WO2005002054A1 - 半導体スイッチ - Google Patents
半導体スイッチ Download PDFInfo
- Publication number
- WO2005002054A1 WO2005002054A1 PCT/JP2004/007756 JP2004007756W WO2005002054A1 WO 2005002054 A1 WO2005002054 A1 WO 2005002054A1 JP 2004007756 W JP2004007756 W JP 2004007756W WO 2005002054 A1 WO2005002054 A1 WO 2005002054A1
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- WO
- WIPO (PCT)
- Prior art keywords
- normally
- gate
- semiconductor switch
- terminal
- fetq
- Prior art date
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 107
- 150000001875 compounds Chemical class 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 27
- 230000007257 malfunction Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
- 230000015556 catabolic process Effects 0.000 description 4
- 241000282320 Panthera leo Species 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/567—Circuits characterised by the use of more than one type of semiconductor device, e.g. BIMOS, composite devices such as IGBT
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
Definitions
- the present invention relates to a semiconductor switch, in which a high-voltage normally-on FET formed of a compound semiconductor or Si and two low-on-resistance MOS FETs are connected in series, and a high-voltage semiconductor that can be used in an alternating current.
- a semiconductor switch in which a high-voltage normally-on FET formed of a compound semiconductor or Si and two low-on-resistance MOS FETs are connected in series, and a high-voltage semiconductor that can be used in an alternating current.
- a semiconductor switch in which a high-voltage normally-on FET formed of a compound semiconductor or Si and two low-on-resistance MOS FETs are connected in series, and a high-voltage semiconductor that can be used in an alternating current.
- AC switch As an AC semiconductor switch (hereinafter referred to as an AC switch) that is turned on / off by a control signal to control the input AC signal on / off, as shown in FIGS. 1, 2, and 3, There is something.
- AC switches use two high-voltage FETs to control ON / OFF of an AC signal applied to both ends of the first terminal 11 and the second terminal 12.
- the AC switch shown in Fig. 1 has a normally-off type MOS SFE TQ 11 (referred to as FE TQ 11 1) and a normally-off type that are connected in reverse series at both ends of the first terminal ⁇ 1 and the second terminal ⁇ 2.
- MO SFE TQ 1 2 (referred to as FE TQ 12).
- the normally-off type FETQ 13 and the normally-off type FETQ 14 are connected in anti-series, and the connection of the drain and the source is reversed from that shown in FIG.
- the first gate signal is applied with a positive voltage from the gate terminal G 1 t to the gate G 1 of FETQ 11
- the second gate signal is applied with a positive voltage on the gate terminal G 1
- both the FETQ 11 and the FETQ 12 are turned on. Therefore, during a period in which the first and second gate signals are at a positive voltage, when a positive voltage is applied to the first terminal 11, a current flows from the ⁇ terminal 11 to the second terminal 12, When a positive voltage is applied to the second terminal 12, a current flows from the second terminal 12 to the first terminal 11.
- the first and second gate signals are zero voltage and applied to the gates of FETQ 11 and FETQ 12 are active. As a result, no current flows through the AC switch.
- the AC switch shown in FIG. 2 operates in the same manner as the AC switch shown in FIG.
- the AC switch shown in FIG. 3 has a first series circuit composed of a diode D 11 and a normally-off type FETQ 15 at both ends of a first terminal 11 and a second terminal 12, and a diode D 1 2 And a second series circuit comprising a normally-off type FETQ 16 are connected in parallel.
- the anode of the diode D 11 is connected to the first terminal 11, and the anode of the die D 12 is connected to the second terminal 12.
- the first gate signal is applied with a positive voltage from the gate terminal G 1 t to the gate G 1 of FETQ 15, and the second gate signal is applied with the positive voltage.
- G 2 t is applied to the gate G 2 of FETQ 16
- both FETQ 15 and FETQ 16 are turned on. Therefore, a current flows from the first terminal 11 to the terminal D 11 ⁇ F E TQ ⁇ 5 ⁇ the second terminal 12. That is, during a period in which the first and second gate signals are positive voltages, a current flows from the first terminal 11 to the second terminal 12 when a positive voltage is applied to the first terminal 11. .
