US20130215263A1 - Image processing device and method of image processing - Google Patents

Image processing device and method of image processing Download PDF

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Publication number
US20130215263A1
US20130215263A1 US13/545,269 US201213545269A US2013215263A1 US 20130215263 A1 US20130215263 A1 US 20130215263A1 US 201213545269 A US201213545269 A US 201213545269A US 2013215263 A1 US2013215263 A1 US 2013215263A1
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Prior art keywords
image
images
imaging unit
control unit
stage
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Abandoned
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US13/545,269
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English (en)
Inventor
Kozo Ariga
Masaru Kawazoe
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Mitutoyo Corp
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Mitutoyo Corp
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Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ARIGA, KOZO, KAWAZOE, MASARU
Publication of US20130215263A1 publication Critical patent/US20130215263A1/en
Priority to US15/070,148 priority Critical patent/US9390324B1/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G06T3/4038—Image mosaicing, e.g. composing plane images from plane sub-images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/08—Feature extraction
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/12—Classification; Matching

Definitions

  • This invention relates to an image processing device employed in the likes of a hardness testing device and a method of image processing.
  • a hardness testing device that measures hardness of a measuring object based on a shape of an indentation formed in a surface of the measuring object, is known (refer to JP 2010-190817 A and JP 2005-345117 A).
  • the measuring object is disposed on a stage and a measured value of hardness of the measuring object is obtained using an image of the measuring object capable of being taken by an imaging device.
  • the image shows only a region of part of the measuring object, an entire image showing the measuring object is necessary.
  • a method that shifts the stage relatively in a certain direction to take a plurality of images and joins these plurality of images to generate a composite image, is known (refer to JP H08-313217 A).
  • the present invention was made in view of such a problem and has an object of providing an image processing device and a method of image processing capable of generating a composite image having no discontinuity at a composite portion, easily and at low cost.
  • An image processing device comprises: an imaging unit for taking an image of a measuring object; a stage configured to be mountable with the measuring object and to be shiftable relatively with respect to the imaging unit; and a control unit for shifting the imaging unit relatively with respect to the stage to take an image of the measuring object at a plurality of places by the imaging unit and thereby obtain a plurality of images, and for generating a composite image of the measuring object having a range which is wider than an imaging range of the imaging unit by combining the obtained plurality of images or images obtained by a certain processing from the obtained plurality of images, the control unit shifting the imaging unit relatively with respect to the stage such that parts of images adjacent to one another obtained by the imaging unit overlap, the control unit performing an image matching processing that performs image matching of an overlapped portion of the adjacent images, and the control unit generating the composite image of the measuring object by joining the adjacent images at a position where the image matching is performed in the image matching processing.
  • FIG. 1 is a schematic view showing a hardness testing device according to a first embodiment.
  • FIG. 2 is a block diagram showing a computer main body 21 according to the first embodiment.
  • FIG. 3 is a schematic view showing misalignment of a coordinate system of an imaging unit 12 and a coordinate system of a stage 13 .
  • FIG. 4 is a flowchart showing operation of the hardness testing device according to the first embodiment.
  • FIG. 5 is a schematic view showing shifting of the stage 13 , imaging of a workpiece W, and image matching processing in steps S 101 , S 102 , and S 104 according to the first embodiment.
  • FIG. 6 is a schematic view showing the image matching processing in S 104 according to the first embodiment.
  • FIG. 7 is a schematic view showing the image matching processing in S 104 according to the first embodiment.
  • FIG. 8 is a schematic view showing the image matching processing in S 104 according to the first embodiment.
  • FIG. 9 is a schematic view showing calculation of a stage shifting amount in step S 105 according to the first embodiment.
  • FIG. 10 is a schematic view showing a hardness testing machine 30 according to a second embodiment.
  • FIG. 11 is a schematic view showing shifting of the stage 13 along an edge E of the workpiece W, and imaging of the workpiece W according to a third embodiment.
