TWI449664B - 用於奈米碳管電子發射陰極之固化黏合劑材料 - Google Patents
用於奈米碳管電子發射陰極之固化黏合劑材料 Download PDFInfo
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Description
本申請案主張美國臨時申請序號第60/775,978號之優先權。
本發明概括地關於場發射裝置,且更特別的,關於奈米碳管於場發射上之用途。
奈米碳管(CNTs)係作為場發射顯示器(FEDs)用之冷陰極材料之有前途候選者。CNT FED可用低成本印刷技術構製,此對於現行類型的平面顯示器,諸如液晶顯示器(LCDs)及電漿顯示器(PDPs),非常有競爭性。陰極一致性對於商業化CNT FEDs係一關鍵因素。關於場發射一致性的主要問題在於CNTs之一致分散,CNT像素之物理尺寸一致性,及陰極之活化一致性,係因為大多數印製的CNT陰極需要用不同的方法包括黏膠帶、滾筒、噴沙,等予以活化之故。活化方法可能向上提升CNTs或自黏合劑材料中解放CNTs而使彼等對所施加的電場回應而向上直立。
另一方面,對於用於三極管結構沉積成數十微米深度腔的CNT陰極,當前的活化方法不能具有像對平坦表面上的CNT陰極相同的一致性活化效用。為具有一致性活化,活化材料對該CNT陰極表面的一致壓力及物理上的一致性接觸對於得到一致的場發射陰極係非常重要者。但由於三極管結構之深腔,該活化材料可能不會用同樣壓力一致地接觸CNT陰極之表面,結果為非一致性之場發射。
一種新穎的黏合劑材料、無機聚合物,用於調配奈米碳管糊狀物。此材料可在200℃固化且具有高達500℃之熱穩定性。此黏合劑之低排氣使其成為長效型場發射裝置的良好候選者。由於此黏合劑具有更好的黏著力,一種來自液體形式的強黏著力可剝離聚合物可施用於CNT陰極上以達到對表面的均勻接觸和壓力之一致性活化。該可剝離的聚合物膜可用作活化層及罩層兩者以使用微影法構製場發射裝置用的高解析度圖案化奈米碳管陰極。
前文業以廣義地概述出本發明的特徵及技術優點以使下面的本發明詳細說明獲得更佳瞭解。本發明的其他特徵及優勢將於後文說明,其形成本發明申請專利範圍之主體。
在下面的說明中,陳述出眾多特別的細節諸如特別的陰極材料,等,以提供對本發明之徹底瞭解。不過,其對於熟諳此技者顯而易知著本發明可不用此等特別細節而付諸實施。於其他情況中,熟知的電路業經以方塊圖形式顯示以期不以非必要的細節混淆本發明。對於大部份而言,關於時間安排及類似物的細節都經省略,因為此等細節對於獲得本發明之徹底瞭解皆為不必要者且都在有相關技藝者的一般技巧之內者。
至此參考圖式,其中所繪示之元件不一定按比例顯示出且其中於數個圖式中,都將相同或相似的元件以相同的指示數字表出。
一種液體形式之聚合物材料經提出(2005年,6月16日美國專利公告第2005/0129858A1號)用於填充腔結構且在固化聚合物膜自陰極表面剝掉時,活化CNT陰極。若CNT之黏著力不足,諸如經由用CNT漿料噴霧及網版印刷所製備的樣品,則該液態溶液會容易地穿透到多孔CNT陰極中使得大部份之陰極材料會容易地移除。由於聚合物之高黏著力,可使用無機粉末調節聚合物之黏著性質以在剝除聚合物材料時避免損壞CNT陰極。不過,要將無機粉末均勻地分散到該聚合物中戲不容易者,因為該粉末傾向沉到聚合物之底部且不會均勻地懸浮於溶液內。粉末的不均勻分散因而會在其固化時,導致聚合物膜的不一致黏著性質。此會影響由該含粉末聚合物膜活化的CNT陰極之場發射一致性。但是,若CNT陰極之黏著力可改良之時,純聚合物溶液就可以用於一致性活化而不會移除太多的CNT陰極材料或損壞CNT陰極。
