TWI685436B

TWI685436B - System and method for measuring track flatness

Info

Publication number: TWI685436B
Application number: TW107118675A
Authority: TW
Inventors: 林文一; 楊念祖
Original assignee: 萬業科技股份有限公司
Priority date: 2018-05-31
Filing date: 2018-05-31
Publication date: 2020-02-21
Also published as: TW202003302A

Abstract

本創作係一種測量軌道平整狀態的系統與方法，該系統包含一第一光學感應器、一第二光學感應器及一分析裝置；該第一光學感應器係裝設於行駛在軌道上的一交通工具的一第一車輪，該第二光學感應器係裝設於該交通工具的第二車輪，該第一光學感應器與該第二光學感應器係相對設置；該方法包含：a.量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量；b.判斷軌道不整的類型；該第一光學感應器、該第二光學感應器能量測出該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量，並將該等偏移量輸入該分析裝置中，該分析裝置即判斷出軌道不整的態樣。The present invention is a system and method for measuring the flatness of a track. The system includes a first optical sensor, a second optical sensor, and an analysis device; the first optical sensor is installed on a track running on the track A first wheel of the vehicle, the second optical sensor is mounted on the second wheel of the vehicle, the first optical sensor and the second optical sensor are oppositely arranged; the method includes: a. amount Measure a first X-axis offset, a first Y-axis offset and a first Z-axis offset; b. Determine the type of track irregularities; the energy of the first optical sensor and the second optical sensor The first X-axis offset, the first Y-axis offset, and the first Z-axis offset are measured, and the offsets are input into the analysis device, and the analysis device determines that the track is irregular Appearance.

Description

測量軌道平整狀態的系統及方法System and method for measuring track flatness

一種軌道測量系統及軌道測量方法，尤其是指一種利用光學感應器組成的系統，及利用光學感應器測量軌道不整形態的方法。 An orbit measurement system and orbit measurement method, in particular, a system composed of optical sensors and a method for measuring orbital irregularities using optical sensors.

在眾多的交通工具中，例如高鐵、火車、輕軌、捷運……等，都是使用到鐵軌作為移動媒介，而鐵軌本身的特殊性，無論是單軌制或是雙軌制，都只能讓特定的列車行駛，不會有其他交通工具與其搶道，因此，利用鐵軌作為移動媒介的交通工具大多為大眾交通運輸工具。換言之，這些列車只能行駛在特定的軌道上，一但因意外而駛離軌道，就無法正常地運行在一般路面，不但無法達成運輸的功能，還可能會因脫軌造成列車的翻覆，對乘客或是對其他用路人造成傷亡。 In many modes of transportation, such as high-speed rail, trains, light rail, MRT, etc., rails are used as mobile media, and the particularity of rails, whether it is single-rail system or dual-rail system, can only make certain When a train runs, there is no other means of transportation to grab the road, so most of the vehicles that use rails as mobile media are public transportation. In other words, these trains can only travel on a specific track. Once they leave the track due to an accident, they cannot run normally on the normal road. Not only can they not achieve the function of transportation, but also may cause the train to overturn due to derailment. Or cause casualties to other passers-by.

在眾多造成脫軌的意外中，其中一項為軌道不平整。造成軌道不平整的原因繁多且複雜。舉例而言，當地震發生時，可能會影響地面的平整性，進而扭曲鐵軌，使鐵軌的間距有所增減、兩條鐵軌間產生高低落差、鐵軌大幅地彎曲甚至斷裂，這些都有可能讓列車在行駛中脫軌，造成嚴重的安全問題；另外，列車行駛在鐵軌上時會對鐵軌施加力量，讓鐵軌些許形變，長時間反覆地行駛可能會造成金屬疲乏而累積鐵軌的形變量，使得列車在行駛過形變處會顛簸或搖晃，當鐵軌的形變量增加，顛簸或搖晃的程度隨之增加，雖不致影響行車安全，但會造成乘客的不適，以及物品的散落；而劇烈的溫度變化會使鐵軌的熱漲冷縮較為劇烈，同樣會影響乘車的舒適感。 Among the many accidents that caused derailment, one of them was uneven track. The causes of uneven track are numerous and complex. For example, when an earthquake occurs, it may affect the flatness of the ground, which will distort the rails, increase or decrease the distance between the rails, produce a high-low drop between the two rails, and greatly bend or even break the rails. The train derails while driving, causing serious safety problems. In addition, the train exerts force on the rail when it is running on the rail, causing the rail to deform slightly. Repeated driving for a long time may cause metal fatigue and accumulate the deformation of the rail, making the train It will bump or shake when driving through the deformation. When the deformation of the rail increases, the degree of bump or shaking will increase accordingly. Although it will not affect driving safety, it will cause discomfort to passengers and scattered items; and severe temperature changes will Making the railroad tracks heat up and down more drastically will also affect the ride comfort.

以往檢查鐵軌形變狀態的方法，一般為相關單位定期派遣人員行走在軌道上定點量測，惟這種方式費工費時，定點式的測量容易忽略掉某些形變量較大的軌道處，或是僅能得知某個定點的形變量，並無法知道一段長度的鐵軌是否以整體變形；定期式的檢查也不能及時發現且處理，無法有效率地解決此問題。 In the past, the method of checking the deformation status of the railroad track was usually to send personnel on the track to make fixed-point measurements on a regular basis. However, this method takes time and labor, and fixed-point measurement can easily ignore certain tracks with large deformation variables, or You can only know the deformation of a fixed point, and you cannot know whether a length of rail is deformed as a whole; regular inspections cannot be found and processed in time, and this problem cannot be solved efficiently.

為能及時偵測到軌道的形變，讓相關單位的人員能及時發現軌道異常處，本創作係提出一種測量軌道平整狀態的系統及方法，在列車的車輪上安裝光學感應器，能在列車行駛中監測整條軌道的形變量，降低人力檢查的成本，也能較清楚得知一條鐵路上鐵軌在各點及整體的形變量。 In order to detect the deformation of the track in time and allow the personnel of the relevant units to find the track abnormality in time, the Department of Creation proposes a system and method for measuring the smoothness of the track. An optical sensor is installed on the wheel of the train to be able to travel on the train It can monitor the deformation of the entire track in order to reduce the cost of manpower inspection, and can clearly know the deformation of each rail and the overall deformation of a rail on a railway.

