流ヒューズ Download PDFInfo
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- WO2006025199A1 WO2006025199A1 PCT/JP2005/014628 JP2005014628W WO2006025199A1 WO 2006025199 A1 WO2006025199 A1 WO 2006025199A1 JP 2005014628 W JP2005014628 W JP 2005014628W WO 2006025199 A1 WO2006025199 A1 WO 2006025199A1
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- conductive particles
- self
- solid conductive
- electrodes
- current
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- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
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- 239000011701 zinc Substances 0.000 description 2
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G2/00—Details of capacitors not covered by a single one of groups H01G4/00-H01G11/00
- H01G2/14—Protection against electric or thermal overload
- H01G2/16—Protection against electric or thermal overload with fusing elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H87/00—Protective devices in which a current flowing through a liquid or solid is interrupted by the evaporation of the liquid or by the melting and evaporation of the solid when the current becomes excessive, the circuit continuity being reestablished on cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/02—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having positive temperature coefficient
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/02—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having positive temperature coefficient
- H01C7/027—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having positive temperature coefficient consisting of conducting or semi-conducting material dispersed in a non-conductive organic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/12—Overvoltage protection resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H85/00—Protective devices in which the current flows through a part of fusible material and this current is interrupted by displacement of the fusible material when this current becomes excessive
- H01H85/02—Details
- H01H85/04—Fuses, i.e. expendable parts of the protective device, e.g. cartridges
- H01H85/05—Component parts thereof
- H01H85/055—Fusible members
- H01H85/06—Fusible members characterised by the fusible material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M50/00—Constructional details or processes of manufacture of the non-active parts of electrochemical cells other than fuel cells, e.g. hybrid cells
- H01M50/50—Current conducting connections for cells or batteries
- H01M50/572—Means for preventing undesired use or discharge
- H01M50/574—Devices or arrangements for the interruption of current
- H01M50/583—Devices or arrangements for the interruption of current in response to current, e.g. fuses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M2200/00—Safety devices for primary or secondary batteries
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M2200/00—Safety devices for primary or secondary batteries
- H01M2200/10—Temperature sensitive devices
- H01M2200/103—Fuse
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49107—Fuse making
Definitions
- the present invention relates to a self-recovering current-limiting current that realizes an interrupted current-limiting state and a current-carrying state by using a dielectrophoretic force of solid conductive particles generated by applying and applying a voltage by solid-dispersing solid conductive particles in a liquid matrix.
- fuses Regarding fuses.
- a positive resistance temperature coefficient element that is, a PTC element is used as a protection element for a secondary battery in an electronic device such as a mobile phone or a notebook personal computer.
- PTC elements are required to have higher functionality, longer drive time, and improved efficiency. For this reason, higher capacity and higher voltage secondary batteries are required.
- higher voltage is required for PTC devices.
- PTC elements of about 8V have been put to practical use.
- PTC elements are mainly made of solid materials such as ceramics and polymers as a matrix. For example, polyethylene PTC elements (having polyethylene and carbon black), barium titanate PTC elements Is currently being used.
- the dielectrophoresis filter device is capable of inducing dielectrophoresis with respect to a plurality of dielectric particles that are filled between electrodes and locally concentrate or reduce the electric field formed between the electrodes, and suspended fine particles.
- a power supply unit that applies an alternating voltage of frequency between the electrodes is provided, and the dielectric particles are brought into contact with or approached to other dielectric particles at the side surface where the surrounding electric field strength is maximum or minimum, and formed near the side surface.
- the suspended fine particles are collected and captured by the dielectrophoresis at the electric field specific part (see, for example, Patent Document 1).
- an electrode chip used in a microorganism measuring apparatus is known.
- the microorganism measuring device In this method, specific microorganisms in the mixed suspension can be quantified with high sensitivity and speed, without the need of specialists.
- An antibody solution tank that supplies the antibody solution to the measurement chamber, and the control unit applies an alternating voltage from the electrophoresis power supply unit to concentrate multiple types of microorganisms and supply the antibody solution from the antibody solution tank It specifically reacts with specific microorganisms, aggregates them, separates other microorganisms, calculates and outputs the number of microorganisms from the change in conductance between the electrodes measured by the measurement unit (for example, patents) Reference 2).
- the PTC current limiter is composed of a PTC element body and an electrode plate fixed to the lower and upper surfaces of the PTC element body.
- the PTC element body is composed of a thick part with a protruding central part and a thick part, and a thin part with an outer peripheral part located outside the thick part being thinner than the thick part.
- the electrode plate has a concave part that fits into the thick part at the center and a thick part at the outer periphery.
