WO2005008227A1 - 透過撮影装置 - Google Patents
透過撮影装置 Download PDFInfo
- Publication number
- WO2005008227A1 WO2005008227A1 PCT/JP2003/009232 JP0309232W WO2005008227A1 WO 2005008227 A1 WO2005008227 A1 WO 2005008227A1 JP 0309232 W JP0309232 W JP 0309232W WO 2005008227 A1 WO2005008227 A1 WO 2005008227A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- radiation
- target
- radiation detector
- source device
- detector
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
Definitions
- FIG. 2 is a side view in which a part of the transmission imaging apparatus is broken.
- I I image intensifier 3 with high detectability is used.
- pincushion distortion occurs in the image of I13, it is also possible to correct the pincushion distortion of the photographed image using a distortion correction lens.
- the source device 2, the first radiation detector 3, and the second radiation detector The head 4 is integrally moved in the Y direction, and the sample table 5 is moved in the X direction.
- the radiation source device 2, the first radiation detector 3, and the second radiation detector 4 may be fixed, and the sample table 5 may be relatively moved with respect to them.
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2003/009232 WO2005008227A1 (ja) | 2003-07-22 | 2003-07-22 | 透過撮影装置 |
US10/565,745 US7397894B2 (en) | 2003-07-22 | 2003-07-22 | Transmission imager |
JP2005504388A JP4369923B2 (ja) | 2003-07-22 | 2003-07-22 | 透過撮影装置 |
CNB038267837A CN100485372C (zh) | 2003-07-22 | 2003-07-22 | 透射成像装置 |
AU2003252227A AU2003252227A1 (en) | 2003-07-22 | 2003-07-22 | Transmission imager |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2003/009232 WO2005008227A1 (ja) | 2003-07-22 | 2003-07-22 | 透過撮影装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2005008227A1 true WO2005008227A1 (ja) | 2005-01-27 |
Family
ID=34074125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2003/009232 WO2005008227A1 (ja) | 2003-07-22 | 2003-07-22 | 透過撮影装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7397894B2 (ja) |
JP (1) | JP4369923B2 (ja) |
CN (1) | CN100485372C (ja) |
AU (1) | AU2003252227A1 (ja) |
WO (1) | WO2005008227A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105452804B (zh) * | 2013-05-10 | 2019-01-15 | 株式会社尼康 | X线装置及构造物的制造方法 |
WO2015134277A1 (en) | 2014-03-05 | 2015-09-11 | Faxitron Bioptics, Llc | System and method for multi-axis imaging of specimens |
WO2017040977A1 (en) | 2015-09-04 | 2017-03-09 | Faxitron Bioptics, Llc | Multi-axis specimen imaging device with embedded orientation markers |
WO2017100475A1 (en) * | 2015-12-09 | 2017-06-15 | Integrated-X, Inc. | Systems and methods for inspection using electromagnetic radiation |
US11083426B2 (en) * | 2016-11-04 | 2021-08-10 | Hologic, Inc. | Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet |
EP3682228A4 (en) | 2017-09-11 | 2021-06-16 | Faxitron Bioptics, LLC | ADAPTIVE OBJECT MAGNIFICATION IMAGING SYSTEM |
US11986170B2 (en) | 2018-12-26 | 2024-05-21 | Hologic, Inc. | Tissue imaging in presence of fluid during biopsy procedure |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001004559A (ja) * | 1999-06-16 | 2001-01-12 | Hamamatsu Photonics Kk | X線検査装置 |
JP2001153819A (ja) * | 1999-11-26 | 2001-06-08 | Hitachi Kokusai Electric Inc | X線撮像装置 |
JP2003057195A (ja) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | 3次元構造分析方法、及び3次元構造分析装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3989944A (en) * | 1975-09-05 | 1976-11-02 | The United States Of America As Represented By The Secretary Of The Navy | Parallel-beam X-ray optics for measuring asbestos |
JP4355875B2 (ja) | 2000-01-20 | 2009-11-04 | 株式会社島津製作所 | X線撮影装置 |
JP2002052015A (ja) * | 2000-08-07 | 2002-02-19 | Shimadzu Corp | 平面型放射線検出器ユニット及びx線撮像装置 |
US20040120457A1 (en) * | 2002-12-20 | 2004-06-24 | University Of Massachusetts Medical Center | Scatter reducing device for imaging |
US7065175B2 (en) * | 2003-03-03 | 2006-06-20 | Varian Medical Systems Technologies, Inc. | X-ray diffraction-based scanning system |
EP1833075B1 (en) | 2004-12-27 | 2011-02-16 | Hamamatsu Photonics K.K. | X-ray tube and x-ray source |
-
2003
- 2003-07-22 JP JP2005504388A patent/JP4369923B2/ja not_active Expired - Lifetime
- 2003-07-22 CN CNB038267837A patent/CN100485372C/zh not_active Expired - Fee Related
- 2003-07-22 US US10/565,745 patent/US7397894B2/en not_active Expired - Fee Related
- 2003-07-22 WO PCT/JP2003/009232 patent/WO2005008227A1/ja active Application Filing
- 2003-07-22 AU AU2003252227A patent/AU2003252227A1/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001004559A (ja) * | 1999-06-16 | 2001-01-12 | Hamamatsu Photonics Kk | X線検査装置 |
JP2001153819A (ja) * | 1999-11-26 | 2001-06-08 | Hitachi Kokusai Electric Inc | X線撮像装置 |
JP2003057195A (ja) * | 2001-08-09 | 2003-02-26 | X-Ray Precision Inc | 3次元構造分析方法、及び3次元構造分析装置 |
Also Published As
Publication number | Publication date |
---|---|
CN100485372C (zh) | 2009-05-06 |
CN1802561A (zh) | 2006-07-12 |
JP4369923B2 (ja) | 2009-11-25 |
JPWO2005008227A1 (ja) | 2006-08-31 |
US7397894B2 (en) | 2008-07-08 |
US20070189450A1 (en) | 2007-08-16 |
AU2003252227A1 (en) | 2005-02-04 |
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