TWI365982B - Method and device for inspecting defects of electroluminescence display device and method of manufacturing electroluminescence display device using the same - Google Patents

Method and device for inspecting defects of electroluminescence display device and method of manufacturing electroluminescence display device using the same

Info

Publication number
TWI365982B
TWI365982B TW096132835A TW96132835A TWI365982B TW I365982 B TWI365982 B TW I365982B TW 096132835 A TW096132835 A TW 096132835A TW 96132835 A TW96132835 A TW 96132835A TW I365982 B TWI365982 B TW I365982B
Authority
TW
Taiwan
Prior art keywords
display device
electroluminescence display
same
manufacturing
inspecting defects
Prior art date
Application number
TW096132835A
Other languages
English (en)
Other versions
TW200842343A (en
Inventor
Takashi Ogawa
Original Assignee
Sanyo Electric Co
Sanyo Semiconductor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co, Sanyo Semiconductor Co Ltd filed Critical Sanyo Electric Co
Publication of TW200842343A publication Critical patent/TW200842343A/zh
Application granted granted Critical
Publication of TWI365982B publication Critical patent/TWI365982B/zh

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of El Displays (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
TW096132835A 2006-09-04 2007-09-04 Method and device for inspecting defects of electroluminescence display device and method of manufacturing electroluminescence display device using the same TWI365982B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006239626A JP4836718B2 (ja) 2006-09-04 2006-09-04 エレクトロルミネッセンス表示装置の欠陥検査方法及び欠陥検査装置及びこれらを利用したエレクトロルミネッセンス表示装置の製造方法

Publications (2)

Publication Number Publication Date
TW200842343A TW200842343A (en) 2008-11-01
TWI365982B true TWI365982B (en) 2012-06-11

Family

ID=39150762

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096132835A TWI365982B (en) 2006-09-04 2007-09-04 Method and device for inspecting defects of electroluminescence display device and method of manufacturing electroluminescence display device using the same

Country Status (5)

Country Link
US (1) US8493296B2 (zh)
JP (1) JP4836718B2 (zh)
KR (1) KR101268237B1 (zh)
CN (1) CN101183079B (zh)
TW (1) TWI365982B (zh)