- the specific resistance of the thick part at the center is smaller than the specific resistance of the thin part, and the temperature rise of the entire PTC element body is uniform even though the heat dissipation rate at the outer periphery is large (for example, see Patent Document 3). ).
- both electrodes are fixed coaxially to both ends of the insulating cylinder, and then the fuse element is wound from a through hole formed in the bottom surface of one of the electrodes. Pass the insulated core through the insulation tube. After fixing one end of the insulating core to one electrode and filling the insulating cylinder with arc-extinguishing sand
- the other end of the insulating core was fixed to the electrode lid, and the electrode lid was fixed to the other electrode.
- the insulating core can be attached after both electrodes are fixed to the insulating cylinder (see, for example, Patent Document 4).
- Patent Document 1 Japanese Patent Laid-Open No. 2003-200081
- Patent Document 2 Japanese Patent Laid-Open No. 2003-223
- Patent Document 3 Japanese Patent Laid-Open No. 10-326554
- Patent Document 4 Japanese Patent Laid-Open No. 2002-270078
- the conventional PTC element partial discharge with poor insulation in the OFF state occurs, which causes deterioration of the material and deterioration of the return characteristics, that is, ON (O N) There was a problem that the resistance increased and the loss increased.
- the occurrence of partial discharge in a PTC element may cause problems such as EMC and noise to the system.
- the conventional PTC element has a structural problem that the conductive filler exists in the solid matrix. In other words, the conventional PTC element is realized by cutting the conductive filler path by the expansion of the matrix in the OFF state, but in the case of a solid matrix, it is structurally cracked during expansion. There are voids.
- FIG. 9 shows a principle diagram of the basic operation of the conventional PTC element 5.
- the PTC element 5 uses a solid matrix 6, and the OFF state is generated due to the expansion of the solid matrix 6, causing problems of cracks and partial discharges, which deteriorates the recovery characteristics.
- the ON resistance increases and the loss during energization increases.
- the PTC element 5 has a structure in which conductive particles 7 as a filler are mixed in a solid insulator such as ceramics or polymer, that is, a solid matrix 6, and the filler 7 usually contacts and bridges between the electrodes 8. As a result, a conduction path is formed, and as shown in Fig.
- the object of the present invention is to solve the above problems by using a liquid matrix instead of a conventional solid matrix, thereby making it free of cracks. Since the insulation resistance of the liquid matrix is higher than that of gas, the withstand voltage is increased. For example, it can realize a withstand voltage more than 10 times and ensure discharge-free at 00V, and realize a function to protect a secondary battery with a high rated voltage by improving the withstand voltage, expanding the application range. , By shortening the charging time and using a fuse with self-healing characteristics due to dielectrophoretic force as the basic operating principle, it is possible to repeat reliable interrupting current-limiting operation and energizing operation without replacing the fuse element.
- a PTC current limiting element is configured by flowing and dispersing solid conductive particles in a liquid matrix filled in an insulating container and disposing electrodes facing each other, and the voltage between the electrodes.
- An energized state in which the solid conductive particles are collected between the electrodes by the dielectrophoretic force of the solid conductive particles generated by application and bridged between the electrodes, and the solid conductive particles evaporate in the liquid matrix.
- ⁇ Cut-off by current spreading ⁇ Current-limiting state is repeatedly realized, and the solid conductive particles are evaporated by overcurrent.
- the present invention relates to a self-recovering current-limiting fuse using dielectrophoretic force.
- the liquid matrix I is a matrix composed of one or more kinds selected from deionized water containing pure water, insulating oil, insulating organic polymer material, and insulating organic polymer material gel.
- the solid conductive particles constituting the filler are composed of at least one kind selected from low melting point materials such as Sn, Zn, In and Bi. Select from material force, or at least one kind selected from low melting point materials such as Sn, Zn, In, Bi and low contact electric resistance materials such as carbon, Cu, Al, Ag, Au It is formed from the material which consists of 1 type or multiple types.
- the solid conductive particles may include a high melting point material such as W, Ti, and stainless steel in the low melting point material or a mixed material of the low melting point material and the low contact electric resistance material. It can be adjusted so that all particles do not evaporate.
- the solid conductive particles are formed into particles of a predetermined size with the material, or a rod-like or plate-like fixed fuse element made of the material connecting the electrodes is blown by an overcurrent. Then, the fuse element pieces fused and separated in the liquid matrix generated are solidified and formed.
- the electrode is formed of at least Al, Cu, Ag, Au, etc. on an oxide film formed on a glass substrate or a metal substrate.