- a positive voltage is applied to the second terminal 12
- a current flows through the second terminal 12 ⁇ the diode D 12 ⁇ FETQ 16 ⁇ the first terminal 11. That is, a current flows from the second terminal 12 to the first terminal 11.
- the first and second gate signal is zero voltage, when applied to the gate Bok of F ETQ 1 5 and FE TQ 1 6, since the c to F ETQ 1 5 and F ETQ 1 6 turns off both Current does not flow through the AC switch.
- FETs made of compound semiconductors such as SiC and GaN have low resistance even if they have a high withstand voltage, and are very suitable for large power switches. Only FETs (FETs with drain current flowing when the gate signal is zero) can be manufactured. In this normally-on type FET, there is no gate signal when power is turned on, so a drain current flows and damage is caused, making it extremely difficult to use. For this reason, it was necessary to develop a FET in which the drain current did not flow even if the gate signal was zero.
- a normally-on type FETQ 18 made of high-voltage SiC and a normally-off type of low-voltage low on-resistance are provided at both ends of the first terminal ⁇ 1 and the second terminal 12.
- a DC switch in which a cascade-connected FETQ 17 is used Japanese Patent Laid-Open No. 5-75010. This DC switch has a high voltage and a low on-resistance, and a DC signal is applied between the first terminal 11 and the second terminal 12.
- the FETQ 17 when a voltage equal to or higher than the threshold is applied to the gate G 1 of the FETQ 17, the FETQ 17 turns on and the FETQ 18 turns on.
- a voltage lower than the threshold is applied to the gate G 1 of the FETQ 17, the FETQ 17 is turned off and the FETQ 18 is also turned off. That is, it can be turned on / off by the gate G1 of the FETQ17, and can operate as if it were one high breakdown voltage FET.
- the AC switch shown in Fig. 4 cannot be used for AC. For this reason, AC switches have been realized using circuits as shown in Figs.
- the AC switch shown in Fig. 5 is obtained by applying the DC switch shown in Fig. 4 to the AC switch shown in Fig. 3, and the FETQ 19 and Q21 shown in Fig. 5 are replaced by the FETQ 15 shown in Fig. 3. 5 correspond to the FETQ 16 shown in FIG. 3, and the operation is the same as the operation shown in FIGS.
- the AC switch shown in Fig. 6 is obtained by applying the DC switch shown in Fig. 4 to the AC switch shown in Fig. 1, and FETQ 25 and Q26 shown in Fig. 6 are connected to FETQ11 shown in Fig. 1.
- FETQ 23 and Q 24 shown in FIG. 6 correspond to FETQ 12 shown in FIG. 1, and the operation is the same as the operation shown in FIGS. Disclosure of the invention
- the AC switch shown in Fig. 5 requires two normally-on type FETs compared to the AC switch shown in Fig. 3, and two extra power diodes for passing the main current. In other words, there were many components, the cost was high, and the loss due to the diode was large.
- the AC switch shown in Fig. 6 also had many components and was expensive.
- An object of the present invention is to provide an inexpensive semiconductor switch which has a high withstand voltage and which can reduce a loss by controlling an AC signal on and off.
- the present invention has been made to solve the above problems, and a first aspect of the present invention is to connect a normally-on type F £ and a first and second normally-off type FE ⁇ in series.
- a normally-on type semiconductor switch is provided.
- FET is connected between the first normally-off type FET and the second normally-off type FET.
- a second aspect of the present invention is a semiconductor switch in which a plurality of normally-on type FETs connected in series and first and second normally-off type FETs are connected in series.
- a plurality of normally-on type FETs are connected between the first normally-off type FET and the second normally-off type FET.
- FIG. 1 is a circuit diagram of a first example of a conventional semiconductor switch.
- FIG. 2 is a circuit diagram of Example 2 of a conventional semiconductor switch.
- FIG. 3 is a circuit diagram of Example 3 of a conventional semiconductor switch.
