200944809 九、發明說明： 【發明所屬之技術領域】 本發明係有關於一種發光二極體(LED)的測試治具及 /則试方去，尤指一種用於提供測試已完成封裝等製程的— LED架，測試其所具有之多數個發光二極體之明^狀態的 LED光源測試治具及使用該LED光源測試治具 = 一極體的測試方法。 ❹ 【先前技術】 按，目前之半導體(1C)及發光二極體(LED)等產業由 於製程已越作愈精密，因此即需要大量之檢測工作以確保 成品之出貨品質，如以發光二極體為例，其於其中一種檢 測方式為將—已完成沖壓、射出、固晶、打線及封裂等$ 程之LED架放置於一具有為數眾多探針的工作台上， :探針對應接觸於LED架上的發光二極體的正:負電極 I5進而升/成電導通以測試發光二極體的發光良率，從 挑選出無法發光的發光二極體並予以淘汰，但通常操作者 f法直接以目視得知發光二極體是奸發光等之情形，· 猎助電性導通時的訊號才可得知。 而 入f述之探針係由具導電性的金屬材質所製成，大致自 3 -破體件、—設置於殼體件内的壓縮彈簧、— ^於殼體件上端的上制件，及—可_設置於殼體= 件’而，彈簧的兩端即是分別頂抵上接觸件 ’以供上接觸件及下接觸件能彈性伸縮。1 ’上接觸件㈣接缺發光二極體 ，、 接觸件即係電連接至如電路板的電路接點中當，，下 200944809 件相互接觸時即形成電導通，進而將電壓傳遞至發光二極 承上述之說明’上述的探針直徑尺寸大約 lmm左 右，其係插設於工作台上相對應的插孔内，而插設作業往 往必須以人工之方式逐漸—地插設，炎無法以自動化方 式插设而減少組裝時間，並且工作台上通常皆需插設到上 百隻以上的探針，一般來說尺寸越小的物品則相對地提高 人員於組襞上困難度’尤其是彼此之間的節距(pitch)短， 如此更k馬人力費時之問題，進而增加之成本，從而造成 廠商購買/製造測試設備或治具等成本提高之虞。 一其次，探針若被外力不慎碰撞時，即容易使探針損 壞，進而造成測試發光二極體的發光良率可靠度不足，容 易淘汰到為良品的發光二極體，使得發光二極體整體之生 產製造流程中於後端測試光源製程作業良率不足。並且， 如針與發光二極體接觸時，因接觸面積極小而使用至 時間後，探針即容易發生碳化之情形，而無法電性導通t 再者，通常電性測試完後，並會有進行 ㈣ 作業，藉以測試發光二極體於不同環境中之可靠度，、但 上述工作台體積大，故無法整機進入至環境測$ 一 直接測試發光二極體之可靠产，則 …至内，而 ^ #度則必須再另行於工作台上 ^ L奶卸下’料再送人至環境 = 業上之不便處。 Π以成製程作 緣是’本發明人有感上述缺 來從事此方面之相關經驗，悉心觀察二之且:據多年 理之運用，而提出1設計合理且有效^上述缺m 200944809 發明。 【發明内容】 本發明之主要目的，係提出一種LED光源測試治具， 其免除使用探針以測試發光二極體的發光良率而具有降 低成本，及免除因探針損壞而造成測試發光二極體的發光 良率可靠度不足的。 本發明之另一目的，係提出一種使用LED光源測試 治具測試發光二極體的測試方法，其供測試發光二極體之 〇 明暗狀態，以具有易於檢測並有利於簡化測試步驟而提高 測試及製程效率的目的。 依據上述之目的，本發明提出一種LED光源測試治 具，包括：一底座，其設有多數個插孔，每一插孔設有一 導電性金屬件；多數個第一金屬片及第二金屬片，係分別 相對應組設於該底座，每一第一金屬片係彎折延伸有多數 個第一彈性臂及每一第二金屬片係彎折延伸有多數個對 應於該第一金屬片之第一彈性臂的第二彈性臂；一絕緣 ⑩層，係設於該等第一、第二金屬片上，該絕緣層設有多數 個開口，該箏第一、第二金屬片之第一彈性臂、第二彈性 臂分別伸入該等開口；一上蓋，其係可掀開及蓋合設於談 底座上，該上蓋開設有多數個對應於該等第一、第二金屬 片之第一彈性臂、第二彈性臂的槽孔；以及一電路板，其 係與該上蓋相對的位於該底座之下方，上述該等導電性金 屬件的兩端係分別接觸該等第一、第二金屬片及該電路 礙。 為達上述之另一目的，本發明提出一種使用led光 200944809 源測試、冶具測試發光二極體❹】試方法，包括下列少驟： (一)提供一LED光源測試治具，其係包含一底座、多 數個組設於該底座的第—金屬片和第二金屬片、一哎於該 紅金屬片上的絕緣層、—可掀開及蓋合設於該 二m、—設置於該底座的電路板及多數個設於該底 座中且兩^彳姆該電路板及料第—、第二 —第二金屬片f折延伸有多數個第一彈性臂 ❹ 設有多數個槽孔； ㈣心生臂，該上蓋 加^㈡放置- LED架於該LED光源測試治具上該 ㈣包含-框片架及多數個發光二極體，每 —: 3片第—彈性臂、第二彈輯係接觸於該哪^ 1C極體具有的兩電極部，並將該上蓋蓋合於該 使 對應於LED架之發光二極體的出 I4it()進行通電作業，其—電壓於電路板，以電 性導通至該導電性金屬件、料第-、第二金屬ΐ及= :光二極體’以電性測試該LED架上的發光二極體j 暗0 本發明具有如下所述之效益： 1藉由第、第二金屬片、底座、絕緣層、上蓋 ^生盘屬件及電路板之組合設計而組成該光源沒 ί治具，錄齡以製造簡單錢私會增加組裝及S =上之困難度’並與習知以人卫方式 作台上相較下，可大幅減少人力之玉時，進而具有_ 200944809 買或製造測 提供料二轉製造廠商購 2、籍由第 - ’、弟二金屬片彎折延伸有第—碟α 第二彈性臂以供彈性接觸發光二極體的兩電極而：、 習知所述以探針接觸方式，避免 邛而免除 光二極體的發光良率可靠度不足，且本發 設計下，具有防止彈性臂被外力不當撞觸而有斷裂之200944809 IX. Description of the Invention: [Technical Field] The present invention relates to a test fixture for a light-emitting diode (LED) and/or a tester, and more particularly to a process for providing a test that has completed packaging and the like. — LED frame, test the LED light source test fixture of the LED state of the majority of the light-emitting diodes, and test the fixture using the LED light source = one pole test method. ❹ 【Prior Art】 According to the current semiconductor (1C) and light-emitting diode (LED) industries, the process has become more sophisticated, so a large amount of testing work is required to ensure the quality of finished products, such as In the case of a polar body, one of the detection methods is to place the LED frame of the stamping, injection, solid crystal, wire bonding and sealing on a workbench having a plurality of probes: probe corresponding Contacting the positive electrode of the LED on the LED frame: the negative electrode I5 is further boosted/conducted to test the luminous yield of the light-emitting diode, and the light-emitting diode that cannot emit light is selected and eliminated, but usually operated The method of f can directly visually know that the light-emitting diode is a illuminating light, etc., and the signal when the hunting aid is electrically turned on can be known. The probe described in the above is made of a conductive metal material, substantially from a 3-broken member, a compression spring disposed in the housing member, and an upper member at the upper end of the housing member. And - can be disposed in the housing = piece ', and the two ends of the spring are respectively abutted against the upper contact member 's for the upper contact member and the lower contact member to elastically expand and contract. 