- the conductive metal material or the arc resistance at the time of interruption / current limiting, electrode wear during repeated use, etc. it is composed of the above-mentioned conductive metal material and high melting point material such as W, Ti, stainless steel, etc. Yes.
- the conductive metal material may be formed as a thin film on the glass substrate or an oxide film formed on the metal substrate.
- the electrode is preferably in the form of a thin film in relation to the size of the solid conductive particles, but if a large number of repeated operations are required, the corresponding thickness must be considered.
- the self-healing current limiting fuse using the dielectrophoretic force is configured so that a heat radiating plate for dissipating the generated heat is attached to the insulating container so as to cope with a large capacity.
- a vibrator that vibrates when it is on to improve the contact between the solid conductive particles.
- the self-healing current-limiting fuse using the dielectrophoretic force uses the liquid matrix. It achieves void-free, crack-free, and high insulation resistance, and protects secondary batteries with high rated voltage as high withstand voltage.
- the self-recovering current-limiting fuse using the dielectrophoretic force repeats the interrupting current-limiting operation and the energizing operation by the self-repairing property of the dielectrophoretic force of the solid conductive particles.
- the self-healing current limiting fuse using the dielectrophoretic force is configured as described above, the use of a liquid matrix suppresses the generation of cracks and voids, improves the withstand voltage, Self-healing characteristics are realized by the dielectrophoretic force of solid conductive particles generated by voltage application. For example, carbon nanofilar etc. as solid conductive particles are mixed or flow dispersed in liquid matrix. ON) resistance can be reduced, and withstand voltage is improved to protect secondary batteries with high rated voltage, expand application range, improve efficiency, shorten charging time, and realize maintenance-free .
- This self-healing current-limiting fuse also cuts off the current when the pearl chain of solid conductive particles is connected to each other against mechanical shocks and vibrations such as earthquakes and collisions. It can also be made to function as a device for use.
- FIG. 1 is a schematic diagram showing the basic operation principle of a self-healing current limiting fuse according to the present invention by the dielectrophoretic force of solid conductive particles.
- FIG. 2 is an explanatory diagram showing the basic principle of the dielectrophoretic force acting on the solid conductive particles in the liquid matrix of the self-healing current limiting fuse using this dielectrophoretic force.
- FIG. 3 is an explanatory diagram showing the principle of applying a voltage to an electrode in a self-healing current limiting fuse using this dielectrophoretic force.
- FIG. 4 is a plan view showing various types of electrodes used in a self-healing current limiting fuse using this dielectrophoretic force.
- FIG. 5 is an explanatory view showing a state in which a voltage is applied between electrodes consisting of a needle body and a flat plate.
- FIG. 6 is an explanatory view showing a state in which a voltage is applied between electrodes composed of a rod and a concave body.
- FIG. 7 is a graph showing the relationship between the number of solid conductive particles for short-circuiting between electrodes and the ON resistance for various electrodes.
- FIG. 8 A graph showing the relationship between the off (OFF) resistance and the on (O N) resistance of various electrodes.
- FIG. 9 is a schematic diagram showing the basic operation principle of a conventional self-healing current limiting fuse. Explanation of symbols
- the dielectrophoretic force acts on the solid conductive particles dispersed in the matrix to which a voltage is applied between the electrodes facing each other.
- the particles are connected continuously to form a conductive path.
- the matrix may be a vacuum in a zero-gravity environment such as a spacecraft where a liquid matrix is preferred in the normal gravitational sphere.
- the liquid matrix 2 is The principle diagram of the basic operation of the dielectrophoretic force acting on the solid conductive particles 3 is shown. Self-healing using this dielectrophoretic force
- the current limiting fuse uses a liquid matrix 2 in place of the conventionally used solid matrix, accommodates the liquid matrix 2 in an insulating container 9, and installs electrodes 4 facing each other through the liquid matrix 2.
- the self-healing current-limiting fuse 1 is constructed by flowing and dispersing solid conductive particles 3 in a liquid matrix 2.
- the dielectrophoretic force FDEP acts on the solid conductive particles 3 in the liquid matrix 2 when a voltage is applied between the electrodes 4 with power supplied by 10 power sources.
- Figure 2 shows the dielectrophoretic force FDEP acting on the solid conductive particles 3 in the liquid matrix 2.
- the dielectrophoretic force FDEP consisting of the horizontal component FDEPr and the vertical component FDEPz acts on the solid conductive particles 3. . That is, as shown in Fig.
- the self-healing current-limiting fuse 1 using this dielectrophoretic force is dielectrophoresis into the solid conductive particles 3 in the liquid matrix 2 when a voltage is applied from the voltage power source 10 between the electrodes 4.