- FIG. 4 is a circuit diagram of Kiyoshi 4 of a conventional semiconductor switch.
- FIG. 5 is a circuit diagram of Example 5 of a conventional semiconductor switch.
- FIG. 6 is a circuit diagram of Example 6 of a conventional semiconductor switch.
- FIG. 7 is a basic circuit diagram of the semiconductor switch according to the first embodiment of the present invention.
- FIG. 8 is a specific circuit diagram of the semiconductor switch according to the first embodiment of the present invention.
- FIG. 9 is a first equivalent circuit diagram of the semiconductor switch shown in FIG.
- FIG. 10 is a second equivalent circuit diagram of the semiconductor switch shown in FIG.
- FIG. 11 is a third equivalent circuit diagram of the semiconductor switch shown in FIG.
- FIG. 12 is a fourth equivalent circuit diagram of the semiconductor switch shown in FIG.
- FIG. 13 is a circuit diagram of a semiconductor switch according to the second embodiment of the present invention.
- FIG. 14 is a circuit diagram of a semiconductor switch according to the third embodiment of the present invention.
- FIG. 5 is a circuit diagram of a semiconductor switch according to a fourth embodiment of the present invention.
- FIG. 16 is a circuit diagram of a semiconductor switch according to the fifth embodiment of the present invention.
- FIG. 17 is a circuit diagram of a semiconductor switch according to the sixth embodiment of the present invention.
- FIG. 18 is a circuit diagram of a semiconductor switch according to the seventh embodiment of the present invention.
- FIG. 19 is a circuit diagram of a semiconductor switch according to the eighth embodiment of the present invention. BEST MODE FOR CARRYING OUT THE INVENTION
- the semiconductor switch according to the first embodiment has a configuration in which a high-voltage compound semiconductor FET is connected in series between two Si low-voltage low-on-resistance MOSFETs to control on / off of an AC signal.
- the semiconductor switch is characterized in that the loss is reduced and the semiconductor switch has a high withstand voltage and is inexpensive.
- FIG. 7 is a basic circuit diagram of the semiconductor switch according to the first embodiment of the present invention.
- the semiconductor switch shown in FIG. 7 has a normally-on type FETQ 3 connected between a normally-off type FETQ ⁇ and a normally-on type FETQ 2.
- FE The source S of TQ 1 is connected to the first terminal 11, the drain D of FE TQ 1 is connected to the first main electrode 2 1 of FE TQ 3, and the second main electrode 22 of F ETQ 3 is connected to FE TQ 2
- the source S of FETQ 2 is connected to the drain D, and is connected to the second terminal 12.
- F E T Q 1 and Q 2 are low-voltage low-on-resistance MO S FETs made of Si.
- the FETQ 3 has a low on-resistance and a high withstand voltage, and is made of, for example, a compound semiconductor such as SiC or GaN or MESFET.
- the drain and source are formed symmetrically, so that the first main electrode connected to the higher potential terminal between the first terminal 11 and the second terminal 12 21 or the second main electrode 22 serves as a drain, and the other main electrode connected to a terminal having a lower potential serves as a source.
- the first gate signal composed of a pulse signal or the like is applied to the gate G 1 of the FETQ 1 via the gate terminal G 1 t, and the second gate signal is supplied to the gate terminal G 2 t.
- the third gate signal is applied to the gate G3 (control electrode) of the FETQ3 via the gate terminal G3t via the gate terminal G3t. ing.
- the first main electrode 21 serves as a drain
- the second main electrode 22 serves as a source.
- FETQ3 is turned on. I do.
- the first gate signal is applied with a positive voltage from the gate terminal G 1 t to the gate G 1 of FETQ 1
- the second gate signal is applied with a positive voltage and the gate terminal G 2 t FE TQ ⁇ and FE TQ 2 are both turned on when applied to gate G 2 of FETQ 2 from.
- the first main electrode 21 of the FETQ 3 becomes a source and the second main electrode 22 becomes a drain.
- the potential of the gate G 3 is higher than the potential of the first main electrode 21 serving as a source, or When a third gate signal having a zero potential is input from the gate terminal G 3 t, the FET Q 3 is turned on.
