TWI784291B - 發光裝置的蓋件、蓋件的製造方法及發光裝置 - Google Patents
發光裝置的蓋件、蓋件的製造方法及發光裝置 Download PDFInfo
- Publication number
- TWI784291B TWI784291B TW109123132A TW109123132A TWI784291B TW I784291 B TWI784291 B TW I784291B TW 109123132 A TW109123132 A TW 109123132A TW 109123132 A TW109123132 A TW 109123132A TW I784291 B TWI784291 B TW I784291B
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- Prior art keywords
- film
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- cover
- titanium
- gold
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- 238000004519 manufacturing process Methods 0.000 title claims description 34
- 239000010408 film Substances 0.000 claims abstract description 366
- 239000010936 titanium Substances 0.000 claims abstract description 92
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 90
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 90
- 239000013078 crystal Substances 0.000 claims abstract description 88
- 239000011104 metalized film Substances 0.000 claims abstract description 49
- 238000007789 sealing Methods 0.000 claims abstract description 32
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 30
- 239000000956 alloy Substances 0.000 claims abstract description 30
- 239000010931 gold Substances 0.000 claims description 83
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 82
- 229910052737 gold Inorganic materials 0.000 claims description 80
- 238000000034 method Methods 0.000 claims description 43
- 239000000463 material Substances 0.000 claims description 42
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 37
- 230000008569 process Effects 0.000 claims description 28
- 229910000679 solder Inorganic materials 0.000 claims description 28
- 230000005496 eutectics Effects 0.000 claims description 20
- 229910001128 Sn alloy Inorganic materials 0.000 claims description 18
- JVPLOXQKFGYFMN-UHFFFAOYSA-N gold tin Chemical compound [Sn].[Au] JVPLOXQKFGYFMN-UHFFFAOYSA-N 0.000 claims description 18
- 229910052759 nickel Inorganic materials 0.000 claims description 18
- 239000011135 tin Substances 0.000 claims description 17
- 229910052718 tin Inorganic materials 0.000 claims description 16
- 229910000990 Ni alloy Inorganic materials 0.000 claims description 15
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 15
- 230000002093 peripheral effect Effects 0.000 claims description 15
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 12
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 12
- 238000007747 plating Methods 0.000 claims description 7
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 6
- 230000001590 oxidative effect Effects 0.000 claims description 3
- 229910001069 Ti alloy Inorganic materials 0.000 claims description 2
- 229910001020 Au alloy Inorganic materials 0.000 claims 1
- 239000010410 layer Substances 0.000 abstract description 176
- 229910052751 metal Inorganic materials 0.000 abstract description 86
- 239000002184 metal Substances 0.000 abstract description 86
- 239000000919 ceramic Substances 0.000 abstract description 38
- 238000004806 packaging method and process Methods 0.000 abstract description 4
- 239000002356 single layer Substances 0.000 abstract description 3
- 238000011156 evaluation Methods 0.000 description 44
- HZEWFHLRYVTOIW-UHFFFAOYSA-N [Ti].[Ni] Chemical compound [Ti].[Ni] HZEWFHLRYVTOIW-UHFFFAOYSA-N 0.000 description 24
- 229910001000 nickel titanium Inorganic materials 0.000 description 24
- 238000002845 discoloration Methods 0.000 description 22
- 238000001465 metallisation Methods 0.000 description 19
- 238000012360 testing method Methods 0.000 description 16
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 13
- 238000005336 cracking Methods 0.000 description 13
- 238000007499 fusion processing Methods 0.000 description 11
- 230000015572 biosynthetic process Effects 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 10
- CLDVQCMGOSGNIW-UHFFFAOYSA-N nickel tin Chemical compound [Ni].[Sn] CLDVQCMGOSGNIW-UHFFFAOYSA-N 0.000 description 8