Families Citing this family (71)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2443206A1 (en) 2003-09-23 2005-03-23 Ignis Innovation Inc. Amoled display backplanes - pixel driver circuits, array architecture, and external compensation
EP2688058A3 (en) 2004-12-15 2014-12-10 Ignis Innovation Inc. Method and system for programming, calibrating and driving a light emitting device display
US8576217B2 (en) 2011-05-20 2013-11-05 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
US10012678B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US10013907B2 (en) 2004-12-15 2018-07-03 Ignis Innovation Inc. Method and system for programming, calibrating and/or compensating, and driving an LED display
US9799246B2 (en) 2011-05-20 2017-10-24 Ignis Innovation Inc. System and methods for extraction of threshold and mobility parameters in AMOLED displays
KR20080032072A (ko) 2005-06-08 2008-04-14 이그니스 이노베이션 인크. 발광 디바이스 디스플레이 구동 방법 및 시스템
CA2518276A1 (en) 2005-09-13 2007-03-13 Ignis Innovation Inc. Compensation technique for luminance degradation in electro-luminance devices
EP2008264B1 (en) 2006-04-19 2016-11-16 Ignis Innovation Inc. Stable driving scheme for active matrix displays
CA2556961A1 (en) 2006-08-15 2008-02-15 Ignis Innovation Inc. Oled compensation technique based on oled capacitance
JP4836718B2 (ja) 2006-09-04 2011-12-14 オンセミコンダクター・トレーディング・リミテッド エレクトロルミネッセンス表示装置の欠陥検査方法及び欠陥検査装置及びこれらを利用したエレクトロルミネッセンス表示装置の製造方法
JP2008066003A (ja) * 2006-09-04 2008-03-21 Sanyo Electric Co Ltd エレクトロルミネッセンス表示装置の欠陥検査方法及び欠陥修正方法及びエレクトロルミネッセンス表示装置の製造方法
JP2010078807A (ja) * 2008-09-25 2010-04-08 Canon Inc アクティブマトリックス型表示装置、その製造方法、およびその駆動方法
CA2669367A1 (en) 2009-06-16 2010-12-16 Ignis Innovation Inc Compensation technique for color shift in displays
US9384698B2 (en) 2009-11-30 2016-07-05 Ignis Innovation Inc. System and methods for aging compensation in AMOLED displays
US10319307B2 (en) 2009-06-16 2019-06-11 Ignis Innovation Inc. Display system with compensation techniques and/or shared level resources
CA2688870A1 (en) 2009-11-30 2011-05-30 Ignis Innovation Inc. Methode and techniques for improving display uniformity
US9311859B2 (en) 2009-11-30 2016-04-12 Ignis Innovation Inc. Resetting cycle for aging compensation in AMOLED displays
US10996258B2 (en) 2009-11-30 2021-05-04 Ignis Innovation Inc. Defect detection and correction of pixel circuits for AMOLED displays
US8803417B2 (en) 2009-12-01 2014-08-12 Ignis Innovation Inc. High resolution pixel architecture
US20140313111A1 (en) 2010-02-04 2014-10-23 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US10163401B2 (en) 2010-02-04 2018-12-25 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US10176736B2 (en) 2010-02-04 2019-01-08 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
CA2692097A1 (en) 2010-02-04 2011-08-04 Ignis Innovation Inc. Extracting correlation curves for light emitting device
US10089921B2 (en) 2010-02-04 2018-10-02 Ignis Innovation Inc. System and methods for extracting correlation curves for an organic light emitting device
US9881532B2 (en) 2010-02-04 2018-01-30 Ignis Innovation Inc. System and method for extracting correlation curves for an organic light emitting device
CA2696778A1 (en) 2010-03-17 2011-09-17 Ignis Innovation Inc. Lifetime, uniformity, parameter extraction methods
JP5626341B2 (ja) * 2010-05-07 2014-11-19 コニカミノルタ株式会社 発光デバイス検査装置、および発光デバイス検査方法
CN102456592A (zh) * 2010-10-15 2012-05-16 北京京东方光电科技有限公司 测试阵列基板上薄膜晶体管特性的方法和装置
US8907991B2 (en) 2010-12-02 2014-12-09 Ignis Innovation Inc. System and methods for thermal compensation in AMOLED displays
US9530349B2 (en) 2011-05-20 2016-12-27 Ignis Innovations Inc. Charged-based compensation and parameter extraction in AMOLED displays
US9466240B2 (en) 2011-05-26 2016-10-11 Ignis Innovation Inc. Adaptive feedback system for compensating for aging pixel areas with enhanced estimation speed
EP3293726B1 (en) 2011-05-27 2019-08-14 Ignis Innovation Inc. Systems and methods for aging compensation in amoled displays
US9276231B2 (en) 2011-06-16 2016-03-01 Joled Inc. Method for fabricating organic electroluminescence device and organic electroluminescence device
KR101829398B1 (ko) * 2011-06-30 2018-02-20 삼성디스플레이 주식회사 유기전계발광 표시장치 및 그의 구동방법
JP5842212B2 (ja) * 2011-09-12 2016-01-13 株式会社Ｊｏｌｅｄ 有機ｅｌ表示パネルの検査方法及び検査システム
US9324268B2 (en) 2013-03-15 2016-04-26 Ignis Innovation Inc. Amoled displays with multiple readout circuits
US10089924B2 (en) 2011-11-29 2018-10-02 Ignis Innovation Inc. Structural and low-frequency non-uniformity compensation
US8937632B2 (en) 2012-02-03 2015-01-20 Ignis Innovation Inc. Driving system for active-matrix displays
US8922544B2 (en) 2012-05-23 2014-12-30 Ignis Innovation Inc. Display systems with compensation for line propagation delay
US9336717B2 (en) 2012-12-11 2016-05-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
US9786223B2 (en) 2012-12-11 2017-10-10 Ignis Innovation Inc. Pixel circuits for AMOLED displays
KR102007636B1 (ko) * 2012-12-24 2019-10-21 엘지디스플레이 주식회사 유기 발광 표시 장치 및 그의 구동 방법
EP3043338A1 (en) 2013-03-14 2016-07-13 Ignis Innovation Inc. Re-interpolation with edge detection for extracting an aging pattern for amoled displays
KR102016153B1 (ko) * 2013-05-10 2019-08-30 삼성디스플레이 주식회사 표시 장치, 표시 장치의 구동 제어 장치 및 그 제어 방법
WO2015022626A1 (en) 2013-08-12 2015-02-19 Ignis Innovation Inc. Compensation accuracy
WO2015059844A1 (ja) * 2013-10-21 2015-04-30 株式会社Ｊｏｌｅｄ 有機ｅｌ表示装置の製造方法
US9761170B2 (en) 2013-12-06 2017-09-12 Ignis Innovation Inc. Correction for localized phenomena in an image array
US9741282B2 (en) 2013-12-06 2017-08-22 Ignis Innovation Inc. OLED display system and method
US9502653B2 (en) 2013-12-25 2016-11-22 Ignis Innovation Inc. Electrode contacts
US10192479B2 (en) 2014-04-08 2019-01-29 Ignis Innovation Inc. Display system using system level resources to calculate compensation parameters for a display module in a portable device
JP6167374B2 (ja) * 2014-06-13 2017-07-26 株式会社Ｊｏｌｅｄ 表示パネルの検査方法及び表示パネルの製造方法
KR102087684B1 (ko) * 2014-09-17 2020-03-11 삼성전자주식회사 Led 디스플레이 장치, 그의 에러 검침 방법
CA2879462A1 (en) 2015-01-23 2016-07-23 Ignis Innovation Inc. Compensation for color variation in emissive devices
CA2889870A1 (en) 2015-05-04 2016-11-04 Ignis Innovation Inc. Optical feedback system
CA2892714A1 (en) 2015-05-27 2016-11-27 Ignis Innovation Inc Memory bandwidth reduction in compensation system
CA2900170A1 (en) 2015-08-07 2017-02-07 Gholamreza Chaji Calibration of pixel based on improved reference values
KR102417475B1 (ko) * 2017-07-21 2022-07-05 주식회사 엘엑스세미콘 표시장치, 센싱회로 및 소스드라이버집적회로
CN107290348A (zh) * 2017-08-07 2017-10-24 伟创力电子技术(苏州)有限公司 一种自动分选的晶硅组件缺陷的el测试设备
KR102416705B1 (ko) * 2017-10-24 2022-07-05 엘지디스플레이 주식회사 유기발광표시장치 및 그 구동 방법
TWI635474B (zh) * 2018-02-09 2018-09-11 友達光電股份有限公司 顯示裝置及其畫素偵測方法
JP7298993B2 (ja) * 2018-04-09 2023-06-27 浜松ホトニクス株式会社 試料観察装置及び試料観察方法
CN110706629B (zh) * 2019-09-27 2023-08-29 京东方科技集团股份有限公司 显示基板的检测方法和检测装置
CN111524197B (zh) * 2020-04-01 2023-05-12 武汉精立电子技术有限公司 一种Microled或Miniled的异常像素实时检测修复方法及装置
CN112365829A (zh) * 2020-11-11 2021-02-12 深圳市华星光电半导体显示技术有限公司 暗点检测方法及其装置及电子设备
CN113965163A (zh) * 2021-02-03 2022-01-21 苏州威华智能装备有限公司 一种电池片缺陷检测方法
CN113707569B (zh) * 2021-08-25 2024-02-09 厦门天马显示科技有限公司 显示面板的检测方法、显示面板
KR20230041906A (ko) * 2021-09-17 2023-03-27 삼성디스플레이 주식회사 표시 장치의 검사 방법 및 장치
US11810502B2 (en) * 2021-09-28 2023-11-07 Lg Display Co., Ltd. Electroluminescent display apparatus
KR20230089382A (ko) * 2021-12-13 2023-06-20 엘지디스플레이 주식회사 전계 발광 표시장치와 그의 표시 결함 검출방법
CN116631312B (zh) * 2023-06-26 2024-05-07 东莞市一众显示科技有限公司 显示屏检测方法及***