- the first gate signal is applied with a positive voltage from the gate terminal G 1 t to the gate G 1 of the FETQ 1
- the second gate signal is applied with a positive voltage from the gate terminal G 2 t to the FE TQ FE TQ 1 and FE TQ 2 both turn on when applied to gate G 2 of 2.
- the main electrode as the source is When a gate signal that makes the potential of the gate G3 lower than the potential of the gate is input, the FETQ3 is turned off.
- a high-voltage compound semiconductor FET is connected in series between two Si low-voltage low-on-resistance MOS SFETs, and an AC signal
- the loss can be reduced, and a semiconductor switch with high breakdown voltage and low cost can be provided.
- FIG. 8 is a specific circuit diagram of the semiconductor switch according to the first embodiment of the present invention.
- the voltage due to the third gate signal from the gate terminal G 3 t is input to the gate G 3 of the FETQ 3, but in the semiconductor switch shown in FIG. 8, the first terminal The input of the third gate signal is eliminated by applying the voltage based on the AC signal of the first and second terminals 12 to the gate G3 of the FETQ 3 via the resistor.
- the source S of FE TQ 1 is connected to the cathode of die D 1 and one end of a resistor R 1 as a second current supply means, and the source S of F ETQ 2 is connected to the cathode and die D of diode D 2.
- One end of a resistor R2 as first current supply means is connected.
- the anode of the die D1 and the other end of the resistor R1 and the anode of the diode D2 and the other end of the resistor R2 are connected to a gate G3 of the FETQ3.
- Diodes D 1 and D 2 are diodes that select the lower potential of the sources of FETQ 1 and Q 2.
- the resistors R 1 and R 2 are resistors that allow a bias current to flow through the die. Since the other configuration is the same as the configuration shown in FIG. 7, the same portions are denoted by the same reference numerals, and detailed description thereof will be omitted.
- the circuit becomes the first equivalent circuit shown in FIG. At this time, it can be turned on / off by the second gate signal input to the gate G2 of FETQ2. That is, by selecting the lower potential of the diode D 1 and the diode D 2, the diode D 2 is turned on, and the gate G 3 of the FETQ 3 is connected to the potential of the source S of the FETQ 2. become. Therefore, when F ETQ2 is on, F ETQ 3 is on.
- the equivalent circuit when the potential of the first terminal 11 is low and the potential of the second terminal 12 is high, the equivalent circuit is as shown in FIG. It can be turned on / off by the first gate signal input to the gate G1 of FETQ1. That is, when the lower potential is selected between the diode D 1 and the diode D 2, the diode D 1 is turned on, and the gate G 3 of the FETQ3 is connected to the source S of the FETQ1. Potential. Therefore, when FETQ1 is on, FETQ3 is on. When the FET Q1 is off, no drain current flows, so that the drain current of the FET Q3 does not flow and the FET Q3 turns off. That is, the equivalent circuit is as shown in FIG. At this time, if the gate signal of FETQ2 is input, the forward drop of the body diode Dq2 can be reduced by the MOSFE. That is, the AC signal can be turned on / off at the first terminal 11 and the second terminal 12.
- FIG. 13 is a circuit diagram of a semiconductor switch according to the second embodiment of the present invention.
- the semiconductor switch according to the second embodiment is provided with FETQ4 and Q5 instead of the diodes D1 and D2 of the semiconductor switch according to the first embodiment to prevent malfunction due to noise and leakage current. It is characterized by prevention.
- F ETQ4 and Q5 are normally-off type switches such as MOSFETs.
- the drain D of FETQ4 is connected to the first terminal 11 and the drain D of FETQ 5 is the second terminal. Connected to 1 and 2.
- the source S of FETQ4 and the source S of FETQ5 are connected to the gate G3 of FETQ3.
- the gate of the FET connected to the low potential terminal is turned on by inputting a positive voltage gate signal, and the gate of the FET connected to the high potential terminal is input.
- the input is turned off by inputting a negative voltage gate signal to the input.