  • FIG. 12 is a flowchart showing an edge tracking processing according to the third embodiment.
  • FIG. 13 is a view showing a display screen according to the third embodiment.
  • FIG. 14 is a view showing edge point detection in a window according to the third embodiment.
  • FIG. 15 is a view showing a determining sequence of window positions according to the third embodiment.
  • FIG. 1 is a schematic view showing a hardness testing device according to the present embodiment.
  • the hardness testing device includes a hardness testing machine 10 and a computer system 20 for controlling the hardness testing machine 10 .
  • the hardness testing device functions also as an image processing device for generating a composite image.
  • the hardness testing machine 10 includes a support 11 , an imaging unit 12 , a stage 13 and a turret 14 .
  • the support 11 has a C shape when viewed from an X direction (perpendicular direction to paper plane in FIG. 1 ).
  • the imaging unit 12 is provided on an upper portion of the support 11 and takes an image of a workpiece W (measuring object) via a camera mount 15 .
  • the imaging unit 12 is configured by, for example, a CCD camera or a CMOS camera.
  • the stage 13 is provided on a lower side of the support 11 via a shifting mechanism 16 .
  • the shifting mechanism 16 is configured such that the stage 13 is shiftable in an X axis direction, a Y axis direction, and a Z axis direction that are orthogonal to one another. That is, the shifting mechanism 16 is configured such that the imaging unit 12 is shiftable relatively with respect to the stage 13 .
  • the shifting mechanism 16 is controlled by the computer system 20 to drive the stage 13 .
  • the turret 14 is provided on an upper portion of the support 11 .
  • the turret 14 is configured rotatable around a turret rotating shaft parallel to the Z axis, and includes on its lower side an indenter 17 and objective lenses 18 a and 18 b .
  • the indenter 17 is for being pressed onto the workpiece W to make an indentation in a surface of the workpiece W.
  • the objective lenses 18 a and 18 b are each for configuring an imaging optical system along with the imaging unit 12 . Rotation of the turret 14 allows the indenter 17 and the objective lenses 18 a and 18 b to be switchably disposed to a usage position.
  • the computer system 20 includes a computer main body 21 , a display unit 22 which is a liquid crystal panel or the like, a keyboard 23 and a mouse 24 .
  • the computer main body 21 includes, for example, a CPU 211 , a ROM 212 , a RAM 213 and a HDD 214 .
  • the CPU 211 executes processing according to a macro-program stored in the ROM 212 and a program stored in the RAM 213 from the HDD 214 .
  • the CPU 211 controls the imaging unit 12 , the shifting mechanism 16 and the display unit 22 according to the programs. In addition, the CPU 211 receives input information from the keyboard 23 and the mouse 24 .
  • the present embodiment includes a coordinate system (x, y) of the imaging unit 12 and a coordinate system (X, Y) of the stage 13 .
  • an axis x and an axis y are mutually orthogonal and are axes set in an image obtained by the imaging unit 12 .
  • An axis X and an axis Y are mutually orthogonal and are directions in which the stage 13 is shiftable.
  • the axis x and the axis y may also be axes set in an image obtained by the imaging unit 12 and that has undergone a certain processing.
  • the coordinate system (X, Y) of the stage 13 has an angle e with the coordinate system (x, y) of the imaging unit 12 .
  • an image is taken of the workpiece W while shifting the stage 13 by an amount of a certain distance in an X axis direction to obtain a plurality of images, and those plurality of images, while being displaced by an amount of a certain distance in an x axis direction, are joined to generate a composite image.
  • that composite image becomes a discontinuous image different to the actual workpiece W.
  • a composite image IMa is generated using a processing of the kind shown in FIG. 4 .
  • control shown in FIG. 4 is executed by the CPU 211 .
  • the stage 13 is shifted in a certain direction (S 101 ).
  • an image is taken of the workpiece W by the imaging unit 12 to obtain an image IM(S 102 ).
