SG11201801292PA - Polishing method and polishing apparatus - Google Patents

Polishing method and polishing apparatus

Info

Publication number
SG11201801292PA
SG11201801292PA SG11201801292PA SG11201801292PA SG11201801292PA SG 11201801292P A SG11201801292P A SG 11201801292PA SG 11201801292P A SG11201801292P A SG 11201801292PA SG 11201801292P A SG11201801292P A SG 11201801292PA SG 11201801292P A SG11201801292P A SG 11201801292PA
Authority
SG
Singapore
Prior art keywords
polishing
polishing apparatus
polishing method
Prior art date
Application number
SG11201801292PA
Inventor
Junichi Ueno
Michito Sato
Kaoru Ishii
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Publication of SG11201801292PA publication Critical patent/SG11201801292PA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • B24B37/015Temperature control
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/0076Other grinding machines or devices grinding machines comprising two or more grinding tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/14Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/02Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant
    • B24B55/03Equipment for cooling the grinding surfaces, e.g. devices for feeding coolant designed as a complete equipment for feeding or clarifying coolant
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/228Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67207Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • H01L21/67219Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
SG11201801292PA 2015-09-03 2016-08-16 Polishing method and polishing apparatus SG11201801292PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015173929A JP6376085B2 (en) 2015-09-03 2015-09-03 Polishing method and polishing apparatus
PCT/JP2016/003745 WO2017038032A1 (en) 2015-09-03 2016-08-16 Polishing method and polishing apparatus

Publications (1)

Publication Number Publication Date
SG11201801292PA true SG11201801292PA (en) 2018-03-28

Family

ID=58186949

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201801292PA SG11201801292PA (en) 2015-09-03 2016-08-16 Polishing method and polishing apparatus

Country Status (8)

Country Link
US (1) US10537972B2 (en)
JP (1) JP6376085B2 (en)
KR (1) KR102545528B1 (en)
CN (1) CN107921606B (en)
DE (1) DE112016003359T5 (en)
SG (1) SG11201801292PA (en)
TW (1) TWI694893B (en)
WO (1) WO2017038032A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6883475B2 (en) 2017-06-06 2021-06-09 株式会社荏原製作所 Polishing table and polishing equipment equipped with it
EP4182119A1 (en) * 2020-07-14 2023-05-24 Applied Materials, Inc. Methods of detecting non-conforming substrate processing events during chemical mechanical polishing

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4313284A (en) * 1980-03-27 1982-02-02 Monsanto Company Apparatus for improving flatness of polished wafers
US4450652A (en) * 1981-09-04 1984-05-29 Monsanto Company Temperature control for wafer polishing
JPH0699350A (en) * 1992-09-18 1994-04-12 Toshiba Mach Co Ltd Temperature control method for surface plate
US5700180A (en) * 1993-08-25 1997-12-23 Micron Technology, Inc. System for real-time control of semiconductor wafer polishing
JP2850803B2 (en) * 1995-08-01 1999-01-27 信越半導体株式会社 Wafer polishing method
JP2862073B2 (en) 1995-12-08 1999-02-24 日本電気株式会社 Wafer polishing method
JP3672685B2 (en) * 1996-11-29 2005-07-20 松下電器産業株式会社 Polishing method and polishing apparatus
US6121144A (en) * 1997-12-29 2000-09-19 Intel Corporation Low temperature chemical mechanical polishing of dielectric materials
JP2000202765A (en) * 1999-01-12 2000-07-25 Ebara Corp Washing device for abrasive material flowmeter of polishing device, washing method and polishing device
US6224461B1 (en) * 1999-03-29 2001-05-01 Lam Research Corporation Method and apparatus for stabilizing the process temperature during chemical mechanical polishing
JP2000301440A (en) * 1999-04-22 2000-10-31 Toshiba Ceramics Co Ltd Surface grinder and semiconductor wafer grinding method using it
US6358119B1 (en) * 1999-06-21 2002-03-19 Taiwan Semiconductor Manufacturing Company Way to remove CU line damage after CU CMP
TW458849B (en) * 1999-07-23 2001-10-11 Applied Materials Inc Temperature control device for chemical mechanical polishing
US6299516B1 (en) * 1999-09-28 2001-10-09 Applied Materials, Inc. Substrate polishing article
WO2001056742A1 (en) * 2000-01-31 2001-08-09 Shin-Etsu Handotai Co., Ltd. Polishing device and method
EP1175964A3 (en) * 2000-07-27 2003-07-23 Agere Systems Guardian Corporation Polishing surface temperature conditioning system for a chemical mechanical planarization process
US6485359B1 (en) * 2000-09-15 2002-11-26 Applied Materials, Inc. Platen arrangement for a chemical-mechanical planarization apparatus
TW542049U (en) * 2001-07-18 2003-07-11 Taiwan Semiconductor Mfg Apparatus for preventing CMP polishing slurry from scraping wafer
JP4186692B2 (en) * 2003-05-08 2008-11-26 ソニー株式会社 Polishing equipment
US20040266192A1 (en) * 2003-06-30 2004-12-30 Lam Research Corporation Application of heated slurry for CMP
JP2006239808A (en) * 2005-03-03 2006-09-14 Nec Electronics Corp Polishing device
JP4757580B2 (en) * 2005-09-16 2011-08-24 株式会社荏原製作所 Polishing method, polishing apparatus, and program for controlling polishing apparatus
KR100755011B1 (en) * 2005-12-14 2007-09-06 주식회사 실트론 Polishing plate, and polishing apparatus, polishing method using thereof
JP4902433B2 (en) * 2007-06-13 2012-03-21 株式会社荏原製作所 Polishing surface heating and cooling device for polishing equipment
DE102007063232B4 (en) * 2007-12-31 2023-06-22 Advanced Micro Devices, Inc. Process for polishing a substrate
US8172641B2 (en) * 2008-07-17 2012-05-08 Taiwan Semiconductor Manufacturing Co., Ltd. CMP by controlling polish temperature
JP5632132B2 (en) * 2009-02-27 2014-11-26 株式会社荏原製作所 Substrate processing method
TWI613037B (en) * 2011-07-19 2018-02-01 荏原製作所股份有限公司 Polishing method
JP2013099814A (en) * 2011-11-08 2013-05-23 Toshiba Corp Polishing method and polishing apparatus
US9005999B2 (en) * 2012-06-30 2015-04-14 Applied Materials, Inc. Temperature control of chemical mechanical polishing
TWI540624B (en) * 2012-07-25 2016-07-01 應用材料股份有限公司 Temperature control of chemical mechanical polishing
CN103753380B (en) * 2013-12-18 2016-04-20 河南科技学院 Based on the chemically mechanical polishing interface temperature detecting and controlling system of wireless transmission

Also Published As

Publication number Publication date
US10537972B2 (en) 2020-01-21
TWI694893B (en) 2020-06-01
KR102545528B1 (en) 2023-06-20
KR20180048668A (en) 2018-05-10
WO2017038032A1 (en) 2017-03-09
US20180229344A1 (en) 2018-08-16
CN107921606A (en) 2018-04-17
JP6376085B2 (en) 2018-08-22
JP2017047513A (en) 2017-03-09
CN107921606B (en) 2019-07-09
DE112016003359T5 (en) 2018-04-05
TW201711806A (en) 2017-04-01

Similar Documents

Publication Publication Date Title
SG10201707291RA (en) Polishing apparatus and polishing method
SG10201501574SA (en) Polishing apparatus and polishing method
GB201521341D0 (en) Apparatus and method
GB2538806B (en) Method and apparatus
GB201522727D0 (en) Apparatus and method
GB201510322D0 (en) Apparatus and method
SG10201608243QA (en) Polishing apparatus and polishing method
SG10202101299QA (en) Polishing apparatus and polishing method
SG11201707991SA (en) Polishing apparatus and polishing method
GB201503194D0 (en) Method and apparatus
SG10201607236YA (en) Polishing apparatus and polishing method
GB2577837B (en) Apparatus and method
SG10201508881RA (en) Polishing Apparatus And Polishing Method
GB201515111D0 (en) Method and apparatus
SG10201500455QA (en) Polishing method and polishing apparatus
SG11201801292PA (en) Polishing method and polishing apparatus
GB201603641D0 (en) Apparatus and method
GB201523095D0 (en) Apparatus and method
GB201519859D0 (en) Method and apparatus
GB201507917D0 (en) Apparatus and method
GB201502322D0 (en) Apparatus and method
TWI563586B (en) Substrate-separating apparatus and substrate-separating method
GB201523097D0 (en) Apparatus and method
GB201517314D0 (en) Apparatus and method
GB2542824B (en) Apparatus and Method