TW200514485A - Adapter method and apparatus for interfacing a tester with a device under test - Google Patents
Adapter method and apparatus for interfacing a tester with a device under testInfo
- Publication number
- TW200514485A TW200514485A TW093111111A TW93111111A TW200514485A TW 200514485 A TW200514485 A TW 200514485A TW 093111111 A TW093111111 A TW 093111111A TW 93111111 A TW93111111 A TW 93111111A TW 200514485 A TW200514485 A TW 200514485A
- Authority
- TW
- Taiwan
- Prior art keywords
- tester
- interface assembly
- under test
- device under
- assembly
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/3025—Wireless interface with the DUT
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/685,327 US7009381B2 (en) | 2002-03-21 | 2003-10-10 | Adapter method and apparatus for interfacing a tester with a device under test |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200514485A true TW200514485A (en) | 2005-04-16 |
Family
ID=33452809
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093111111A TW200514485A (en) | 2003-10-10 | 2004-04-21 | Adapter method and apparatus for interfacing a tester with a device under test |
Country Status (5)
Country | Link |
---|---|
US (1) | US7009381B2 (zh) |
CN (1) | CN1605881A (zh) |
DE (1) | DE102004030586A1 (zh) |
GB (1) | GB2407643A (zh) |
TW (1) | TW200514485A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI494569B (zh) * | 2009-04-03 | 2015-08-01 | Dtg Int Gmbh | 用於測試印刷電路板之測試裝置的接觸單元 |
TWI631345B (zh) * | 2015-08-07 | 2018-08-01 | 美商克斯希拉公司 | 用於測試電路板之平行測試器的定位裝置及用於測試電路板的平行測試器 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7375542B2 (en) * | 2004-06-30 | 2008-05-20 | Teradyne, Inc. | Automated test equipment with DIB mounted three dimensional tester electronics bricks |
JP3875254B2 (ja) * | 2005-05-30 | 2007-01-31 | 株式会社アドバンテスト | 半導体試験装置及びインターフェースプレート |
EP1904861A4 (en) * | 2005-07-08 | 2013-05-29 | Formfactor Inc | TEST CARD ASSEMBLY WITH AN INTERCHANGEABLE TEST INSERT |
SG131801A1 (en) * | 2005-10-20 | 2007-05-28 | Agilent Technologies Inc | No-wire pcb with integrated circuit and method for testing using the same |
US20090179657A1 (en) * | 2008-01-11 | 2009-07-16 | Eddie Lee Williamson | Printed circuit board for coupling probes to a tester, and apparatus and test system using same |
CN103308844B (zh) * | 2012-03-16 | 2016-03-16 | 展讯通信(上海)有限公司 | 测试样板、故障定位方法、控制板和夹具的调试方法 |
CN104345189B (zh) * | 2013-08-05 | 2018-08-10 | 深圳市共进电子股份有限公司 | 治具制作方法和治具 |
CN104316731B (zh) * | 2014-10-29 | 2017-09-29 | 上海华岭集成电路技术股份有限公司 | 芯片测试板及芯片测试*** |
CN105866654A (zh) * | 2016-05-25 | 2016-08-17 | 上海华岭集成电路技术股份有限公司 | 晶圆测试的控制方法 |
CN106324460B (zh) * | 2016-11-08 | 2024-03-22 | 沈小晴 | 一种可换针盘式通用测试机构 |
USD851516S1 (en) * | 2018-02-05 | 2019-06-18 | Virginia Panel Corporation | Interface test adapter |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK291184D0 (da) | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
EP0305734A3 (de) | 1987-08-26 | 1989-04-05 | Siemens Aktiengesellschaft | Prüfanordnung für Leiterplatten |
GB2214362A (en) | 1988-01-13 | 1989-08-31 | Gab Hsu | Detachable open/short testing fixture device for testing P.C. Boards |
FR2634025B1 (fr) | 1988-07-08 | 1990-11-09 | Thomson Csf | Adaptateur de brochage pour le test de circuits imprimes de haute densite |
DE3838413A1 (de) * | 1988-11-12 | 1990-05-17 | Mania Gmbh | Adapter fuer elektronische pruefvorrichtungen fuer leiterplatten und dergl. |
US5457380A (en) | 1994-05-11 | 1995-10-10 | Genrad, Inc. | Circuit-test fixture that includes shorted-together probes |
US5602490A (en) * | 1995-03-14 | 1997-02-11 | Genrad, Inc. | Connector for automatic test equipment |
US5896037A (en) * | 1996-10-10 | 1999-04-20 | Methode Electronics, Inc. | Interface test adapter for actively testing an integrated circuit chip package |
NL1004510C2 (nl) | 1996-11-12 | 1998-05-14 | Charmant Beheer B V | Werkwijze voor het vervaardigen van een test-adapter alsmede test-adapter en een werkwijze voor het testen van printplaten. |
US5986447A (en) | 1997-05-23 | 1999-11-16 | Credence Systems Corporation | Test head structure for integrated circuit tester |
US6429671B1 (en) * | 1998-11-25 | 2002-08-06 | Advanced Micro Devices, Inc. | Electrical test probe card having a removable probe head assembly with alignment features and a method for aligning the probe head assembly to the probe card |
US6476628B1 (en) | 1999-06-28 | 2002-11-05 | Teradyne, Inc. | Semiconductor parallel tester |
US6650134B1 (en) | 2000-02-29 | 2003-11-18 | Charles A. Schein | Adapter assembly for connecting test equipment to a wireless test fixture |
US6828773B2 (en) * | 2002-03-21 | 2004-12-07 | Agilent Technologies, Inc. | Adapter method and apparatus for interfacing a tester with a device under test |
US6759842B2 (en) | 2002-04-17 | 2004-07-06 | Eagle Test Systems, Inc. | Interface adapter for automatic test systems |
-
2003
- 2003-10-10 US US10/685,327 patent/US7009381B2/en not_active Expired - Fee Related
-
2004
- 2004-04-21 TW TW093111111A patent/TW200514485A/zh unknown
- 2004-05-17 CN CNA2004100347884A patent/CN1605881A/zh active Pending
- 2004-06-24 DE DE102004030586A patent/DE102004030586A1/de not_active Ceased
- 2004-10-07 GB GB0422306A patent/GB2407643A/en not_active Withdrawn
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI494569B (zh) * | 2009-04-03 | 2015-08-01 | Dtg Int Gmbh | 用於測試印刷電路板之測試裝置的接觸單元 |
TWI631345B (zh) * | 2015-08-07 | 2018-08-01 | 美商克斯希拉公司 | 用於測試電路板之平行測試器的定位裝置及用於測試電路板的平行測試器 |
Also Published As
Publication number | Publication date |
---|---|
GB2407643A (en) | 2005-05-04 |
US20040108848A1 (en) | 2004-06-10 |
DE102004030586A1 (de) | 2005-05-12 |
CN1605881A (zh) | 2005-04-13 |
US7009381B2 (en) | 2006-03-07 |
GB0422306D0 (en) | 2004-11-10 |
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