- Force FDEP works, but when the state of solid conductive particles 3 moving by dielectrophoretic force FDEP is observed with a digital video camera 12 using a microscope 11, for example, as shown in Fig. 1 (a) and (d).
- the solid conductive particles 3 are chained in the liquid matrix 2 to secure the conduction state, and as shown in Fig. 1 (b), an overcurrent flows between the electrodes 4, thereby causing the liquid matrix 2 Joule heat is generated in Fig.
- the substrate is not limited to a two-dimensional shape such as a plane, but may be configured with a three-dimensional structure by cutting grooves so that particles can be easily captured.
- Self-healing current limiting flow For example, in order to facilitate the heat dissipation of the board, a heat sink may be attached when the capacity 1 corresponds to the increase in capacity. Alternatively, the self-healing current limiting fuse 1 can be molded around the element as necessary so that it does not break due to thermal expansion when it is off.
- the solid conductive particles 3 form a pearl chain between the electrodes 4 and become conductive paths, that is, energized, that is, turned on.
- an overcurrent flows through the self-healing current limiting fuse 1 in the state where the solid conductive particles 3 shown in Fig. 1 (d) are chained, the operation from the on state to the off state, that is, the state in the direction of the arrow S
- the state changes as shown in Fig. 1 (b). That is, this self-healing current-limiting fuse performs the function of the self-healing current-limiting fuse 1 by repeating the above state.
- the self-healing current limiting fuse 1 using the dielectrophoretic force is based on the original idea of repeatedly realizing the energized state and the interrupting / breaking / current limiting state as described above.
- Self-healing current limiting fuse 1. For example, it satisfies the use conditions such as ON'OFF resistance, current limiting capacity, operating time, and solid conductive particle size.
- the self-healing current limiting fuse 1 is a mechanical device that interrupts current by breaking the pearl chain of the solid conductive particles 3 connected to each other against mechanical shocks and vibrations such as earthquakes and collisions. It can be used as a protection element against special impacts and can be used as a disaster prevention / impact protection element.
- the return speed from the off-state to the on-state can be adjusted by selecting the type of liquid matrix 2 with a different viscous force and the gap between the electrodes 4 depending on the purpose.
- the force S can be handled by setting the electric field value according to the distance and the shape of the electrode 4.
- the self-healing current-limiting fuse using dielectrophoretic force uses the dielectrophoretic force of the solid conductive particles 3 in the liquid matrix 2 to As shown in Fig. 1 (a) and (d), they are collected efficiently and connected to each other as shown in Fig. 1 (a) and (d).
- the current conduction action is realized by evaporating the solid conductive particles 3 and then cutting off by forming a high resistance state by spreading. It is also conceivable to use a gel-like substance consisting only of liquid matrix 2 as the matrix.
- Using a gel-like substance to form a self-healing current-limiting fuse can prevent the particles from spreading far away, which causes a decrease in the collection efficiency of the solid conductive particles 3, by using the liquid matrix 2. This is considered to have the advantage of eliminating problems such as liquid leakage during use. Furthermore, the most important point about the self-healing current-limiting fuse using this dielectrophoretic force when using the liquid matrix 2 is that the existing solid PTC device has a problem as a cause of deterioration of the device. This eliminates the occurrence of discharge and cracks in voids during flow operation, resulting in higher performance and higher capacity of the device.
- the self-healing current limiting fuse using dielectrophoretic force causes the solid conductive particles 3 to flow and disperse in the liquid matrix 2 filled in the insulating container 9, and the electrodes face each other. 4 is arranged to form a self-recovering current-limiting current fuse 1, and the solid conductive particles 3 are collected between the electrodes 4 by the dielectrophoretic force of the solid conductive particles 3 generated by applying a voltage between the electrodes 4. It is possible to repeatedly realize the energized state bridging between 4 and the vaporization of the solid conductive particles 3 in the liquid matrix 2, the interruption by spreading, and the current limiting state, and an overcurrent flows between the electrodes 4. Therefore, it is characterized by realizing a cut-off and current-limiting operation by forming a high resistance state by evaporation / spreading of the solid conductive particles 3.
- the liquid matrix 2 is composed of one or more kinds of matrix selected from deionized water containing pure water, insulating oil, insulating organic polymer material, and insulating organic polymer material gel.
- the liquid matrix 2 can reduce the on-resistance by cooling a metal such as a particle electrode using a refrigerant such as liquid nitrogen.
- the self-recovering current limiting fuse 1 has an on-resistance by attaching a vibrator 22 to the container 9 and the like and applying a voltage between the electrodes 4 to turn on the vibrator 22 to give vibration. Power S can be reduced.