CNT糊狀物通常含有有機或無機黏合劑、溶劑、和其他添加物。常使用玻璃熔料粉作為無機黏合劑以在煅燒製程熔化該熔料材料並黏合至基板而使CNTs黏上基板。遺憾地,玻璃熔料基質(基本上為金屬氧化物粉末(PbO、SiO2
、B2
O3
,等)),由於CNTs與熔料材料之不相容性及在煅燒後熔料材料對基板的不連續性覆蓋,都不能與CNTs強勁地黏合至基板上。熔料材料對基板的不連續性覆蓋也造成CNT非一致性黏著間題,因為在施用活化程序時,在大面積基板上之非一致性黏著會導致CNT材料之非一致性移除之故。為改良CNT陰極之黏著,需要使用一種對CNTs與基板兩者都具有相當強黏合強度之材料來調配CNT糊狀物。旋塗玻璃黏合劑(SOG)業經報導用來與其他有機媒劑一起調配CNT糊狀物以改良場發射特質(Jae-Hong Park,et al.Asian Display/IMID’04 Digest,468,2004)。但是,研究顯示SOG材料即便固化後仍具有排氣問題,使彼等不成為真空裝置中的良好候選者(J.D.Romero,M.Khan,H Fatemi,及J.Turlo,J.Mater.Res.,6(9),1996(1991))。CNT糊狀物之另一問題在於常採用高溫煅燒方法來煅燒掉糊狀物中之有機材料。該煅燒程序通常會因損壞CNTs導致CNTs之場發射特質的惡化及自糊狀物中的有機媒劑材料產生殘渣而影響CNTs之操作功能(R.Collazo,R.Schlesser,及Z.Sitar,Appl.Phys.Lett.78,2058(2001))。低溫可煅燒的有機黏合劑業經研究以減低CNT陰極在360℃之煅燒溫度(Sora Lee,Won Bin Im,Jong Hyuk Kang,及Duk Young Jeon,J.Vac.Sci.Technol.B23(2),745(2005))。但仍需要玻璃熔料材料以提高CNT陰極之黏著。來自具有低濃度之有機黏合劑之殘餘材料,遺憾地,在煅燒後依舊可偵測到。當場發射裝置經真空密封時,該有機材料之殘渣也會引起排氣問題。有機矽氧烷聚合物,其在美國專利公告第US2005/0242344號中用為低溫固化黏合劑材料,不過,需要在超過400℃下煅燒掉且也會產生殘餘材料。對於CNTs糊狀物調配物需要一種新穎的黏合劑材料,其可在低溫中固化且不惡化CNTs。該黏合材料也應具有高溫熱穩定性、低真空排氣、及良好的CNTs分散性。
一種矽梯式聚合物,聚苯基矽倍半氧烷(Polyphenylsilsesquioxane)(PPSQ),係一種具有順式-間規性(cis-syndiotactic)雙鏈結構之無機聚合物,如圖1中所示者(J.F.Brown,Jr.,J.Polym.Sci.1C(1963)83)。其已為新興的下一代材料用於半導體絕緣膜、光學纖維結合、太空梭外面塗料、及防水塗料。此材料經設計為具有SiO2
之良好物理性質且為伴隨有機化學的官能基化學反應性之優良選擇。聚苯基矽倍半氧烷((C6
H5
SiO1.5
)x
),特別地,因為其對於,目前利用,在電子學、光子學、及其他材料技術中所用矽基無機物之潛在替代性,與相容性,而已經產生極大重要性。在具有低真空排氣性質之下,PPSQ材料業經被認為對場發射裝置所用基板具有良好黏著性之絕緣體(K.Nishimura,et al.,J.Vac.Sci.Techn.B 22(3),1377(2004))。來自PPSQ類的吸附氣體係顯著地低者,有助於真空密封裝置的長壽命。該PPSQ可經旋塗或網版印刷在基板上成為薄膜或厚膜而為對微電子具有良好黏著性之電介質材料。此類型材料亦具有低的熱收縮率。該熱退火的收縮率低於0.1%。再者,PPSQ材料可經由濕式及乾式蝕刻予以圖案化。不像玻璃熔料粉末者,PPSQ材料可溶解於溶劑內以製成溶液使得CNTs可分散於黏著性黏合劑基質中以在基板上獲得一致的黏著層。此材料可在200℃固化且具有高達500℃之熱穩定性,使其成為良好的黏合劑候選物用於CNT調配物中以取代玻璃熔料材料或甚至有機黏合劑材料。PPSQ類聚合物可終端結合其他化學官能基,諸如C2