為達成上述目的，本創作一種測量軌道平整狀態的系統，其裝設於一行走於軌道的列車上，該測量軌道平整狀態的系統包含：一第一光學感應器，係裝設於該列車的一第一車輪，該第一車輪係行走於該第一軌道上；一第二光學感應器，係裝設於該列車的一第二車輪，該第二車輪係行走於該第二軌道上，第二光學感應器與該第一光學感應器係相對設置，該第一光學感應器與第二光學感應器係量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量，其中：該第一X軸偏移量係為該第一光學感應器與該第二光學感應器在X軸向的相對移動量；該第一Y軸偏移量係為該第一光學感應器與該第二光學感應器在Y軸向的相對移動量，其中Y軸向係為該第一軌道垂直朝上及垂直朝下的方向；該第一Z軸偏移量係為該第一軌道與該第二軌道之間的距離變化量，其中Z軸向為沿著該第一軌道垂直朝向該第二軌道的方向，且Z軸向分別垂直於Y軸向及X軸向；一分析裝置，係與該第一光學感應器與第二光學感應器電性連接，該分析裝置接收且根據該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量，判斷軌道平整狀態；該第一光學感應器具有一第一光源發射器及一第一光學接收矩陣，該第二光學感應器係具有一第二光源發射器及一第二光學接收矩陣，該第一光源發射器係經一固定時間或移動一預設長度時發射雷射光予該第二光學接收矩陣接收，同時該第二光源發射器係經一固定時間或移動一預設長度時發射雷射光予該第一光學接收矩陣接收；一第三光學感應器，係裝設於該列車上的一第一車輪，該第三光學感應器具有一第三光源發射器及一第三光學接收矩陣；一第四光學感應器，係裝設於該列車上的一第三車輪，該第三車輪係朝X軸向行走於該第一軌道上，且與該第一車輪呈間隔設置，該第四光學感應器具有一第四光源發射器及一第四光學接收矩陣；該第三光學感應器及該第四光學感應器係量測一第二X軸偏移量、一第二Y軸偏移量及一第二Z軸偏移量。 In order to achieve the above purpose, the author creates a system for measuring the track flatness status, which is installed on a train walking on the track. The system for measuring the track flatness status includes: a first optical sensor, which is installed on the train A first wheel, the first wheel is walking on the first track; a second optical sensor is a second wheel installed on the train, the second wheel is walking on the second track, The second optical sensor and the first optical sensor are arranged oppositely. The first optical sensor and the second optical sensor measure a first X-axis offset, a first Y-axis offset and a The first Z-axis offset, wherein: the first X-axis offset is the relative movement of the first optical sensor and the second optical sensor in the X axis; the first Y axis offset Is the relative movement amount of the first optical sensor and the second optical sensor in the Y-axis direction, wherein the Y-axis direction is the vertical upward and downward directions of the first track; The first Z-axis offset is the amount of change in the distance between the first track and the second track, where the Z axis is the direction perpendicular to the second track along the first track, and the Z axis Perpendicular to the Y axis and the X axis, respectively; an analysis device electrically connected to the first optical sensor and the second optical sensor, the analysis device receives and receives the first X axis offset, the first A Y-axis offset and the first Z-axis offset determine the track leveling state; the first optical sensor has a first light source emitter and a first optical receiving matrix, and the second optical sensor has a A second light source emitter and a second optical receiving matrix, the first light source emitter emits laser light to the second optical receiving matrix for a fixed time or moving a preset length, and the second light source emitter It emits laser light to the first optical receiving matrix for a fixed time or moves a preset length; a third optical sensor is a first wheel installed on the train, the third optical sensor There is a third light source emitter and a third optical receiving matrix; a fourth optical sensor is a third wheel mounted on the train, the third wheel is walking on the first track towards the X axis And arranged at an interval from the first wheel, the fourth optical sensor has a fourth light source emitter and a fourth optical receiving matrix; the third optical sensor and the fourth optical sensor measure a second X-axis offset, a second Y-axis offset, and a second Z-axis offset.

一種測量軌道平整狀態的系統，其裝設於一行走於一第一軌道及一第二軌道的列車上，該第一軌道係於該第二軌道平行朝X軸向延伸，該測量軌道平整狀態的系統包含：一第三光學感應器，係裝設於一列車上的一第一車輪，該第一車輪係朝X軸向行走於該第一軌道上；一第四光學感應器，係裝設於該列車的一第三車輪，該第三車輪係行走於該第一軌道上，第四光學感應器與該第三光學感應器係相對設置，該第三光學感應器與第四光學感應器係量測一第二Y軸偏移量及一第二Z軸偏移量，其中：該第二Y軸偏移量係為該第三光學感應器與該第四光學感應器在Y軸向的相對移動量，其中Y軸向係為該第一軌道垂直朝上及垂直朝下的方向；該第二Z軸偏移量係為該第一軌道與該第二軌道之間的距離變化量，其中Z軸向為沿著該第一軌道垂直朝向該第二軌道的方向，且Z軸向分別垂直於Y軸向及X軸向；一分析裝置，係與該第三光學感應器與第四光學感應器電性連接，該分析裝置接收且根據該第二Y軸偏移量及該第二Z軸偏移量，判斷軌道平整狀態。 A system for measuring track flatness is installed on a train running on a first track and a second track. The first track extends parallel to the X axis on the second track. The measurement track is flat. The system includes: a third optical sensor, a first wheel mounted on a train, the first wheel is walking on the first track toward the X axis; A fourth optical sensor is installed on a third wheel of the train, the third wheel runs on the first track, the fourth optical sensor and the third optical sensor are oppositely arranged, the first The three optical sensors and the fourth optical sensor measure a second Y-axis offset and a second Z-axis offset, wherein: the second Y-axis offset is the third optical sensor and The relative movement amount of the fourth optical sensor in the Y-axis direction, wherein the Y-axis direction is the vertical upward and downward directions of the first rail; the second Z-axis offset is the first rail and the The amount of change in the distance between the second rails, where the Z axis is the direction perpendicular to the second rail along the first rail, and the Z axis is perpendicular to the Y axis and the X axis respectively; an analysis device, It is electrically connected to the third optical sensor and the fourth optical sensor. The analysis device receives and determines the track flat state according to the second Y-axis offset and the second Z-axis offset.

一種測量軌道平整狀態的方法，使用於行走於一第一軌道及一第二軌道的一列車，該測量軌道平整狀態的方法包含：a.量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量，利用一第一光學感應器與一第二光學感應器，該第一光學感應器係裝設於該列車的一第一車輪，該第二光學感應器係裝設於該列車的一第二車輪，該第一車輪係行走於該第一軌道，該第二車輪係行走於該第二軌道；在a步驟中更包含a1步驟：量測一第二X軸偏移量、一第二Y軸偏移量及一第二Z軸偏移量，利用一第三光學感應器及一第四光學感應器，其中該第三光學感應器裝設於該第一車輪，該第四光學感應器係裝設於一第三車輪，該第三車輪係行走於該第一軌道，該第一車輪與該第三車輪係間隔設置；b.判斷軌道不整的類型，將該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量利用一分析裝置整合後判斷。本創作利用具有光源發射器及光學接收矩陣的光學感應器，在列車行駛當中每經過固定時間或固定距離進行一次測量，較能精準量測軌道在各處的形變量。 A method for measuring the track flatness state is used for a train walking on a first track and a second track. The method for measuring the track flatness state includes: a. measuring a first X-axis offset, a first The Y-axis offset and a first Z-axis offset utilize a first optical sensor and a second optical sensor. The first optical sensor is installed on a first wheel of the train. Two optical sensors are installed on a second wheel of the train, the first wheel is walking on the first track, and the second wheel is walking on the second track; step a1 further includes: Measuring a second X-axis offset, a second Y-axis offset and a second Z-axis offset, using a third optical sensor and a fourth optical sensor, wherein the third optical sensor Installed on the first wheel, the fourth optical sensor is installed on a third wheel, the third wheel is walking on the first track, the first wheel and the third wheel are spaced apart; b. To determine the type of track irregularity, the first X-axis offset, the first Y-axis offset and the first Z-axis offset are integrated and analyzed by an analysis device. This creation uses an optical sensor with a light source transmitter and an optical receiving matrix to make a measurement every time a fixed time or a fixed distance passes during train travel, which can accurately measure the deformation of the track everywhere.

