TW201243353A - Test handler for memory card - Google Patents

Test handler for memory card Download PDF

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Publication number
TW201243353A
TW201243353A TW101112877A TW101112877A TW201243353A TW 201243353 A TW201243353 A TW 201243353A TW 101112877 A TW101112877 A TW 101112877A TW 101112877 A TW101112877 A TW 101112877A TW 201243353 A TW201243353 A TW 201243353A
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TW
Taiwan
Prior art keywords
test
memory card
unit
tray
buffer
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Application number
TW101112877A
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Chinese (zh)
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TWI445972B (en
Inventor
Hae-Jun Park
Kyung-Min Hyun
Kyoung-Doo Roh
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Mirae Corp
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Publication of TWI445972B publication Critical patent/TWI445972B/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67271—Sorting devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention relates to a test handler for memory card, which includes: a tray part arranged thereon a supply tray for receiving the memory cards under test and a plurality of receiving trays for classifying and receiving the tested memory cards according to the test result; a test part including a plurality of test units for testing the memory cards and a plurality of test picking devices for delivering the memory cards; a buffer part arranged between the tray part and the test part for delivering the memory card; and a movement picker for delivering the memory cards between the buffer part and the tray part. In accordance with the present invention, it is able to automatically execute the test procedure for testing the performance of the memory cards and the classification procedure for classifying the memory cards based on the test result, thereby reducing the time required for performing the test procedure and the classification procedure to the memory cards, and increasing the performance reliability of the memory cards.

Description

201243353 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種記憶卡用測試分選機（Test Handler for Memory Card)，將記憶卡與測試設備相連接，並且根據測試結果 將經測試的記憶卡進行分類。 【先前技術】 SD( Secure Digital)卡、緊湊式快閃記憶體(compact Flash，CF) 卡、多媒體卡（Multi Media Card，MMC )、記憶棒（Memory stick)、 智慧（SmartMedia)卡、xD 圖像（Extreme Digital Picture)卡等 記憶卡（Memory Card)作為便於攜帶又能夠存儲大量資料的介質 而廣泛應用。例如，這些記憶卡使用於數位相機、手機、個人數 位助理（PersonalDigitalAssistants，PDA)等電子產品中。 這些記憶卡透過多個工序製造，這些工序包含：測試記憶卡 所具有的性能之一測試工序；根據測試結果將記憶卡按等級進行 分類的-分類玉序等。透過這些工序將未正常運行的記憶卡與正 常運行的錄卡騎分類，之祕正常運行的·卡出薇。 以往，測試：!!序與分類卫序透過作業者的手卫作業完成。因 此，將記憶卡進行商品化需魏長咖，存在生產率低下的問題。 此外’由於測試工序與分類工序透過作業者的手工作業完成，所 以存在記憶卡性能的可靠性低下之問題。 201243353 【發明内容】 因此，黎於上述問題’本發明之目的在於提供一種記憶卡用 測試分賴，_織相_讀機_自滅侧試記憶卡 所具有的性能之測試工序與根據測試結果將記憶卡進行分類的分 類工序。 為了實現上述目的，本發明包含如下結構。 本發明涉及的記憶卡用測試分選機可包含：一托盤部，位於 托盤區域，減區域安放有胁收崎職的記憶卡的供給托 盤，以及根據測試結果將經測試的記憶卡分類收納的複數個收納 托盤；一測試部，包含用於測試記憶卡的複數個測試單元，這些 測試單元分別没置於進行測試記憶卡的測試工序的一第一測試區 域以及一第二測試區域；一緩衝部，配設於托盤部與測試部之間， 包含-第-緩衝機構及一第二緩衝機構，第一緩衝機構在托盤部 所處的托盤區域與第一測試區域之間移動以搬運記憶卡，第二緩 衝機構在托盤區域與第二測試區域之間移動以搬運記憶卡；以及 搬送拾料器（Picker)，在第一緩衝機構與托盤部之間搬送記憶卡， 以及在第二緩衝機構與托盤部之間搬送記憶卡。測試部可以包含 在測試單元與緩衝部之間搬送記憶卡的複數個測試拾料器。測試 部可以包含一第一測試拾料器以及一第二測試拾料器，第一測試 拾料器在設置於第一測試區域内的測試單元與第一緩衝機構之間 搬送s己憶卡，第二測試拾料器在設置於第二測試區域之内的測試 201243353 單元與第二緩衝機構之間搬送記憶卡。 本發明涉及的記憶卡用測試分選機可以包含：一托盤部：安 放有用於_制綱記憶卡躲祕盤，錢試結果將 么測試的圮憶卡分類收納的複數個收納托盤；一測試部，包含用 於測試記針數鋼解元；-緩騎，峨純^部與測 試部之間用於搬運記憶卡；以及搬送拾料器，在緩衝部與托盤部 之間搬送記憶卡。測試部可以包含在測試單元與緩衝部之間搬送 記憶卡的複數個測試拾料器。 根據本發明能夠實現如下效果。 本發明自動執行測試記憶卡所具有的性能的測試工序和根據 /則試結果將記憶卡進行分類的分類工序，從而能夠縮短對記憶卡 執行測試X序與分類J1序所需的時間，可提高記憶卡性能之可靠 性。 【實施方式】 下面將參考附圖詳細說明本發明的一記憶卡用測試分選機之 較佳實施例。 請參閱「第1圖」’本發明涉及的記憶卡用測試分選機丨，將 記憶卡與測試設備相連接，並且根據測試結果將經測試的記憶卡 進行分類。這些s己憶卡可為SD (SecureDigital)卡、緊凑式快閃 記憶體（CompactFlash,CF)卡、多媒體卡（MultiMediaCard， MMC)、6己憶棒（Memory stick)、智慧（SmartMedia)卡、xD 圖 201243353 像（Extreme Digital Picture)卡等。 本發明涉及的記憶卡_試分選機i包含：安放有記憶卡的 一托盤部2 ;麟搬送記針的_搬送拾· 3 ;祕搬運記憶卡 的緩衝部4 ;以及進行測試記憶卡的工序的一測試部5。測試部 5包含··驗職纖卡的複數個職單元;以及雜在緩衝 與測辟兀μ之間搬送記憶卡的複數個測試拾料器％。在測 試單元51上配設有用於測試記憶卡的測試設備。 田搬送拾料器3將待測試的記憶卡自托盤部2搬送至緩衝部4 時’緩衝部4將制試的記憶卡搬運至測試部5之—側。當測試 拾料器52將待測試的記憶卡自緩衝部4搬送至測試單元51時， 測試單元5丨將制朗記針與酬試設伽連接。攸憶卡的 測試結束之後’戦拾· 52將_試的記憶卡自賴單元51 搬送至緩衝部4。而搬送拾料器3自緩衝部4拾取已經測試的記憶 卡之後，將拾取的峨卡根_試結果進行等分且搬送至托 盤部2。 也過上述之工序，本發明涉及的記憶卡用測試分選機【可自 動執行測試德卡性能的峨I序，以及根_試結果將記憶卡 進行分類的分類工和因此，本發明涉及的記憶卡制試分職丄 與透過作業者的手卫作業絲峨工序與分類功的現有技術相 =，能夠縮短測試卫序與分類卫序所需的時間，從而可提高生產 率。此外’本發明涉及的記憶卡用測試分選機i與現有技術相比， 201243353 能夠提尚根據測試結果將記憶卡進行分類的分類工序之準確性， 從而可提高記憶卡性能之可靠性。 下面請參閱附圖詳細說明托盤部2、搬送拾料器3、緩衝部4 以及測試部5。 請參閱「第1圖」’托盤部2包含：用於安放收納有待測試的 記憶卡的供給托盤的一裝載堆裝箱21 ;以及用於安放收納有經測 試的記憶卡的枚納托盤的一卸載堆裝箱22。 裝載堆裝箱21上儲存有複數個供給托盤，這些供給托盤用於 收納待測試的記憶卡。在供給托盤上形成有複數個收納槽（未圖 示），收納槽用於收納待測試之記憶卡。搬送拾料器3自供給托盤 上拾取待測試的記憶卡，並且將拾取的記憶卡搬送至緩衝部4。 卸載堆裝箱22上儲存有複數個收納托盤，收納托盤用於收納 經測試的記憶卡。在收納托盤上形成有複數個收納槽（未圖示）， 收納槽用於收納經測試的記憶卡。搬送拾料器3自緩衝部4拾取 經測試的記憶卡，並且根據測試結果將拾取的記憶卡搬送至收納 托盤中的某一個上。搬送拾料器3可以朝向第一軸方向（γ軸方 向）及第二軸方向（X軸方向）雜，從而搬送記憶卡。卸載堆 裝箱22沿第二軸方向（x轴方向）與裝載堆裝箱21設置為間隔 開一預定間距。在卸載堆裝箱22上沿第二軸方向（χ軸方向）以 預定距離相間_说有複數個㈣托盤。在裝絲裝箱Μ上沿第 二軸方向（X轴方向）以預定距離相間隔配設有複數個供給托盤。 201243353 “月參閱第1圖」及「第2圖」，搬送拾料器3在托盤部2與 緩衝卩之間搬送s己憶卡。搬送拾料器3將待測試的記憶卡自托 盤4 2搬送至緩衝部4。搬送拾料器3將經測試的記憶卡自麟部 4搬送至托盤部2。 搬送拾料器3為了執行搬送記憶卡的工序，可以朝向第一轴 方向（轴方向）及第二轴方向（χ抽方向）移動。搬送拾料器3 可以在托盤區域A内移動。托_ 2位於托盤區域A之内。搬送 拾料器3可以將待測試的記憶卡自供給托盤上拾取，之後將拾取 的s己憶卡收納至位於托盤區域A之⑽緩衝部4。搬送拾料器^ 可以將經職的記憶卡自位於托盤區域A至内的緩衝部4拾取， 之後將拾取的記憶卡㈣至收納減上，送拾辟3可以進行 升降，以執行拾取記憶卡之工序及收納記憶卡之工序^本發明涉 及的記憶卡_試分選機i可以包含驅動單^未圖示），該驅動 單元使職送拾料器3朝向第-軸方向（γ轴方向）以及第二轴 方向（X軸方向）移動’並且使得搬送拾料器3進行升降。該驅 動單元可以採用利用親缸或氣紅等的缸體式、利用電機與齒條 (RackGear)以及小齒輪（PinionGeer)等的齒輪式利用電機 與滾珠絲扛（BallS_)等的滾珠雜式、_電賊滑輪以及 帶子等的帶式、直線電_方式等，使得搬送拾料器3移動、 升降。 在此，在托盤部2及測試部5上，分別收納有記憶卡，記憶 201243353 卡以不同的間距隔開且形成行列。收納於測試部5上的記憶卡沿 第一轴（Y軸方向）及第二轴方向（X轴方向）彼此隔開的間距， 相比較於收納於托盤部2上的記憶卡沿第一軸方向（γ軸方向） 及第二軸方向（X軸方向）彼此隔開的間距為寬。因此，本發明 涉及的記憶卡用測試分選機1，可分別減小供給托盤與收納托盤各 自大小的同時，也能夠在供給托盤與收納托盤上分別收納更多記 憶卡。此外，本發明涉及的記憶卡用測試分選機丨，由於在測試4 5上記憶卡能細更寬關距㈣，所以可防止記針在測試部 -^ ,Ι-Κ-ί-ϋ. , ^ ^ ....... .i . 5 --- ,J 思下社决IJ = 上彼此干擾，從而能夠提两測試記憶卡的測試工序之準確性。 為此本發明涉及的記憶卡卿j試分選機〗，在托盤部2與測 試部5之間搬送記憶卡的過程中，沿第—軸方向（γ軸方向）與 第二轴方向（X轴方向）靖記憶卡彼關_關距。為了縮 短調節記憶卡彼此關的間輯需的時間，本發及的記憶卡 用測試分選機1包含緩衝部4。 Λ緩衝部4配設於托盤部2與測試部5之間。緩衝部4與測試 帛轴方向（γ轴方向）以彼此間隔開相同距離之方式收 ^隐卡琪5與緩衝部4相比，收納記憶卡時沿第二軸方 向（X軸方向）以更寬的距離間隔開。 緩衝部4與托盤部2以沿第_ 開相同距離的方式收㈣卡:軸方向(x軸方向)彼此間隔 記憶卡時在第-==衝部4與托盤部2相比，收納 °轴方向）以更寬的間距隔開。搬送拾 201243353 料器3在托盤部2與緩衝部4之間搬送記憶卡的過程中，沿第一 軸方向（Y軸方向）調節記憶卡的隔開間距。為此，搬送拾料器3 包:-搬戦嘴31 (在「第3圖」中表示出）以及一行間距調節 單元32 (在「第3圖」中表示出）。 清參閱「第1圖」、「第3圖」以及「第4圖」，搬送吸嘴31 吸附讀、卡。搬送拾料^ 3包含複數個搬送吸嘴3卜在搬送拾料 〇〇的主體33上配設有形成行列的複數個搬送吸嘴31。搬送吸嘴 、朝向第軸方向（γ軸方向）移動地配設於搬送拾料器3 之主體33上。搬送吸嘴31也可以可升降地配設於主體33上。 月參閱第1圖」、「第3圖」及「第4圖」，行間距調節單元 。用於調節搬送吸嘴31沿第—軸方向（γ軸向）相關的距離。 當記憶卡形成行列，收納於托盤部2與緩衝部4時，第一抽方向 (Y軸方向）為與行方向侧之方向。即，行間距娜單元32用 於調卽搬送吸嘴31沿行方向（γ财向）她開的麟。行間距 調節單元32包含-第-凸輪板321及一第一升降單元322。 第一凸輪板321可升降地配設於主體33上。在第一凸輪板％】 上形成有複數個第-凸輪槽321卜搬送吸嘴31可移動地分別與第 一凸輪槽3211相結合。第-凸輪槽3211分別以彼此不相同的傾 斜角傾斜地形成於第一凸輪板321升降的方向（z軸方向）上。 第一凸輪槽3211分別形成為，越向第一凸輪板32i下降的方向彼 此之間的間距越窄。第一凸輪槽3211用於引導搬送吸嘴31以相 201243353 同之間距相隔開或縮窄。 第-升降單元322用於升降第一凸輪板321。當第一升降單元 322使得第一凸輪板321升降時，搬送吸嘴31隨著第一凸輪槽幻^ 移動。從而調節搬送吸嘴31沿行方向（γ軸方向）相隔開_距。 如「第3圖」所示，當第一升降單元322使得第一凸輪板321 上升時’搬送吸嘴31隨著第-凸輪槽3211移動，從而沿該行方 向（Y軸方向）關距變^此時’搬送吸嘴31之間距調節為， 與記憶卡在托辦2上沿第-财向（γ軸方向）與第二轴方向 (X轴方向）相隔開收納的間距相同。因此，搬送拾料器3能夠 自供給托盤上一次拾取複數個待測試的記憶卡。此外，搬送拾料 器3能夠將複數個經測試的記憶卡同時收納於收納托盤上。 如「第4圖」所示，當第一升降單元322使得第一凸輪板321 下降時，搬送吸嘴31隨著第一凸輪槽3211移動，從而使得沿行 方向（Y轴方向）的間距變寬。此時，搬送吸嘴之間距調節為， 與記憶卡在緩衝部4中沿第一轴方向（γ轴方向）與第二轴方向 (X軸反向）相隔開收納的間距相同。因此，搬送拾料器3能夠 將複數個待測試的記憶卡同時收納於緩衝部4上《此外，搬送拾 料器3能夠自緩衝部4 一次拾取複數個經測試的記憶卡。 所以’搬送拾料器3能夠以行列為單位一次拾取複數個記憶 卡，也能夠以行列為單位同時收納複數個記憶卡。因此，本發明 涉及的記憶卡用測試分選機1能夠縮短在托盤部2與緩衝部4之 11 201243353 間搬送記憶卡的工序所需之時間。第一升降單元322可以採用利 =軸氣虹等的缸體式、利用電機與齒條以及小齒輪等的齒 2子專的帶式、利用直線電機的方式等，使得第一凸輪板奶 幵降。 請參閱「第1圖」及「第5圖」，緩衝部4與測試單元51以 2卡沿第-财心㈣）彼崎瞻_開的; 億卡。戦單U與緩衝部4她，沿第二轴方向（乂 以更寬_Ε_地收納記憶卡，拾料器201243353 VI. Description of the Invention: [Technical Field] The present invention relates to a Test Handler for Memory Card, which connects a memory card to a test device and is tested according to the test result. The memory card is classified. [Prior Art] SD (Secure Digital) card, compact flash (CF) card, Multi Media Card (MMC), Memory Stick, SmartMedia card, xD A Memory Card such as an Extreme Digital Picture card is widely used as a medium that is easy to carry and can store a large amount of data. For example, these memory cards are used in electronic products such as digital cameras, mobile phones, and personal digital assistants (PDAs). These memory cards are manufactured through a plurality of processes, including: one of the test performances of the test memory card; and the classification of the memory cards according to the test results - the classification of the jade sequence. Through these procedures, the memory card that is not operating normally is sorted with the card card that is normally running, and the secret is the card that runs normally. In the past, the test:!! sequence and classification order was completed by the operator's hand-held work. Therefore, the commercialization of the memory card requires Wei Changca, and there is a problem of low productivity. Further, since the test process and the sorting process are completed by the manual work of the operator, there is a problem that the reliability of the memory card performance is low. 201243353 [Summary of the Invention] Therefore, in the above problem, the object of the present invention is to provide a test procedure for the memory card, the test procedure of the performance of the _ phase-reader_self-extinguishing side test memory card and the test result according to the test result. The classification process of the classification of the memory card. In order to achieve the above object, the present invention comprises the following structure. The test sorting machine for a memory card according to the present invention may comprise: a tray portion located in the tray area, a supply tray for the memory card of the threatening position, and a memory card of the tested test according to the test result. a plurality of storage trays; a test portion comprising a plurality of test units for testing the memory card, the test units are not placed in a first test area and a second test area for performing the test process of the test memory card; The portion is disposed between the tray portion and the test portion, and includes a - a buffer mechanism and a second buffer mechanism. The first buffer mechanism moves between the tray region where the tray portion is located and the first test region to carry the memory card. a second buffer mechanism moves between the tray area and the second test area to carry the memory card; and a picker, transports the memory card between the first buffer mechanism and the tray portion, and the second buffer mechanism Transfer the memory card between the tray and the tray. The test section may include a plurality of test pickers that transport the memory card between the test unit and the buffer. The test portion may include a first test picker and a second test picker, and the