- the FET connected to the FET with the lower source potential of FET Q 1 and Q 2 of FE TQ4 and FE TQ 5 is turned on, and the FET with the higher source potential of FET Q 1 and Q 2 is turned on. Turn off the FET connected to the FET.
- the lion Z can be turned off by the first gate signal input to the gate G1 of the FETQ1. That is, it is turned on by inputting a positive voltage gate signal to the gate of FETQ4.
- the gate G 3 of the FETQ 3 becomes the potential of the source S of the FETQ 1.
- FETQ 3 is on when FETQ 1 is on.
- FETQ 1 is off, no drain current flows, so no drain current for FETQ 3 flows and it is off. That is, the AC signal can be turned on / off at the first terminal 11 and the second terminal 12.
- the semiconductor switch according to the second embodiment the same effect as that of the semiconductor switch according to the first embodiment can be obtained, and the FETs Q 4 and Q 5 can be stably turned on. Malfunction due to noise and leakage current can be prevented.
- FIG. 14 is a circuit diagram of a semiconductor switch according to the third embodiment of the present invention.
- a phenomenon may occur in which the current flows halfway without turning on completely when the gate voltage is zero.
- the semiconductor switch according to the third embodiment is such that a current flows from a terminal having a high potential to the gate G3 of the FETQ3 via a diode and a resistor, and the gate voltage is changed to a positive voltage to change the gate voltage of the FETQ3. Is turned on without fail.
- FIG. 14 the same portions as those shown in FIG. 7 are denoted by the same reference numerals, and the description of the same portions will be omitted.
- the first terminal 1 1 is connected to the anode of the diode D 1, and the cathode of the diode D 1 is connected to the anode of the diode D 3, the anode of the diode D 4 and the gate G 3 of the FET Q 3 via the resistor R 1. It is connected to the.
- the cathode of diode D3 is connected to the gate G1 of FETQ1, and the cathode of die D4 is connected to the gate G2 of FETQ2.
- the anode of the diode D2 is connected to the second terminal 12, and the power source of the diode D2 is connected to one end of the resistor R1 and the cathode of the diode D1.
- the first main electrode 21 of the FETQ 3 becomes a drain and the second main electrode 22 becomes a source.
- a current flows through the first terminal 11 ⁇ the diode D1 ⁇ the resistor R1 ⁇ the gate G3 of the FETQ3.
- the gate voltage of the FE Q 3 can be secured, so that the FET Q 3 can be reliably turned on.
- the diode D 2 is off.
- the semiconductor switch of the third embodiment the same effect as that of the semiconductor switch according to the first embodiment can be obtained, and the die switch is connected to a terminal having a high potential.
- a current is passed to the gate G3 of the FETQ3 via the resistor, and the gate voltage is set to a positive voltage, so that the FETQ3 can be reliably turned on. This can prevent malfunction due to noise or leakage current.
- FIG. 15 is a circuit diagram of a semiconductor switch according to the fourth embodiment of the present invention.
- a DC power source E is further provided between the connection point between the resistors R 1 and R 2 and the gate G 3 of the FET Q 3 in the structure shown in FIG. It is characterized by having.
- the positive electrode of the DC power supply E is connected to the gate G3 of the FETQ3, and the negative electrode of the DC power supply E is connected to the connection point between the resistors R1 and R2.
- the DC voltage of the DC power supply E is always applied to the gate G3 of the FET Q3 as a bias voltage, so that a gate voltage shortage occurs. And FETQ 3 does not malfunction.
- FETs Q2 and Q3 are Si FETs with a withstand voltage of 20 V and a resistance of 1 m ⁇ , and FETQ 3 is a compound semiconductor with a withstand voltage of 100 V. It is a mullion type FET. Assuming that the gate voltage of FETQ 3 is turned off at a gate voltage of 120 V, the withstand voltage of FETQ 2 is 20 V, and operation is possible if the withstand voltage of 20 V is satisfied. However, if FETQ 3 is a compound semiconductor with a higher withstand voltage, for example, a FET with a withstand voltage of 4000 V, a voltage of about 50 V must be applied to the gate to turn off the FET.