- the self-healing current-limiting fuse 1 when detecting a change based on the resistance change from the off state to the on state, the device vibrates for several seconds even for several milliseconds, and it is better for each solid conductive particle 3 It can reduce the on-resistance by giving a contact state.
- the solid conductive particles 3 constituting the filler are selected from low melting point materials such as tin (Sn) particles, zinc (Zn) particles, indium (In) particles, and bismuth (Bi) particles.
- the first material which is one or more types, can be used.
- the solid conductive particles 3 may be one or more selected from low melting point materials such as tin (Sn) particles, zinc (Zn) particles, indium (In) particles, and bismuth (Bi) particles, and carbon.
- Use a second material consisting of one or more materials selected from low contact electrical resistance materials such as particles, copper (Cu) particles, aluminum (A1) particles, silver (Ag) particles, and gold (Au) particles. Can do.
- the solid conductive particles 3 are made of high melting point materials such as tungsten (W), titanium (Ti), stainless steel, etc. so as not to evaporate and spread in consideration of repeated use. Can be added to resistive materials. Therefore, the linear fuse element forming the solid conductive particles 3 may be composed of a low melting point material, a mixture of a low contact electric resistance material and a high melting point material, or an alloy.
- solid conductive particles 3 are of two types: a start with a linear fuse and a start with a particulate fuse. That is, the solid conductive particles 3 can be produced by forming particles of a predetermined size using the first material and the second material described above. Alternatively, the solid conductive particles 3 can be manufactured through the following steps. That is, solid When the conductive particles 3 are connected between the electrodes 4 by a rod-like or plate-like solid fuse element (not shown) made of the first or second material, and then an overcurrent is passed between the electrodes 4, The solid fuse element is melted and fuse element pieces are fused and separated in the liquid matrix 2, but these fuse element pieces can be formed by solidification.
- the electrodes 4 are energized using the solid fuse element described above, and an overcurrent is once passed between the electrodes 4 in the energized state.
- the solid fuse element melts and decomposes into fuse element pieces, and evaporates and spreads in the liquid matrix 2 to enter a cut-off / current-limiting state, but the fused fuse element pieces are solidified in the liquid matrix 2 respectively.
- Solid conductive particles 3 Therefore, when the flow of overcurrent between the electrodes 4 disappears and a predetermined voltage is applied again between the electrodes 4, the solid conductive particles 3 are collected and function to enter a bridging state. Will do.
- an appropriate amount of particles can be dispersed in the liquid matrix 2 from the beginning so that good on-resistance characteristics can be obtained when turning on again after turning off.
- This self-healing current-limiting fuse using the dielectrophoretic force achieves crack-free, void-free, and high withstand voltage by using the liquid matrix 2, and a secondary battery having a high rated voltage is realized. Can be protected.
- the current-limiting operation is interrupted by the self-healing property of the dielectrophoretic force of the solid conductive particles 3 in the liquid matrix 2.
- the electrode 4 can be formed of a thin film made of one or more kinds of conductive metal forces selected from Al, Cu, Ag, and Au on an oxide film formed on a glass substrate or a metal substrate. , Ti, stainless steel and other high-melting-point materials can be used or added to enable repeated use. In addition, the electrode 4 forms an unequal electric field that does not need to be limited to a thin film, and the particles are easily in contact with the electrode 4.
- Electrode 4 can be a high melting point material alone or a composite containing a high melting point material. It can be made of gold and arc resistant material that is resistant to electric corrosion.
- Figure 4 shows four types of electrode 4 shapes.
- FIG. 4 (a) shows an electrode 4A that is composed of a needle body 13 and a flat plate 14 and faces each other.
- FIG. 4 (b) shows electrodes 4B that are composed of a rod 15 and a recess 16 and face each other.
- Fig. 4 (c) shows the electrodes 4C facing each other and composed of comb teeth 17 and comb teeth 18 having more teeth than the comb teeth 17.
- FIG. 4 shows an electrode 4A that is composed of a needle body 13 and a flat plate 14 and faces each other.
- FIG. 4 (b) shows electrodes 4B that are composed of a rod 15 and a recess 16 and face each other.
- Fig. 4 (c) shows the electrodes 4C facing each other and composed of comb teeth 17 and comb teeth 18 having
- Electrodes 4D shows electrodes 4D facing each other, which are composed of a rod body 19 and a concave body 20 into which the rod body 19 is fitted.
