TW200612509A - Semiconductor test system - Google Patents
Semiconductor test systemInfo
- Publication number
- TW200612509A TW200612509A TW094128240A TW94128240A TW200612509A TW 200612509 A TW200612509 A TW 200612509A TW 094128240 A TW094128240 A TW 094128240A TW 94128240 A TW94128240 A TW 94128240A TW 200612509 A TW200612509 A TW 200612509A
- Authority
- TW
- Taiwan
- Prior art keywords
- mother board
- board
- signals
- analog signals
- pass
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2004/012693 WO2006022026A1 (ja) | 2004-08-26 | 2004-08-26 | 半導体のテストシステム |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200612509A true TW200612509A (en) | 2006-04-16 |
Family
ID=35967249
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094128240A TW200612509A (en) | 2004-08-26 | 2005-08-18 | Semiconductor test system |
Country Status (7)
Country | Link |
---|---|
US (1) | US20070162800A1 (zh) |
EP (1) | EP1783504A1 (zh) |
JP (1) | JPWO2006022026A1 (zh) |
CN (1) | CN101069101A (zh) |
CA (1) | CA2578060A1 (zh) |
TW (1) | TW200612509A (zh) |
WO (1) | WO2006022026A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416117B (zh) * | 2009-10-28 | 2013-11-21 | Mpi Corp | 探針卡 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5817236B2 (ja) * | 2011-06-17 | 2015-11-18 | 株式会社Sumco | 半導体試料中の金属汚染評価方法および半導体基板の製造方法 |
US8860448B2 (en) * | 2011-07-15 | 2014-10-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Test schemes and apparatus for passive interposers |
JP2014071089A (ja) * | 2012-10-02 | 2014-04-21 | Hioki Ee Corp | 基板検査装置 |
TWI451108B (zh) * | 2013-01-17 | 2014-09-01 | Test Research Inc | 時序分析裝置及時序分析方法 |
CN103694176B (zh) | 2014-01-07 | 2015-02-18 | 苏州立新制药有限公司 | 尼洛替尼中间体的制备方法 |
CN104808133B (zh) * | 2014-01-24 | 2018-02-06 | 矽创电子股份有限公司 | 自动测试设备和升级自动测试设备的集成电路测试界面 |
TWM488641U (zh) * | 2014-01-24 | 2014-10-21 | Sitronix Technology Corp | 自動測試設備的積體電路測試介面 |
US11221365B2 (en) * | 2020-03-11 | 2022-01-11 | Teradyne, Inc. | Calibrating an interface board |
CN113078962B (zh) * | 2021-03-19 | 2022-12-09 | Oppo广东移动通信有限公司 | 射频校准方法、射频校准装置、测试设备及存储介质 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58174864A (ja) * | 1982-04-08 | 1983-10-13 | Toshiba Corp | 回路診断装置 |
JPH04212524A (ja) * | 1990-12-06 | 1992-08-04 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP3235402B2 (ja) * | 1995-05-11 | 2001-12-04 | 株式会社明電舎 | ディジタル保護継電器 |
US5659312A (en) * | 1996-06-14 | 1997-08-19 | Logicvision, Inc. | Method and apparatus for testing digital to analog and analog to digital converters |
JPH11190765A (ja) * | 1997-10-20 | 1999-07-13 | Advantest Corp | 半導体試験装置 |
JP3157782B2 (ja) * | 1998-07-23 | 2001-04-16 | 茨城日本電気株式会社 | Icソケット |
JP4272726B2 (ja) * | 1998-10-08 | 2009-06-03 | 株式会社アドバンテスト | Ic試験方法及び装置 |
JP2000321315A (ja) * | 1999-05-07 | 2000-11-24 | Harness Syst Tech Res Ltd | 実装基板の検査方法および装置 |
JP2001337133A (ja) * | 2000-05-26 | 2001-12-07 | Yokogawa Electric Corp | Icテスタ |
JP2004048383A (ja) * | 2002-07-11 | 2004-02-12 | Renesas Technology Corp | 送受信システムおよび通信用半導体集積回路並びにテスト方法 |
TWI241071B (en) * | 2004-06-30 | 2005-10-01 | Univ Nat Cheng Kung | Test framework and test method of analog to digital converter |
-
2004
- 2004-08-26 CN CNA2004800442482A patent/CN101069101A/zh active Pending
- 2004-08-26 CA CA002578060A patent/CA2578060A1/en not_active Abandoned
- 2004-08-26 EP EP04772649A patent/EP1783504A1/en not_active Withdrawn
- 2004-08-26 JP JP2006531218A patent/JPWO2006022026A1/ja not_active Withdrawn
- 2004-08-26 WO PCT/JP2004/012693 patent/WO2006022026A1/ja not_active Application Discontinuation
-
2005
- 2005-08-18 TW TW094128240A patent/TW200612509A/zh unknown
-
2007
- 2007-02-21 US US11/677,155 patent/US20070162800A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416117B (zh) * | 2009-10-28 | 2013-11-21 | Mpi Corp | 探針卡 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2006022026A1 (ja) | 2008-05-08 |
EP1783504A1 (en) | 2007-05-09 |
CN101069101A (zh) | 2007-11-07 |
US20070162800A1 (en) | 2007-07-12 |
WO2006022026A1 (ja) | 2006-03-02 |
CA2578060A1 (en) | 2006-03-02 |
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