first test picker transports the memory card between the test unit disposed in the first test area and the first buffer mechanism. The second test picker transports the memory card between the test 201243353 unit and the second buffer mechanism disposed within the second test area. The test sorting machine for a memory card according to the present invention may comprise: a tray portion: a plurality of storage trays for storing the memory card for the _ system memory card, and the memory test results are classified and stored; The part includes a steel solution for testing the number of stitches; - a slow ride, a memory card for transporting the memory card between the ^ pure part and the test part; and a picker for transporting the memory card between the buffer part and the tray part. The test section may include a plurality of test pickers for transporting the memory card between the test unit and the buffer section. According to the present invention, the following effects can be achieved. The present invention automatically executes a test process for testing the performance of the memory card and a sorting process for classifying the memory card according to the test result, thereby shortening the time required to execute the test X sequence and the classification J1 sequence on the memory card, thereby improving The reliability of memory card performance. [Embodiment] A preferred embodiment of a test sorter for a memory card of the present invention will be described in detail below with reference to the accompanying drawings. Referring to "Fig. 1", a test sorting machine for a memory card according to the present invention connects a memory card to a test device, and classifies the tested memory card based on the test result. These cards can be SD (SecureDigital) cards, Compact Flash (CF) cards, MultiMediaCard (MMC), 6 Memory Stick, SmartMedia cards, xD Figure 201243353 (Extreme Digital Picture) card, etc. The memory card_test sorting machine i according to the present invention includes: a tray portion 2 on which a memory card is placed; a _ transport pick-up 3 of a lining transport needle; a buffer portion 4 for secretly transporting a memory card; and a test memory card A test portion 5 of the process. The test unit 5 includes a plurality of job units of the inspector card, and a plurality of test pickers % that carry the memory card between the buffer and the probe. A test device for testing the memory card is disposed on the test unit 51. When the field transfer picker 3 transports the memory card to be tested from the tray unit 2 to the buffer unit 4, the buffer unit 4 transports the test memory card to the side of the test unit 5. When the test picker 52 transports the memory card to be tested from the buffer unit 4 to the test unit 51, the test unit 5 connects the lock needle to the test set. After the test of the memory card is completed, the memory card of the test card is transferred from the buffer unit 4 to the buffer unit 4. After the pick-up picker 3 picks up the tested memory card from the buffer unit 4, the picked-up pick-up result is equally divided and transferred to the tray unit 2. The above-mentioned process, the test sorting machine for a memory card according to the present invention [automatically performs the 峨I sequence of testing the performance of the deka, and the classification of the memory card by the root_test result and thus, the present invention relates to The memorization of the memory card test and the prior art of the wire-drawing process and the sorting work by the operator's hand-held work can reduce the time required for the test sequence and the sorting order, thereby improving productivity. In addition, the test sorting machine i for a memory card according to the present invention can compare the accuracy of the sorting process for classifying the memory card according to the test result, thereby improving the reliability of the performance of the memory card. Next, the tray unit 2, the transport picker 3, the buffer unit 4, and the test unit 5 will be described in detail with reference to the drawings. Please refer to "FIG. 1". The tray portion 2 includes: a loading stack 21 for housing a supply tray containing a memory card to be tested; and a loading tray for housing the tested memory card. Unload the stack 22. The loading stacker 21 stores a plurality of supply trays for accommodating the memory card to be tested. A plurality of storage slots (not shown) are formed in the supply tray, and the storage slots are used to receive the memory card to be tested. The transport picker 3 picks up the memory card to be tested from the supply tray, and transports the picked-up memory card to the buffer unit 4. The unloading stacker 22 stores a plurality of storage trays for storing the tested memory cards. A plurality of storage grooves (not shown) are formed in the storage tray, and the storage grooves are used to store the tested memory cards. The transport picker 3 picks up the tested memory card from the buffer unit 4, and transports the picked-up memory card to one of the storage trays based on the test result. The conveyance picker 3 can convey the memory card so as to be misaligned in the first axial direction (γ-axis direction) and the second axial direction (X-axis direction). The unloading stack 22 is disposed at a predetermined interval from the loading stacker 21 in the second axial direction (x-axis direction). On the unloading stack 22, a plurality of (four) trays are arranged at a predetermined distance in the second axial direction (the x-axis direction). A plurality of supply trays are disposed on the wire loading cassette at a predetermined distance in the second axial direction (X-axis direction). 201243353 "Refer to Fig. 1" and "Fig. 2", the pick-up picker 3 transports the card between the tray unit 2 and the buffer cassette. The pickup picker 3 transports the memory card to be tested from the tray 4 2 to the buffer unit 4. The transport picker 3 transports the tested memory card from the collar 4 to the tray unit 2. The conveyance picker 3 is movable in the first axial direction (axial direction) and the second axial direction (squeezing direction) in order to perform the process of transporting the memory card. The transport picker 3 can be moved in the tray area A. The tray 2 is located within the tray area A. The pick-up picker 3 can pick up the memory card to be tested from the supply tray, and then store the picked-up memory card to the (10) buffer portion 4 located in the tray area A. The pick-up picker can pick up the memory card from the buffer portion 4 located in the tray area A, and then pick up the picked-up memory card (4) to the storage, and the pick-up 3 can be lifted and lowered to perform the pick-up memory card. Process of accommodating a memory card. The memory card according to the present invention - the test sorter i may include a drive unit (not shown), and the drive unit causes the pick-up picker 3 to face the first-axis direction (γ-axis direction) And the second axis direction (X-axis direction) moves 'and causes the pick-up picker 3 to move up and down. The drive unit can be a cylinder type using a cylinder or a gas red, a gear type using a motor, a rack (RackGear), and a pinion (Pinion Geer), and a ball type using a motor and a ball screw (BallS_). _Electric thief pulleys, belts, belts, etc., such as belt type, linear electric_mode, etc., make the pick-up picker 3 move and raise and lower. Here, the memory card is stored in the tray unit 2 and the test unit 5, and the memory 201243353 card is spaced apart at different pitches to form a matrix. The memory card accommodated in the test unit 5 is spaced apart from each other along the first axis (Y-axis direction) and the second axis direction (X-axis direction), and the memory card stored on the tray portion 2 is along the first axis. The distance between the direction (γ-axis direction) and the second axis direction (X-axis direction) is wide. Therefore, the test card sorting machine 1 for a memory card according to the present invention can reduce the size of each of the supply tray and the storage tray, and can store more memory cards on the supply tray and the storage tray. In addition, the present invention relates to a test sorting machine for a memory card. Since the memory card can be thinner and wider (4) in the test 4 5, the needle can be prevented from being in the test portion -^, Ι-Κ-ί-ϋ. , ^ ^ ....... .i . 5 --- , J thinks that IJ = interfere with each other, so that the accuracy of the test procedure of the two test memory cards can be mentioned. To this end, the memory card jam sorting machine according to the present invention, in the process of transporting the memory card between the tray unit 2 and the test unit 5, along the first-axis direction (γ-axis direction) and the second axis direction (X) Axis direction) Jing memory card and _ off distance. In order to shorten the time required to adjust the interval between the memory cards, the test card sorter 1 of the present invention includes the buffer unit 4. The buffer portion 4 is disposed between the tray portion 2 and the test portion 5. The buffer portion 4 is spaced apart from the test x-axis direction (γ-axis direction) by the same distance from each other. The hidden card 5 is more in the second axis direction (X-axis direction) than when the memory card is received. Wide distances are spaced apart. The buffer portion 4 and the tray portion 2 are received at the same distance from the tray portion 2 (four) cards: when the memory card is spaced apart from each other in the axial direction (x-axis direction), the -== punching portion 4 is compared with the tray portion 2, and the axis is accommodated. Directions are separated by a wider spacing. Transport Pickup 201243353 The feeder 3 adjusts the separation pitch of the memory cards in the first axis direction (Y-axis direction) while the memory card is being transported between the tray unit 2 and the buffer unit 4. To this end, the pick-up picker 3 packs: - a transfer nozzle 31 (shown in "Fig. 3") and a line spacing adjustment unit 32 (shown in "Fig. 3"). In the "1st picture", "3rd picture" and "4th picture", the suction nozzle 31 is used to absorb the reading and card. The transport pick-up 3 includes a plurality of transport nozzles 3, and a plurality of transport nozzles 31 forming a row and a row are disposed on the main body 33 of the transport pick-up magazine. The conveyance nozzle is disposed on the main body 33 of the conveyance picker 3 so as to move in the direction of the first axis (the γ-axis direction). The transport nozzle 31 may be disposed on the main body 33 so as to be movable up and down. Please refer to Figure 1 ", Figure 3" and "Figure 4" for the line spacing adjustment unit. It is used to adjust the distance of the transport nozzle 31 in the first-axis direction (γ-axis direction). When the memory card is formed in a row and is accommodated in the tray portion 2 and the buffer portion 4, the first drawing direction (Y-axis direction) is the direction from the row direction side. That is, the line spacing unit 32 is used to adjust the direction in which the suction nozzle 31 is opened in the row direction (γ 。). The line spacing adjustment unit 32 includes a -th cam plate 321 and a first lifting unit 322. The first cam plate 321 is disposed on the main body 33 so as to be movable up and down. A plurality of first cam grooves 321 are formed on the first cam plate %, and the transfer nozzles 31 are movably coupled to the first cam grooves 3211, respectively. The first cam grooves 3211 are formed obliquely in a direction (z-axis direction) in which the first cam plate 321 is lifted and lowered at an inclination angle different from each other. The first cam grooves 3211 are formed such that the distance between each other toward the first cam plate 32i is narrower. The first cam groove 3211 is for guiding the conveying nozzle 31 to be spaced or narrowed by the same distance between the phases 201243353. The first lifting unit 322 is for lifting and lowering the first cam plate 321. When the first lifting unit 322 raises and lowers the first cam plate 321, the conveying nozzle 31 moves with the first cam groove. Thereby, the transport nozzles 31 are adjusted to be spaced apart from each other in the row direction (γ-axis direction). As shown in "Fig. 3", when the first lifting unit 322 raises the first cam plate 321, the conveying nozzle 31 moves along the first cam groove 3211, thereby changing the distance in the row direction (Y-axis direction). ^ At this time, the distance between the transport nozzles 31 is adjusted to be the same as the pitch in which the memory card is stored in the second fiscal direction (the γ-axis direction) and the second axial direction (the X-axis direction) on the tray 2 . Therefore, the transport picker 3 can pick up a plurality of memory cards to be tested from the supply tray at a time. Further, the transport picker 3 can simultaneously store a plurality of tested memory cards on the storage tray. As shown in "Fig. 4", when the first lifting unit 322 lowers the first cam plate 321, the conveying nozzle 31 moves with the first cam groove 3211, so that the pitch in the row direction (Y-axis direction) is changed. width. At this time, the distance between the transfer nozzles is adjusted to be the same as the pitch in which the memory card is accommodated in the buffer portion 4 in the first axial direction (γ-axis direction) and the second axial direction (X-axis reverse direction). Therefore, the transport picker 3 can simultaneously store a plurality of memory cards to be tested on the buffer unit 4. Further, the transport picker 3 can pick up a plurality of tested memory cards from the buffer unit 4 at a time. Therefore, the pick-up picker 3 can pick up a plurality of memory cards at a time in units of rows and columns, and can also accommodate a plurality of memory cards in units of rows and columns. Therefore, the test sorter 1 for a memory card according to the present invention can shorten the time required for the process of transporting the memory card between the tray unit 2 and the buffer unit 4 201243353. The first lifting unit 322 can be a cylinder type of a shaft, a shaft, or the like, a belt type using a motor, a rack, a pinion, or the like, a linear motor, or the like, so that the first cam plate can be used. drop. Please refer to "Figure 1" and "Figure 5". The buffer unit 4 and the test unit 51 are 2 cards along the first - Finance (4)).戦Single U and buffer part 4, in the direction of the second axis (乂 to accommodate the memory card wider, _ _ _, picker

2與測試單元51之_送峨卡的過程中，沿第二轴方向(X 測試=調節記憶卡的相隔開之間距。為此，測試拾料器52包含 二〇 521 (在第5圓」t示出）以及一列間距調節單元522 (在「第5圖」令示出）。 月參目第1圖」及「第5圖」，測試吸嘴Ml用於吸附記憶 +-1^4, 52 521 〇 $2 _ 3上鄉成仃列的方式配财複數侧試吸嘴52卜測試 吸嘴521也可以可升降地配設於主體⑵上。 請參閱「第1圖及「坌^ 第5圖」，列間距調節單元522用於調 二"及嘴52!沿第二軸方向（χ轴方向）相隔開的間距。當記 2成行列，收納於緩衝部4與測試單元Μ上時，第二轴方向 方向）為與列方向相同的方向。即，列間距調節單元5222 In the process of sending the Leica with the test unit 51, in the direction of the second axis (X test = adjusting the distance between the memory cards. For this purpose, the test picker 52 includes two 521 (in the fifth circle) t is shown) and a column of spacing adjustment unit 522 (shown in the "Fig. 5" command). In the month 1st and 5th, the test nozzle M1 is used to absorb memory +-1^4, 52 521 〇$2 _ 3 Ways to go to the hometown of the squadrons. The number of side test nozzles 52 test nozzles 521 can also be lifted and lowered on the main body (2). Please refer to "1st picture and "坌^ 5th In the figure, the column spacing adjusting unit 522 is used to adjust the spacing between the second axis and the mouth 52! in the direction of the second axis (the axis direction). When the row is 2 rows and rows, it is stored in the buffer portion 4 and the test unit. The direction of the second axis direction is the same direction as the column direction. That is, the column pitch adjustment unit 522

S 12 201243353 沿列方向（x軸方向）調節測試吸嘴521的隔開間距。列間距調 節單元522包含一第二凸輪板5221以及一第二升降單元5222。 第二凸輪板5221可升降地配設於主體523上。在第二凸輪板 5221上开》成有複數個第二凸輪槽522ia。測試吸嘴52丨可移動地 分別與第二凸輪槽5221a相結合。第二凸輪槽5221a分別以彼此 不相同得傾斜角傾斜祕成於第二凸輪板迎耕的方向轴 方向）上。第二凸輪槽5221a分別形成為’越向第二凸輪板522ι 下降的方向彼此之間的間距越寬。第二凸輪槽52叫用於引導測 試吸嘴521以相同之間距相隔開或縮窄。 〜第二餅單元迎使料二凸輪板5221耕。#第二升降 單元5222使得帛二凸輪板5221升降時，測試吸嘴521隨著第二 凸輪槽522!a移動。由此，沿列方向（χ軸方向）調節測試料 521的間距。 W ^二开料元5222使料二凸輪板5221下降時， 測試吸嘴521隨著第二凸輪槽咖移動，從而使得沿列方向（ 軸方向）的間距變窄。此時，測試吸嘴521沿列方向㈣ 變窄的間距，與記憶卡在緩衝部4上沿列方向（χ轴方向）袖 開且收納的間距相同。因此，測試吸嘴521之間距調節為 憶卡在緩衝部4中沿第-轴方向（γ㈣向）與第 、。 轴反向）相瞧糊距妳所以，測試她2 衝部4 一次拾取複數個待卿記憶卡。此外，戦拾料器^ 13 201243353 夠將複數個酬朗記針同時㈣於緩衝部4。 例如，當第二升降單元皿使得第二凸輪板迎上升時， 測試吸嘴切隨著第二凸輪槽移動，從而使得沿列方向& 軸方向）的間距變寬。「第5圖」係為測試吸嘴521沿列方向（χ 軸方向）之間距變寬的狀態之示意圖。此時，測試吸嘴52ι沿列 方向（Χ軸方向）魏_距，與記憶卡在戦單元5丨上沿列方 向（X軸方向）相隔開收納的間距相同。因此，測試吸嘴521的 間距調節為，與記憶卡在職單元51沿第—財向（Υ轴方向） 與第二轴方向（X軸方向）相關收納的間距相同。所以，測試 拾料器52 _賴數個制朗記憶卡同雜_職單元51 上此外’測試拾料器52能夠自測試單元51 一次拾取複數個經 測試的記憶卡。 所以’測試拾料器52 _以行列為單位一次拾取複數個記憶 卡’也能夠崎列為單位同時收触油記,隐卡。·，本發明 涉及的記憶卡用測試分選機丨能夠縮短在緩衝部4與測試部5之 間搬送記憶卡的X序所需之時間。第二升降單元逝可以採用利 用液壓缸或氣缸等的缸體式、雜與齒條以及小#輪等的齒 輪式、利用電機與滾珠絲权等的滾珠絲杠式'利用電機與滑輪以 及帶子等的帶式、利用直線電機的方式等，使得第二凸輪板5221 升降。 請參閱「第1圖」、「第2圖」以及「第6圖」，緩衝部4用於 14 S. 201243353 搬運δ己憶卡。線徐^ 構_細_卡的-緩衝機 圖」中表不出），以及使得緩衝機構41朝向第一 出『向（Y轴方向）移動的—驅動機構42 (在「第6圖」中表示 緩衝機構41包含用於收納記憶卡的複數個緩衝槽411 (在「第 圖」中表不出）。緩衝槽411沿第一軸方向轴方向）與第二 軸方向（Χ轴方向）相隔開預定得間距並形成行列。緩衝槽411 沿第-轴方向（Υ軸方向）彼此相關關距，與 (在第1圖」中表示出）上沿第一軸方向（γ軸方向） 相隔開收納的間距相同。緩衝槽411沿第二軸方向（χ軸方向） 彼此相隔開的間距’與記憶卡在供給托盤與收納托盤上沿第二轴 方向（X轴方向）相隔開收納的間距相同。 驅動機構42使得緩衝機構41朝向第一軸方向（γ軸方向） 移動。驅動機構42移動緩衝機構41使得緩衝機構41位於托盤區 域Α或測試區域Β之内。測試區域Β為配設有測試單元51之區 域。搬送拾料器3在位於托盤區域A内的緩衝機構41與托盤部2 之間搬送記憶卡。測試拾料器52在位於測試區域β内的緩衝機構 41與測試單元51之間搬送記憶卡。因此，搬送拾料器3與測試拾 料器52能夠對彼此位於不同位置的緩衝機構41執行搬送記憶卡 之工序。所以’本發明涉及的記憶卡用測試分選機1，能夠避免搬 送拾料器3與測試拾料器52在搬送記憶卡的過程中彼此衝突。 15 201243353 驅動機構42可以採用姻液壓缸或氣缸等的缸體式、利用電 機與齒條以及小等的錄式、_電機與滾珠雜等的滾珠 絲杠式、_賴與·以及帶子_帶式、_錢電機的、方 式等，將緩衝機構41朝向第一軸方向（γ軸方向）移動。 緩衝部4可以包含複數個緩衝機構41以及複數個驅動機構 42。緩衝機構41可以彼此獨立地朝向第一軸方向（γ軸方向）移 動。因此，搬送拾料器3可以對緩衝機構41中位於托盤區域α之 内的緩衝機構41執行搬送記憶卡之工序。此外，測試拾料器& 可以對緩衝機構41中位於測試區域β之内的緩衝機構41執行搬 送記憶卡之工序。由於搬送拾料器3與測試拾料器52能夠同時對 不同的緩衝機構41執行搬送記憶卡之工序，所以本發明涉及的記 憶卡用測試分選機1，能夠縮短測試工序與分類工序所需之時間。 請參閱「第1圖」、「第2圖」、「第7圖」以及「第8圖」，測 試部5包含測試單元51以及測試拾料器52。 測試單元51與測試設備Τ(在「第7圖」中表示出）相連接。 測試設備Τ用於測試收納於測試單元51上的記憶卡。測試單元 51包含用於與測试g史備Τ電連接的連接銷（未圖示）。測試單元 51包含：用於收納記憶卡的一測試插口 511 (在「第8圖」中表 示出）’用於將收納於測试插口 511中的記憶卡與測試設備τ相連 接的一-^爪512 (在「第8圖」中表示出）；以及配設有複數個測 試插口 511的測試板513 (在「第7圖」中表示出）。 201243353 測試插口 511包含用於收納記憶卡的測試槽5111。測試插口 511在測試板513上配設有複數個，以使得測試槽5111沿第一軸 方向（Y軸方向）與第二轴方向（X軸方向）彼此相隔開預定之 間距而形成為行列。測試槽5111沿第一軸方向（γ軸方向）彼此 相隔開的間距，與緩衝槽411 (在「第6圖」中表示出）沿第一轴 方向（Y軸方向）彼此相隔開的間距相同。 測試插口 511包含一第一插口主體5112 (在「第8圖」中表 示出）以及一第二插口主體5113 (在「第8圖」中表示出）。 第一插口主體5112可升降地結合於第二插口主體5113。第一 插口主體5112以彈簧（未圖示）作祕體可彈性升降地結合於第 二插口主體5113上。對第-插口主體5112未施加外力時，第一 插口主體5112可以根據彈簧所具有的彈力而上升。測試槽仙 形成於第-插口主體上。卡爪512與第一插口主體5ii2相 結合。 第一插口主體5113與測試板513相結合。請參閱「第8圖」， 在第二插口主體5113上配設有一支承部件5114、一彈性部件5出 以及一連接部件5116。 支承部件如4以彈性部件仙作為媒體可彈性升降地結合 於第二插口主體5113上。記憶卡收納於測試槽則之内且安裝 在支承部件5114上。安裝於支承部件5114上的記憶卡與連接部 件5116電連接。 17 201243353 彈性部件5115位於支承部件5114與第二插口主體Mu之 間。彈性部件5115之—側與支承部件·相結合，另—側與第 二插口主體5m相結合。當卡爪512按壓安裝於支承部件51、14 上的記憶卡時’彈性部件5出透過支承部件犯4壓住而麗縮。 當卡爪512自安裝於支承部件5114上的記憶卡分離時彈性部件 5115被拉伸從而使得支承部件5114上升。測試插口 5ιι可以包含 複數個彈性部件5115。 連接部件5116的一侧與支承部件5114相結合，另一側與第 二插口主體5113相結合。連接部件5116的一侧與安裝於支承部 件5114上的記憶卡電連接。連接部件5116的另一側與測試板513 (在「第7圖」中表示出）電連接。因此，安裝於支承部件5114 上的δ己憶卡透過所述連接部件5116及測試板513與測試設備τ電 連接。測試插口 511可以包含複數個連接部件5116。 請參閱「第1圖」、「第2圖」、「第7圖」以及「第8圖」，卡 爪512(在「第8圖」中表示出）可移動地設置於測試插口 5η中。 當測試槽5111之内收納記憶卡時，卡爪512旋轉至以不妨礙記憶 卡被測試槽5111收納的位置。當測試槽5111内收納有記憶卡時， 卡爪512旋轉至能夠按壓被收納於測試槽5111之内的記憶卡的位 置。隨著卡爪512按壓收納於測試槽5111之内的記憶卡，收納於 測試槽5111内的記憶卡與測試設備Τ相連接。在第一插口主體 5112上可以結合有複數個卡爪512。 201243353 卡爪512能夠可旋轉地配設於第一插口主體5112上。卡爪512 可以將彈簧（未圖示）作為媒體可彈性旋轉地結合於第一插口主 體5112上。當第一插口主體5112上升時，卡爪512旋轉以便根 據彈簧所具有的彈力能夠按壓收納於測試槽5111内的記憶卡。當 第-插口主體5112下降時’卡爪旋轉至不妨礙記憶卡透過測 試槽5111收納的位置。 測試板513 (在「第7圖」中表示出）支承測試插口 511。在 測試板513上配設有複數個測試插〇 511。測試插〇 5ιι沿第一轴 方向（Υ轴方向）與第二軸方向（χ軸方向）形成行列，配設於 如試板513上在測試板513 配設有用於與測試設備τ電連接 的連接銷（未圖示）。測試板513與測試插口 511所具有的連接部 件5H6電連接。因此’職設備τ關透過連接部件皿及連 接銷對收納於測試插π 的記憶卡進行測試。測試板513整體 可以以矩形板狀形成。 請參閱「第1圖」、「第2圖」、「第7圖」以及「第8圖」，測 試拾料器52(在「第1圖」中表示出）在緩衝部4與測試單元51 之間搬送記憶卡。測試拾料器52將待測試的峨卡自緩衝部*搬 送至測試料51。戦拾· 52將酬朗記憶卡 51搬送至緩衝部4。 早疋 測試拾料器52為了執行搬送記憶卡之 (轴方向）與第二轴方向（X轴方向）移動。測試拾料器52可 201243353 以在測試_ (在「第2圖」t表示出）之内綠測試單元 51位於測試區域B之内。崎拾料器52自位於職區域B之内 的緩衝部4拾取待測試的記憶卡，之後將拾取的記憶卡收納於測 試單元51上。測試拾_2自測試單元51拾_試的記憶卡， 之後將拾取的記憶卡收納於位於戦區域b之内的緩衝部4上。 測試拾料器52可進行升降以執行拾取記憶卡的工序及收納記憶卡 之工序。顧部5可吨含—驅動單元（未_)，該驅動單元將 測試拾料器52朝向第一抽方向（Y轴方向）與第二軸方向㈣ 方向）移動，並且使得測試拾料器52棒驅㈣可以採用利 用液壓缸或氣虹等的虹體式、利用電機與齒條以及小齒輪等的齒 輪式、_ f機與滾珠脉等的滾珠絲杠式、_賴與滑輪以 及帶子等的帶式、利用直線電機的方式等，使得測試拾料器 動、升降。 請參閱「第1圖」、「第2圖」、「第7圖」至「第10圖」，測 試部5包含移動卡爪512(在「第8圖」中表示幻的一 單元53 (在「第7圖」中表示出）。 開閉單元幻可移動卡爪犯以開故測試槽仙。在測試槽 5111開放的狀態下，職娜52可以將待測試幅相（在 「第9圖」中表不出）收納於測試插口 511中。在測試槽51 放的狀態下，獅自咖口 5U偷經測試^ 記憶卡Μ。 201243353 開閉單元53可以移動卡爪512以關閉測試槽5111。在測試槽 5111關閉的狀態下’卡爪512可以按壓收納於測試插口 511中的 記憶卡Μ。因此，收納於測試插口 511中的記憶卡μ與測試設備 Τ (在「第7圖」中表示出）連接從而進行測試。開閉單元53包 含一開閉機構531、一第一移動機構532 (在「第7圖」中表示出） 以及一第二移動機構533 (在「第7圖」中表示出）。 開閉機構531可以升降第一插口主體5112。如「第9圖」所 示’當開閉機構531使得第一插口主體5112下降時，卡爪512旋 轉以便開放測試槽5111。如「第10圖」所示，當開閉機構531自 第一插口主體5112分離時’卡爪512旋轉以關閉測試槽5111。開 閉機構531可以包含複數個貫穿孔5311。當開閉機構531使得第 一插口主體5112下降時，貫穿孔5311分別位於對應於測試槽5111 的位置。由此’在開閉機構531使得第一插口主體5112下降的狀 態下，測試拾料器52可以通過貫穿孔5311將記憶卡μ收納於測 試插口 511中。此外，在開閉機構531使得第一插口主體5112下 降的狀態下，測試拾料器52可以通過貫穿孔5311自測試插口 511 中拾取記憶卡Μ。開閉機構531整體可以以矩形板狀形成。 第一移動機構532 (在「第7圖」中表示出）用於升降開閉機 構531。當第一移動機構532使得開閉機構531下降時，開閉機構 531使得第一插口主體5112下降。因此，卡爪512旋轉以開放測 試槽5111。當第一移動機構532使得開閉機構531上升時，開閉 21 201243353 缸體式、梅ΓΓ532可咖_繼錢缸等的 =::r、___子等的帶: 用直線電機的方式等’使得開閉機構53ι升降。 第二移動機構533 (在「第7 =;—_移—:： 機構奶在測試單元51 ° (、轴方向）移動，以便開閉 乂㈣一 選擇一部分進行開閉。因此，在對收納 在測试早U中—部料_切_試工序_，測 試拾料器52可對其他職單μ執行收納記針M的工序或自 其他測試單元Μ拾取記憶卡Μ之工序。