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11231280A (ja) * 1998-02-13 1999-08-27 Hitachi Ltd 液晶表示装置
JP4755748B2 (ja) * 1999-09-24 2011-08-24 東芝モバイルディスプレイ株式会社 平面表示装置
TW513804B (en) * 2000-05-01 2002-12-11 Koninkl Philips Electronics Nv One-time UV-programmable non-volatile semiconductor memory and method of programming such a semiconductor memory
TW461002B (en) * 2000-06-05 2001-10-21 Ind Tech Res Inst Testing apparatus and testing method for organic light emitting diode array
US6909111B2 (en) * 2000-12-28 2005-06-21 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a light emitting device and thin film forming apparatus
US7224333B2 (en) * 2002-01-18 2007-05-29 Semiconductor Energy Laboratory Co. Ltd. Display device and driving method thereof
JP4270891B2 (ja) * 2003-01-21 2009-06-03 三洋電機株式会社 Ｅｌ表示装置のレーザーリペア方法
JP3527726B2 (ja) 2002-05-21 2004-05-17 ウインテスト株式会社 アクティブマトリクス基板の検査方法及び検査装置
JP2004101767A (ja) * 2002-09-06 2004-04-02 Semiconductor Energy Lab Co Ltd 発光装置の駆動方法
TW577136B (en) * 2002-10-25 2004-02-21 Ritdisplay Corp Detecting repairing system and method
CN107657920B (zh) * 2002-10-31 2021-12-07 株式会社半导体能源研究所 显示设备及其控制方法
TWI349903B (en) * 2002-11-06 2011-10-01 Chimei Innolux Corp Sensing of emissive elements in an active matrix display device
JP4574130B2 (ja) * 2003-06-18 2010-11-04 株式会社半導体エネルギー研究所 半導体装置、電子機器
JP3628014B1 (ja) * 2003-09-19 2005-03-09 ウインテスト株式会社 表示装置及びそれに用いるアクティブマトリクス基板の検査方法及び装置
JP2005149769A (ja) * 2003-11-11 2005-06-09 Shimadzu Corp Ｔｆｔアレイ検査方法及びｔｆｔアレイ検査装置
JP2005149768A (ja) * 2003-11-11 2005-06-09 Shimadzu Corp Ｔｆｔアレイ検査方法及びｔｆｔアレイ検査装置
JP4301498B2 (ja) * 2003-11-13 2009-07-22 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｔｆｔを検査する検査装置
JP4826079B2 (ja) * 2004-09-24 2011-11-30 日本精機株式会社 有機ｅｌ素子の製造方法
JP2006107826A (ja) * 2004-10-01 2006-04-20 Shimadzu Corp パネル検査装置
JP2006221982A (ja) * 2005-02-10 2006-08-24 Toshiba Matsushita Display Technology Co Ltd アレイ基板の製造方法及び有機ｅｌ表示装置の製造方法
JP4836718B2 (ja) 2006-09-04 2011-12-14 オンセミコンダクター・トレーディング・リミテッド エレクトロルミネッセンス表示装置の欠陥検査方法及び欠陥検査装置及びこれらを利用したエレクトロルミネッセンス表示装置の製造方法

