SG11201801519PA - Ic test system - Google Patents
Ic test systemInfo
- Publication number
- SG11201801519PA SG11201801519PA SG11201801519PA SG11201801519PA SG11201801519PA SG 11201801519P A SG11201801519P A SG 11201801519PA SG 11201801519P A SG11201801519P A SG 11201801519PA SG 11201801519P A SG11201801519P A SG 11201801519PA SG 11201801519P A SG11201801519P A SG 11201801519PA
- Authority
- SG
- Singapore
- Prior art keywords
- test system
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
- G01R31/287—Procedures; Software aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2015/074755 WO2017037844A1 (ja) | 2015-08-31 | 2015-08-31 | Ic試験システム |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201801519PA true SG11201801519PA (en) | 2018-03-28 |
Family
ID=58188789
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201801519PA SG11201801519PA (en) | 2015-08-31 | 2015-08-31 | Ic test system |
Country Status (7)
Country | Link |
---|---|
US (1) | US10527669B2 (ja) |
EP (1) | EP3346280B8 (ja) |
JP (1) | JP6789221B2 (ja) |
KR (1) | KR20180035856A (ja) |
CN (1) | CN108450015B (ja) |
SG (1) | SG11201801519PA (ja) |
WO (1) | WO2017037844A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106950490B (zh) * | 2017-05-05 | 2019-05-10 | 福州派利德电子科技有限公司 | 下压式ic芯片检测机构 |
TWI676031B (zh) * | 2018-09-06 | 2019-11-01 | 致茂電子股份有限公司 | 滑移式電子元件測試裝置 |
KR20200121188A (ko) * | 2019-04-15 | 2020-10-23 | 주식회사 아테코 | 핸드 티칭 기능이 구비된 전자부품 테스트 핸들러 및 이를 이용한 핸드 티칭 방법 |
JP7362507B2 (ja) * | 2020-02-25 | 2023-10-17 | 株式会社Nsテクノロジーズ | 電子部品搬送装置、電子部品検査装置およびポケット位置検出方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0658986A (ja) | 1992-08-07 | 1994-03-04 | Fujitsu Miyagi Electron:Kk | 半導体試験装置 |
JPH0974128A (ja) * | 1995-09-05 | 1997-03-18 | Hitachi Electron Eng Co Ltd | Icパッケージの真空吸着ハンド |
JPH1068759A (ja) * | 1996-05-31 | 1998-03-10 | Advantest Corp | 吸着物検知装置、該装置を用いた吸着物検知方法、該装置を用いた位置ずれ検知方法、および該装置を用いた清掃方法 |
KR100351052B1 (ko) * | 2000-03-30 | 2002-09-05 | 삼성전자 주식회사 | 패키지 가이더가 있는 반도체 패키지 가공용 로더 및 그사용방법 |
JP4327335B2 (ja) * | 2000-06-23 | 2009-09-09 | 株式会社アドバンテスト | コンタクトアームおよびこれを用いた電子部品試験装置 |
JP2003344483A (ja) * | 2002-05-31 | 2003-12-03 | Fujitsu Ltd | ハンドリング装置およびこれを使用した試験装置 |
CN1319215C (zh) * | 2003-07-18 | 2007-05-30 | 威盛电子股份有限公司 | 电子元件测试插置座的移动限位件 |
KR100861006B1 (ko) * | 2007-02-28 | 2008-09-30 | (주)테크윙 | 테스트핸들러용 테스트트레이 이송장치 |
JP2008243861A (ja) * | 2007-03-23 | 2008-10-09 | Tokyo Electron Ltd | 検査装置及び検査方法 |
KR100857603B1 (ko) * | 2007-03-29 | 2008-09-09 | 삼성전자주식회사 | 전자부품 검사 시스템 및 그 제어방법 |
TWI342950B (en) * | 2007-08-17 | 2011-06-01 | Hon Tech Inc | Testing means for use in loading fixture of elements |
JP2009145153A (ja) | 2007-12-13 | 2009-07-02 | Yamaha Motor Co Ltd | 電子部品試験装置および電子部品試験方法 |
CN101567327B (zh) * | 2008-04-23 | 2010-09-08 | 中茂电子(深圳)有限公司 | 裸晶测试机台用缓冲分类装置及该机台 |
