TW358886B - Semiconductor tester - Google Patents

Semiconductor tester

Info

Publication number
TW358886B
TW358886B TW087102419A TW87102419A TW358886B TW 358886 B TW358886 B TW 358886B TW 087102419 A TW087102419 A TW 087102419A TW 87102419 A TW87102419 A TW 87102419A TW 358886 B TW358886 B TW 358886B
Authority
TW
Taiwan
Prior art keywords
undulation
graphics
graphic
generators
testing
Prior art date
Application number
TW087102419A
Other languages
English (en)
Chinese (zh)
Inventor
Toshiyuki Negishi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW358886B publication Critical patent/TW358886B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW087102419A 1997-02-21 1998-02-20 Semiconductor tester TW358886B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03753597A JP3501200B2 (ja) 1997-02-21 1997-02-21 Ｉｃ試験装置

Publications (1)

Publication Number Publication Date
TW358886B true TW358886B (en) 1999-05-21

Family

ID=12500227

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087102419A TW358886B (en) 1997-02-21 1998-02-20 Semiconductor tester

Country Status (5)

Country Link
US (1) US6119257A (ko)
JP (1) JP3501200B2 (ko)
KR (1) KR100295546B1 (ko)
DE (1) DE19807237C2 (ko)
TW (1) TW358886B (ko)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6708301B1 (en) * 1997-03-21 2004-03-16 Matsushita Electric Industrial Co., Ltd. Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor
WO1999008123A1 (fr) * 1997-08-06 1999-02-18 Advantest Corporation Generateur de synchronisation
JP4102493B2 (ja) * 1998-10-21 2008-06-18 株式会社アドバンテスト 半導体試験装置
DE10080254B4 (de) * 1999-01-08 2004-12-09 Advantest Corp. Wellenformerzeugungsvorrichtung und Halbleiterprüfvorrichtung
JP2000352575A (ja) * 1999-06-10 2000-12-19 Mitsubishi Electric Corp 組み込み型自己テスト回路およびテスト方法
WO2001095117A2 (en) * 2000-06-06 2001-12-13 Igor Anatolievich Abrosimov Data processing system for high speed memory test
DE10122081B4 (de) * 2001-05-07 2004-02-05 Infineon Technologies Ag Verfahren zum Kalibrieren eines Testsystems für eine integrierte Halbleiterschaltung und kalibrierbares Testystem
US6782900B2 (en) 2001-09-13 2004-08-31 Micell Technologies, Inc. Methods and apparatus for cleaning and/or treating a substrate using CO2
TWI286216B (en) * 2004-06-29 2007-09-01 Pixart Imaging Inc Single chip test method, component and its test system
KR20080069778A (ko) 2007-01-24 2008-07-29 삼성전자주식회사 멀티칩 테스트를 위한 반도체 메모리 장치의 테스트 회로및 그의 테스트 방법
US9501085B2 (en) * 2007-02-01 2016-11-22 Keithley Instruments, Llc Method and apparatus for pulse generation
KR100892296B1 (ko) * 2007-10-24 2009-04-08 주식회사 아이티엔티 반도체 테스트 패턴신호의 체배 장치
US7973584B2 (en) 2008-09-04 2011-07-05 Advantest Corporation Waveform generator
KR20160107685A (ko) * 2015-03-05 2016-09-19 에스케이하이닉스 주식회사 반도체 시스템 및 반도체 장치의 테스트 방법
CN108121628B (zh) * 2017-12-19 2021-01-05 珠海市君天电子科技有限公司 一种读写速度的测试方法、装置及电子设备

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5321700A (en) * 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
US5177630A (en) * 1990-12-14 1993-01-05 Westinghouse Electric Corp. Method and apparatus for generating and transferring high speed data for high speed testing applications
JPH04218785A (ja) * 1990-12-19 1992-08-10 Advantest Corp Ｉｃ試験装置
JP3591657B2 (ja) * 1993-10-13 2004-11-24 株式会社アドバンテスト 半導体ｉｃ試験装置
JPH07280883A (ja) * 1994-04-04 1995-10-27 Advantest Corp 半導体試験装置
US5606568A (en) * 1995-11-30 1997-02-25 Megatest Corporation Method and apparatus for performing serial and parallel scan testing on an integrated circuit
KR100238933B1 (ko) * 1996-01-12 2000-03-02 오우라 히로시 시험 패턴 발생기
JP3552184B2 (ja) * 1996-10-18 2004-08-11 株式会社アドバンテスト 半導体メモリ試験装置

Also Published As

Publication number Publication date
JP3501200B2 (ja) 2004-03-02
JPH10232271A (ja) 1998-09-02
DE19807237A1 (de) 1998-09-03
KR19980071586A (ko) 1998-10-26
KR100295546B1 (ko) 2001-07-12
DE19807237C2 (de) 2002-11-21
US6119257A (en) 2000-09-12

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees