WO2004092082A1 - SiO2-TiO2系ガラスの製造方法、SiO2-TiO2系ガラス及び露光装置 - Google Patents
SiO2-TiO2系ガラスの製造方法、SiO2-TiO2系ガラス及び露光装置 Download PDFInfo
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- WO2004092082A1 WO2004092082A1 PCT/JP2004/005204 JP2004005204W WO2004092082A1 WO 2004092082 A1 WO2004092082 A1 WO 2004092082A1 JP 2004005204 W JP2004005204 W JP 2004005204W WO 2004092082 A1 WO2004092082 A1 WO 2004092082A1
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- based glass
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1415—Reactant delivery systems
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1415—Reactant delivery systems
- C03B19/1423—Reactant deposition burners
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1453—Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/06—Glass compositions containing silica with more than 90% silica by weight, e.g. quartz
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/60—Substrates
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B2201/00—Type of glass produced
- C03B2201/06—Doped silica-based glasses
- C03B2201/30—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi
- C03B2201/40—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
- C03B2201/42—Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn doped with titanium
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2201/00—Glass compositions
- C03C2201/06—Doped silica-based glasses
- C03C2201/30—Doped silica-based glasses containing metals
- C03C2201/40—Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
- C03C2201/42—Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn containing titanium
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C2203/00—Production processes
- C03C2203/40—Gas-phase processes
Definitions
- SiO 2 - The method of producing TiO 2 system glass, SiO 2 -TiO 2 type glass and an exposure apparatus art
- the present invention Si0 2 - Ti0 process for producing a 2 glass (quartz glass containing Ti0 2), relates to SiO 2 -Ti0 2 glass and an exposure apparatus.
- an exposure apparatus called a stepper is used.
- the optical system of this stepper is composed of an illumination optical system that uniformly illuminates a reticle on which a pattern is drawn by light from a light source, and an integrated circuit pattern formed on the reticle, which is reduced to 1/5, for example, to a wafer. And a projection optical system for projecting and transferring the image onto the top.
- the pattern line width that can be exposed and transferred by an exposure device As is well known, the pattern line width that can be exposed and transferred by an exposure device
- 2001-515977 discloses a method for producing a fused silica glass containing titania by flame hydrolysis, wherein a mixture of a silicic acid precursor and a titania precursor in a vapor form is flamed. is supplied to, the mixture to form a Si0 2 _Ti0 2 particles was passed through a flame, the particle element is described how to deposit glass of said particles into a furnace to form a melt solid glass body ing.
- Li 2 0- A1 2 0 3 - Si0 2 system for glass-ceramics which is for low thermal expansion to generate fine crystals in the interior
- the surface roughness of Ken Migakugo by hardness differences in the Matorittasu microcrystalline It has been pointed out that it is difficult to obtain the surface.
- This disadvantage can be considered essential because the heterogeneous particles are dispersed in the matrix.
- Si0 2 -Ti0 2 based glass which can be randomly distribution of elements for glass, although there is an advantage that said hard could component distribution, Si0 2 obtained by conventional production method - Ti0 2 system in the glass, Ti0 2 concentration distribution in the glass in the glass In addition to the visualization of the striae, there was a problem that sufficient surface roughness could not be obtained due to the striae.
- the present invention has been made in view of such circumstances, and has an optical system such as an exposure apparatus mirror using a light source in various wavelength regions, preferably in the ultraviolet region of 200 nm or less, and more preferably in the extreme ultraviolet region of 50 nm or less. suitable for use in, striae sufficiently small and the variation of the thermal expansion coefficient is extremely small, the production of Si0 2 -Ti0 2 based glass capable you to achieve a high level of surface roughness after polishing method, Si0 2 - Ti0 2 system glass, it is an object to provide an exposure apparatus using a Si0 2 -Ti0 2 system glass child.
- the present inventors have found that suitable for use in a semiconductor exposure apparatus using extreme ultraviolet as described above, the high-quality Si0 2 - Ti0 stably produced intensively studied how to the 2-based low thermal expansion glass was done.
- Si0 2 - Ti0 2 system glass in a method of manufacturing the flame hydrolysis method, or jetting directly to PANA Si0 2 powder and Ti0 2 powder in the synthesis of (i) glass, or (ii ) by Rukoto be strictly controlled mixing condition and the supply state of the gaseous precursor gaseous precursor and TiO 2 of Si0 2 used in synthesizing the glass, that will be able to solve the above problems
- high-quality Si 0 2 such as may be used in the semiconductor exposure apparatus - can now be produced stably Ti0 2 based low thermal expansion glass.