H5
O-PPSQ-C2
H5
及CH3
-PPSQ-CH3
。
多面體低聚矽倍半氧烷(POSS),另一類無機聚合物,亦可用來調配CNT糊狀物。POSS化學技術具有獨特的特徵:其化學組成物係介於氧化矽(SiO2
)及矽酮(R2
SiO)之間的混雜中間產物(RSiO1.5
)。
PPSQ CNT糊狀物調配物1:PPSQ材料可經由將40~50重量% PPSQ材料和40~50重量%甲苯用攪拌機混合15小時而製成。PPSQ的黏度範圍為自500-5000 CP。接著,可按下述調配PPSQ CNT糊狀物:可將20~30重量% PPSQ+60~70重量%稀釋劑(松脂醇)+3~10重量% SWNTs+3~10重量%石墨(2~15微米)在研缽內用手摻合。然後,使用三輥磨機處理此混合物5次。可添加石墨粉以創造邊界使得CNTs不會被PPSQ材料湮沒且確使某些CNTs可由活化程序所釋放。
該PPSQ CNT糊狀物可用網版印刷在ITO玻璃上。活性CNT陰極面積可為3×3平方公分。將PPSQ CNT陰極用一煅燒程序(400℃氮氣中)煅燒。該CNT陰極具有一非常良好的黏著性,因為使用發泡體片時幾乎沒有材料可自該陰極之表面移除。黏著膠帶活化可用於該PPSQ CNT陰極,自表面移除非常少的材料且在活化之前與之後都保持同樣的厚度(~7微米)。當使用軟質發泡體和膠帶進行活化時,可用層合機透過滾筒以適當壓力施用發泡體或膠帶在CNT陰極之表面上。該PPSQ CNT陰極具有比從含有玻璃熔料及有機媒劑的糊狀物製備的其他CNT陰極遠較為好的對基板黏著性。當採用膠帶活化程序時,從含有玻璃熔料或其他黏合劑的其他奈米碳管陰極可移除超過50%之材料。圖2顯示從二種PPSQ CNT陰極及標準CNT陰極所得之I-V曲線。標準CNT糊狀物包含CNTs、有機媒劑、玻璃熔料、及溶劑。
由於以PPSQ為基的CNT陰極之更高黏著性,水基聚合物(X-膜複製品X2020,可得自Transfer Devices,Inc.)就可活化CNT陰極。該水基聚合物溶液包括56~78重量%水、17~34重量%乙醇、3~8重量%乙醇均聚物、及1~2重量%丁醇。
該活化程序係:1)將一滴液體聚合物(X-膜)溶液置於CNT陰極上。使該液體溶液均勻地淹沒整個陰極。
2)在空氣中或60℃之烤箱內乾燥X-膜。該X-膜之厚度可經由調節X-膜溶液之體積而控制在超過50微米。
3)剝離該X-膜以活化CNT陰極。
該液體溶液可容易地穿透到多孔CNT陰極內使得若CNT的黏著性不夠好時,諸如經由噴布製備的樣品,及某些印製樣品,大部份陰極材料會容易被移除。X-膜活化對於具有良好黏著性的印製PPSQ CNT陰極可良好地作用。該標準CNT陰極係在450℃煅燒且可用膠帶或發泡體活化,不過X-膜會移除幾乎所有的CNT陰極材料,而由於極少的CNTs留在基板上,導致非常不良的場發射。
與美國專利公告第US2005/0129858A1中所用的複雜聚合物材料所不同者,X-膜係一種水溶性聚合物且可在室溫空氣中硬化。PPSQ CNT糊狀物亦為獨特者,因為其比傳統CNT糊狀物具有遠較為好的黏著性。
使用X-膜活化之優點為:1)用於三極管應用所用的良好結構基板可由液體溶液自然地填充且在洞內的CNT陰極表面上產生一致的接觸。
2)使用層合機的活化通常會在大陰極上造出壓力變異,如此會導致一致性問題。X-膜活化不需要用到層合機。