- the gen- eration resistance is about 5 to 10 times larger than that of a 20 V breakdown voltage FET, and the overall on-resistance is increased.
- the semiconductor switch shown in FIG. 8 is further provided with a medium-voltage normally-on switch between F ETQ 1 and F ETQ 3. It has a type F £ 06 and a medium pressure normally-on type FE TQ 7 between ETQ3 and FETQ2.
- FETQ2 and F ETQ 7 and the combination of F ETQ 1 and F ETQ 6 are configured as shown in Fig. 16 to provide an equivalent circuit equivalent to F ET with a withstand voltage of 50 V or more.
- TQ 3 can be turned on / off. That is, FETQ6 and FETQ7 are normally-on type FETs that can be turned on / off with a gate signal of not more than 20 V, and the withstand voltage of the drain D of FETQ1 and FETQ2 may be 20 V.
- FETQ 3 is a normallyion type FET that can be turned on / off with a gate signal of 150 V or less, and the withstand voltage of the drain D of FETQ6 and FETQ 7 may be 50 V. Therefore, a high-voltage semiconductor switch with a withstand voltage of 4000 V can be configured as a whole.
- the first main electrode 23 of FETQ 6 is connected to the drain D of FETQ 1, and the second main electrode 24 of FETQ 6 is connected to the first main electrode 21 of FETQ 3.
- the first main electrode 25 of FETQ 7 is connected to the second main electrode 22 of FETQ 3, and the second main electrode 26 of FETQ 7 is connected to the drain D of FETQ 2.
- the gate G3 of the FETQ3 is commonly connected to the gate G6 of the FETQ6 and the gate G7 of the FETQ7.
- the operation of the semiconductor switch according to the fifth embodiment configured as described above will be described.
- the die D2 is turned on, and the gate G3 of FETQ3, the gate G6 of FETQ6, and the gate G7 of FETQ7 are connected to the potential of the source S of FETQ2.
- FETQ 2 is on, FETQ 3, FETQ 6 and FETQ 7 are on.
- the FETQ 2 is off, no drain current flows, so that the drain currents of the FETQ3, FETQ6, and FETQ7 do not flow, and the FETQ2 is turned off.
- the signal can be turned on / off by the first gate signal input to the gate G 1 of the FETQ 1. That is, the die D1 is turned on, and the gate G3 of FETQ3, the gate G6 of FETQ6, and the gate G7 of FETQ7 become the potential of the source S of FETQ1.
- FETQ1 is on
- FETQ3, FETQ6, and FETQ7 are on.
- FETQ1 is off, no drain current flows, so that drain currents of FETQ3, FETQ6 and FETQ7 do not flow and they are off. That is, the AC signal can be turned on and off at the first terminal 11 and the second terminal 12.
- the semiconductor switch according to the fifth embodiment the same effect as that of the semiconductor switch according to the second embodiment can be obtained, and three normally-on type FETs and two It is possible to provide a normally-off type high-voltage semiconductor switch composed of a low-voltage low-slung MOS MOSFET.
- FIG. 17 is a circuit diagram of a semiconductor switch according to the sixth embodiment of the present invention.
- the semiconductor switch shown in FIG. 17 differs from the semiconductor switch shown in FIG. 13 in that a normally-on type FETQ 6 of a medium pressure is provided between FETQ 1 and FETQ3, and FETQ 3 and FETQ An intermediate pressure normally-on type FETQ 7 is provided between the ETQ 2 and the ETQ 2.
- the source S of FETQ4 and the source S of FETQ5 are connected to the gate G3 of FETQ3, the gate G6 of FETQ6, and the gate G7 of FETQ7.
- the operation is substantially the same as the operation of the semiconductor switch shown in FIG.
- the gate G3 of FETQ3, the gate G6 of FETQ6, and the gate G7 of FETQ7 become the same as the potential of the source S of FET connected to the low potential terminal.
- FE TQ 3, FE TQ 6, and FE TQ 7 are turned on.