- First Si0 2 of the present invention - Ti0 2 system manufacturing method of glass, Si0 2 - Ti0 2 based glass to a method of producing a flame pressurized water solution, Si0 2 gaseous precursor and Ti0 2 gas
- the precursors are mixed in a turbulent state and supplied in a laminar flow from the central pipe of the wrench.Oxygen or an oxygen-containing gas and hydrogen or a hydrogen-containing gas are supplied from the surrounding pipes and burned. and the said Si0 2 gaseous precursor and Ti0 2 gaseous precursor, against the plate-shaped heat-resistant base or Ranaru target, deposition 'melt allowed to Si0 2 - Ti0 glass to obtain a 2 glass
- First Si0 2 of the present invention in the Ti0 2 based method of manufacturing a glass, mixing the Si0 2 gaseous precursor and Ti0 2 gaseous precursor in a turbulent state.
- the gaseous precursor of SiO 2 and the gaseous precursor of TiO 2 can be sufficiently stirred and mixed.
- this mixture is blown out from the central pipe of the wrench, it is in a laminar flow state.
- mixtures are by connexion heated to the flame, to be uniformly deposited ⁇ melted, resulting Si0 2 when depositing and melting the target - Pai0 occurrence of striae in 2 glass is sufficiently suppressed
- the variation in the coefficient of thermal expansion becomes extremely small, and it is possible to achieve a high level of surface roughness after polishing.
- Second Si0 2 of the present invention a method of manufacturing Ti0 2 based glass, Si0 2 - Ti0 2 system glass to a method of producing a flame pressurized water solution, a mixture of SiO 2 powder and TiO 2 powder, oxygen or supplied to the oxygen-containing combustion flame gas and hydrogen or a hydrogen-containing gas, heated the Si0 2 powder and Ti0 2 powder and depositing and melting allowed by the Si0 2 - Ti0 glass growth to obtain a 2 glass It is a method including.
- the manufacturing process becomes very simple, Si0 obtained 2 - Ti0 occurrence of striae in the 2 system glass It is sufficiently suppressed and the variation in the coefficient of thermal expansion is extremely small, so that a high level of surface roughness can be achieved after polishing.
- Second Si0 2 of the present invention - Ti0 In the method for producing a 2 glass, that (i) the Si0 2 powder size is, the diameter of the circumscribed sphere is sized to the range of 1 ⁇ 500nm preferred laid, also, (ii) the Ti0 2 powder size is preferably the diameter of the circumscribed sphere is sized to the range of L ⁇ 500nm.
- the first and second Si0 2 of the present invention - Ti0 In the method for producing a 2 glass, before Symbol glass growth step, the Si0 2 - Ti0 temperature of the growth surface of 2 based glass 1% 0 ° C ⁇ is preferably 2 200 ° C.
- first and second Si0 2 of the present invention - method of manufacturing a Ti0 2 system glass, the Si0 2
- the side surface of the columnar glass is placed in contact with the bottom surface of the crucible.
- the columnar glass is taken out of the crucible, and the periphery, upper and lower surfaces are ground.
- the manufacturing method of the first and second Si0 2 _Ti0 2 glass of the present invention after the Si0 2 _Ti0 2 based glass, and held for 1 to 20 hours at a temperature between 700 ° C ⁇ 1200 ° C
- the method further includes an annealing step of cooling at a temperature lowering rate of 1 to 20 ° C / hr up to 500 ° C.
- the difference A CTE PK _ PK of the maximum value and the minimum value of thermal expansion coefficient in the direction perpendicular to the optical axis and the horizontal direction either direction 23ppb / K or less Since it is very small, it does not cause local thermal deformation and is suitable for use in optical systems for extreme ultraviolet exposure equipment.
- the second SiO 2 —TiO 2 glass of the present invention has a root mean square of surface roughness of 0.23 nm or less after polishing using colloidal silicide force as an abrasive.
- Second Si0 2 of the present invention - in the Ti0 2 based glass a very small surface roughness Therefore, it is suitable for use in an optical system for an extreme ultraviolet exposure apparatus. Incidentally, it is not possible to reduce the Ti0 2 If is unevenly distributed surface roughness, the second S i 0 2 -T i 0 less uneven distribution of T i 0 2 in 2 glass and vein of the present invention
- the surface roughness described above is realized due to the low level of processing.
- the first exposure apparatus of the present invention Si0 2 produced by the production method of the first or second Si0 2 _Ti0 2 glass of the present invention - because use Iteiru the Ti0 2 based glass as an optical member, The stria in the optical member is sufficiently small, the variation in the coefficient of thermal expansion is extremely small, and a high level of surface roughness is achieved. Therefore, the first exposure apparatus of the present invention achieves good exposure accuracy even when used as an extreme ultraviolet exposure apparatus.
- the second exposure apparatus of the present invention, the first or the second Si0 2 of the present invention - are those used as Ti0 2 based glass optical member.
- the second exposure apparatus of the present invention since the uses the first or second Si0 2 -Ti0 2 glass of the present invention as an optical member, variation in thermal expansion coefficient in the optical member is extremely small, Also, a high level of surface roughness has been achieved. Therefore, the second exposure apparatus of the present invention achieves good exposure accuracy even when used as an extreme ultraviolet exposure apparatus.
- FIG. 1 is a schematic diagram of an optical system of an EUV exposure apparatus which is a preferred embodiment of the exposure apparatus of the present invention.
- Method for producing S i0 2 -Ti0 2 glass of the present invention Departure First Si0 2 of light - Ti0 2 system manufacturing method of glass, Si0 2 - Ti0 2 system glass to a method of producing a flame hydrolysis method, Si0 2 gaseous precursor and Ti0 2 gaseous The precursor is mixed in a turbulent state and supplied in a laminar state from the central pipe of the parner, and oxygen or an oxygen-containing gas and hydrogen or a hydrogen-containing gas are supplied from the surrounding pipes and burned.
- serial and Si0 2 gaseous precursor and Ti0 2 gaseous precursor against a target composed of a flat heat-resistant substrate, depositing ⁇ melt allowed to Si0 2 - the Ti0 2 based glass growth step to obtain a glass It is a method that includes.
- Si0 The second gaseous precursors, SiCl "H 4 - n ( n is 0 to 4 integer), SiF 4, organic Ke I-containing compounds, and among these SiCl terms of ease and flow amount and the handling 4 is preferred.
- Ti0 Examples of the gaseous precursor, TiCl 4, organic titanium compounds, and the like.
- combustion sustaining gas from the standpoint of ease and flow amount and handling oxygen Is most preferred, but it is also possible to use a gas containing oxygen, for example, air, etc.
- hydrogen is most preferred as the flammable gas, but methane, propane, or the like can be used as a gas other than hydrogen. is there.
- the PANA used in the present invention Si0 2 gaseous precursor and Ti0 2 of a gas mixture of gaseous pre-precursor from the central tube, the tube of the surrounding and oxygen or oxygen-containing gas and hydrogen or hydrogen-containing gas What is necessary is just to be able to supply from.
- a quintuple burner having an inner pipe diameter of 3.534 mm and an outer pipe diameter of 6.540 is preferably used.
- the target used in the present invention may be any of flat form having a heat-resistant substrate, for example, S i C, alumina (A1 2 0 3), mullite Doo (A1 2 0 3 - MgO) heat resistance such as A flat disk-shaped target made of a material is preferably used.
- the first Si0 2 -Ti0 2 based process for producing a glass of the present invention first, mixing the Si0 2 gaseous precursor and Ti0 2 gaseous precursor in a turbulent state. At that time, the resulting Si0 2 -. Ti0 proportion of Ti0 2 in the 2 based glass 6. 0 10. 0 wt% to become such a ratio It is preferable to mix the two gaseous precursors. By doing so, there is a tendency that a SiO 2 —TiO 2 glass having a very low coefficient of thermal expansion can be obtained.
- a Reynolds number in the mixing portion where the two gaseous precursors are merged and mixed is 2400 or more, and the force S is preferably 2400 to 7000. It is particularly preferred that there is.
- the Reynolds number is less than 2400, the two gaseous precursors will not be uniformly mixed, Si0 2 obtained - generating striae in the Ti0 2 based glass, variations in the thermal expansion coefficient, and the surface roughness after polishing is sufficiently Tend not to be reduced.
- direction Ke is supplied to the target in a laminar flow state from the central tube of a gas mixture of the two gaseous precursors the PANA Oxygen or an oxygen-containing gas and hydrogen or a hydrogen-containing gas are supplied from the tubes around the tube and burned.
- I connection hits the gaseous precursor heated Si0 2 and the Ti0 2 gaseous precursor the target, deposition ⁇ been brought melt Si0 2 - ⁇ 0 2 based glass is obtained.
- the supply amount of hydrogen is preferably 100 to 200 slm, and the supply amount of hydrogen or the hydrogen-containing gas is preferably 200 to 400 slm.
- the conditions for supplying the mixed gas of the two gaseous precursors in a laminar state are as follows: the Reynolds number in the parner part discharged from the central tube of the parner is preferably 600 or less, Is particularly preferred. When the Reynolds number exceeds 600, the two gaseous precursor is easily separated into layers, Si0 2 obtained - generating striae in the Ti0 2 based glass, variations in the thermal expansion coefficient, and the surface roughness after polishing It does not tend to be reduced sufficiently.
- oxygen-containing gas and hydrogen or hydrogen-containing gas are also in a laminar flow state.
- the mixture of both the gaseous precursor is uniformity improved more when deposition is heated
- Te cowpea flame is Si0 2 - Ti0 occurrence of striae definitive 2 based glass, Variations in the coefficient of thermal expansion and surface roughness after polishing tend to be more reliably reduced.
- the conditions for supplying the oxygen or oxygen-containing gas and the hydrogen or hydrogen-containing gas in a laminar flow state are as follows: the Reynolds number in the parner portion discharged from the outer tube of the parner is preferably 1500 or less, and 500 to Particularly preferred is 1500.
- the temperature of the glass growth surface on which the mixture of the two gaseous precursors is heated by the flame and deposited on the target is preferably 1950 ° C to 2200 ° C.
- the Kokodei cormorants glass growth surface, Si0 2 - Ti0 2 particles is that the surface to grow a glass.
- the temperature of the surface is less than 1950 ° C, it tends to Si0 2 _Ti0 2 particles becomes difficult to vitrify.
- Si0 2 - in Ti0 tendency 2 particles are hardly ⁇ catching volatilized.
- a second Si0 2 of the present invention - is described Ti0 2 system manufacturing method of a glass.
- Si0 The 2 powder, a diameter of the circumscribed sphere ranges become the size of l ⁇ 500nm is preferred.
- Si0 2 powder the diameter of the circumscribed sphere is small such that it is less than l nm, Si0 2 - in Ti0 tendency 2 particles is less likely to be captured target 1, to.
- S i0 2 powder the diameter of the circumscribed sphere is large exceeding 500 nm, tends to Si0 2 -Ti0 2 particles reactivity deteriorates is less likely to be formed.
- Such SiO 2 powder may be obtained by hydrolysis or use of a halogenated silicon compound. Those obtained by a combustion reaction of a mechanical silicon compound are preferred. This makes it possible to obtain a Si0 2 powder very high purity (99.9% - ". 99%).
- Ti0 The 2 powder, a diameter of the circumscribed sphere ranges become the size of l ⁇ 500nm is preferred.
- Ti0 2 powder the diameter of the circumscribed sphere is small such that less than I nm, tends to Si0 2 -Ti0 2 particles is less likely to be trapped in the target.
- T i0 2 powder the diameter of the circumscribed sphere is large exceeding 500 ml, tend to Si0 2 _Ti0 2 particles reactivity deteriorates it is less likely to be formed.
- Such Ti0 2 powder obtained by the combustion reaction of hydrolysis or organic titanium compounds titanium halide compound. This makes it possible to obtain Ti02 powder with extremely high purity (99.9% to 99.99%).
- the PANA used in the present invention a mixture of Si0 2 powder and Ti0 2 powder, acid Motomata may be any one which can be supplied to the combustion flame of the oxygen-containing gas and hydrogen or a hydrogen-containing gas.
- the specific configuration thereof is not particularly limited, but, for example, a quartz tube triple-paner structure is preferably used.
- the oxygen-containing gas and a hydrogen-containing gas body, the first Si0 2 of the present invention - is of Ti0 those used in the production method of 2 glass the same way.
- a second Si0 2 of the present invention - in the Ti0 2 based method of manufacturing a glass first, mixing the Si0 2 powder and T i0 2 powder. At that time, the resulting Si0 2 -..