3)因為在固化後形成整體聚合物片,所以在活化後之陰極上沒有觀察到明顯的殘渣。使用膠帶,將黏著劑和塑膠基板分開而可能有一些黏著劑殘渣保留在陰極上。
如圖2所顯示者,由X-膜活化的PPSQ CNT陰極具有改良的場發射特性。圖3顯示出來自以膠帶活化的PPSQ CNT陰極(30mA,4.2伏/微米)之場發射照度。圖4顯示出由X-膜活化的PPSQ CNT陰極(30mA,3.9伏/微米)之場發射照度。
PPSQCNT糊狀物調配物2:也可使用雙壁型CNTs(DWNTs)來調配CNT糊狀物。可將15~25重量% PPSQ(甲苯作為溶劑),65~80重量%稀釋劑,2~10重量% DWNTs和2~10重量%石墨(2~15微米)在研缽內用手混合。然後,使用三輥磨機處理此混合物至少5次。
可將該PPSQ CNT糊狀物用網版印在ITO玻璃上(具有3×3平方公分之活性CNT陰極面積)。該PPSQ CNT陰極可用烘烤方法(200℃空氣中)固化1小時。該CNT陰極具有非常良好的黏著性。膠帶活化可用於該PPSQ CNT陰極,自表面移除非常少的材料且在活化之前和之後基本上保持其厚度。圖5顯示來自在200℃固化及450℃固化的PPSQ CNT陰極之I-V曲線。其指出較低溫固化法可防止CNTs惡化,因而導致較低的電場。
PPSQ CNT糊狀物調配物3:也可將PPSQ添加至其他CNT糊狀物以提高黏著性,可以使用雙壁型CNT(DWNT)糊狀物作為主糊狀物以調配具有5~15重量%PPSQ材料。該主DWNT糊狀物可用10~20重量%CNTs、30~65重量%有機媒劑、30~60重量%稀釋劑、及5~20重量%玻璃熔料粉予以調配。可將該混合物在研缽內用杵摻合及接著以三輥磨機進一步分散。在調配中,可以使用稀釋劑(松脂醇)調節該糊狀物物之黏度。該糊狀物的黏度可為自9000 CP至90,000厘泊(CP)。
PPSQ CNT糊狀物調配物4:將10~30重量% PPSQ+40~70重量%稀釋劑+3~10重量% SWNTs+(6~20重量%)有機媒劑、+3~20重量%石墨(2~15微米)在研缽內用手摻合。有機媒劑包括乙基纖維素(15-20%)、乙酸丁基卡必醇(60-70%)、及卡必醇(10-20%)。接著,可使用三輥磨機處理此混合物5次。該糊狀物的黏度範圍可自10000 CP至90000厘泊(CP)。可將用此糊狀物調配物製備的CNT陰極在390℃煅燒以燒掉有機媒劑材料。此調配物中之媒劑材料係用於使以PPSQ為基的糊狀物更適合用於印刷。
使用一網版,可將該PPSQ改質的CNT糊狀物網版印刷在具有50微米深洞之三極管結構上,如圖6所顯示者。圖6A闡示一種基板4,在其上沉積電極3和絕緣體2且用沉積於三極管結構的洞內之CNT陰極1予以圖案化。圖6B顯示出一自X-膜之液態材料形成之可剝離的聚合物膜5。液體聚合物(X-膜水溶液)係經填充到三極管結構的腔中且固化形成用於CNT陰極1之活化的可剝離厚膜(超過50微米)。
於用X-膜活化之下,可得具有深腔之非常一致的CNT陰極,如圖7所示者。圖7顯示出一種場發射照明之數位影像,顯示出經由對具有50微米深洞之三極管結構使用X-膜活化所得非常一致的場發射,如圖6所示。在此樣品中,像素大小為250×800平方微米。
經由使用PPSQ CNT糊狀物及X-膜之高解像力圖案化CNT陰極:網版印刷之解析度限值使其難於得到具有小於50微米的特徵之圖案。可以使用UV(紫外線)敏感性聚合物來圖案化CNTs。遺憾地,此聚合物材料在煅燒後可能具有殘渣,且在圖案化CNT陰極後亦需要活化程序。再者,通常需要舉離程序來移除UV曝光區。在此舉離製程常使用溶劑,此會影響CNT陰極。業經證實者,可經由使用標準微影法將可剝離的X-膜圖案化。於此揭示一種方法,其藉由使用可剝離的X-膜,可圖案化出具有相當高解析度的CNT陰極且可在移除該可剝離的X-膜時,予以活化,如圖8示出者。PPSQ CNT陰極可使用CF4