- the electrode 4 shown on the left side of Fig. 4 shows electrodes 4A-N, 4B-N, 4 and 40-N with a narrow gap length between the electrodes 4, and the right side of Fig. 4
- the electrode 4 shown in FIG. 4 shows electrodes 4A—W, 4B-W, 40 ° and 40— ⁇ having a long gap length between the electrodes 4.
- electrodes 4A-N, 4B-N, 4C-N, and 4D-N with narrow gap length between electrodes 4 have a gap length between electrodes 4 of 30 xm, for example.
- electrodes 4A-W, 4 ⁇ -W, 4C-W, and 4D-W, which have a long gap length between electrodes 4 have a gap length between electrodes 4 of about 150 ⁇ , for example.
- FIG. 5 shows the movement state of the solid conductive particles 3 in the liquid matrix 2 when the electrode 4 ⁇ in FIG. 4 is used.
- Fig. 5 (a) shows an off state in which the solid conductive particles 3 float in the liquid matrix 2 before voltage is applied between the electrodes 4A.
- Figure 5 (b) shows the ON ( ⁇ N) state in which the solid conductive particles 3 contact the chain state in the liquid matrix 2 when a voltage is applied between the power source 10 and the electrode 4A.
- FIG. 6 shows the movement state of the solid conductive particles 3 in the liquid matrix 2 when the electrode 4B of FIG. 4 is used.
- Fig. 6 (a) shows an off state in which the solid conductive particles 3 float in the liquid matrix 2 before voltage is applied between the electrodes 4B.
- Figure 6 (b) shows the ON ( ⁇ N) state in which the solid conductive particles 3 are in chain contact in the liquid matrix 2 when a voltage is applied between the power source 10 and the electrode 4B.
- Figure 7 shows solids for short-circuiting electrodes 4 for various electrodes 4A-N, 4B-N, 4C-N, 4D-N, 4A-W, 4B-W, 4C-W, 4D_W.
- 4 is a graph showing the relationship between the number of conductive particles 3 and the ON ( ⁇ N) resistance.
- Electrode 4C— N It can be seen that achieves the minimum on ( ⁇ N) resistance. Also, it can be seen that electrode 4A and electrode 4B require a large number of solid conductive particles 3 to realize the on ( ⁇ N) state, and the gap space between electrodes 4 is wide. It can also be seen that the ON resistance increases as the number of solid conductive particles 3 increases, and the contact resistance increases.
- the on (ON) state can be realized with a small number of solid conductive particles 3, but the on (ON) resistance is not so different between the electrode 4C and the electrode 4D. Since the size and shape of the conductive particles 3 are not uniform, it can be seen that the contact state of the solid conductive particles 3 differs, and that the contact electrical resistance is not necessarily determined by the number of particles.
- Figure 8 shows the OFF resistance and ON for various electrodes 4A-N, 4B-N, 4C-N, 4D-N, 4A-W, 4B-W, 4C-W, 4D-W.
- the ON (ON) resistance and the OFF (OFF) resistance vary with the difference in the shape of the electrode 4 and the difference in the gap length between the electrodes 4. Different power, power of S.
- the larger the ratio (ROFF / RON) of the on (ON) resistance to the off (OFF) resistance the dotted line in the figure represents each ratio. That is, ROFF / RON is plotted within 140 to 3000 times.
- electrode 4D-N shows the best resistance change.
- the change is 3000 times.
- the resistance of the electrode substrate is low, so the OFF resistance is limited by the resistance of the electrode substrate.
- the off-resistance can be further increased 10 to 100 times by making the substrate with a large resistance.
- the on (ON) resistance can be further reduced by mixing carbon nanofiers and reducing the contact electrical resistance.
- the OFF resistance is in the order of several hundreds k ⁇ to several ⁇
- the ON ( ⁇ N) resistance is in the order of ⁇
- the resistance change ratio is 10 8 to 10 9. Will be twice as large.