更進一步，軌道不整的態樣如以下所述：軌距不整：當該第一光學感應器與該第二光學感應器量測到該第一Z軸偏移量大於或小於一預設值，即判斷為軌距不整；水平不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，即判斷為水平不整；高低不整：當該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為高低不整；方向不整：當該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為方向不整；第一平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為第一平面不整；第二平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為第二平面不整；複合不整：當該第一光學感應器與該第二光學感應器量測到該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量及該第二Z軸偏移量皆大於或小於該預設值，即判斷為複合不整；其中該預設值為零。 Furthermore, the track irregularities are as follows: track pitch irregularity: when the first optical sensor and the second optical sensor measure that the first Z-axis offset is greater or less than a preset value, It is determined that the gauge is irregular; the horizontal is irregular: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater or less than the preset value, it is determined that the horizontal is irregular; : When the third optical sensor and the fourth optical sensor measure that the second Y-axis offset is greater than or less than the preset value, it is judged as irregularity; the direction is irregular: when the third optical sensor And the fourth optical sensor measures that the second Z-axis offset is greater or less than the preset value, that is, it is determined that the direction is irregular; the first plane is irregular: when the first optical sensor and the second optical sensor The first Y-axis offset is greater than or less than the preset value, and the third and fourth optical sensors measure that the second Y-axis offset is greater or less than the preset Value, that is, the first plane is determined to be irregular; the second plane is irregular: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater or less than the preset value, and the first When the three optical sensors and the fourth optical sensor measure that the second Z-axis offset is greater or less than the preset value, it is determined that the second plane is irregular; compound irregularity: when the first optical sensor and the The second optical sensor measures that the first Y-axis offset is greater than or less than the preset value, and the third optical sensor and the fourth optical sensor measure the second Y-axis offset and If the second Z-axis offset is greater than or less than the preset value, it is judged as compound irregularity; wherein the preset value is zero.

藉由各光學感應器所量測的各軸偏移量所搭配，並交由該分析裝置進行分析，能判斷出此區域的軌道不平整的型態為何，進而採取適當的維護或維修方式，既精準又能減少時間及人力成本。 By matching the offset of each axis measured by each optical sensor, and passing it to the analysis device for analysis, it can determine the type of uneven track in this area, and then take appropriate maintenance or repair methods. It is accurate and can reduce time and labor costs.

10‧‧‧第一光學感應器 10‧‧‧First optical sensor

11‧‧‧第一光學發射器 11‧‧‧First optical transmitter

13‧‧‧第一光學接收矩陣 13‧‧‧First optical receiving matrix

15‧‧‧第一車輪 15‧‧‧ First wheel

20‧‧‧第二光學感應器 20‧‧‧Second optical sensor

23‧‧‧第二光學接收矩陣 23‧‧‧Second optical receiving matrix

25‧‧‧第二車輪 25‧‧‧ second wheel

30‧‧‧分析裝置 30‧‧‧Analysis device

51‧‧‧第一軌道 51‧‧‧ First track

52‧‧‧第二軌道 52‧‧‧The second track

60‧‧‧第三光學感應器 60‧‧‧ Third optical sensor

70‧‧‧第四光學感應器 70‧‧‧ Fourth optical sensor

90‧‧‧列車 90‧‧‧Train

91‧‧‧第一車輪 91‧‧‧ First wheel

92‧‧‧第二車輪 92‧‧‧Second wheel

93‧‧‧第三車輪 93‧‧‧The third wheel

94‧‧‧第四車輪 94‧‧‧ Fourth wheel

B‧‧‧黑點 B‧‧‧Black dot

W‧‧‧白點 W‧‧‧White spot

D,D1,D2,D3‧‧‧距離 D, D1, D2, D3 ‧‧‧ distance

L‧‧‧預設長度 L‧‧‧ preset length

θ‧‧‧角度 θ‧‧‧angle

圖1：本創作一種測量軌道平整狀態的系統及方法之電路方塊圖。 Figure 1: This is a circuit block diagram of a system and method for measuring track flatness.

圖2：本創作之光學感應器配置圖。 Figure 2: The layout of the optical sensor in this creation.

圖3：本創作之光學感應器示意圖。 Figure 3: Schematic diagram of the optical sensor in this creation.

圖4：本創作之兩光學感應器發射與接收示意圖。 Figure 4: Schematic diagram of the transmission and reception of the two optical sensors in this creation.

圖5A：本創作X軸偏移量示意圖。 Figure 5A: Schematic diagram of the X-axis offset of this creation.

圖5B：本創作Z軸偏移量示意圖。 Figure 5B: Schematic diagram of the Z-axis offset of this creation.

圖6：本創作Y軸偏移量曲線圖。 Figure 6: Y-axis offset curve of this creation.

圖7：本創作之光學感應器在移動中量測的動態示意圖。 Figure 7: The dynamic schematic diagram of the measurement of the optical sensor in the movement.

圖8：本創作之步驟流程圖。 Figure 8: Flow chart of the steps of this creation.

圖9：本創作之軌道第一不整態樣示意圖。 Figure 9: Schematic diagram of the first irregularity of the track of this creation.

圖10：本創作之軌道第二不整態樣示意圖。 Figure 10: Schematic diagram of the second irregularity of the track of this creation.

圖11A：本創作之軌道第三不整態樣立體圖。 Figure 11A: A perspective view of the third irregularity of the track in this creation.

圖11B：本創作之軌道第三不整態樣側視圖。 Figure 11B: Side view of the third irregularity of the track of this creation.

圖12A：本創作之軌道第四不整態樣立體圖。 Figure 12A: A perspective view of the fourth irregularity of the track of this creation.

圖12B：本創作之軌道第四不整態樣側視圖。 Figure 12B: Side view of the fourth irregularity of the track of this creation.

圖13A：本創作之軌道第五不整態樣立體圖。 Figure 13A: A perspective view of the fifth irregularity of the track of this creation.

圖13B：本創作之軌道第五不整態樣側視圖。 Figure 13B: Side view of the fifth irregularity of the track of this creation.

圖14A：本創作之軌道第六不整態樣立體圖。 Figure 14A: A perspective view of the sixth irregularity of the track of this creation.

圖14B：本創作之軌道第六不整態樣側視圖。 Figure 14B: Side view of the sixth irregularity of the track of this creation.

圖15：本創作之軌道第七不整態樣立體圖。 Figure 15: A perspective view of the seventh irregularity of the track of this creation.

請參見圖1，本創作一種測量軌道平整狀態的系統包含：一第一光學感應器10、一第二光學感應器20及一分析裝置30。該第一光學感應器10、該第二光學感應器20係分別與該分析裝置30電性連接。 Referring to FIG. 1, the author creates a system for measuring the track flatness state including: a first optical sensor 10, a second optical sensor 20 and an analysis device 30. The first optical sensor 10 and the second optical sensor 20 are electrically connected to the analysis device 30 respectively.

請參見圖2，該第一光學感應器10係裝設於一列車90的一第一車輪91，該第二光學感應器20係裝設於該列車90的一第二車輪92上，其中該第一車輪91係行走於一第一軌道51，該第二車輪92係行走於一第二軌道52，該第一軌道51與該第二軌道52係相對設置，且該第一軌道51與該第二軌道52之延伸方向係定義為朝X軸向延伸。如圖2所示，該第一光學感應器10及該第二光學感應器20係相對設置，均設置在該第一車輪91與該第二車輪92的內側。 2, the first optical sensor 10 is installed on a first wheel 91 of a train 90, and the second optical sensor 20 is installed on a second wheel 92 of the train 90, wherein the The first wheel 91 runs on a first track 51, the second wheel 92 runs on a second track 52, the first track 51 and the second track 52 are oppositely arranged, and the first track 51 and the The extension direction of the second rail 52 is defined as extending toward the X axis. As shown in FIG. 2, the first optical sensor 10 and the second optical sensor 20 are oppositely arranged, and are both disposed inside the first wheel 91 and the second wheel 92.