1 'The upper contact piece (4) is connected to the light-emitting diode, and the contact piece is electrically connected to the circuit contact such as the circuit board. When the next 200944809 pieces are in contact with each other, the electrical conduction is formed, and the voltage is transmitted to the light-emitting two. According to the above description, the above-mentioned probe has a diameter of about lmm, which is inserted into the corresponding jack on the workbench, and the insertion work must be gradually inserted in an artificial manner. Automated plug-in to reduce assembly time, and usually need to insert more than one hundred probes on the workbench. Generally, the smaller the size of the article, the higher the difficulty of the personnel on the group, especially each other. The short pitch between them is such a problem that the manpower is time-consuming and the cost is increased, which causes the cost of the manufacturer to purchase/manufacture test equipment or fixtures. Secondly, if the probe is inadvertently collided by an external force, the probe is easily damaged, which results in insufficient reliability of the luminous yield of the test light-emitting diode, and is easily eliminated into a good light-emitting diode, so that the light-emitting diode In the overall manufacturing process, the yield of the back-end test light source process is insufficient. Moreover, if the needle is in contact with the light-emitting diode, the probe is likely to be carbonized because the contact surface is actively small, and the probe is likely to be carbonized. Furthermore, after the electrical test, there will be Carry out (4) operations to test the reliability of the light-emitting diodes in different environments, but the above-mentioned workbench is bulky, so it is impossible to enter the environment to measure the cost of a direct test light-emitting diode. , ^ ^ degree must be separately on the workbench ^ L milk unloading 'material and then send people to the environment = the inconvenience in the industry. Π Π 成 制 ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ ’ 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本 本SUMMARY OF THE INVENTION The main object of the present invention is to provide an LED light source test fixture, which eliminates the use of a probe to test the luminous yield of a light-emitting diode, has a reduced cost, and is free from test light damage caused by probe damage. The polar body's luminous yield is not reliable enough. Another object of the present invention is to provide a test method for testing a light-emitting diode using an LED light source test fixture for testing a light-dark state of a light-emitting diode to improve testing by facilitating detection and facilitating simplification of test steps. And the purpose of process efficiency. According to the above object, the present invention provides an LED light source test fixture, comprising: a base provided with a plurality of jacks, each of which is provided with a conductive metal member; a plurality of first metal sheets and second metal sheets Correspondingly, the first metal sheets are bent and extended, and the plurality of first elastic arms and each of the second metal sheets are bent and extended to have a plurality of corresponding ones of the first metal sheets. a second elastic arm of the first elastic arm; an insulating 10 layer is disposed on the first and second metal sheets, the insulating layer is provided with a plurality of openings, and the first elastic of the first and second metal pieces of the same The arm and the second elastic arm respectively extend into the openings; an upper cover that can be opened and closed on the base, the upper cover is provided with a plurality of first corresponding to the first and second metal pieces a slot of the elastic arm and the second elastic arm; and a circuit board opposite to the upper cover, the two ends of the