- the semiconductor switch according to the sixth embodiment the same effect as that of the semiconductor switch according to the fifth embodiment can be obtained, and FETQ4 and Q5 can be stably turned on. Malfunction due to noise and leakage current can be prevented.
- FIG. 18 is a circuit diagram of a semiconductor switch according to the seventh embodiment of the present invention.
- the semiconductor switch shown in FIG. 18 differs from the semiconductor switch shown in FIG. 14 in that a normally-on normally-on FETQ 6 is provided between FETQ 1 and FETQ3, and FETQ3 and FETQ3 are connected to each other.
- a normally-on type FETQ 7 of medium pressure is provided between ETQ2 and ETQ2.
- the gate G3 of the FETQ3 is connected to the gate G6 of the FETQ6 and the gate G7 of the FETQ7.
- the same effect as that of the semiconductor switch according to the fifth embodiment can be obtained, and the diode and the resistance can be reduced from the terminal having a high potential.
- the current flows through the gate G3 of FETQ3, the gate G6 of FETQ6 and the gate G7 of FETQ7, and the gate voltage is set to a positive voltage to ensure that FETQ3, FETQ6 and FETQ7 It can be turned on. This can prevent malfunction due to noise or leakage current.
- FIG. 19 is a circuit diagram of a semiconductor switch according to the eighth embodiment of the present invention.
- the semiconductor switch shown in FIG. 19 differs from the semiconductor switch shown in FIG. 15 in that a normally-on normally-on FETQ 6 is provided between FETQ1 and FETQ3, and FETQ3 and An FET Q7 of a medium pressure normally-on type is provided between the FETQ2 and the FETQ2.
- the gate G3 of the FETQ3 is connected to the gate G6 of the FETQ6 and the gate G7 of the FETQ7.
- the same effect as that of the semiconductor switch according to the fifth embodiment can be obtained, and the DC voltage of the DC power supply E is As it is always applied to the gate G3 of FETQ3, the gate G6 of FETQ6 and the gate G7 of FETQ7, the gate voltage shortage does not occur and the FETQ3, FETQ6 and FETQ7 malfunction. No longer.
- the resistor R1 is used to pass a current.
- a current element / constant current circuit or the like may be used, and according to these, a forward current can flow stably from a low voltage to a high voltage.
- a normally-on type FET is connected between a first normally-off type FET and a second normally-off type FET, thereby reducing a loss and providing a high breakdown voltage and inexpensive semiconductor switch. be able to.
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Abstract
Description
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US10/522,264 US7245175B2 (en) | 2003-06-30 | 2004-05-28 | Semiconductor switch |
JP2005510969A JP3849712B2 (ja) | 2003-06-30 | 2004-05-28 | 半導体スイッチ |
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Application Number | Priority Date | Filing Date | Title |
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JP2003-187106 | 2003-06-30 | ||
JP2003187106 | 2003-06-30 |
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WO2005002054A1 true WO2005002054A1 (ja) | 2005-01-06 |
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PCT/JP2004/007756 WO2005002054A1 (ja) | 2003-06-30 | 2004-05-28 | 半導体スイッチ |
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US (1) | US7245175B2 (ja) |
JP (1) | JP3849712B2 (ja) |
CN (1) | CN100359805C (ja) |
WO (1) | WO2005002054A1 (ja) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007135081A (ja) * | 2005-11-11 | 2007-05-31 | Matsushita Electric Works Ltd | 半導体リレー装置 |
JP2009159222A (ja) * | 2007-12-26 | 2009-07-16 | Sanken Electric Co Ltd | スイッチ装置 |