為清楚說明該第一光學感應器10及該第二光學感應器20之間的相對位置及相對運動，茲定義以下方位：X軸向為該第一軌道51及該第二軌道52的延伸方向；Y軸向係為該第一軌道51或該第二軌道52垂直朝上及垂直朝下的方向；Z軸向為沿著該第一軌道51垂直朝向該第二軌道52的分量，且Z軸向與Y軸向及X軸向為正交的三軸，若以該第一軌道51與該第二軌道52所在的路面或地面為基準，X軸向與Z軸向所構成之平面即該路面或地面。 To clearly illustrate the relative position and relative movement between the first optical sensor 10 and the second optical sensor 20, the following orientation is defined: the X axis is the extending direction of the first rail 51 and the second rail 52 The Y axis is the direction of the first rail 51 or the second rail 52 vertically upward and vertically downward; the Z axis is the component along the first rail 51 perpendicular to the second rail 52, and Z The three axes that are orthogonal to the Y axis and the X axis are the planes formed by the X axis and the Z axis if the first track 51 and the second track 52 are located on the road surface or ground. The pavement or ground.

請進一步參見圖3，該第一光學感應器10包含一第一光源發射器11及一第一光學接收矩陣13；該第二光學感應器20同樣包含一第二光源發射器及一第二光學接收矩陣。請進一步參見圖4，該第一光學感應器10係利用該第一光源發射器11發射雷射光至該第二光學接收矩陣，該第二光源發射器發射雷射光至該第一光學接收矩陣13，以圖4為例，在一般情形下，該第一軌道51及該第二軌道52係為平整，該第二光源發射器係發射一道雷射光至該第一光學接收矩陣13的中心(圖4中的黑點B)，而該第一光源發射器11同樣會發射一道雷射光至該第二光學接收矩陣的中心(圖上未畫出)。更進一步，為先取得兩軌道之一間距基準值，係利用該第一軌道51及該第二軌道52在正常狀態下的相對位置，讓該第一光源發射器11發射雷射光至該第二光學矩陣，並記錄雷射光發射到接收的時間，將這個時間定義為一基準收發時間，該分析裝置30會紀錄該基準收發時間的值，供後續比較參考。 Please further refer to FIG. 3, the first optical sensor 10 includes a first light source emitter 11 and a first optical receiving matrix 13; the second optical sensor 20 also includes a second light source emitter and a second optical Receive matrix. Please further refer to FIG. 4, the first optical sensor 10 uses the first light source emitter 11 to emit laser light to the second optical receiving matrix, and the second light source emitter emits laser light to the first optical receiving matrix 13 , Taking FIG. 4 as an example, under normal circumstances, the first track 51 and The second track 52 is flat, the second light source emitter emits a laser beam to the center of the first optical receiving matrix 13 (black dot B in FIG. 4), and the first light source emitter 11 will also A laser beam is emitted to the center of the second optical receiving matrix (not shown in the figure). Furthermore, in order to obtain a reference value of the distance between two tracks first, the relative positions of the first track 51 and the second track 52 in a normal state are used to allow the first light source emitter 11 to emit laser light to the second track The optical matrix records the time from when the laser light is transmitted to when it is received. This time is defined as a reference transceiver time, and the analysis device 30 records the value of the reference transceiver time for subsequent comparison and reference.

當因地震或是受到外力影響，該第一軌道51及該第二軌道52呈現非正常狀態，讓該第一車輪91與該第二車輪92之間的相對位置有所偏移，使得該第一光源發射器11及該第二光學接收矩陣之間的相對位置偏移，所發射之雷射光會偏移該第二光學接收矩陣的中心，使得在該第二光學接收矩陣上接收的光點位置與中心點的距離不為零。例如圖4中的白點W，其位置偏離該第一光學接收矩陣13的中心。舉例而言，請參見圖5A，該第二光學感應器20朝X軸向偏移了一段距離D，該第二光學接收矩陣係紀錄到一X軸偏移量，且該X軸偏移量為D。該第二光學接收矩陣接著將該X軸偏移量傳輸至該分析裝置30中。而當該第二光學感應器20朝Y軸向偏移了另一段距離時，該第二光學接收矩陣會記錄到一Y軸偏移量，再將該Y軸偏移量傳輸至該分析裝置30中。 When an earthquake or an external force affects the first rail 51 and the second rail 52 in an abnormal state, the relative position between the first wheel 91 and the second wheel 92 is offset, so that the first The relative position between a light source emitter 11 and the second optical receiving matrix is shifted, the emitted laser light will be shifted from the center of the second optical receiving matrix, so that the light spot received on the second optical receiving matrix The distance between the location and the center point is not zero. For example, the white point W in FIG. 4 is located away from the center of the first optical receiving matrix 13. For example, referring to FIG. 5A, the second optical sensor 20 is offset by a distance D toward the X axis, the second optical receiving matrix records an X axis offset, and the X axis offset For D. The second optical receiving matrix then transmits the X-axis offset to the analysis device 30. When the second optical sensor 20 is offset by another distance toward the Y axis, the second optical receiving matrix records a Y axis offset, and then transmits the Y axis offset to the analysis device 30.

請參見5B，當該第二光學感應器20朝Z軸向偏移了一段距離D時，由於該第一光學感應器10及該第二光學感應器20的距離有所變化，使實際收發時間會與該基準收發時間有所不同，該分析裝置30會記錄該實際收發時間，並與該基準收發時間進行比較，以該收發時間及該基準收發時間之間的時間差換算出該偏移的距離D之數值，計算出來的距離D之數值即為該Z軸偏移量。 Please refer to 5B. When the second optical sensor 20 is shifted toward the Z axis by a distance D, the distance between the first optical sensor 10 and the second optical sensor 20 changes, so that the actual transceiver time It will be different from the reference transceiver time, the analysis device 30 will record the actual transceiver time and compare with the reference transceiver time, convert the offset distance by the time difference between the transceiver time and the reference transceiver time The value of D, the calculated value of distance D is the Z-axis offset.

以該列車90在行駛中的動態測量為說明，請參見圖6及圖7，該列車90往X軸向行駛。編號1代表在該列車90行經第一記錄點，編號2代表在該列車90行經第二記錄點，編號3代表在該列車90行經第三記錄點，以此類推，圖中以5個記錄點為例。該列車90每移動一預設長度L時，該第一光學感應器10及該第二光學感應器20同樣會移動一預設長度L，這時該第一光源發射器11發射一次雷射光予該第二光學接收矩陣23。在該列車行經第一紀錄點時，該第二光學接收矩陣23記錄到該Y軸偏移量為0；該列車90行經第二記錄點時，該第二光學接收矩陣23記錄到該Y軸偏移量為+1，代表此區段的該第一軌道51及該第二軌道52之間有高低上的偏移；該列車90行經第三記錄點時，該第二光學接收矩陣23記錄到該Y軸偏移量為+0，代表此區段的該第一軌道51及該第二軌道52之間無高低上的偏差；該列車90行經第四記錄點時，該第二光學接收矩陣23記錄到該Y軸偏移量為+0；該列車90行經第五記錄點時，該第二光學接收矩陣23記錄到該Y軸偏移量為+2，代表此區段的該第一軌道51及該第二軌道52之間有高低上的偏差，且偏差的量大於在第二記錄點時的區段。將該列車90在行駛的路段中，所有紀錄點的Y軸偏移量記錄下來並累加，能看出在這區段鐵軌在Y軸上的總形變量，可得到如圖6的曲線圖，依此判斷在這區段鐵軌的Y軸形變的嚴重程度。 Taking the dynamic measurement of the train 90 during traveling as an illustration, please refer to FIGS. 6 and 7, the train 90 travels in the X axis direction. Number 1 means passing the first recording point on the train 90, number 2 means passing the second recording point on the train 90, number 3 means passing the third recording point on the train 90, and so on. For example. Each time the train 90 moves a preset length L, the first optical sensor 10 and the second optical sensor 20 will also move a preset length L. At this time, the first light source emitter 11 emits laser light once to the Second optical receiving matrix 23. When the train travels through the first recording point, the second optical receiving matrix 23 records that the Y axis offset is 0; when the train travels through the second recording point, the second optical receiving matrix 23 records on the Y axis The offset is +1, which means that there is an offset between the first track 51 and the second track 52 in this section; when the train 90 travels through the third recording point, the second optical receiving matrix 23 records The offset to the Y axis is +0, which means that there is no difference in height between the first track 51 and the second track 52 in this section; when the train 90 passes the fourth recording point, the second optical receiver Matrix 23 records that the Y-axis offset is +0; when the train 90 passes through the fifth recording point, the second optical receiving matrix 23 records that the Y-axis offset is +2, which represents the first There is a difference in height between a track 51 and the second track 52, and the amount of the deviation is larger than the zone at the second recording point. Recording and accumulating the Y-axis offsets of all the recorded points of the train 90 in the traveling section, it can be seen that the total deformation of the rails in this section on the Y-axis can obtain the graph as shown in Figure 6, Based on this, determine the severity of the Y-axis deformation of the rails in this section.