conductive metal members respectively contacting the first and second metals The film and the circuit block. In order to achieve the above other object, the present invention provides a test method for using a led light 200944809 source test and a tool for testing a light-emitting diode, including the following few steps: (1) providing an LED light source test fixture, which includes a a base, a plurality of the first metal piece and the second metal piece disposed on the base, and an insulating layer on the red metal piece, which can be opened and closed on the second m, and disposed on the base a plurality of circuit boards and a plurality of slots are disposed in the base, and the first and second second metal sheets are folded to extend a plurality of first elastic arms, and a plurality of slots are provided; The arm, the upper cover plus ^ (two) placement - LED frame on the LED light source test fixture (4) contains - frame frame and a plurality of light-emitting diodes, each - 3 pieces - elastic arm, second elastic series Contacting the two electrode portions of the 1C pole body, and covering the upper cover to the outlet I4it() corresponding to the LEDs of the LED frame, the voltage is applied to the circuit board to electrify Conductively conductive to the conductive metal member, material first-, second metal ΐ and =: light diode ' Electrically testing the LEDs on the LED frame j Dark 0 The invention has the following benefits: 1 by the combination of the first and second metal sheets, the base, the insulating layer, the upper cover, the disk member and the circuit board The design and composition of the light source is not a fixture, the age of the record is simple to make money, the assembly will increase the difficulty of assembly and S = and it can reduce the manpower when it is compared with the conventional method. And then have _ 200944809 buy or manufacture test supply two-turn manufacturer to buy 2, from the first - ', two brothers metal sheet bent to extend the first disc - the second elastic arm for elastic contact with the light-emitting diode two Electrode:: It is known that the probe contact method avoids flaws and eliminates the lack of reliability of the light-emitting diode of the light-emitting diode, and the design of the present invention prevents the elastic arm from being broken by the external force and is broken.
從，更能=發光二極體整體之生產製造流程^端 測试光源製程作業良率不足。 ' ^ 3、 承上述’經由彈性臂接觸發光二極體的電極部以 具有較大的制面積，故制後能防止容易碳化之情形。 4、 藉由該LED光源測試治具供咖架置設，進而 測試發光二極體光源的明暗狀態(發光良率），經該l e D光 源測試治具之設計’使測試方法的步驟簡單易於檢測並有 利於簡化測試步驟，以提高測試效率。 5、經由上it led光源測試治具之設計而具有體積 小的特性，故可與led架直接送人至環境測試室内，以 測試發光二極體於環境中之可靠度，以利於簡化製程作業 上之流程等。 為了能更進一步瞭解本發明為達成既定目的所採取 之技術、方法及功效，請參閱以下有關本發明之詳細說明 ，附圖’相信本發明之目的、特徵與特點，當可由此得一 深入且具體之瞭解，誠所_式僅提供參考與說明用， 並非用來對本發明加以限制者。 200944809 【實施方式】 請先參閱第一圖至第四圖所示，本發明係提出一種 LED光源測試治具1 〇 〇，其包括一底座丄〇、多數個第 一金屬片2 0 a與第二金屬片2 〇 b、一絕緣層3 〇、一 上蓋4 0及一電路板5 〇。 底座1 0可係由金屬件或絕緣件所製成，其設有多數 個插孔1 1，每-插孔！丄可對應設有一導電性金屬件6 0 中底座1 〇係為絕緣件時，其可係由射出成型方 式而成型’而每-導電性金屬件6 〇即可埋設於底座工〇 内：因而使導電性金屬件6 0外圍形成有插孔工丄；當底 座係為金屬件時’即可開設有插i以供導電性金屬件 6 0插設，當然為絕緣件時亦可使用前述相同之方式。 々每-第-金屬片2 〇 a係具有一第一基部2工a、一 第一連接臂2 2 a及多數個第一彈性臂2 3 a，每一第二 金屬片2 0 b係具有-第二基部2 1 b、一第二連接臂2 瞻 2 b及多數個第二彈性臂2 3 b ;第一連接臂2 2 a係連 J於第-基部2 1 a的-端，自第一連接臂2 2 a的侧端 、f折延伸出該等第-彈性臂23a ;第二連接臂22_ 2連接於第二基部2 1匕的—端，而第二連接臂2 2 b與 一連接臂2 2 a為相間隔的設置，自第二連接臂2 2 b ，側端f折延伸出該等第二彈性臂23b，使得第一彈性 身2 ^ a與第二彈性臂2 3 b係相對應的設置(如第二八 ，所示）。更進-步的說明，每一第一金屬片2 〇 a與每 第金屬片2 0 b原皆係為同一金屬片經下料沖壓彎 折而成，並經切斷後，即成為不連接於一起的金屬片，藉 200944809 以提供與外部正、負極電性導通之用。 絕緣層3 0係設有多數個開口 3 1。 上蓋4 0係開設有多數個槽孔41 ;其中，上蓋4 〇 的一侧端突設有至少一具第一樞孔4 2丄的樞部4 2，及 與樞部4 2相對的另一侧端形成有至少一樞座4 3及對 應樞設於該樞座4 3上可開啟及扣合的扣片44，本發明 中’係以設有兩樞部4 2、兩樞座4 3及兩扣片4 4為例。 電路板5 0上係形成一電連接部5丄及多數個電路 接點5 2」電連接部5 !可係為一金手指，但不以此為 限亦可係為電連接器，藉以與外部電源達成電性連結。 在本發明中，該LED光源測試治具i 〇〇係可更進 步已括至乂固疋條7 〇及二定位框8 〇，固定條7 〇 第二樞孔711的對接部71，其對應於上述之 =0=部42,兩定位框8〇係呈一门字型狀，其 /、有*條8 1及二連接於基條81末端的側條名2。 參 第一金屬片2 0 a與相對應之第二 採間隔依序地分別組設於底座1 '、 览一、烽n 丄υ上絕緣層3 0係設於 第弟一盘屬片2 〇 a、2 〇 b，在本發 絕緣層3 0係為-呈片體狀之彳發月之圖式中， 第-全f 構件，其罩設於第一、 ::金屬片2〇a、20bJl，而每—第一、第 2 〇 a、2 0 b之第一彈性臂2 3 a、彈 即分別伸入於絕緣層3 〇之開第：：性’ 2 3 b 示);當然絕緣層3 〇亦可係與底座丄〇厶第:二:： 件，即可係以射出成形之方式而成，每 ^形之構 片2“、20b即係運用模***出成型之技術方::: 11 200944809 埋設於絕緣層3 0與底座1 〇間，同樣地，絕緣層3 0也 係設於每一第一、第二金屬片2 0 a、2 0 b上，而第一 彈性臂2 3 a、第二彈性臂2 3 b即伸入絕緣層3 0之開 口 3 1。 