  • the image IM is displayed in the display unit 22 .
  • step S 104 the composite image IMa is an image of the workpiece W having a range which is wider than a one-shot imaging range of the imaging unit 12 .
  • step S 104 the composite image IMa is displayed in the display unit 22 .
  • the composite image IMa may be configured capable of being printed by a printer. Then, shifting amounts ⁇ X and ⁇ Y of the stage 13 (stage shifting amounts) in the X axis and Y axis directions in which the stage 13 is shiftable are calculated based on the composite image IMa (S 105 ). Note that, as mentioned later, shifting of the imaging unit 12 is controlled based on these stage shifting amounts.
  • an indentation position is set based on the composite image IMa (S 106 ). For example, a shape of the workpiece W is recognized from the composite image IMa, and the indentation position is disposed automatically from the shape of that workpiece. Alternatively, by using the keyboard 23 and the mouse 24 to designate any position on the composite image IMa displayed in the display unit 22 , the indentation position is disposed manually in that designated position.
  • the indenter 17 is pressed onto the surface of the workpiece W to make an indentation in the disposed indentation position (S 107 ). Then, an image is taken of this indentation, and a hardness value calculated based on a shape (size) of the indentation (S 108 ). Then, this indentation position (coordinate value on the composite image) and the hardness value corresponding to that position are displayed in the display unit 22 (S 109 ).
  • FIG. 5 shifting of the stage 13 , imaging of the workpiece W and the image matching processing in steps S 101 , S 102 and S 104 are described specifically with reference to FIG. 5 .
  • an image of the image IM( 1 ) is taken by the imaging unit 12 .
  • the stage 13 is shifted in parallel in the ⁇ X axis direction by an amount of a range which is slightly smaller than a size of the one-shot imaging range of the imaging unit, 12 in the X axis direction to take images of the images IM( 2 ) and IM( 3 ).
  • the stage 13 is shifted in parallel in the +Y axis direction by an amount of a range which is slightly smaller than a size of the one-shot imaging range of the imaging unit 12 in the Y axis direction to take an image of the image IM( 4 ). Then, the stage 13 is shifted in parallel in the +X axis direction by an amount of a range which is slightly smaller than a size of the one-shot imaging range of the imaging unit 12 in the X axis direction to take images of the images IM( 5 ) and IM( 6 ). As a result, adjacent images IM( 1 )-IN( 6 ) are taken so as to include overlapping region images RIM( 1 )-RIM( 7 ) that overlap one another to configure a composite portion.
  • image matching is performed to match patterns inside the overlapping region images RIM( 1 )-RIM( 7 ) (image matching processing).
  • image matching processing is performed to match patterns inside the overlapping region images RIM( 1 )-RIM( 7 ) (image matching processing).
  • the composite image IMa is generated by joining the adjacent images IM( 1 )-IM( 6 ) at a position where the image matching is performed in the image matching processing.
  • These composite image IMa, images IM( 1 )-IM( 6 ), and overlapping region images RIM( 1 )-RIM( 7 ) are displayed in the display unit 22 .
  • FIG. 6 shows an example where image matching is performed on the overlapping region images RIM( 1 ) and RIM( 2 ) of the images IM( 1 ) and IM( 2 ) to generate the composite image IMa.
  • the overlapping region images RIM( 1 ) and RIM( 2 ) of the images IM( 1 ) and IM( 2 ) are extracted (S 1041 ).
  • the overlapping region images RIM( 1 ) and RIM( 2 ) each undergo image compression by a thinning processing or the like to generate compressed images SRIM( 1 ) and SRIM( 2 ) (S 1042 ). Reducing a data amount subject to arithmetic processing in the image matching processing by this processing of step S 1042 makes it possible to reduce time required in the image matching processing that follows this processing of step S 1042 .
  • the fellow data-compressed compressed images SRIM( 1 ) and SRIM( 2 ) undergo image matching (macro-matching) to calculate a misalignment amount between the images IM( 1 ) and IM( 2 ) (relative position between the compressed images) (S 1043 ).