在本創作的另一較佳實施例中，該第一光學感應器10、該第二光學感應器20、該第三光學感應器60及該第四光學感應器70係設定為經過一固定時間發射/接收一次雷射光進行測量。 In another preferred embodiment of the present invention, the first optical sensor 10, the second optical sensor 20, the third optical sensor 60 and the fourth optical sensor 70 are set to pass a fixed time Transmit/receive a laser beam for measurement.

請參見圖8，本創作測量軌道平整狀態的方法包含：S101：利用一第一光學感應器10與一第二光學感應器20量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量； S102：判斷軌道不整的類型，該分析裝置30接收並整合該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量。 Please refer to FIG. 8, the method for measuring the track flatness in this creation includes: S101: measuring a first X-axis offset and a first Y-axis offset by using a first optical sensor 10 and a second optical sensor 20 Shift and a first Z-axis offset; S102: Determine the type of track irregularity. The analysis device 30 receives and integrates the first X-axis offset, the first Y-axis offset, and the first Z-axis offset.

以下就軌道不整的類型進行說明： The following describes the types of track irregularities:

TYPE1：軌距不整；請參見圖9，當該第一軌道51與該第二軌道52之間的相對距離有所增加或減少，該第二光學接收矩陣23所記錄到的該實際收發時間會比預設的該收發時間長或短，在本實施例中，該第二軌道52與該第一軌道51的相對距離增加了一段距離D，該分析裝置30利用該實際收發時間與該基準收發時間的時間差換算出該第一Z軸偏移量，該第一Z軸偏移量即為距離D。當一段鐵道中僅得到該第一Z軸偏移量，該分析裝置30會判斷此段鐵道的不整態樣為軌距不整。 TYPE1: irregular gauge; please refer to FIG. 9, when the relative distance between the first track 51 and the second track 52 increases or decreases, the actual transceiver time recorded by the second optical receiving matrix 23 will be Is longer or shorter than the preset sending and receiving time, in this embodiment, the relative distance between the second track 52 and the first track 51 is increased by a distance D, and the analyzing device 30 uses the actual sending and receiving time to send and receive with the reference The time difference of time is converted into the first Z-axis offset, and the first Z-axis offset is the distance D. When only the first Z-axis offset is obtained in a section of railway, the analysis device 30 will determine that the irregularity of the section of railway is gauge irregularity.

TYPE2：水平不整；請參見圖10，當該第一軌道51與該第二軌道52之間有高低落差，未位於同一水平面上，且該第一軌道51高於該第二軌道52，使得該第二光學接收矩陣23接收到該第一Y軸偏移量為-D。當一段鐵道中僅得到該第一Y軸偏移量，該分析裝置30會判斷此段鐵道的不整態樣為水平不整，即兩軌道的高度不一致。 TYPE2: The level is uneven; please refer to FIG. 10, when there is a height difference between the first rail 51 and the second rail 52, which are not on the same horizontal plane, and the first rail 51 is higher than the second rail 52, making the The second optical receiving matrix 23 receives that the first Y-axis offset is -D. When only the first Y-axis offset is obtained in a section of railway, the analysis device 30 will determine that the irregularity of the section of railway is horizontal, that is, the heights of the two tracks are inconsistent.

TYPE3：高低不整；請參見圖2，本態樣的測量需用到一第三光學感應器60及一第四光學感應器70，該第三光學感應器60係裝設於該第一車輪91，該第四光學感應器70係裝設於一第三車輪93，其中該第三車輪93係裝設於該列車90，且與該第一車輪91同樣行走在該第一軌道51上，並與該第一車輪91呈間隔設置；該第三光學感應器60具有一第三光源發射器及一第三光學接收矩陣；該第四光學感應器70係具有一第四光源發射器及一第四光學接收矩陣。該第三光學感應器60與一第四光學感應器70量測一第二X軸偏移量、一第二Y軸偏移量及一第二Z軸偏移量。 TYPE3: unevenness; please refer to FIG. 2, a third optical sensor 60 and a fourth optical sensor 70 are required for the measurement of this aspect, the third optical sensor 60 is installed on the first wheel 91, The fourth optical sensor 70 is installed on a third wheel 93, wherein the third wheel 93 is installed on the train 90, and walks on the first track 51 like the first wheel 91, and The first wheels 91 are arranged at intervals; the third optical sensor 60 has a third light source emitter and a third optical receiving matrix; the fourth optical sensor 70 has a fourth light source emitter and a fourth Optical receiving matrix. The third optical sensor 60 and a fourth optical sensor 70 measure a second X-axis offset, a second Y-axis offset, and a second Z-axis offset.

以該第一軌道51為例，請參見圖11A及圖11B，當該第一軌道51的某個軌段下降了該距離D，在該列車90行駛的過程中，該第三光學感應器60會先進入下降的軌段，而該第四光學感應器70尚未進入下降的軌段，使該第三光學感應器60及該第四光學感應器70同樣產生了該距離D的落差；在進行量測時，該第三光學接收矩陣及該第四光學接收矩陣會記錄到值為距離D的該第二Y軸偏移量。當一段軌道中在一基準長度內僅得到該第二Y軸偏移量，該分析裝置30會判斷此段鐵道的不整態樣為高低不整。 Taking the first track 51 as an example, please refer to FIGS. 11A and 11B. When a certain track section of the first track 51 drops by the distance D, the third optical sensor 60 is in the process of the train 90 traveling Will enter the descending rail segment first, and the fourth optical sensor 70 has not yet entered the descending rail segment, causing the third optical sensor 60 and the fourth optical sensor 70 to also produce the drop of the distance D; During the measurement, the third optical receiving matrix and the fourth optical receiving matrix will record the second Y-axis offset value of the distance D. When only the second Y-axis offset is obtained within a reference length in a section of track, the analysis device 30 determines that the irregularity of the section of railway is uneven.

TYPE4：方向不整；請參見圖12A及圖12B，當該第一軌道51與該第二軌道52的某個軌段向Z軸向同時偏移了一段距離D，使該第三光學感應器60及該第四光學感應器70同樣產生了該距離D的落差，該第三光學接收矩陣及該第四光學接收矩陣會記錄到距離D的該第二Z軸偏移量。當一段鐵道中僅得到該第三光學感應器60及該第四光學感應器70所量測到的該第二Z軸偏移量，該分析裝置30會判斷此段鐵道的不整態樣為高低不整。 TYPE4: Irregular direction; please refer to FIG. 12A and FIG. 12B, when a certain track segment of the first track 51 and the second track 52 is simultaneously offset to the Z axis by a distance D, so that the third optical sensor 60 And the fourth optical sensor 70 also produces the drop of the distance D, the third optical receiving matrix and the fourth optical receiving matrix will record the second Z-axis offset of the distance D. When only the second Z-axis offset measured by the third optical sensor 60 and the fourth optical sensor 70 is obtained in a section of railway, the analysis device 30 will determine whether the irregularity of the section of railway is high or low Irregular.

