TW201145728A - Contact pin holder - Google Patents
Contact pin holder Download PDFInfo
- Publication number
- TW201145728A TW201145728A TW100101815A TW100101815A TW201145728A TW 201145728 A TW201145728 A TW 201145728A TW 100101815 A TW100101815 A TW 100101815A TW 100101815 A TW100101815 A TW 100101815A TW 201145728 A TW201145728 A TW 201145728A
- Authority
- TW
- Taiwan
- Prior art keywords
- pin
- contact
- signal
- contact pins
- substrate
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
- H01R24/54—Intermediate parts, e.g. adapters, splitters or elbows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7076—Coupling devices for connection between PCB and component, e.g. display
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Connecting Device With Holders (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010008087A JP2011146334A (ja) | 2010-01-18 | 2010-01-18 | コンタクトピンホルダ |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201145728A true TW201145728A (en) | 2011-12-16 |
Family
ID=43757895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100101815A TW201145728A (en) | 2010-01-18 | 2011-01-17 | Contact pin holder |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2011146334A (ja) |
TW (1) | TW201145728A (ja) |
WO (1) | WO2011088308A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9088121B2 (en) | 2012-11-16 | 2015-07-21 | Delta Electronics (Shanghai) Co., Ltd. | Package module, package terminal and manufacturing method thereof |
TWI554867B (zh) * | 2015-12-21 | 2016-10-21 | 視動自動化科技股份有限公司 | 具有連結組件之通訊結構 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6116112B2 (ja) * | 2011-02-04 | 2017-04-19 | スリーエム イノベイティブ プロパティズ カンパニー | Icデバイス用ソケット |
JP6383256B2 (ja) * | 2014-11-06 | 2018-08-29 | シャープ株式会社 | 半導体トランジスタのテスト方法、及び、テストソケット |
TWI620936B (zh) * | 2017-02-22 | 2018-04-11 | 中華精測科技股份有限公司 | 積體電路之測試探針卡 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0247892A (ja) * | 1988-08-10 | 1990-02-16 | Hitachi Ltd | セラミック多層配線基板 |
JPH03272579A (ja) * | 1990-03-20 | 1991-12-04 | Fujitsu Ltd | コネクタ |
JP3199592B2 (ja) * | 1995-01-27 | 2001-08-20 | 株式会社日立製作所 | 多層印刷回路基板 |
WO1997009753A1 (en) * | 1995-09-06 | 1997-03-13 | Connector Systems Technology N.V. | Assembly of shielded connectors and a board having plated holes |
JPH1167396A (ja) | 1997-08-11 | 1999-03-09 | Toshiba Chem Corp | 端子ピッチ変換基板 |
JP2000082553A (ja) | 1998-09-08 | 2000-03-21 | Tokyo Cosmos Electric Co Ltd | Ic用ソケット |
US6392160B1 (en) * | 1998-11-25 | 2002-05-21 | Lucent Technologies Inc. | Backplane for radio frequency signals |
JP2007080592A (ja) | 2005-09-12 | 2007-03-29 | Fujitsu Component Ltd | 半導体装置実装用ソケット |
-
2010
- 2010-01-18 JP JP2010008087A patent/JP2011146334A/ja active Pending
-
2011
- 2011-01-14 WO PCT/US2011/021284 patent/WO2011088308A1/en active Application Filing
- 2011-01-17 TW TW100101815A patent/TW201145728A/zh unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9088121B2 (en) | 2012-11-16 | 2015-07-21 | Delta Electronics (Shanghai) Co., Ltd. | Package module, package terminal and manufacturing method thereof |
TWI497663B (zh) * | 2012-11-16 | 2015-08-21 | Delta Electronics Shanghai Co | 封裝模塊、封裝終端及其製造方法 |
TWI554867B (zh) * | 2015-12-21 | 2016-10-21 | 視動自動化科技股份有限公司 | 具有連結組件之通訊結構 |
US9531095B1 (en) | 2015-12-21 | 2016-12-27 | Viewmove Technologies, Inc. | Communication structure with connecting assembly |
Also Published As
Publication number | Publication date |
---|---|
JP2011146334A (ja) | 2011-07-28 |
WO2011088308A1 (en) | 2011-07-21 |
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