所以，本發明涉及的記 憶卡用測試分職i，可以對複數個測試單元51共同使用一個開 閉機構別’從而減少開閉機構531的數量。因此，本發明涉及的 記憶卡用測試分選機丨，_降低材料成本，可降低整個設備的製 造成本。 在第二移動麵533上可結合有第一移動機構Μ2。第二移動 機構533使得第-移動機構知朝向第一轴方向（γ轴方向）移 動，從而使得開閉機構53i朝向第一轴方向（γ轴方向）移動。 第二移動機構533可以採用利用液壓缸或氣缸等的缸體式、利用 22 201243353 電機與齒條以及小齒輪等的齒輪式、利用電機與滾珠絲4等的袞 珠絲杠式、利用電機與滑輪以及帶子等的帶式、利用直線電w 方式等’使得第-移動麵532朝向第一轴方向（γ轴方向 動。 °移 在此，請參閱「第2圖」及「第7圖」，測試部5可以在第一 測試區域Β1 (在「第2圖」中表示出）與第二測試區域Β2(在「第 2圖」中表示出）之内分別配設有複數個測試單元51。第一測試 區域Β1與第二測試區域於沿第工軸方向（χ轴方向）相隔開預 定得-間距。此時，緩衝部4包含：-第一緩衝機構4U (在「第 2圖」中表示出），用於在托盤區域a與第一測試區域61之間搬 運記憶卡；以及一第二緩衝機構41b (在「第2圖」中表示出）， 用於在托盤區域A與第二測試區域B2之間搬運記憶卡。測試部5 包含：一第一測試拾料器52a (在「第2圖」中表示出），在配設 於第一測試區域B1之内的測試單元51與第一緩衝機構41a之間 搬送記憶卡；以及一第二測試拾料器52b(在「第2圖」中表示出）， 在配設於第二測試區域B2之内的測試單元51與第二緩衝機構4lb 之間搬送記憶卡。因此，本發明涉及的記憶卡用測試分選機1可 具有如下作用效果。 第一，本發明涉及的記憶卡用測試分選機1，相對於一個托盤 部2 ’分別配設於第一測試區域B1與第二測試區域B2之内的測 試單元51可單獨地執行對記憶卡的測試工序。因此，即使在第一 23 201243353 測試區域B1之内配設有的測試單元51或者在第二測試區域B2 之内配設有的測試單元51中的任一個發生誤動作，本發明涉及的 記憶卡用測試分選機1也可以利用在第一測試區域B1之内配設有 的測試單元51或者在第二測試區域B2之内設有的測試單元51中 未發生誤動作的任一個，對記憶卡執行測試工序。因此，本發明 涉及的記憶卡用測試分選機1，能夠連續對記憶卡執行測試工序， 從而能夠在短時間内對更多的記憶卡執行測試工序。 第二，本發明涉及的記憶卡用測試分選機1，相對於一個托盤 部2’第一緩衝機構41a與第一測試拾料器52a能夠執行搬送記憶 卡之工序，與此相獨立，第二緩衝機構41b與第二測試拾料器5邡 能夠執行搬送記憶卡之工序。因此，即使在第一緩衝機構41a與 第一測試拾料器52a或者第二緩衝機構41b與第二測試拾料器52b 中的任-個發生誤動作，本發明涉及的記憶卡用測試分選機i也 可以利用在第-緩衝機構4la與第—測試拾料器52a或者第二緩 衝機構41b與第二測試拾料器52b中未發生誤動作的任一個對 記憶卡執行搬送工序。所以，本發明涉及的記憶卡_試分選機i 能夠連續執行在托盤部2、緩衝部4以及測試部5之間搬送記憶卡 的工序，從而能夠在短時間内對更多的記憶卡執行測試工序。 第三’測試設備Τ測試記憶卡時所需的時間，相比較於搬送 拾料器3與測試拾料器52在托盤部2、緩衝部纽及測試部$之 間搬送記憶卡時所需的時間長。所以，對於—個托盤部2，如果僅S 12 201243353 Adjust the separation pitch of the test nozzles 521 in the column direction (x-axis direction). The column spacing adjustment unit 522 includes a second cam plate 5221 and a second lifting unit 5222. The second cam plate 5221 is vertically disposed on the main body 523. A plurality of second cam grooves 522ia are formed in the second cam plate 5221. The test nozzles 52 are movably coupled to the second cam grooves 5221a, respectively. The second cam grooves 5221a are respectively inclined at inclination angles different from each other in the direction of the direction axis of the second cam plate. The second cam grooves 5221a are respectively formed such that the distance between the other toward the second cam plate 522 is wider. The second cam groove 52 is called for guiding the test nozzles 521 to be spaced apart or narrowed by the same distance. ~ The second cake unit greets the material of the two cam plates 5221. When the second lifting unit 5222 raises and lowers the second cam plate 5221, the test suction nozzle 521 moves along with the second cam groove 522!a. Thereby, the pitch of the test material 521 is adjusted in the column direction (the x-axis direction). When the W ^ two opening element 5222 lowers the material two cam plate 5221, the test suction nozzle 521 moves with the second cam groove, thereby narrowing the pitch in the column direction (axial direction). At this time, the pitch at which the test nozzle 521 is narrowed in the column direction (four) is the same as the pitch at which the memory card is sleeved in the column direction (the x-axis direction) on the buffer portion 4 and accommodated. Therefore, the distance between the test nozzles 521 is adjusted to be in the first-axis direction (γ (four) direction) and the first in the buffer portion 4. The axis is reversed. Therefore, test her 2 punch 4 to pick up a number of memory cards. In addition, the pick-up device ^ 13 201243353 is sufficient to simultaneously (four) the plurality of counters in the buffer portion 4. For example, when the second lifting unit causes the second cam plate to ascend, the test nozzle cuts in accordance with the movement of the second cam groove, thereby widening the pitch in the column direction & axial direction. Fig. 5 is a view showing a state in which the distance between the test nozzles 521 in the column direction (the axis direction) is widened. At this time, the test nozzle 52 is arranged in the column direction (the x-axis direction), and the distance between the memory card and the memory card in the column direction (X-axis direction) is the same. Therefore, the pitch of the test nozzle 521 is adjusted to be the same as the pitch of the memory card serving unit 51 in the second-axis direction (X-axis direction) along the first-axis direction (the x-axis direction). Therefore, the test picker 52 _ depends on the number of memory cards and the spare unit 51. Further, the test picker 52 can pick up a plurality of tested memory cards from the test unit 51 at a time. Therefore, the 'test picker 52 _ picks up a plurality of memory cards at a time in units of rows and columns' can also be counted as a unit while receiving oil notes and hidden cards. The test sorting machine for a memory card according to the present invention can shorten the time required to transfer the X sequence of the memory card between the buffer unit 4 and the test unit 5. The second lifting unit may be a cylinder type using a hydraulic cylinder or a cylinder, a gear type such as a tooth and a rack, and a small wheel, a ball screw type using a motor and a ball, and the like, using a motor and a pulley and a belt. The second cam plate 5221 is raised and lowered by a belt type or the like using a linear motor. Please refer to "1st picture", "2nd picture" and "6th picture". The buffer part 4 is used for 14 S. 201243353 to carry the δ recall card. The line mechanism is not shown in the "buffer diagram", and the drive mechanism 42 that moves the buffer mechanism 41 toward the first "direction (Y-axis direction)" (in FIG. 6) The buffer mechanism 41 includes a plurality of buffer grooves 411 for accommodating the memory card (not shown in the "figure"). The buffer groove 411 is axially separated from the second axis direction (the x-axis direction). The predetermined spacing is opened and a row is formed. The buffer grooves 411 are spaced apart from each other in the first-axis direction (the x-axis direction), and are spaced apart from each other in the first axial direction (the γ-axis direction) in the (the first drawing). The pitch "the distance between the buffer grooves 411 in the second axial direction (the x-axis direction) is the same as the pitch at which the memory card is accommodated in the second axial direction (X-axis direction) on the supply tray and the storage tray. The drive mechanism 42 moves the buffer mechanism 41 in the first axial direction (γ-axis direction). The drive mechanism 42 moves the buffer mechanism 41 such that the buffer mechanism 41 is located within the tray area Α or the test area Β. The test area Β is an area in which the test unit 51 is provided. The transport picker 3 transports the memory card between the buffer mechanism 41 located in the tray area A and the tray unit 2. The test picker 52 transports the memory card between the buffer mechanism 41 located in the test area β and the test unit 51. Therefore, the transport picker 3 and the test picker 52 can perform the process of transporting the memory card to the buffer mechanisms 41 located at different positions from each other. Therefore, the test sorting machine 1 for a memory card according to the present invention can prevent the pick-up picker 3 and the test picker 52 from colliding with each other in the process of transporting the memory card. 15 201243353 The drive mechanism 42 can be a cylinder type such as a hydraulic cylinder or a cylinder, a ball screw type using a motor, a rack, and a small type, a motor, a ball, and the like, and a belt and a belt. The mode, the motor, and the like move the buffer mechanism 41 in the first axial direction (γ-axis direction). The buffer portion 4 may include a plurality of buffer mechanisms 41 and a plurality of drive mechanisms 42. The buffer mechanism 41 can move toward the first axial direction (γ-axis direction) independently of each other. Therefore, the transport picker 3 can perform the process of transporting the memory card to the buffer mechanism 41 located in the tray area α of the buffer mechanism 41. Further, the test picker & can perform the process of transporting the memory card to the buffer mechanism 41 located in the test area β in the buffer mechanism 41. Since the transport picker 3 and the test picker 52 can simultaneously perform the process of transporting the memory card to the different buffer mechanism 41, the test sorter 1 for a memory card according to the present invention can shorten the test procedure and the sorting process. Time. Referring to "1", "2", "7" and "8", the test unit 5 includes a test unit 51 and a test picker 52. The test unit 51 is connected to the test equipment Τ (shown in "Fig. 7"). The test device is used to test a memory card housed on the test unit 51. The test unit 51 includes a connection pin (not shown) for electrically connecting to the test device. The test unit 51 includes: a test socket 511 for accommodating the memory card (shown in FIG. 8) - a type for connecting the memory card accommodated in the test socket 511 to the test device τ -^ Claw 512 (shown in "Fig. 8"); and a test board 513 equipped with a plurality of test sockets 511 (shown in "Fig. 7"). 201243353 Test socket 511 includes a test slot 5111 for housing a memory card. The test socket 511 is provided with a plurality of test plates 513 so that the test grooves 5111 are formed in a row along the first axis direction (Y-axis direction) and the second axis direction (X-axis direction) at a predetermined interval from each other. The pitch of the test grooves 5111 spaced apart from each other in the first axial direction (γ-axis direction) is the same as the spacing between the buffer grooves 411 (shown in FIG. 6) in the first axial direction (Y-axis direction). . The test socket 511 includes a first socket body 5112 (shown in "Fig. 8") and a second socket body 5113 (shown in "Fig. 8"). The first socket body 5112 is coupled to the second socket body 5113 in a liftable manner. The first socket body 5112 is elastically coupled to the second socket body 5113 by a spring (not shown) as a secret body. When no external force is applied to the first socket main body 5112, the first socket main body 5112 can be raised in accordance with the elastic force of the spring. The test slot is formed on the body of the first socket. The claw 512 is combined with the first socket body 5ii2. The first socket body 5113 is combined with the test board 513. Referring to Fig. 8, a support member 5114, an elastic member 5, and a connecting member 5116 are disposed on the second socket body 5113. The support member 4, for example, is elastically coupled to the second socket body 5113 by the elastic member. The memory card is housed in the test slot and mounted on the support member 5114. The memory card mounted on the support member 5114 is electrically connected to the connecting member 5116. 