TYPE5：第一平面不整；請參見圖13A及圖13B，當該第一軌道51與該第二軌道52的某個軌段向Y軸向同時凸起或是凹陷了一段距離D1，且在這個軌段中，該第二軌道52相對於該第一軌道51旋轉了一角度θ，使得該第一軌道51高於該第二軌道52一段距離D2，該第一光學感應器10及該第二光學感應器20係量測到該第一Y軸偏移量，且該第一Y軸偏移量的值為D2；該第三光學感應器60與該第四光學感應器70係量測到該第二Y軸偏移量，且該第二Y軸偏移量為D1。當該分析裝置30係接收到且僅接收到來自第一光學感應器10/第二光學感應器的該第一Y軸偏移量=D2，及來自第三光學感應器60/第四光學感應器70的該第二Y軸偏移量=D1，則會判斷此段鐵道的不整態樣為第一平面不整。 TYPE5: The first plane is irregular; please refer to FIGS. 13A and 13B, when a certain rail segment of the first rail 51 and the second rail 52 simultaneously protrudes or is recessed by a distance D1 toward the Y axis, and at this In the track segment, the second track 52 is rotated by an angle θ relative to the first track 51 so that the first track 51 is higher than the second track 52 by a distance D2, the first optical sensor 10 and the second The optical sensor 20 measures the first Y-axis offset, and the value of the first Y-axis offset is D2; the third optical sensor 60 and the fourth optical sensor 70 measure The second Y-axis offset, and the second Y-axis offset is D1. When the analysis device 30 receives and only receives the first Y-axis offset = D2 from the first optical sensor 10 / second optical sensor, and the third optical sensor 60 / fourth optical sensor The second Y-axis offset of the device 70 = D1, it will be judged that the irregularity of this section of the railway is the irregularity of the first plane.

TYPE6：第二平面不整；請參見圖14A，當該第一軌道51與該第二軌道52的某個軌段向Z軸向同時偏移了一段距離D1，且在這個軌段中，該第二軌道52相對於該第一軌道51旋轉了該角度θ，使得該第一軌道51高於該第二軌道52一段距離D2，該第一光學感應器10及該第二光學感應器20係量測到該第一Y軸偏移量，且該第一Y軸偏移量的值為D2；該第三光學感應器60與該第四光學感應器70係量測到該第二Z軸偏移量，且該第二Z軸偏移量為D1。當該分析裝置30係接收到且僅接收到該第一Y軸偏移量及該第二Z軸偏移量，則會判斷此段鐵道的不整態樣為第一平面不整。 TYPE6: The second plane is irregular; please refer to FIG. 14A, when a certain track segment of the first track 51 and the second track 52 is simultaneously offset by a distance D1 in the Z axis direction, and in this track segment, the first The second rail 52 rotates the angle θ relative to the first rail 51 so that the first rail 51 is higher than the second rail 52 by a distance D2, the first optical sensor 10 and the second optical sensor 20 are The first Y-axis offset is measured, and the value of the first Y-axis offset is D2; the third optical sensor 60 and the fourth optical sensor 70 measure the second Z-axis offset The amount of shift, and the second Z-axis offset is D1. When the analysis device 30 receives and only receives the first Y-axis offset and the second Z-axis offset, it will determine that the irregularity of the railway is the first plane irregularity.

TYPE7：複合不整；請參見圖15，當該第一軌道51與該第二軌道52的某個軌段向Y軸向同時凸起或是凹陷了一段距離D1，同時，該第二軌道52相對於該第一軌道51旋轉了該角度θ，使得該第一軌道51高於該第二軌道52一段距離D2，同時，該第一軌道51與該第二軌道52同樣朝Z軸向偏移一段距離D3。在上述的各種偏移中，該第三光學感應器60及該第四光學感應器70係量測到該第二Y軸偏移量，且該第二Y軸偏移量的值為D1；該第一光學感應器10與該第二光學感應器20係量測到該第一Y軸偏移量，且該第一Y軸偏移量為D2；該第三光學感應器60及該第四光學感應器70量測到該第二Z軸偏移量，且該第二Z軸偏移量=D3。當該分析裝置30係接收到來自第三光學感應器60/第四光學感應器70的該第二Y軸偏移量=D1，以及來自第一光學感應器10/第二光學感應器20的該第一Y軸偏移量D2，以及來自第三光學感應器60/第四光學感應器70的該第二Z軸偏移量=D3，則會判斷此段鐵道的不整態樣為複合不整。 TYPE7: Recombination is incomplete; please refer to FIG. 15, when a certain track segment of the first rail 51 and the second rail 52 is convex or concave at a distance D1 to the Y axis at the same time, at the same time, the second rail 52 is opposite When the first track 51 rotates by the angle θ, the first track 51 is higher than the second track 52 by a distance D2, and at the same time, the first track 51 and the second track 52 are also offset by a certain amount in the Z axis direction Distance D3. Among the various offsets described above, the third optical sensor 60 and the fourth optical sensor 70 measure the second Y-axis offset, and the value of the second Y-axis offset is D1; The first optical sensor 10 and the second optical sensor 20 measure the first Y-axis offset, and the first Y-axis offset is D2; the third optical sensor 60 and the first The four optical sensors 70 measure the second Z-axis offset, and the second Z-axis offset = D3. When the analysis device 30 receives the second Y-axis offset = D1 from the third optical sensor 60 / fourth optical sensor 70, and the first optical sensor 10 / second optical sensor 20 The first Y-axis offset D2, and the second Z-axis offset = D3 from the third optical sensor 60/fourth optical sensor 70, it will be judged that the irregularity of this section of the railway is compound irregularity .

本創作係利用多個光學感應器安裝在該列車90上，在該列車90行進時即能隨時量測所經軌段之鐵軌形變量，並用該分析裝置30整合該等光學感應器所量測到的該第一X軸偏移量、該第一Y軸偏移量、該第一Z軸偏移量、第二X軸偏移量、該第二Y軸偏移量及該第二Z軸偏移量，判別出這條鐵路上的軌道不整態樣為何，不但能及時偵測，取樣的數據也較多，能提高判別軌道不整態樣的準確度，並且讓維修人員看到數據後即能做出適當的維修判斷，減少前往現場勘驗的時間及人力成本。另外，可藉由增加光學感應器的數量，能增加辨識軌道不整態樣的數量，提供維修人員更精確的數據。 This creation uses multiple optical sensors installed on the train 90. The rail shape variable of the track section can be measured at any time while the train 90 is traveling, and the analysis device 30 is used to integrate the measurement of the optical sensors. The first X-axis offset, the first Y-axis offset, the first Z-axis offset, the second X-axis offset, the second Y-axis offset, and the second Z The axis offset to identify the What is the track irregularity? Not only can it be detected in time, but also more data is sampled, which can improve the accuracy of identifying the track irregularity, and allow the maintenance personnel to make proper maintenance judgment after seeing the data, reducing the number of trips to the site Investigation time and labor cost. In addition, by increasing the number of optical sensors, the number of track irregularities can be increased to provide more accurate data for maintenance personnel.