上蓋4 0係可掀開及蓋合設於底座1〇之上方，在本 發明中，係經由上述之固定條7 〇鎖合於底座1〇之一侧 端’而上蓋4 0之樞部4 2對應結合於固定條7 0之對接 部7 1中，使第一樞孔4 2 1與第二樞孔7 1 1相對應， 進而可供一軸桿（圖略）樞設，即可使上蓋4 〇可掀開及蓋 合的設於底座1 〇上，且上蓋4 〇之扣片4 4即可扣合於 底座1 0之另一側端處而固定。上蓋4 〇之槽孔4工即分 別對應於第一金屬片2 〇 a、第二金屬片2 〇b之第一彈 性臂2 3 a、第二彈性滑2 3 b的位置處。另，兩定位框 8 0係組設於底座1 0相對的兩側端部上，並位於上蓋4 〇與底座1 〇之間。 電路板1 2 3 4 〇即係與上蓋4 0相對的設於底座1 〇之 下方’而上述之每一導電性金屬件6 0的兩端即係分別接 :於相對應的第-、第二金屬片2 0 a、2 0 b的第一基 邻2 1 a、第二基部2 1 b及電路板5 〇之電路接點5 12 1 ’而使得電路板5 0能與第-、第二金屬片20a、2 〇 b達成電導通（請配合參閱第七圖及第九圖所示）。 2 再配合參閱第五圖至第九圖所示，本發明LED光 ，測4冶具1 Q Q係可提供置設—已完成沖壓、射出、固 曰曰二打線及封料製程之LED架9 Q㈣行光源， 3 led 架 9 η η # a a 4 u u係包含一框片架9 i，及多數個可拆卸下的 200944809 結合於框片架9 1上的發光二極體9 2，每一發光二極體 9 2皆具有二電極部9 2 1 (如第五A圖所示，圖式中僅 繪示出一個電極部為例）。 當上蓋4 0掀開後，LED架9 0 〇即可設置於絕緣層 3 0上方’兩定位框8 0即係定位住led架9 〇 〇之框 片架9 1的兩端部，而定位LED架9 0 〇 ;同時，每一 第一、第二金屬片2 0a、2〇b之第一彈性臂23a、 第二彈性臂2 3 b即彈性接觸於相對應之發光二極體9 ❿ 2的兩電極部921;之後，即可將上蓋4〇芸入，t签 4 0之槽孔41即能對應於每—發光二ς4體〇9f上蓋 接著，當電路板5 0通電時，電壓即可由導電性金屬 件6 0傳遞至第一、第二金屬片2〇a、2〇b，進而再 傳遞至發光二極體9 2之兩電極部9 2丄，藉以測試發光 二極體9 2是否能釋放出光源，使用人員即可以目測之方 式透過上蓋4 0的槽孔41，觀視發光二極體g 2的明暗 情形’進而測試出此Lrn)架9 0 0上的發光良率，並可 參 以適當之色筆於損壞及/或亮度低之發光二極體上作出顏 色標記’以便於將LED架自LED光_試治具取出後， 進而淘汰損壞及/或亮度低之發光二極體。另，利用彈性 臂接觸於發光二極體的電極部具有較大的接觸面積。 目此’請再配合㈣第十圖⑽，本發明更提出一種 ，用LED統賴治具職發光二極體的職方法，其 包括下列步驟： ，其係包含有一 a、2 0 b、一 (一)提供一 LED光源測試治具1 〇 〇 底座1 0、多數個第一、第二金屬片2 〇 13 200944809 絕緣層3 0、-上蓋4 〇一電路板5 〇及多數個導電性金 屬件6 0; 其中，上述底座i 〇、第一、第二金屬片2 〇 a、2 0 b與電路板5 0等元件之連結關係已於上述t說明，在 此不再重複加以贅述，另導電金屬件6 〇即係設於底座工 0中。 (二)放置一 LED架g 〇 〇於LED光源測試治具工〇 0上，而LED架9 0 〇係包含上述說明中的一框片架9 1及多數個發光二極體9 2，每一第一、第二金屬片2 〇 a、2 0 b之第一彈性臂2 3 a、第二彈性臂2 3 b係接 觸於LED帛9 0 〇相對應之發光二極體9 2的兩電極部 9 2 1，並將上蓋4 〇蓋合於LED架9 〇 〇上，且槽孔 4 1對應於LED架9 〇 〇之發光二極體g 2的出光處。 (二）進行一通電作業，其係施加電壓於電路板5 〇， 以電性導通至導電性金屬件6 〇、第一、第二金屬片2 〇 a、2 0 b及發光二極體g 2，以電性測試LED架9 〇 〇上的發光二極體9 2之明暗狀態。 另，步驟（一）之LED光源測試治具1 〇 〇更進一步 包含二相對應設置於底座1 0兩侧端部上的定位框8 〇，使步驟(二)之LED架9 0 0之框片架9 χ兩側端部定 位於兩定位框8 〇内。 另’步驟(三)後更進一步包括利用色筆（圖略)伸入上 蓋4 0之槽孔4 1中，並於未產生發光及/或亮度低於其 它發光二極體9 2之發光二極體9 2的外表塗劃上顏色 才示s己之步驟(四），藉以當停止施加電壓之後，可區別出損 14 200944809 壞及/或亮度低之發光二極體9 2，之後，並可予以自框 片架9 1上拆卸下而淘汰。From, more = the production process of the LED body as a whole ^ end of the test light source process operation yield is insufficient. ' ^ 3, the above-mentioned electrode portion of the light-emitting diode is contacted via the elastic arm to have a large manufacturing area, so that it is possible to prevent easy carbonization after the manufacture. 4. By using the LED light source test fixture for the setting of the coffee maker, and then testing the light and dark state of the light emitting diode light source (luminous yield), the design of the test fixture of the light source is simple and easy to test. Detect and facilitate the simplification of test steps to improve test efficiency. 5, through the design of the test fixture on the led light source has a small size, so it can be directly sent to the environmental test room with the led frame to test the reliability of the LED in the environment, in order to simplify the process The process of the above. In order to further understand the techniques, methods and effects of the present invention in order to achieve the intended purpose, reference should be made to the following detailed description of the invention. It is to be understood that the detailed description is not intended to limit the invention. 200944809 [Embodiment] Please refer to the first to fourth figures, the present invention provides an LED light source test fixture 1 〇〇, which includes a base 丄〇, a plurality of first metal pieces 2 0 a and The two metal sheets 2 〇b, an insulating layer 3 〇, an upper cover 40 and a circuit board 5 〇. The base 10 can be made of metal or insulation, and has a plurality of jacks 1, one per jack! The base 1 of the conductive metal member 60 can be correspondingly formed as an insulating member, and can be formed by injection molding, and each conductive metal member 6 can be embedded in the base workpiece: A conductive work is formed on the periphery of the conductive metal