Also Published As

Publication number Publication date
KR20080021564A (ko) 2008-03-07
US8493296B2 (en) 2013-07-23
TW200842343A (en) 2008-11-01
KR101268237B1 (ko) 2013-05-31
CN101183079A (zh) 2008-05-21
JP4836718B2 (ja) 2011-12-14
JP2008064806A (ja) 2008-03-21
CN101183079B (zh) 2013-09-25
US20080055211A1 (en) 2008-03-06

Similar Documents

Publication Publication Date Title
TWI365982B (en) Method and device for inspecting defects of electroluminescence display device and method of manufacturing electroluminescence display device using the same
EP2023114A4 (en) LEAK-SEARCHING METHOD AND LEAK-SEARCHING DEVICE
TWI372298B (en) Inspection method of substrate, substrate inspection system, and manufacturing method of display device
EP2095102A4 (en) APPARATUS AND METHOD FOR INSPECTION
EP2078955A4 (en) METHOD AND DEVICE FOR INSPECTION OF A TIRE SURFACE
EP2002473A4 (en) PUNCH TESTING DEVICE AND PUNCH TEST PROCEDURE THEREWITH
GB2442259B (en) Display apparatus and method
GB2437547B (en) Method and apparatus for inspecting pipes
EP2026081A4 (en) TEST DEVICE AND TESTING METHOD
EP2264446A4 (en) Periodic defect detecting device and method for the same
EP2093536A4 (en) MEASURING ARRANGEMENT AND MEASURING PROCEDURE
EP2071558A4 (en) DISPLAY APPARATUS AND METHOD
EP2006676A4 (en) DEFECTIVE INSPECTION DEVICE AND METHOD
PL2100072T3 (pl) Przyrząd i sposób kontroli liniowej struktury
EP2088441A4 (en) HOLDER OF THE INVESTIGATION, INVESTIGATION FACILITY AND INVESTIGATION PROCEDURES
EP2219173A4 (en) DISPLAY DEVICE AND METHOD FOR THE PRODUCTION THEREOF
EP2219068A4 (en) DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME
IL189712A0 (en) Device and method for inspecting an object
EP2192404A4 (en) METHOD FOR MEASURING SUBSTRATE CONCENTRATION AND DEVICE THEREOF
GB2439804B (en) Organic electroluminescence display device and method of fabricating the same
EP2071060A4 (en) APPARATUS AND METHOD FOR MANUFACTURING MONOCRYSTAL
HK1112449A1 (en) Method for manufacturing glass substrate for display and glass substrate
IL193731A0 (en) Apparatus and method for inspecting circuit structures
TWI339757B (en) Display device and method of manufacturing the same
GB0711754D0 (en) Measurement device and method

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees