NO20061073L - Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon - Google Patents
Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjonInfo
- Publication number
- NO20061073L NO20061073L NO20061073A NO20061073A NO20061073L NO 20061073 L NO20061073 L NO 20061073L NO 20061073 A NO20061073 A NO 20061073A NO 20061073 A NO20061073 A NO 20061073A NO 20061073 L NO20061073 L NO 20061073L
- Authority
- NO
- Norway
- Prior art keywords
- capacitance detection
- diodes
- detection circuit
- signal line
- capacitance
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R3/00—Circuits for transducers, loudspeakers or microphones
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Amplifiers (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Det er tilveiebrakt en kapasitansdeteksjonskrets omfattende en inputbeskyttelseskrets og som har høy følsomhet. En kapasitansdeteksjonskrets (20) for detektering av kapasitansen til en kapasitiv sensor (Cs), omfattende en bufferforsterker (12) koplet sammen med den kapasitive sensoren (Cs) via en signalledning (13) og som har en spenningsforsterkning på l; dioder (Dpl, Dp2) koplet i serie mellom signalledningen (13) og en positiv energitilførsel (+Vdd); dioder (Dm1, Dm2) sammenkoplet i serie mellom signalledningen (13) og en negativ energitilførsel (-Vdd), der en outputterminal av bufferforsterkeren (12) er koplet til et krysningspunkt (21a) av diodene (Dpl og Dp2) og til et krysningspunkt (21b) av diodene (Dml og Dm2).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003287991A JP3693665B2 (ja) | 2003-08-06 | 2003-08-06 | 容量検出回路及び容量検出方法 |
PCT/JP2004/011577 WO2005015246A1 (ja) | 2003-08-06 | 2004-08-05 | 容量検出回路及び容量検出方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
NO20061073L true NO20061073L (no) | 2006-05-05 |
Family
ID=34131497
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20061073A NO20061073L (no) | 2003-08-06 | 2006-03-06 | Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon |
Country Status (8)
Country | Link |
---|---|
US (1) | US7557590B2 (no) |
EP (1) | EP1686383A4 (no) |
JP (1) | JP3693665B2 (no) |
KR (1) | KR100655258B1 (no) |
CN (1) | CN100478691C (no) |
NO (1) | NO20061073L (no) |
TW (1) | TWI266061B (no) |
WO (1) | WO2005015246A1 (no) |
Families Citing this family (31)
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TWI240403B (en) * | 2004-04-29 | 2005-09-21 | Via Tech Inc | Electrostatic discharge protection circuit |
KR20070078522A (ko) * | 2006-01-27 | 2007-08-01 | 삼성전자주식회사 | 표시 장치 및 액정 표시 장치 |
JP4816487B2 (ja) * | 2007-02-13 | 2011-11-16 | アイシン精機株式会社 | 静電容量検出装置 |
US8711129B2 (en) * | 2007-01-03 | 2014-04-29 | Apple Inc. | Minimizing mismatch during compensation |
US8049732B2 (en) * | 2007-01-03 | 2011-11-01 | Apple Inc. | Front-end signal compensation |
CN101281220B (zh) * | 2008-01-02 | 2010-09-29 | 清华大学 | 电容检测电路及其电容式传感器接口电路芯片 |
TWI383310B (zh) * | 2008-03-14 | 2013-01-21 | Tpo Displays Corp | 控制方法、電路及電子系統 |
DE102008057823A1 (de) * | 2008-11-18 | 2010-08-19 | Ident Technology Ag | Kapazitives Sensorsystem |
EP2299284A1 (en) * | 2009-09-18 | 2011-03-23 | ABB Technology AG | Method, capacitance meter, and computer program product for improved capacitance measurement |
JP2011170616A (ja) * | 2010-02-18 | 2011-09-01 | On Semiconductor Trading Ltd | 静電容量型タッチセンサ |
CN102193695A (zh) * | 2010-03-05 | 2011-09-21 | 启迪科技股份有限公司 | 触控面板测试设备及其检测装置 |
EP2413149A1 (en) * | 2010-07-29 | 2012-02-01 | Imec | Capacitance measurement in microchips |
US8688393B2 (en) * | 2010-07-29 | 2014-04-01 | Medtronic, Inc. | Techniques for approximating a difference between two capacitances |
US8860455B2 (en) | 2010-12-24 | 2014-10-14 | Intel Corporation | Methods and systems to measure a signal on an integrated circuit die |
US8780512B2 (en) * | 2011-04-01 | 2014-07-15 | Neurosky, Inc. | Low leakage ESD structure for non-contact bio-signal sensors |
US8933712B2 (en) | 2012-01-31 | 2015-01-13 | Medtronic, Inc. | Servo techniques for approximation of differential capacitance of a sensor |
CN102749525B (zh) * | 2012-06-05 | 2015-05-20 | 泰凌微电子(上海)有限公司 | 电容检测方法及电容检测电路 |
KR101497586B1 (ko) * | 2012-07-05 | 2015-03-02 | 호쿠토 덴시 고교 가부시키가이샤 | 정전용량형의 수분 검출 장치 |
CN103969468B (zh) * | 2013-01-29 | 2019-03-15 | 北京哲朗科技有限公司 | 微机械加速度计小电容补偿方法 |
US10260983B2 (en) * | 2014-01-20 | 2019-04-16 | Lear Corporation | Apparatus and method for diagnostics of a capacitive sensor with plausibility check |
WO2015145309A1 (de) * | 2014-03-24 | 2015-10-01 | BSH Hausgeräte GmbH | Gargerätevorrichtung mit selbststeuernder überbrückungseinheit |
CN104316087B (zh) * | 2014-09-30 | 2017-01-18 | 广东合微集成电路技术有限公司 | 一种电容式传感器的测量电路 |
US9706312B2 (en) * | 2014-12-16 | 2017-07-11 | Stmicroelectronics S.R.L. | Sensing circuit and method of detecting an electrical signal generated by a microphone |
JP6832207B2 (ja) * | 2017-03-29 | 2021-02-24 | 東京エレクトロン株式会社 | 静電容量測定用の測定器 |
JP6960831B2 (ja) * | 2017-11-17 | 2021-11-05 | エイブリック株式会社 | センサ装置 |
CN108168580B (zh) * | 2017-12-21 | 2020-05-08 | 中国科学院上海微***与信息技术研究所 | 一种用于硅基mems电容式传感器的防静电结构 |
TWI645200B (zh) * | 2018-01-04 | 2018-12-21 | 國立彰化師範大學 | 非接觸式靜電量測裝置 |
CN108519541A (zh) * | 2018-04-23 | 2018-09-11 | 珠海深圳清华大学研究院创新中心 | 一种检测电路及检测设备 |
CN113167563B (zh) * | 2018-12-10 | 2023-05-23 | 株式会社爱信 | 静电电容传感器 |
CN110823316B (zh) * | 2019-10-25 | 2021-10-01 | 德阳市新泰自动化仪表有限公司 | 具有屏蔽干扰功能的电容信号检测电路 |
KR20210092863A (ko) * | 2020-01-16 | 2021-07-27 | 삼성디스플레이 주식회사 | 정전기 방전 보호 회로 및 이를 포함하는 유기 발광 표시 장치 |
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US3646538A (en) * | 1969-10-27 | 1972-02-29 | Rosemount Eng Co Ltd | Transducer circuitry for converting a capacitance signal to a dc current signal |
US5285120A (en) * | 1988-09-15 | 1994-02-08 | Rockwell International Corporation | Broadband phase splitter |
JPH05335493A (ja) | 1992-05-28 | 1993-12-17 | Sanyo Electric Co Ltd | 入力保護回路 |
GB9422911D0 (en) * | 1994-11-14 | 1995-01-04 | Moonstone Technology Ltd | Capacitive touch detectors |
ATE190405T1 (de) * | 1995-01-18 | 2000-03-15 | Carlo Gavazzi Services Ag | Kapazitiver sensor |
US6151967A (en) * | 1998-03-10 | 2000-11-28 | Horizon Technology Group | Wide dynamic range capacitive transducer |
US6005439A (en) * | 1998-07-09 | 1999-12-21 | National Semiconductor Corporation | Unity gain signal amplifier |
US6271060B1 (en) * | 1999-09-13 | 2001-08-07 | Vishay Intertechnology, Inc. | Process of fabricating a chip scale surface mount package for semiconductor device |
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US7102366B2 (en) * | 2001-02-09 | 2006-09-05 | Georgia-Pacific Corporation | Proximity detection circuit and method of detecting capacitance changes |
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TW475250B (en) | 2001-03-14 | 2002-02-01 | Taiwan Semiconductor Mfg | ESD protection circuit to be used in high-frequency input/output port with low capacitance load |
DE10134680A1 (de) * | 2001-07-20 | 2003-02-06 | Endress & Hauser Gmbh & Co Kg | Schaltungsanrdnung für einen kapazitiven Sensor |
JP2003075486A (ja) | 2001-09-06 | 2003-03-12 | Sumitomo Metal Ind Ltd | インピーダンス検出回路及び静電容量検出回路とその方法 |
US6950514B2 (en) * | 2002-03-06 | 2005-09-27 | Intersil Americas Inc. | Voltage reference filter for subscriber line interface circuit |
US7315438B2 (en) | 2003-06-10 | 2008-01-01 | Seiko Epson Corporation | Technique to reduce ESD loading capacitance |
JP4455201B2 (ja) * | 2004-07-20 | 2010-04-21 | 富士通マイクロエレクトロニクス株式会社 | 検出回路 |
-
2003
- 2003-08-06 JP JP2003287991A patent/JP3693665B2/ja not_active Expired - Fee Related
-
2004
- 2004-08-05 EP EP04771552A patent/EP1686383A4/en not_active Withdrawn
- 2004-08-05 US US10/567,092 patent/US7557590B2/en not_active Expired - Fee Related
- 2004-08-05 WO PCT/JP2004/011577 patent/WO2005015246A1/ja active IP Right Grant
- 2004-08-05 CN CNB2004800213623A patent/CN100478691C/zh not_active Expired - Fee Related
- 2004-08-05 KR KR1020057016160A patent/KR100655258B1/ko not_active IP Right Cessation
- 2004-08-06 TW TW093123739A patent/TWI266061B/zh not_active IP Right Cessation
-
2006
- 2006-03-06 NO NO20061073A patent/NO20061073L/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
JP3693665B2 (ja) | 2005-09-07 |
EP1686383A4 (en) | 2007-09-26 |
US7557590B2 (en) | 2009-07-07 |
TW200508619A (en) | 2005-03-01 |
EP1686383A1 (en) | 2006-08-02 |
TWI266061B (en) | 2006-11-11 |
WO2005015246A1 (ja) | 2005-02-17 |
CN1826534A (zh) | 2006-08-30 |
KR100655258B1 (ko) | 2006-12-11 |
CN100478691C (zh) | 2009-04-15 |
US20080150553A1 (en) | 2008-06-26 |
JP2005055362A (ja) | 2005-03-03 |
KR20060024345A (ko) | 2006-03-16 |
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Legal Events
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FC2A | Withdrawal, rejection or dismissal of laid open patent application |