和O2
經由RIE(反應性離子蝕刻)予以蝕刻,因為PPSQ材料可用相當高蝕刻速率予以蝕刻。在圖8A中,電極經沉積在一基板上。在圖8B中,方法接著係PPSQ CNT陰極之印刷。圖8C顯示出一旋塗在陰極之頂上的X-膜。圖8D闡示在X-膜層之頂上塗覆一光阻劑。在圖8E中,該方法接著為以所欲方式進行的光阻劑之圖案化。在圖8F中,使用具有光阻劑之典型微影技術將該X-膜曝光及移除。在圖8G中,經由乾式蝕刻移除曝光過的PPSQ CNT陰極材料。在圖8H中,沉積一厚X-膜,及接著在圖8I中,剝離該厚X-膜以活化該圖案化的CNT陰極。
圖9闡示出使用陰極製成之場發射顯示器938的一部份,如上面造出者。在陰極內包含一傳導層906。陽極可包括一玻璃基板902、銦錫層903、與一燐光體層904。在陽極與陰極之間建立一電場。此類顯示器938可用於資料處理系統1013內諸如闡示於圖10之中者。
用於實施本發明之代表性硬體環境經繪示於圖10中,其闡示一根據本發明資料處理系統1013示範的硬體組態,其中具有中央處理單元(CPU)1010,諸如習用的微處理器,與透過系統匯流排1012互連的許多其他單元。資料處理系統1013包括隨機存取記憶體(RAM)1014、唯讀記憶體(ROM)1016和輸出/輸入(I/O)轉接器1018用於連接周邊裝置諸如磁碟單元1020及磁帶機1040至匯流排1012;使用者介面轉接器1022,用於連接鍵盤1024、滑鼠1026及/或其他使用者介面裝置諸如觸控式螢幕裝置(沒有顯示出)至匯流排1012;用於連接資料處理系統1013至資料處理網路之通信轉接器1034;及顯示器轉接器1036,用於連接匯流排1012至顯示器裝置1038。CPU 1010可能包含在本文中沒有顯示出之其他電路系統,其包括常在微處理器內的電路系統,例如,執行單元、匯流排介面單元、算數邏輯單元,等。
雖然本發明及其優點業經詳細說明,不過應瞭解者對其可做出各種改變、取代及變更而不脫離由後附申請專利範圍所界定的本發明旨意及範圍。
1...CNT陰極
2...絕緣體
3...電極
4...基板
5...可剝離的聚合物膜
902...玻璃基板
903...銦錫層
904...燐光體層
906...傳導層
938...場發射顯示器
1010...中央處理單元(CPU)
1012...系統匯流排
1013...資料處理系統
1014...隨機存取記憶體
1016...唯讀記憶體
1018...輸出/輸入(I/O)轉接器
1020...磁碟單元
1022...使用者介面轉接器
1024...鍵盤
1026...滑鼠
1034...通信轉接器
1036...顯示器轉接器
1038...顯示器裝置
1040...磁帶機
為了對本發明,其優點,更完全的瞭解,於此要參照下面配合所附圖式的說明,其中:圖1闡示一種PPSQ階梯狀無機聚合物(HO-PPSQ-H)之化學結構;圖2闡示在標準CNT陰極與PPSQ CNT陰極之間場發射I-V比較;圖3闡示經由帶子活化的PPSQ CNT陰極;圖4闡示由X-膜活化的PPSQ CNT陰極;圖5闡示在200℃與450℃固化的PPSQ CNT陰極之間的場發射I-V比較;圖6A及6B闡示經填充於三極管結構的腔內且經固化以形成用於活化的可剝離厚膜之液體聚合物(X-膜水溶液);圖7闡示出對具有50微米深洞之三極管結構使用X-膜活化所得一致性場發射影像;圖8A-8I闡示一種使用可剝離膜以圖案化及活化具有高解析度的CNT陰極之方法;圖9闡示一種按照本發明具體實例構組成的場發射裝置;及圖10闡示按照本發明具體實例構組的一種資料處理系統。