- the self-healing current limiting fuse using the dielectrophoretic force according to the present invention has a high capacity and high capacity in, for example, electronic devices such as mobile phones, notebook personal computers, electric components of electric vehicles, and hybrid vehicles. It can be applied as a protection element for a secondary battery for voltage.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Dispersion Chemistry (AREA)
- Fuses (AREA)
- Battery Electrode And Active Subsutance (AREA)
- Connection Of Batteries Or Terminals (AREA)
- Thermistors And Varistors (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006531674A JP3955956B2 (ja) | 2004-08-30 | 2005-08-10 | 誘電泳動力を用いた自己回復性限流ヒューズ |
US11/596,746 US7626483B2 (en) | 2004-08-30 | 2005-08-10 | Self-recovering current limiting fuse using dielectrophoretic force |
DE602005011021T DE602005011021D1 (de) | 2004-08-30 | 2005-08-10 | Selbst-regenerierende strombegrenzungssicherung unter verwendung einer dielektrophoretischen kraft |
EP05770830A EP1786011B1 (en) | 2004-08-30 | 2005-08-10 | Self-recovery current limiting fuse using dielectrophoretic force |
KR1020077002655A KR101158149B1 (ko) | 2004-08-30 | 2005-08-10 | 유전영동력(誘電泳動力)을 이용한 자기회복성(自己回復性)한류(限流)퓨즈 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004-249481 | 2004-08-30 | ||
JP2004249481 | 2004-08-30 |
Publications (1)
Publication Number | Publication Date |
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WO2006025199A1 true WO2006025199A1 (ja) | 2006-03-09 |
Family
ID=35999859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2005/014628 WO2006025199A1 (ja) | 2004-08-30 | 2005-08-10 | 誘電泳動力を用いた自己回復性限流ヒューズ |
Country Status (6)
Country | Link |
---|---|
US (1) | US7626483B2 (ja) |
EP (1) | EP1786011B1 (ja) |
JP (1) | JP3955956B2 (ja) |
KR (1) | KR101158149B1 (ja) |
DE (1) | DE602005011021D1 (ja) |
WO (1) | WO2006025199A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010103812A (ja) * | 2008-10-24 | 2010-05-06 | Nikon Corp | スイッチング素子およびスライドトランス |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009055763A2 (en) * | 2007-10-26 | 2009-04-30 | Kowalik Daniel P | Micro-fluidic bubble fuse |
JP5050265B2 (ja) * | 2007-11-09 | 2012-10-17 | 国立大学法人九州工業大学 | 自己回復性限流ヒューズ |
JP5050266B2 (ja) * | 2008-01-10 | 2012-10-17 | 国立大学法人九州工業大学 | メカニカルヒューズ及びその感度設定方法 |
EP2390883A1 (en) * | 2010-05-26 | 2011-11-30 | Tsan-Chi Chen | Non-solid conductive surge absorber |
US8953314B1 (en) * | 2010-08-09 | 2015-02-10 | Georgia Tech Research Corporation | Passive heat sink for dynamic thermal management of hot spots |
WO2015125944A1 (ja) | 2014-02-21 | 2015-08-27 | 学校法人早稲田大学 | 自己修復型配線及び伸縮デバイス |
US10446345B2 (en) | 2018-01-09 | 2019-10-15 | Littelfuse, Inc. | Reflowable thermal fuse |
WO2022212132A1 (en) | 2021-03-31 | 2022-10-06 | Enovix Operations Inc. | Electrode assemblies including current limiters, secondary batteries having such electrode assemblies, and methods of testing |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6199301A (ja) * | 1984-10-22 | 1986-05-17 | 松下電器産業株式会社 | 電力用サ−ミスタ |
JPH09326302A (ja) * | 1996-06-04 | 1997-12-16 | Mitsubishi Electric Corp | Ptc材料組成物及びptc材料 |
JP2000331592A (ja) * | 1999-05-19 | 2000-11-30 | Agilent Technol Inc | 電流遮断器 |
JP2002075329A (ja) * | 2000-08-31 | 2002-03-15 | Matsushita Electric Ind Co Ltd | Ptc素子の取付方法及びこれを用いた電池パック |
US20030048619A1 (en) * | 2001-06-15 | 2003-03-13 | Kaler Eric W. | Dielectrophoretic assembling of electrically functional microwires |
JP2003317602A (ja) * | 2002-04-22 | 2003-11-07 | Ube Electronics Ltd | 電気ヒューズ材料及び電気ヒューズ素子 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3838373A (en) * | 1970-12-25 | 1974-09-24 | Mitsubishi Electric Corp | Self-recovering current limiter |
JP2884120B2 (ja) | 1991-03-09 | 1999-04-19 | 東洋自動機株式会社 | 袋詰包装機の運転方法 |
US5581192A (en) * | 1994-12-06 | 1996-12-03 | Eaton Corporation | Conductive liquid compositions and electrical circuit protection devices comprising conductive liquid compositions |
US5471185A (en) * | 1994-12-06 | 1995-11-28 | Eaton Corporation | Electrical circuit protection devices comprising conductive liquid compositions |
US5691689A (en) * | 1995-08-11 | 1997-11-25 | Eaton Corporation | Electrical circuit protection devices comprising PTC conductive liquid crystal polymer compositions |
US5907272A (en) * | 1996-01-22 | 1999-05-25 | Littelfuse, Inc. | Surface mountable electrical device comprising a PTC element and a fusible link |
JPH10326554A (ja) | 1997-03-27 | 1998-12-08 | Ngk Insulators Ltd | Ptc素子を備えた限流器及び/又は遮断器 |
US5796569A (en) * | 1997-06-19 | 1998-08-18 | Yazaki Corporation | Cylindrical PTC circuit overcurrent protection device |
US6191681B1 (en) * | 1997-07-21 | 2001-02-20 | General Electric Company | Current limiting device with electrically conductive composite and method of manufacturing the electrically conductive composite |
DE19909558C1 (de) * | 1999-03-05 | 2000-05-25 | Moeller Gmbh | Selbsterholende Strombegrenzungseinrichtung mit Flüssigmetall |
DE19914147A1 (de) * | 1999-03-29 | 2000-10-05 | Moeller Gmbh | Selbsterholende Strombegrenzungseinrichtung mit Flüssigmetall |
DE19916324A1 (de) * | 1999-04-12 | 2000-10-19 | Moeller Gmbh | Selbsterholende Strombegrenzungseinrichtung mit Flüssigmetall |
DE19927065A1 (de) * | 1999-06-15 | 2000-12-21 | Moeller Gmbh | Selbsterholende Strombegrenzungseinrichtung mit Flüssigmetall |
US6489879B1 (en) * | 1999-12-10 | 2002-12-03 | National Semiconductor Corporation | PTC fuse including external heat source |
JP3967087B2 (ja) | 2001-03-09 | 2007-08-29 | エナジーサポート株式会社 | 限流ヒューズ及びその製造方法 |
DE10120517B4 (de) * | 2001-04-26 | 2013-06-06 | Epcos Ag | Elektrischer Vielschicht-Kaltleiter und Verfahren zu dessen Herstellung |
JP3869686B2 (ja) | 2001-06-26 | 2007-01-17 | 独立行政法人科学技術振興機構 | 微生物測定装置とそのために使用される微生物測定用電極チップ、及び微生物測定方法 |
JP3811404B2 (ja) | 2002-01-10 | 2006-08-23 | 独立行政法人科学技術振興機構 | 誘電泳動フィルター装置及び誘電泳動による懸濁微粒子除去方法 |
-
2005
- 2005-08-10 US US11/596,746 patent/US7626483B2/en not_active Expired - Fee Related
- 2005-08-10 JP JP2006531674A patent/JP3955956B2/ja active Active
- 2005-08-10 DE DE602005011021T patent/DE602005011021D1/de active Active
- 2005-08-10 KR KR1020077002655A patent/KR101158149B1/ko not_active IP Right Cessation
- 2005-08-10 EP EP05770830A patent/EP1786011B1/en not_active Expired - Fee Related
- 2005-08-10 WO PCT/JP2005/014628 patent/WO2006025199A1/ja active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6199301A (ja) * | 1984-10-22 | 1986-05-17 | 松下電器産業株式会社 | 電力用サ−ミスタ |
JPH09326302A (ja) * | 1996-06-04 | 1997-12-16 | Mitsubishi Electric Corp | Ptc材料組成物及びptc材料 |
JP2000331592A (ja) * | 1999-05-19 | 2000-11-30 | Agilent Technol Inc | 電流遮断器 |
JP2002075329A (ja) * | 2000-08-31 | 2002-03-15 | Matsushita Electric Ind Co Ltd | Ptc素子の取付方法及びこれを用いた電池パック |
US20030048619A1 (en) * | 2001-06-15 | 2003-03-13 | Kaler Eric W. | Dielectrophoretic assembling of electrically functional microwires |
JP2003317602A (ja) * | 2002-04-22 | 2003-11-07 | Ube Electronics Ltd | 電気ヒューズ材料及び電気ヒューズ素子 |
Non-Patent Citations (1)
Title |
---|
See also references of EP1786011A4 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010103812A (ja) * | 2008-10-24 | 2010-05-06 | Nikon Corp | スイッチング素子およびスライドトランス |
Also Published As
Publication number | Publication date |
---|---|
US20070241856A1 (en) | 2007-10-18 |
EP1786011B1 (en) | 2008-11-12 |
EP1786011A1 (en) | 2007-05-16 |
JPWO2006025199A1 (ja) | 2008-05-08 |
EP1786011A4 (en) | 2007-09-05 |
US7626483B2 (en) | 2009-12-01 |
KR20070046838A (ko) | 2007-05-03 |
DE602005011021D1 (de) | 2008-12-24 |
KR101158149B1 (ko) | 2012-06-19 |
JP3955956B2 (ja) | 2007-08-08 |
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