member 60; when the base is a metal member, the plug can be opened for the conductive metal member 60 to be inserted, and of course, the same can be used for the insulating member. The way. The 々 every-metal sheet 2 〇a has a first base portion 2a, a first connecting arm 2 2 a and a plurality of first elastic arms 2 3 a, each of the second metal sheets 20 b having a second base 2 1 b, a second connecting arm 2 and a plurality of second elastic arms 2 3 b; the first connecting arm 2 2 a is connected to the end of the first base 2 1 a, The side ends of the first connecting arm 2 2 a are folded to extend out of the first elastic arms 23a; the second connecting arms 22_ 2 are connected to the ends of the second base 2 1 , and the second connecting arms 2 2 b are A connecting arm 2 2 a is spaced apart from the second connecting arm 2 2 b and the side end f is extended to extend the second elastic arms 23b such that the first elastic body 2 ^ a and the second elastic arm 23 b is the corresponding setting (as shown in the second eight). In the further step, each of the first metal piece 2 〇a and each of the second metal pieces 2 0 b are originally formed by the same metal piece being punched and bent, and after being cut, the wire is not connected. A piece of metal, with 200944809 to provide electrical continuity with the external positive and negative electrodes. The insulating layer 30 is provided with a plurality of openings 31. The upper cover 40 is provided with a plurality of slots 41; wherein, at one end of the upper cover 4, at least one pivot portion 42 having a first pivot hole 42 is protruded, and the other opposite to the pivot portion 42 The side end is formed with at least one pivot seat 43 and a buckle piece 44 correspondingly disposed on the pivot seat 43 to be opened and fastened. In the present invention, the system is provided with two pivot portions 4 2 and two pivot seats 4 3 . And two cleats 4 4 as an example. The circuit board 50 has an electrical connection portion 5 and a plurality of circuit contacts 5 2". The electrical connection portion 5 can be a gold finger, but not limited thereto can be an electrical connector. The external power supply is electrically connected. In the present invention, the LED light source test fixture i can be further improved to the shackle 7 〇 and the second positioning frame 8 〇, the fixed strip 7 〇 the second pivot hole 711 of the mating portion 71, corresponding to In the above-mentioned =0=section 42, the two positioning frames 8 are in the shape of a gate, and the / strips 8 1 and 2 are connected to the side stripe 2 at the end of the strip 81. The first metal piece 20 a and the corresponding second sampling interval are respectively arranged on the base 1 ', the first one, the 烽n 丄υ upper insulating layer 30 is set in the first disc of the disc 2 a, 2 〇b, in the pattern of the present invention, the insulating layer 30 is a sheet-like shape, the first-full-f member is covered by the first, :: metal piece 2〇a, 20bJl, and the first elastic arm 2 3 a of each of the first, second, and second 0 b, respectively, protrudes into the opening of the insulating layer 3:: '' 2 3 b b); of course, the insulation Layer 3 〇 can also be combined with the base 丄〇厶: 2::, can be formed by injection molding, each shape of the 2", 20b is the use of in-mold injection molding technology: :: 11 200944809 is embedded between the insulating layer 30 and the base 1 , and similarly, the insulating layer 30 is also disposed on each of the first and second metal pieces 20 a, 20 b, and the first elastic arm 2 3 a, the second elastic arm 2 3 b extends into the opening 3 1 of the insulating layer 30. The upper cover 40 can be opened and closed over the base 1 ,, in the present invention, through the above The fixing strip 7 is locked on one side of the base 1' The pivot portion 4 2 of the 40 is correspondingly coupled to the abutting portion 7 1 of the fixing strip 70, so that the first pivot hole 4 2 1 corresponds to the second pivot hole 7 1 1 , and thus the shaft