US8542029B1 (en) * | 2009-02-10 | 2013-09-24 | Xilinx, Inc. | Methods and apparatus for testing of integrated circuits |
DE112010000775B4 (de) * | 2009-02-12 | 2016-03-17 | Kyoto University | Industrierobotersystem |
CN201820770U (zh) * | 2010-06-08 | 2011-05-04 | 致茂电子(苏州)有限公司 | 一种用于太阳能硅芯片检测机台的缓冲输送检测装置 |
JP5212520B2 (ja) * | 2011-06-23 | 2013-06-19 | セイコーエプソン株式会社 | 電子部品ハンドラ及びハンドラ |
JP2013053991A (ja) | 2011-09-06 | 2013-03-21 | Seiko Epson Corp | ハンドラー及び部品検査装置 |
CN203546850U (zh) * | 2013-09-25 | 2014-04-16 | 李飞宇 | 一种进水阀、排水阀失效和马桶堵塞的自动保护装置 |
TWI494576B (zh) | 2013-12-03 | 2015-08-01 | Tohoku Seiki Ind Co Ltd | IC processor |
KR102122325B1 (ko) * | 2013-12-03 | 2020-06-12 | 해피재팬, 인크. | Ic 핸들러 |
-
2015
- 2015-08-31 KR KR1020187005783A patent/KR20180035856A/ko not_active Application Discontinuation
- 2015-08-31 US US15/756,435 patent/US10527669B2/en active Active
- 2015-08-31 SG SG11201801519PA patent/SG11201801519PA/en unknown
- 2015-08-31 JP JP2017537106A patent/JP6789221B2/ja active Active
- 2015-08-31 CN CN201580082746.4A patent/CN108450015B/zh active Active
- 2015-08-31 EP EP15902966.9A patent/EP3346280B8/en active Active
- 2015-08-31 WO PCT/JP2015/074755 patent/WO2017037844A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
CN108450015B (zh) | 2021-07-02 |
EP3346280A1 (en) | 2018-07-11 |
WO2017037844A1 (ja) | 2017-03-09 |
CN108450015A (zh) | 2018-08-24 |
US10527669B2 (en) | 2020-01-07 |
JPWO2017037844A1 (ja) | 2018-06-14 |
EP3346280A4 (en) | 2019-05-08 |
JP6789221B2 (ja) | 2020-11-25 |
EP3346280B8 (en) | 2021-12-29 |
KR20180035856A (ko) | 2018-04-06 |
EP3346280B1 (en) | 2021-08-18 |
US20180267097A1 (en) | 2018-09-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG10201913112TA (en) | Chip measurement system | |
EP3457409C0 (en) | POINT OF CARE TEST SYSTEM | |
GB201514084D0 (en) | Planar test system | |
GB201819585D0 (en) | Wafer test system | |
GB2522657B (en) | Bollard testing system | |
GB2545496B (en) | A Test System | |
GB2537562B (en) | Measurement system | |
EP4027134C0 (en) | INSPECTION SYSTEM | |
SG11201708899UA (en) | Device handler | |
SG11201801519PA (en) | Ic test system | |
GB2549622B (en) | Fixing device | |
GB201504373D0 (en) | Computer system testing | |
GB201507546D0 (en) | Fixing device | |
GB201417271D0 (en) | Testing devices | |
GB2539674B (en) | Test apparatus | |
GB201508054D0 (en) | Test apparatus | |
GB201621664D0 (en) | Measurement system | |
GB201512667D0 (en) | Measuring device | |
PL3079209T3 (pl) | Urządzenie mocujące | |
GB2522037B (en) | Test arrangement | |
TWM533745U (en) | Measuring system | |
GB2552143B (en) | Test Arrangement | |
GB2541526B (en) | Measuring device | |
GB201608849D0 (en) | Measurement System | |
TWI562463B (en) | Test connector |