  • the two images IM( 1 ) and IM( 2 ) can be joined based on this misalignment amount to obtain the composite image IMa.
  • a processing of the kind shown in FIG. 7 may be performed. That is, the overlapping region images RIM( 1 ) and RIM( 2 ) are each binarized into a region of high brightness and a region of low brightness based on a certain threshold value to generate binarized images BIM( 1 ) and BIM( 2 ).
  • the fellow binarized images BIM( 1 ) and BIM( 2 ) undergo image matching (macro-matching) to calculate a misalignment amount between the images IM( 1 ) and IM( 2 ) (misalignment amount between the binarized images).
  • the two images IM( 1 ) and IM( 2 ) can be joined based on this misalignment amount to obtain the composite image IMa.
  • a processing of the kind shown in FIG. 8 may be performed. That is, edge images EIM( 1 ) and EIM( 2 ) are generated, the edge images EIM( 1 ) and EIM( 2 ) having an outline (edge) only of an image extracted from each of the overlapping region images RIM( 1 ) and RIM( 2 ). Next, the fellow edge images EIM( 1 ) and EIM( 2 ) undergo image matching (macro-matching) to calculate a misalignment amount between the images IM( 1 ) and IM( 2 ) (misalignment amount between the edge images).
  • the two images IM( 1 ) and IM( 2 ) can be joined based on this misalignment amount to obtain the composite image IMa.
  • image matching micro-matching
  • FIG. 9 shows an example where the stage shifting amount in the X axis and Y axis directions in which the stage 13 is shiftable is calculated based on the misalignment amount between the image IM( 1 ) and the image IM( 2 ) in the composite image IMa.
  • a coordinate system (X′, Y′) is set in the composite image IMa.
  • An axis X′ and an axis Y′ in the coordinate system (X′, Y′) of the composite image are mutually orthogonal and are set parallel to the axis x and the axis y, respectively, in the coordinate system (x, y) of the imaging unit 12 .
  • the coordinate system (X, Y) of the stage 13 is misaligned with the coordinate system (x, y) of the imaging unit 12 by an angle ⁇ , hence the coordinate system (X′, Y′) of the composite image IMa is also misaligned with the coordinate system (X, Y) of the stage 13 by the angle ⁇ .
  • the misalignment amount of the image IM( 2 ) with respect to the image IM( 1 ) in the composite image IMa when the stage 13 is shifted by an amount of ⁇ X in the X axis direction is assumed to be ⁇ X′
  • the misalignment amount in the Y axis direction is assumed to be ⁇ Y′.
  • the stage shifting amounts ⁇ X and ⁇ Y are obtained with respect to these ⁇ X′ and ⁇ Y′ in view of the angle ⁇ .
  • the present embodiment makes it possible to generate a composite image IMa having no discontinuity at a composite portion, easily and at low cost, without adjusting the coordinate system of the stage 13 and the coordinate system of the imaging unit 12 .
  • the present embodiment also makes it possible to shift the stage 13 accurately based on the coordinate system of the composite image by calculating the stage shifting amount.
  • the hardness testing device according to the second embodiment includes a hardness testing machine 30 different to that in the first embodiment.
  • the second embodiment differs from the first embodiment in this point only, and is similar to the first embodiment regarding other configurations and operation.
  • the hardness testing machine 30 includes a base 31 and a support 32 extending in a Z direction from the base 31 .
  • a stage 33 shiftable in an X direction and a Y direction.
  • the stage 33 is configured such that its upper surface is mountable with the workpiece W.
  • a unit 34 shiftable in the Z direction.
  • the unit 34 is provided with an imaging unit 35 and a turret 36 .
  • the imaging unit 35 takes an image of the workpiece W mounted on the stage 33 .