can be pivoted Therefore, the upper cover 4 can be opened and closed on the base 1 ,, and the buckle 4 4 of the upper cover 4 can be fastened to the other end of the base 10 and fixed. The upper cover 4 The slotted holes 4 respectively correspond to the positions of the first metal piece 2 〇a, the first elastic piece 2 3 a of the second metal piece 2 〇b, and the second elastic sliding piece 2 3 b. The 8 0 series is disposed on opposite side ends of the base 10 and is located between the upper cover 4 〇 and the base 1 。. The circuit board 1 2 3 4 〇 is opposite to the upper cover 40 and is disposed on the base 1 The lower side of each of the above-mentioned conductive metal members 60 is respectively connected to: the first base of the corresponding first and second metal sheets 20a, 2 0b, 2 1 a, second The base portion 2 1 b and the circuit board 5 1 of the circuit board 5 而 enable the circuit board 50 to be electrically connected to the first and second metal sheets 20a, 2 〇 b (please refer to the seventh picture and the ninth Figure)) 2 with reference to the fifth As shown in the ninth figure, the LED light of the present invention can be provided by the QQ tooling system. The LED frame of the stamping, injection, solid-state two-line and sealing process is 9 Q (four) line light source, 3 led frame 9 η η # aa 4 uu includes a frame frame 9 i, and a plurality of detachable 200944809 are coupled to the light-emitting diodes 9 2 on the frame frame 9 1 , and each of the light-emitting diodes 9 2 has two The electrode portion 9 2 1 (as shown in FIG. 5A, only one electrode portion is illustrated as an example). After the upper cover 40 is opened, the LED frame 90 〇 can be disposed above the insulating layer 30. The two positioning frames 80 are positioned at the two ends of the frame frame 9 1 of the led frame 9 and positioned. The LED frame is 90 〇; at the same time, the first elastic arm 23a and the second elastic arm 23b of each of the first and second metal pieces 20a and 2b are elastically contacted with the corresponding light-emitting diodes ❿ The two electrode portions 921 of the second; after that, the upper cover 4 can be inserted, and the slot 41 of the t-check 40 can correspond to the cover of each of the light-emitting diodes 9f, and then, when the circuit board 50 is energized, the voltage The conductive metal member 60 can be transferred to the first and second metal sheets 2a and 2b, and then transferred to the two electrode portions 9 2 of the light-emitting diode 9 2 to test the light-emitting diode 9 2 Whether the light source can be released, the user can visually observe the light and dark condition of the light-emitting diode g 2 through the slot 41 of the upper cover 40, and then test the luminous yield of the Lrn) frame 900. And can be colored with a suitable color pen on the damaged and/or low-luminance light-emitting diodes' to facilitate the removal of the LED frame from the LED light_test fixture, and then Eliminate light-emitting diodes that are damaged and/or low in brightness. Further, the electrode portion which is in contact with the light-emitting diode by the elastic arm has a large contact area. In view of the above, please cooperate with (4) the tenth figure (10). The present invention further proposes a method for using the LED to govern the working light-emitting diode, which comprises the following steps: the system includes a, 2 0 b, a (1) Providing an LED light source test fixture 1 〇〇 base 10, a plurality of first and second metal sheets 2 〇13 200944809 insulating layer 3 0, - upper cover 4 电路 a circuit board 5 〇 and a plurality of conductive metals The connection relationship between the base i 〇, the first and second metal pieces 2 〇a, 2 0 b and the circuit board 50 and the like is described in the above t, and will not be repeated here, and The conductive metal member 6 is attached to the base 0. (2) placing an LED frame g on the LED light source test fixture 0, and the LED frame 90 includes a frame frame 9 1 and a plurality of light-emitting