1...CNT陰極
2...絕緣體
3...電極
4...基板
5...可剝離的聚合物膜
Claims (7)
- 一種複合物,其包含與奈米碳管混合之無機聚合物,其中該無機聚合物係一矽梯式聚合物。
- 如申請專利範圍第1項之複合物,其中該無機聚合物黏合劑係聚苯基矽倍半氧烷(Polyphenylsilsesquioxane)(PPSQ)。
- 如申請專利範圍第1項之複合物,其中該無機聚合物係多面體低聚矽倍半氧烷(POSS)。
- 一種複合物,其包含奈米碳管、石墨粉及無機聚合物之混合物,其中該無機聚合物為一矽梯式聚合物。
- 一種場發射陰極,其包括:一基板;一在該基板上之場射極(field emitter),其中該場射極包括一包含奈米碳管及無機聚合物之糊狀物,其中該無機聚合物為一矽梯式聚合物;及電路系統,用於產生電場以自該場射極引起電子場發射。
- 如申請專利範圍第5項之場發射陰極,其中該無機聚合物包含PPSQ。
- 如申請專利範圍第5項之場發射陰極,其中該無機聚合物包含POSS。
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- 2006-12-18 US US11/612,313 patent/US8264137B2/en not_active Expired - Fee Related
- 2006-12-20 CN CN2006800502410A patent/CN101365735B/zh not_active Expired - Fee Related
- 2006-12-20 KR KR1020087018394A patent/KR101368255B1/ko not_active IP Right Cessation
- 2006-12-20 WO PCT/US2006/062396 patent/WO2007111748A2/en active Application Filing
- 2006-12-20 JP JP2008549522A patent/JP2009522203A/ja active Pending
- 2006-12-26 TW TW095149033A patent/TWI449664B/zh not_active IP Right Cessation
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Also Published As
Publication number | Publication date |
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CN101365735B (zh) | 2013-01-23 |
KR101368255B1 (ko) | 2014-03-03 |
WO2007111748A3 (en) | 2008-01-03 |
US20070262687A1 (en) | 2007-11-15 |
WO2007111748A2 (en) | 2007-10-04 |
JP2009522203A (ja) | 2009-06-11 |
TW200738558A (en) | 2007-10-16 |
CN101365735A (zh) | 2009-02-11 |
KR20080086916A (ko) | 2008-09-26 |
US8264137B2 (en) | 2012-09-11 |
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