10 第一光學感應器 20 第二光學感應器 30 分析裝置10 First optical sensor 20 Second optical sensor 30 Analysis device

Claims

一種測量軌道平整狀態的系統，其裝設於一行走於一第一軌道及一第二軌道的列車上，該第一軌道係於該第二軌道平行朝X軸向延伸，該測量軌道平整狀態的系統包含：一第一光學感應器，係裝設於該列車的一第一車輪，該第一車輪係行走於該第一軌道上；一第二光學感應器，係裝設於該列車的一第二車輪，該第二車輪係行走於該第二軌道上，第二光學感應器與該第一光學感應器係相對設置，該第一光學感應器與第二光學感應器係量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量，其中：該第一X軸偏移量係為該第一光學感應器與該第二光學感應器在X軸向的相對移動量；該第一Y軸偏移量係為該第一光學感應器與該第二光學感應器在Y軸向的相對移動量，其中Y軸向係為該第一軌道垂直朝上及垂直朝下的方向；該第一Z軸偏移量係為該第一軌道與該第二軌道之間的距離變化量，其中Z軸向為沿著該第一軌道垂直朝向該第二軌道的方向，且Z軸向分別垂直於Y軸向及X軸向；一分析裝置，係與該第一光學感應器與第二光學感應器電性連接，該分析裝置接收且根據該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量，判斷軌道平整狀態；該第一光學感應器具有一第一光源發射器及一第一光學接收矩陣，該第二光學感應器係具有一第二光源發射器及一第二光學接收矩陣，該第一光源發射器係經一固定時間或移動一預設長度時發射雷射光予該第二光學接收矩陣接收，同時該第二光源發射器係經一固定時間或移動一預設長度時發射雷射光予該第一光學接收矩陣接收；一第三光學感應器，係裝設於該列車上的一第一車輪，該第三光學感應器具有一第三光源發射器及一第三光學接收矩陣；一第四光學感應器，係裝設於該列車上的一第三車輪，該第三車輪係朝X軸向行走於該第一軌道上，且與該第一車輪呈間隔設置，該第四光學感應器具有一第四光源發射器及一第四光學接收矩陣；該第三光學感應器及該第四光學感應器係量測一第二X軸偏移量、一第二Y軸偏移量及一第二Z軸偏移量。 A system for measuring track flatness is installed on a train running on a first track and a second track. The first track extends parallel to the X axis on the second track. The measurement track is flat. The system includes: a first optical sensor installed on a first wheel of the train, the first wheel walking on the first track; a second optical sensor installed on the train A second wheel, the second wheel runs on the second track, the second optical sensor and the first optical sensor are oppositely arranged, the first optical sensor and the second optical sensor measure a A first X-axis offset, a first Y-axis offset and a first Z-axis offset, wherein: the first X-axis offset is the first optical sensor and the second optical sensor The relative movement of the sensor in the X axis; the first Y axis offset is the relative movement of the first optical sensor and the second optical sensor in the Y axis, where the Y axis is the first A track is oriented vertically upward and vertically downward; the first Z-axis offset is the amount of change in the distance between the first track and the second track, where the Z axis is perpendicular to the first track Towards the direction of the second track, and the Z axis is perpendicular to the Y axis and the X axis respectively; an analysis device is electrically connected to the first optical sensor and the second optical sensor, the analysis device receives and According to the first X-axis offset, the first Y-axis offset and the first Z-axis offset, determine the track leveling state; the first optical sensor has a first light source emitter and a first optical Receiving matrix, the second optical sensor has a second light source emitter and a second optical receiving matrix, the first light source emitter emits laser light to the second when a fixed time or moving a preset length Optical receiving matrix At the same time, the second light source transmitter emits laser light to the first optical receiving matrix for a fixed time or moving a preset length; a third optical sensor is a first optical sensor installed on the train A wheel, the third optical sensor has a third light source emitter and a third optical receiving matrix; a fourth optical sensor is a third wheel mounted on the train, the third wheel is facing X Walking axially on the first track and spaced apart from the first wheel, the fourth optical sensor has a fourth light source emitter and a fourth optical receiving matrix; the third optical sensor and the fourth The optical sensor measures a second X-axis offset, a second Y-axis offset, and a second Z-axis offset.

如請求項1所述之測量軌道平整狀態的系統，其中軌道不整的類型包含：軌距不整：當該第一光學感應器與該第二光學感應器量測到該第一Z軸偏移量大於或小於一預設值，即判斷為軌距不整；水平不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，即判斷為水平不整；高低不整：當該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為高低不整；方向不整：當該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為方向不整；第一平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為第一平面不整；第二平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為第二平面不整；複合不整：當該第一光學感應器與該第二光學感應器量測到該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量及該第二Z軸偏移量皆大於或小於該預設值，即判斷為複合不整。 The system for measuring track flatness as described in claim 1, wherein the types of track irregularities include: track pitch irregularity: when the first optical sensor and the second optical sensor measure the first Z-axis offset If it is greater than or less than a preset value, it is determined that the gauge is irregular; horizontal irregularity: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater than or less than the preset value, That is, it is determined that the level is irregular; the level is irregular: when the third optical sensor and the fourth optical sensor measure that the second Y-axis offset is greater or less than the preset value, it is determined that the level is irregular; the direction is irregular : When the third optical sensor and the fourth optical sensor measure that the second Z-axis offset is greater or less than the preset value, it is determined that the direction is irregular; the first plane is irregular: when the first optical The sensor and the second optical sensor measure that the first Y-axis offset is greater than or less than the predetermined value, and the third optical sensor and the fourth optical sensor measure the second Y-axis offset If the shift amount is greater than or less than the preset value, it is determined that the first plane is irregular; Irregular second plane: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater or less than the preset value, and the third optical sensor and the fourth optical sensor When the sensor measures that the second Z-axis offset is greater or less than the preset value, it is determined that the second plane is irregular; compound irregularity: when the first optical sensor and the second optical sensor measure the first A Y-axis offset is greater than or less than the preset value, and the third and fourth optical sensors measure that the second Y-axis offset and the second Z-axis offset are both greater than If it is less than the preset value, it is judged as compound irregularity.

如請求項2所述之測量軌道平整狀態的系統，其中該預設值為零。 The system for measuring track leveling state as described in claim 2, wherein the preset value is zero.

一種測量軌道平整狀態的系統，其裝設於一行走於一第一軌道及一第二軌道的列車上，該第一軌道係於該第二軌道平行朝X軸向延伸，該測量軌道平整狀態的系統包含：一第三光學感應器，係裝設於一列車上的一第一車輪，該第一車輪係朝X軸向行走於該第一軌道上；一第四光學感應器，係裝設於該列車的一第三車輪，該第三車輪係行走於該第一軌道上，第四光學感應器與該第三光學感應器係相對設置，該第三光學感應器與第四光學感應器係量測一第二Y軸偏移量及一第二Z軸偏移量，其中：該第二Y軸偏移量係為該第三光學感應器與該第四光學感應器在Y軸向的相對移動量，其中Y軸向係為該第一軌道垂直朝上及垂直朝下的方向；該第二Z軸偏移量係為該第一軌道與該第二軌道之間的距離變化量，其中Z軸向為沿著該第一軌道垂直朝向該第二軌道的方向，且Z軸向分別垂直於Y軸向及X軸向；一分析裝置，係與該第三光學感應器與第四光學感應器電性連接，該分析裝置接收且根據該第二Y軸偏移量及該第二Z軸偏移量，判斷軌道平整狀態。 A system for measuring track flatness is installed on a train running on a first track and a second track. The first track extends parallel to the X axis on the second track. The measurement track is flat. The system includes: a third optical sensor, which is a first wheel installed on a train, the first wheel is walking on the first track toward the X axis; a fourth optical sensor, which is installed A third wheel provided on the train, the third wheel runs on the first track, the fourth optical sensor and the third optical sensor are oppositely arranged, the third optical sensor and the fourth optical sensor The device measures a second Y-axis offset and a second Z-axis offset, wherein: the second Y-axis offset is the third optical sensor and the fourth optical sensor on the Y axis The relative movement amount in the direction, where the Y axis is the direction of the first track vertically upward and downward; the second Z axis offset is the change in the distance between the first track and the second track The Z axis is the direction along the first track perpendicular to the second track, and the Z axis is perpendicular to the Y axis and the X axis respectively; an analysis device is connected to the third optical sensor and The fourth optical sensor is electrically connected, and the analysis device receives and determines the track flatness state according to the second Y-axis offset and the second Z-axis offset.