diodes 9 2 in the above description, each The first elastic arm 2 3 a and the second elastic arm 2 3 b of the first and second metal sheets 2 〇a, 20 b are in contact with the two LEDs 9 2 corresponding to the LED 帛 90 〇 The electrode portion 9 2 1 covers the upper cover 4 于 on the LED frame 9 ,, and the slot 4 1 corresponds to the light exiting portion of the LED illuminator g 2 of the LED frame 9 . (2) performing a power-on operation, applying a voltage to the circuit board 5 〇 to electrically conduct to the conductive metal member 6 〇, the first and second metal sheets 2 〇 a, 2 0 b, and the light-emitting diode g 2. The brightness of the light-emitting diodes 9 on the LED frame 9 is electrically tested. In addition, the LED light source test fixture 1 of the step (1) further comprises two positioning frames 8 相对 correspondingly disposed on the two ends of the base 10, so that the frame of the LED frame of step (2) is 90 The ends of the frame 9 are positioned in the two positioning frames 8 。. In addition, after the step (3), the color pen (not shown) is inserted into the slot 4 1 of the upper cover 40, and the light is not generated and/or the brightness is lower than that of the other light-emitting diodes 9 The outer surface of the polar body 9 2 is painted to show the step (4), so that when the voltage is stopped, the light-emitting diode 9 2 with a bad and/or low brightness can be distinguished, and then Can be removed from the frame frame 9 1 and eliminated.
另外，當電性測試發光良率完成後，因本發明之LED 光源測試治具1 〇 〇具有體積小的特性，因此可將LED 架9 0 〇與本發明之LED光源測試治具1 〇 〇直接送入 至一環境測試室内以進行一環境測試之步驟，僅須將電路 板5 0之電連揍部5 1與其相匹備的電連接器相插接 後，即可於環境測室内測試LED架9 0 0上之發光二極 體9 2的可靠度。 是以，透過本發明之LED光源測試治具及使用該led 光源測試治具測試發光二極體的測試方法，具有如下述的 特點： 1、藉由第一、第二金屬片2Qa、2〇b、底座工 0、絕緣層3 0、上蓋4 0、導電性金屬件6 〇及電路板 5 0之組合設計而組成該LED光源測試治具丄〇 〇，其 整體組震及製造簡單方便並不會增加組裝及製造上之困 難度並與1知以人方式將探針逐—插設於工作台上相 ，下可大幅減少人力之工時，進而具有降低成本之效 而能频發光試治具 有第：=:、第二金屬片2〇a、2〇b•彎折延伸 光二極f Q 9 3、第二彈性臂2 3 ^供彈性接觸潑 接觸方4 &兩電極部9 2 1，而免除W減述以探旬 又不足且本發明藉由絕緣層3 〇之設計下，具 200944809 有防止彈性臂被外力不當撞觸而有斷裂之虞，從而更能避 免發光二極體整體之生產製造流程中於後端測試光源製 程作業良率不足。 3、 承上述，經由彈性臂接觸發光二極體9 2的電極 部9 2 1以具有較大的接觸面積，故使用後能防止容易碳 化之情形。 4、 藉由該LED光源測試治具1 〇 〇供LED架9 0 0置設，進而測試發光二極體9 2光源的明暗狀態（發光 〇 良率），經該LED光源測試治具1 〇 〇之設計，使測試方 法的步驟簡單易於檢測並有利於簡化測試步驟，以提高測 試效率。 5、 經由上述LED光源測試治具1 〇 〇之設計而具 有體積小的特性，故可與LED架9 0 0直接送入至環境 測試室内，以測試發光二極體9 2於環境中之可靠度，以 利於簡化製程作業上之流程等。 惟，上述所揭露之圖式、說明，僅為本發明之實施例 而已，凡精於此項技藝者當可依據上述之說明作其他種種 之改良，而這些改變仍屬於本發明之發明精神及以下界定 之專利範圍中。 【圖式簡單說明】 第一圖為本發明之立體組合圖。 第二圖為本發明之立體分解圖。 第二A圖為第二圖之A部份詳圖。 第三圖為本發明之部份立體組合圖。 第四圖為本發明之立體組合圖，其係繪示上蓋呈開啟之狀 16 200944809 態。 第四A圖為第四圖之A部份詳圖。 . 第五圖為本發明繪示LED光源測試治具提供置設LED架 之立體分解圖。 第五A圖為第五圖之A部份詳圖。 第六圖為本發明為本發明繪示LED光源測試治具提供置 設LED架之立體組合圖。 第％圖為本發明繪示LED光源測試治具提供置設LED架 〇 之部份剖視立體圖。 第八圖為第七圖之前視圖。 第九圖為第七圖之側視圖。 第十圖為本發明之步驟流程圖。 【主要元件符號說明】 LED光源測試治具 1〇〇 底座 10 插孔 11 •第-金屬片2 0 a 第一基部 21a 第一連接臂 22a 第一彈性臂 23a 第二金屬片 2 0 b 第二基部 21b 第二連接臂 22b 第二彈性臂 23b 絕緣層 3 0 開口 3 1 17 200944809 上蓋 4 0 槽孔 4 1 第一枢孔 4 2 1 扣片 4 4 電路板 5 0 電連接部 5 1 導電性金屬件 6 0 固定條 7 0 對接部 7 1 定位框 8 0 基條 8 1 枢部 4 2 樞座 4 3 電路接點 5 2 第二枢孔 711 側條 8 2 LED 架.9 0 0 框片架 91 發光二極體 92 電極部 921 18In addition, after the electrical test luminous yield is completed, since the LED light source test fixture 1 of the present invention has a small volume characteristic, the LED frame 90 〇 and the LED light source test fixture of the present invention can be used. The process of directly feeding into an environmental test room for performing an environmental test, only after plugging the electrical connector 5 1 of the circuit board 50 with the electrical connector of the same, can be tested in the environmental test room. The reliability of the LED 92 on the LED frame 900. Therefore, the LED light source test fixture of the present invention and the test method for testing the light-emitting diode using the LED light source test fixture have the following features: 1. By the first and second metal sheets 2Qa, 2〇 b, the base work 0, the insulating layer 30, the upper cover 40, the conductive metal member 6 〇 and the circuit board 50 combination design to form the LED light source test fixture 丄〇〇, the overall group