17 201243353 The elastic member 5115 is located between the support member 5114 and the second socket body Mu. The side of the elastic member 5115 is combined with the support member, and the other side is coupled to the second socket main body 5m. When the claw 512 presses the memory card attached to the support members 51, 14, the elastic member 5 is slid by the support member 4 and is contracted. When the claw 512 is separated from the memory card mounted on the support member 5114, the elastic member 5115 is stretched to cause the support member 5114 to rise. The test socket 5 can contain a plurality of elastic members 5115. One side of the connecting member 5116 is coupled to the supporting member 5114, and the other side is coupled to the second socket main body 5113. One side of the connecting member 5116 is electrically connected to a memory card mounted on the supporting member 5114. The other side of the connecting member 5116 is electrically connected to the test board 513 (shown in "Fig. 7"). Therefore, the δ-remember card mounted on the support member 5114 is electrically connected to the test device τ through the connecting member 5116 and the test board 513. Test socket 511 can include a plurality of connection components 5116. Referring to "Fig. 1", "Fig. 2", "Fig. 7" and "Fig. 8", a claw 512 (shown in Fig. 8) is movably provided in the test socket 5n. When the memory card is housed in the test slot 5111, the claw 512 is rotated to a position where the memory card is not accommodated in the test slot 5111. When the memory card is housed in the test slot 5111, the claw 512 is rotated to a position where the memory card accommodated in the test slot 5111 can be pressed. As the claw 512 presses the memory card housed in the test slot 5111, the memory card housed in the test slot 5111 is connected to the test device 。. A plurality of claws 512 may be coupled to the first socket body 5112. 201243353 The claw 512 is rotatably disposed on the first socket body 5112. The claw 512 can be elastically rotatably coupled to the first socket main body 5112 as a medium by a spring (not shown). When the first socket body 5112 is raised, the claw 512 is rotated to be able to press the memory card housed in the test slot 5111 in accordance with the elastic force of the spring. When the first socket main body 5112 is lowered, the claw is rotated so as not to hinder the position where the memory card is received through the test slot 5111. The test board 513 (shown in "Fig. 7") supports the test socket 511. A plurality of test inserts 511 are disposed on the test board 513. The test insert 5 is formed in a row along the first axis direction (the x-axis direction) and the second axis direction (the x-axis direction), and is disposed on the test board 513, and is disposed on the test board 513 for electrically connecting with the test device τ. Connecting pin (not shown). The test board 513 is electrically connected to the connection member 5H6 of the test socket 511. Therefore, the service equipment τ turns the memory card stored in the test plug π through the connection member and the connecting pin. The test board 513 as a whole may be formed in a rectangular plate shape. Please refer to "1", "2", "7" and "8", and the test picker 52 (shown in "1") is in the buffer unit 4 and the test unit 51. Transfer the memory card between. The test picker 52 transports the Leica to be tested from the buffer portion* to the test material 51. Picking up 52, the memory card 51 is transported to the buffer unit 4. The pick-up picker 52 moves in the (axis direction) and the second axis direction (X-axis direction) in order to carry out the transfer of the memory card. The test picker 52 can be 201243353 to be within the test area B within the test _ (shown in "Fig. 2" t). The pick-up device 52 picks up the memory card to be tested from the buffer portion 4 within the service area B, and then stores the picked-up memory card on the test unit 51. The test pickup 2 picks up the test card from the test unit 51, and then stores the picked-up memory card in the buffer portion 4 located in the crotch region b. The test picker 52 can be lifted and lowered to perform the process of picking up the memory card and the process of accommodating the memory card. The unit 5 can include a drive unit (not _) that moves the test picker 52 toward the first pumping direction (Y-axis direction) and the second axis direction (four) direction, and causes the picker 52 to be tested. The rod drive (4) can be a rainbow type using a hydraulic cylinder or a gas cylinder, a gear type using a motor, a rack and a pinion, a ball screw type such as a _f machine and a ball, a pulley, a belt, and the like. The belt type, the method using a linear motor, etc., make the test picker move and lift. Please refer to "1", "2", "7th" to "10th". The test unit 5 includes a moving claw 512 (a unit 53 in the "Fig. 8") It is shown in "Fig. 7". The opening and closing unit of the magical movable jaw is used to test the slot. In the state where the test slot 5111 is open, the squad 52 can test the amplitude (in Figure 9). It is stored in the test socket 511. In the state in which the test slot 51 is placed, the lion has passed the test ^ memory card 5. 201243353 The opening and closing unit 53 can move the claw 512 to close the test slot 5111. When the test slot 5111 is closed, the 'jaw 512 can press the memory card 收纳 stored in the test socket 511. Therefore, the memory card μ and the test device 收纳 housed in the test socket 511 (shown in "Fig. 7") The connection is performed for testing. The opening and closing unit 53 includes an opening and closing mechanism 531, a first moving mechanism 532 (shown in "Fig. 7"), and a second moving mechanism 533 (shown in "Fig. 7"). The opening and closing mechanism 531 can raise and lower the first socket body 5112. As shown in "Fig. 9" When the opening/closing mechanism 531 causes the first socket main body 5112 to descend, the claw 512 is rotated to open the test slot 5111. As shown in Fig. 10, when the opening and closing mechanism 531 is separated from the first socket main body 5112, the claw 512 Rotating to close the test slot 5111. The opening and closing mechanism 531 may include a plurality of through holes 5311. When the opening and closing mechanism 531 lowers the first socket body 5112, the through holes 5311 are respectively located at positions corresponding to the test slots 5111. Thus 'opening and closing mechanism In a state where the first socket main body 5112 is lowered, the test picker 52 can receive the memory card μ through the through hole 5311 in the test socket 511. Further, in a state where the opening and closing mechanism 531 causes the first socket main body 5112 to descend, The test picker 52 can pick up the memory cassette from the test socket 511 through the through hole 5311. The opening and closing mechanism 531 as a whole can be formed in a rectangular plate shape. The first moving mechanism 532 (shown in "Fig. 7") is used for lifting The opening and closing mechanism 531. When the first moving mechanism 532 causes the opening and closing mechanism 531 to descend, the opening and closing mechanism 531 causes the first socket main body 5112 to descend. Therefore, the claw 512 rotates. In the open test slot 5111. When the first moving mechanism 532 causes the opening and closing mechanism 531 to rise, the opening and closing 21 201243353 cylinder type, the ΓΓ ΓΓ 532 咖 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The mode of the motor, etc., causes the opening and closing mechanism 53i to move up and down. The second moving mechanism 533 (in the "7th =; - _ shift -:: mechanism milk moves in the test unit 51 ° (, axis direction), in order to open and close 乂 (four) one select a part Therefore, in the test early U-part_cut_test_test, the test picker 52 can perform the process of storing the needle M for other job orders μ or pick up the memory from other test units. The process of the card. Therefore, the memory card according to the present invention is used for the test division i, and an opening/closing mechanism can be used in common for the plurality of test units 51, thereby reducing the number of the opening and closing mechanisms 531. Therefore, the present invention relates to a test sorting machine for a memory card, which reduces the material cost and can reduce the manufacturing cost of the entire device. A first moving mechanism Μ2 may be coupled to the second moving surface 533. The second moving mechanism 533 causes the first moving mechanism to move in the first axial direction (γ-axis direction) so that the opening and closing mechanism 53i moves in the first axial direction (γ-axis direction). The second moving mechanism 533 can be a cylinder type using a hydraulic cylinder or an air cylinder, a gear type using a 22 201243353 motor, a rack and a pinion gear, a bead screw type using a motor and a ball wire 4, and the like, using a motor and The pulley type, the belt type of the belt, etc., the linear motion w or the like, so that the first moving surface 532 is oriented in the first axial direction (the γ-axis direction is moved. Here, please refer to "Fig. 2" and "Fig. 7" The test unit 5 can be provided with a plurality of test units 51 in the first test area Β1 (shown in "Fig. 2") and the second test area Β2 (shown in "Fig. 2"). The first test area Β1 and the second test area are spaced apart by a predetermined interval in the direction of the working axis (the x-axis direction). At this time, the buffer unit 4 includes: - the first buffer mechanism 4U (in "Fig. 2" Means) for transporting the memory card between the tray area a and the first test area 61; and a second buffer mechanism 41b (shown in "Fig. 2") for use in the tray area A and The memory card is transported between the two test areas B2. The test part 5 includes: a first a test picker 52a (shown in "Fig. 2") for transporting a memory card between the test unit 51 disposed within the first test area B1 and the first buffer mechanism 41a; and a second test pick The hopper 52b (shown in "Fig. 2") transfers the memory card between the test unit 51 and the second buffer mechanism 41b disposed in the second test area B2. Therefore, the memory card according to the present invention The test sorter 1 can have the following effects. First, the test sorter 1 for a memory card according to the present invention is disposed on the first test area B1 and the second test area B2 with respect to one tray portion 2', respectively. The test unit 51 can perform the test process for the memory card separately. Therefore, even the test unit 51 disposed within the first 23 201243353 test area B1 or disposed within the second test area B2 The test unit 51 of the present invention may also use the test unit 51 disposed in the first test area B1 or in the second test area B2. Some test units 51 are not Any one of the malfunctions performs a test process on the memory card. Therefore, the test sorter 1 for a memory card according to the present invention can continuously perform a test process on the memory card, thereby enabling execution of more memory cards in a short time. Second, the test sorting machine 1 for a memory card according to the present invention is capable of executing a process of transporting a memory card with respect to one tray portion 2' first buffer mechanism 41a and first test picker 52a. Independently, the second buffer mechanism 41b and the second test picker 5 can perform the process of transporting the memory card. Therefore, even in the first buffer mechanism 41a and the first test picker 52a or the second buffer mechanism 41b and the second Any one of the test pickers 52b malfunctions, and the test sorter i for the memory card according to the present invention can also be utilized in the first buffer mechanism 4la and the first test picker 52a or the second buffer mechanism 41b and the first Any one of the test pickers 52b that has not malfunctioned performs a transport process on the memory card. Therefore, the memory card_test sorter i according to the present invention can continuously execute the process of transporting the memory card between the tray unit 2, the buffer unit 4, and the test unit 5, thereby enabling execution of more memory cards in a short time. Test procedure. The time required for the third 'test device Τ test memory card is compared to that required when the transport picker 3 and the test picker 52 transfer the memory card between the tray portion 2, the buffer portion and the test portion $ long time. So, for a tray part 2, if only

24 201243353 具有在第一測試區域B1之内配設有的測試單元51或 ▲ ^ 一測試 區域Β2之内配設有的測試單元中的某一個時，直至測試設備τ 對記憶卡的測試結束為止，將發生移動拾料器3與測試拾料器幻 待機的時間。 本發明涉及的記憶卡用測試分選機1，第一緩衝機構41&、在 第一測試區域B1之内配設有的測試點單元51以及第一測試拾料 器52a可組成一套系統，以執行在托盤部2與測試部5之間搬送 a己憶卡的工序及測試記憶卡的工序。此外，本發明涉及的記情卡 用測試分選機1 ’第二緩衝機構42a、在第二測試區域B2之内配 設有的測試點單元51以及第二測試拾料器52b可組成一套系統， 以執行在托盤部2與測試部5之間搬送記憶卡的工序及測試記憶 卡之工序。所以’本發明涉及的記憶卡用測試分選機i，能夠縮短 搬送拾料器3細試拾料器52的待機時間。因此，本發明涉及的 記憶卡賴齡選機1賴在短時_對更多的記憶卡執行測試 工序以及分類工序。 請參閱「第2圖」及「第7圖」，在第一測試區域m之内配 設有沿第二轴方向（X軸方向）相隔開一預定間距的測試板513。 因此，測試單元51以沿第一軸方向（γ軸方向）與第二軸方向 軸方向）形成行列的方式配設於第一測試區域3丨之内。第一測試 拾料器52a在第一測試區域B1之内移動。第一測試拾料器52a在 第緩衝機構41a及配設於第一測試區域則之内的測試單元51 25 201243353 之間搬送記憶卡。緩衝部4包含複數個第—緩衝機構化。第一緩 衝機構化沿第1方向（X軸方向）相_定間距設置。緩 衝部4包含複數個使得第一緩衝機構4ia朝向第一轴方向以軸 方向）移動的第-驅動機構•第一驅動機構似使得第一緩衝 機構41a在托魅μ與第一測試區域則之間移♦搬送拾料器 3在托盤部2與位於_區域Α之内的第一緩衝機構化之間搬 送記憶卡。第-測試拾料器52a在位於第一測試區域之内的測 試單元51與位於第一測試區域m之内的第一緩衝機構化之間 搬送記憶卡。第-測試拾料器52a包含：一第一測試吸嘴（未圖 示），用於吸附記憶卡；以及第—列間距調節單元（未圖示），調 節第-測試吸嘴的列方向（X轴方向）間距。在第—測試區域則 之内配設有的各測試板513上配設有開閉單元53。 請參閱「第2圖」及「第7圖」，在第二測試區域B2之内沿 第二軸方向（X軸方向）相隔開預定間距配設有測試板5⑶因此， 測試單元51以沿第—軸方向（γ轴方向）與第二轴方向（χ轴方 向）形成行觸方式配設於第二測試區域Β2之…第二測試拾料 器52b在第二測試區域Β2之内移動嚆二測試拾料器奶在第二 缓衝機構41b及配設於第二測試區域Β2之内的測試單元^之間 搬送記憶卡。緩衝部4包含複數個第二緩衝機構仙 齢 構仙沿第二軸方向（絲方向）相隔開之間距設置。緩衝 部4包含複數個使得第二緩衝機構仙朝向第—轴方向（γ轴方 26 201243353 向）移動的第二驅動機構42b。第二驅動機構42b使得第二緩衝機 構41b在托舰域A與第二測試區域B2之間移動。搬送拾料器3 在托盤部2與位於托盤區域A之内的第二緩衝機構仙之間搬送 記憶卡。第二測試拾料器52b在位於第二測試區域B2之内的測試 單TC51與位於第二測試區域扣之内的第二緩衝機構仙之間搬 送記憶卡。第二測試拾料器52b包含：一第二測試吸嘴（未圖示）， 用於吸附記憶卡；以及—第二列間距調節單元（未圖示），調節第 -測試吸嘴的列方向（X軸方向）間距。配設於第二測試區域拉 之内的各測試板513上配設有開閉單元53。 在此，記憶卡可按產品資訊分別收納於不同的供給托盤上而 供給至托盤部2。該產品資訊可以包含記憶卡交貨商資訊、記憶卡 類型以及記憶卡規格中的至少一個。在托盤部2中供給托盤區分 供給記憶卡’即’優紐具有第—產品#訊的記憶卡自托盤部2 搬送至測試部5，之後將具有第二產品資訊的記憶卡自托盤部2 搬送至測試部5。因此，可以優先將具有第一產品資訊的記憶卡根 據測試結果進行等級區分並收納於收納托盤，之後將具有第二產 品資訊的記憶卡根據測試結果進行等級區分並收納於收納托盤。 具有第一產品資訊的記憶卡和具有第二產品資訊的記憶卡收納於 不同的收納托盤之内，以便能夠按收納托盤區分開來交貨。在此， 如果測試具有第一產品資訊的記憶卡所需的時間，相比較於測試 具有第一產品資訊的記憶卡所需的時間長時，在緩衝部4上可能 27 201243353 混合收納具有第-產品資訊的記憶卡與具有第二產品資訊的記憶 卡。因此’存在具有第—產品資_記鮮與具有第二產品資訊 的記憶卡混合交貨關題。為了解決這些_，本發明涉及的記 憶卡用測試分選機1包含—讀取部6 (在「第u圖」中表示出）， 用於獲得記憶卡Μ的產品資訊。 請參閱「第11圖」，讀取部6讀取在記憶卡Μ上形成的條碼 (未圖示）’從而獲得織卡Μ的產品f訊。讀取部6可以將獲 得的產品資訊提供給搬送拾料H 3。搬送拾料^ 3可以糊產品資 訊將收納於緩衝部4上的經戦的記憶卡M搬送至收納托盤上。 例如’搬送拾料ϋ 3可以優先將在細彳試的魄卡m中具有 第-產品資訊的所有記憶收納於收_盤上，之後將具有第 二產品資訊的記憶卡M收納於收納托盤上^本發明涉及的記憶卡 用測試分選機i包含-存儲部（未圖示），用於存儲提供給托盤部 2的記憶卡的產品資城產品纽_朗產品數量。搬送拾料器 3可以優先將在_試的記憶卡M中具有第―產品資訊的輯卡 Μ自緩衝部4搬送至收納托盤上，以便搬送至收納托盤上的具有 第-產品資訊的記憶卡Μ的數量達到存儲於存儲部中的具有第一 產品資訊的記憶卡Μ的數量。當具有第—產品資訊_有記憶卡 Μ根據測試結果按等㈣分而收納於㈣托盤上時，該收納托盤 被空置的收納托盤f換。之後，搬送拾料^ 3將具有第二產品資 訊的記憶卡M收納至被更換敝納托盤上。因此，本發明涉:的24 201243353 When there is one of the test unit 51 or ▲ ^ within the test area Β2 disposed in the first test area B1, until the test device τ ends the test of the memory card The time when the picker 3 and the test picker are in standby will occur. The test card sorting machine 1 for a memory card according to the present invention, the first buffer mechanism 41&, the test point unit 51 disposed in the first test area B1, and the first test picker 52a may constitute a system. The process of transporting a card between the tray unit 2 and the test unit 5 and the process of testing the memory card are performed. In addition, the present invention relates to a test card sorting machine 1 'the second buffer mechanism 42a, a test point unit 51 disposed within the second test area B2, and a second test picker 52b. The system performs a process of transferring a memory card between the tray unit 2 and the test unit 5 and a process of testing a memory card. Therefore, the test sorting machine i for a memory card according to the present invention can shorten the standby time of the pick-up picker 3 fine sample picker 52. Therefore, the memory card sorting machine 1 according to the present invention performs the test process and the sorting process for a short time_to more memory cards. Referring to "Fig. 2" and "Fig. 7", a test plate 513 spaced apart by a predetermined interval in the second axial direction (X-axis direction) is disposed in the first test area m. Therefore, the test unit 51 is disposed within the first test region 3A so as to form a matrix in the first axial direction (γ-axis direction) and the second axial direction axial direction. The first test picker 52a moves within the first test area B1. The first test picker 52a transports the memory card between the first buffer mechanism 41a and the test unit 51 25 201243353 disposed within the first test area. The buffer unit 4 includes a plurality of first buffering mechanisms. The first buffer mechanism is set in the first direction (X-axis direction) at a constant pitch. The buffer portion 4 includes a plurality of first drive mechanisms that move the first buffer mechanism 4ia in the axial direction in the first axial direction. The first drive mechanism is such that the first buffer mechanism 41a is in the first test area and the first test area. The shifting ♦ transport picker 3 transports the memory card between the tray unit 2 and the first buffer mechanism located in the _ area 。. The first-test picker 52a transports the memory card between the test unit 51 located within the first test area and the first buffer mechanism located within the first test area m. The first-test picker 52a includes: a first test nozzle (not shown) for absorbing the memory card; and a first column spacing adjusting unit (not shown) for adjusting the column direction of the first-test nozzle ( X-axis direction) spacing. An opening and closing unit 53 is disposed on each of the test boards 513 disposed in the first test area. Referring to "Fig. 2" and "Fig. 7", the test board 5 (3) is disposed at a predetermined interval in the second axial direction (X-axis direction) within the second test area B2. Therefore, the test unit 51 is along the - The axial direction (γ axis direction) and the second axis direction (χ axis direction) are arranged in a line contact manner in the second test area Β 2... The second test picker 52b moves within the second test area Β2 The test picker milk transfers the memory card between the second buffer mechanism 41b and the test unit ^ disposed in the second test area Β2. The buffer portion 4 includes a plurality of second buffer mechanisms, which are disposed at a distance between the second axis directions (wire directions). The buffer portion 4 includes a plurality of second drive mechanisms 42b that move the second buffer mechanism toward the first-axis direction (the γ-axis side 26 201243353 direction). The second drive mechanism 42b causes the second buffer mechanism 41b to move between the carrier domain A and the second test zone B2. The transport picker 3 transports the memory card between the tray unit 2 and the second buffer mechanism located in the tray area A. The second test picker 52b transports the memory card between the test sheet TC51 located within the second test area B2 and the second buffer mechanism located within the second test area buckle. The second test picker 52b includes: a second test nozzle (not shown) for absorbing the memory card; and a second column pitch adjusting unit (not shown) for adjusting the column direction of the first test nozzle (X-axis direction) spacing. An opening and closing unit 53 is disposed on each of the test boards 513 disposed in the second test area. Here, the memory card can be stored in the tray unit 2 by being stored in different supply trays according to product information. The product information may include at least one of a memory card vendor information, a memory card type, and a memory card specification. In the tray unit 2, the supply tray is supplied to the memory card, that is, the memory card having the first product is transmitted from the tray unit 2 to the test unit 5, and then the memory card having the second product information is transported from the tray unit 2. To the test section 5. Therefore, the memory card having the first product information can be preferentially classified and stored in the storage tray based on the test result, and then the memory card having the second product information can be classified and stored in the storage tray according to the test result. The memory card having the first product information and the memory card having the second product information are housed in different storage trays so as to be able to be delivered separately by the storage tray. Here, if the time required to test the memory card having the first product information is longer than the time required to test the memory card having the first product information, the buffer portion 4 may be 27 201243353 mixed storage having the first - Memory card for product information and memory card with second product information. Therefore, there is a hybrid delivery issue with a memory card with the first product and the second product information. In order to solve these problems, the test sorter 1 for a memory card according to the present invention includes a reading unit 6 (shown in "u-tu") for obtaining product information of a memory card. Referring to Fig. 11, the reading unit 6 reads a bar code (not shown) formed on the memory card 从而 to obtain a product of the woven card. The reading unit 6 can supply the obtained product information to the transport pickup H 3 . The conveyance pick-up 3 can convey the warp memory card M stored in the buffer unit 4 to the storage tray. For example, the 'receiving pick-up ϋ 3 can preferentially store all the memories having the first-product information in the fine-tested Leica m on the receiving tray, and then storing the memory card M having the second product information on the storage tray. The test sorter i for a memory card according to the present invention includes a storage unit (not shown) for storing the number of product products of the memory card supplied to the tray unit 2. The transport picker 3 can preferentially transport the card having the first product information in the memory card M of the test to the storage tray, and transfer the memory card having the first product information to the storage tray. The number of Μ reaches the number of memory cards having the first product information stored in the storage unit. When the first product information_memory card is stored in the (four) tray according to the test result, the storage tray is replaced by the empty storage tray f. Thereafter, the transport pickup 3 stores the memory card M having the second product information on the replaced cassette. Therefore, the present invention relates to:

28 201243353 S己憶卡用測試分選機1可以將彼此具有不同產品資訊的記憶卡M 按收納托盤區分開來發貨。 凊參閱「第11圖」，讀取部6可以配設於搬送拾料器3上。 搬送拾料器3拾取收納於緩衝部4上的記憶卡M之前，為了使得 讀取部6自收納於緩衝部4上的記憶卡M中獲得產品資訊而進行 移動。在搬送拾料器3上可以配設有與在緩衝部4上沿第二轴方 向（X軸方向）收納的記憶的數量相同數量的讀取部6。例 如，如「第11圖」所示，可以在緩衝部4上沿第二轴方向（乂轴 方向）各收納有八個記憶卡Μ，而且在搬送拾料器3上沿第二轴 方向（X軸方向）配财人個讀取部6。因此，當搬送拾料器3 朝向第-軸方向（Υ軸方向)移動時，讀取部6能夠獲得在緩衝 部4上以沿第-軸方向（γ轴方向）與第二軸方向（χ轴方向） 形成行列的方式被收_記憶卡崎具有的產品魏。讀取部6 能夠以自移動吸嘴31沿第-軸方向（γ軸方向）相隔開預定之間 距的方式配設於移動拾料器3上。 請參閱「第U圖」，本發明涉及的記憶卡用測試分選機【包 含一圖像部7，用於對記憶卡厘執行外觀檢查。 圖像部7可以拍攝位於職單元51上的峨卡μ從而獲得 $關記憶卡Μ的檢查圖像。圖像部7透過將獲得的檢查圖像與標 準圖像進行比較’從樣行對織卡Μ的外觀檢查鬚標準圖 像為正常狀態下的記憶卡Μ _像。糊像部7中存儲有所述標 29 201243353 準圖像®像部7可以包含電荷輕合元件（Charge c〇upied如心， CCD)相機’用於拍攝位於測試單元51上的記憶卡％。圖像部7 也可以拍攝設在測試插口511中的卡爪512 (在「第8圖」中表示 出）從而獲得有關卡爪512的檢查圖像。因此，圖像部7也可以 執仃有關卡爪M2❾損傷與否的外觀檢查。圖像部7也可以獲得 匕3卡爪7與卡爪512所按壓的記憶卡μ的檢查圖像。 12圖」，圖像部7可以配設於測試拾料器a上 測試拾料器52在拾取收納於測試單元51上的記憶卡μ之前，无 行移動以使得圖像部7自收納於職單元51上的記憶卡Μ中獲 得檢查圖像。在戦拾· 52上可㈣設有與在測試單元Μ上 沿第二軸方向（X轴方向）收納的記憶卡Μ的數量相同數量的撞 像部7。例如，如「第12圖」所示，可以在測試單元51上沿第- 軸方向（Χ轴方向）各收納有八個記憶卡Μ，而且在測試拾料器 52上沿第二軸方向（χ軸方向）配設有人_賴像部7。 當測試拾 52朝向第1方向（γ軸方向）移動時，圖像部7 能夠獲得在戦單元51沿第-_ (Υ_)與第二轴方向 (X軸方向）嶋胸級_記針_咖 7以自物嘴5 w拘綱預定^ =2=输物2上。t物5 &麵個測辦料 ° ’ a以在測試拾料器52分別配設有圖像部7。 可以將有敝奸Μ驗纽秘供賴秘 3。搬秘料 201243353 器3根據圖像部7提供的檢查結果將記憶卡M區分收納在收納托 盤上。 請參閱「第13圖」及「第14圖」，本發明涉及的記憶卡用測 試分選機1包含一感測器部8，用於獲得位於測試單元51上的記 憶卡Μ的狀態資訊。 感測器部8能夠獲得收納於測試單元51上的記憶卡Μ的狀 態資訊。該狀態資訊可以是在測試單元51上收納有兩個以上彼此 結合的記憶卡Μ的狀態，記憶卡Μ在測試單元51上傾斜收納的 狀態等。如「第14圖」所示，當在測試單元51上收納有兩個以 上彼此結合的記憶卡IV[時，測試拾料器52 (在「第13圖」中表 示出）可以將該記憶卡Μ自測試插口 511中拾取並搬送至緩衝部 4(在「第1圖」中表示出），以防止對該記憶卡％執行測試工序。 搬送拾料⑸賴將_以上彼此結合的蹄收納於單獨的 收納托盤上。賴未圖示，當記憶卡厘在峨插口 51丨中被傾斜 收納時，測試拾料器52可以拾取該記憶卡Μ之後，重新收納至 測試插口 511中。 ;么請參閱「第13圖」及「第14圖」，感測器部8可以配設於測 試拾料器52 _L。測試拾料器52在對收納於測試單元5ι上的記憶 卡Μ執行測試工序之前，可進行義讀感測轉8獲得有關收 納於測試單元51上的記憶卡Μ雜態資訊。在測試拾料器52上 可以配設有與麵試單元Μ上沿第二軸方向（χ_向）收納的 31 201243353 β己隐卡Μ祕量相隨量賊湘部 所述測試單元51上沿第二轴方向 =’如圖U所示，在 卡Μ，而在測試 向）各收納有八個記憶 有八料：麵方向（χ軸方向）配設 J器。Ρ8。因此，當測試拾料器5 時’感__獲得卿二:::: 的城卡Μ向）與第—財向（X轴方向）形成行列並被收納 的”隐卡Μ的狀態資訊。感測器部8自測試吸物朝向第一轴 方向（Υ财向）祕_定之間舰設_試拾湘52上。當 測試部5包含複數個測試拾料器52時，可以在測試拾料器^ 別設置感測器部卜感測器部8可以將有關記憶卡Μ的狀態資訊 提供給測試拾料器52。 凊參閱「第13圖」及「第14圖」’感測器部§可以包含：一 發光感測器81 (在「第14圖」中表示出），朝向位於測試單元51 上的記憶卡Μ發射光；一受光感測器82 (在「第14圖」中表示 出），用於接收發光感測器81發射的光；以及一檢測單元83，利 用受光感測器接受的光而獲得位於測試單元51上的記憶卡Μ的 狀態資訊。 發光感測器81與受光感測器82可以彼此相隔開一預定之間 距設置。發光感測器81發射的光可以透過記憶卡Μ反射後由受 光感測器82接受。檢測單元82可以利用發光感測器81發射的光 透過受光感測器82接受所需的時間以獲得記憶卡Μ的狀態資28 201243353 S test card sorting machine 1 can separate the memory cards M with different product information from each other by the storage tray. Referring to "Fig. 11", the reading unit 6 can be disposed on the transport picker 3. Before the pick-up picker 3 picks up the memory card M stored in the buffer unit 4, the pickup unit 6 moves the product information obtained from the memory card M stored in the buffer unit 4. The transport picker 3 can be provided with the same number of reading portions 6 as the number of memories stored in the buffer portion 4 in the second axial direction (X-axis direction). For example, as shown in FIG. 11, eight memory cassettes can be accommodated in the buffer portion 4 in the second axial direction (the x-axis direction), and the transport picker 3 can be along the second axis direction ( The X-axis direction is associated with the financial person reading unit 6. Therefore, when the conveyance picker 3 moves in the first-axis direction (the z-axis direction), the reading portion 6 can obtain the buffer portion 4 in the first-axis direction (γ-axis direction) and the second-axis direction (χ Axis direction) The way of forming the ranks is received. The reading unit 6 can be disposed on the moving picker 3 so as to be spaced apart from the moving axis 31 by a predetermined distance in the first-axis direction (γ-axis direction). Please refer to the "U-picture". The test sorting machine for a memory card according to the present invention [includes an image portion 7 for performing visual inspection on a memory card. The image portion 7 can take a Leica μ on the job unit 51 to obtain an inspection image of the OFF memory card. The image unit 7 compares the obtained inspection image with the standard image. The appearance of the woven cassette from the sample line is checked by the standard image as a memory card 正常 image in a normal state. The target image is stored in the paste portion 7. 201243353 The quasi-image® image portion 7 may include a charge-clamping device (CCD) camera for capturing the memory card % located on the test unit 51. The image portion 7 can also capture the claw 512 (shown in Fig. 8) provided in the test socket 511 to obtain an inspection image relating to the claw 512. Therefore, the image portion 7 can also perform an appearance check on whether or not the claw M2 is damaged. The image portion 7 can also obtain an inspection image of the memory card μ pressed by the 卡3 claw 7 and the claw 512. 12, the image portion 7 can be disposed on the test picker a. Before the pick-up picker 52 picks up the memory card μ stored on the test unit 51, there is no movement to make the image portion 7 self-retained. An inspection image is obtained in the memory cassette on unit 51. On the pickup 52, (4) the same number of the image pickup portions 7 as the number of the memory cassettes accommodated in the second axis direction (X-axis direction) on the test unit 设有 are provided. For example, as shown in Fig. 12, eight memory cassettes may be accommodated in the first-axis direction (the x-axis direction) on the test unit 51, and in the second axis direction on the test picker 52 ( In the direction of the x-axis, there is a person_photograph unit 7. When the test pickup 52 moves toward the first direction (the γ-axis direction), the image portion 7 can obtain the chest level _ the needle _ along the __ (Υ_) and the second axis direction (X-axis direction) in the 戦 unit 51. The coffee 7 is scheduled to be closed by the self-object 5 w. ^ = 2 = the input 2 is on. The object 5 & surface test material ° ' a is provided with the image portion 7 in the test picker 52. There will be a smuggling test for the secrets of the secret. The secret material 201243353 3 stores the memory card M in a storage tray in accordance with the inspection result provided by the image unit 7. Referring to "Fig. 13" and "Fig. 14", the test card sorting machine 1 for a memory card according to the present invention includes a sensor portion 8 for obtaining status information of a memory card located on the test unit 51. The sensor unit 8 can obtain status information of the memory cassette stored in the test unit 51. The status information may be a state in which two or more memory cards are coupled to each other on the test unit 51, a state in which the memory card is tilted and stored on the test unit 51, and the like. As shown in Fig. 14, when two or more memory cards IV combined with each other are stored in the test unit 51, the test picker 52 (shown in "Fig. 13") can hold the memory card. The Μ is picked up from the test socket 511 and transported to the buffer unit 4 (shown in "Fig. 1") to prevent the test process from being performed on the memory card %. The transporting and picking up (5) is carried out on the separate storage trays. Although not shown, when the memory card is tilted and stored in the port 51, the test picker 52 can pick up the memory card and re-storage it into the test socket 511. Please refer to "Fig. 13" and "Fig. 14", and the sensor unit 8 can be disposed in the test picker 52_L. The test picker 52 can perform the sense read turn 8 to obtain the memory card miscellaneous information received on the test unit 51 before performing the test process on the memory card stored on the test unit 5i. The test picker 52 may be provided with an upper face along the second axis direction (χ_direction) of the interview unit, and the above-mentioned test unit 51 is on the edge of the test unit 51. The second axis direction = 'As shown in Fig. U, in the cassette, and in the test direction, each of the eight memories has eight materials: the surface direction (the axis direction) is equipped with a J device. Ρ 8. Therefore, when the picker 5 is tested, the status information of the "hidden card" which is formed in the ranks of the first fiscal position (the X-axis direction) is stored. The sensor portion 8 is from the test suction toward the first axis direction (Υ财向) _ _ between the ship _ test Xiang 52. When the test portion 5 contains a plurality of test pickers 52, can be tested in the pick The sensor unit 8 can provide status information about the memory card to the test picker 52. 凊 Refer to "Fig. 13" and "14" "Sensor section § It may include: a light-emitting sensor 81 (shown in "Fig. 14") that emits light toward the memory card located on the test unit 51; a light-receiving sensor 82 (shown in "Fig. 14") ) for receiving light emitted by the light-emitting sensor 81; and a detecting unit 83 for obtaining state information of the memory card located on the test unit 51 by using the light received by the light sensor. The light-emitting sensor 81 and the light-receiving sensor 82 may be spaced apart from each other by a predetermined distance. The light emitted by the illuminating sensor 81 can be reflected by the photosensor 82 after being reflected by the memory card. The detecting unit 82 can use the light emitted by the light-emitting sensor 81 to pass through the light-receiving sensor 82 to receive the required time to obtain the state of the memory card.

32 201243353 訊。當測試插口 511中收納有兩個以上彼此結合的記憶卡厘時， 與在測試插口 511中收納有一個記憶卡μ時相比，受光感測器82 接受來自發光感測器81發射的光時所需的時間減少。由此，檢測 單元83可以確認記憶卡Μ處於兩個以上彼此結合而收納於測試 插口 511中的狀態。檢測單元83也可以利用受光感測器82接收 到的光量以獲得有關收納於測試插口 511中的記憶卡μ的狀態資 訊。當記憶卡Μ傾斜收納於測試插口 511中時，與記憶卡Μ正常 收納於測試插口 511中時相比，受光感測器82接受的來自發光感 測器81發射的光的量減少。由此，檢測單元耵可以確認記憶卡 Μ處於傾斜收納在測試插口 511中的狀態。檢測單元幻可以將有 關&己憶卡Μ的狀態資訊提供給測試拾料器52。 以上說明的本發明並不限定於上述實施例及附圖，對於本發 明所屬技躺_普職術人貞來說，在不超丨本發明的技術思 想的範圍内，可以進行多種替換、變形和變更。 【圖式簡單說明】 第1圖係為本發明涉及的記憶卡用測試分選機之概略俯視 圖； 第2圖係制於說明本發明涉及的托盤區域及測試區域之概 念俯視圖； 第3圖及第4圖係為本發明涉及的搬送拾料器之概略侧視圖； 第5圖係為本發明涉及的測試拾料器之概略立體圖； 33 201243353 第6圖係為本發明涉及的緩衝部之概略俯視圖； 第7圖係為本發明涉及的測試單元與開閉單元之概略立體 圖； 第8圖至第1〇圓係為為了說明本發明涉及的測試單元與開閉 單元的運作關係的以第7圖的線為基準之概略側剖視圖； 第Π圖係為用於說明本發明涉及的一讀取部之概念俯視圖； 第12圖係為用於說明本發明涉及的一圖像部之概念俯視圖； 第13圖係為用於說明本發明涉及的一感測器部之概念俯視 圖；以及 第14圖係為用於說明本發明的感測器部之運作關係之概略 側剖視圖。 【主要元件符號說明】 1 記憶卡用測試分選機 2 托盤部 3 搬送拾料器 4 緩衝部 5 測試部 6 讀取部 7 圖像部 8 感測器部 21 裝載堆裝箱32 201243353 News. When the test socket 511 accommodates two or more memory cards combined with each other, the light-receiving sensor 82 receives the light emitted from the light-emitting sensor 81 as compared with when the memory card μ is accommodated in the test socket 511. The time required is reduced. Thereby, the detecting unit 83 can confirm that the memory cassette is in a state in which two or more are coupled to each other and housed in the test socket 511. The detecting unit 83 can also use the amount of light received by the light receiving sensor 82 to obtain status information about the memory card μ accommodated in the test socket 511. When the memory card is tilted and stored in the test socket 511, the amount of light emitted from the light sensor 81 received by the light sensor 82 is reduced as compared with when the memory card is normally stored in the test socket 511. Thereby, the detecting unit 耵 can confirm that the memory card Μ is in a state of being stored in the test socket 511 obliquely. The detection unit illusion can provide status information about & recall to the test picker 52. The present invention described above is not limited to the above-described embodiments and the accompanying drawings, and various alternatives and modifications can be made without departing from the technical spirit of the present invention. And changes. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic plan view of a test sorter for a memory card according to the present invention; FIG. 2 is a conceptual plan view illustrating a tray area and a test area according to the present invention; 4 is a schematic side view of a transport picker according to the present invention; Fig. 5 is a schematic perspective view of a test picker according to the present invention; 33 201243353 Fig. 6 is a schematic view of a buffer portion according to the present invention FIG. 7 is a schematic perspective view of a test unit and an opening and closing unit according to the present invention; FIG. 8 to FIG. 1 are diagrams for explaining the operational relationship between the test unit and the opening and closing unit according to the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 12 is a conceptual plan view for explaining a reading unit according to the present invention; FIG. 12 is a conceptual plan view for explaining an image portion according to the present invention; The figure is a conceptual plan view for explaining a sensor unit according to the present invention; and FIG. 14 is a schematic side cross-sectional view for explaining the operational relationship of the sensor unit of the present invention. [Description of main component symbols] 1 Test sorter for memory card 2 Pallet section 3 Pickup picker 4 Buffer section 5 Test section 6 Reader section 7 Image section 8 Sensor section 21 Loading stacker

34 201243353 22 卸載堆裝箱 31 搬送吸嘴 32 行間距調節單元 33 主體 41 緩衝機構 41a 第一緩衝機構 41b 第二緩衝機構 42 驅動機構 42a 第二緩衝機構 42b 第二驅動機構 51 測試單元 52 測試拾料器 52a 第一測試拾料器 52b 第二測試拾料 53 開閉單元 81 發光感測器 82 受光感測器 83 檢測單元 321 第一凸輪板 322 第一升降單元 411 緩衝槽 35 201243353 511 測試插口 512 卡爪 513 測試板 521 測試吸嘴 522 列間距調節單元 523 主體 531 開閉機構 532 第一移動機構 533 第二移動機構 3211 第一凸輪槽 5111 測試槽 5112 第一插口主體 5113 第二插口主體 5114 支承部件 5115 彈性部件 5116 連接部件 5221 第二凸輪板 5221a 第二凸輪槽 5222 第二升降單元 5311 貫穿孔 A 托盤區域 36 201243353 B 測試區域 T 測試設備 Μ 記憶卡 B1 第一測試區域 Β2 第二測試區域 3734 201243353 22 Unloading stack 31 Transfer nozzle 32 Line spacing adjustment unit 33 Main body 41 Buffer mechanism 41a First buffer mechanism 41b Second buffer mechanism 42 Drive mechanism 42a Second buffer mechanism 42b Second drive mechanism 51 Test unit 52 Test pick Feeder 52a First test picker 52b Second test pick-up 53 Opening and closing unit 81 Light-emitting sensor 82 Light-receiving sensor 83 Detection unit 321 First cam plate 322 First lifting unit 411 Buffer slot 35 201243353 511 Test socket 512 Claw 513 Test board 521 Test nozzle 522 Column pitch adjustment unit 523 Main body 531 Opening and closing mechanism 532 First moving mechanism 533 Second moving mechanism 3211 First cam groove 5111 Test slot 5112 First socket body 5113 Second socket body 5114 Supporting member 5115 Elastic member 5116 Connecting member 5221 Second cam plate 5221a Second cam groove 5222 Second lifting unit 5311 Through hole A Pallet area 36 201243353 B Test area T Test equipment 记忆 Memory card B1 First test area Β 2 Second test area 37

Claims (1)

201243353 七、申請專利範圍： 1. 一種記憶卡用測試分選機’係包含： 一托盤部，係位於一托盤區域之内，該托盤區域安玫有用 於收納待測試的記憶卡之一供給托盤，以及根據測試結果分類 收納經測試的記憶卡的複數個收納托盤； 一測試部，係包含用於測試記憶卡的複數個測試單元，在 進行測试s己憶卡的測试工序之一第一測試區域與一第二測試 區域之内分別配設有該等測試單元； 一緩衝部，係配設於在該托盤部與該測試部之間，包含一 第一緩衝機構及一第二緩衝機構，該第一緩衝機構在該托盤區 域與該第-測試區域之間移動以搬運記憶卡，該第二緩衝機構 在該托盤區域與該第二測試區域之間移動以搬運記憶卡；以及 一搬送拾料器’係在該第一緩衝機構與該托盤部之間搬送 S己憶卡’在該第二緩衝機構與該托盤部之間搬送記憶卡； 該測試部包含在該等測試單元與該緩衝部之間搬送記憶 卡的複數個測試拾料器，其中該測試部包含一第一測試拾料器 以及s—測試拾㈣’該第—測試拾料^在設置於該第一測 試區域之内的顺單讀料—緩衝機構之眺送記憶卡，該 第則試才。料器在设置於該第二測試區域之内的測試單元與 該第二緩衝機構之間搬送記憶卡。 如青长項第1項所述之記憶卡_試分賴，其中 38 201243353 該搬送拾料純含用於_記憶卡的複數個搬送吸嘴，以 及用於麟轉搬送輯之行方_距的—行間距調節單元； 該第1試拾料ϋ包含用於_峨卡的複數個第一測 試吸嘴以及用於調節該等第一測試吸嘴之列方向間距的一第 一列間距調節單元； 該第-測趣料器包含用於吸附記憶卡的複數個第二測 試吸嘴，以及胁_料第二職吸嘴之列方㈣距的一第 二列間距調節單元。 3. —種記憶卡用測試分選機，係包含： 一托盤部’係安放有用於㈣制試的記憶卡的-供給托 盤’以及根據測試結果分類收納經測試的記憶卡的複數個收納 托盤； 一測試部’係包含用於測試記憶卡的複數個測試單元； 一緩衝部’係配設於該托盤部與該測試部之間，用於搬運 記憶卡；以及 一搬送拾料器，係在該緩衝部與該托盤部之間搬送記憶 卡； 其中該測試部包含在該等測試單元與該緩衝部之間搬送 s己憶卡的複數個測試拾料器。 4. 如請求項第3項所述之記憶卡用測試分選機，其中 該搬送拾料器包含用於吸附記憶卡的複數個搬送吸嘴，以 39 201243353 及用於調節該等搬送吸嘴之行方向間距的一行間距調節單元，· 該等測試純n分別包相於崎記憶卡的複數個測試 吸嘴，以及用於調節該等測試吸嘴之列方向間距的一列間距調 節單元。 5.如請求項第1項或第3項所述之記憶卡用測試分選機，其中更 包含-讀取部’該讀取部配設於該搬送拾料器上，用於讀 取在6己憶卡上職的條碼峨得鋪卡的產品資訊； 其中該搬送拾料H _觸取部獲得的產品魏，將收納 於該緩衝部的經職的記憶卡自該緩衝部搬送至該等收納托 盤。 6. 如請求項第5項所述之記‘Jf相賴分選機，其中 該讀取部獲得產品資訊，該產品資訊包含記憶卡交貨商資 訊、記憶卡類型以及記憶卡規格中的至少一個， 該搬送拾料器將經測試的記憶卡自該緩衝部搬送至該等 收納托盤上，以使得經測試的記憶卡按照該產品資訊收納於該 等收納托盤上。 7. 如-月求項第1項或第3項所述之記憶卡用測試分選機，其中 更包含一圖像部，該圖像部拍攝位於該測試單元上的記憶 卡，以對記憶卡執行外觀檢查， 其中該圖像部分別配設於每一該等測試拾料器上。 如清求項第1項或第3項所述之記憶卡⑴職分選機，其中 201243353 更包含一感測器部’該感測器部用於獲得記憶卡位於該測 試單元的狀態資訊， 其中該感測器部配設於每一該等測試拾料器上。 9.如明求項第8項所述之記憶卡用測試分選機，其中該感測器部 包含： 一發光感測器，係朝向位於該測試單元的記憶卡發射光； 一受光感測器’係用於接受該發光感測器發射的光；以及 一檢測單元’係利用該受光感測器接受的光而獲得位於該 測試單元的記憶卡的狀態資訊。 10.如清求項第1項或第3項所述之記憶卡用測試分選機，其中該 測試單元包含： 一測試插口，係用於收納記憶卡；以及 一卡爪’係可移動地結合於該測試插口上，以使得收納於 該測試插口中的記憶卡與該測試設備相連接。 U.如請求項第10項所述之記憶卡用測試分選機’其中， 該測試插口包含用於收納記憶卡的測試槽； 該測試部包含用於移動該卡爪以開閉該測試槽的一開閉 機構’在該開閉機構形成有使得該等測試拾料器通過的複數個 貫穿孔， 該等測試拾料器通過該等貫穿孔執行在該阅試槽内收納 記憶卡的工序與自該測試槽拾取記憶卡的工序。201243353 VII. Patent application scope: 1. A test card sorting machine for memory card includes: a tray portion located within a tray area, the tray area is provided with a supply tray for storing a memory card to be tested And a plurality of storage trays for storing the tested memory cards according to the test results; a test portion comprising a plurality of test units for testing the memory card, and one of the test procedures for testing the memory card The test unit is disposed in a test area and a second test area; a buffer portion is disposed between the tray portion and the test portion, and includes a first buffer mechanism and a second buffer a mechanism, the first buffer mechanism moves between the tray area and the first test area to carry a memory card, the second buffer mechanism moves between the tray area and the second test area to carry a memory card; The transport picker 'transports the S memory card between the first buffer mechanism and the tray portion' to transfer a memory card between the second buffer mechanism and the tray portion; the test portion a plurality of test pickers for transporting a memory card between the test unit and the buffer portion, wherein the test portion includes a first test picker and s-test pick (four) 'the first test strip ^ The single-reading material-buffering mechanism disposed in the first test area is sent to the memory card, and the first test is performed. The feeder transports the memory card between the test unit disposed within the second test area and the second buffer mechanism. For example, the memory card described in item 1 of the Qing Chang item is divided into 38, which is the same as the transport nozzle for the _ memory card, and the line for the lining transfer. a line spacing adjustment unit; the first test pick includes a plurality of first test nozzles for the _ Leica and a first column spacing adjustment unit for adjusting the direction spacing of the first test nozzles The first-stage funer includes a plurality of second test nozzles for adsorbing the memory card, and a second column pitch adjusting unit for arranging the fourth (fourth) distance of the second-stage nozzle. 3. A test sorting machine for a memory card, comprising: a tray portion 'with a memory card for a (four) test - a supply tray' and a plurality of storage trays for storing the tested memory cards according to the test results a test portion includes a plurality of test units for testing the memory card; a buffer portion is disposed between the tray portion and the test portion for carrying the memory card; and a transport picker is The memory card is transported between the buffer portion and the tray portion; wherein the test portion includes a plurality of test pickers for transporting the memory card between the test unit and the buffer portion. 4. The test sorting machine for a memory card according to Item 3, wherein the transport picker includes a plurality of transport nozzles for adsorbing a memory card, and is used for adjusting the transport nozzles at 39 201243353 A line spacing adjustment unit for the direction of the line direction, the test pieces n respectively comprise a plurality of test nozzles of the Saki memory card, and a column of pitch adjustment units for adjusting the direction spacing of the test nozzles. 5. The test sorting machine for a memory card according to Item 1 or Item 3, further comprising a reading unit configured to be disposed on the transport picker for reading 6 Responsible for the card product information of the card on the card; wherein the product obtained by the pickup H _ contact part, the memory card stored in the buffer unit is transferred from the buffer to the Wait for the storage tray. 6. The 'Jf Dependent Sorting Machine as described in Item 5 of the claim, wherein the reading unit obtains product information, the product information including at least one of a memory card vendor information, a memory card type, and a memory card specification. In one, the transport picker transports the tested memory card from the buffer to the storage tray so that the tested memory card is stored on the storage tray according to the product information. 7. The test sorting machine for a memory card according to item 1 or item 3 of the present invention, further comprising an image portion, the image portion capturing a memory card located on the test unit for memory The card performs a visual inspection, wherein the image portions are respectively disposed on each of the test pickers. For example, the memory card (1) job sorting machine described in Item 1 or Item 3, wherein 201243353 further includes a sensor portion for obtaining the status information of the memory card located in the test unit, The sensor portion is disposed on each of the test pickers. 9. The test sorting machine for a memory card according to Item 8, wherein the sensor portion comprises: a light-emitting sensor that emits light toward a memory card located in the test unit; The device is configured to receive light emitted by the light-emitting sensor; and a detecting unit to obtain state information of the memory card located in the test unit by using light received by the light-receiving sensor. 10. The test sorting machine for a memory card according to Item 1 or 3, wherein the test unit comprises: a test socket for accommodating a memory card; and a claw 'movably The test socket is coupled to the memory card received in the test socket to be connected to the test device. U. The test card sorting machine for a memory card according to claim 10, wherein the test socket includes a test slot for accommodating a memory card; the test portion includes a test portion for moving the claw to open and close the test slot An opening and closing mechanism is formed in the opening and closing mechanism with a plurality of through holes through which the test pickers pass, and the test pickers perform the process of accommodating the memory card in the test slot through the through holes The process of picking up the memory card in the test slot.
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