  • the turret 36 is provided at a lower end of the unit 34 , is configured rotatable around a turret rotating shaft parallel to the Z axis, and includes on its lower side an indenter 37 and objective lenses 38 a and 38 b for configuring an image optical system along with the imaging unit 35 . Similar advantages to those of the first embodiment are displayed, even with the above-described hardness testing machine 30 according to the second embodiment.
  • the hardness testing device according to the third embodiment differs from that of the first embodiment in a method of shifting of the stage 13 only.
  • an image of a designated region of the workpiece W is taken.
  • an edge E of the workpiece W is tracked based on an image taken beforehand (edge tracking processing), and an image is taken of images IM( 1 )-IM( 4 ) along that edge E.
  • the previously mentioned image matching is executed on those images IM( 1 )-IM( 4 ) to generate the composite image IMa.
  • FIG. 12 is a flowchart showing the edge tracking processing
  • FIG. 13 is a view for explaining this processing and shows image information 41 indicating a part of the workpiece W displayed in the display unit 22 .
  • the image information 41 shown in FIG. 13 includes an edge 42 which is attempting to be tracked. Therefore, first, the mouse 24 and so on are operated to set an initial position of a rectangular window 43 indicating a measuring region so as to include a part of the edge 42 inside the window 43 ( FIG. 12 , S 201 ). For example, as shown in FIG.
  • the window 43 is designated by the likes of an operation that sets four corners A, B, C, and D of the window 43 by click operation of the mouse 24 , or an operation that, after designating two points at opposing corner directions of the rectangle, inclines that rectangular region at any angle to shift the rectangular region by a drag operation. Note that, at this time, a direction for tracking along the edge 42 is also designated.
  • FIG. 14 shows details of this sampling. An interval of sampling of the edge points shown in FIG. 14 is set previously.
  • multi-value image information of an address indicated by x and y coordinates is extracted, from a start point A(x a , y a ) to an end point B (x b , y b ), while changing an x coordinate cos ⁇ at a time [where ⁇ is an inclination of the window 43 ] and a y coordinate sin ⁇ at a time.
  • An appropriate threshold level is set from the obtained multi-value point sequence data, and sampling is performed, the sampling setting a point where this threshold level and the point sequence data intersect as an edge point.
  • the start point and the end point are shifted by amounts of ⁇ sin ⁇ and ⁇ cos ⁇ , respectively, and similar sampling is executed.
  • an approximate line is fitted to sampling values of the obtained plurality of edge points 44 by, for example, a method of least squares ( FIG. 12 , S 203 ).
  • a next window 43 ′ is determined so as to conform with this approximate line L ( FIG. 12 , S 204 ).
  • a perpendicular line is dropped to the approximate line L from an edge point 43 a nearest to an edge in the shifting direction of the window 43 obtained by the present window 43 , then a point P 1 and a point P 2 are obtained, the point P 1 being separated from a crossing point of the perpendicular line and the approximate line L by an amount of H ⁇ m/100 (where H is a height of the window and m is a previously set duplication rate (%)) along the approximate line L in an opposite direction to the shifting direction of the window 43 , and the point P 2 being separated from the point P 1 by an amount of H in the shifting direction of the window 43 .
  • points that are on lines orthogonal to the approximate line L at each of points P 1 and P 2 and that are each separated from the approximate line L by an amount of W/2 are set as points A′, B′, C′, and D′ at four corners of a new window 43 ′.
  • W is a width of the window
  • the window 43 is shifted sequentially while performing sampling of edge points and fitting of an approximate line in the window 43 ′ similarly to as previously mentioned. Then, when the edge to be tracked is all tracked, the processing is completed ( FIG. 12 , S 205 ).
  • disposition of the indentation position may also be based on the likes of CAD data or shape data of a workpiece of a profile measuring instrument.
  • shifting of the stages 13 and 33 , and the unit 34 may also be performed manually.
  • an image of that designated position may also be taken by the imaging unit 12 .

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US9390324B1 (en) 2016-07-12
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