shock and manufacturing is simple and convenient It will not increase the difficulty of assembly and manufacturing, and it will be able to insert the probe on the workbench in a human-like manner. This can greatly reduce the man-hours of manpower, and thus have the effect of reducing cost and energy-emitting luminescence. The treatment has the following: =:, the second metal piece 2〇a, 2〇b • the bent extension light dipole f Q 9 3, the second elastic arm 2 3 ^ for the elastic contact splash contact 4 & the two electrode parts 9 2 1, and the elimination of the W-reduction is not enough, and the invention is designed by the insulating layer 3, and the 200944809 has the function of preventing the elastic arm from being broken by the external force and being broken, thereby avoiding the light-emitting diode. In the overall manufacturing process, the yield of the back-end test light source process is insufficient. 3. In the above, the electrode portion 9 2 1 of the light-emitting diode 92 is contacted via the elastic arm to have a large contact area, so that it is possible to prevent easy carbonization after use. 4, through the LED light source test fixture 1 〇〇 for the LED frame 900 setting, and then test the light and dark state of the light-emitting diode 9 2 light source (luminous 〇 yield), through the LED light source test fixture 1 〇 The design of the test method makes the steps of the test method simple and easy to detect and facilitates the simplification of the test steps to improve the test efficiency. 5, through the above-mentioned LED light source test fixture 1 〇〇 design and has a small size, so it can be directly sent into the environmental test room with the LED frame 900 to test the reliableness of the light-emitting diode 92 in the environment Degree, in order to facilitate the process flow in the process. However, the drawings and descriptions disclosed above are only examples of the present invention, and those skilled in the art can make various other modifications according to the above description, and these changes still belong to the inventive spirit of the present invention. The scope of the patents defined below. BRIEF DESCRIPTION OF THE DRAWINGS The first figure is a three-dimensional combination diagram of the present invention. The second figure is an exploded perspective view of the present invention. Figure 2A is a detailed view of Part A of the second figure. The third figure is a partial perspective combination of the present invention. The fourth figure is a three-dimensional combination diagram of the present invention, which shows the state in which the upper cover is opened 16 200944809. Figure 4A is a detailed view of Part A of the fourth figure. The fifth figure is an exploded perspective view of the LED light source test fixture provided with the LED frame. Figure 5A is a detailed view of Part A of the fifth figure. The sixth figure is a three-dimensional combination diagram of the LED frame provided by the LED light source test fixture according to the present invention. The figure is a partial cross-sectional perspective view of the LED light source test fixture provided with the LED frame 〇. The eighth picture is the front view of the seventh figure. The ninth figure is a side view of the seventh figure. The tenth figure is a flow chart of the steps of the present invention. [Main component symbol description] LED light source test fixture 1 〇〇 base 10 socket 11 • first metal piece 2 0 a first base portion 21a first connecting arm 22a first elastic arm 23a second metal piece 2 0 b second Base 21b Second connecting arm 22b Second resilient arm 23b Insulating layer 3 0 Opening 3 1 17 200944809 Upper cover 4 0 Slot 4 1 First pivot hole 4 2 1 Clasp 4 4 Circuit board 5 0 Electrical connection 5 1 Conductivity Metal part 60 0 Fixing strip 7 0 Butt joint 7 1 Positioning frame 8 0 Base strip 8 1 Shaft 4 2 Pivot seat 4 3 Circuit contact 5 2 Second pivot hole 711 Side strip 8 2 LED frame.9 0 0 Frame piece Rack 91 light-emitting diode 92 electrode portion 921 18