- 239000000758 substrate Substances 0.000 description 7
- 238000005452 bending Methods 0.000 description 6
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 239000011651 chromium Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000035939 shock Effects 0.000 description 5
- 229910015363 Au—Sn Inorganic materials 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- 210000002469 basement membrane Anatomy 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 2
- BLOIXGFLXPCOGW-UHFFFAOYSA-N [Ti].[Sn] Chemical compound [Ti].[Sn] BLOIXGFLXPCOGW-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000005275 alloying Methods 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 229910001882 dioxygen Inorganic materials 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000004659 sterilization and disinfection Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 210000004379 membrane Anatomy 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical group [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000001954 sterilising effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 229910001258 titanium gold Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/06—Containers; Seals characterised by the material of the container or its electrical properties
- H01L23/08—Containers; Seals characterised by the material of the container or its electrical properties the material being an electrical insulator, e.g. glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Led Device Packages (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019-136741 | 2019-07-25 | ||
JP2019136741 | 2019-07-25 | ||
JP2019-214001 | 2019-11-27 | ||
JP2019214001 | 2019-11-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202115930A TW202115930A (zh) | 2021-04-16 |
TWI784291B true TWI784291B (zh) | 2022-11-21 |
Family
ID=74193041
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW109123132A TWI784291B (zh) | 2019-07-25 | 2020-07-09 | 發光裝置的蓋件、蓋件的製造方法及發光裝置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7173347B2 (ja) |
CN (1) | CN113646908A (ja) |
TW (1) | TWI784291B (ja) |
WO (1) | WO2021014904A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011040577A (ja) * | 2009-08-11 | 2011-02-24 | Citizen Electronics Co Ltd | 発光装置の製造方法 |
JP2015018873A (ja) * | 2013-07-09 | 2015-01-29 | 日機装株式会社 | 半導体モジュール |
JP2018093137A (ja) * | 2016-12-07 | 2018-06-14 | 日機装株式会社 | 光半導体装置の製造方法 |
TW201906198A (zh) * | 2017-06-22 | 2019-02-01 | 日商Agc股份有限公司 | 窗材、光學封裝 |
TW201921728A (zh) * | 2017-09-05 | 2019-06-01 | 韓商Lg伊諾特股份有限公司 | 半導體裝置封裝 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002353352A (ja) * | 2001-05-30 | 2002-12-06 | Kyocera Corp | 撮像素子収納用パッケージ |
JP4332047B2 (ja) * | 2004-02-26 | 2009-09-16 | 京セラ株式会社 | 電子装置 |
US7910945B2 (en) * | 2006-06-30 | 2011-03-22 | Cree, Inc. | Nickel tin bonding system with barrier layer for semiconductor wafers and devices |
JP6294417B2 (ja) * | 2016-09-01 | 2018-03-14 | 日機装株式会社 | 光半導体装置および光半導体装置の製造方法 |
-
2020
- 2020-06-30 WO PCT/JP2020/025716 patent/WO2021014904A1/ja active Application Filing
- 2020-06-30 JP JP2021533894A patent/JP7173347B2/ja active Active
- 2020-06-30 CN CN202080023443.6A patent/CN113646908A/zh active Pending
- 2020-07-09 TW TW109123132A patent/TWI784291B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011040577A (ja) * | 2009-08-11 | 2011-02-24 | Citizen Electronics Co Ltd | 発光装置の製造方法 |
JP2015018873A (ja) * | 2013-07-09 | 2015-01-29 | 日機装株式会社 | 半導体モジュール |
JP2018093137A (ja) * | 2016-12-07 | 2018-06-14 | 日機装株式会社 | 光半導体装置の製造方法 |
TW201906198A (zh) * | 2017-06-22 | 2019-02-01 | 日商Agc股份有限公司 | 窗材、光學封裝 |
TW201921728A (zh) * | 2017-09-05 | 2019-06-01 | 韓商Lg伊諾特股份有限公司 | 半導體裝置封裝 |
Also Published As
Publication number | Publication date |
---|---|
WO2021014904A1 (ja) | 2021-01-28 |
JP7173347B2 (ja) | 2022-11-16 |
CN113646908A (zh) | 2021-11-12 |
TW202115930A (zh) | 2021-04-16 |
JPWO2021014904A1 (ja) | 2021-01-28 |
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