TW201145728A - Contact pin holder - Google Patents

Contact pin holder Download PDF

Info

Publication number
TW201145728A
TW201145728A TW100101815A TW100101815A TW201145728A TW 201145728 A TW201145728 A TW 201145728A TW 100101815 A TW100101815 A TW 100101815A TW 100101815 A TW100101815 A TW 100101815A TW 201145728 A TW201145728 A TW 201145728A
Authority
TW
Taiwan
Prior art keywords
pin
contact
signal
contact pins
substrate
Prior art date
Application number
TW100101815A
Other languages
English (en)
Chinese (zh)
Inventor
Yuichi Tsubaki
Masahiko Kobayashi
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of TW201145728A publication Critical patent/TW201145728A/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/54Intermediate parts, e.g. adapters, splitters or elbows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889Interfaces, e.g. between probe and tester
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/7076Coupling devices for connection between PCB and component, e.g. display
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Connecting Device With Holders (AREA)
  • Measuring Leads Or Probes (AREA)
TW100101815A 2010-01-18 2011-01-17 Contact pin holder TW201145728A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010008087A JP2011146334A (ja) 2010-01-18 2010-01-18 コンタクトピンホルダ

Publications (1)

Publication Number Publication Date
TW201145728A true TW201145728A (en) 2011-12-16

Family

ID=43757895

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100101815A TW201145728A (en) 2010-01-18 2011-01-17 Contact pin holder

Country Status (3)

Country Link
JP (1) JP2011146334A (ja)
TW (1) TW201145728A (ja)
WO (1) WO2011088308A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9088121B2 (en) 2012-11-16 2015-07-21 Delta Electronics (Shanghai) Co., Ltd. Package module, package terminal and manufacturing method thereof
TWI554867B (zh) * 2015-12-21 2016-10-21 視動自動化科技股份有限公司 具有連結組件之通訊結構

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6116112B2 (ja) * 2011-02-04 2017-04-19 スリーエム イノベイティブ プロパティズ カンパニー Icデバイス用ソケット
JP6383256B2 (ja) * 2014-11-06 2018-08-29 シャープ株式会社 半導体トランジスタのテスト方法、及び、テストソケット
TWI620936B (zh) * 2017-02-22 2018-04-11 中華精測科技股份有限公司 積體電路之測試探針卡

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0247892A (ja) * 1988-08-10 1990-02-16 Hitachi Ltd セラミック多層配線基板
JPH03272579A (ja) * 1990-03-20 1991-12-04 Fujitsu Ltd コネクタ
JP3199592B2 (ja) * 1995-01-27 2001-08-20 株式会社日立製作所 多層印刷回路基板
WO1997009753A1 (en) * 1995-09-06 1997-03-13 Connector Systems Technology N.V. Assembly of shielded connectors and a board having plated holes
JPH1167396A (ja) 1997-08-11 1999-03-09 Toshiba Chem Corp 端子ピッチ変換基板
JP2000082553A (ja) 1998-09-08 2000-03-21 Tokyo Cosmos Electric Co Ltd Ic用ソケット
US6392160B1 (en) * 1998-11-25 2002-05-21 Lucent Technologies Inc. Backplane for radio frequency signals
JP2007080592A (ja) 2005-09-12 2007-03-29 Fujitsu Component Ltd 半導体装置実装用ソケット

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9088121B2 (en) 2012-11-16 2015-07-21 Delta Electronics (Shanghai) Co., Ltd. Package module, package terminal and manufacturing method thereof
TWI497663B (zh) * 2012-11-16 2015-08-21 Delta Electronics Shanghai Co 封裝模塊、封裝終端及其製造方法
TWI554867B (zh) * 2015-12-21 2016-10-21 視動自動化科技股份有限公司 具有連結組件之通訊結構
US9531095B1 (en) 2015-12-21 2016-12-27 Viewmove Technologies, Inc. Communication structure with connecting assembly

Also Published As

Publication number Publication date
JP2011146334A (ja) 2011-07-28
WO2011088308A1 (en) 2011-07-21

Similar Documents

Publication Publication Date Title
US6264476B1 (en) Wire segment based interposer for high frequency electrical connection
JP4884485B2 (ja) 高性能電気コネクタ
JP4663722B2 (ja) 携帯無線通信装置のためのアンテナ装置、及びそのようなアンテナ装置を備える携帯無線通信装置
US6712620B1 (en) Coaxial elastomeric connector system
CN107796966B (zh) 垂直式探针及其制法和使用垂直式探针的探针头与探针卡
TW201208213A (en) Contact holder
TW201145728A (en) Contact pin holder
TWI438438B (zh) 具有高頻內插器之測試系統
US7990168B2 (en) Probe card including a sub-plate with a main supporter and a sub-supporter with the sub-supporter having probe needles
JP2004519075A (ja) ランド格子アレイインタポーザまたは電気コネクタ用の接触子アセンブリ
JP6116112B2 (ja) Icデバイス用ソケット
TW200831907A (en) Contact probe and socket for testing semiconductor chips
JP2009164135A (ja) 柔軟電気接点
JP2011514519A5 (ja)
US8333597B2 (en) Connector and interposer using connector
US20120182037A1 (en) Ic device testing socket
EP3830906B1 (en) Board connector and printed circuit board assembly
US8110751B2 (en) Semiconductor memory module and electronic component socket for coupling with the same
JP2004333459A (ja) コンタクトプローブ、これを用いた半導体及び電気検査装置
KR102265360B1 (ko) 동축 케이블을 이용한 프로브 핀 및 이를 포함하는 테스트 소켓
TW201212432A (en) Contact pin holder
TW490566B (en) Contact structure having contact bumps
US20070093058A1 (en) Method for producing electric contact and electrical connector
JP6109247B2 (ja) Icデバイス用ソケット
CN109581005B (zh) 探针组件及其空间转换介面板