TW200612509A - Semiconductor test system - Google Patents

Semiconductor test system

Info

Publication number
TW200612509A
TW200612509A TW094128240A TW94128240A TW200612509A TW 200612509 A TW200612509 A TW 200612509A TW 094128240 A TW094128240 A TW 094128240A TW 94128240 A TW94128240 A TW 94128240A TW 200612509 A TW200612509 A TW 200612509A
Authority
TW
Taiwan
Prior art keywords
mother board
board
signals
analog signals
pass
Prior art date
Application number
TW094128240A
Other languages
English (en)
Inventor
Yoshito Tanaka
Original Assignee
Test Res Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Test Res Lab Inc filed Critical Test Res Lab Inc
Publication of TW200612509A publication Critical patent/TW200612509A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW094128240A 2004-08-26 2005-08-18 Semiconductor test system TW200612509A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2004/012693 WO2006022026A1 (ja) 2004-08-26 2004-08-26 半導体のテストシステム

Publications (1)

Publication Number Publication Date
TW200612509A true TW200612509A (en) 2006-04-16

Family

ID=35967249

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094128240A TW200612509A (en) 2004-08-26 2005-08-18 Semiconductor test system

Country Status (7)

Country Link
US (1) US20070162800A1 (zh)
EP (1) EP1783504A1 (zh)
JP (1) JPWO2006022026A1 (zh)
CN (1) CN101069101A (zh)
CA (1) CA2578060A1 (zh)
TW (1) TW200612509A (zh)
WO (1) WO2006022026A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416117B (zh) * 2009-10-28 2013-11-21 Mpi Corp 探針卡

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5817236B2 (ja) * 2011-06-17 2015-11-18 株式会社Sumco 半導体試料中の金属汚染評価方法および半導体基板の製造方法
US8860448B2 (en) * 2011-07-15 2014-10-14 Taiwan Semiconductor Manufacturing Company, Ltd. Test schemes and apparatus for passive interposers
JP2014071089A (ja) * 2012-10-02 2014-04-21 Hioki Ee Corp 基板検査装置
TWI451108B (zh) * 2013-01-17 2014-09-01 Test Research Inc 時序分析裝置及時序分析方法
CN103694176B (zh) 2014-01-07 2015-02-18 苏州立新制药有限公司 尼洛替尼中间体的制备方法
CN104808133B (zh) * 2014-01-24 2018-02-06 矽创电子股份有限公司 自动测试设备和升级自动测试设备的集成电路测试界面
TWM488641U (zh) * 2014-01-24 2014-10-21 Sitronix Technology Corp 自動測試設備的積體電路測試介面
US11221365B2 (en) * 2020-03-11 2022-01-11 Teradyne, Inc. Calibrating an interface board
CN113078962B (zh) * 2021-03-19 2022-12-09 Oppo广东移动通信有限公司 射频校准方法、射频校准装置、测试设备及存储介质

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58174864A (ja) * 1982-04-08 1983-10-13 Toshiba Corp 回路診断装置
JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
JP3235402B2 (ja) * 1995-05-11 2001-12-04 株式会社明電舎 ディジタル保護継電器
US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters
JPH11190765A (ja) * 1997-10-20 1999-07-13 Advantest Corp 半導体試験装置
JP3157782B2 (ja) * 1998-07-23 2001-04-16 茨城日本電気株式会社 Ｉｃソケット
JP4272726B2 (ja) * 1998-10-08 2009-06-03 株式会社アドバンテスト Ｉｃ試験方法及び装置
JP2000321315A (ja) * 1999-05-07 2000-11-24 Harness Syst Tech Res Ltd 実装基板の検査方法および装置
JP2001337133A (ja) * 2000-05-26 2001-12-07 Yokogawa Electric Corp Ｉｃテスタ
JP2004048383A (ja) * 2002-07-11 2004-02-12 Renesas Technology Corp 送受信システムおよび通信用半導体集積回路並びにテスト方法
TWI241071B (en) * 2004-06-30 2005-10-01 Univ Nat Cheng Kung Test framework and test method of analog to digital converter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416117B (zh) * 2009-10-28 2013-11-21 Mpi Corp 探針卡

Also Published As

Publication number Publication date
JPWO2006022026A1 (ja) 2008-05-08
EP1783504A1 (en) 2007-05-09
CN101069101A (zh) 2007-11-07
US20070162800A1 (en) 2007-07-12
WO2006022026A1 (ja) 2006-03-02
CA2578060A1 (en) 2006-03-02

Similar Documents

Publication Publication Date Title
TW200612509A (en) Semiconductor test system
TW200717002A (en) Electronic device having and interface supported testing mode
TW200724950A (en) Architecture and method for testing of an integrated circuit device
EP1296154A3 (en) Semiconductor integrated circuit
US8174277B2 (en) Compensation for voltage drop in automatic test equipment
MY147606A (en) System for testing and sorting electronic components
TW200704809A (en) Test equipment of semiconductor devices
AU2001268630A1 (en) Systems for testing integraged circuits during burn-in
WO2006102419A3 (en) Automated electrical wiring inspection system
TW200706899A (en) Active diagnostic interface for wafer probe applications
WO2003100446A3 (en) High performance probe system for testing semiconductor wafers
TW200634320A (en) Handler for testing semiconductor devices
USRE41516E1 (en) Socketless/boardless test interposer card
WO2004077524A3 (en) Method and apparatus for test and characterization of semiconductor components
TW200602649A (en) Parallel calibration system for a test device
WO2008146622A1 (ja) 電子機器のノイズ測定方法
US20080109179A1 (en) Signal measuring apparatus and semiconductor testing apparatus
US7598728B2 (en) System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms
TWI559325B (zh) 高頻記憶體之測試裝置及測試方法
WO2010014474A3 (en) High signal level compliant input/output circuits
TW200632348A (en) Semiconductor device, measuring device, and measuring method
KR20080089348A (ko) 캘리브레이션 회로
GB0602641D0 (en) High speed data processing system
KR100710185B1 (ko) 반도체 소자의 검사장치
WO2007027758A3 (en) Functional cells for automated i/o timing characterization of an integrated circuit