- Ti0 rate which accounts for Ti0 2 in 2 based glass 6. 0 0 wt% to become such the arbitrariness preferred to mix the two powders in the ratio. By doing so, there is a tendency that can be thermal expansion coefficient to obtain a very low Si0 2 -Ti0 2 based glass.
- the specific method of mixing the two powders is not particularly limited.
- a mixing method using a planetary ball mill or the like is preferably used.
- the mixture of the two powders is supplied into a combustion flame of oxygen or an oxygen-containing gas and hydrogen or a hydrogen-containing gas. And I connection, it heated the Si0 2 powder and Ti0 2 powder and the deposition 'Shi melted Because being Si0 2 _Ti0 2 based glass obtained.
- the supply amount of Si0 2 powder supply amount of 10 to 25 g / min, Ti0 2 supply amount of the powder is 0. 5 ⁇ 3g / min, oxygen or oxygen-containing gas 100 ⁇ 200Slm, the hydrogen or hydrogen containing gas
- the supply amount is preferably from 200 to 400 slm.
- the specific method of supplying the mixture of the two powders into the combustion flame is not particularly limited.
- the mixture of the two powders is supplied by mixing with oxygen or an oxygen-containing gas or hydrogen or a hydrogen-containing gas.
- a method and a method of supplying a mixture of the two powders together with another carrier gas (an inert gas such as nitrogen or argon) into a combustion flame are preferably used.
- the oxygen or the oxygen-containing gas and the hydrogen or the hydrogen-containing gas be supplied in a laminar flow state.
- the both powder mixed compound is uniformity improved more when deposition is heated by the flame, striae in Si0 2 -Ti0 2 based glass obtained occurs, the thermal expansion coefficient Variations and surface roughness after polishing tend to be reduced more reliably.
- the conditions for supplying the oxygen or oxygen-containing gas and the hydrogen or hydrogen-containing gas in a laminar flow state are as follows: the Reynolds number in the burner section released from the burner is preferably 1500 or less, and 500 to 1500. It is particularly preferred that there is.
- the temperature of the glass growth surface on which the mixture of the two powders is heated and deposited by the flame is preferably 1950 ° C to 2200 ° C.
- the glass growth surface here, Si 0 2 -Ti0 2 particles is that the surface to grow a glass. If the temperature of this surface is lower than 1950 ° C., the SiO 2 -TiO 2 particles tend to be less vitrified. Further, when the temperature of the surface is more than 2200 ° C, Si0 2 - Ti0 Ru tended to 2 particles becomes difficult volatilized captured.
- S i0 2 - the TiO 2 particles The specific method of vitrification is not particularly limited.
- S0 2 powder and TiO 2 powder are deposited and melted by applying them to a target made of a plate-shaped heat-resistant substrate together with a flame.
- i0 and method for obtaining the 2 -TiO 2 type glass (ii) Si0 2 powder and Ti0 2 powder and the deposition is supplied into the furnace together with the flame ⁇ by allowed to melt Si0 2 _Ti0 method suitably to obtain a 2 glass Used.
- the first and second Si0 2 of the present invention - Ti0 method for producing 2 based glass described is preferred homogenization step further comprises. That is, in the manufacturing method of the present invention, it is preferable to remove the striae and performing the S i 0 2 -T i 0 to 2 based glass further kneading homogenization. Such kneading homogenizing treatment, Si0 2 _Ti0 also dispersed as Ti0 2 was unevenly distributed in 2-based glass, the striae can be more reliably removed, variation in the thermal expansion coefficient ⁇ Pi polishing Later surface roughness tends to be more sufficiently reduced.
- the following method is preferable. That is, the ends of the ingot are chucked, a flame is radiated from the side of the ingot to heat and soften, and the chucking portions at both ends are twisted in opposite directions. Make a lump. Further, as a method of such a kneading and homogenizing treatment, a method as described in Japanese Patent Application Laid-Open No. H08-33125 may be employed.
- the Si0 2 _Ti0 2 based glass in the (a) cylindrical crucible installed in contact with the bottom surface of the crucible and placed in each crucible furnace. At this time, in the case of Si0 2 -Ti0 2 based glass obtained in the step (d), the side surface of the columnar glass is placed in contact with the bottom surface of the crucible.
- Si0 2 - Ti0 dissolving 2 glass load pressure is strong point formed in one direction, and then dissolved before perpendicular direction by repeating the step of molding under a load Even if TiO 2 is unevenly distributed in the SiO 2 -TiO 2 system glass, it is dispersed, the striae are more reliably removed, and the variation in the coefficient of thermal expansion and the surface roughness after polishing are reduced more sufficiently. Tend to be.
- S i 0 2 is less than 1700 ° C the heating temperature in the step of (b) - tends to be insufficient dissolution of Ti 0 2 based glass, while the glass component volatilizes exceeds 2000 ° C there is a possibility. If the cooling rate in the step (c) is less than 50 ° C / hr, the glass tends to be crystallized. Further, the grinding in the step (d) is performed because the components in the crucible may be dissolved in the glass and become impurities, and therefore, the region where such impurities may be contained (preferably The area within 5 from the surface) is removed. In addition, as a component of the crucible, CWMo or the like that can withstand high temperatures is preferable.
- an annealing step which is preferably further included in the first and second methods for producing a SiO 2 -TiO 2 based glass of the present invention, will be described.
- the Si0 2 - Ti0 2 system glass 700 ° C 1200 After 1 20 hour hold at a temperature between C, l 20 ° C / hr to 500 ° C It is preferable to cool at a temperature lowering rate.
- the annealing in this good UNA heat treatment, Si0 2 -Ti0 be more reliably removed even internal strain is present in the 2 system glass, Ru tended to be prevented generation of a new distortion sufficiently.
- Si0 2 of the present invention - is described Ti0 2 based glass. That, Si0 2 first of the present invention - Ti0 2 based glass, the difference ⁇ CTE PK _ p K of the maximum value of the thermal expansion coefficient in the direction perpendicular to the optical axis ⁇ Pi horizontal any direction and the minimum value 23ppb / K or less, 20 Those having ppb / K or less are more preferable.
- the second Si0 2 of the present invention - Ti0 2 based glass are those surface roughness root square mean of after the polishing using colloidal silica force as a polishing agent is less than 0. 23 nm, Those having a diameter of 0.20 nm or less are more preferable.
- Si0 2 _Ti0 2 glass of the present invention as described above are those which became for the first time obtained by the production method of the first and second SiO 2 _Ti0 2 glass of the invention described above.
- the exposure apparatus of the present invention will be described. That is, the first exposure equipment of the present invention, the first or the second Si0 2 of the present invention - used as Ti0 2 based glass optical members - Ti0 2 based glass is the production by the manufacturing method Si0 2 Things.
- the second exposure apparatus of the present invention, the first or the second Si0 2 of the present invention - are those used as Ti0 2 based glass optical member.
- the striae of the optical member used are sufficiently small, the variation in the coefficient of thermal expansion is extremely small, and a high level of surface roughness is achieved. Even in such a case, good exposure accuracy is achieved.
- optical members constituting an exposure apparatus of the present invention in particular the reflector, is 50% or more of the a light faculty member consisting of Si0 2 _Ti0 2 glass of the present invention.
- FIG. 1 shows a schematic diagram of an optical system of an EUV exposure apparatus which is a preferred embodiment of the exposure apparatus of the present invention.
- IR 1 to IR 4 are reflecting mirrors of the illumination optical system
- PR 1 to PR 4 Is a reflecting mirror of the projection optical system.
- W is a wafer
- M is a mask.
- the laser light emitted from the laser light source is converged on the target S, and EUV light (soft X-ray) is generated from the target S by a plasma phenomenon.
- EUV light is reflected by the reflecting mirrors C and D, and enters the illumination optical system as parallel EUV light. Then, the light is sequentially reflected by the reflection mirrors IR1 to IR4 of the illumination optical system to illuminate the illumination area of the mask M.
- EUV light reflected by the pattern formed on the mask M is sequentially reflected by the reflecting mirrors PR1 to PR4 of the projection optical system, and forms an image of the pattern on the wafer W surface.
- Si0 2 of the present invention obtained by the production method of the present invention - Ti0 2 based glass, various wavelength regions, preferably 200 discussions following ultraviolet, more preferably of less extreme ultraviolet region 50mn source It is suitable for use in an optical system such as a mirror of an exposure apparatus to be used.
- Example 3 in accordance with the method described in Example 1 of JP-A-8 3 3 3 3 1 2 5 No., the Si0 2 - the Ti0 2 based glass
- the mixture was kneaded and homogenized. That is, the Si0 to Chiyakkingu both ends of 2 _Ti0 2 based glass (Ingo' g), causing twisting from the side of the ingot in each opposite direction together Chiyakkingu portions at both ends when the heating and softened by radiating flame, so'isuto motion While gradually approaching the heating section to form a lump. What has been kneaded and homogenized
- Table 1 shows X that was not performed.
- the heat treatment was performed on the SiO 2 —TiO 2 -based glass through the following steps. That is, the heat treatment including the following steps (a) to (d) was repeated the number of times shown in Table 1.
- the atmosphere in the crucible was N 2 atm.
- the crucible is heated to the heat treatment temperature shown in Table 1, Si0 2 - Ti0 2 based glass to obtain a cylindrical glass by its own weight deformation or weighted deformed in the direction of gravity ⁇ .
- Example 1 2400 300 35.0 2.3 175 350 2100 ⁇ C 1750 3 11
- Example 2 5000 200 23.5 1.6 155 350 2150 ⁇ W 1800 3 ⁇
- Example 3 4500 250 29.0 2.0 100 200 2000 ⁇ Mo 1850 3 ⁇
- Example 4 4000 500 58.5 3.9 180 400 2200 X------Example 5 6000 150 17.5 1.2 130 300 2050 ⁇ ----Example 6 6500 600 70.0 4.7 150 300 1950 XC 1950 3-one
- Example 1 1100 ° C 5hr hold
- Example 1 1 6000 150 17.5 1.2 130 300 2050 ⁇ --10 ° C / hr
- T i 0 2 content For Si0 2 -Ti0 2 glass obtained in this way in Example 1 ⁇ 1 2, T i 0 2 content, the presence or absence of striae, the difference between the maximum value and the minimum value of the thermal expansion coefficient (A CTE PK — PK ), presence of bubbles and foreign substances, and surface roughness (RMS) were measured as follows. Table 2 shows the obtained results.
- T i 0 2 content measured by X-ray microanalyzer (EP MA).
- Bubble-Presence / absence of foreign matter Measured by the projection method (Japan Optical Glass Industry Association Standard: 12-1994, 13-1994).
- Example 1 7.7 No 3 directions 22 Not detected 0.23
- Example 2 8.0 No 3 directions 9 Not detected 0.18
- Example 3 7.7 No 3 directions 10 Not detected 0.19
- Example 4 7.9 No three directions 17 Not detected 0.2
- Example 5 7.5 No three directions 11 Not detected 0.19
- Example 6 7.6 No three directions 7 Not detected 0.21
- Example 7 7.6 No three directions 20
- Example 8 7.6 No 3 directions 6 Not detected 0.15
- Example 9 8.0 No 3 directions 7 Not detected 0.16
- Example 10 7.8 No 3 directions 15 Not detected 0.18
- Example 11 7.4 No 3 directions 8 Not detected 0.17
- Example 12 7.6 Three directions None 5 Not detected 0.18 As shown in Table 2, in each of the examples, no striae were observed in any of the three directions, and no bubbles or foreign substances were observed.
- the difference between the maximum value and the minimum value of the coefficient of thermal expansion ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ was 22 ppb / K or less in each of the examples. Furthermore, in each of the examples, the force S for obtaining a surface roughness of 0.23 nm (RMS) or less was obtained.
- the amount of oxygen and hydrogen was adjusted to be supplied from each pipe as shown in Table 3, and the combustion was adjusted and burned to cause flame hydrolysis, which was applied to a flat plate made of SiC (diameter: 150 mm). to obtain a Ti0 2 system glass - the Si0 2 deposition ⁇ and brought melt Te.
- the temperature of the growth surface was as shown in Table 3.
- Et al is, in Examples 1 third to two 6, wherein the material of the crucible, the atmosphere in the crucible, in the same manner as in Example 7 except that the heat treatment temperature and heat treatment times were as shown in Table 3 Si0 2 - Ti0 was subjected to a heat treatment to 2-based glass.
- Examples 20 to 26 The SiO 2 —TiO 2 -based glass was annealed in the same manner as in Example 7 except that the annealing conditions were as shown in Table 3.
- Example 2 7 As shown in Table 4, in each of the examples, no striae was observed in any of the three directions, and no bubbles or foreign substances were observed. Further, as shown in Table 4, the difference ⁇ ⁇ — ⁇ between the maximum value and the minimum value of the thermal expansion coefficient was 23 ppb / K or less in the examples of the deviation and the deviation. Further, in each of the examples, a surface roughness of 0.22 nm (RMS) or less could be obtained.
- RMS surface roughness
- Example 1 The same as in Example 7, except that the Reynolds number in the mixing part, the Reynolds number in the corner part, the various supply amounts, and the growth surface temperature were set as shown in Table 5, Si0 2- with a diameter of 210 mra and a thickness of 40 mm- Ti0 obtain a 2 glass (quartz glass) (Comparative example 1 to 1 0).
- Si0 2 gaseous precursor and Ti0 2 gaseous precursor, Comparative Example 1, 3, 5 and 7 are in are mixed in a laminar flow state
- Si0 2 gaseous precursor and Ti0 2 gaseous precursor, Comparative Example 1, 3, and the 5 and 7 PANA portion is released in a laminar flow state, Comparative Example 4, 6 and 8 to 1
- Comparative Example 2 unlike the method of the present invention, two cavities for SiCl 4 , two cavities for TiCl 4 and two cavities for TiCl 4 were used at the same time to blow out from the burner in a turbulent state.
- Comparative Example 7 to 0 was subjected to kneading homogenization processing on the Si0 2 -Ti0 2 based glass in the same manner as in Example 7. Further, in Comparative Examples 9 to 1 0, crucible material, the Si0 2 in the same manner as in Example 7 except that the heat treatment temperature and heat treatment times were as shown in Table 5 - facilities to heat treatment Ti0 2 based glass did. Then, in Comparative Example 1, 2 and 1 0, except that the Aniru conditions were as shown in Table 5 was facilities annealing process on the Si0 2 -Ti0 2 based glass in the same manner as in Example 7.
- the present invention is used for an optical system such as an exposure apparatus mirror using a light source in various wavelength regions, preferably ultraviolet light having a wavelength of 200 nm or less, more preferably an extreme ultraviolet light region having a wavelength of 50 nm or less.
- a light source in various wavelength regions, preferably ultraviolet light having a wavelength of 200 nm or less, more preferably an extreme ultraviolet light region having a wavelength of 50 nm or less.
- suitable for striae sufficiently small and the variation of the thermal expansion coefficient is extremely small, achieving a high level of surface roughness after polishing is possible that Si0 2 - method of making a Ti0 2 system glass, Si0 2 - Ti0 2 based glass, and an exposure apparatus using the Si0 2 -Ti 0 2 based glass can be provided.
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Abstract
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Cited By (9)
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JP2006240978A (ja) * | 2005-02-01 | 2006-09-14 | Shinetsu Quartz Prod Co Ltd | 均質なシリカ・チタニアガラスの製造方法 |
JP2006240979A (ja) * | 2005-02-01 | 2006-09-14 | Shinetsu Quartz Prod Co Ltd | 均質なシリカ・チタニアガラスの製造方法 |
JP2007131472A (ja) * | 2005-11-09 | 2007-05-31 | Asahi Glass Co Ltd | TiO2を含有するシリカガラスの成型方法 |
JP2007186347A (ja) * | 2004-12-24 | 2007-07-26 | Shinetsu Quartz Prod Co Ltd | 脈理のないシリカ・チタニアガラスの製造方法 |
JP2007186348A (ja) * | 2004-12-28 | 2007-07-26 | Shinetsu Quartz Prod Co Ltd | 脈理のないシリカ・チタニアガラスの製造方法 |
JP2010013335A (ja) * | 2008-07-07 | 2010-01-21 | Shin-Etsu Chemical Co Ltd | チタニアドープ石英ガラス部材及びその製造方法 |
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JP4646314B2 (ja) * | 2005-02-01 | 2011-03-09 | 信越石英株式会社 | 均質なシリカ・チタニアガラスの製造方法 |
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JP4568219B2 (ja) * | 2005-02-01 | 2010-10-27 | 信越石英株式会社 | 均質なシリカ・チタニアガラスの製造方法 |
JP2007131472A (ja) * | 2005-11-09 | 2007-05-31 | Asahi Glass Co Ltd | TiO2を含有するシリカガラスの成型方法 |
JP4534957B2 (ja) * | 2005-11-09 | 2010-09-01 | 旭硝子株式会社 | TiO2を含有するシリカガラスの成型方法 |
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