如請求項4所述之測量軌道平整狀態的系統，該第三光學感應器具有一第三光源發射器及一第三光學接收矩陣，該第四光學感應器係具有一第四光源發射器及一第四光學接收矩陣，該第三光源發射器每經過一固定時間係發射雷射光予該第四光學接收矩陣接收，該第四光源發射器每經過該固定時間係發射雷射光予該第三光學接收矩陣接收。 The system for measuring the track flatness state according to claim 4, the third optical sensor has a third light source emitter and a third optical receiving matrix, and the fourth optical sensor has a fourth light source emitter and a A fourth optical receiving matrix, the third light source emitter emits laser light to the fourth optical receiving matrix every fixed time, the fourth light source emitter emits laser light to the third optical every time fixed time Receive matrix reception.

如請求項4或5所述之測量軌道平整狀態的系統，該第三光學感應器具有一第三光源發射器及一第三光學接收矩陣，該第四光學感應器係具有一第四光源發射器及一第四光學接收矩陣，當該列車係移動一預設距離，該第三光源發射器係發射雷射光予該第四光學接收矩陣接收，同時該第四光源發射器係發射雷射光予該第三光學接收矩陣接收。 The system for measuring track flatness according to claim 4 or 5, the third optical sensor has a third light source emitter and a third optical receiving matrix, and the fourth optical sensor has a fourth light source emitter And a fourth optical receiving matrix, when the train moves a predetermined distance, the third light source emitter emits laser light to the fourth optical receiving matrix, and the fourth light source emitter emits laser light to the The third optical receiving matrix receives.

如請求項6所述之測量軌道平整狀態的系統，其中軌道不整的類型包含：高低不整：當該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為高低不整；方向不整：當該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為方向不整；其中該預設值為零。 The system for measuring track flatness as described in claim 6, wherein the types of track irregularities include: high and low irregularities: when the third optical sensor and the fourth optical sensor measure that the second Y-axis offset is greater than Or less than the preset value, it is judged as irregularity; the direction is irregular: when the third optical sensor and the fourth optical sensor measure that the second Z-axis offset is greater or less than the preset value, ie It is determined that the direction is irregular; where the preset value is zero.

一種測量軌道平整狀態的方法，使用於行走於一第一軌道及一第二軌道的一列車，該測量軌道平整狀態的方法包含：a.量測一第一X軸偏移量、一第一Y軸偏移量及一第一Z軸偏移量，利用一第一光學感應器與一第二光學感應器，該第一光學感應器係裝設於該列車的一第一車輪，該第二光學感應器係裝設於該列車的一第二車輪，該第一車輪係行走於該第一軌道，該第二車輪係行走於該第二軌道；在a步驟中更包含a1步驟：量測一第二X軸偏移量、一第二Y軸偏移量及一第二Z軸偏移量，利用一第三光學感應器及一第四光學感應器，其中該第三光學感應器裝設於該第一車輪，該第四光學感應器係裝設於一第三車輪，該第三車輪係行走於該第一軌道，該第一車輪與該第三車輪係間隔設置；b.判斷軌道不整的類型，將該第一X軸偏移量、該第一Y軸偏移量及該第一Z軸偏移量利用一分析裝置整合後判斷。 A method for measuring the track flatness state is used for a train walking on a first track and a second track. The method for measuring the track flatness state includes: a. measuring a first X-axis offset, a first The Y-axis offset and a first Z-axis offset utilize a first optical sensor and a second optical sensor. The first optical sensor is installed on a first wheel of the train. Two optical sensors are installed on a second wheel of the train, the first wheel is walking on the first track, and the second wheel is walking on the second track; step a1 further includes: Measuring a second X-axis offset, a second Y-axis offset, and a second Z-axis offset, using a third light Sensor and a fourth optical sensor, wherein the third optical sensor is installed on the first wheel, the fourth optical sensor is installed on a third wheel, the third wheel is walking on the first A track, the first wheel and the third wheel are arranged at intervals; b. determine the type of track irregularity, the first X-axis offset, the first Y-axis offset and the first Z-axis offset The amount is determined after integration by an analysis device.

如請求項8所述之測量軌道平整狀態的方法，其中該第一光學感應器、該第二光學感應器、該第三光學感應器及該第四光學感應器各自具有一光學發射器及一光學接收矩陣。 The method for measuring the track flatness state according to claim 8, wherein the first optical sensor, the second optical sensor, the third optical sensor and the fourth optical sensor each have an optical transmitter and a Optical receiving matrix.

如請求項9所述之測量軌道平整狀態的方法，在b步驟中更包含b1步驟：將該第二X軸偏移量、該第二Y軸偏移量及該第二Z軸偏移量由該分析裝置整合後判斷軌道不整的類型。 The method for measuring the leveling state of the track as described in claim 9, step b1 further includes step b1: the second X-axis offset, the second Y-axis offset and the second Z-axis offset The integration of the analysis device determines the type of track irregularity.

如請求項10所述之測量軌道平整狀態的方法，其中軌道不整的類型包含：軌距不整：當該第一光學感應器與該第二光學感應器量測到該第一Z軸偏移量大於或小於一預設值，即判斷為軌距不整；水平不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，即判斷為水平不整；高低不整：當該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為高低不整；方向不整：當該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為方向不整；第一平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量大於或小於該預設值，即判斷為第一平面不整；第二平面不整：當該第一光學感應器與該第二光學感應器量測該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Z軸偏移量大於或小於該預設值，即判斷為第二平面不整；複合不整：當該第一光學感應器與該第二光學感應器量測到該第一Y軸偏移量大於或小於該預設值，且該第三光學感應器與該第四光學感應器量測到該第二Y軸偏移量及該第二Z軸偏移量皆大於或小於該預設值，即判斷為複合不整。 The method for measuring track flatness as described in claim 10, wherein the types of track irregularities include: track pitch irregularity: when the first optical sensor and the second optical sensor measure the first Z-axis offset If it is greater than or less than a preset value, it is determined that the gauge is irregular; horizontal irregularity: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater than or less than the preset value, That is, it is determined that the level is irregular; the level is irregular: when the third optical sensor and the fourth optical sensor measure that the second Y-axis offset is greater or less than the preset value, it is determined that the level is irregular; the direction is irregular : When the third optical sensor and the fourth optical sensor measure that the second Z-axis offset is greater or less than the preset value, it is determined that the direction is irregular; Irregular first plane: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater or less than the preset value, and the third optical sensor and the fourth optical sensor When the sensor measures that the second Y-axis offset is greater or less than the preset value, it is determined that the first plane is irregular; the second plane is irregular: when the first optical sensor and the second optical sensor measure the The first Y-axis offset is greater than or less than the preset value, and the third and fourth optical sensors measure that the second Z-axis offset is greater than or less than the preset value, that is, judgment The second plane is irregular; the composite irregular: when the first optical sensor and the second optical sensor measure that the first Y-axis offset is greater or less than the preset value, and the third optical sensor and When the fourth optical sensor measures that the second Y-axis offset and the second Z-axis offset are both greater than or less than the preset value, it is determined that the compound is incomplete.

如請求項11所述之測量軌道平整狀態的方法，其中該預設值為零。 The method for measuring the track leveling state as described in claim 11, wherein the preset value is zero.