JP2010166301A (ja) * | 2009-01-15 | 2010-07-29 | Daikin Ind Ltd | スイッチ回路 |
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US8373534B2 (en) | 2005-12-07 | 2013-02-12 | Sumida Corporation | Flexible coil |
JP2014003110A (ja) * | 2012-06-18 | 2014-01-09 | Renesas Electronics Corp | 半導体装置及びそれを用いたシステム |
JP2015089117A (ja) * | 2013-09-26 | 2015-05-07 | 株式会社半導体エネルギー研究所 | スイッチ回路、半導体装置、及びシステム |
US11862630B2 (en) | 2018-04-23 | 2024-01-02 | Infineon Technologies Austria Ag | Semiconductor device having a bidirectional switch and discharge circuit |
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US7498862B2 (en) * | 2005-05-31 | 2009-03-03 | Texas Instruments Incorporated | Switch for handling terminal voltages exceeding control voltage |
CN1996200B (zh) * | 2006-01-05 | 2010-12-08 | 鸿富锦精密工业(深圳)有限公司 | 笔记本电脑防盗报警*** |
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JP5290354B2 (ja) | 2011-05-06 | 2013-09-18 | シャープ株式会社 | 半導体装置および電子機器 |
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US9947654B2 (en) | 2016-09-08 | 2018-04-17 | Semiconductor Components Industries, Llc | Electronic device including a transistor and a field electrode |
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US10770455B2 (en) * | 2018-09-25 | 2020-09-08 | Semiconductor Components Industries, Llc | Electronic device including a transistor and a variable capacitor |
WO2021153170A1 (ja) * | 2020-01-27 | 2021-08-05 | パナソニックIpマネジメント株式会社 | 基板電位安定化回路及び双方向スイッチシステム |
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JP3529238B2 (ja) | 1997-03-18 | 2004-05-24 | 株式会社エヌ・ティ・ティ・データ | 半導体スイッチ |
US6580306B2 (en) * | 2001-03-09 | 2003-06-17 | United Memories, Inc. | Switching circuit utilizing a high voltage transistor protection technique for integrated circuit devices incorporating dual supply voltage sources |
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- 2004-05-28 US US10/522,264 patent/US7245175B2/en active Active
- 2004-05-28 JP JP2005510969A patent/JP3849712B2/ja not_active Expired - Fee Related
- 2004-05-28 CN CNB2004800008671A patent/CN100359805C/zh not_active Expired - Fee Related
- 2004-05-28 WO PCT/JP2004/007756 patent/WO2005002054A1/ja active Application Filing
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JPH0575110A (ja) * | 1991-09-13 | 1993-03-26 | Fuji Electric Co Ltd | 半導体装置 |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007135081A (ja) * | 2005-11-11 | 2007-05-31 | Matsushita Electric Works Ltd | 半導体リレー装置 |
US8373534B2 (en) | 2005-12-07 | 2013-02-12 | Sumida Corporation | Flexible coil |
JP2010539712A (ja) * | 2007-09-12 | 2010-12-16 | トランスフォーム インコーポレイテッド | Iii族窒化物双方向スイッチ |
JP2009159222A (ja) * | 2007-12-26 | 2009-07-16 | Sanken Electric Co Ltd | スイッチ装置 |
JP2010166301A (ja) * | 2009-01-15 | 2010-07-29 | Daikin Ind Ltd | スイッチ回路 |
JP2014003110A (ja) * | 2012-06-18 | 2014-01-09 | Renesas Electronics Corp | 半導体装置及びそれを用いたシステム |
JP2015089117A (ja) * | 2013-09-26 | 2015-05-07 | 株式会社半導体エネルギー研究所 | スイッチ回路、半導体装置、及びシステム |
US11862630B2 (en) | 2018-04-23 | 2024-01-02 | Infineon Technologies Austria Ag | Semiconductor device having a bidirectional switch and discharge circuit |
WO2024013326A1 (en) * | 2022-07-13 | 2024-01-18 | Infineon Technologies Austria Ag | Cascode-based switch device with voltage clamp circuit |
EP4350997A3 (en) * | 2022-10-06 | 2024-04-17 | Infineon Technologies Austria AG | Bidirectional power switch |
Also Published As
Publication number | Publication date |
---|---|
JP3849712B2 (ja) | 2006-11-22 |
CN100359805C (zh) | 2008-01-02 |
CN1701510A (zh) | 2005-11-23 |
US20050225373A1 (en) | 2005-10-13 |
US7245175B2 (en) | 2007-07-17 |
JPWO2005002054A1 (ja) | 2006-08-10 |
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